CN203786273U - Automatic continuous impact testing circuit - Google Patents
Automatic continuous impact testing circuit Download PDFInfo
- Publication number
- CN203786273U CN203786273U CN201420092355.3U CN201420092355U CN203786273U CN 203786273 U CN203786273 U CN 203786273U CN 201420092355 U CN201420092355 U CN 201420092355U CN 203786273 U CN203786273 U CN 203786273U
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- power supply
- switch
- line
- time
- solenoid
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Abstract
The utility model discloses an automatic continuous impact testing circuit, and belongs to the field of power supply production and manufacture auxiliary equipment. The automatic continuous impact testing circuit comprises a power supply loop and a power supply controlling device, an AC L line is connected with a master control switch in the power supply loop, the AC L line is connected with a KM1 solenoid to an AC N line via a JS1 time-delay disconnecting switch, the AC L line is connected with a JS1 control terminal to the AC N line via a JS2 time-delay disconnecting switch, the AC L line is connected with a JS2 control terminal to the AC N line via a JS1 time-delay closed switch, one terminal of a KM1 normally-open switch is connected with an adjustable input voltage, the other terminal of the KM1 normally-open switch is connected to a power supply socket, a switch power supply is connected to the power supply socket and accessed to a load resistor, and the on-off of the KM1 normally-open switch is controlled by the KM1 solenoid of the power supply loop. The beneficial effects of the automatic continuous impact testing circuit are that in the condition of energy consumption reduction, power supply aging can be simulated, and components with poor performance can be selected.
Description
Technical field
The utility model relates to a kind of Automatic continuous shock-testing circuit, belongs to power supply and manufactures utility appliance field.
Background technology
In the reliability testing of power supply product, must there is a burn-in test, when in burn-in test, the appearance of defective products mostly concentrates on firm energising and voltage transitions, therefore, the general method adopting of present burn-in test is, after working for a long time, changing another input voltage tests again, this method of testing need to have special testing location and enough large space, and test process needs 2-4 hour, length consuming time and a large amount of electric energy are consumed, cause the waste of time and the energy, detection efficiency is low.
Summary of the invention
The problem existing for above-mentioned prior art, the utility model provides a kind of Automatic continuous shock-testing circuit, can improve detection efficiency, reduces energy resource consumption.
To achieve these goals, the technical solution adopted in the utility model is: a kind of Automatic continuous shock-testing circuit, comprises current supply circuit and power supply control apparatus; Current supply circuit comprises the very first time relay J S1 being made up of JS1 time closing switch, JS1 time delay cut-off switch and JS1 control end; KM1 solenoid in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch and JS2 control end forms; Current supply circuit is by mains-supplied;
In described current supply circuit, on AC L line, be connected with total control switch;
AC L line connects KM1 solenoid to AC N line by JS1 time delay cut-off switch;
AC L line connects JS1 control end to AC N line by JS2 time delay cut-off switch;
AC L line connects JS2 control end to AC N line by JS1 time closing switch;
Power supply control apparatus comprises KM1 normal open switch, supply socket, Switching Power Supply and the pull-up resistor of A.C. contactor KM1; KM1 normal open switch one end connects adjustable input voltage, and the other end is connected in supply socket, and Switching Power Supply is connected in supply socket and Switching Power Supply access pull-up resistor;
KM1 normal open switch in power supply control apparatus is opened and closed by the KM1 solenoid controlled in current supply circuit.
Preferably, described supply socket is a plurality of.
A kind of from being dynamically connected shock-testing circuit testing method, comprise the following steps:
A: current supply circuit is connected civil power; Power supply control apparatus is connected adjustable input voltage;
B: the Switching Power Supply of needs test is connected to power source socket;
C: according to Switching Power Supply actual requirement access pull-up resistor;
D: press total control switch;
E: current supply circuit is connected AC L line, arrives AC N line by JS1 time delay cut-off switch again to the power supply of KM1 solenoid, forms loop; KM1 solenoid obtains operating voltage, makes the adhesive of KM1 normal open switch, and the power supply of adjustable input voltage is linked into supply socket, starts Switching Power Supply to power;
F:AC L line passes through JS2 time delay cut-off switch to JS1 control end, when JS1 control end internal timer arrives after setting-up time, JS1 control end is started working, and the power supply of JS2 control end is given in the adhesive of JS1 time closing switch, JS1 time delay cut-off switch disconnects, disconnect the power supply of KM1 solenoid, KM1 normal open switch is disconnected, now, adjustable input voltage stops the power supply to supply socket, thereby disconnects the power supply to Switching Power Supply;
G:AC L line passes through JS1 time closing switch to JS2 control end, when the internal timer of JS2 control end arrives after setting-up time, the work of JS2 control end, now, JS2 time delay cut-off switch disconnects, thereby disconnect the power supply to JS1 control end, make very first time relay J S1 enter reset mode, now, JS1 time closing switch disconnects, and JS2 control end loses supply voltage and enters reset mode, JS2 time delay cut-off switch closure, AC L line to the power supply of JS1 control end, meanwhile, returns to step e through JS2 time delay cut-off switch;
H: disconnect total control switch, end operation.
The beneficial effects of the utility model are: this feature when mostly concentrating on firm energising and voltage transitions according to the appearance of defective products in burn-in test, energising by civil power and adjustable input voltage and power-off and mutually control and accomplish follow-on test, can reduce energy resource consumption in the situation that, analog power is aging, select the bad element of performance.The utility model can regulate the power on/off time as required, meets the requirement of different Switching Power Supply products.
Brief description of the drawings
Fig. 1 is circuit connection diagram of the present utility model.
In figure: 1, current supply circuit, 11, JS1 time closing switch, 12, JS1 time delay cut-off switch, 13, JS1 control end, 14, JS2 time delay cut-off switch, 15, JS2 control end, 16, KM1 solenoid, 17, total control switch, 18, civil power, 2, power supply control apparatus, 21, KM1 normal open switch, 22, supply socket, 23, Switching Power Supply, 24, pull-up resistor, 25, adjustable input voltage.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further detail.
As shown in Figure 1: the utility model comprises current supply circuit 1 and power supply control apparatus 2; Current supply circuit 1 comprises the very first time relay J S1 being made up of JS1 time closing switch 11, JS1 time delay cut-off switch 12 and JS1 control end 13; KM1 solenoid 16 in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch 14 and JS2 control end 15 forms; Current supply circuit 1 is powered by civil power 18;
In described current supply circuit 1, on AC L line, be connected with total control switch 17;
AC L line connects KM1 solenoid 16 to AC N lines by JS1 time delay cut-off switch 12;
AC L line connects JS1 control end 13 to AC N lines by JS2 time delay cut-off switch 14;
AC L line connects JS2 control end 15 to AC N lines by JS1 time closing switch 11;
Power supply control apparatus 2 comprises KM1 normal open switch 21, supply socket 22, Switching Power Supply 23 and the pull-up resistor 24 of A.C. contactor KM1; KM1 normal open switch 21 one end connect adjustable input voltage 25, and the other end is connected in supply socket 22, and Switching Power Supply 23 is connected in supply socket 22 and Switching Power Supply 23 accesses pull-up resistor 24;
KM1 normal open switch 21 in power supply control apparatus 2 is controlled keying by the KM1 solenoid 16 in current supply circuit 1.
Described supply socket 22 is a plurality of.
A kind of from being dynamically connected shock-testing circuit testing method, comprise the following steps:
A: current supply circuit 1 is connected civil power 18; Power supply control apparatus 2 is connected adjustable input voltage 25;
B: the Switching Power Supply 23 of needs test is connected to power source socket 22;
C: according to Switching Power Supply 23 actual requirement access pull-up resistors 24;
D: press total control switch 17;
E: current supply circuit 1 is connected AC L line, is powered and is arrived AC N line again by JS1 time delay cut-off switch 12 to KM1 solenoids 16, forms loop; KM1 solenoid 16 obtains operating voltage, makes 21 adhesives of KM1 normal open switch, and the power supply of adjustable input voltage 25 is linked into supply socket 22, starts Switching Power Supply 23 to power;
F:AC L line arrives JS1 control end 13 by JS2 time delay cut-off switch 14, when JS1 control end 13 internal timers arrive after setting-up time, JS1 control end 13 is started working, and 11 adhesives of JS1 time closing switch power to JS2 control end 15, JS1 time delay cut-off switch 12 disconnects, disconnect the power supply of KM1 solenoid 16, KM1 normal open switch 21 is disconnected, now, adjustable input voltage 25 stops the power supply to supply socket 22, thereby disconnects the power supply to Switching Power Supply 23;
G:AC L line arrives JS2 control end 15 by JS1 time closing switch 11, when the internal timer of JS2 control end 15 arrives after setting-up time, JS2 control end 15 is worked, now, JS2 time delay cut-off switch 14 disconnects, thereby disconnect the power supply to JS1 control end 13, make very first time relay J S1 enter reset mode, now, JS1 time closing switch 11 disconnects, and JS2 control end 15 loses supply voltage and enters reset mode, JS2 time delay cut-off switch 14 closures, AC L line powers to JS1 control end 13 through JS2 time delay cut-off switch 14, meanwhile, returns to step e;
H: disconnect total control switch 17, end operation.
By above-mentioned method of testing, the break-make of this device energy setting voltage is also mutually controlled and is accomplished follow-on test, and can regulate as required the power on/off time, better meets the requirement of different Switching Power Supply products.
Claims (2)
1. an Automatic continuous shock-testing circuit, comprises current supply circuit (1) and power supply control apparatus (2); It is characterized in that current supply circuit (1) comprises the very first time relay J S1 being made up of JS1 time closing switch (11), JS1 time delay cut-off switch (12) and JS1 control end (13); KM1 solenoid (16) in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch (14) and JS2 control end (15) forms; Current supply circuit (1) is powered by civil power (18);
In described current supply circuit (1), on AC L line, be connected with total control switch (17);
AC L line connects KM1 solenoid (16) to AC N line by JS1 time delay cut-off switch (12);
AC L line connects JS1 control end (13) to AC N line by JS2 time delay cut-off switch (14);
AC L line connects JS2 control end (15) to AC N line by JS1 time closing switch (11);
Power supply control apparatus (2) comprises KM1 normal open switch (21), supply socket (22), Switching Power Supply (23) and the pull-up resistor (24) of A.C. contactor KM1; KM1 normal open switch (21) one end connects adjustable input voltage (25), and the other end is connected in supply socket (22), and Switching Power Supply (23) is connected in supply socket (22) and Switching Power Supply (23) access pull-up resistor (24);
KM1 normal open switch (21) in power supply control apparatus (2) is controlled and is opened and closed by the KM1 solenoid (16) in current supply circuit (1).
2. a kind of Automatic continuous shock-testing circuit according to claim 1, is characterized in that, described supply socket (22) is a plurality of.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420092355.3U CN203786273U (en) | 2014-03-03 | 2014-03-03 | Automatic continuous impact testing circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420092355.3U CN203786273U (en) | 2014-03-03 | 2014-03-03 | Automatic continuous impact testing circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203786273U true CN203786273U (en) | 2014-08-20 |
Family
ID=51322447
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420092355.3U Withdrawn - After Issue CN203786273U (en) | 2014-03-03 | 2014-03-03 | Automatic continuous impact testing circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203786273U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103852734A (en) * | 2014-03-03 | 2014-06-11 | 徐州市恒源电器有限公司 | Automatic continuous bump impact test circuit and test method of automatic continuous bump impact test circuit |
-
2014
- 2014-03-03 CN CN201420092355.3U patent/CN203786273U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103852734A (en) * | 2014-03-03 | 2014-06-11 | 徐州市恒源电器有限公司 | Automatic continuous bump impact test circuit and test method of automatic continuous bump impact test circuit |
| CN103852734B (en) * | 2014-03-03 | 2016-09-28 | 徐州市恒源电器有限公司 | A kind of Automatic continuous shock-testing circuit and method of testing thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140820 Effective date of abandoning: 20160928 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |