CN103852734A - Automatic continuous bump impact test circuit and test method of automatic continuous bump impact test circuit - Google Patents
Automatic continuous bump impact test circuit and test method of automatic continuous bump impact test circuit Download PDFInfo
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- CN103852734A CN103852734A CN201410072601.3A CN201410072601A CN103852734A CN 103852734 A CN103852734 A CN 103852734A CN 201410072601 A CN201410072601 A CN 201410072601A CN 103852734 A CN103852734 A CN 103852734A
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Abstract
The invention discloses an automatic continuous bump impact test circuit and a test method of the automatic continuous bump impact test circuit, and belongs to the field of power source manufacturing auxiliary equipment. The automatic continuous bump impact test circuit comprises a power supply loop and a power supply control device. In the power supply loop, a total control switch is connected to an ACL line; the ACL line enables a KM1 electromagnetic coil to be connected to an ACN line through a JS1 delayed disconnecting switch; the ACL line enables a JS1 control end to be connected to the ACN line through a JS2 delayed disconnecting switch; the ACL line enables a JS2 control end to be connected to the ACN line through a JS1 delayed disconnecting switch; one end of a KM1 normally-open switch is connected with an adjustable input voltage, the other end of the KM1 normally-open switch is connected to a power socket, a switching power source is connected to the power socket, and the switching power source is connected into a load resistor. The KM1 normally-open switch is controlled by the KM1 electromagnetic coil in the power supply loop to be turned on and turned off. The automatic continuous bump impact test circuit and the test method of the automatic continuous bump impact test circuit have the advantages that under the condition that the energy consumption is reduced, power source aging can be simulated, and elements with the poor performance can be selected.
Description
Technical field
The present invention relates to a kind of Automatic continuous shock-testing circuit and method of testing thereof, belong to power supply and manufacture utility appliance field.
Background technology
In the reliability testing of power supply product, must there is a burn-in test, when in burn-in test, the appearance of defective products mostly concentrates on firm energising and voltage transitions, therefore, the general method adopting of present burn-in test is, after working for a long time, changing another input voltage tests again, this method of testing need to have special testing location and enough large space, and test process needs 2-4 hour, length consuming time and a large amount of electric energy are consumed, cause the waste of time and the energy, detection efficiency is low.
Summary of the invention
The problem existing for above-mentioned prior art, the invention provides a kind of Automatic continuous shock-testing circuit and method of testing thereof, can improve detection efficiency, reduces energy resource consumption.
To achieve these goals, the technical solution used in the present invention is: a kind of Automatic continuous shock-testing circuit, comprises current supply circuit and power supply control apparatus; Current supply circuit comprises the very first time relay J S1 being made up of JS1 time closing switch, JS1 time delay cut-off switch and JS1 control end; KM1 solenoid in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch and JS2 control end forms; Current supply circuit is by mains-supplied;
In described current supply circuit, on AC L line, be connected with total control switch;
AC L line connects KM1 solenoid to AC N line by JS1 time delay cut-off switch;
AC L line connects JS1 control end to AC N line by JS2 time delay cut-off switch;
AC L line connects JS2 control end to AC N line by JS1 time closing switch;
Power supply control apparatus comprises KM1 normal open switch, supply socket, Switching Power Supply and the pull-up resistor of A.C. contactor KM1; KM1 normal open switch one end connects adjustable input voltage, and the other end is connected in supply socket, and Switching Power Supply is connected in supply socket and Switching Power Supply access pull-up resistor;
KM1 normal open switch in power supply control apparatus is opened and closed by the KM1 solenoid controlled in current supply circuit.
Preferably, described supply socket is a plurality of.
A kind of from being dynamically connected shock-testing circuit testing method, comprise the following steps:
A: current supply circuit is connected civil power; Power supply control apparatus is connected adjustable input voltage;
B: the Switching Power Supply of needs test is connected to power source socket;
C: according to Switching Power Supply actual requirement access pull-up resistor;
D: press total control switch;
E: current supply circuit is connected AC L line, arrives AC N line by JS1 time delay cut-off switch again to the power supply of KM1 solenoid, forms loop; KM1 solenoid obtains operating voltage, makes the adhesive of KM1 normal open switch, and the power supply of adjustable input voltage is linked into supply socket, starts Switching Power Supply to power;
F:AC L line passes through JS2 time delay cut-off switch to JS1 control end, when JS1 control end internal timer arrives after setting-up time, JS1 control end is started working, and the power supply of JS2 control end is given in the adhesive of JS1 time closing switch, JS1 time delay cut-off switch disconnects, disconnect the power supply of KM1 solenoid, KM1 normal open switch is disconnected, now, adjustable input voltage stops the power supply to supply socket, thereby disconnects the power supply to Switching Power Supply;
G:AC L line passes through JS1 time closing switch to JS2 control end, when the internal timer of JS2 control end arrives after setting-up time, the work of JS2 control end, now, JS2 time delay cut-off switch disconnects, thereby disconnect the power supply to JS1 control end, make very first time relay J S1 enter reset mode, now, JS1 time closing switch disconnects, and JS2 control end loses supply voltage and enters reset mode, JS2 time delay cut-off switch closure, AC L line to the power supply of JS1 control end, meanwhile, returns to step 5 through JS2 time delay cut-off switch;
H: disconnect total control switch, end operation.
The invention has the beneficial effects as follows: this feature when mostly concentrating on firm energising and voltage transitions according to the appearance of defective products in burn-in test, energising by civil power and adjustable input voltage and power-off and mutually control and accomplish follow-on test, can reduce energy resource consumption in the situation that, analog power is aging, select the bad element of performance.The present invention can regulate the power on/off time as required, meets the requirement of different Switching Power Supply products.
Brief description of the drawings
Fig. 1 is circuit connection diagram of the present invention.
In figure: 1, current supply circuit, 11, JS1 time closing switch, 12, JS1 time delay cut-off switch, 13, JS1 control end, 14, JS2 time delay cut-off switch, 15, JS2 control end, 16, KM1 solenoid, 17, total control switch, 18, civil power, 2, power supply control apparatus, 21, KM1 normal open switch, 22, supply socket, 23, Switching Power Supply, 24, pull-up resistor, 25, adjustable input voltage.
Embodiment
Below in conjunction with accompanying drawing, the invention will be further described.
As shown in Figure 1: the present invention includes current supply circuit 1 and power supply control apparatus 2; Current supply circuit 1 comprises the very first time relay J S1 being made up of JS1 time closing switch 11, JS1 time delay cut-off switch 12 and JS1 control end 13; KM1 solenoid 16 in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch 14 and JS2 control end 15 forms; Current supply circuit 1 is powered by civil power 18;
In described current supply circuit 1, on AC L line, be connected with total control switch 17;
AC L line connects KM1 solenoid 16 to AC N lines by JS1 time delay cut-off switch 12;
AC L line connects JS1 control end 13 to AC N lines by JS2 time delay cut-off switch 14;
AC L line connects JS2 control end 15 to AC N lines by JS1 time closing switch 11;
Power supply control apparatus 2 comprises KM1 normal open switch 21, supply socket 22, Switching Power Supply 23 and the pull-up resistor 24 of A.C. contactor KM1; KM1 normal open switch 21 one end connect adjustable input voltage 25, and the other end is connected in supply socket 22, and Switching Power Supply 23 is connected in supply socket 22 and Switching Power Supply 23 accesses pull-up resistor 24;
KM1 normal open switch 21 in power supply control apparatus 2 is controlled keying by the KM1 solenoid 16 in current supply circuit 1.
Described supply socket 22 is a plurality of.
A kind of from being dynamically connected shock-testing circuit testing method, comprise the following steps:
A: current supply circuit 1 is connected civil power 18; Power supply control apparatus 2 is connected adjustable input voltage 25;
B: the Switching Power Supply 23 of needs test is connected to power source socket 22;
C: according to Switching Power Supply 23 actual requirement access pull-up resistors 24;
D: press total control switch 17;
E: current supply circuit 1 is connected AC L line, is powered and is arrived AC N line again by JS1 time delay cut-off switch 12 to KM1 solenoids 16, forms loop; KM1 solenoid 16 obtains operating voltage, makes 21 adhesives of KM1 normal open switch, and the power supply of adjustable input voltage 25 is linked into supply socket 22, starts Switching Power Supply 23 to power;
F:AC L line arrives JS1 control end 13 by JS2 time delay cut-off switch 14, when JS1 control end 13 internal timers arrive after setting-up time, JS1 control end 13 is started working, and 11 adhesives of JS1 time closing switch power to JS2 control end 15, JS1 time delay cut-off switch 12 disconnects, disconnect the power supply of KM1 solenoid 16, KM1 normal open switch 21 is disconnected, now, adjustable input voltage 25 stops the power supply to supply socket 22, thereby disconnects the power supply to Switching Power Supply 23;
G:AC L line arrives JS2 control end 15 by JS1 time closing switch 11, when the internal timer of JS2 control end 15 arrives after setting-up time, JS2 control end 15 is worked, now, JS2 time delay cut-off switch 14 disconnects, thereby disconnect the power supply to JS1 control end 13, make very first time relay J S1 enter reset mode, now, JS1 time closing switch 11 disconnects, and JS2 control end 15 loses supply voltage and enters reset mode, JS2 time delay cut-off switch 14 closures, AC L line powers to JS1 control end 13 through JS2 time delay cut-off switch 14, meanwhile, returns to step 5;
H: disconnect total control switch 17, end operation.
By above-mentioned method of testing, the break-make of this device energy setting voltage is also mutually controlled and is accomplished follow-on test, and can regulate as required the power on/off time, better meets the requirement of different Switching Power Supply products.
Claims (3)
1. an Automatic continuous shock-testing circuit, comprises current supply circuit (1) and power supply control apparatus (2); It is characterized in that current supply circuit (1) comprises the very first time relay J S1 being made up of JS1 time closing switch (11), JS1 time delay cut-off switch (12) and JS1 control end (13); KM1 solenoid (16) in the second time relay JS2 and the A.C. contactor KM1 being made up of JS2 time delay cut-off switch (14) and JS2 control end (15) forms; Current supply circuit (1) is powered by civil power (18);
In described current supply circuit (1), on AC L line, be connected with total control switch (17);
AC L line connects KM1 solenoid (16) to AC N line by JS1 time delay cut-off switch (12);
AC L line connects JS1 control end (13) to AC N line by JS2 time delay cut-off switch (14);
AC L line connects JS2 control end (15) to AC N line by JS1 time closing switch (11);
Power supply control apparatus (2) comprises KM1 normal open switch (21), supply socket (22), Switching Power Supply (23) and the pull-up resistor (24) of A.C. contactor KM1; KM1 normal open switch (21) one end connects adjustable input voltage (25), and the other end is connected in supply socket (22), and Switching Power Supply (23) is connected in supply socket (22) and Switching Power Supply (23) access pull-up resistor (24);
KM1 normal open switch (21) in power supply control apparatus (2) is controlled and is opened and closed by the KM1 solenoid (16) in current supply circuit (1).
2. a kind of Automatic continuous shock-testing circuit according to claim 1, is characterized in that, described supply socket (22) is a plurality of.
3. from being dynamically connected a shock-testing circuit testing method, it is characterized in that comprising the following steps:
A: current supply circuit (1) is connected civil power (18); Power supply control apparatus (2) is connected adjustable input voltage (25);
B: the Switching Power Supply (23) of needs test is connected to power source socket (22);
C: according to Switching Power Supply (23) actual requirement access pull-up resistor (24);
D: press total control switch (17);
E; Current supply circuit (1) is connected AC L line, arrives AC N line by JS1 time delay cut-off switch (12) to KM1 solenoid (16) power supply again, forms loop; KM1 solenoid (16) obtains operating voltage, makes KM1 normal open switch (21) adhesive, and the power supply of adjustable input voltage (25) is linked into supply socket (22), starts Switching Power Supply (23) to power;
F:AC L line arrives JS1 control end (13) by JS2 time delay cut-off switch (14), when JS1 control end (13) internal timer arrives after setting-up time, JS1 control end (13) is started working, JS1 time closing switch (11) adhesive, give JS2 control end (15) power supply, JS1 time delay cut-off switch (12) disconnects, disconnect the power supply of KM1 solenoid (16), KM1 normal open switch (21) is disconnected, now, adjustable input voltage (25) stops the power supply to supply socket (22), thereby disconnects the power supply to Switching Power Supply (23);
G:AC L line arrives JS2 control end (15) by JS1 time closing switch (11), when the internal timer of JS2 control end (15) arrives after setting-up time, JS2 control end (15) work, now, JS2 time delay cut-off switch (14) disconnects, thereby disconnect the power supply to JS1 control end (13), make very first time relay J S1 enter reset mode, now, JS1 time closing switch (11) disconnects, JS2 control end (15) loses supply voltage and enters reset mode, JS2 time delay cut-off switch (14) closure, AC L line is given JS1 control end (13) power supply through JS2 time delay cut-off switch (14), simultaneously, return to step 5,
H: disconnect total control switch (17), end operation.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410072601.3A CN103852734B (en) | 2014-03-03 | 2014-03-03 | A kind of Automatic continuous shock-testing circuit and method of testing thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410072601.3A CN103852734B (en) | 2014-03-03 | 2014-03-03 | A kind of Automatic continuous shock-testing circuit and method of testing thereof |
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| CN103852734A true CN103852734A (en) | 2014-06-11 |
| CN103852734B CN103852734B (en) | 2016-09-28 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107255788A (en) * | 2017-04-18 | 2017-10-17 | 广东浪潮大数据研究有限公司 | A kind of power supply cut-offs the method for testing, system and smart jack of surge |
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| KR20050079350A (en) * | 2004-02-05 | 2005-08-10 | 주식회사 엠엔티 | Tester of power module |
| CN102486533A (en) * | 2010-12-01 | 2012-06-06 | 西安中科麦特电子技术设备有限公司 | LED switching power supply test device |
| CN103135072A (en) * | 2011-11-26 | 2013-06-05 | 西安中科麦特电子技术设备有限公司 | Testing system of lighting emitting diode (LED) switching power supply |
| CN203396921U (en) * | 2013-07-23 | 2014-01-15 | 乐清市捷达自动化设备有限公司 | Multi-load voltage switch power test device |
| CN203786273U (en) * | 2014-03-03 | 2014-08-20 | 徐州市恒源电器有限公司 | Automatic continuous impact testing circuit |
-
2014
- 2014-03-03 CN CN201410072601.3A patent/CN103852734B/en active Active
Patent Citations (5)
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|---|---|---|---|---|
| KR20050079350A (en) * | 2004-02-05 | 2005-08-10 | 주식회사 엠엔티 | Tester of power module |
| CN102486533A (en) * | 2010-12-01 | 2012-06-06 | 西安中科麦特电子技术设备有限公司 | LED switching power supply test device |
| CN103135072A (en) * | 2011-11-26 | 2013-06-05 | 西安中科麦特电子技术设备有限公司 | Testing system of lighting emitting diode (LED) switching power supply |
| CN203396921U (en) * | 2013-07-23 | 2014-01-15 | 乐清市捷达自动化设备有限公司 | Multi-load voltage switch power test device |
| CN203786273U (en) * | 2014-03-03 | 2014-08-20 | 徐州市恒源电器有限公司 | Automatic continuous impact testing circuit |
Cited By (1)
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| CN107255788A (en) * | 2017-04-18 | 2017-10-17 | 广东浪潮大数据研究有限公司 | A kind of power supply cut-offs the method for testing, system and smart jack of surge |
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| CN103852734B (en) | 2016-09-28 |
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Denomination of invention: An automatic continuous impact testing circuit and its testing method Effective date of registration: 20221019 Granted publication date: 20160928 Pledgee: Xuzhou Hi tech Financing Guarantee Co.,Ltd. Pledgor: XUZHOU HENGYUAN ELECTRICAL APPLIANCES Co.,Ltd. Registration number: Y2022320000619 |
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Date of cancellation: 20231108 Granted publication date: 20160928 Pledgee: Xuzhou Hi tech Financing Guarantee Co.,Ltd. Pledgor: XUZHOU HENGYUAN ELECTRICAL APPLIANCES Co.,Ltd. Registration number: Y2022320000619 |
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Denomination of invention: An automatic continuous impact testing circuit and its testing method Effective date of registration: 20231202 Granted publication date: 20160928 Pledgee: Xuzhou Hi tech Financing Guarantee Co.,Ltd. Pledgor: XUZHOU HENGYUAN ELECTRICAL APPLIANCES Co.,Ltd. Registration number: Y2023980068567 |