CN203012068U - Open circuit and short circuit testing system - Google Patents
Open circuit and short circuit testing system Download PDFInfo
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- CN203012068U CN203012068U CN 201220733191 CN201220733191U CN203012068U CN 203012068 U CN203012068 U CN 203012068U CN 201220733191 CN201220733191 CN 201220733191 CN 201220733191 U CN201220733191 U CN 201220733191U CN 203012068 U CN203012068 U CN 203012068U
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Abstract
The utility model provides an open circuit and short circuit testing system which comprises a testing module and an integrated circuit to be tested, wherein the integrated circuit to be tested is connected with the testing module. The open circuit and short circuit testing system is characterized in that the testing module comprises a voltage measuring tool array, a function testing logic module array, a first power supply interface and a second power supply interface, wherein the voltage measuring tool array, the function testing logic module array, the first power supply interface and the second power supply interface are respectively connected with corresponding pins to be tested of the integrated circuit to be tested, each pin to be tested of the integrated circuit is provided with a protective circuit, each protective circuit is composed of a diode which is connected with a power source and a diode which is connected with the ground, the first power supply interface is connected with a negative pole of the diode connected with the power source, and the second power supply interface is connected with a positive pole of the diode connected with the ground. Further provided is an open circuit and short circuit testing method. Open circuit and short circuit testing is achieved through the open circuit and short circuit testing system and the testing method instead of a traditional relay matrix, testing cost is greatly saved, and meanwhile stability and maintainability of the testing system are guaranteed.
Description
Technical field
The utility model is mainly used in integrated circuit testing, is specifically related to a kind of open circuit/short circuit test macro.
Background technology
Whether well-known open circuit/short circuit is tested mainly for detection of the electrostatic discharge protective circuit of the connection performance of system and integrated circuit intact; That the open circuit/short circuit test all is absolutely necessary in middle survey or in becoming to survey.In integrated circuit (IC) design in order to protect chip; each pin has designed a holding circuit, and this holding circuit is two end to end diodes, and the pin of integrated circuit is placed between two diodes; one of them diode ground connection, another diode connects power supply.Open circuit/short-circuit test is exactly in fact the characteristic of testing these two diodes.
Yet no matter be in middle survey or becoming to survey, it is not the open circuit/short circuit of test pin in the test of to-be-measured integrated circuit, also need by this pin, the function of to-be-measured integrated circuit to be tested, add the functional test logic module can complete the functional test of to-be-measured integrated circuit in above-mentioned circuit under test.
In conjunction with Fig. 1 and Fig. 2, the traditional test module comprises test voltage instrument, functional test logic module, the first power switch K1 and the second power switch K2, described functional test logic module comprises functional test logic and K switch 3, described the first power switch K1 is connected with pin to be measured and the electric current of 100uA is provided for pin to be measured, described the second power switch K2 is connected with pin to be measured and for pin to be measured provides-electric current of 100uA, described switch is controlled the break-make of described functional test logic.
Traditional method of testing is as follows:
1, the pressure drop of the diode that test is connected with power supply, give integrated circuit pin input to be measured 100uA electric current, other pin is all to zero potential or direct ground connection, after described and diode current flow that power supply is connected, voltage with the described measuring voltage instrument described integrated circuit of test pin to be measured, if the magnitude of voltage of this pin is between 0.2V～1.5V, this pin is normal, test is passed through, if the magnitude of voltage of this pin is greater than 1.5V, this pin is open circuit, test is not passed through, if the magnitude of voltage of this pin is less than 0.2V, this pin short circuit, test is not passed through.
2, the pressure drop of the diode that test is connected to the ground, give described to-be-measured integrated circuit pin input-100uA electric current, other pin is all to zero potential or direct ground connection, after the described diode current flow that is connected to the ground, test the voltage of described integrated circuit pin to be measured with described measuring voltage instrument, if the magnitude of voltage of this pin is at-1.5V～(0.2V), this pin is normal, test is passed through, if the magnitude of voltage of this pin is less than-1.5V, this pin is open circuit, test is not passed through, if the magnitude of voltage of this pin is greater than-0.2V, this pin short circuit, test is not passed through.
In traditional method of testing, each pin has a complete test circuit, each test circuit needs 2-3 switch, to-be-measured integrated circuit has N pin just to have N complete test circuit, the test circuit of whole to-be-measured integrated circuit just has 2N-3N switch, there be N pin to be measured just to need test 2N time, the switching of simulating signal simultaneously can only be used relay, the shortcoming of relay is that the life-span is short, volume is large, cost is high, and has its stability of test macro and the maintainability of relay matrix not high.The life-span of relay only has the left and right 100,000 times, and the replacing of relay matrix is inconvenient, and this greatly reduces testing efficiency.
The utility model content
The purpose of this utility model is to provide the alternative traditional relay matrix of a kind of open circuit/short circuit test macro and completes the open circuit/short circuit test, has greatly saved testing cost and has also guaranteed the stable and maintainable of test macro simultaneously.
for achieving the above object, the utility model provides a kind of open circuit/short circuit test macro, comprise test module and the to-be-measured integrated circuit that is connected with described test module, it is characterized in that, described test module comprises the connected voltage measurement array of tools of to be measured pin corresponding to described to-be-measured integrated circuit respectively, functional test logic module array, the first power supply interface and the second power supply interface, each of described to-be-measured integrated circuit pin to be measured has a holding circuit, described holding circuit connects the diode of power supply by one and the diode of a ground connection forms, describedly connect the diode of power supply and the protection diode of described ground connection joins end to end, described pin to be measured is placed between the protection diode of the described diode that connects power supply and described ground connection, described the first power supply interface is connected with the described negative electrode that connects the diode of power supply, described the second power supply interface is connected with the anode of the diode of described ground connection,
Better, the quantity of the voltage measurement instrument in described voltage measurement array of tools is N, the quantity of the functional test logic module in described functional test logic module array is N, and is identical with the quantity of described pin to be measured, and N 〉=2;
Better, described functional test logic module comprises current-limiting resistance and the functional test logic that is connected with described current-limiting resistance, and described current-limiting resistance is protected negative electrode and the not short circuit of functional test logic of the diode of the anode of the described diode that connects power supply and described ground connection;
Better, described the first power supply interface and described the second power supply interface are selector switch, when the described diode that connects power supply of test, described the first power supply interface and described the second equal ground connection of power supply interface, when test, functional test logic output high level, the described diode current flow that connects power supply, the not conducting of diode of described ground connection;
Better, described the first power supply interface and described the second power supply interface are selector switch, when testing the diode of described ground connection, described the first power supply interface and described the second power supply interface all connect power supply, when test, functional test logic output low level, the diode current flow of described ground connection, the described not conducting of diode that connects power supply.
Better, the voltage range of described the first power supply interface is greater than the coupled described pressure drop scope that connects the diode of power supply, the voltage range of described the second power supply interface is greater than the pressure drop scope of the diode of coupled described ground connection, and described the first power supply interface is identical with the supply voltage of described the second power supply interface.
Better, the voltage of described the first power supply interface and described the second power supply interface can be adjusted according to the designing requirement of to-be-measured integrated circuit.
Better, the pressure drop scope of the diode of the described diode that connects power supply and described ground connection is 0.2V～1.5V.
Description of drawings
Fig. 1 is background technology tradition open circuit/short circuit test macro block diagram
Fig. 2 is background technology tradition open circuit/short circuit test circuit figure
Fig. 3 is the technical solutions of the utility model system chart
Fig. 4 is the technical solutions of the utility model circuit diagram
Embodiment
Now describe by reference to the accompanying drawings the utility model, the utility model provides a kind of open circuit/short circuit test macro as mentioned above, and enforcement of the present utility model can reduce costs to a great extent, can improve Systems balanth and maintainability simultaneously.
in conjunction with Fig. 3 and Fig. 4, as shown in the figure, the utility model embodiment provides a kind of open circuit/short circuit test macro, comprise test module and the to-be-measured integrated circuit that is connected with described test module, it is characterized in that, described test module comprises the connected voltage measurement instrument ADC array of to be measured pin corresponding to to-be-measured integrated circuit respectively, functional test logic module array, the first power supply interface K1 and the second power supply interface K2, each of described to-be-measured integrated circuit pin to be measured has a holding circuit, described holding circuit meets the diode D1 of power supply by one and the diode D2 of a ground connection forms, describedly meet the diode D1 of power supply and the protection diode D2 of described ground connection joins end to end, described pin to be measured is placed between the protection diode D2 of the described diode D1 that connects power supply and described ground connection, described the first power supply interface K1 is connected with the described negative electrode that meets the diode D1 of power supply, described the second power supply interface K2 is connected with the anode of the diode D2 of described ground connection,
Better, the quantity of the voltage measurement instrument ADC in described voltage measurement instrument ADC array is N, the quantity of the functional test logic module in described functional test logic module array is N, and is identical with the quantity of described pin to be measured, and N 〉=2
Better, described functional test logic module comprises current-limiting resistance R and the functional test logic that is connected with described current-limiting resistance, and described current-limiting resistance R protects negative electrode and the not short circuit of described functional test logic of the diode D2 of the anode of the described diode D1 that connects power supply and described ground connection;
Better, described the first power supply interface K1 and described the second power supply interface K2 are selector switch, when the described diode D1 that connects power supply of test, described the first power supply interface K1 and described the second equal ground connection of power supply interface K2, when test, functional test logic output high level, the described diode D1 conducting that connects power supply, the not conducting of diode D2 of described ground connection;
Better, described the first power supply interface K1 and described the second power supply interface K2 are selector switch, when testing the diode D2 of described ground connection, described the first power supply interface K1 and described the second power supply interface K2 all connect power supply, when test, functional test logic output low level, the diode D2 conducting of described ground connection, the described not conducting of diode D1 that connects power supply.
Better, the voltage range of described the first power supply interface K1 is greater than the coupled described pressure drop scope that meets the diode D1 of power supply, the voltage range of described the second power supply interface K2 is greater than the pressure drop scope of the diode D2 of coupled described ground connection, and described the first power supply interface K1 is identical with the supply voltage of described the second power supply interface K2.
Better, the voltage of described the first power supply interface K1 and described the second power supply interface K2 can be adjusted according to the designing requirement of to-be-measured integrated circuit.
Better, the pressure drop scope of the diode D2 of the described diode D1 that connects power supply and described ground connection is 0.2V～1.5V.
the principle of work of the utility model embodiment is as follows, referring to Fig. 4, when testing the described diode D1 that connects power supply, described the first power supply interface K1 and described the second power supply interface K2 be ground connection simultaneously, that is to say the plus earth of the diode D2 of described ground connection, so the diode D2 of described ground connection never can conducting, so just can not exert an influence to testing the described diode D1 that connects power supply, the high voltage of described functional test logic output 3.3V through current-limiting resistance R to the described anode that meets the diode D1 of power supply, because the described anode that meets the diode D1 of power supply has been high voltage by the 3.3V high voltage drive of described functional test logic output, so described diode D1 conducting that connects power supply, the conduction voltage drop of general general-purpose diode is the 0.65V left and right, therefore the voltage that the described anode that connects the diode of power supply is the to-be-measured integrated circuit pin will be fixed on the 0.65V left and right by pincers, the pressure drop of some diode is 0.2V, the pressure drop meeting of some diode is higher than 0.65V but lower than 1.5V, so set the normal voltage of described pin to be measured between 0.2V～1.5V, if described voltage measurement instrument ADC measures the voltage of to-be-measured integrated circuit pin between 0.2V～1.5V, test is passed through, if not between 0.2V～1.5V, test is not passed through.when testing the diode D2 of described ground connection, described the first power supply interface K1 and described the second power supply interface K2 connect power supply simultaneously, that is to say that the described negative electrode that meets the diode D1 of power supply connects power supply, so the described diode D1 that connects power supply never can conducting, so just can the diode D2 that test described ground connection not exerted an influence, described functional test logic output 0 voltage is through the negative electrode of described current-limiting resistance R to the diode D2 of described ground connection, there is pressure reduction in the anode and cathode of the diode D2 of described ground connection at this moment, so diode D2 conducting of described ground connection, voltage on pin to be measured will be fixed on by pincers (VDD-0.65V) left and right at this moment, the pressure drop of some diode is 0.2V, the pressure drop meeting of some diode is higher than 0.65V but lower than 1.5V, so set the normal voltage of described pin to be measured between 0.2V～1.5V, if described voltage measurement instrument ADC measures the voltage of to-be-measured integrated circuit pin between (VDD-1.5V)～(VDD-0.2V), test is passed through, if not between (VDD-1.5V)～(VDD-0.2V), test is not passed through.
Compared with prior art, only need two relays in technical solutions of the utility model, and only need to test and to have surveyed all pins to be measured for twice and greatly reduce cost, improved Systems balanth and maintainability.No matter be that test connects the diode of power supply or the diode of test ground connection, the voltage on pin to be measured is all positive voltage, has reduced the requirement of measuring voltage instrument simultaneously.
Abovely in conjunction with most preferred embodiment, the utility model is described, but the utility model is not limited to the embodiment of above announcement, and should contains various modification, equivalent combinations of carrying out according to essence of the present utility model.
Claims (8)
1. open circuit/short circuit test macro, comprise test module and the to-be-measured integrated circuit that is connected with described test module, it is characterized in that, described test module comprises the connected voltage measurement array of tools of to be measured pin corresponding to described to-be-measured integrated circuit respectively, functional test logic module array, the first power supply interface and the second power supply interface, each of described to-be-measured integrated circuit pin to be measured has a holding circuit, described holding circuit connects the diode of power supply by one and the diode of a ground connection forms, describedly connect the diode of power supply and the protection diode of described ground connection joins end to end, described pin to be measured is placed between the protection diode of the described diode that connects power supply and described ground connection, described the first power supply interface is connected with the described negative electrode that connects the diode of power supply, described the second power supply interface is connected with the anode of the diode of described ground connection.
2. open circuit/short circuit test macro according to claim 1, it is characterized in that: the quantity of the voltage measurement instrument in described voltage measurement array of tools is N, the quantity of the functional test logic module in described functional test logic module array is N, identical with the quantity of described pin to be measured, and N 〉=2.
3. open circuit/short circuit test macro according to claim 1; it is characterized in that: described functional test logic module comprises current-limiting resistance and the functional test logic that is connected with described current-limiting resistance, and described current-limiting resistance is protected negative electrode and the not short circuit of functional test logic of the diode of the anode of the described diode that connects power supply and described ground connection.
4. open circuit/short circuit test macro according to claim 1, it is characterized in that: described the first power supply interface and described the second power supply interface are selector switch, when the described diode that connects power supply of test, described the first power supply interface and described the second equal ground connection of power supply interface, when test, functional test logic output high level, the described diode current flow that connects power supply, the not conducting of diode of described ground connection.
5. open circuit/short circuit test macro according to claim 1, it is characterized in that: described the first power supply interface and described the second power supply interface are selector switch, when testing the diode of described ground connection, described the first power supply interface and described the second power supply interface all connect power supply, when test, functional test logic output low level, the diode current flow of described ground connection, the described not conducting of diode that connects power supply.
6. open circuit/short circuit test macro according to claim 1, it is characterized in that: the voltage range of described the first power supply interface is greater than the coupled described pressure drop scope that connects the diode of power supply, the voltage range of described the second power supply interface is greater than the pressure drop scope of the diode of coupled described ground connection, and described the first power supply interface is identical with the supply voltage of described the second power supply interface.
7. open circuit/short circuit test macro according to claim 1, it is characterized in that: the voltage of described the first power supply interface and described the second power supply interface can be adjusted according to the designing requirement of to-be-measured integrated circuit.
8. open circuit/short circuit test macro according to claim 1 is characterized in that: the pressure drop scope of the diode of the described diode that connects power supply and described ground connection is 0.2V～1.5V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220733191 CN203012068U (en) | 2012-12-26 | 2012-12-26 | Open circuit and short circuit testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220733191 CN203012068U (en) | 2012-12-26 | 2012-12-26 | Open circuit and short circuit testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203012068U true CN203012068U (en) | 2013-06-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220733191 Expired - Fee Related CN203012068U (en) | 2012-12-26 | 2012-12-26 | Open circuit and short circuit testing system |
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| CN (1) | CN203012068U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103063975A (en) * | 2012-12-26 | 2013-04-24 | 成都市中州半导体科技有限公司 | Open circuit and short circuit testing system and method |
| CN103529354A (en) * | 2013-10-31 | 2014-01-22 | 京东方科技集团股份有限公司 | Circuit testing method and circuit testing system |
| CN104635102A (en) * | 2013-11-14 | 2015-05-20 | 富泰华工业（深圳）有限公司 | Electronic component detection device and detection method thereof |
| CN106872840A (en) * | 2017-01-09 | 2017-06-20 | 浙江南都电源动力股份有限公司 | Voltage acquisition line short test circuit and equipment |
| CN109564264A (en) * | 2018-10-31 | 2019-04-02 | 深圳市汇顶科技股份有限公司 | Test macro |
-
2012
- 2012-12-26 CN CN 201220733191 patent/CN203012068U/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103063975A (en) * | 2012-12-26 | 2013-04-24 | 成都市中州半导体科技有限公司 | Open circuit and short circuit testing system and method |
| CN103529354A (en) * | 2013-10-31 | 2014-01-22 | 京东方科技集团股份有限公司 | Circuit testing method and circuit testing system |
| CN103529354B (en) * | 2013-10-31 | 2016-10-05 | 京东方科技集团股份有限公司 | A kind of circuit testing method and circuit test system |
| US9746509B2 (en) | 2013-10-31 | 2017-08-29 | Boe Technology Group Co., Ltd. | Circuit testing method and circuit testing system |
| CN104635102A (en) * | 2013-11-14 | 2015-05-20 | 富泰华工业（深圳）有限公司 | Electronic component detection device and detection method thereof |
| CN106872840A (en) * | 2017-01-09 | 2017-06-20 | 浙江南都电源动力股份有限公司 | Voltage acquisition line short test circuit and equipment |
| CN109564264A (en) * | 2018-10-31 | 2019-04-02 | 深圳市汇顶科技股份有限公司 | Test macro |
| WO2020087363A1 (en) * | 2018-10-31 | 2020-05-07 | 深圳市汇顶科技股份有限公司 | Test system |
| US20200355777A1 (en) * | 2018-10-31 | 2020-11-12 | Shenzhen GOODIX Technology Co., Ltd. | Test system |
| CN109564264B (en) * | 2018-10-31 | 2021-05-14 | 深圳市汇顶科技股份有限公司 | Test system |
| US11486955B2 (en) * | 2018-10-31 | 2022-11-01 | Shenzhen GOODIX Technology Co., Ltd. | Test system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130619 Termination date: 20141226 |
|
| EXPY | Termination of patent right or utility model |