CN106872840A - Voltage acquisition line short test circuit and equipment - Google Patents
Voltage acquisition line short test circuit and equipment Download PDFInfo
- Publication number
- CN106872840A CN106872840A CN201710013451.2A CN201710013451A CN106872840A CN 106872840 A CN106872840 A CN 106872840A CN 201710013451 A CN201710013451 A CN 201710013451A CN 106872840 A CN106872840 A CN 106872840A
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- CN
- China
- Prior art keywords
- voltage acquisition
- light emitting
- line short
- acquisition line
- short test
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses a kind of voltage acquisition line short test circuit and equipment, wherein circuit includes power supply and multiple light emitting diodes；Multiple light emitting diodes are sequentially connected in series, and loop is formed with power supply；The positive input of each light emitting diode connects a current limiting element；Current limiting element, one end be arranged between power supply and light emitting diode or two light emitting diodes between, the other end be provided with connection Devices to test voltage acquisition port, for will access loop in current limit within the rated current of light emitting diode.The voltage acquisition line short test equipment that the present invention is provided includes housing and is arranged on the voltage acquisition line short test circuit of enclosure interior.Using the present invention provide voltage acquisition line short test circuit and equipment, can conveniently detection voltage collecting device it is highly reliable either with or without short circuit, break away from the limitation of in-site installation test, equipment compact volume and convenience is carried simultaneously, it is not necessary to which external equipment is powered, easy to use.
Description
Technical field
The present invention relates to circuit testing technology field, more particularly to a kind of voltage acquisition line short test circuit and set
It is standby.
Background technology
It is traditional judge voltage acquisition circuit whether the method for short circuit, depend on the reliability and software of hardware design
The reliability of code, both one of them easily cause voltage acquisition line short if defective, so as to damage voltage
Collecting device.And be not often found in engineer at first, set until collecting device is installed to the practicalities such as battery
Can just be exposed when standby upper and gone wrong.
Therefore, it is this it is traditional judge voltage acquisition circuit whether the method for short circuit, due to heavy dependence designed lines
Hardware Engineer and software engineer, poor reliability, and need in-site installation to test, operation inconvenience.
The content of the invention
For prior art, the invention provides a kind of voltage acquisition line short test circuit, including power supply and multiple
Light emitting diode；
Multiple light emitting diodes are sequentially connected in series, and loop is formed with the power supply；
The positive input of each light emitting diode connects a current limiting element；
The current limiting element, one end is arranged between the power supply and the light emitting diode or two light-emitting diodes
Between pipe, the other end is provided with the voltage acquisition port of connection Devices to test, for will access the current limit in the loop
Within the rated current of the light emitting diode.
Used as a kind of embodiment, the current limiting element is resistance or the positive voltage-regulator diode for setting.
As a kind of embodiment, circuit brake is additionally provided with the loop.
Used as a kind of embodiment, the circuit brake is fuse.
Used as a kind of embodiment, the power supply is dc source.
Used as a kind of embodiment, the power supply is AC power, and the output end of the power supply is connected with rectifier cell.
Used as a kind of embodiment, the rectifier cell is commutation diode or rectifier.
Used as a kind of embodiment, the quantity of the light emitting diode is 24.
Used as a kind of embodiment, the quantity of the light emitting diode is 12.
Correspondingly, the present invention also provides a kind of voltage acquisition line short test equipment, including housing and any of the above-described
Voltage acquisition line short test circuit described in；
The voltage acquisition line short test circuit is arranged on the enclosure interior.
The present invention is relative to the beneficial effect of prior art：
The voltage acquisition line short test circuit that the present invention is provided, is sequentially connected in series by setting multiple light emitting diodes,
Loop is formed with power supply, the positive input of each light emitting diode connects a current limiting element, and current limiting element one end is arranged on electricity
Between source and light emitting diode or between two light emitting diodes, the other end is provided with the voltage acquisition end of connection Devices to test
Mouthful, so as to form plurality of voltages test circuit.During test, Devices to test is directly accessed into voltage acquisition port, using hardware electricity
The principle of road resistant series partial pressure, partial pressure is carried out by the voltage that power supply is exported, there is provided suitable voltage is to Devices to test.If treated
Measurement equipment is normal, then according to the characteristic of diode unilateal conduction, just have electric current by light emitting diode, and light emitting diode will lead
It is logical.If Devices to test abnormal formation short circuit, according to the principle of parallel shunt, electric current almost all is adopted by the voltage of short circuit
Collection circuit passes through, and does not have electric current by light emitting diode, and light emitting diode is not turned on.So as to the light on and off shape according to light emitting diode
State can determine whether whether voltage acquisition circuit is normal.
The voltage acquisition line short test circuit and equipment provided using the present invention, can conveniently detection voltage
Collecting device is highly reliable either with or without short circuit, breaks away from the limitation of in-site installation test, while equipment compact volume and convenience is carried, no
External equipment is needed to be powered, it is easy to use.
Brief description of the drawings
Fig. 1 is the voltage acquisition line short test circuit schematic diagram that the embodiment of the present invention one is provided；
Fig. 2 is a circuit theory diagrams of the voltage acquisition line short test circuit shown in Fig. 1；
Current trend schematic diagrames of the Fig. 3 for the circuit shown in Fig. 2 under normal circumstances；
Current trend schematic diagrames of the Fig. 4 for the circuit shown in Fig. 2 in a short-circuit situation.
Specific embodiment
Below in conjunction with accompanying drawing, the technical characteristic above-mentioned and other to the present invention and advantage are clearly and completely described,
Obviously, described embodiment is only section Example of the invention, rather than whole embodiments.
Voltage acquisition line short test circuit provided in an embodiment of the present invention, including power supply and multiple light emitting diodes,
Multiple light emitting diodes are sequentially connected in series, and loop is formed with power supply；The positive input of each light emitting diode connects current limliting unit
Part；Current limiting element, one end be arranged between power supply and light emitting diode or two light emitting diodes between, the other end is provided with company
Receive measurement equipment voltage acquisition port, for will access loop in current limit light emitting diode rated current with
It is interior.
Wherein, current limiting element can be resistance or the positive voltage-regulator diode for setting, and circuit protection is additionally provided with loop
Device, such as fuse or voltage-regulator diode etc., it is ensured that each component is operated under rated voltage in circuit.Power supply can be adopted
With dc source, it would however also be possible to employ AC power.If AC power, then the rectifications such as commutation diode or rectifier unit is connected
Part, is direct current by AC conversion.
Voltage acquisition line short test circuit provided in an embodiment of the present invention, by setting multiple light emitting diodes successively
Series connection, loop is formed with power supply, and the positive input of each light emitting diode connects a current limiting element, and current limiting element one end is set
Between power supply and light emitting diode or between two light emitting diodes, the other end is provided with the voltage acquisition of connection Devices to test
Port, so as to form plurality of voltages test circuit.During test, Devices to test is directly accessed into voltage acquisition port, using hardware
The principle of circuitous resistance series connection partial pressure, partial pressure is carried out by the voltage that power supply is exported, there is provided suitable voltage is to Devices to test.If
Devices to test is normal, then according to the characteristic of diode unilateal conduction, just have electric current by light emitting diode, and light emitting diode will
Conducting.If Devices to test abnormal formation short circuit, according to the principle of parallel shunt, electric current almost all by short circuit voltage
Collection circuit passes through, and does not have electric current by light emitting diode, and light emitting diode is not turned on.So as to the light on and off according to light emitting diode
State can determine whether whether voltage acquisition circuit is normal.
It is exemplified below：
Referring to Fig. 1, the voltage acquisition line short test circuit that the embodiment of the present invention one is provided, including 48V's is straight
Stream out-put supply, 24 light emitting diodes, 24 Xiao Jite diodes (can work as high current commutation diode, fly-wheel diode and
Protection diode is used), 24 10 ohm of resistance, a fuse, nethermost J4, J3 are the voltage for connecting Devices to test
Collection port.
This circuit structure is adapted to use 12 road voltage collection circuits and 24 road voltage collection circuit detections.
When using 12 road voltage collection circuits：The interface 1 of J4 connects total negative, and the 2-13 interfaces of J4 connect 12 batteries successively
Positive pole, J3 it is idle without.
When using 24 road voltage acquisition circuits：The interface 1 of J4 connects total negative, and the 2-13 interfaces of J4 connect 12 economize on electricitys successively
The positive pole in pond, the 1-12 interfaces of J3 connect the positive pole of remaining 12 batteries successively.
For convenience of description, hardware configuration can be reduced to Fig. 2：
The voltage acquisition line short test circuit that the embodiment of the present invention one is provided, including a direct current output electricity of 48V
Source M1, for exporting 48V DC voltages；24 light emitting diode D1 to D24, light emitting diode can be bright when there is electric current to flow through,
For judging whether electric current circulates；24 10 ohm of resistance R1 to R24.(center section represents omission, i.e. identical electricity in figure
Road)：Resistance R1 to R24 is connected to voltage acquisition port, and resistance can not be too big.Resistance is too big according to I=U/R, and electric current is just less than normal,
Shunted i.e. in line short few, cause still to have electric current flowing through light emitting diode from branch road, light emitting diode can be bright, so not
Pipe all can be bright either with or without short-circuit diode, and detection function is just failed.During fuse F1 can avoid high current from burning circuit
Component.Digital 1-25 represents the passage of Devices to test output voltage, i.e.,：1-2 can regard first segment voltage 2V as, and 1 is negative, and 2 are
Just, pressure difference is 2V；2-3 is second section 2V voltages simultaneously, and 2 is negative, and 3 is just, by that analogy.Note：This example is to test the hard of 2V
The design of part circuit, the parameter such as dc source, resistance and fuse only meets the circuit in this example.
Circuit operation principle is as follows：
After the 48V voltages of dc source M1 are by average partial pressure, 2V is equally divided into, i.e. 24 passages of numeral 1-25 are defeated
Go out the voltage of 2V.
After connection is good, under normal operation, electric current flows through light emitting diode, and light emitting diode is bright.Such as Fig. 3 institutes
Show by taking last acquisition channel 24 and 25 as an example, there is the pressure difference of 2V between the passage 24 and 25 of normal voltage acquisition circuit,
And normal voltage acquisition circuit will not allow 24 to be connected with 25, short circuit is formed like that can burn parts.Therefore it is normal
In the case of be between 24 and 25 open circuit, electric current is not had and is passed through, electric current passes through from the light emitting diode D24 of another branch road, light
Diode D24 is lit.Other light emitting diodes D23, D22 are by that analogy.If 24 light emitting diodes are all lit, explanation
Tested voltage acquisition circuit is normal.
In the case where being short-circuited, the passage of voltage acquisition circuit forms path, an other line of the electric current from parallel connection
Road flows away, and connecting the light emitting diode of the passage does not have electric current or only only a few electric current to flow through, and light emitting diode does not work.
Referring to Fig. 4, by taking last acquisition channel 24 and 25 as an example, when being short-circuited, passage 24 with 25 equivalent to connecting,
Because resistance R24 and resistance R23 resistances are smaller, according to the principle of parallel shunt, high current flows through from the passage of short circuit, causes hair
Optical diode D24 no currents pass through, it is impossible to be lit.Short circuit is there occurs in now account for voltage collection circuit, needs to search.Other
Light emitting diode D23, D22 etc. by that analogy.Which do not work corresponding passage that just illustrate just is asked in 24 light emitting diodes
Topic.
Voltage acquisition line short test equipment provided in an embodiment of the present invention, including housing and set in the housing
The voltage acquisition line short test circuit.The voltage acquisition line short test circuit and equipment provided using the present invention, can
It is highly reliable either with or without short circuit with conveniently detection voltage collecting device, the limitation of in-site installation test is broken away from, while
Equipment compact volume and convenience is carried, it is not necessary to which external equipment is powered, easy to use.
Particular embodiments described above, has been carried out further to the purpose of the present invention, technical scheme and beneficial effect
Describe in detail, it will be appreciated that the foregoing is only specific embodiment of the invention, the protection being not intended to limit the present invention
Scope.Particularly point out, to those skilled in the art, it is all within the spirit and principles in the present invention, done any repair
Change, equivalent, improvement etc., should be included within the scope of the present invention.
Claims (10)
1. a kind of voltage acquisition line short test circuit, it is characterised in that including power supply and multiple light emitting diodes；
Multiple light emitting diodes are sequentially connected in series, and loop is formed with the power supply；
The positive input of each light emitting diode connects a current limiting element；
The current limiting element, one end be arranged between the power supply and the light emitting diode or two light emitting diodes it
Between, the other end is provided with the voltage acquisition port of connection Devices to test, for will access the current limit in the loop in institute
Within stating the rated current of light emitting diode.
2. voltage acquisition line short test circuit according to claim 1, it is characterised in that the current limiting element is electricity
Resistance or the positive voltage-regulator diode for setting.
3. voltage acquisition line short test circuit according to claim 1, it is characterised in that also set up in the loop
There is circuit brake.
4. voltage acquisition line short test circuit according to claim 3, it is characterised in that the circuit brake
It is fuse.
5. voltage acquisition line short test circuit according to claim 1, it is characterised in that the power supply is direct current
Source.
6. voltage acquisition line short test circuit according to claim 1, it is characterised in that the power supply is alternating current
Source, the output end of the power supply is connected with rectifier cell.
7. voltage acquisition line short test circuit according to claim 6, it is characterised in that the rectifier cell is whole
Stream diode or rectifier.
8. the voltage acquisition line short test circuit according to any one of claim 1 to 7, it is characterised in that the hair
The quantity of optical diode is 24.
9. the voltage acquisition line short test circuit according to any one of claim 1 to 7, it is characterised in that the hair
The quantity of optical diode is 12.
10. a kind of voltage acquisition line short test equipment, it is characterised in that including housing and the claims 1 to 9
Voltage acquisition line short test circuit described in one；
The voltage acquisition line short test circuit is arranged on the enclosure interior.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710013451.2A CN106872840A (en) | 2017-01-09 | 2017-01-09 | Voltage acquisition line short test circuit and equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710013451.2A CN106872840A (en) | 2017-01-09 | 2017-01-09 | Voltage acquisition line short test circuit and equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106872840A true CN106872840A (en) | 2017-06-20 |
Family
ID=59164515
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710013451.2A Pending CN106872840A (en) | 2017-01-09 | 2017-01-09 | Voltage acquisition line short test circuit and equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106872840A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108152614A (en) * | 2017-11-30 | 2018-06-12 | 中航锂电（江苏）有限公司 | A kind of harness busbar detection method |
| CN109521323A (en) * | 2017-09-18 | 2019-03-26 | 湖南中车时代电动汽车股份有限公司 | A kind of interface circuit on off operating mode detection device and method |
| CN113238903A (en) * | 2021-05-14 | 2021-08-10 | 山东英信计算机技术有限公司 | Slot position detection device for memory slot on main board |
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| CN101191813A (en) * | 2007-03-09 | 2008-06-04 | 中兴通讯股份有限公司 | Short circuit detection device |
| CN102221656A (en) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业（深圳）有限公司 | Short circuit tester |
| CN203012068U (en) * | 2012-12-26 | 2013-06-19 | 成都市中州半导体科技有限公司 | Open circuit and short circuit testing system |
| CN203350389U (en) * | 2013-07-31 | 2013-12-18 | 广东易事特电源股份有限公司 | Flat cable detecting device |
| JP2014055876A (en) * | 2012-09-13 | 2014-03-27 | Fujitsu Telecom Networks Ltd | Current detection and measurement device |
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2017
- 2017-01-09 CN CN201710013451.2A patent/CN106872840A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101191813A (en) * | 2007-03-09 | 2008-06-04 | 中兴通讯股份有限公司 | Short circuit detection device |
| CN102221656A (en) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业（深圳）有限公司 | Short circuit tester |
| JP2014055876A (en) * | 2012-09-13 | 2014-03-27 | Fujitsu Telecom Networks Ltd | Current detection and measurement device |
| CN203012068U (en) * | 2012-12-26 | 2013-06-19 | 成都市中州半导体科技有限公司 | Open circuit and short circuit testing system |
| CN203350389U (en) * | 2013-07-31 | 2013-12-18 | 广东易事特电源股份有限公司 | Flat cable detecting device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109521323A (en) * | 2017-09-18 | 2019-03-26 | 湖南中车时代电动汽车股份有限公司 | A kind of interface circuit on off operating mode detection device and method |
| CN108152614A (en) * | 2017-11-30 | 2018-06-12 | 中航锂电（江苏）有限公司 | A kind of harness busbar detection method |
| CN113238903A (en) * | 2021-05-14 | 2021-08-10 | 山东英信计算机技术有限公司 | Slot position detection device for memory slot on main board |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170620 |