CN202968740U - 一种区熔炉单晶夹持*** - Google Patents
一种区熔炉单晶夹持*** Download PDFInfo
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- CN202968740U CN202968740U CN 201220682114 CN201220682114U CN202968740U CN 202968740 U CN202968740 U CN 202968740U CN 201220682114 CN201220682114 CN 201220682114 CN 201220682114 U CN201220682114 U CN 201220682114U CN 202968740 U CN202968740 U CN 202968740U
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- single crystal
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- 239000013078 crystal Substances 0.000 title claims abstract description 33
- 238000004857 zone melting Methods 0.000 title claims abstract description 13
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 26
- 229920005591 polysilicon Polymers 0.000 claims abstract description 26
- 230000004941 influx Effects 0.000 claims description 7
- 230000000295 complement effect Effects 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 239000002994 raw material Substances 0.000 abstract description 2
- 230000000903 blocking effect Effects 0.000 abstract 3
- 238000011084 recovery Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 210000003739 neck Anatomy 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000003723 Smelting Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 2
- 238000005266 casting Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
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Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201220682114 CN202968740U (zh) | 2012-12-11 | 2012-12-11 | 一种区熔炉单晶夹持*** |
Applications Claiming Priority (1)
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CN 201220682114 CN202968740U (zh) | 2012-12-11 | 2012-12-11 | 一种区熔炉单晶夹持*** |
Publications (1)
Publication Number | Publication Date |
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CN202968740U true CN202968740U (zh) | 2013-06-05 |
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CN 201220682114 Expired - Lifetime CN202968740U (zh) | 2012-12-11 | 2012-12-11 | 一种区熔炉单晶夹持*** |
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CN (1) | CN202968740U (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105386120A (zh) * | 2014-09-03 | 2016-03-09 | 硅电子股份公司 | 在根据fz方法结晶单晶期间支撑生长单晶的方法 |
-
2012
- 2012-12-11 CN CN 201220682114 patent/CN202968740U/zh not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105386120A (zh) * | 2014-09-03 | 2016-03-09 | 硅电子股份公司 | 在根据fz方法结晶单晶期间支撑生长单晶的方法 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: GRINM ADVANCED MATERIALS CO., LTD. Free format text: FORMER NAME: GRINM SEMICONDUCTOR MATERIALS CO., LTD. |
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CP01 | Change in the name or title of a patent holder |
Address after: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Patentee after: GRINM ADVANCED MATERIALS CO.,LTD. Patentee after: Guotai Semiconductor Material Co.,Ltd. Address before: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Patentee before: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. Patentee before: Guotai Semiconductor Material Co.,Ltd. |
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C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Patentee after: GRINM ADVANCED MATERIALS CO.,LTD. Patentee after: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. Address before: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Patentee before: GRINM ADVANCED MATERIALS CO.,LTD. Patentee before: Guotai Semiconductor Material Co.,Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: GRINM SEMICONDUCTOR MATERIALS CO., LTD. Free format text: FORMER OWNER: GRINM ADVANCED MATERIALS CO., LTD. Effective date: 20150708 Free format text: FORMER OWNER: GRINM SEMICONDUCTOR MATERIALS CO., LTD. Effective date: 20150708 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Effective date of registration: 20150708 Address after: 101300 Beijing city Shunyi District Shuanghe Linhe Industrial Development Zone on the south side of the road Patentee after: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. Address before: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Patentee before: GRINM ADVANCED MATERIALS CO.,LTD. Patentee before: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. |
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CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 101300 south side of Shuanghe Road, Linhe Industrial Development Zone, Shunyi District, Beijing Patentee after: Youyan semiconductor silicon materials Co.,Ltd. Address before: 101300 south side of Shuanghe Road, Linhe Industrial Development Zone, Shunyi District, Beijing Patentee before: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. |
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CX01 | Expiry of patent term |
Granted publication date: 20130605 |
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CX01 | Expiry of patent term |