CN202679330U - Synchronous pulse control circuit preventing fault of MCU and driver IC - Google Patents
Synchronous pulse control circuit preventing fault of MCU and driver IC Download PDFInfo
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- CN202679330U CN202679330U CN 201220266556 CN201220266556U CN202679330U CN 202679330 U CN202679330 U CN 202679330U CN 201220266556 CN201220266556 CN 201220266556 CN 201220266556 U CN201220266556 U CN 201220266556U CN 202679330 U CN202679330 U CN 202679330U
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Abstract
The utility model discloses a synchronous pulse control circuit preventing the faults of a MCU and a driver IC, comprising a signal sampling circuit, a synchronization pulse converting circuit and a shaping control signal output circuit. The synchronous pulse control circuit preventing the faults of a MCU and a driver IC is characterized in that the sampling circuit carries out sampling and amplitude adjusting to the voltage signals output by a MCU or a driver IC, the sampling voltage signal is output to the synchronization pulse converting circuit, a normal pulse sampling voltage signal with duty ratio control is coupled to the input terminal of the shaping control signal output circuit by the synchronization pulse converting circuit, simultaneously, a DC fault voltage signal is blocked out, and when the shaping control signal output circuit has a fault, the control terminal of the complementation push-pull power amplification circuit of a main driving circuit is clamped to zero potential. According to the utility model, the synchronous pulse control circuit preventing faults of a MCU and a driver IC is advantageous in that the technology following performance is good, the reliability is high, and the cost is low.
Description
Technical field
The utility model relates to the impulse transfer control field, is the lock-out pulse control circuit of a kind of anti-MCU or drive IC fault specifically.
Background technology
Present traditional electronic type power switch, (MCU or drive IC) is when breaking down in the pulsed drive source, the drive pulse signal width then can be subjected to the impact of input stage (prime) to reach maximum, it is the mode of operation of the full conducting of high level, this will be so that the rear class power switch pipe be in full duty ratio conduction mode, damages this power switch pipe because electric current is excessive.
Figure 1 shows that traditional complementary push-pull formula power driving circuit with triode paraphase amplification input.(U when the MCU of prime or drive IC break down
0Be full low level, normal is the controllable driving signal of pulse duration), in this traditional circuit, this fault is after triode and complementary push-pull amplifier carry out dual amplification, can cause power switch pipe to enter fully conducting state, conducting internal resistance between its D-S is close to zero especially, causes this power switch pipe to damage because electric current is excessive.
Figure 2 shows that the complementary push-pull formula power driving circuit of traditional employing discharge resistance.As mentioned above, when the MCU of prime or drive IC break down, by this complementary push-pull circuit and drive resistance, can cause equally terminal power switch pipe to damage because electric current is excessive.
Fig. 3, Figure 4 shows that the complementary push-pull formula power driving circuit of traditional employing operational amplifier/comparator homophase input.With Fig. 1, Fig. 2 difference be (output voltage U when the MCU of prime or drive IC break down
0Being the overall height level, normally is the controllable driving signal of pulse duration), this fault high level is delivered to the driving stage of power switch pipe through in-phase input end, thereby terminal power switch pipe is damaged because electric current is excessive.
Address the above problem at present the following three kinds of methods that mainly contain:
Method one
High-power current-limiting resistance R9 of the upper series connection of the power switch pipe D utmost point (or C utmost point) endways, such as Fig. 5, shown in Figure 6, this current-limiting resistance owing to connected, can prevent that power switch pipe from entering short-circuit condition when the MCU fault, thereby well its electric current be remained in the safety value of power switch pipe.But this scheme is owing to increased fixing high-power resistance load, be connected in the major loop, increased to a certain extent the power loss of major loop, therefore greatly reduce the operating efficiency of complete machine, and the resistance of this resistance is selected the corresponding increase of difficulty meeting, simultaneously with the increase of power, the heating of resistance itself and volume also are the problems that must consider.
Method two
The output of MCU or drive IC external operational amplifier or comparator; overall height level or complete low level problem may appear when breaking down according to prime; can adopt such as Fig. 7, the scheme shown in Figure 8 (protective circuit shown in the overall height level map interlinking 7; protective circuit shown in the full low level map interlinking 8), make triode Q by the output of operational amplifier or comparator
5Smoothly conducting; overall height or complete low power switch pipe fault driving signal directly can be drawn ground; this fault-signal is pulled down to by force near zero level; thereby make terminal power switch pipe because being in cut-off state without drive level; this moment, its D-S was equivalent to the disconnection of switch; thereby the overall height level when having avoided this power switch pipe to hinder for some reason opens that electric current to occur excessive and cause damage, has played protective effect to a certain degree.But this scheme be because the high/low level during to the prime fault can only carry out individual event selects, when MCU or drive IC break down, actually or just be difficult to determine its output characteristic high level low level.So its service condition is restricted, be unfavorable for really dealing with problems.
Method three
In traditional complementary push-pull formula drive circuit; such as Fig. 9, shown in Figure 10; the driving transformer of an isolation usefulness of serial connection; when prime MCU or drive IC break down; the overall height of output or entirely low fault drive signal can't be by driving transformer (transformer has the characteristic of logical high frequency resistance low frequency, logical interchange stopping direct current) because of acrotism momentum (D. C. value); make terminal power switch pipe because being in cut-off state without driving signal; thereby can avoid the generation of the above overcurrent phenomenon, play protective effect to a certain degree.But this scheme rises and drives and the transformer of buffer action because having increased by one, and (when drive circuit works during at the low frequency state, transformer is low because of frequency, according to the principle＜X of induction reactance so that the volume and weight in whole driving loop greatly increases
L=2 π fL〉as can be known, its volume and weight will be multiplied), cost is also corresponding increase certainly, and can't determine because of the frequency that drives signal, so that the type selecting of transformer faces actual difficulty equally.In brief, two practical problems of this of existence can say that so that the scope of application of this scheme is restricted this scheme also fails fundamentally to overcome the above problems.
Summary of the invention
To be solved in the utility model is that the control circuit of existing anti-MCU or drive IC the fault complex structure, the cost that exist are higher, volume is larger, and a series of Related Technical Issues such as technical feasibility is poor provide a kind of clock circuit that can carry out sample-pulse signal conversion and control to MCU or the drive IC fault of input stage.
Solving the problems of the technologies described above the technical scheme that adopts is: the lock-out pulse control circuit of anti-MCU or drive IC fault, comprise signal sample circuit, lock-out pulse change-over circuit and shaping control signal output circuit, and it is characterized in that:
Described sample circuit is sampled and the amplitude adjustment to the output voltage signal of MCU or drive IC, and output sampled voltage signal is to the lock-out pulse change-over circuit;
Described lock-out pulse change-over circuit will arrive with the normal burst sampled voltage signal coupling of Duty ratio control the input of shaping control signal output circuit, block simultaneously the DC Line Fault voltage signal;
Described shaping control signal output circuit comprises shaping circuit, control circuit and a clamping diode, described shaping circuit will be exported to control circuit after the normal burst sampling coupled voltages signal shaping with Duty ratio control, control circuit output high level, the clamping diode cut-off; When the input of control circuit was low level, the control circuit output low level made the clamping diode conducting, and the control end that described clamping diode will be led the complementary push-pull formula power amplification circuit that drives the loop is clamped on zero potential.
The lock-out pulse control circuit of anti-MCU of the present utility model or drive IC fault, when MCU or drive IC normal operation, output is with the normal burst voltage signal of Duty ratio control.Described sample circuit is sampled and the amplitude adjustment to the output voltage signal of MCU or drive IC, and output sampled voltage signal is to the lock-out pulse change-over circuit; Described lock-out pulse change-over circuit will arrive with the normal burst sampled voltage signal coupling of Duty ratio control the input of shaping control signal output circuit; Described shaping control signal output circuit will be with after the signal shaping of the normal burst of Duty ratio control sampling coupled voltages, by control circuit output high level, clamping diode cut-off.At this moment, the lock-out pulse control circuit of anti-MCU of the present utility model or drive IC fault can not exert an influence to the main complementary push-pull formula power amplification circuit that drives the loop.
When MCU or drive IC break down, output overall height level or full low level.When being output as the overall height level, sample circuit carries out phse conversion to the output voltage signal of MCU or drive IC.Therefore, no matter false voltage is overall height level or full low level, and the sampled voltage signal of exporting from sample circuit is low level.The lock-out pulse change-over circuit is blocked d. c. voltage signal, and its output also is low level.Shaping control signal output circuit output low level makes the clamping diode conducting, and the control end that described clamping diode will be led the complementary push-pull formula power amplification circuit that drives the loop is clamped on zero potential.
The lock-out pulse control circuit of anti-MCU of the present utility model or drive IC fault, do not affecting overall efficiency, and do not affect under the prerequisite of overall performance, carry out Simultaneous Monitoring by the operating state to prime MCU or drive IC, prevent that final stage power switch pipe when prime breaks down from entering the short-circuit condition of full duty ratio conducting, can make the driving semaphore lock of output in a very safe scope, thereby solved the MCU or the drive IC fault that occur under the improper reason, the serious electrically problems such as aircraft bombing of having avoided this fault to cause produce.In addition, the utility model neither needs to adopt any isolation drive transformer, can be applicable to again in the drive circuit of various frequencies, and can carry out Synchronization Control to the height fault level of input.In one word, this circuit utility model has three quantum jumps point technically: followability is good, good reliability, with low cost.
According to the utility model, described sample circuit is pure resistor element circuit, perhaps is operation amplifier circuit, comparator circuit, transistor circuit, MOSFET circuit or IGBT circuit any logic control pipe circuit wherein.
According to the utility model, described lock-out pulse change-over circuit comprises pulse-couple electric capacity.Described pulse-couple electric capacity is electrochemical capacitor or polarity free capacitor, and quantity is one or more.Further, when the RC of lock-out pulse change-over circuit burst length constant greater than T
SDuring the sampled signal pulsewidth, described pulse-couple electric capacity two ends positive pulse fly-wheel diode in parallel, negative pulse fly-wheel diode of series connection between the output of described pulse-couple electric capacity and the ground, and the plus earth of described negative pulse fly-wheel diode.Described negative pulse fly-wheel diode and positive pulse fly-wheel diode can effectively be blocked low-frequency voltage and pass through.
According to the utility model, the shaping circuit of described shaping control signal output circuit is one or more levels RC integrating circuit.
According to the utility model, the control circuit of described shaping control signal output circuit is operation amplifier circuit or comparator circuit, perhaps is the combination of transistor circuit, MOSFET circuit or IGBT circuit any two/kind logic control pipe circuit wherein.The control circuit of this structure can guarantee that its input and output keep the same-phase state.
Description of drawings
The utility model is described in further detail below in conjunction with drawings and Examples.
Fig. 1, Fig. 2 are that the complementary push-pull formula drive circuit of inputting is amplified in traditional swinging to triode.
Fig. 3, Fig. 4 are traditional complementary push-pull formula drive circuits with operational amplifier/comparator input.
Fig. 5, Fig. 6 are the drive circuits that increases endways high-power current-limiting resistance in the power switch pipe major loop.
Fig. 7, Fig. 8 are the drive circuits that adopts the low fault level detection of single overall height/entirely or protection.
Fig. 9, Figure 10 are the complementary push-pull formula drive circuits that adopts the isolated driving transformer of string.
Figure 11, Figure 12, Figure 13, Figure 14 are the lock-out pulse control circuits that the utility model adopts the dual operational amplifier input and output.
Figure 15, Figure 16 are the lock-out pulse control circuits that the utility model adopts the tandem transistor input and output.
Figure 17, Figure 18 are that the utility model adopts single operational amplifier and monocrystal triode as the lock-out pulse control circuit of input and output.
Embodiment
Embodiment one
Implementation of the present utility model is just like shown in the control circuit in Figure 11 dotted line frame.Lock-out pulse control circuit of the present utility model comprises signal sample circuit, lock-out pulse change-over circuit and shaping control signal output circuit.
Described signal sample circuit is by operational amplifier OPAMP1 and the peripheral circuit that is comprised of resistance R 1, R2, R3 and R4.Wherein: the series circuit that divider resistance R2 and R3 consist of provides reference voltage to the input negative terminal of operational amplifier OPAMP1; The output of resistance R 1 one termination MCU or drive IC, the input anode of another termination operational amplifier OPAMP1; The output of one termination operational amplifier OPAMP1 of resistance R 4.
Described lock-out pulse change-over circuit comprises pulse-couple capacitor C 1, the pulse-couple capacitor C
1Left end connect the output (being the other end of resistance R 4) of pulse signal sampling, right-hand member connects the input of pulse shaper.Pulse-couple capacitor C wherein
1Also can substitute (containing electrochemical capacitor and polarity free capacitor etc.) with the electric capacity of other specifications.
Described shaping control signal output circuit comprises shaping circuit, control circuit and a clamping diode D3.Described shaping circuit is a two-stage RC integrating circuit that is made of resistance R 5, capacitor C 2, resistance R 6 and capacitor C 3.Described control circuit comprises operational amplifier OPAMP2 and the peripheral circuit that is made of resistance R 7, R8, R9 and R10, and wherein: the series circuit that divider resistance R9 and R10 consist of provides reference voltage to the input negative terminal of operational amplifier OPAMP2; The input anode of the termination operational amplifier OPAMP2 of resistance R 7 and R8, the other end of resistance R 7 and R8 is not connected to the two ends of the capacitor C 3 in the integrating circuit of the second level.The negative electrode of clamping diode D3 connects the output of operational amplifier OPAMP2, and anode connects the control end of complementary push-pull formula power amplification circuit.
When MCU or drive IC fault-free, in resistance R
1Left end will occur driving signal with the normal burst of Duty ratio control, OPAMP1 takes a sample through operational amplifier, by the pulse-couple capacitor C
1Be coupled to the input (electric capacity has logical high frequency resistance low frequency, the logical characteristic that exchanges stopping direct current, Xc=1/2 π fC) of pulse shaper, pass through again resistance R
5, capacitor C
2, resistance R
6, capacitor C
3The twin-stage integrating circuit that forms is delivered to the input of operational amplifier OPAMP1, so its output will obtain the high level synchronous with MCU or drive IC, clamping diode D
3Anti-partially cut-off, this synchronization control circuit can not exert an influence to the driving major loop of normal operation.When MCU or drive IC break down, resistance R
1On will detect a fault level (overall height level or full low level), carry out phase-detection by operational amplifier OPAMP1, deliver to the pulse-couple capacitor C
1Left end, because of the pulse-couple capacitor C
1The logical characteristic that exchanges stopping direct current is arranged, the overall height that prime is sent here or entirely low DC level can't deliver to rear class.Simultaneously, pulse shaper passes through operational amplifier OPAMP2 output low level, clamping diode D because of without the input signal output low level
3Conducting is pulled low to zero level with the input that drives the complementary push-pull power amplification circuit in the major loop, and the power switch pipe of final stage is in cut-off state because nothing drives signal, thereby has played the Synchronization Control effect.
The utility model is not affecting under overall efficiency and the electrical prerequisite, and the final stage power switch pipe is because of the excessive problem of damaging of electric current thereupon when having solved prime MCU or drive IC and breaking down.In brief, it is good that this circuit has followability, good reliability, the advantage such as with low cost.
On this basis, when the RC of lock-out pulse change-over circuit burst length constant greater than T
SDuring the sampled signal pulsewidth, described pulse-couple capacitor C 3 two ends positive pulse sustained diode 1 in parallel, negative pulse sustained diode 2 of series connection between the output of described pulse-couple capacitor C 1 and the ground, and the plus earth of described negative pulse sustained diode 2.Described negative pulse sustained diode 1 and positive pulse sustained diode 2 can effectively be blocked low-frequency voltage and pass through.
Embodiment two
With reference to Figure 12, present embodiment is the improvement on Figure 11 embodiment basis.Be that with Figure 11 embodiment difference described signal sample circuit is made of resistance R 4, all the other structures are identical with Figure 11 embodiment.
Embodiment three
With reference to Figure 13, present embodiment is the improvement on Figure 11 embodiment basis.Be that with Figure 11 embodiment difference described shaping circuit adopts one-level RC integrating circuit, namely consisted of by resistance R 5 and capacitor C 2 that all the other structures are identical with Figure 11 embodiment.
Embodiment four
Improvement on Figure 13 embodiment basis with reference to Figure 14 present embodiment.Be that with Figure 13 embodiment difference described signal sample circuit is made of resistance R 4, all the other structures are identical with Figure 13 embodiment.Embodiment five
With reference to Figure 15, another implementation of the present utility model.In the present embodiment, the main power switch pipe control end that drives the loop final stage adopts PNP triode discharge type.Lock-out pulse control circuit of the present utility model comprises signal sample circuit, lock-out pulse change-over circuit and shaping control signal output circuit.
Described signal sample circuit comprises triode Q1 and the peripheral circuit that is comprised of resistance R 1, R2, R3 and R4.One termination MCU of described resistance R 1 or the output of drive IC, the base stage of another termination triode Q1; The collector electrode connecting resistance R2 of triode Q1 and the end of R4, another termination power VCC1 of resistance R 2.
Described lock-out pulse change-over circuit comprises pulse-couple capacitor C 1, the pulse-couple capacitor C
1Left end connect the output (being the other end of resistance R 3) of pulse signal sampling, right-hand member connects the input of pulse shaper.Pulse-couple capacitor C wherein
1Also can substitute (containing electrochemical capacitor and polarity free capacitor etc.) with the electric capacity of other specifications.When the RC of lock-out pulse change-over circuit burst length constant greater than T
SDuring the sampled signal pulsewidth, described pulse-couple capacitor C 3 two ends positive pulse sustained diode 1 in parallel, negative pulse sustained diode 2 of series connection between the output of described pulse-couple capacitor C 1 and the ground, and the plus earth of described negative pulse sustained diode 2.
Described shaping control signal output circuit comprises shaping circuit, control circuit and a clamping diode D3.Described shaping circuit is a two-stage RC integrating circuit that is made of resistance R 5, capacitor C 2, resistance R 6 and capacitor C 3.Described control circuit comprises triode Q2, triode QA, resistance R 7, R8 and RA.The base stage connecting resistance R6 of triode Q2 and the end of R7, the other end of emitter connecting resistance R7, the emitter of triode QA and ground, the base stage of base stage connecting resistance R8 and triode QA; An end and the power supply VCC1 of the other end connecting resistance RA of resistance R 8; The other end of the collector electrode connecting resistance RA of triode QA and the negative electrode of clamping diode D3; The anode of clamping diode D3 connects the control end of complementary push-pull formula power amplification circuit.
When MCU or drive IC break down, in resistance R
1On will obtain an overall height or complete low DC level, by sampling triode Q
1After the paraphase, from its C utmost point output, because of the pulse-couple capacitor C
1The logical characteristic that exchanges of stopping direct current is arranged, and this fault DC level can't be passed through the pulse-couple capacitor C
1In addition because the positive pulse sustained diode
1Be in anti-partially state, the fault high level also can't be by the pulse sustained diode
1Be sent to rear class, make triode Q
2The forward voltage sent here because of the no pulse shaping circuit of the b utmost point be in cut-off state, triode Q
2C utmost point output high level so that control triode Q
AThe b utmost point present high level, triode Q
AConducting, its c is low level very, clamping diode D
3Conducting; the input of complementary push-pull power amplifier is pulled to close to zero potential; make the final stage power switch pipe because being in off-state without driving voltage; thereby played the lock-out pulse control action; protected late-class circuit to be unlikely to damage because electric current is excessive, wherein the master power switch pipe of final stage also can use triode, MOSFET, IGBT device to replace.
Embodiment six
With reference to Figure 14, another execution mode of the present utility model.The difference of the execution mode of present embodiment and Figure 15 is: one, and what the main power switch pipe control end that drives the loop final stage adopted is the conductive discharge form; Another place is the pulse shaper of synchronizing control loop, and Figure 15 has adopted two-stage RC integrating circuit, and present embodiment has adopted one-level RC integrating circuit, and the RC integrating circuit that wherein relates to pulse converter is available multistage the replacement also.All the other structures are identical with the execution mode of Figure 15.
Embodiment seven
With reference to Figure 17, the another execution mode of the utility model after improve on Figure 15 execution mode basis.Be that with Figure 15 execution mode difference sample circuit is by operational amplifier OPAMP1 and the peripheral circuit that is comprised of resistance R 1, R2, R3 and R4.Wherein: the series circuit that divider resistance R2 and R3 consist of provides reference voltage to the input negative terminal of operational amplifier OPAMP1; The output of resistance R 1 one termination MCU or drive IC, the input anode of another termination operational amplifier OPAMP1; The output of one termination operational amplifier OPAMP1 of resistance R 4, an end of another termination pulse-couple capacitor C 1.All the other structures are identical with Figure 15 execution mode.
The master control device of the input sampling circuit in the lock-out pulse control circuit and output control circuit also can adopt triode, MOSTET pipe and operational amplifier (containing comparator) to substitute.
When MCU or drive IC are working properly, be subjected to the pulse signal of Duty ratio control through resistance R
1Deliver to the pulse-couple capacitor C with input sampling circuit
1Left end, because of the pulse-couple capacitor C
1Logical high frequency resistance low frequency is arranged, the logical characteristic that exchanges stopping direct current, this pulse signal is through pulse coupling capacitance C
1Deliver to pulse shaper, the output high level makes clamping diode D
3Negative terminal present high level, clamping diode D
3Cut-off, inoperative to the main driving loop of normal operation.When MCU or drive IC operation irregularity (fault), in resistance R
1On will obtain an overall height or complete low DC level, deliver to every straight diode C by sampling triode (sampling operational amplifier or comparator)
1Left end, because this fault sampled signal is overall height or complete low DC level, can't be through every straight diode C
1Be sent to rear class, pulse shaper is because of can't the input signal output low level, and output control valve output low level adds to clamping diode D
3Negative terminal, clamping diode D
3Be in the positively biased conducting state, thereby will lead the input that drives the loop is pulled to close to zero potential, the final stage power switch pipe is because being in passive off-state without driving signal, be equivalent to the disconnection of switch, play the lock-out pulse control action of anti-MCU or drive IC fault, reached the technical indicator that requires.
Embodiment eight
With reference to Figure 18, the utility model is improved another execution mode on Figure 17 basis.Be with Figure 17 execution mode difference: one, the power switch pipe control end that the master of Figure 17 drives the loop final stage adopts PNP triode discharge type, and the power switch pipe control end employing of the main driving loop final stage of present embodiment is the conductive discharge form; Another place is the pulse shaper of synchronizing control loop, and Figure 17 has adopted two-stage RC integrating circuit, and present embodiment has then adopted one-level RC integrating circuit, and the RC integrating circuit that wherein relates to pulse converter is available multistage the replacement also.
What should be understood that is: above-described embodiment is just to explanation of the present utility model, rather than to restriction of the present utility model, any utility model that does not exceed in the utility model connotation scope is created, and all falls within the protection range of the present utility model.
Claims (7)
1. the lock-out pulse control circuit of anti-MCU or drive IC fault comprises signal sample circuit, lock-out pulse change-over circuit and shaping control signal output circuit, it is characterized in that:
Described sample circuit is sampled and the amplitude adjustment to the output voltage signal of MCU or drive IC, and output sampled voltage signal is to the lock-out pulse change-over circuit;
Described lock-out pulse change-over circuit will arrive with the normal burst sampled voltage signal coupling of Duty ratio control the input of shaping control signal output circuit, block simultaneously the DC Line Fault voltage signal;
Described shaping control signal output circuit comprises shaping circuit, control circuit and a clamping diode, described shaping circuit will be exported to control circuit after the normal burst sampling coupled voltages signal shaping with Duty ratio control, control circuit output high level, the clamping diode cut-off; When the input of control circuit was low level, the control circuit output low level made the clamping diode conducting, and the control end that described clamping diode will be led the complementary push-pull formula power amplification circuit that drives the loop is clamped on zero potential.
2. the lock-out pulse control circuit of anti-MCU as claimed in claim 1 or drive IC fault, it is characterized in that described sample circuit is pure resistor element circuit, perhaps is operation amplifier circuit, comparator circuit, transistor circuit, MOSFET circuit or IGBT circuit any logic control pipe circuit wherein.
3. the lock-out pulse control circuit of anti-MCU as claimed in claim 1 or drive IC fault is characterized in that described lock-out pulse change-over circuit comprises pulse-couple electric capacity.
4. the lock-out pulse control circuit of anti-MCU as claimed in claim 4 or drive IC fault is characterized in that described pulse-couple electric capacity is electrochemical capacitor or polarity free capacitor, and quantity is one or more.
5. the lock-out pulse control circuit of anti-MCU as claimed in claim 4 or drive IC fault, it is characterized in that described pulse-couple electric capacity two ends positive pulse fly-wheel diode in parallel, negative pulse fly-wheel diode of series connection between the output of described pulse-couple electric capacity and the ground, and the plus earth of described negative pulse fly-wheel diode.
6. the lock-out pulse control circuit of anti-MCU as claimed in claim 1 or drive IC fault is characterized in that the shaping circuit of described shaping control signal output circuit is one or more levels RC integrating circuit.
7. the lock-out pulse control circuit of anti-MCU as claimed in claim 1 or drive IC fault, the control circuit that it is characterized in that described shaping control signal output circuit is operation amplifier circuit or comparator circuit, perhaps is the combination of transistor circuit, MOSFET circuit or IGBT circuit any two logic control pipe circuit wherein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220266556 CN202679330U (en) | 2012-06-04 | 2012-06-04 | Synchronous pulse control circuit preventing fault of MCU and driver IC |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220266556 CN202679330U (en) | 2012-06-04 | 2012-06-04 | Synchronous pulse control circuit preventing fault of MCU and driver IC |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202679330U true CN202679330U (en) | 2013-01-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220266556 Withdrawn - After Issue CN202679330U (en) | 2012-06-04 | 2012-06-04 | Synchronous pulse control circuit preventing fault of MCU and driver IC |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102684652A (en) * | 2012-06-04 | 2012-09-19 | 浙江榆阳电子有限公司 | Synchronous pulse control circuit for preventing faults of microprogrammed control unit (MCU) or driving integrated circuit (IC) |
| CN108696267A (en) * | 2017-04-12 | 2018-10-23 | 赤多尼科两合股份有限公司 | A kind of field-effect tube driving device, driving method and for electric installation |
-
2012
- 2012-06-04 CN CN 201220266556 patent/CN202679330U/en not_active Withdrawn - After Issue
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102684652A (en) * | 2012-06-04 | 2012-09-19 | 浙江榆阳电子有限公司 | Synchronous pulse control circuit for preventing faults of microprogrammed control unit (MCU) or driving integrated circuit (IC) |
| CN102684652B (en) * | 2012-06-04 | 2015-11-18 | 浙江榆阳电子有限公司 | The synchronized-pulse control circuit of anti-MCU or drive IC fault |
| CN108696267A (en) * | 2017-04-12 | 2018-10-23 | 赤多尼科两合股份有限公司 | A kind of field-effect tube driving device, driving method and for electric installation |
| CN108696267B (en) * | 2017-04-12 | 2021-11-30 | 赤多尼科两合股份有限公司 | Driving device and driving method of field effect transistor and power supply device |
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