CN201945438U - Testing device for single point PBS prism - Google Patents

Testing device for single point PBS prism Download PDF

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Publication number
CN201945438U
CN201945438U CN2010206188952U CN201020618895U CN201945438U CN 201945438 U CN201945438 U CN 201945438U CN 2010206188952 U CN2010206188952 U CN 2010206188952U CN 201020618895 U CN201020618895 U CN 201020618895U CN 201945438 U CN201945438 U CN 201945438U
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CN
China
Prior art keywords
prism
diaphragm
pbs
single point
light
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Expired - Fee Related
Application number
CN2010206188952U
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Chinese (zh)
Inventor
马新建
黄文华
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Fujian Castech Crystals Inc
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Fujian Castech Crystals Inc
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Priority to CN2010206188952U priority Critical patent/CN201945438U/en
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Publication of CN201945438U publication Critical patent/CN201945438U/en
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Abstract

A testing device for single point PBS prism is disclosed. In order to test the intensity of spot P and spot S of single point or narrow band PBS prism, a bias opening device based on Glam Taylor prism is routinely used to capture the P-light and S-light to measure the prism products. Such a technique has its advantages in measuring broad band products with normal index; however it fails to ensure high precision measurement of single point or narrow band PBS prisms. The testing device of this utility model has a broad band PBS prism with high light extinction ratios disposed tightly against the diaphragm on one side, and a prism ready for measurement disposed tightly against the diaphragm on the other side. The two sides of the diaphragm are in parallel and in perpendicular to the testing table. The device can be used to reach high precision of PBS testing.

Description

A kind of single-point PBS prism proving installation
[technical field]
The invention belongs to the optic test field, specifically refer to a kind of single-point PBS prism proving installation.
[technical background]
When film tilt to use since electric field and the tangential component of magnetic field on each interface continuously-so the effective refractive index of p component and s component different this will be produced polarization separation inevitably.Around this principle can make various polarizing beam splitter mirrors.Polarization beam splitter prism both had been different from based on the Nicol prism O light of birefringence principle and e light and had had a fixing shooting angle, be different from the polaroid that absorbs based on selectivity again, it has the characteristics of low-loss and design of Optical System dirigibility, thereby polarization beam splitter prism is widely used in the optoisolator and systems such as optical circulator/silicon liquid crystal light valve and fiber-Optic Voltage Sensors of TV projection system/Fiber Optical Communication System.
In PBS prism prism manufacturing process, the P light of single-point or narrow wave band PBS prism prism and S light intensity are important indicators, classic method is the P light and the S light intensity of test single-point or narrow wave band PBS prism prism, typically uses one and obtains P light based on the inclined to one side device of opening of Glan Taylor prism and S light is measured prism product to be tested.Test has certain advantage to existing method to the broadband product conventional index, but the high precision measurement of single-point that high target is required or narrow wave band PBS prism prism is unable to do what one wishes a bit.This also is the problem that will solve.
[summary of the invention]
The present invention is characterised in that the broadband P BS prism prism of a High Extinction Ratio is close to diaphragm and is placed on a side, prism to be tested is close to diaphragm places an other side.It is characterized in that diaphragm two surfaces are parallel, and this Surface Vertical is in test board.But because this broadband P BS prism prism and PBS prism prism coordination to be measured processing, thus can obtain highly purified P light (or) S light, prism to be tested then is close to diaphragm and is placed other side, so just can test to obtain Tp (or Ts).
[description of drawings]
Figure one is a kind of single-point PBS prism proving installation
[embodiment]
Embodiment one: as shown in Figure 1, diaphragm 1 is fixed on the test board 3, guarantee that diaphragm two surfaces are parallel, and guarantee that two Surface Vertical are in test board, the broadband P BS prism prism 2 of one High Extinction Ratio is positioned over diaphragm one side as the polarizer, thereby obtain highly purified P light, prism 4 to be tested then is close to the diaphragm opposite side and is placed.Thereby test obtains Tp or Ts.Test result shows that this method measuring accuracy will be higher than classic method.

Claims (2)

1. single-point PBS prism proving installation, the broadband P BS prism prism that it is characterized in that a High Extinction Ratio is close to diaphragm and is placed on a side, prism to be tested is close to diaphragm places an other side.
2. a kind of according to claim 1 single-point PBS prism proving installation it is characterized in that diaphragm two surfaces are parallel, and this Surface Vertical is in test board.
CN2010206188952U 2010-11-22 2010-11-22 Testing device for single point PBS prism Expired - Fee Related CN201945438U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010206188952U CN201945438U (en) 2010-11-22 2010-11-22 Testing device for single point PBS prism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010206188952U CN201945438U (en) 2010-11-22 2010-11-22 Testing device for single point PBS prism

Publications (1)

Publication Number Publication Date
CN201945438U true CN201945438U (en) 2011-08-24

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010206188952U Expired - Fee Related CN201945438U (en) 2010-11-22 2010-11-22 Testing device for single point PBS prism

Country Status (1)

Country Link
CN (1) CN201945438U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103411752A (en) * 2013-07-05 2013-11-27 中国科学院苏州生物医学工程技术研究所 Simple and automated polarization test system of a semiconductor laser

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103411752A (en) * 2013-07-05 2013-11-27 中国科学院苏州生物医学工程技术研究所 Simple and automated polarization test system of a semiconductor laser

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C14 Grant of patent or utility model
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C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110824

Termination date: 20131122