CN201514460U - Test device for voice type integrated circuit - Google Patents
Test device for voice type integrated circuit Download PDFInfo
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- CN201514460U CN201514460U CN2009201314354U CN200920131435U CN201514460U CN 201514460 U CN201514460 U CN 201514460U CN 2009201314354 U CN2009201314354 U CN 2009201314354U CN 200920131435 U CN200920131435 U CN 200920131435U CN 201514460 U CN201514460 U CN 201514460U
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Abstract
The utility model discloses a test device for a voice type integrated circuit, which comprises a processing unit, a communication unit, an excitation unit, a function test unit, and a comparison unit, wherein the communication unit is used for setting a probe station, is connected with the processing unit, and comprises a port connected with the probe station; the excitation unit outputs voltages to test the current of the tested voice type integrated circuit or outputs currents to test the voltage of the tested voice type integrated circuit, and is connected with the processing unit; the function test unit simultaneously sends out test signals to the tested voice type integrated circuit and a standard sample, and is connected with the processing unit, the tested voice type integrated circuit and the standard sample; and the comparison unit compares the outputs of the tested voice type integrated circuit and the standard sample, and feeds back the comparison results to the processing unit. The test device can greatly improve the test efficiency and reduce the test cost.
Description
Technical field
The utility model relates to the chip testing field, particularly relates to the proving installation of voice integrated circuit.
Background technology
The rise of infotech derives the market demand to various semi-conductor chips (integrated circuit); The requirement for the service efficiency of the pin usefulness of complex semiconductor chip structure and silicon material I/O simultaneously becomes higher.Therefore, before these chips dispatch from the factory, all need satisfactory testing apparatus that it is tested, whether meet the demands with circuit and the system that detects these chips.
The test of semi-conductor chip needs special tester and probe station.Place the chip that needs test on the probe station, the then collaborative probe station of tester is tested described chip.Because semi-conductor chip is of a great variety, various chip may need different testers and method to test.
Detection in the semiconductor production process generally is divided into three major types:
1. parameter detection: provide the equipment energy characteristic during the manufacturing to measure;
2. based on the probe of wafer (wafer sort) of probe station: when manufacturing finish to encapsulate before, proving installation function on a series of wafer;
3. encapsulation back test (Final Test): before client is given in shipment, the device that encapsulation is finished is done last test.
After wafer put into probe station, after probe station moved to the correct corresponding position of probe with wafer, probe station can upwards move wafer, make its electric be connected in tester on probe contact, to survey.When test is finished, then can automatically next one wafer to be measured be substituted into below the probe, circulating so again and again.
Because existing chip becomes increasingly complex, the process of its test is also corresponding time-consuming, and the method for test also only limits to several, often adopts method of testing by turn in surveying based on the wafer-process of probe station, and quite consuming time, testing cost is higher.
The utility model content
The technical matters that the utility model mainly solves provides a kind of proving installation of voice integrated circuit, can significantly improve testing efficiency, reduce testing cost.
For solving the problems of the technologies described above, the technical scheme that the utility model adopts is: a kind of proving installation of voice integrated circuit is provided, comprises: processing unit; To the communication unit that probe station is provided with, it connects described processing unit, and comprises the port that is connected with described probe station; Output voltage carries out testing current for tested voice integrated circuit or output current carries out the exciting unit of voltage tester for described tested voice integrated circuit, and it connects described processing unit; Respectively to the functional test unit that described tested voice integrated circuit and standard model send test massage, it connects described processing unit, described tested voice integrated circuit and standard model simultaneously; Whether the output of more described tested voice integrated circuit and standard model is identical and comparative result is fed back to the comparing unit of described processing unit.
Wherein, further comprise the general-purpose serial bus USB interface card that connects described processing unit.
Wherein, described usb card comprises interface, USB module, on-site programmable gate array FPGA state machine and the data command parsing module that connects successively, described processing unit comprises data module and command module, described data module is connected described FPGA state machine and data command parsing module respectively with command module, and described data module is connected described communication unit, exciting unit, functional test unit respectively with command module.
Wherein, described communication unit comprises the isolator of isolating signal interference between described processor and the probe station.
Wherein, described isolator is an optical coupling isolator.
Wherein, described communication unit comprises the switch that described communication unit is switched to the different probe platform.
Wherein, described communication unit is a transistor-transistor logic circuit TTL communication unit, and described exciting unit is unit TMU test cell actuation time.
Wherein, be solidified with the program of independent and described communication unit communication in the described processing unit.
The beneficial effects of the utility model are: be different from prior art and adopt by turn the method for testing measuring semiconductor and cause testing efficiency low, the testing cost condition with higher, the utility model adopts exciting unit to come output voltage or electric current to give tested voice integrated circuit so that test condition to be provided, adopt the functional test unit to send test massage to tested voice integrated circuit and standard model respectively simultaneously then, adopt comparing unit to come more above-mentioned tested voice integrated circuit and both output of standard model whether identical at last, the identical normal result of tested voice integrated circuit that then draws, otherwise then be judged to problem, the low efficiency problem of avoiding thus testing each the pin output of tested voice integrated circuit by turn and causing, characteristics at voice integrated circuit can once obtain all pin output results of tested integrated circuit, improve testing efficiency greatly, effectively reduce testing cost.
Description of drawings
Fig. 1 is the circuit block diagram of proving installation first embodiment of the utility model voice integrated circuit;
Fig. 2 is the circuit block diagram of proving installation second embodiment of the utility model voice integrated circuit;
Fig. 3 is the circuit block diagram of usb card in the proving installation of the utility model voice integrated circuit;
Fig. 4 is the process flow diagram of the method for testing of the utility model voice integrated circuit.
Embodiment
Consult Fig. 1, the proving installation of the utility model voice integrated circuit mainly comprises:
Processing unit;
To the communication unit that probe station is provided with, it connects described processing unit, and comprises the port that is connected with described probe station;
Output voltage carries out testing current for tested voice integrated circuit or output current carries out the exciting unit of voltage tester for described tested voice integrated circuit, and it connects described processing unit;
Respectively to the functional test unit that described tested voice integrated circuit and standard model send test massage, it connects described processing unit, described tested voice integrated circuit and standard model simultaneously;
Whether the output of more described tested voice integrated circuit and standard model is identical and comparative result is fed back to the comparing unit of described processing unit.
When the proving installation that utilizes the utility model voice integrated circuit is tested tested voice integrated circuit, described processing unit is provided with described probe station by described communication unit, carries out the foundation of some handshake mechanisms and the setting of basic parameter.Described exciting unit to tested voice integrated circuit output voltage or electric current, is set up test environment under the control of described processing unit.Described functional test unit then sends same test signal to described tested voice integrated circuit and standard model respectively simultaneously under the control of described processing unit.The output pin of described tested voice integrated circuit and standard model has corresponding output or no-output respectively.At this moment adopt comparing unit to connect the output pin of described tested voice integrated circuit and standard model, and relatively whether both output is identical, and comparative result is fed back to described processing unit.
Being different from prior art adopts by turn the method for testing measuring semiconductor and causes testing efficiency low, the testing cost condition with higher, the utility model adopts exciting unit to come output voltage or electric current to give tested voice integrated circuit so that test condition to be provided, adopt the functional test unit to send test massage to tested voice integrated circuit and standard model respectively simultaneously then, adopt comparing unit to come more above-mentioned tested voice integrated circuit and both output of standard model whether identical at last, the identical normal result of tested voice integrated circuit that then draws, otherwise then be judged to problem, the low efficiency problem of avoiding thus testing each the pin output of tested voice integrated circuit by turn and causing, characteristics at voice integrated circuit can once obtain all pin output results of tested integrated circuit, improve testing efficiency greatly, effectively reduce testing cost.
This method is not paid close attention to the details in the test process, only pays close attention to last result, thus test speed method of testing is a lot of soon more by turn, thereby reduce the test duration.
In the described whole testing device, processing unit can mainly comprise main control chip, data module and command module.Described main control chip can be single-chip microcomputer, deciphers the sheet choosing by chip select circuit on the hardware, and described data module and command module realize ordering the control with data to transmit jointly.Test command and test procedure can concentrate in the described single-chip microcomputer, and when using single-board testing, it directly accepts and send order and probe station communication, and the control whole test process.Described processing unit can connect other unit by bus.
Consult Fig. 2 and Fig. 3, the utility model is convenient to be used in order to make, and further comprises the general-purpose serial bus USB interface card that connects described processing unit.This interface card can connect computing machine, and the usb communication part in the cooperation Control Software, be mainly used in and become parallel data to send to the address mouth or the data port of described processing unit calculating the data-switching that transmits, and can realize reading at random the data of these two mouths, reach the convenient purpose that connects computing machine, utilizes computing machine readwrite tests data.Described usb card can integrate with the proving installation of the utility model voice integrated circuit.
Consult Fig. 3, during specific implementation, described usb card can comprise interface, USB module, on-site programmable gate array FPGA state machine and the data command parsing module that connects successively.The data module of described processing unit is connected described FPGA state machine and data command parsing module respectively with command module, and described data module is connected described communication unit, exciting unit, functional test unit respectively with command module.
When not using a computer, thus described processing unit can be directly by described communication unit and probe station carry out communication and realize the purpose of test automatically.For realizing automatic test, can be solidified with the program of independent and described communication unit communication in the described processing unit.
For preventing to disturb, described communication unit can comprise isolates the isolator that signal disturbs between described processor and the probe station, such as optical coupling isolator.Can add optical coupling isolator between the TTL communication interface signal of communication unit between processing unit and the probe station isolates.
And described communication unit can also comprise switch, is used for described communication unit is switched to the different probe platform.Such as, can between the communication signal of communication unit, add one group of wire jumper, select the communication signal of its significant level at probe station kind difference, can test two or two above voice integrated circuits simultaneously.
In concrete the application, described communication unit is transistor-transistor logic circuit (TTL) communication unit, and described exciting unit is unit actuation time (TMU) test cell.Described TMU can use two analog-digital chips, by described its output voltage of processing unit regulating and controlling, and gathers voltage and current.
Consult Fig. 4, the utility model also provides a kind of method of testing of voice integrated circuit, comprises step:
401: output voltage carries out testing current for tested voice integrated circuit, or output current carries out voltage tester for described tested voice integrated circuit;
402: when carrying out voltage or testing current, send test massage to described tested voice integrated circuit and standard model respectively simultaneously;
403: whether the output of more described tested voice integrated circuit and standard model is identical, obtains comparative result.
Except that said process, can further include step: described test result is sent by USB interface.
Summary:
1) this proving installation volume is little, and is easy-to-use flexibly;
2) special-purpose method of testing is adopted in functional test, once tests all integrated circuit pins, and test speed is fast;
3) can test two above integrated circuit simultaneously;
4) adopt modular design, can design interface during the each several part co-ordination sentence and make things convenient for communication.
The above only is embodiment of the present utility model; be not so limit claim of the present utility model; every equivalent structure or equivalent flow process conversion that utilizes the utility model instructions and accompanying drawing content to be done; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present utility model.
Claims (7)
1. the proving installation of a voice integrated circuit is characterized in that, comprising:
Processing unit;
To the communication unit that probe station is provided with, it connects described processing unit, and comprises the port that is connected with described probe station;
Output voltage carries out testing current for tested voice integrated circuit or output current carries out the exciting unit of voltage tester for described tested voice integrated circuit, and it connects described processing unit;
Respectively to the functional test unit that described tested voice integrated circuit and standard model send test massage, it connects described processing unit, described tested voice integrated circuit and standard model simultaneously;
Whether the output of more described tested voice integrated circuit and standard model is identical and comparative result is fed back to the comparing unit of described processing unit.
2. the proving installation of voice integrated circuit according to claim 1 is characterized in that: further comprise the general-purpose serial bus USB interface card that connects described processing unit.
3. the proving installation of voice integrated circuit according to claim 2, it is characterized in that: described usb card comprises interface, USB module, on-site programmable gate array FPGA state machine and the data command parsing module that connects successively, described processing unit comprises data module and command module, described data module is connected described FPGA state machine and data command parsing module respectively with command module, and described data module is connected described communication unit, exciting unit, functional test unit respectively with command module.
4. according to the proving installation of each described voice integrated circuit of claim 1 to 3, it is characterized in that: described communication unit comprises isolates the isolator that signal disturbs between described processor and the probe station.
5. the proving installation of voice integrated circuit according to claim 4, it is characterized in that: described isolator is an optical coupling isolator.
6. according to the proving installation of each described voice integrated circuit of claim 1 to 3, it is characterized in that: described communication unit comprises the switch that described communication unit is switched to the different probe platform.
7. according to the proving installation of each described voice integrated circuit of claim 1 to 3, it is characterized in that: described communication unit is a transistor-transistor logic circuit TTL communication unit, and described exciting unit is unit TMU test cell actuation time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201314354U CN201514460U (en) | 2009-05-05 | 2009-05-05 | Test device for voice type integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201314354U CN201514460U (en) | 2009-05-05 | 2009-05-05 | Test device for voice type integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201514460U true CN201514460U (en) | 2010-06-23 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201314354U Expired - Fee Related CN201514460U (en) | 2009-05-05 | 2009-05-05 | Test device for voice type integrated circuit |
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| CN (1) | CN201514460U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102135581A (en) * | 2010-12-21 | 2011-07-27 | 上海华岭集成电路技术股份有限公司 | Method for monitoring probe test utilization rate in real time |
| CN103308844A (en) * | 2012-03-16 | 2013-09-18 | 展讯通信（上海）有限公司 | Testing template, fault location method and debugging methods of control board and clamping apparatus |
| CN107677951A (en) * | 2017-08-29 | 2018-02-09 | 深圳市江波龙电子有限公司 | Die test devices and method |
| WO2019041662A1 (en) * | 2017-08-29 | 2019-03-07 | 深圳市江波龙电子有限公司 | Dram test device and method |
-
2009
- 2009-05-05 CN CN2009201314354U patent/CN201514460U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102135581A (en) * | 2010-12-21 | 2011-07-27 | 上海华岭集成电路技术股份有限公司 | Method for monitoring probe test utilization rate in real time |
| CN103308844A (en) * | 2012-03-16 | 2013-09-18 | 展讯通信（上海）有限公司 | Testing template, fault location method and debugging methods of control board and clamping apparatus |
| CN103308844B (en) * | 2012-03-16 | 2016-03-16 | 展讯通信（上海）有限公司 | The adjustment method of test sample plate, Fault Locating Method, control panel and fixture |
| CN107677951A (en) * | 2017-08-29 | 2018-02-09 | 深圳市江波龙电子有限公司 | Die test devices and method |
| WO2019041662A1 (en) * | 2017-08-29 | 2019-03-07 | 深圳市江波龙电子有限公司 | Dram test device and method |
| WO2019041663A1 (en) * | 2017-08-29 | 2019-03-07 | 深圳市江波龙电子有限公司 | Die test device and method |
| CN107677951B (en) * | 2017-08-29 | 2019-12-06 | 深圳市江波龙电子股份有限公司 | Die testing device and method |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100623 Termination date: 20110505 |