CN201429631Y

CN201429631Y - Memory bar protection test socket

Info

Publication number: CN201429631Y
Application number: CN2009200067843U
Authority: CN
Inventors: 张光荣
Original assignee: Individual
Current assignee: Individual
Priority date: 2009-03-19
Filing date: 2009-03-19
Publication date: 2010-03-24
Anticipated expiration: 2019-03-19

Abstract

The utility model provides a memory bar protection test socket, which comprises memory protecting claps, a contact circuit PCB board and a memory channel connector, wherein the memory channel connector comprises shrapnel terminals and a plastic channel; the contact circuit PCB board is provided with through connection golden fingers, circuits and pads which correspond to the through connection golden fingers one by one; the pads of the through contact PCB board are in correspondingly electric connection with the shrapnel terminals one by one; the outer surface of the memory protecting clap iscovered by an insulating layer or the whole body is made by insulation materials; the memory protecting clap is provided with inversed U-shaped open slots which are used to accommodate a memory bar and the plastic channel, and is further provided with a guide slot which is used for nesting the plastic channel, wherein the shape of the plastic channel is matched with the guide slot and the plasticchannel is movably sleeved in the guide slot; and the lower end of the guide slot extends to form an L-shaped extending part which limits the twist range between the plastic channel and the contact circuit PCB board, thereby the problem that the connection part of the shrapnel terminal and the pad can be damaged due to uneven force or transverse twisting force is effectively solved.

Description

A kind of memory bar protection test bench

Technical field

The utility model relates to a kind of memory bar protection test bench.

Background technology

Computer main board is as a kind of important component of computer, in order to guarantee that its quality and technical parameter reach requirement, the manufacturer will carry out functional test to it, need insert memory bar and can test this moment on the memory slot of mainboard, originally be memory bar directly to be inserted on the memory slot of computer main board or the internal memory switching test seat test, memory bar is exposed outside, damage easily the small components on the memory bar during plug and need reprocess, increased production cost greatly, the memory protect test bench of the integral type of another common usefulness, comprise the memory protect folder, contact circuit pcb board and memory slot connector, wherein the memory slot connector is made up of plastic cement groove and shell fragment terminal, on the contact circuit pcb board golden finger is arranged, circuit and pad; It is the contact circuit plate to be had to be welded on the memory slot connector beyond the pad earlier; plug memory bar again; put into the interior formation four of memory protect folder guide groove then together and connect one; can not break the small components on the memory bar; like this test memory bar has been played very big protective effect; when motherboard is tested; four connect in the draw-in groove that one memory protect test benches directly are inserted in memory slot on the motherboard and the start test; along with the renewal of motherboard design and dwindling of area; memory slot on the motherboard is in continuous increase; become 4 by previous 2; 8 or more; and the spacing between each root memory groove is also being dwindled; add the mass production in market, require testing efficiency more and more higher, so there is following critical defect in existing integral type memory protect test bench:

1. after up to a hundred times of plug test, because of the contact engaging and separating force inequality easily makes shell fragment terminal in the test bench memory slot connector loosening or extract the influence test from root;

2. after up to a hundred times of plug test,, be easy to cause the solder joint of test bench memory slot contained elastic sheet terminal and wiring board PCB pad to come off or perk, the influence test because of the contact engaging and separating force inequality;

3. when in two or many integral type memory protect test benches are inserted in the draw-in groove of motherboard memory slot simultaneously, testing; can produce extruding each other; thereby the shell fragment terminal in influence test or the damage motherboard memory slot mainly is thick partially the causing of thickness of this integral type memory protect test bench.

The utility model content

In order to address the above problem; the technical program provides a kind of long service life; safe and reliable; the memory bar protection test bench that can effectively reduce production costs; improve the durability and the stability of integral type memory protect test bench, thoroughly solve the problem of the influence of the extruding each other test when many integral type memory protect test benches are tested simultaneously.

For achieving the above object; the technical solution of the utility model is: a kind of memory bar protection test bench; comprise the memory protect folder; contact circuit pcb board and memory slot connector; described memory slot connector comprises shell fragment terminal and plastic cement groove; described contact circuit pcb board is provided with the switching golden finger; circuit and by circuit and described switching golden finger pad one to one; the pad of described contact circuit pcb board and the corresponding one by one electrical connection of described shell fragment terminal; described memory protect folder outside surface is provided with insulation course or integral body is the insulation material; described memory protect is folded with the inverted U-shaped open slot that holds memory bar and plastic cement groove; also be provided with the guide groove of nested plastic cement groove; the profile of described plastic cement groove and described guide groove coupling also are movably set in the guide groove, prolong in the lower end of described guide groove and form L shaped extension.

Preferably, described memory protect is folded with at least one louvre.

Preferably, the two ends of described plastic cement groove are provided with the guiding stopper slot with the size match of the memory bar tested.

Preferably, described shell fragment terminal is provided with the arm of force of lengthening.

Preferably, the root of described shell fragment terminal is provided with at least 3 places and punctures fixedly hangnail.

Preferably, also be provided with 2 fuses that are electrically connected in the described circuit on the described contact circuit pcb board.

Preferably, described memory bar protection test bench comprises at least two groups protection folder, contact circuit pcb board and memory slot connector, is tied together by a T-connecting piece between described every group.

Adopt the beneficial effect of the technical program to be: a kind of memory bar protection test bench is provided; the design of L shaped extension; when making memory bar protection test bench inhomogeneous firmly or laterally torsion in use occur; L shaped extension has limited the twisting scope between plastic cement groove and the contact circuit pcb board; thereby effectively solve the problem that the joint portion of shell fragment terminal and pad is caused damage because of inhomogeneous firmly or laterally torsion; and adopt the memory protect folder and the plastic cement groove of this programme thickness effectively can be dwindled; thoroughly solved the problem of mutual extrusion between the memory bar protection test bench arranged side by side when carrying out the mainboard test, the effective protection of memory protect folder memory bar is avoided damaging simultaneously.

In addition; the guiding stopper slot of the size match of the memory bar that the two ends of described plastic cement groove are provided with and are tested; when having limited memory bar insertion memory bar protection test bench completely left or right off normal taking place moves; effectively reduced pressure wearing and tearing wound to the fool proof post that is provided with in the middle of the plastic cement groove; improved the serviceable life of memory bar protection test bench; stop the accident generation that the dislocation mistake is surveyed or memory bar is burnt in short circuit, reduced production cost, improved test correctness and reliability.

Description of drawings

Below in conjunction with the drawings and specific embodiments the utility model is described in further detail.

Fig. 1 is an all directions view of the present utility model;

Fig. 2 is all directions view of the utility model memory slot connector and contact circuit pcb board assembly;

Fig. 3 is all directions view of the utility model memory slot connector;

Fig. 4 is the synoptic diagram of the utility model shell fragment terminal front view and right view;

Fig. 5 is the synoptic diagram of the utility model contact circuit pcb board;

Fig. 6 is the synoptic diagram of the utility model memory protect folder;

Fig. 7 is two groups of synoptic diagram of assembling side by side of the utility model.

Numeral and the represented corresponding component title of letter among the figure:

11. plastic cement groove 111. guiding stopper slots 12. shell fragment terminals 121. puncture fixedly hangnail

2. 21.2 fuses of contact circuit pcb board, 22. pads 23. switching golden fingers

3. memory protect presss from both sides 31. louvres, 32. inverted U-shaped open slot 33. guide grooves

34.L shape extension 4.T shape web member 5. memory bars

Embodiment

Arrive shown in Figure 6 as Fig. 1; a kind of memory bar protection test bench; comprise memory protect folder 3; contact circuit pcb board 2 and memory slot connector; the memory slot connector comprises shell fragment terminal 12 and plastic cement groove 11; the guiding stopper slot 111 of the size match of the memory bar 5 that the two ends of plastic cement groove 11 are provided with and are tested; the root of shell fragment terminal 12 is provided with 4 places and punctures fixedly hangnail 121; plastic cement groove 11 has and runs through the strip groove at two ends up and down; be processed with golden finger corresponding groove with the memory bar 5 that will test at the internal face of groove; shell fragment terminal 12 places groove one by one; 4 places that shell fragment terminal 12 is provided with puncture fixedly hangnail 121 and combine closely with plastic cement groove 11; more solid and reliable than having only two places to puncture the structure of fixing hangnail 121; effectively solved the loosening easily problem of shell fragment terminal 12; in the utility model; the arm of force of shell fragment terminal 12 has extended some than existing product; make that the restoring force of shell fragment terminal 12 is more excellent; make shell fragment terminal 12 more reliable with being electrically connected of memory bar; prolonged serviceable life; contact circuit pcb board 2 is provided with switching golden finger 23 and reaches and golden finger 23 pad 22 one to one of transferring; pad 22 and the corresponding one by one welding in the lower end of shell fragment terminal 12; also be provided with 2 fuses 21 that are electrically connected in the circuit on the contact circuit pcb board 2, not burnt at overcurrent or overvoltage time protection internal memory.

Memory protect folder 3 is to form with aluminium die-casting; thermal treatment and anti-oxidant treatment have been passed through; and do insulation and handle; promptly spray insullac to form a layer insulating in the memory protect clamp surface; memory protect folder 3 is provided with the inverted U-shaped open slot 32 that holds memory bar 5 and plastic cement groove 11; also be provided with the guide groove 33 of nested plastic cement groove 11, the profile of plastic cement groove 11 and guide groove 33 couplings also are movably set in the guide groove 33, prolong in the lower end of guide groove 33 and form L shaped extension 34.

In practical operation; this memory protect test bench be earlier with the shell fragment terminal 12 of memory slot connector one by one correspondence be welded on the pad 22; golden finger with memory bar inserts in the memory bar protection test bench along guiding stopper slot 111 then, and then penetrates the memory protect test bench of 32 li formulas that become one of inverted U-shaped open slot of memory protect folder 3 together.

The setting of louvre 31 can solve the problem of long-time test memory bar warming-up effect test.

Principle of work of the present utility model is, the switching golden finger 23 that inserts the integral type memory bar protection test bench of internal memory is inserted in the memory bank of computer main boards and snap close good, last energized is tested.

As shown in Figure 7; in the foregoing description; can also be connected to an integral body side by side by T shape connector between two memory protect folders 3; like this; two and two above memory protect test benches just can be connected to an integral body side by side; make the insertion in when test and extract all very conveniently, improved testing efficiency, also can connect into integral body equally side by side between same three memory protects folder 3.

4 places that shell fragment terminal 12 of the present utility model is provided with puncture fixedly hangnail 121 also can change 3 or 5 etc. as required into, to satisfy different technology and parameter request.

Adopt the beneficial effect of the technical program to be: a kind of memory bar protection test bench is provided; the design of L shaped extension 34; when making memory bar protection test bench inhomogeneous firmly or laterally torsion in use occur; L shaped extension 34 has limited the twisting scope between plastic cement groove 11 and the contact circuit pcb board 2; thereby effectively solve the problem that the shell fragment terminal 12 and the joint portion of pad 22 is caused damage because of inhomogeneous firmly or laterally torsion; and adopt the memory protect folder 3 and the plastic cement groove 11 of this programme thickness effectively can be dwindled; thoroughly solved the problem of mutual extrusion between the memory bar protection test bench arranged side by side when carrying out the mainboard test, memory protect folder 3 effective protection memory bars are avoided damaging simultaneously.

The two ends of plastic cement groove 11 are provided with the guiding stopper slot 111 with the size match of the memory bar 5 tested in addition; when having limited memory bar 5 insertion memory bar protection test benches completely left or right off normal taking place moves; effectively reduced pressure wearing and tearing wound to the fool proof post that is provided with in the middle of the plastic cement groove 11; improved the serviceable life of memory bar protection test bench; stopped the accident generation that the dislocation mistake is surveyed or memory bar 5 is burnt in short circuit; reduced production cost; test correctness and reliability have been improved; the setting of 2 fuses 21; the accident overcurrent protection further is provided, effectively reduces the risk that internal memory burns.

Above-described only is preferred implementation of the present utility model; should be pointed out that for the person of ordinary skill of the art, under the prerequisite that does not break away from the utility model creation design; can also make some distortion and improvement, these all belong to protection domain of the present utility model.

Claims

1. a memory bar is protected test bench; comprise the memory protect folder; contact circuit pcb board and memory slot connector; described memory slot connector comprises shell fragment terminal and plastic cement groove; described contact circuit pcb board is provided with the switching golden finger; circuit and by circuit and described switching golden finger pad one to one; the pad of described contact circuit pcb board and the corresponding one by one electrical connection of described shell fragment terminal; it is characterized in that; described memory protect folder outside surface is provided with insulation course or integral body is the insulation material; described memory protect is folded with the inverted U-shaped open slot that holds memory bar and plastic cement groove; also be provided with the guide groove of nested plastic cement groove; the profile of described plastic cement groove and described guide groove coupling also are movably set in the guide groove, prolong in the lower end of described guide groove and form L shaped extension.

2. a kind of memory bar protection test bench according to claim 1 is characterized in that described memory protect is folded with at least one louvre.

3. a kind of memory bar protection test bench according to claim 1 is characterized in that the guiding stopper slot of the size match of the memory bar that the two ends of described plastic cement groove are provided with and are tested.

4. according to claim 1,2,3 arbitrary described a kind of memory bar protection test benches, it is characterized in that described shell fragment terminal is provided with the arm of force of lengthening.

5. according to claim 1,2,3 arbitrary described a kind of memory bar protection test benches, it is characterized in that the root of described shell fragment terminal is provided with at least 3 places and punctures fixedly hangnail.

6. according to claim 1,2,3 arbitrary described a kind of memory bar protection test benches, it is characterized in that, also be provided with 2 fuses that are electrically connected in the described circuit on the described contact circuit pcb board.

7. according to claim 1,2,3 arbitrary described a kind of memory bar protection test benches; it is characterized in that; described memory bar protection test bench comprises at least two groups protection folder, contact circuit pcb board and memory slot connector, is tied together by a T-connecting piece between described every group.