CN201229391Y - Circuit board comprising removable gagging point part and test system - Google Patents
Circuit board comprising removable gagging point part and test system Download PDFInfo
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- CN201229391Y CN201229391Y CNU2007200095223U CN200720009522U CN201229391Y CN 201229391 Y CN201229391 Y CN 201229391Y CN U2007200095223 U CNU2007200095223 U CN U2007200095223U CN 200720009522 U CN200720009522 U CN 200720009522U CN 201229391 Y CN201229391 Y CN 201229391Y
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Abstract
The utility model relates to a circuit board and a testing system, wherein the circuit board comprises a test point part which can be removed. The circuit board of the utility model comprises at least one functional part and at least one test point part which can be removed and is attached on at least one functional part, wherein the test point part which can be removed comprises at least one test point, wherein the test point is electrically connected with at least one testing device which is located on the functional part. The test point allows contact to verify whether the functional part works normally or not or whether installed electric components are electrically connected with the circuit board or not. The utility model also provides a testing circuit board which can be allocated and can be adjusted to adapt circuit boards with different sizes or different electric measuring demands. The utility model also provides a system which is used to test the circuit boards.
Description
Technical field
The application relates to and comprises the circuit board that can remove the test point part, relates to the configurable test platform that is used for testing circuit board simultaneously.
Background technology
Circuit board can be used for mechanically supporting and being electrically connected electrical equipment (for example, integrated circuit, resistor, transistor and capacitor) such as printed circuit board (PCB) (PCB), logic card, printed wiring board, etched wiring plate and other known plate.Circuit board typically utilizes one or more layers non-conductive substrate and signal conducting path structure.This signal conducting path may reside in one or more layers or the every layer of non-conductive substrate.Sometimes the signal conductive layer that is known as trace, parts or lead-in wire can be metallic conduction material (for example, copper or gold) or optics conductive material (for example, optical fiber).
Electrical equipment can be installed on the described circuit board by through-hole structure or surface installation structure, and is electrically connected to one or more signal conducting paths by welding.When described electrical equipment by physically and when being electrically connected to described plate, can test with the interconnecting of test example such as signal conducting path and electrical equipment, correct element installation and operation, electromagnetic compatibility, static and discharge and other suitable test parameter.Such test can be undertaken by utilization probe on test point that spreads all over described circuit board or test node.
Test point can be electrically connected to described signal conducting path and therefore can operate to provide test data to the probe that connects on it.Accompanying drawing 1 shows the top view of the simplified block diagram of prior art circuits plate 100, and it has this circuit board 100 funtion part 110 and be arranged in test point 120 (shown in the shadow region) among the funtion part 110.The shortcoming of the test point in the traditional circuit-board as shown in the accompanying drawing 1 is that they have occupied valuable " real estate (real estate) " on circuit board, therefore limited the final functions of use utilization factor of described plate, this utilization factor also will be utilized if it were not for the existence because of described test node.That is to say that test point has occupied the real estate that should be utilized better by electrical equipment.As a result, in the time must testing, test point has limited the convergent-divergent (for example, miniaturization) and the component density of described plate.Therefore, needed be can be not only with the circuit board of the final functions of use utilization factor maximization but also the test point that can be provided for testing.
The test platform that is used for testing on circuit board is known.For example, a kind of known test machine can comprise the probe of computer operation, and this probe can be shifted to another test point from a test point.Yet such test platform may need complicated and expensive Robotics that described test probe is moved to particular location on the circuit board.In addition, such Robotics may need to be used for the complex control software of every tested circuit board.Test platform unlike flexible other based on the test platform of Robotics comprises that the specialized designs of customization is used to test the test platform of particular circuit boards.Such platform can comprise top test panel and bottom test panel, include specific arrangement on it with described circuit board on the contacted probe of test point.The shortcoming of the platform of these customizations is high manufacturing cost, limited life-span and can not tests more than a kind of circuit board.Therefore, needed is the general test platform that can test the number of different types circuit board.
The utility model content
It is a kind of both with final functions of use utilization factor maximization, the circuit board of the test point that can be provided for testing again that the utility model provides.In circuit board of the present utility model, final functions of use utilization factor is maximized and provides test point, and this circuit board is constructed to comprise funtion part and at least one removable test node part according to principle of the present utility model.As herein defined, described funtion part is the part that circuit board can be used for (for example in the consumption electric device) final use.For example, described funtion part can comprise the realization necessary electrical equipment of final use (for example, processor, storer, battery, capacitor etc.).The described test node of removing partly comprises test node, and the signal conducting path that described test node is electrically connected in the funtion part for example carries out desired test at test position to funtion part with permission.After having finished desired test, described part that can be removed can be removed, and only stays the funtion part that is used for final use thus.
The utility model provides other circuit board, and it comprises the two or more funtion parts that can remove the test point part of sharing.The test point the removed part that is shared can be used as bridge, and this bridge can serve as interconnective structure, is used to make circuit board can be assembled with a plurality of funtion parts.The advantage of the test point the removed part of use sharing is that its size can be designed to produce and is used for the circuit board tested by existing proving installation.For example, because the position of the test probe of proving installation is known, so the test point of sharing removed part can be configured to when the use test probe, the test probe of proving installation is aimed at the test point on being positioned at shared portion.
The utility model provides configurable test platform, is used to connect and the circuit board of test different types and size the circuit board that especially has the test point of installing the side.Different with top or bottom installation testing point, the test point that install the side is positioned on the edge of described plate.Configurable platform physically be can dispose to accept the circuit board of different size, and on electric be can dispose with the circuit board of test different types (for example, circuit board with different final uses), provide one " general " test platform thus.
The configurable performance of physics can use the circuit board with side installation testing point to realize, because the position of side installation testing point can not change in the mode identical with top or bottom installation testing point.That is to say that for any given circuit board with side installation testing point, many such circuit boards can be configured to have same standard.Therefore, regardless of the length and the width of circuit board, the use of the test point that install the side can be consistent to following piece plate from a plate.This consistance provides stable basis for structure test probe array, and regardless of the size and the final use of plate, this test probe array can contact with the test point that install the side.
Electric configurability can adopt the test probe signal selecting circuit to realize.Test point on different plates and these plates may need specific signal in test.One or more arrays of the test probe of configurable test platform can be configured to provide needed signal to each test probe under the guidance of test probe signal selecting circuit.
Description of drawings
In conjunction with the drawings and with reference to the following detailed description, above-mentioned feature and performance and the various advantage with other of the utility model will become clearer, and wherein identical Reference numeral is represented identical part all the time, wherein:
Accompanying drawing 1 shows the top view of the schematic block diagram of prior art circuits plate;
Accompanying drawing 2 shows the top view of the schematic block diagram of the circuit board that is constituted according to the utility model principle;
Accompanying drawing 3A-Fig. 3 I shows the top view according to the various boards of the utility model principle;
Accompanying drawing 3J shows the view according to the other circuit board of the utility model principle;
Accompanying drawing 3K shows the view according to the another kind of circuit board of the utility model principle;
Accompanying drawing 3L shows the view according to another circuit board of the utility model principle;
Accompanying drawing 4 shows the side view of a part of the schematic block diagram of the circuit board that is constituted according to the utility model principle;
Accompanying drawing 5 shows the circuit board layout according to the utility model principle, and wherein two funtion parts are shared the common test point removed part;
Accompanying drawing 6 shows the circuit board according to the example that comprises several funtion parts of the utility model principle, the test point the removed part institute bridge joint that these several funtion parts are shared;
Accompanying drawing 7 is process flow diagrams, and according to principle of the present utility model, its represented step can utilize the circuit board that comprises at least one part that can be removed to carry out;
Accompanying drawing 8 shows the abstract block scheme of black box of the configurable test platform of being constructed according to the utility model principle;
Accompanying drawing 9 shows one section partial cross-section zoomed-in view according to the circuit board as shown in Figure 8 of the utility model principle;
Accompanying drawing 10 shows the concise and to the point top view according to the configurable test platform of the utility model principle;
Accompanying drawing 11A and 11B show the schematic representation according to another configurable test platform of the utility model principle;
Accompanying drawing 12 shows the concise and to the point side view according to another configurable test platform of the utility model principle;
Accompanying drawing 13 shows and can be used for the test probe signal selecting circuit of electrical configurations according to the test platform of the utility model principle;
Accompanying drawing 14 shows the process flow diagram that configurable test platform is connected to the step that circuit board adopts according to the utility model principle; With
Accompanying drawing 15 shows according to the utility model principle can be used for the example system 1500 that is connected with configurable test platform.
Embodiment
Accompanying drawing 2 shows the top view of the schematic block diagram of the circuit board 200 that is constituted according to the utility model principle.As shown in the figure, circuit board 200 comprises funtion part 210 and removable test point part 220.Funtion part 210 can comprise electrical equipment (not shown) and any software that can be stored and/or move by one or more elements, finally is used to final use.Can be provided with signal conducting path (, not extending to part 220) in one or more layers of circuit board 200 and be shown from part 210 shown in the funtion part 210.(it is a class signal conducting path to tested conductor 225, therefore also can be present in one or more layers of circuit board 200) directly path can be provided between the one or more test positions in test point in the part 220 228 and the part 210 (for example, the portion that interconnects between the element of part 210 or element and the circuit board 200) basically.In certain embodiments, tested conductor 225 can be the signal conducting path that only places circuit board 200 for test-purpose specially.In other embodiments, tested conductor can be to can be used as multi-purpose signal conducting path.For example, tested conductor both can also can be used as the signal conducting path of transmission signals as the tested conductor of testing in final use equipment after part that can be removed 220 is removed.
Note, funtion part 210 in the accompanying drawing 2 and part that can be removed 220 representatives only be exemplary.As shown in the figure, part that can be removed 220 is attached to funtion part via tested conductor 225, yet substantial portion can be by attaching.The dotted line that extends between part 210 and 220 shown in the accompanying drawing 2 represents that in certain embodiments part 210 and 220 in fact can be by attaching (for example, part 210 contacts with part 220 direct physical) maybe can be by the mutual attaching of inserting of medium mutually.The structure of actual plate (for example, part 210 and 220 is attaching how) can be the problem of design alternative, is not limited to example disclosed herein and statement.
In multilayer circuit board, tested conductor 225 and other signal conducting path can be preferably located in the middle layer, thereby are used in the available real estate maximization of the electrical equipment that is positioned on circuit board top, bottom and top and the bottom.Be understandable that even tested conductor and other signal conducting path mainly are arranged in the middle layer, such path also can be arranged in top layer, bottom layer or top layer and bottom layer.Can be understood that further that principle of the present utility model can be used for the circuit board arrangement of any kind, no matter it is single layer structure or sandwich construction.
Be arranged in the circuit board embodiment of top, bottom or top and bottom in test point, such circuit board can be constructed such that removable test point part 220 comprises major part or whole test points.Such structure helps making the funtion part of circuit board 200 to have the final functions of use utilization factor of enhancing.That is to say that by test point being focused in the part that can be removed 200, the size of funtion part 210 can be reduced.In addition, the density of electrical equipment can be increased.Be arranged in other circuit board embodiment of at least one sidepiece and top, bottom or top and bottom in test point, such circuit board can be constructed such that the test point on top, bottom or top and the bottom concentrates in the part that can be removed 220.In only having other circuit board embodiment of the test point of installing the side, such circuit board can be constructed such that these test points are positioned on the part that can be removed 220.
Be understandable that, although in certain embodiments, can preferably the position of test point is concentrated on the part that can be removed 220, still, other embodiment also can be provided, and wherein the number percent of the test point on the funtion part 210 is equal to or greater than the number percent of the test point on the part that can be removed 220.For example, circuit board with the test point of installing the side on the one or more sides of funtion part 210, can surpass test point on the part that can be removed 220 in the quantity of the test point on the one or more sides of funtion part 210, and no matter whether part that can be removed 220 has the test point that install sidepiece, bottom and/or bottom.
Accompanying drawing 2 shows the circuit board 200 of the part that can be removed 220 of first side with funtion part of being attached to 210, it should be understood that according to principle of the present utility model, can implement many different circuit board layout.Several examples of the layout that these are different are shown in accompanying drawing 3A-Fig. 3 I, and wherein each figure shows the top view according to the various boards of the utility model principle.Fig. 3 A-Fig. 3 D shows the circuit board that comprises funtion part 310 and only be positioned the removable test point part 320 on funtion part 310 1 sides.Specifically, as shown in accompanying drawing 3A, 3B, 3C and 3D, can remove on right part, left part, bottom and the top that test point part 320 is positioned in funtion part 310 respectively.Fig. 3 E-figure I shows the circuit board on the both sides at least that part that can be removed 320 is attached to funtion part 310.Specifically, accompanying drawing 3E shows the sides adjacent that two parts that can be removed 320 are attached to funtion part 310.Accompanying drawing 3F and 3G show on the opposite side (top side and bottom side among left side among the accompanying drawing 3F and right side and the accompanying drawing 3G) that two parts that can be removed 320 are attached to funtion part 310.Accompanying drawing 3H shows on three sidepieces that three parts that can be removed 320 are attached to funtion part 310, and accompanying drawing 3I shows on four sidepieces that four parts that can be removed 320 are attached to funtion part 310.
Be understandable that the layout of being discussed among Fig. 3 A-Fig. 3 L only is exemplary and can implements different layouts by the utility model.
Can be configured to the convenient removal that can remove the test point part according to circuit board of the present utility model.With reference to the accompanying drawings 4, the side view of the part of circuit board 400 schematic block diagram of being constructed according to the utility model principle is shown.Circuit board 400 shows funtion part 410 and the part that can be removed 420 that (at dotted line 402 places) link together.But dehiscence part 440 and 442 are arranged respectively at top and bottom at plate 400, to promote the removal of part that can be removed 420.If desired, but can on a side of circuit board 400 or many sides, extra dehiscence part (not shown) be set.But the part that dehiscence part 440 and 442 can be by deliberately making plate influences breaking point between part 410 and 420 than the easier breakage of other parts, is similar to perforation and how promotes to separate in paper spare.In addition, but dehiscence part 440 and 442 also can be used as " guide groove " of the instrument that splits that is used for separating part 410 and 420.For example, wear described plate to cut off described part if the instrument that splits dashes, then it can be inserted into that described " " guide groove " guarantees that thus punching press occurs in position correct on the described plate before wearing dashing.
Can adopt any amount of suitable method to remove removable test point part according to circuit board of the present utility model.For example, described part that can be removed can be removed by splitting (adopting as the cut substrate of saw or the high energy source of employing such as laser no matter be), punching press or other suitable method.
Accompanying drawing 5 shows the circuit board layout of wherein sharing the public test point removed part according to two funtion parts of the utility model principle.As shown in the figure, the test point the removed part 525 that is shared is attached to funtion part 510 and 512.The part 525 that is shared can comprise part 510 and 512 shared test point (not shown), be specifically designed to the combination of test point (not shown) or the common test point and the special test point of part 510 or 512.The common test point can be electrically connected to one or more in components identical in part 510 and 512 or the signal conducting path.The common test point can make proving installation can test two or more funtion parts simultaneously, thereby reduces test duration and extra material cost.Special test point can only be electrically connected to a funtion part (for example, part 512).
The test point the removed part of sharing 525 can be used as the bridge between two or more funtion parts, and thereby can be provided for making circuit board can be assembled with the structure that interconnects of several funtion parts, described funtion part can use removable test point partly to test.Accompanying drawing 6 shows according to the utility model principle and comprises example circuit board 600 by several funtion parts 610 of 625 bridge joints of the test point removed of sharing.As shown in the figure, circuit board 600 comprises the N * Metzler matrix of funtion part 610, and wherein the N representative is along the predetermined quantity (four parts as shown in the figure) of the funtion part 610 of X-axis, and the M representative is along the predetermined quantity (three parts as shown in the figure) of the funtion part of Y-axis.Be dispersed between the funtion part 610 is the test point the removed part of sharing 625 (being depicted as bridge circuit continuous in the plate 600).The test point the removed part of sharing 625 can comprise top side, bottom side or top side and public test point on the bottom side and/or the special test point that is positioned at plate 600.Also show the test point the removed part 630 on the outer ledge that is arranged on circuit board 600.Test point part 630 can be removed and special test point in the combination of the edge, top, bottom or these positions that are positioned at plate 600 can be comprised.
The advantage of the test point the removed part 625 that employing is shared is it to be dimensioned to production can be by having the circuit board that proving installation is tested now.For example, because the position of the test probe of proving installation is known, so the test point the removed part of sharing 625 can be configured to when the use test probe, the test probe of described proving installation is aimed at the test point on being positioned at part 625.Like this, can test the saving that different funtion parts realizes cost by utilizing " common " proving installation, wherein each funtion part all has different final uses.
Accompanying drawing 7 is process flow diagrams, and its represented step can be utilized according to principle of the present utility model and comprise that the circuit board of at least one part that can be removed carries out.In step 710, provide to comprise that at least one funtion part and at least one can remove the circuit board of test point part.For example, can provide in the circuit board that above 2-6 in conjunction with the accompanying drawings discusses any one.In step 720, electrical equipment (for example, integrated circuit, resistor and capacitor) can be installed on the circuit board.Described electrical equipment can utilize known technology to install, these technology such as welding, clamping (pinch crimps), any other the known technology that is connected and is used to guarantee be electrically connected.
When electrical equipment is installed or afterwards, can be by at least one test point that can remove on the test point part, using at least one test probe test described funtion part (shown in step 730).Described test can audit function test position on the part, for example, whether certain electrical equipment is electrically connected to signal conducting path or another electrical equipment.Test probe can be applied to the test point that top, bottom and/or sidepiece are installed.
In step 740, removable test point part can be removed from circuit board, thereby makes the funtion part of final use.In the time can removing test point and partly be removed, the lead-in wire that is exposed on the funtion part (for example, signal conducting path) can be processed to prevent corrosion.Can be by epoxy resin, wax or antioxidant being applied to exposed lead-in wire and the lead-in wire that is exposed being handled.In step 750, described funtion part can be used to final use.
Be understandable that the step shown in the accompanying drawing 7 only is exemplary, can add extra step and omit existing step.For example, can add the step of handling exposed leads.
Accompanying drawing 8 shows the abstract block scheme of black box of the configurable test platform of being constructed according to the utility model principle.Configurable test platform 810 represents that abstractively it can receive and testing circuit board 820 according to one among many different proving installation embodiment of the present utility model, especially has the circuit board of side installation testing point (being depicted as test point 822).Going through of circuit board with the test point of installing the side can be referring to the patented claim of top " method and apparatus that is used for testing circuit board " by name mentioned, yet, for convenience, accompanying drawing 9 shows the xsect partial enlarged view of the A section of the circuit board 820 that comprises top surface 826, shows the test point 822 that install the side on the edge surface 827 of plate 820.What note is, the structure of the test point 822 that install the side (for example all is consistent to another test point from a test point, aspect the distance between test point and the size of each test point), show that described structure can meet the construction standard of the test point of installing the side.
With reference to accompanying drawing 8, configurable platform 810 can be physically configurable to receive the circuit board of different size.In fact, as the gap of separating plate was shown, it was can varying sized (having transformable length as shown in the figure) for 820 explanations of drawn circuit.Be understandable that circuit board 820 also can be varying sized on width and short transverse.Available circuit board with side installation testing point is realized the configurable performance of described physics, because the position of the test point that install the side can't change in the mode identical with the changeable mode of test point of top or bottom installation.That is to say that for any given circuit board with the test point of installing the side, many such circuit boards can be configured to have similar standard.Therefore, regardless of the length and the width of circuit board, the use of side installation testing point all is consistent to next piece plate from a plate.This consistance provides stable basis for structure test probe array, and regardless of the size and the final use of plate, described test probe array all can contact with the test point that install described side.Preferably, the width of test probe array is the same wide with the wideest circuit board for the treatment of test on platform 810 at least, thereby the circuit of guaranteeing all expectations is all applicable.In addition, at least one test probe array can move adapting to the circuit board of different length, and this point will be explained in the discussion of 10-12 in conjunction with the accompanying drawings in more detail.In certain embodiments, control system 830 can be for example by adjustment be connected to the pneumatic means that can remove the test probe array or rotating band control described at least one can remove the motion of test probe array.What note is, one in the described test probe array can be parts, and it is held in place the circuit board that receives, and is connected but can not carry out the interface with test point.
In addition, configurable platform 810 can be electric configurable to adapt to different circuit boards.Test point on different plates and these plates needs specific signal in test.Configurable each test probe of one or more arrays of the test probe of configurable test platform 810 is to provide needed signal.Electric configurable performance can realize with the test probe signal selecting circuit according to the utility model principle, and this circuit will be hereinafter being described in 13 the discussion in conjunction with the accompanying drawings in more detail.In certain embodiments, the selection that offers the signal of test probe can realize by control system 830.
Accompanying drawing 10 shows the concise and to the point top view according to the configurable test platform 1000 of the utility model principle.Test platform 1000 comprises test probe array 1010 and 1012, and each array all can comprise several test probes 1015.Test probe array 1010 and 1012 can be positioned at the opposite side of circuit board 1020.One or two test probe array 1010 and 1012 is transportable.If removable, described array can be connected to the kinematic system (not shown) of accurate control.For example, a pneumatic system or tracing system (for example, linear slide) can be used for one or two test probe arrays 1010 and 1012 precisely controlled motion is provided.In pneumatic system, pneumatic means can be attached to probe array 1010 and 1012 with the location of control with respect to circuit board 1020.In tracing system, probe array 1010 and 1012 can be positioned on the carriage that can move to desired position on the track.
Test platform 1000 can provide the connection and the test of robotization for circuit board 1020.For example, circuit board 1020 can be placed in preposition in the described platform 1000, and the user can indicate the type of circuit board 1020 to the control system (not shown).Described control system can automatically be adjusted one or two test probe array 1010 and 1012, is connected so that make relevant test probe 1015 carry out the interface with the test point (not shown) of circuit board 1020.What note is that when test probe array 1010 and 1012 was in " link position ", some test probe can't link to each other with circuit board 1020.Disconnected probe does not so influence the test of being undertaken by test platform.In fact, described control system (not shown) can be so disconnected probe configuration empty (for example, by with such node ground connection).Described connected probe can electrically be configured to the adaptive circuit plate.When test probe array 1010 and 1012 is in link position, just can begin test.
Accompanying drawing 11A shows the fragmentary perspective view according to another configurable test platform 1100 of the utility model principle.Accompanying drawing 11B shows the concise and to the point side view according to the configurable test platform 1100 of the utility model principle.11A and 11B with reference to the accompanying drawings when describing test platform 1100.Configurable test platform 1100 comprises fixing test probe array 1110 and test probe array 1112 movably, they each all can comprise test probe 1115 (shown in concave part). Test probe array 1110 and 1112 can be electrically connected to the control system (not shown) that is used for electric configuration testing probe 1115.
Fixing test probe array 1110 is fixed on the permanent location in the platform 1100, as the fixture that is used for circuit board for receiving 1120.Movable detection probe 1112 can along rectilinear direction towards be free to slide away from fixing test probe array 1110.When circuit board 1120 is received by platform 1100, first end of plate 1120 can be inserted in the test probe array 1110, movably test probe array 1112 can be removed from fixing test probe array 1110, for being provided the gap by second end of the plate 1120 of movable detection probe array 1112 receptions.Movable detection probe array 1112 can be connected to the tensioner 1130 that is fixed on the fixed part 1140.Tensioner 1130 can be volute spring or other tensioner, comprises the object or the device that movable detection probe array 1112 are applied line pressure along the direction of fixing test probe array 1110.Tensioner 1130 can be designed to make enough pressure to be applied on the movable detection probe array 1112 to guarantee all to obtain reliable link position for the circuit board of any desired size.
Accompanying drawing 12 still shows the concise and to the point side view according to the configurable test platform 1200 of the another one of the utility model principle.Configurable test platform 1200 comprises test probe array 1210 and 1212, and both all can comprise test probe 1215 (shown in concave part). Test probe array 1210 and 1212 can be electrically connected to the control system (not shown) that is used for electrical configurations test probe 1215. Test probe array 1210 and 1212 can rotate around axis 1211 and 1213 respectively.Specifically with reference to array 1210, array 1210 can be from 90 degree angles (array 1210 at this point perpendicular to platform base portion 1202) turns to the predetermined angular less than 90 degree.Array 1210 and 1211 can be loaded tension force so that they are biased to rest on place, 90 degree angle.Such biasing can be desired to guarantee when being in link position, applies enough test probe array pressure on circuit board 1220.
When configurable test platform circuit board for receiving 1220, test probe array 1210 and 1212 rotatable away from circuit board 1220 to adapt to the circuit board of different size.For example, plate 1220 itself can make test probe array 1210 and 1212 rotate away from 1220, up to plate 1220 tested probe 1215 fix in position.In certain embodiments, described test probe 1115 can be independent of the rotation of test probe array 1210 and 1212 and move, with the connection of further promotion circuit board test point (not shown) to test probe 1215.For example, when the angle of inclination of array 1210 and 1212 reduces (for example, reduce to predetermined angular from 90 degree), the position of described test probe 1215 can with respect to array 1210 with 1212 rotation and backward rotation so that test probe 1215 can be contacted better with described test point.That is to say that test probe 1215 can be configured on the independent rotation carriage, this rotating bracket allows the relative position of test probe 1215 (in array 1210 and 1212) to keep basic identical, regardless of described angle of inclination.Like this, when array 1210 and 1212 is in an angle of 90 degrees, and when array 1210 and 1212 was in 70 degree angles, the relative position of described test probe 1215 can be identical.
Accompanying drawing 13 shows a kind of test probe signal selecting circuit 1302 that can be used for according to the electrical configurations test platform of the utility model principle.Also show test probe array 1310 in the accompanying drawing 13 with several test probes 1315.Each test probe all is connected to test probe data line 1318.Based on the circuit board that will be connected to test probe array 1310, each test probe data line 1318 all can optionally be electrically connected to source data line D by selecting circuit 1310
1To D
NIn any one.The source data line can comprise signal and other data signal under test of different voltage and currents.The data that are used for the source data line can be supplied with and monitoring by control system 1330.
Select the advantage of circuit 1310 to be, test platform easily electrical configurations becomes to be used for to carry out the interface connection with different circuit boards.In the numeral of selecting circuit 1310 is implemented, the control signal that is provided by control system 1330 can make select circuit 1310 with suitable source data line options be electrically connected to described test probe data line.Each point is represented one " switch ", and it can or turn-off the source data line is electrically connected to specific test probe data line by the conducting of selectivity.The numeral embodiment can comprise that traffic pilot, numerical control switch matrix are (for example, FPGA) or the software simulation of these hardware.Select circuit 1310 also can implement with manual embodiment, such as the hand control switch matrix, it requires the user physically to insert and/or removes wire jumper to influence desired electrical connection.
Accompanying drawing 14 shows a process flow diagram, shows the step that configurable test platform is connected to circuit board according to the utility model principle.In step 1410, provide a configurable test platform (for example, accompanying drawing 10,11 and 12 illustrate respectively platform 1000,1100 or 1200).In step 1420, receive the relevant indication for the treatment of the type of the circuit board that tested platform receives.For example, which circuit board the user can be input in control panel or the computing machine with tested.Disposed by electricity based on the described test platform of the indication of being received in step 1430.More specifically, can the test probe signal selecting circuit 1302 of accompanying drawing 13 optionally be electrically connected to specific data line with described test probe by for example using, described test probe can be used to test specific circuit board by " preparation ".
Accompanying drawing 15 shows the example system 1500 that can be used in combination with the configurable test platform according to the utility model principle.System 1500 can comprise computing machine 1510, user interface apparatus 1530 and configurable test platform 1540.System 1500 can comprise many computing machines 1510 and user interface apparatus 1530, but of in accompanying drawing 15, only they being shown in each, to avoid complicated drawing.Computing machine 1510 is illustrated by communication path 1590 and is connected to user interface apparatus 1530 and platform 1540.
Also be understandable that, various expression directions or directed words, being used at this such as similar words such as " vertically " and " level ", " left side " and " right side ", " top " and " bottom ", " edge ", " highly " only is for convenience, the fixing or not absolute direction of the use of these speech or the intention of alignment restrictions.For example, device of the present utility model can have any desired orientation.If redirect, in it is described, need to use different directivity or direction-sense word so, but this does not change their base attributes within scope and spirit of the present utility model.
Therefore as seen, the utility model provides and has had circuit board and the configurable test platform that can remove the test point part.It will be understood by those skilled in the art that the utility model can implement by the mode except described embodiment, introducing these embodiment is that the utility model is only limited by following claims for exemplary rather than restrictive purpose.
Claims (19)
1. circuit board, it is characterized in that: described circuit board comprises:
At least one funtion part; With
Be attached at least one test point removed part of described at least one funtion part, the described test point of removing partly comprises at least one test point, and described test point is electrically connected at least one test position that is positioned on the described funtion part.
2. circuit board according to claim 1 also comprises the electrical equipment that is installed on the described funtion part, and wherein said at least one test position comprises that electrical equipment is electrically connected to the position of described funtion part.
3. circuit board according to claim 1 also comprises a plurality of signal conducting paths on the one deck at least that is arranged on described circuit board, and wherein at least one described signal conducting path extends to described part that can be removed from described funtion part.
4. circuit board according to claim 1, but also be included at least one dehiscence part between described funtion part and part that can be removed on the first surface of described circuit board.
5. circuit board according to claim 1, wherein said test point are the test points that install bottom, top or side.
6. circuit board, it is characterized in that: described circuit board comprises:
A plurality of funtion parts; With
Be attached to the test point the removed part of sharing at least two in the described funtion part, the described shared test point removed partly comprises a plurality of test points, wherein, the first of described test point be electrically connected to described at least two by first funtion part in the funtion part of attaching, and the second portion of wherein said test point be electrically connected to described at least two by second funtion part in the funtion part of attaching.
7. circuit board according to claim 6 also comprises a plurality of signal conducting paths on the one deck at least that is arranged on described circuit board, and wherein at least one described signal conducting path from described funtion part extends to described shared part that can be removed.
8. circuit board according to claim 6, wherein said test point are the test points that install top or bottom.
9. circuit board according to claim 6 also comprises the unshared test point part of removing, and the described unshared test point of removing partly comprises at least one test point that is electrically connected to one of described funtion part.
10. circuit board according to claim 6, wherein said shared part that can be removed forms interconnective bridge network, and described interconnective bridge network is used for during Computer-Assisted Design, Manufacture And Test described funtion part being linked together.
11. circuit board according to claim 6, wherein said shared part that can be removed comprises the third part of test point, and the third part of described test point is electrically connected to described first and second simultaneously by the funtion part of attaching.
12. a test macro is characterized in that: described test macro can be operated to test a plurality of different sizes and all comprise the circuit board of the test point that install the side with final use and each, and described system comprises:
Can operate to receive and to test in described a plurality of circuit board the test platform of any one, described test platform comprises and is used for firm first and second parts in place of the circuit board that will be received, wherein, in described first and second parts at least one is transportable, so that make described platform can receive the circuit board of different size, in described first and second parts at least one comprises the test probe array, and described test probe array comprises the test probe that a plurality of test point interfaces that are used for installing with the side of the circuit board that is received are connected.
13. system according to claim 12, wherein said first parts are fixed, described second parts are transportable, and described second parts are connected to tensioner, and described tensioner applies power with the auxiliary fixing circuit board that is received on described second parts.
14. system according to claim 12, wherein said first and second parts can move on rectilinear direction.
15. system according to claim 14, wherein said first and second parts can move on rotation direction.
16. system according to claim 12, wherein said first and second parts include the test probe array, and described test probe array comprises a plurality of test probes that the test point interface that is used for installing with the side of the circuit board that is received is connected.
17. system according to claim 12 also comprises the control system that is electrically connected to described test probe array at least, and described control system can be operated test signal is applied to the circuit board that described test probe is received with test.
18. system according to claim 12, described test platform also comprises the test probe signal selecting circuit, and described test probe signal selecting circuit can be operated the test probe with the described test probe array of electrical configurations.
19. system according to claim 18 also comprises the control system that is electrically connected to described test probe signal selecting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007200095223U CN201229391Y (en) | 2007-10-09 | 2007-10-09 | Circuit board comprising removable gagging point part and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007200095223U CN201229391Y (en) | 2007-10-09 | 2007-10-09 | Circuit board comprising removable gagging point part and test system |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200920007771U Division CN201374867Y (en) | 2006-11-07 | 2007-10-09 | Circuit board with removable test point part |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201229391Y true CN201229391Y (en) | 2009-04-29 |
Family
ID=40634335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2007200095223U Expired - Lifetime CN201229391Y (en) | 2007-10-09 | 2007-10-09 | Circuit board comprising removable gagging point part and test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201229391Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101644720A (en) * | 2009-05-15 | 2010-02-10 | 上海闻泰电子科技有限公司 | PCBA calibration clamp and calibration method thereof |
| CN101697599B (en) * | 2009-10-16 | 2013-02-20 | 惠州Tcl移动通信有限公司 | Multimedia data card as well as device and method for testing handset multimedia data cards |
| CN108872917A (en) * | 2018-06-28 | 2018-11-23 | 北京铂阳顶荣光伏科技有限公司 | A kind of test device for probe contact class testing equipment |
-
2007
- 2007-10-09 CN CNU2007200095223U patent/CN201229391Y/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101644720A (en) * | 2009-05-15 | 2010-02-10 | 上海闻泰电子科技有限公司 | PCBA calibration clamp and calibration method thereof |
| CN101697599B (en) * | 2009-10-16 | 2013-02-20 | 惠州Tcl移动通信有限公司 | Multimedia data card as well as device and method for testing handset multimedia data cards |
| CN108872917A (en) * | 2018-06-28 | 2018-11-23 | 北京铂阳顶荣光伏科技有限公司 | A kind of test device for probe contact class testing equipment |
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| C14 | Grant of patent or utility model | ||
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Granted publication date: 20090429 |
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| CX01 | Expiry of patent term |