CN1710435A - Led lamp beam-splitting colour-separating testing method - Google Patents

Abstract

Being combined with hardware part, the disclosed testing method forms a set of independent, integrated led lamp spectrum and color separation test system. Based on and improving traditional method, the testing method collects partial and useful data, and carries out reasonable data process. Comparing with traditional method, the testing method is more effective in aspects of data process and designing test structure. Moreover, the testing method raises testing speed and testing accuracy.

Description

A kind of method of led lamp beam split color separation test

Technical field

The present invention relates to a kind of method of led lamp beam split color separation test.

Background technology

At present, LED universal tester on the market is applicable to the static state/dynamically detection and demonstration of light-emitting diode displays such as charactron, 8 * 8 monochromes/double-colored dot matrix, monochromatic dot matrix 16 * 16 below, ' rice ' word LED mostly, and it is mainly tested short circuit, opens circuit, inverse current, forward voltage drop and decide the electric current demonstration and test.Generally have 32 programmable test mouth line outputs, test parameter can be provided with, and need not increase any change-over panel to different LED types and just can test, and the user can define the test parameter of several LED types.This quasi-instrument generally adopts the constant current metering system, have single-spot testing, line by line/function such as row demonstration etc.This class testing instrument can not be produced continuously, so output is little.It is manual that its method of testing mostly is greatly.In recent years, invented full-automatic LED photoelectric properties test machine abroad, it can detect most important optical characteristics of LED and electrical specification.Optical characteristics comprises spectral distribution and peak wavelength, luminous intensity IV, spectral half width etc.; Electrology characteristic comprises forward working current IF, forward operating voltage VF, V-I characteristic etc.

Domesticly currently developing the testing apparatus that meets the LED characteristic and setting up test macro.Comprise: LED optic testing system, monitoring temperature test macro, appliance test system, environmental testing system, permanance reliability test system etc.The present invention answers the existing market needs exactly, overcome and existing external have the testing sequence irregularities about test LED beam split color separation method of testing, random more intense, among the process of test, only carried out simple data processing and careful inadequately for other influence factor consideration of optic test, the problem that the influence that ambient light produced does not remedy, the existence of this problem, it can draw corresponding error in the process of the processing of test and data, thereby has reduced the measuring accuracy of system.

Summary of the invention

The present invention provides a kind of measuring accuracy height to society, the method for the led lamp beam split color separation test that the rational testing efficiency of testing sequence is high.

Technical scheme of the present invention is: on the basis of existing method of testing, the testing sequence of existing method of testing is adjusted, carried out rational collocation, on the speed of test, improve many, in test process, use the mode of soft or hard combination again, system has been carried out revising the processing of making up for, made method more perfect.

The concrete steps of this method of testing are:

A kind of method of led lamp beam split color separation test, it comprises the steps:

(1), measures and makes up for step;

(2), the polarity test step, test value and default value are not inconsistent. then carry out oppositely energising;

Otherwise enter next step;

(3), the testing impedance step, test value and default value are not inconsistent, and then adjust probe location;

Otherwise, enter next step;

(4), photoelectric properties testing procedure.

Described metering and make up for step and comprise the steps:

(1), knocks out material;

(2), detect induction current;

(3), difference is amplified;

(4), to gather be zero, as the result for being to enter the polarity test step; As for after not revising, it is rapid to return previous step.

Described photoelectric properties test value carries out in the following order:

(1), surveys the VF value;

(2), survey IV, WL value;

(3), survey Δ VF value;

(4), survey the VFP value;

(5), survey the VFL value;

(6), survey the VR value;

(7), survey the FI value;

(8), survey the IR value;

The test that all will whether need to test this value before above-mentioned each photoelectric properties value test judges, if judged result for being then directly enter next step test, if judged result for otherwise skip next step, enter the test judgement of next value.

The present invention has the following advantages, and has adopted metering and has made up for step, has overcome the influence of ambient light to test result, adopts the test of permanent order, thereby and the judgement of before test, whether testing improved the measuring accuracy and and the speed of system.

Description of drawings

Fig. 1: be testing process block diagram of the present invention.

Embodiment

See also Fig. 1, Fig. 1 explanation: the method for this led lamp beam split color separation test comprises the steps:

(1), knock out material, close the light source of the influence that might produce test result;

(2), detect the induction current of natural light;

(3), carrying out difference amplifies;

(4), amplify the result and should be zero, as the result for being to enter the polarity test step; As for after not revising, it is rapid to return previous step.

(5), polarity test, if test result and default value are not inconsistent, then logical inverse current;

Otherwise, enter next step;

(6) testing impedance mainly is to judge the observing and controlling positive stop of whether popping one's head in, if test result and default value are not inconsistent, then rearranges the position of observing and controlling probe; Until meeting default value; If test result conforms to default value, directly enter next step photoelectric properties test;

The photo test is carried out in the following order:

(1), surveys the VF value;

(2), survey IV, WL value;

(3), survey Δ VF value;

(4), survey the VFP value;

(5), survey the VFL value;

(6), survey the VR value;

(7), survey the FI value;

(8), survey the IR value;

The test that all will whether need to test this value before above-mentioned each photoelectric properties value test judges, if judged result for being then directly enter next step test, if judged result for otherwise skip next step, enter the test judgement of next value.

Generally speaking, after the factor that may impact test result is to external world measured and is made up for, after machine is had good positioning measured material, at first test the polarity of LED, adding electric current if LED polarity is opposite with setting value will be reverse, like this regardless of the direction of LED, can test, go to change polarity without mechanism, so process also can be saved time.After this test finishes, just enter the next item down, testing impedance can have the unstable phenomenon of Probe clip among mechanism's feeding location process, and this is the test condition of poor to occur, carries out the test of this step and just can fix a breakdown.And then be that the test of the common electrical VF of LED also can be skipped this and directly entered the next item down test, and in the back followed by the test of wavelength and brightness, such arrangement benefit one circuit tests wavelength after testing VF again and brightness makes, electrically setting up the stable time on the LED is more prone to, benefit two is directly to require to survey these three because of most material, so can directly withdraw from after testing, save a lot of times, the speed of system is just faster.Order at the testing electrical property of back also is fixing arranged, arranges the test of a big electric current to arrange in pairs or groups after little testing current, makes whole testing process smooth and easy, and the service efficiency of hardware is higher.Thereby reach the purpose of speed-raising.On the precision of test, before beginning test, carried out making up for of software and hardware before this, the data of ambient light are existed among the method, during test, go to revise the data of test with method, so just got rid of the influence that produces because of extraneous light, made that the precision of test is higher, error is littler.

Claims (3)

1, a kind of method of led lamp beam split color separation test, it comprises the steps:

(1), measures and makes up for step;

(2), the polarity test step, test value and default value are not inconsistent, and then carry out oppositely energising;

Otherwise enter next step;

(3), the testing impedance step, test value and default value are not inconsistent, and then adjust probe location;

Otherwise, enter next step;

(4), photoelectric properties testing procedure.

2, the method for led lamp beam split color separation according to claim 1 test is characterized in that, described metering and make up for step and comprise the steps:

(1), knocks out material;

(2), detect induction current;

(3), difference is amplified;

(4), to gather be zero, as the result for being to enter the polarity test step; As for after not revising, it is rapid to return previous step.

3, the method for led lamp beam split color separation test according to claim 1 is characterized in that described photoelectric properties test value carries out in the following order:

(1), surveys the VF value;

(2), survey IV, WL value;

(3), survey Δ VF value;

(4), survey the VFP value;

(5), survey the VFL value;

(6), survey the VR value;

(7), survey the FI value;

(8), survey the IR value;

The test that all will whether need to test this value before above-mentioned each photoelectric properties value test judges, if judged result for being then directly enter next step test, if judged result for otherwise skip next step, enter the test judgement of next value.

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