CN1619328A - Semiconductor device and testing method thereof - Google Patents
Semiconductor device and testing method thereof Download PDFInfo
- Publication number
- CN1619328A CN1619328A CNA2004100922532A CN200410092253A CN1619328A CN 1619328 A CN1619328 A CN 1619328A CN A2004100922532 A CNA2004100922532 A CN A2004100922532A CN 200410092253 A CN200410092253 A CN 200410092253A CN 1619328 A CN1619328 A CN 1619328A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- voltage
- semiconductor device
- test
- grayscale voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/10—Measuring sum, difference or ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3674—Details of drivers for scan electrodes
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3685—Details of drivers for data electrodes
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3696—Generation of voltages supplied to electrode drivers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal Display Device Control (AREA)
- Tests Of Electronic Circuits (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (21)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003378595 | 2003-11-07 | ||
JP2003378595 | 2003-11-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1619328A true CN1619328A (en) | 2005-05-25 |
CN100414312C CN100414312C (en) | 2008-08-27 |
Family
ID=34779831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100922532A Expired - Fee Related CN100414312C (en) | 2003-11-07 | 2004-11-05 | Semiconductor device and testing method thereof |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100824158B1 (en) |
CN (1) | CN100414312C (en) |
TW (1) | TWI278647B (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101960511A (en) * | 2008-02-28 | 2011-01-26 | 夏普株式会社 | Drive circuit, and display device |
CN101681604B (en) * | 2007-05-29 | 2012-06-27 | 夏普株式会社 | Driving circuit, display device and television system |
CN102938258A (en) * | 2012-11-30 | 2013-02-20 | 上海宏力半导体制造有限公司 | Semiconductor testing method |
CN102227764B (en) * | 2008-11-28 | 2014-04-16 | 夏普株式会社 | Drive circuit, display device and method for self-detecting and self-repairing drive circuit |
CN105843717A (en) * | 2016-04-05 | 2016-08-10 | 河北上元工控技术有限公司 | Interface detection protection circuit for lane controller |
CN106340264A (en) * | 2016-07-12 | 2017-01-18 | 友达光电股份有限公司 | Potential converter and output end short circuit detection method thereof |
CN107786189A (en) * | 2016-08-26 | 2018-03-09 | 精工半导体有限公司 | Semiconductor device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7240133B2 (en) * | 2018-10-29 | 2023-03-15 | ラピスセミコンダクタ株式会社 | semiconductor equipment |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0829500A (en) * | 1994-07-15 | 1996-02-02 | Advantest Corp | Semiconductor testing device |
JPH0862307A (en) * | 1994-08-17 | 1996-03-08 | Advantest Corp | Voltage testing device with high accuracy |
JP3558964B2 (en) * | 1999-07-23 | 2004-08-25 | シャープ株式会社 | Semiconductor integrated circuit inspection apparatus and inspection method |
JP3522662B2 (en) * | 1999-07-23 | 2004-04-26 | シャープ株式会社 | Inspection apparatus for semiconductor integrated circuit, inspection method thereof, and storage medium storing inspection program |
JP3617621B2 (en) * | 2000-09-29 | 2005-02-09 | シャープ株式会社 | Semiconductor integrated circuit inspection apparatus and inspection method thereof |
JP3553509B2 (en) * | 2001-02-07 | 2004-08-11 | シャープ株式会社 | Semiconductor integrated circuit and inspection method thereof |
JP2002258810A (en) * | 2001-03-05 | 2002-09-11 | Hitachi Ltd | Liquid crystal display |
JP4097986B2 (en) * | 2002-04-30 | 2008-06-11 | シャープ株式会社 | Semiconductor integrated circuit inspection apparatus and inspection method |
-
2004
- 2004-10-20 TW TW093131824A patent/TWI278647B/en not_active IP Right Cessation
- 2004-11-04 KR KR1020040089139A patent/KR100824158B1/en not_active IP Right Cessation
- 2004-11-05 CN CNB2004100922532A patent/CN100414312C/en not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101681604B (en) * | 2007-05-29 | 2012-06-27 | 夏普株式会社 | Driving circuit, display device and television system |
CN101960511A (en) * | 2008-02-28 | 2011-01-26 | 夏普株式会社 | Drive circuit, and display device |
CN101960511B (en) * | 2008-02-28 | 2013-06-26 | 夏普株式会社 | Drive circuit, and display device |
CN102227764B (en) * | 2008-11-28 | 2014-04-16 | 夏普株式会社 | Drive circuit, display device and method for self-detecting and self-repairing drive circuit |
CN102938258A (en) * | 2012-11-30 | 2013-02-20 | 上海宏力半导体制造有限公司 | Semiconductor testing method |
CN105843717A (en) * | 2016-04-05 | 2016-08-10 | 河北上元工控技术有限公司 | Interface detection protection circuit for lane controller |
CN105843717B (en) * | 2016-04-05 | 2023-02-28 | 河北上元智能科技股份有限公司 | Interface detection protection circuit of lane controller |
CN106340264A (en) * | 2016-07-12 | 2017-01-18 | 友达光电股份有限公司 | Potential converter and output end short circuit detection method thereof |
CN106340264B (en) * | 2016-07-12 | 2019-08-09 | 友达光电股份有限公司 | Potential converter and output end short circuit detection method thereof |
CN107786189A (en) * | 2016-08-26 | 2018-03-09 | 精工半导体有限公司 | Semiconductor device |
CN107786189B (en) * | 2016-08-26 | 2022-07-05 | 艾普凌科有限公司 | Semiconductor device with a plurality of semiconductor chips |
Also Published As
Publication number | Publication date |
---|---|
KR100824158B1 (en) | 2008-04-21 |
KR20050044254A (en) | 2005-05-12 |
CN100414312C (en) | 2008-08-27 |
TWI278647B (en) | 2007-04-11 |
TW200521458A (en) | 2005-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: NEC CORP. Free format text: FORMER OWNER: RENESAS TECHNOLOGY CORP. Effective date: 20100812 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: RENESAS ELECTRONICS CO., LTD. Free format text: FORMER NAME: NEC CORP. |
|
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TOKYO, JAPAN TO: KANAGAWA, JAPAN |
|
CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa, Japan Patentee after: Renesas Electronics Corp. Address before: Kanagawa, Japan Patentee before: NEC ELECTRONICS Corp. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20100812 Address after: Kanagawa, Japan Patentee after: NEC ELECTRONICS Corp. Address before: Tokyo, Japan Patentee before: Renesas Technology Corp. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080827 Termination date: 20131105 |