CN1385860A - 具有磁性隧道接合部的薄膜磁体存储装置 - Google Patents
具有磁性隧道接合部的薄膜磁体存储装置 Download PDFInfo
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- CN1385860A CN1385860A CN02119916A CN02119916A CN1385860A CN 1385860 A CN1385860 A CN 1385860A CN 02119916 A CN02119916 A CN 02119916A CN 02119916 A CN02119916 A CN 02119916A CN 1385860 A CN1385860 A CN 1385860A
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- 230000005291 magnetic effect Effects 0.000 title claims abstract description 210
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- 238000005859 coupling reaction Methods 0.000 claims description 48
- 230000005415 magnetization Effects 0.000 claims description 45
- 239000010409 thin film Substances 0.000 claims description 28
- 230000008859 change Effects 0.000 claims description 25
- 238000003860 storage Methods 0.000 claims description 17
- 239000011159 matrix material Substances 0.000 claims description 14
- 230000004048 modification Effects 0.000 description 58
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- 239000002184 metal Substances 0.000 description 15
- 230000005540 biological transmission Effects 0.000 description 10
- 101100166255 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) CEP3 gene Proteins 0.000 description 9
- 238000001514 detection method Methods 0.000 description 7
- 230000004888 barrier function Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 101100329534 Haloarcula marismortui (strain ATCC 43049 / DSM 3752 / JCM 8966 / VKM B-1809) csg1 gene Proteins 0.000 description 4
- 101100422777 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) SUR1 gene Proteins 0.000 description 4
- 238000013500 data storage Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000005290 antiferromagnetic effect Effects 0.000 description 3
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- 230000003111 delayed effect Effects 0.000 description 3
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- 229910015136 FeMn Inorganic materials 0.000 description 1
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- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
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- 230000003213 activating effect Effects 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP145984/01 | 2001-05-16 | ||
JP2001145984A JP4731041B2 (ja) | 2001-05-16 | 2001-05-16 | 薄膜磁性体記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1385860A true CN1385860A (zh) | 2002-12-18 |
CN1385860B CN1385860B (zh) | 2010-05-12 |
Family
ID=18991707
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN021199167A Expired - Fee Related CN1385860B (zh) | 2001-05-16 | 2002-05-16 | 具有磁性隧道接合部的薄膜磁体存储装置 |
Country Status (6)
Country | Link |
---|---|
US (2) | US6876575B2 (zh) |
JP (1) | JP4731041B2 (zh) |
KR (1) | KR100654266B1 (zh) |
CN (1) | CN1385860B (zh) |
DE (1) | DE10220897A1 (zh) |
TW (1) | TWI225255B (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101587746B (zh) * | 2004-02-20 | 2011-01-26 | 瑞萨电子株式会社 | 半导体器件 |
CN107404112A (zh) * | 2016-05-18 | 2017-11-28 | 来扬科技股份有限公司 | 应用于mram 的尖峰电流旁路保护控制装置 |
CN107705812A (zh) * | 2016-08-08 | 2018-02-16 | 台湾积体电路制造股份有限公司 | 静态随机存取存储器sram装置 |
CN109584923A (zh) * | 2017-09-28 | 2019-04-05 | 赢世通股份有限公司 | 感应电路及其内存宏码 |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003196973A (ja) * | 2001-12-21 | 2003-07-11 | Mitsubishi Electric Corp | 薄膜磁性体記憶装置 |
JP4218527B2 (ja) | 2002-02-01 | 2009-02-04 | 株式会社日立製作所 | 記憶装置 |
JP4208500B2 (ja) * | 2002-06-27 | 2009-01-14 | 株式会社ルネサステクノロジ | 薄膜磁性体記憶装置 |
US7209378B2 (en) * | 2002-08-08 | 2007-04-24 | Micron Technology, Inc. | Columnar 1T-N memory cell structure |
US6882553B2 (en) * | 2002-08-08 | 2005-04-19 | Micron Technology Inc. | Stacked columnar resistive memory structure and its method of formation and operation |
JP2004086934A (ja) * | 2002-08-22 | 2004-03-18 | Renesas Technology Corp | 不揮発性記憶装置 |
JP4365591B2 (ja) * | 2003-01-17 | 2009-11-18 | Tdk株式会社 | 磁気メモリデバイスおよび書込電流駆動回路、並びに書込電流駆動方法 |
JP2004296859A (ja) * | 2003-03-27 | 2004-10-21 | Renesas Technology Corp | 磁気記録素子及び磁気記録素子の製造方法 |
US7055007B2 (en) * | 2003-04-10 | 2006-05-30 | Arm Limited | Data processor memory circuit |
US7071908B2 (en) * | 2003-05-20 | 2006-07-04 | Kagutech, Ltd. | Digital backplane |
JP4325275B2 (ja) * | 2003-05-28 | 2009-09-02 | 株式会社日立製作所 | 半導体装置 |
JP4567963B2 (ja) * | 2003-12-05 | 2010-10-27 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
US7123506B2 (en) * | 2004-02-13 | 2006-10-17 | Applied Spintronics Technology, Inc. | Method and system for performing more consistent switching of magnetic elements in a magnetic memory |
JP4189395B2 (ja) * | 2004-07-28 | 2008-12-03 | シャープ株式会社 | 不揮発性半導体記憶装置及び読み出し方法 |
DE102004047666B4 (de) * | 2004-09-30 | 2015-04-02 | Qimonda Ag | Speicher mit Widerstandsspeicherzelle und Bewertungsschaltung |
JP4606869B2 (ja) * | 2004-12-24 | 2011-01-05 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP4657813B2 (ja) * | 2005-05-31 | 2011-03-23 | ルネサスエレクトロニクス株式会社 | 不揮発性半導体記憶装置 |
US7239543B2 (en) * | 2005-10-28 | 2007-07-03 | Freescale Semiconductor, Inc. | Magnetic tunnel junction current sensors |
US7463507B2 (en) * | 2005-11-09 | 2008-12-09 | Ulrike Gruening-Von Schwerin | Memory device with a plurality of memory cells, in particular PCM memory cells, and method for operating such a memory cell device |
JP2007164969A (ja) * | 2005-12-15 | 2007-06-28 | Samsung Electronics Co Ltd | 選択された基準メモリセルを具備する抵抗型メモリ素子 |
KR100735750B1 (ko) | 2005-12-15 | 2007-07-06 | 삼성전자주식회사 | 복수개의 균일한 기준 데이터들을 생성하는 기준 셀 블록및 감지증폭 유니트들을 구비하는 반도체 소자들 및 이를채택하는 시스템들 |
US8084835B2 (en) * | 2006-10-20 | 2011-12-27 | Avalanche Technology, Inc. | Non-uniform switching based non-volatile magnetic based memory |
EP1863034B1 (en) | 2006-05-04 | 2011-01-05 | Hitachi, Ltd. | Magnetic memory device |
US7764536B2 (en) * | 2007-08-07 | 2010-07-27 | Grandis, Inc. | Method and system for providing a sense amplifier and drive circuit for spin transfer torque magnetic random access memory |
KR101374319B1 (ko) * | 2007-08-24 | 2014-03-17 | 삼성전자주식회사 | 가변 저항 메모리 장치 및 그것의 동작 방법 |
US20090103354A1 (en) * | 2007-10-17 | 2009-04-23 | Qualcomm Incorporated | Ground Level Precharge Bit Line Scheme for Read Operation in Spin Transfer Torque Magnetoresistive Random Access Memory |
JP5150936B2 (ja) * | 2007-12-28 | 2013-02-27 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8242776B2 (en) * | 2008-03-26 | 2012-08-14 | Everspin Technologies, Inc. | Magnetic sensor design for suppression of barkhausen noise |
US8159870B2 (en) * | 2008-04-04 | 2012-04-17 | Qualcomm Incorporated | Array structural design of magnetoresistive random access memory (MRAM) bit cells |
US7764535B2 (en) * | 2008-06-11 | 2010-07-27 | Miradia Inc. | Low power, small size SRAM architecture |
JP5100530B2 (ja) * | 2008-06-23 | 2012-12-19 | 株式会社東芝 | 抵抗変化型メモリ |
US8625338B2 (en) | 2010-04-07 | 2014-01-07 | Qualcomm Incorporated | Asymmetric write scheme for magnetic bit cell elements |
JP2012059326A (ja) * | 2010-09-10 | 2012-03-22 | Toshiba Corp | 半導体記憶装置 |
JP2012203944A (ja) * | 2011-03-24 | 2012-10-22 | Toshiba Corp | 抵抗変化型メモリ |
US9047965B2 (en) * | 2011-12-20 | 2015-06-02 | Everspin Technologies, Inc. | Circuit and method for spin-torque MRAM bit line and source line voltage regulation |
US8995180B2 (en) * | 2012-11-29 | 2015-03-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetoresistive random access memory (MRAM) differential bit cell and method of use |
KR102098244B1 (ko) | 2014-02-04 | 2020-04-07 | 삼성전자 주식회사 | 자기 메모리 소자 |
KR102235211B1 (ko) * | 2014-03-25 | 2021-04-05 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그것을 포함하는 저장 장치, 그것의 쓰기 방법 및 읽기 방법 |
WO2017043105A1 (en) * | 2015-09-11 | 2017-03-16 | Kabushiki Kaisha Toshiba | Resistance change type memory |
JP6139623B2 (ja) * | 2015-09-15 | 2017-05-31 | 株式会社東芝 | 不揮発性半導体メモリ |
JP2018147546A (ja) * | 2017-03-09 | 2018-09-20 | ソニーセミコンダクタソリューションズ株式会社 | 制御回路、半導体記憶装置、情報処理装置及び制御方法 |
US10854259B2 (en) | 2018-06-29 | 2020-12-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Asynchronous read circuit using delay sensing in magnetoresistive random access memory (MRAM) |
US11910723B2 (en) * | 2019-10-31 | 2024-02-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device with electrically parallel source lines |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2845952B2 (ja) * | 1989-06-28 | 1999-01-13 | 株式会社日立製作所 | 薄膜磁気メモリセルとその記録および再生装置 |
JPH04205793A (ja) * | 1990-11-29 | 1992-07-27 | Seiko Epson Corp | 半導体記憶装置 |
US5448515A (en) * | 1992-09-02 | 1995-09-05 | Mitsubishi Denki Kabushiki Kaisha | Magnetic thin film memory and recording/reproduction method therefor |
US5732016A (en) | 1996-07-02 | 1998-03-24 | Motorola | Memory cell structure in a magnetic random access memory and a method for fabricating thereof |
US6072718A (en) | 1998-02-10 | 2000-06-06 | International Business Machines Corporation | Magnetic memory devices having multiple magnetic tunnel junctions therein |
US6219273B1 (en) * | 1998-03-02 | 2001-04-17 | California Institute Of Technology | Integrated semiconductor-magnetic random access memory system |
US5982690A (en) * | 1998-04-15 | 1999-11-09 | Cirrus Logic, Inc. | Static low-power differential sense amplifier circuits, systems and methods |
US6111781A (en) * | 1998-08-03 | 2000-08-29 | Motorola, Inc. | Magnetic random access memory array divided into a plurality of memory banks |
JP2000132961A (ja) * | 1998-10-23 | 2000-05-12 | Canon Inc | 磁気薄膜メモリ、磁気薄膜メモリの読出し方法、及び磁気薄膜メモリの書込み方法 |
DE19853447A1 (de) * | 1998-11-19 | 2000-05-25 | Siemens Ag | Magnetischer Speicher |
US6055178A (en) * | 1998-12-18 | 2000-04-25 | Motorola, Inc. | Magnetic random access memory with a reference memory array |
US6185143B1 (en) * | 2000-02-04 | 2001-02-06 | Hewlett-Packard Company | Magnetic random access memory (MRAM) device including differential sense amplifiers |
US6215707B1 (en) | 2000-04-10 | 2001-04-10 | Motorola Inc. | Charge conserving write method and system for an MRAM |
JP3800925B2 (ja) | 2000-05-15 | 2006-07-26 | 日本電気株式会社 | 磁気ランダムアクセスメモリ回路 |
JP4726290B2 (ja) * | 2000-10-17 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
TW584976B (en) | 2000-11-09 | 2004-04-21 | Sanyo Electric Co | Magnetic memory device |
JP4667594B2 (ja) * | 2000-12-25 | 2011-04-13 | ルネサスエレクトロニクス株式会社 | 薄膜磁性体記憶装置 |
-
2001
- 2001-05-16 JP JP2001145984A patent/JP4731041B2/ja not_active Expired - Fee Related
- 2001-10-22 US US09/982,936 patent/US6876575B2/en not_active Expired - Lifetime
-
2002
- 2002-05-10 TW TW091109769A patent/TWI225255B/zh not_active IP Right Cessation
- 2002-05-10 KR KR1020020025887A patent/KR100654266B1/ko not_active IP Right Cessation
- 2002-05-10 DE DE10220897A patent/DE10220897A1/de not_active Ceased
- 2002-05-16 CN CN021199167A patent/CN1385860B/zh not_active Expired - Fee Related
-
2004
- 2004-11-08 US US10/982,895 patent/US7116595B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101587746B (zh) * | 2004-02-20 | 2011-01-26 | 瑞萨电子株式会社 | 半导体器件 |
CN107404112A (zh) * | 2016-05-18 | 2017-11-28 | 来扬科技股份有限公司 | 应用于mram 的尖峰电流旁路保护控制装置 |
CN107705812A (zh) * | 2016-08-08 | 2018-02-16 | 台湾积体电路制造股份有限公司 | 静态随机存取存储器sram装置 |
CN107705812B (zh) * | 2016-08-08 | 2021-06-29 | 台湾积体电路制造股份有限公司 | 静态随机存取存储器sram装置 |
CN109584923A (zh) * | 2017-09-28 | 2019-04-05 | 赢世通股份有限公司 | 感应电路及其内存宏码 |
CN109584923B (zh) * | 2017-09-28 | 2023-05-30 | 赢世通股份有限公司 | 感应电路及其内存宏码 |
Also Published As
Publication number | Publication date |
---|---|
US6876575B2 (en) | 2005-04-05 |
CN1385860B (zh) | 2010-05-12 |
US20050083773A1 (en) | 2005-04-21 |
US7116595B2 (en) | 2006-10-03 |
JP4731041B2 (ja) | 2011-07-20 |
KR100654266B1 (ko) | 2006-12-07 |
US20020172068A1 (en) | 2002-11-21 |
KR20030009123A (ko) | 2003-01-29 |
JP2002343077A (ja) | 2002-11-29 |
DE10220897A1 (de) | 2002-11-28 |
TWI225255B (en) | 2004-12-11 |
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