CN118041437A

CN118041437A - Index determining method and device for spliced filter and storage medium

Info

Publication number: CN118041437A
Application number: CN202211418902.8A
Authority: CN
Inventors: 孔祥健; 肖礼; 李东华; 杨家喜; 陈宏刚; 张博; 罗勇; 马卫东
Original assignee: Accelink Technologies Co Ltd
Current assignee: Accelink Technologies Co Ltd
Priority date: 2022-11-14
Filing date: 2022-11-14
Publication date: 2024-05-14
Also published as: WO2024103642A1

Abstract

The disclosure provides an index determining method, an index determining device and a storage medium of a spliced filter, wherein the spliced filter comprises: a comb filter and a wavelength division multiplexer; the method comprises the following steps: acquiring first data of a splicing filter at a first temperature; respectively acquiring temperature related parameters of the comb filter and the wavelength division multiplexer in the spliced filter at a second temperature; determining second data of the splice filter at a second temperature based on the comb filter, a temperature related parameter of the wavelength division multiplexer at the second temperature, and the first data of the splice filter; an index value of the splice filter at a second temperature is determined based on the first data and/or the second data of the splice filter.

Description

Index determining method and device for spliced filter and storage medium

Technical Field

The disclosure relates to the technical field of communication, and in particular relates to a method and a device for determining indexes of a spliced filter and a storage medium.

Background

In an optical communication system, a splicing filter formed by a comb filter and a wavelength division multiplexer has the advantages of low cost, improved communication capacity, capability of meeting the application requirements of a QAM (quadrature amplitude modulation) and other related optical communication systems and the like by reducing channel intervals on the basis of original equipment, so that the splicing filter has wide application scenes.

In practical application, the change of the ambient temperature is considered to cause the wavelength shift and the insertion loss of the filter to further influence the performance index of the filter, thereby preventing the normal operation of the communication network. Therefore, we should pay attention not only to the normal temperature index of the filter but also to the high and low temperature index of the filter.

In the related technology, the high and low temperature indexes of the filter can be determined through the temperature related parameters of the filter; however, for the spliced filter, it is still difficult to determine the temperature-related parameter of the spliced filter spliced by the comb filter and the wavelength division multiplexer, which device is related to the temperature-related parameter; so that the high and low temperature indexes of the spliced filter cannot be determined.

Disclosure of Invention

Accordingly, a primary object of the present disclosure is to provide a method, an apparatus and a storage medium for determining an index of a splice filter.

In order to achieve the above purpose, the technical scheme of the present disclosure is realized as follows:

In a first aspect, an embodiment of the present disclosure provides a method for determining an index of a spliced filter, where the spliced filter includes: a comb filter and a wavelength division multiplexer; comprising the following steps:

acquiring first data of the spliced filter at a first temperature;

respectively acquiring temperature related parameters of the comb filter and the wavelength division multiplexer in the spliced filter at a second temperature;

determining second data of the splice filter at a second temperature based on the comb filter, a temperature related parameter of the wavelength division multiplexer at the second temperature, and the first data of the splice filter;

An index value of the splice filter at the second temperature is determined based on the first data and/or the second data of the splice filter.

Optionally, the temperature-related parameter includes at least: temperature dependent wavelength (Temperature DEPENDENT WAVELENGTH, TDW);

the determining, based on the temperature-related parameters of the comb filter and the wavelength division multiplexer at the second temperature, the target temperature-related parameter of the splicing filter at the second temperature includes:

And determining a first temperature related wavelength of the comb filter at the second temperature as a target temperature related wavelength of the splicing filter at the second temperature.

Optionally, the temperature-related parameter includes at least: temperature dependent loss (Temperature Dependent Loss, TDL);

And summing the first temperature-related loss of the comb filter at the second temperature and the second temperature-related loss of the wavelength division multiplexer at the second temperature to obtain the target temperature-related loss of the splicing filter at the second temperature.

Optionally, the first data includes at least: first wavelength data and first insertion loss data; the second data at least comprises: second wavelength data and second insertion loss data;

The determining the second data of the splicing filter at the second temperature according to the first data of the splicing filter at the first temperature and the target temperature related parameter of the splicing filter at the second temperature comprises the following steps:

Determining second wavelength data of the splice filter at the second temperature based on a sum value between the first wavelength data and the target temperature-related wavelength of the splice filter at the second temperature;

And determining second insertion loss data of the splicing filter at the second temperature based on a difference between the first insertion loss data and the target temperature-related loss of the splicing filter at the second temperature.

Optionally, the index value includes: a precision index value;

the determining an index value of the splicing filter at the second temperature based on the first data and/or the second data of the splicing filter includes:

Determining the precision index value of the center wavelength of the splicing filter at the first temperature based on the first data;

and determining the precision index value of the center wavelength of the splicing filter at the second temperature according to the precision index value of the splicing filter at the first temperature and the target temperature related wavelength of the splicing filter at the second temperature.

Optionally, the index value includes: an insertion loss index value within an effective bandwidth range;

Determining whether the target temperature related wavelength of the splicing filter at the second temperature meets a first preset condition;

If the target temperature related wavelength of the splicing filter at the second temperature meets the first preset condition, obtaining an insertion loss index value of the splicing filter in the effective bandwidth range at the first temperature;

And carrying out summation processing on the insertion loss index value of the splicing filter in the effective bandwidth range at the first temperature and the target temperature related loss of the splicing filter at the second temperature to obtain the insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature.

Optionally, the index value includes: a full bandwidth index value;

Determining a first cut-off wavelength and a second cut-off wavelength of the splice filter at the first temperature based on the first data of the splice filter; wherein the first cut-off wavelength and the second cut-off wavelength are: the peak insertion loss of the splicing filter is reduced by a wavelength value corresponding to ndB, and the first cut-off wavelength is smaller than the second cut-off wavelength;

Determining a full bandwidth index value of the splice filter at the first temperature based on the first cut-off wavelength and the second cut-off wavelength;

and determining the full bandwidth index value of the splicing filter at the first temperature as the full bandwidth index value of the splicing filter at the second temperature.

Optionally, the index value includes: a net bandwidth index value;

Determining a first cut-off wavelength and a second cut-off wavelength of the splice filter at the second temperature based on the first cut-off wavelength of the splice filter at the first temperature, the second cut-off wavelength, and the target temperature-related wavelength of the splice filter at the second temperature;

and determining a net bandwidth index value of the splicing filter at the second temperature based on the first cut-off wavelength and the second cut-off wavelength of the splicing filter at the second temperature.

Optionally, the index value includes: adjacent isolation index (Adjacent Isolation, AI) values;

determining an adjacent isolation index value of the spliced filter at the first temperature based on the first data of the spliced filter;

determining an adjacent isolation index value of the splice filter at the second temperature based on the adjacent isolation index value of the splice filter at the first temperature and the first temperature-dependent wavelength of the comb filter at the second temperature;

Wherein a difference between an adjacent isolation index value of the splice filter at the first temperature and an adjacent isolation index value of the splice filter at the second temperature is positively correlated with the first temperature-dependent wavelength of the comb filter at the second temperature.

Optionally, the index value includes: non-adjacent isolation (Non-adjacent Isolation, NI) index value;

Determining a non-adjacent isolation index value of the splice filter at the first temperature based on the first data of the splice filter;

Determining a non-adjacent isolation index value of the splice filter at the second temperature based on the non-adjacent isolation index value of the splice filter at the first temperature and the second temperature-dependent wavelength of the wavelength division multiplexer at the second temperature;

Wherein a difference between a non-adjacent isolation index value of the splice filter at the first temperature and a non-adjacent isolation index value of the splice filter at the second temperature is positively correlated with the second temperature-dependent wavelength of the wavelength division multiplexer at the second temperature.

Optionally, the method comprises:

acquiring a first target parameter of the spliced filter; the first target parameters are: any one of the temperature dependent loss and the temperature dependent wavelength;

acquiring a plurality of expected indexes of the spliced filter;

Determining a target parameter variation of a second target parameter when the splice filter simultaneously meets the plurality of desired indexes based on the plurality of desired indexes and the first target parameter of the splice filter; the second target parameters are: the temperature dependent loss and the temperature dependent wavelength are different parameters than the first target parameter.

In a second aspect, an embodiment of the present disclosure provides an index determining apparatus of a splice filter, the splice filter including: a comb filter and a wavelength division multiplexer, the apparatus comprising:

the acquisition module is used for acquiring first data of the spliced filter at a first temperature; respectively acquiring temperature related parameters of the comb filter and the wavelength division multiplexer in the spliced filter at a second temperature;

The first determining module is used for determining a target temperature related parameter of the splicing filter at the second temperature based on the temperature related parameters of the comb filter and the wavelength division multiplexer at the second temperature;

a second determining module, configured to determine second data of the splicing filter at a second temperature based on the comb filter, a temperature-related parameter of the wavelength division multiplexer at the second temperature, and the first data of the splicing filter; an index value of the splice filter at the second temperature is determined based on the first data and/or the second data of the splice filter.

In a third aspect, an embodiment of the present disclosure provides an index determining device of a spliced filter, including a memory and a processor, where the memory stores a computer program executable on the processor, and the processor implements steps in the method according to the first aspect of the embodiment of the present disclosure when the processor executes the program.

In a fourth aspect, embodiments of the present disclosure provide a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the method of the first aspect of embodiments of the present disclosure.

The embodiment of the disclosure can determine second data of the splicing filter at a second temperature based on first data of the splicing filter at the first temperature and temperature related parameters of the comb filter and the wavelength division multiplexer in the splicing filter at the second temperature; and then according to the first data and/or the second data of the spliced filter, determining an index value of the spliced filter at the second temperature, so that the filter index in a high-low temperature environment is simply and efficiently evaluated, the cost is low, and the production is facilitated.

Drawings

FIG. 1 is a flow chart of a method of determining an index of a splice filter, according to an exemplary embodiment;

FIG. 2 is a schematic diagram of a splice filter according to an exemplary embodiment;

FIG. 3 is a schematic diagram II of a splice filter according to an exemplary embodiment;

FIG. 4 is a schematic diagram of a two-stage splice filter according to an exemplary embodiment;

FIG. 5 is a schematic diagram of a three stage splice filter, according to an exemplary embodiment;

FIG. 6 is a graphical illustration of first data of a splice filter at ambient conditions, shown in accordance with an exemplary embodiment;

FIG. 7 is an enlarged partial schematic view of FIG. 6;

Fig. 8 is a schematic diagram showing first data of a comb filter in a normal temperature condition according to an exemplary embodiment;

fig. 9 is a schematic diagram showing first data of a wavelength division multiplexer in a normal temperature condition according to an exemplary embodiment;

FIG. 10 is a schematic diagram of a comparison plot of first data of a splice filter, comb filter, and wavelength division multiplexer at ambient conditions, according to an exemplary embodiment;

FIG. 11 is an enlarged partial schematic view of FIG. 10;

FIG. 12 is a schematic diagram II of a two-stage splice filter according to an exemplary embodiment;

FIG. 13 is a graph showing a comparison of second data of a splice filter, comb filter and wavelength division multiplexer in a high temperature scenario, according to an exemplary embodiment;

FIG. 14 is a graph of second data of a comb filter in a high temperature scenario, according to an exemplary embodiment;

FIG. 15 is a schematic diagram of second data of a wavelength division multiplexer in a high temperature scenario, according to an exemplary embodiment;

FIG. 16 is a graph illustrating second data of a splice filter at high temperature, according to an exemplary embodiment;

FIG. 17 is an enlarged partial schematic view of FIG. 16;

FIG. 18 is a schematic diagram illustrating a center wavelength and accuracy index definition in accordance with an exemplary embodiment;

FIG. 19 is a schematic diagram illustrating a loss-of-plug index definition according to an example embodiment;

FIG. 20 is a diagram illustrating a bandwidth indicator definition according to an exemplary embodiment;

FIG. 21 is a schematic diagram illustrating an isolation definition according to an example embodiment;

Fig. 22 is a schematic structural view of an index determining apparatus of a splice filter according to an exemplary embodiment;

Fig. 23 is a schematic diagram showing a hardware entity structure of an index determining apparatus of a splice filter according to an exemplary embodiment.

Detailed Description

For the purposes of making the objects, technical solutions and advantages of the embodiments of the present disclosure more apparent, the specific technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings in the embodiments of the present disclosure. The following examples are illustrative of the present disclosure, but are not intended to limit the scope of the present disclosure.

An embodiment of the present disclosure provides a method for determining an index of a spliced filter, as shown in fig. 1, and fig. 1 is a flowchart illustrating a method for determining an index of a spliced filter according to an exemplary embodiment. The method comprises the following steps:

step S101, obtaining first data of the spliced filter at a first temperature;

Step S102, respectively acquiring temperature related parameters of the comb filter and the wavelength division multiplexer in the spliced filter at a second temperature;

Step S103, determining second data of the splicing filter at a second temperature based on the comb filter, the temperature related parameter of the wavelength division multiplexer at the second temperature and the first data of the splicing filter;

step S104, determining an index value of the splicing filter at the second temperature based on the first data and/or the second data of the splicing filter.

The index determining method of the spliced filter shown in the embodiment of the present disclosure may be applied to a spliced filter, and it should be noted that the spliced filter is formed by splicing two filters (i.e., a first filter and a second filter), as shown in fig. 2, fig. 2 is a schematic structural diagram of one spliced filter shown in an exemplary embodiment. The signal passes through the first filter and the second filter, and the corresponding signal is output after two-stage filtering. The spectrum (dB) of the splice filter is the sum of the spectra (dB) of the first filter (dB) and the second filter (dB).

The spectrum shape of the second filter is wider than that of the first filter, and the spectrum in the band of the second filter is flat, so that the spectrum shape in the band of the spliced filter is determined by the first filter; moreover, by stitching the second filter, the power of the out-of-band spectrum of the stitched filter is lower, i.e. the crosstalk is lower (isolation is higher) than the first filter spectrum. It is particularly noted that the spectral characteristics of the first filter and the second filter may be interchanged in view of reciprocity.

Illustratively, as shown in fig. 3, fig. 3 is a schematic diagram of a second configuration of a splice filter according to an exemplary embodiment. The first filter may be an Interleaver (INT) component and the second filter may be a wavelength division multiplexer (WAVELENGTH DIVISION MULTIPLEXER, WDM) component, as shown in fig. 3, where the INT component may be composed of several comb filters and the WDM component may be composed of several comb filters or wavelength division multiplexers.

As shown in fig. 4, fig. 4 is a schematic diagram illustrating a two-stage splice filter according to an exemplary embodiment. Wherein the INT component consists of 1 comb filter and the WDM component consists of 2 wavelength division multiplexers.

As shown in fig. 5, fig. 5 is a schematic diagram of a three-stage splice filter according to an exemplary embodiment. Wherein the INT component consists of 1 comb filter, and the WDM component consists of 1 comb filter and 2 wavelength division multiplexer.

For ease of understanding, the embodiment of the disclosure uses a two-stage splice filter as an example, and describes an index determining method of the splice filter.

The splice filter includes: a comb filter (INT) and two wavelength division multiplexers (WAVELENGTH DIVISION MULTIPLEXER, WDM); the frequency interval of the comb filter is f, the frequency interval of the wavelength division multiplexer is 2f, and the filtering wavelengths of the two wavelength division multiplexers respectively correspond to the wavelength of the parity channel of the comb filter.

In step S101, first data of the comb filter and the wavelength division multiplexer in the splicing filter at a first temperature may be obtained through an experimental test;

Here, the first temperature may be any normal temperature within an operating temperature range of the splicing filter; the specific value of the first temperature may be determined according to practical situations, which is not limited by the embodiments of the present disclosure. For example, the first temperature may be 25 ℃.

The first data may be: any data capable of reflecting transmission spectral information of the optical device at the first temperature is not limited in this disclosure.

For ease of understanding, assuming a 64 channel 75GHz splice filter, the start and stop frequencies are 196100GHz and 191375GHz, respectively, one of the ITU wavelengths is chosen according to the international telecommunications union standard (International Telecommunication Union, ITU) as λ _ITU＝1528.773nm(f_ITU = 196100 GHz.

The comb filter has 1 input channel and 2 output channels, the 2 output channels are odd channel and even channel, wherein the start wavelength of the odd channel is lambda _odd-1＝λ_ITU-1 = 1528.773nm, the end wavelength of the even channel is lambda _eve-n32＝λ_IT-U64 = 1566.51nm, the end wavelength of the odd channel is lambda _odd-32＝c/(f_even-32 +75) = 1565.905nm, and the start wavelength of the even channel is lambda _odd-1＝λ_ITU-1 = 1528.773nmThus, the frequency spacing of the odd/even channels is 150GHz, and the spacing of the odd and even channels is 75GHz.

The channel number of the two wavelength division multiplexers in the splicing filter is 32, the frequency interval is 150GHz, and the center wavelength and the frequency interval of the two wavelength division multiplexers respectively correspond to the odd channel and the even channel of the comb filter.

Fig. 6 is a schematic diagram of first data of a splice filter at normal temperature, as shown in fig. 6-11, according to an exemplary embodiment. Fig. 7 is an enlarged partial schematic view of fig. 6. Fig. 8 is a schematic diagram showing first data of a comb filter in a normal temperature condition according to an exemplary embodiment; fig. 9 is a schematic diagram showing first data of a wavelength division multiplexer in a normal temperature condition according to an exemplary embodiment; fig. 10 is a schematic diagram showing a comparison curve of first data of a splice filter, a comb filter, and a wavelength division multiplexer in a normal temperature condition according to an exemplary embodiment. Fig. 11 is an enlarged partial schematic view of fig. 10.

It should be noted that the comb filter in fig. 6 to 11 is: michelson-GT cavity interferometers (MGTI), the wavelength division multiplexer being an arrayed waveguide grating (Arrayed Waveguide Grating, AWG); the normal temperature is 25 ℃. It is understood that the splice filter is formed by splicing MGTI and AWG, as shown in fig. 12, and fig. 12 is a schematic diagram two of a two-stage splice filter according to an exemplary embodiment.

The ordinate in FIGS. 6-11 above represents transmittance TRANSMITTANCE and the abscissa represents Wavelength; in the related art, the insertion loss is inversely related to the transmittance.

As can be seen from fig. 10-11, the transmission spectrum (dB) of the splice filter is the sum of the transmission spectrum (dB) of the comb filter and the transmission spectrum (dB) of the wavelength division multiplexer at the same wavelength.

Therefore, after the first data of the comb filter and the wavelength division multiplexer at the first temperature is obtained, the first data of the splicing filter at the first temperature is determined according to the first data of the comb filter and the wavelength division multiplexer.

In step S102, a temperature-related parameter of the comb filter at the second temperature and a temperature-related parameter of the wavelength division multiplexer at the second temperature in the splicing filter may be obtained respectively;

Here, the second temperature may be any temperature other than the first temperature in the operating temperature range of the splice filter; the specific value of the second temperature may be determined according to practical situations, which is not limited by the embodiments of the present disclosure. For example, the second temperature may be a maximum operating temperature of 65 ℃ within an operating temperature range of the splice filter.

The temperature-related parameters are: parameters which change regularly along with the change of temperature. Specifically, the temperature-related parameter may be set according to actual conditions.

In step S103, second data of the comb filter and the wavelength division multiplexer at the second temperature may be determined according to temperature related parameters of the comb filter and the wavelength division multiplexer at the second temperature; and determining second data of the splice filter at the second temperature based on the second data of the comb filter and the wavelength division multiplexer.

Here, the second data may be: any data capable of reflecting the transmission spectrum information of the optical device at the second temperature is not limited in this disclosure.

Determining second data of the comb filter at the second temperature according to the temperature related parameter of the comb filter at the second temperature and first data of the comb filter at the first temperature;

And determining second data of the wavelength division multiplexer at the second temperature according to the temperature related parameter of the wavelength division multiplexer at the second temperature and the first data of the wavelength division multiplexer at the first temperature.

It should be noted that, since the amount of shift between wavelengths of the comb filter (or the wavelength division multiplexer) at the second temperature compared to wavelengths of the comb filter (or the wavelength division multiplexer) at the first temperature and the amount of change between the transmittance of the comb filter (or the wavelength division multiplexer) at the second temperature compared to the transmittance of the comb filter (or the wavelength division multiplexer) at the first temperature depend on the temperature-related parameter of the comb filter (or the wavelength division multiplexer) at the second temperature.

Therefore, the wavelength offset and the insertion loss variation of the comb filter (or the wavelength division multiplexer) can be determined according to the temperature related parameters of the comb filter (or the wavelength division multiplexer) at the second temperature; and determining second data of the comb filter (or the wavelength division multiplexer) at the second temperature according to the first data of the comb filter (or the wavelength division multiplexer), the wavelength offset and the insertion loss variation.

It should be noted that, as shown in fig. 13, fig. 13 is a schematic diagram of a comparison curve of second data of a splicing filter, a comb filter and a wavelength division multiplexer and third data of the splicing filter in a high temperature situation according to an exemplary embodiment.

As can be seen from fig. 13, at high temperature, the transmission spectrum (dB) of the splicing filter is still the sum of the transmission spectrum (dB) of the comb filter and the transmission spectrum (dB) of the wavelength division multiplexer.

Therefore, after the second data of the comb filter and the wavelength division multiplexer at the second temperature is obtained, the second data of the splicing filter at the second temperature is determined according to the second data of the comb filter and the wavelength division multiplexer.

Third data of the splice filter at the second temperature may be determined according to the second temperature-dependent wavelength of the wavelength division multiplexer, and the int+wdm-65-NI curve shown in fig. 13 is the third data of the splice filter at the second temperature determined based on the second temperature-dependent wavelength of the wavelength division multiplexer.

It should be noted that, since the non-adjacent isolation index of the splicing filter is inherited from the non-adjacent isolation value index of the wavelength division multiplexer, the third data of the splicing filter may be used to determine the non-adjacent isolation of the splicing filter.

In step S104, an index value of the splice filter at the second temperature may be determined based on the first data and/or the second data of the splice filter and a preset definition of the index.

Here, the index value may be determined according to actual conditions, and is not limited herein. As an example, the index value may be an index value such as an accuracy index value, an insertion loss index value, a bandwidth index value, a passband flatness index value, and a polarization dependent loss index value.

Optionally, determining the second data of the splice filter at the second temperature in the step S103 based on the comb filter, the temperature related parameter of the wavelength division multiplexer at the second temperature, and the first data of the splice filter includes:

Determining a target temperature related parameter of the splicing filter at a second temperature based on the temperature related parameters of the comb filter and the wavelength division multiplexer at the second temperature;

And determining second data of the splicing filter at the second temperature according to the first data of the splicing filter and a target temperature related parameter of the splicing filter at the second temperature.

In the embodiment of the disclosure, the transmission spectrum (dB) of the splicing filter is the sum of the transmission spectrum (dB) of the comb filter and the transmission spectrum (dB) of the wavelength division multiplexer under the condition of the same wavelength; and the change condition of the transmission spectrum information of the comb filter and the wavelength division multiplexer depends on the temperature related parameters of the comb filter and the wavelength division multiplexer.

Therefore, the target temperature related parameter of the splicing filter at the second temperature can be determined according to the temperature related parameters of the comb filter and the wavelength division multiplexer at the second temperature;

Here, the target temperature related parameter of the splice filter at the second temperature may be at least used to indicate an amount of change between second data of the splice filter at the second temperature and first data of the splice filter at the first temperature.

Determining the wavelength offset and the insertion loss variation of the splicing filter according to the target temperature related parameters of the splicing filter at the second temperature; and determining second data of the splicing filter at a second temperature according to the first data of the splicing filter, the wavelength offset and the insertion loss variation.

Optionally, the temperature-related parameter includes at least: temperature dependent wavelength and temperature dependent loss;

determining a first temperature-dependent wavelength of the comb filter at the second temperature as a target temperature-dependent wavelength of the splice filter at the second temperature;

In an embodiment of the disclosure, the temperature-related parameter includes at least: temperature dependent wavelength TDW and temperature dependent loss TDL;

Here, the temperature-dependent wavelength is at least used for reflecting an offset amount of a device wavelength offset caused by a temperature change; the temperature-dependent loss is at least used for reflecting the change amount of the device insertion loss change caused by the temperature change.

For ease of understanding, fig. 14 is a schematic diagram of the second data of a comb filter in a high temperature situation according to an exemplary embodiment, as shown in fig. 8 and 14. Wherein the high temperature is 65 ℃.

As can be seen from comparison between fig. 8 and fig. 14, in the high temperature situation, the temperature-dependent wavelength TDW _MGTI-65 =5pm of the comb filter and the temperature-dependent loss TDL _MGTI-65 =0.3 dB.

As shown in fig. 9 and 15, fig. 15 is a schematic diagram illustrating second data of a wavelength division multiplexer in a high temperature case according to an exemplary embodiment.

As can be seen from comparison between fig. 9 and fig. 15, in the high temperature situation, the temperature-dependent wavelength TDW _AWG-65 =35 pm of the wavelength division multiplexer and the temperature-dependent loss TDL _AWG-65 =0.2 dB.

6-7, 16-17, FIG. 16 is a graphical illustration of second data of a splice filter at high temperature, according to an exemplary embodiment; fig. 17 is an enlarged partial schematic view of fig. 16.

As can be seen from comparison of fig. 6-7 and 16-17, in the case of high temperature, the temperature-dependent wavelength tdw=5pm and the temperature-dependent loss tdl=0.5 dB of the splice filter.

It can be seen that the target temperature-dependent wavelength of the splicing filter at the second temperature is equal to the first temperature-dependent wavelength of the comb filter at the second temperature; the target temperature dependent loss of the splice filter at the second temperature is equal to the sum of the first temperature dependent loss of the comb filter at the second temperature and the second temperature dependent loss of the wavelength division multiplexer at the second temperature.

Therefore, when determining the target temperature related wavelength of the splicing filter, the first temperature related wavelength of the comb filter at the second temperature can be directly determined as the target temperature related wavelength of the splicing filter at the second temperature;

And when the target temperature-related loss of the splicing filter is determined, summing the first temperature-related loss of the comb filter at the second temperature and the second temperature-related loss of the wavelength division multiplexer at the second temperature to obtain the target temperature-related loss of the splicing filter at the second temperature.

In an embodiment of the disclosure, the first data includes at least: first wavelength data and first insertion loss data.

Here, the first wavelength data and the first wavelength data may be determined according to actual situations, which is not limited by the embodiments of the present disclosure; for example, the first wavelength data may be any one of all wavelength data of the splice filter at the first temperature; the first insertion loss data may be any insertion loss data of all insertion loss data of the splicing filter at the first temperature.

The second data at least comprises: second wavelength data and second insertion loss data.

Here, the second wavelength data and the second insertion loss data may be determined according to actual situations, which is not limited in the embodiments of the present disclosure; for example, the second wavelength data may be any one of all wavelength data of the splice filter at the second temperature; the second insertion loss data may be any insertion loss data of all insertion loss data of the splice filter at the second temperature.

Summing the first wavelength data of the splicing filter at the first temperature and the target temperature related wavelength of the splicing filter at the second temperature to obtain second wavelength data of the splicing filter at the second temperature;

And performing a difference solving process according to the first insertion loss data of the splicing filter at the first temperature and the target temperature related loss of the splicing filter at the second temperature to obtain second insertion loss data of the splicing filter at the second temperature.

The second wavelength data of the splice filter at the second temperature may be determined by:

WL₂＝WL₁+TDW；

the WL ₂ is second wavelength data of the splicing filter, the WL ₁ is first wavelength data of the splicing filter, and the TDW is a target temperature related wavelength of the splicing filter at the second temperature.

The second insertion loss data of the splicing filter at the second temperature can be determined by the following formula:

T₂＝T₁-TDL；

The T ₂ is second insertion loss data of the splicing filter, the T ₁ is first insertion loss data of the splicing filter, and the TDL is target temperature-related loss of the splicing filter at the second temperature.

Optionally, the index value includes: a precision index value;

The determining, in step S104, an index value of the splicing filter at the second temperature based on the first data and/or the second data of the splicing filter includes:

In the embodiment of the disclosure, a first cut-off wavelength and a second cut-off wavelength of the splicing filter at a first temperature can be determined according to first data of the splicing filter at the first temperature; and determining the center wavelength of the spliced filter at the first temperature based on the first cut-off wavelength and the second cut-off wavelength.

Here, the center wavelength characterizes a corresponding wavelength value at the center of the spectral range covered by the peak insertion loss drop ndB; the first cut-off wavelength and the second cut-off wavelength are wavelength values corresponding to the peak insertion loss drop ndB, and the first cut-off wavelength is smaller than the second cut-off wavelength.

The standard center wavelength can be determined according to a preset criterion; and determining an accuracy index value of the center wavelength of the splicing filter based on the center wavelength and the standard center wavelength.

Here, the determining the standard center wavelength according to the preset criterion may be: one of the ITU center wavelengths (hereinafter referred to as ITU wavelength) is selected as the standard center wavelength according to the ITU standard.

As shown in fig. 18, fig. 18 is a schematic diagram illustrating a definition of center wavelength and accuracy index according to an exemplary embodiment.

As shown in fig. 18, assuming that the center wavelength is a wavelength value corresponding to the center of the spectrum range covered by the 3dB decrease in peak insertion loss, the precision index value of the splice filter may be determined by the following equation:

Δλ＝λ_c-λ_ITU；

Wherein Δλ represents an accuracy index value of the splicing filter, λ _c is a center wavelength, and λ _ITU is an ITU wavelength.

Therefore, the difference processing can be performed on the center wavelength of the spliced filter at the first temperature and the standard center wavelength, so as to obtain the precision index value of the center wavelength of the spliced filter at the first temperature.

After determining the precision index value of the splicing filter at the first temperature, summing the precision index value of the splicing filter at the first temperature and the target temperature related wavelength of the splicing filter, and determining the precision index value of the center wavelength of the splicing filter at the second temperature.

It can be understood that, since the target temperature related wavelength of the splicing filter at the second temperature is equal to the first temperature related wavelength of the comb filter at the second temperature, the precision index value of the splicing filter at the first temperature and the first temperature related wavelength of the comb filter at the second temperature may be summed to obtain the precision index value of the center wavelength of the splicing filter at the second temperature.

In some embodiments, the precision index value for the center wavelength of the splice filter at the second temperature may be determined by:

Δλ₆₅＝Δλ₂₅+TDW＝Δλ₂₅+TDW_INT；

Wherein, Δλ ₆₅ is an accuracy index value of the splicing filter at the second temperature, and Δλ ₂₅ is an accuracy index value of the splicing filter at the first temperature; the TDW is a target temperature related wavelength of the splicing filter at the second temperature; the TDW _INT is a first temperature dependent wavelength of the comb filter at the second temperature.

For ease of understanding, as shown in fig. 6-7, in the peak insertion loss IL _{peak-MGTI+AWG-25} =5.14 dB of the spliced filter under normal temperature (i.e. 25 ℃), if the center wavelength represents a wavelength value corresponding to the center of the spectrum covered by the 3dB drop of the peak insertion loss, the wavelength values corresponding to 8.14dB after the 3dB drop of the peak insertion loss are 1528.492nm and 1529.059nm, respectively. Center wavelength λ _{c-MGTI+AWG-25} = (1528.492+1529.059)/2= 1528.776nm of the spliced filter under normal temperature condition; the precision index value delta lambda=lambda _{c-MGTI+AWG-25}-λ_ITU =0.003 nm=3pm of the splicing filter under normal temperature condition.

Considering a target temperature-dependent wavelength of the splice filter at a high temperature condition (i.e., 65 ℃), i.e., a first temperature-dependent wavelength of the comb filter at a high temperature condition (i.e., 65 ℃) is 5pm; the precision index value of the center wavelength of the splice filter is 8pm in the high temperature condition.

In other embodiments, a center wavelength of the splice filter at a second temperature may be determined based on second data of the splice filter, and the precision index value of the center wavelength of the splice filter at the second temperature may be determined based on the standard center wavelength and the center wavelength of the splice filter at the second temperature.

As shown in fig. 16-17, in the high temperature situation (i.e. 65 ℃), if the center wavelength represents a wavelength value corresponding to the center of the spectrum range covered by the 3dB drop of the peak insertion loss, the wavelength value corresponding to 8.64dB after the 3dB drop of the peak insertion loss is 1528.497nm and 1528.064nm respectively; center wavelength lambda _{c-MGTI+AWG-65} = (1528.497+1528.064)/2= 1528.781nm of the splicing filter under high temperature condition; the precision index value delta lambda=lambda _{c-MGTI+AWG-65}-λ_ITU =0.008 nm=8pm of the splicing filter under the high temperature condition.

In an embodiment of the present disclosure, the index value includes: insertion loss index value in effective bandwidth range.

Here, the insertion loss index value may be determined according to an actual situation, for example, the insertion loss index value may be a maximum insertion loss value of the splicing filter within the effective bandwidth, or the insertion loss index value may be a peak insertion loss value of the splicing filter within the effective bandwidth, or the insertion loss index value may be an insertion loss value corresponding to the standard center wavelength of the splicing filter within the effective bandwidth, or the like. The embodiments of the present disclosure are not limited in this regard.

The calculation thinking of the insertion loss index values is the same, and particularly, it is noted that the high and low temperature peak insertion loss is only related to the temperature-related loss and is irrelevant to the temperature-related wavelength.

For convenience of description, the insertion loss index value in the embodiment of the present disclosure is a maximum insertion loss value of the splice filter within the effective bandwidth.

The target temperature related wavelength of the splicing filter at the second temperature can be obtained, and whether the target temperature related wavelength meets a first preset condition or not is determined based on the target temperature related wavelength;

Here, the first preset condition may be: the target temperature-related wavelength is less than or equal to a preset value. The preset value may be determined according to practical situations, for example, the preset value may be 0.

It should be noted that, if the target temperature related wavelength meets the first preset condition, it is indicated that the target temperature related wavelength of the splicing filter at the second temperature has a smaller influence on the insertion loss index value of the splicing filter within the effective bandwidth range at the second temperature.

If the target temperature related wavelength of the splicing filter at the second temperature meets the first preset condition, namely, if the target temperature related wavelength of the splicing filter at the second temperature has a small influence on the insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature, the insertion loss index value of the splicing filter in the effective bandwidth range at the first temperature is obtained.

As shown in fig. 19, fig. 19 is a schematic diagram illustrating a plug index definition according to an exemplary embodiment. And assuming the insertion loss index value is the maximum insertion loss in the effective bandwidth of the channel.

The effective bandwidth range [ lambda _min,λ_max ] of the splice filter may be determined by:

Wherein, lambda _min is the minimum wavelength value in the effective bandwidth range; the lambda _max is the maximum wavelength value in the effective bandwidth range; the c is a constant speed of light, and the c= 299792458m/s; the delta f _passband is the effective bandwidth of the channel of the splicing filter; and f _ITU is the standard center wavelength.

Illustratively, substituting Δf _passband =18 GHz into the above equation yields an effective bandwidth range of the splice filter of [1528.703, 1528.844] nm.

And determining the maximum insertion loss value of the splicing filter in the effective bandwidth range at the first temperature as an insertion loss index value of the splicing filter in the effective bandwidth range at the first temperature according to the first data of the splicing filter at the first temperature and the effective bandwidth range of the splicing filter.

Illustratively, as shown in fig. 6, the maximum insertion loss value (i.e., insertion loss index value) of the splice filter in the effective bandwidth range under normal temperature conditions is 5.22dB.

And carrying out summation processing based on the insertion loss index value at the first temperature and the target temperature related loss of the splicing filter at the second temperature to obtain the insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature.

It should be noted that, the insertion loss index value of the splice filter in the effective bandwidth range at the second temperature is approximately equal to the sum of the insertion loss index value of the splice filter in the effective bandwidth range at the first temperature and the target temperature-related loss of the splice filter at the second temperature.

And in the case that the target temperature related wavelength of the splicing filter at the second temperature has a small influence on the insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature, the insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature is equal to the sum of the insertion loss index value of the splicing filter in the effective bandwidth range at the first temperature and the target temperature related loss of the splicing filter at the second temperature.

Illustratively, the target temperature dependent wavelength tdw=5pm=0.005 nm, taking into account the target temperature dependent loss tdl=0.5 dB of the splice filter at high temperature conditions (i.e. 65 ℃); the target temperature related wavelength of the splicing filter under the high temperature condition has small influence on the insertion loss index value of the splicing filter in the effective bandwidth range of the second temperature, so that the insertion loss index value of the splicing filter in the effective bandwidth range under the high temperature condition is 5.22+0.5=5.72 dB.

In some embodiments, the effective bandwidth range of the splice filter may be determined based on a channel effective bandwidth of the splice filter; and determining an insertion loss index value of the splicing filter in an effective bandwidth range at the second temperature based on second data of the splicing filter at the second temperature and the effective bandwidth range of the splicing filter.

Illustratively, the effective bandwidth range of the splice filter is determined to be [1528.703, 1528.844] nm, based on Δf _passband =18 GHz.

And determining the maximum insertion loss value of the splicing filter in the effective bandwidth range at the second temperature as an insertion loss index value of the splicing filter in the effective bandwidth range at the second temperature according to the second data of the splicing filter at the second temperature and the effective bandwidth range of the splicing filter.

As shown in fig. 14, the maximum insertion loss value (i.e., the insertion loss index value) of the splicing filter in the effective bandwidth range under the high temperature condition is 5.72dB.

Optionally, the index value includes: a full bandwidth index value;

In an embodiment of the present disclosure, the index value may include: full bandwidth index value.

Determining a first cut-off wavelength and a second cut-off wavelength of the spliced filter at a first temperature according to first data of the spliced filter at the first temperature;

here, the first cut-off wavelength and the second cut-off wavelength are short wavelength values and long wavelength values corresponding to a spectral range covered by the peak insertion loss reduction ndB.

After the first cut-off wavelength and the second cut-off wavelength are determined, a first bandwidth value is determined based on the first cut-off wavelength, and a second bandwidth value is determined based on the second cut-off wavelength; it should be noted that, the first bandwidth value and the second bandwidth value may be determined by the following formula:

BW1＝c/λ₁-f_ITU；

BW2＝f_ITU-c/λ₂；

wherein, BW1 is the first bandwidth value, BW2 is the second bandwidth value; the c is a constant speed of light, and the c= 299792458m/s; the lambda ₁ is the first cut-off wavelength; the lambda ₂ is the second cut-off wavelength; and f _ITU is the standard center wavelength.

As shown in fig. 20, fig. 20 is a schematic diagram illustrating a bandwidth indicator definition according to an exemplary embodiment. Assuming that ndB bandwidth is defined as the spectral width covered by the peak insertion loss drop ndB, the full bandwidth index value=bbbk1+bbw2.

After determining a first bandwidth value and a second bandwidth value of the splicing filter at a first temperature, summing the first bandwidth value and the second bandwidth value to obtain a full bandwidth index value of the splicing filter at the first temperature.

Since the full bandwidth index value is not affected by temperature-dependent loss and temperature-dependent wavelength, after determining the full bandwidth index value of the splicing filter at the first temperature, the full bandwidth index value of the splicing filter at the first temperature may be directly determined as the full bandwidth index value of the splicing filter at the second temperature.

For example, as shown in fig. 6, if the peak insertion loss L _{peak-MGTI+AWG-25} = 5.14dB of the splicing filter under the normal temperature condition (i.e. 25 ℃) is the wavelength value corresponding to the 3dB drop of the peak insertion loss, the wavelength values corresponding to 8.14dB after the 3dB drop of the peak insertion loss are respectively 1528.492nm and 1529.059nm.

Based on the above, it is determined that the first bandwidth value and the second bandwidth value of the splicing filter under the normal temperature condition are respectively:

BW1＝c/1528.492-196100＝36.10GHz；

BW2＝196100-c/1529.059＝36.63GHz；

Accordingly, the full bandwidth index value of the splicing filter is 72.73GHz under the normal temperature condition.

Since the full bandwidth index value is not affected by the temperature-dependent loss and the temperature-dependent wavelength, the full bandwidth index value of the splice filter is still 72.73GHz in a high temperature condition (i.e., 65 ℃).

In some embodiments, a first cut-off wavelength and a second cut-off wavelength of the splice filter at the second temperature may be determined based on second data of the splice filter; and determining the full bandwidth index value of the splicing filter at the second temperature according to the first cut-off wavelength and the second cut-off wavelength of the splicing filter at the second temperature.

As shown in fig. 16, for example, if the peak insertion loss IL _{peak-MGTI+AWG-65} =5.64 dB of the splice filter in the high temperature condition (i.e. 65 ℃) is the wavelength value corresponding to the 3dB drop of the peak insertion loss, the wavelength values corresponding to the 8.64dB after the 3dB drop of the peak insertion loss are 1528.497nm (first cut-off wavelength) and 1528.064nm (second cut-off wavelength), respectively.

Therefore, the first bandwidth value and the second bandwidth value of the splicing filter under the high-temperature condition are respectively as follows:

BW1＝c/1528.497-196100＝35.46GHz；

BW2＝196100-c/1529.064＝37.27GHz；

The full bandwidth index value of the splicing filter under the high temperature condition is 72.73GHz.

Optionally, the index value includes: a net bandwidth index value;

In an embodiment of the present disclosure, the index value may include: a net bandwidth index value;

Determining a first cut-off wavelength of the splice filter at the second temperature based on the first cut-off wavelength at the first temperature and the target temperature-related wavelength of the splice filter at the second temperature; determining a second cut-off wavelength of the splice filter at the second temperature based on the second cut-off wavelength at the first temperature and the target temperature-related wavelength of the splice filter at the second temperature;

Here, the first cut-off wavelength (or the second cut-off wavelength) at the first temperature and the target temperature related wavelength of the splicing filter at the second temperature may be summed to obtain the first cut-off wavelength (or the second cut-off wavelength) of the splicing filter at the second temperature.

After determining a first cut-off wavelength and a second cut-off wavelength of the splicing filter at the second temperature, determining a first bandwidth value of the splicing filter at the second temperature based on the first cut-off wavelength, and determining a second bandwidth value of the splicing filter at the second temperature based on the second cut-off wavelength;

as shown in fig. 20, assuming that ndB bandwidth is defined as the spectral width covered by ndB with reduced peak insertion loss, the net bandwidth index value=2×min (BW 1, BW 2).

After determining the first bandwidth value and the second bandwidth value of the splicing filter at the second temperature, accumulating the smaller bandwidth value of the first bandwidth value and the second bandwidth value twice to obtain a net bandwidth index value of the splicing filter at the second temperature.

It should be noted that, the net bandwidth index value is irrelevant to the temperature-related loss, and is relevant to the temperature-related wavelength only; and when the center wavelength λ _c＝λ_ITU, the 3dB net bandwidth index value is equal to the 3dB full bandwidth index value (generally, the smaller the wavelength accuracy, the larger the net bandwidth, but since the center wavelength is the 3dB center wavelength, there is a difference in the 0.5dB, 1.5dB, 10dB, or 20dB net bandwidth).

Illustratively, as shown in fig. 6, according to the first data of the splicing filter under the normal temperature condition (i.e. 25 ℃), determining that the first cut-off wavelength and the second cut-off wavelength of the splicing filter under the normal temperature condition are 1528.492nm and 1529.059nm respectively; based on this, the net bandwidth index value of the splice filter at the normal temperature condition is 72.2GHz.

Considering that the temperature-dependent wavelength tdw=5pm of the splice filter in the high temperature condition (i.e. 65 ℃), the first cut-off wavelength and the second cut-off wavelength of the splice filter in the high temperature condition are respectively:

1528.492+0.005＝1528.497nm；

1529.059+0.005＝1529.064nm；

BW1＝c/1528.497-196100＝35.46GHz；

BW2＝196100-c/1529.064＝37.27GHz；

therefore, the net bandwidth index value of the splicing filter under the high temperature condition is 70.92GHz.

In some embodiments, a first cut-off wavelength and a second cut-off wavelength of the splice filter at the second temperature may be determined based on second data of the splice filter; and determining a net bandwidth index value of the splicing filter at the second temperature according to the first cut-off wavelength and the second cut-off wavelength of the splicing filter at the second temperature.

Illustratively, as shown in fig. 16, the first cut-off wavelength and the second cut-off wavelength of the spliced filter at a high temperature condition (i.e., 65 ℃) are 1528.497nm and 1528.064nm, respectively;

Therefore, the first bandwidth value and the second bandwidth value of the spliced filter under the high-temperature condition are 35.46GHz and 37.27GHz respectively; the net bandwidth index value of the splicing filter under the high temperature condition is 70.92GHz.

Optionally, the index value includes: an adjacent isolation index value;

In an embodiment of the present disclosure, the index value may include: an adjacent isolation index value;

It should be noted that, as shown in fig. 21, fig. 21 is a schematic diagram illustrating isolation definition according to an exemplary embodiment. The adjacent isolation index value AI can be defined as the difference between the insertion loss index value of the spliced filter channel and the minimum value of the insertion loss index value of the spliced filter adjacent channel in the corresponding channel effective bandwidth range; the adjacent isolation index value typically takes the minimum value of the left adjacent isolation index value and the right adjacent isolation index value.

Determining an insertion loss index value of a spliced filter channel in an effective bandwidth range and an insertion loss minimum value of an adjacent channel of the spliced filter in a corresponding effective bandwidth range based on first data of the spliced filter at a first temperature; and determining the adjacent isolation index value of the splicing filter at the first temperature according to the insertion loss index value and the insertion loss minimum value.

Illustratively, as shown in fig. 6, the maximum insertion loss value (i.e., insertion loss index value) of the splicing filter in the effective bandwidth range [1528.703, 1528.844] nm under the normal temperature condition (i.e., 25 ℃) is 5.22dB.

Because the first channel is selected in this example, the wavelength of the left adjacent channel is not selected, so that only the right adjacent isolation index value is obtained, the minimum value of the interpolation loss index value of the right adjacent channel of the splicing filter in the corresponding effective bandwidth range is 38.66dB, and the adjacent isolation index value of the splicing filter under the normal temperature condition is 33.44dB.

The adjacent isolation index is not affected by the temperature-dependent loss, is affected by the temperature-dependent wavelength, and changes in the adjacent isolation index are smaller as the temperature-dependent wavelength is smaller.

And determining whether the target temperature related wavelength of the splicing filter at the second temperature meets a first preset condition, and if the target temperature related wavelength of the splicing filter at the second temperature meets the first preset condition, determining the adjacent isolation index value of the splicing filter at the first temperature as the adjacent isolation index value of the splicing filter at the second temperature.

Illustratively, consider a target temperature-dependent wavelength tdw=5pm=0.005 nm of the splice filter at the high temperature condition (i.e. 65 ℃); the difference value between the adjacent isolation index value of the splicing filter under the normal temperature condition and the adjacent isolation index value under the high temperature condition is smaller, and the adjacent isolation index value of the splicing filter under the normal temperature condition can be determined to be the adjacent isolation index value of the splicing filter under the high temperature condition, namely 33.44dB.

If the target temperature related wavelength of the splicing filter at the second temperature does not meet the first preset condition, determining an adjacent isolation index value of the splicing filter at the second temperature according to second data of the splicing filter at the second temperature.

As shown in fig. 8, the maximum insertion loss value (i.e., the insertion loss index value) of the comb filter in the effective bandwidth range [1528.703, 1528.844] nm under the normal temperature condition is 0.36dB; and interpolating a minimum value of a loss index value of 29.5dB in a corresponding effective bandwidth range by a right adjacent channel of the comb filter, wherein the index value of the adjacent isolation degree of the comb filter under the normal temperature condition is 29.14dB.

As shown in fig. 14, the maximum insertion loss value (i.e., insertion loss index value) of the comb filter in the effective bandwidth range [1528.703, 1528.844] nm under the high-temperature condition is 0.66dB; and interpolating a minimum value of a loss index value of 29.8dB in a corresponding effective bandwidth range by a right adjacent channel of the comb filter, wherein the index value of the adjacent isolation degree of the comb filter under the high-temperature condition is 29.14dB.

It can be seen that the adjacent isolation index value of the splicing filter is better than that of the comb filter.

In some embodiments, a neighboring isolation index value for the splice filter at a second temperature may be determined from second data for the splice filter at the second temperature.

Illustratively, as shown in fig. 16, the maximum insertion loss value (i.e., insertion loss index value) of the splicing filter in the effective bandwidth range [1528.703, 1528.844] nm under the high-temperature condition is 5.72dB; and interpolating a damage index value minimum value of 39.13dB in a corresponding effective bandwidth range by a right adjacent channel of the splicing filter, wherein the adjacent isolation index value of the splicing filter under the high-temperature condition is 33.41dB.

It should be noted that, the adjacent isolation index value (i.e., 33.41 dB) of the spliced filter under the high-temperature condition is similar to the adjacent isolation index value (i.e., 33.44 dB) of the spliced filter under the normal-temperature condition.

Optionally, the index value includes: a non-adjacent isolation index value;

In an embodiment of the present disclosure, the index value may include: the non-adjacent isolation index value;

It should be noted that, as shown in fig. 21, the non-adjacent isolation index value NI may be defined as a difference between the insertion loss index value of the spliced filter channel and the minimum value of the insertion loss index value of the spliced filter non-adjacent channel within the effective bandwidth range of the corresponding channel; the non-adjacent isolation index value typically takes the minimum of all non-adjacent isolation index values.

Determining an insertion loss index value of a spliced filter channel in an effective bandwidth range and an insertion loss minimum value of a non-adjacent channel of the spliced filter in a corresponding effective bandwidth range based on first data of the spliced filter at a first temperature; and determining a non-adjacent isolation index value of the splicing filter at the first temperature according to the insertion loss index value and the insertion loss minimum value.

And if the minimum value of the interpolation loss index value of the non-adjacent channels of the splicing filter in the corresponding effective bandwidth range is 46.92dB, the index value of the non-adjacent isolation degree of the splicing filter under the normal temperature condition is 41.7dB.

It should be noted that, although the target temperature-related wavelength of the splice filter is equal to the first temperature-related wavelength of the comb filter, the second temperature-related wavelength of the wavelength division multiplexer should be considered when determining the non-adjacent isolation index of the splice filter.

The non-adjacent isolation index is not affected by the temperature-dependent loss, is affected by the temperature-dependent wavelength, and changes in the non-adjacent isolation index are smaller the temperature-dependent wavelength is.

And determining whether a second temperature-related wavelength of the wavelength division multiplexer meets a second preset condition, and if the second temperature-related wavelength of the wavelength division multiplexer meets the second preset condition, determining a non-adjacent isolation index value of the splicing filter at the first temperature as the non-adjacent isolation index value of the splicing filter at the second temperature.

If the second temperature-related wavelength of the wavelength division multiplexer does not meet a second preset condition, third data of the splicing filter at a second temperature can be determined based on the second temperature-related wavelength of the wavelength division multiplexer; and determining a non-adjacent isolation index value of the spliced filter at the second temperature based on the third data.

Here, the second preset condition may be: the second temperature-related wavelength is less than or equal to a preset value. The preset value may be determined according to practical situations, for example, the preset value may be 0.

Illustratively, as shown in fig. 16, considering that the second temperature-related wavelength TDW _WDM =35pm=0.035 nm (the temperature-related wavelength is larger) of the wavelength division multiplexer in the high temperature condition (i.e., 65 ℃), the maximum insertion loss value (i.e., insertion loss index value) of the splicing filter in the effective bandwidth range [1528.703, 1528.844] nm in the high temperature condition can be determined to be 5.73dB based on the 65-NI curve shown in fig. 16 for the third data of the splicing filter at the second temperature determined based on the second temperature-related wavelength of the wavelength division multiplexer; and if the minimum value of the interpolation loss index value of the non-adjacent channels of the splicing filter in the corresponding effective bandwidth range is 44.82dB, the non-adjacent isolation index value of the splicing filter under the high temperature condition is 39.1dB.

It should be noted that, as shown in fig. 9, the maximum insertion loss value (i.e., the insertion loss index value) of the wavelength division multiplexer in the effective bandwidth range [1528.703, 1528.844] nm under the normal temperature condition (i.e., 25 ℃) is 4.56dB; and if the minimum value of the interpolation loss index value of the non-adjacent channels of the wavelength division multiplexer in the corresponding effective bandwidth range is 46.08dB, the non-adjacent isolation index value of the wavelength division multiplexer in the normal temperature condition is 41.52dB.

As shown in fig. 15, the maximum insertion loss value (i.e., insertion loss index value) of the wavelength division multiplexer in the effective bandwidth range [1528.703, 1528.844] nm under the high temperature condition (i.e., 65 ℃) is 4.77dB; and if the minimum value of the interpolation loss index value of the non-adjacent channels of the wavelength division multiplexer in the corresponding effective bandwidth range is 43.63dB, the non-adjacent isolation index value of the wavelength division multiplexer in the high-temperature condition is 38.86dB.

It is known that the non-adjacent isolation index value of the splicing filter is similar to the non-adjacent isolation index value of the wavelength division multiplexer.

Optionally, the method comprises:

acquiring a plurality of expected indexes of the spliced filter;

In the embodiment of the disclosure, the first target parameter of the spliced filter may be acquired, so that when the parameter value of the first target parameter is fixed, the parameter variation of the second target parameter of the spliced filter meeting a plurality of expected indexes is determined, so as to screen the first filter and the second filter of the spliced filter.

Here, the first target parameter may be: any one of the temperature dependent loss and the temperature dependent wavelength.

It may be appreciated that if the first target parameter is the temperature-related loss, the temperature-related loss of the comb filter at the third temperature and the temperature-related loss of the wdm at the third temperature may be summed to obtain the temperature-related loss of the splice filter at the third temperature, that is, the first target parameter of the splice filter at the third temperature.

If the first target parameter is the temperature-related wavelength, the temperature-related wavelength of the comb filter at the third temperature may be determined as the temperature-related wavelength of the splice filter at the third temperature, that is, the first target parameter of the splice filter at the third temperature.

Determining fourth data of the splicing filter corresponding to the first target parameter based on the first target parameter;

Acquiring a plurality of expected indexes of the spliced filter, and determining parameter variation amounts of a plurality of second target parameters when the spliced filter meets the plurality of expected indexes respectively based on the plurality of expected indexes and fourth data of the spliced filter;

And performing intersection processing on the parameter variation amounts of the plurality of second target parameters to obtain target parameter variation amounts of the second target parameters when the splicing filter simultaneously meets the plurality of expected indexes.

For example, if the first target parameter is the temperature-related loss, the first insertion loss data in the first data of the spliced filter may be processed based on the temperature-related loss to obtain fourth data of the spliced filter corresponding to the temperature-related loss;

Determining a range of temperature-related wavelengths of the splice filter when the splice filter meets a plurality of expected indexes respectively based on fourth data of the splice filter;

when the temperature-related loss is a constant value and the temperature-related wavelength is changed, the precision index value, the insertion loss index value, the full bandwidth index value, the net bandwidth index value, the adjacent isolation index value and the non-adjacent isolation index value of the splicing filter are all changed.

And determining the parameter change range (i.e. parameter change amount) of the temperature-related wavelength of the splicing filter when each index value just meets the expected index.

And taking intersection sets of parameter variation ranges corresponding to a plurality of expected indexes to obtain a target parameter variation range (namely a target parameter variation quantity) of the temperature-related wavelength.

The embodiment of the present disclosure further provides an index determining apparatus of a splice filter, and fig. 22 is a schematic structural diagram of an index determining apparatus of a splice filter according to an exemplary embodiment. As shown in fig. 22, the apparatus 100 includes:

an acquisition module 101, configured to acquire first data of the splicing filter at a first temperature; respectively acquiring temperature related parameters of the comb filter and the wavelength division multiplexer in the spliced filter at a second temperature;

a first determining module 102, configured to determine a target temperature related parameter of the splicing filter at a second temperature based on the temperature related parameters of the comb filter and the wavelength division multiplexer at the second temperature;

A second determining module 103, configured to determine second data of the splicing filter at a second temperature based on the comb filter, a temperature related parameter of the wavelength division multiplexer at the second temperature, and the first data of the splicing filter; an index value of the splice filter at the second temperature is determined based on the first data and/or the second data of the splice filter.

Optionally, the temperature-related parameter includes at least: a temperature dependent wavelength;

the first determining module 102 is configured to:

Optionally, the temperature-related parameter includes at least: temperature dependent loss;

the first determining module 102 is configured to:

The first data at least comprises: first wavelength data and first insertion loss data; the second data at least comprises: second wavelength data and second insertion loss data;

the second determining module 103 is configured to:

Optionally, the index value includes: a precision index value;

the second determining module 103 is configured to:

determining the precision index value of the center wavelength of the splicing filter at the first temperature based on the first data; and determining the precision index value of the center wavelength of the splicing filter at the second temperature according to the precision index value of the splicing filter at the first temperature and the target temperature related wavelength of the splicing filter at the second temperature.

the second determining module 103 is configured to:

Optionally, the index value includes: a full bandwidth index value;

the second determining module 103 is configured to:

Optionally, the index value includes: a net bandwidth index value;

the second determining module 103 is configured to:

Optionally, the index value includes: an adjacent isolation index value;

the second determining module 103 is configured to:

Optionally, the index value includes: a non-adjacent isolation index value;

the second determining module 103 is configured to:

Optionally, the apparatus comprises: a third determining module 104, configured to:

acquiring a plurality of expected indexes of the spliced filter;

It should be noted that, in the embodiment of the present disclosure, if the method for determining the index of the spliced filter is implemented in the form of a software functional module, and the spliced filter is sold or used as a separate product, the spliced filter may also be stored in a computer readable storage medium. Based on such understanding, the technical embodiments of the present disclosure may be embodied essentially or in part in the form of a software product stored in a storage medium, including instructions to cause a splice filter index determining device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the methods described in the various embodiments of the present disclosure. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read Only Memory (ROM), a magnetic disk, an optical disk, or other various media capable of storing program codes. As such, embodiments of the present disclosure are not limited to any specific combination of hardware and software.

Correspondingly, an embodiment of the present disclosure provides an index determining device for a spliced filter, including a memory and a processor, where the memory stores a computer program that can be run on the processor, and the processor implements the steps in the index determining method for a spliced filter provided in the foregoing embodiment when executing the program.

Correspondingly, the embodiment of the present disclosure provides a computer readable storage medium, on which a computer program is stored, which when being executed by a processor, implements the steps in the index determining method of the splice filter provided in the above embodiment.

It should be noted here that: the description of the storage medium and apparatus embodiments above is similar to that of the method embodiments described above, with similar benefits as the method embodiments. For technical details not disclosed in the embodiments of the storage medium and apparatus of the present disclosure, please refer to the description of the embodiments of the method of the present disclosure for understanding.

It should be noted that, fig. 23 is a schematic diagram of a hardware entity of an index determining apparatus of a spliced filter according to an exemplary embodiment, and as shown in fig. 23, a hardware entity of an index determining apparatus 1100 of the spliced filter includes: the processor 1101 and the memory 1103, optionally, the index determining device 1100 of the spliced filter may further comprise a communication interface 1102.

It is to be appreciated that the memory 1103 can be volatile memory or nonvolatile memory, and can include both volatile and nonvolatile memory. Wherein the nonvolatile Memory may be Read Only Memory (ROM), programmable Read Only Memory (PROM, programmable Read-Only Memory), erasable programmable Read Only Memory (EPROM, erasable Programmable Read-Only Memory), electrically erasable programmable Read Only Memory (EEPROM, ELECTRICALLY ERASABLE PROGRAMMABLE READ-Only Memory), magnetic random access Memory (FRAM, ferromagnetic random access Memory), flash Memory (Flash Memory), magnetic surface Memory, optical disk, or compact disk-Only Memory (CD-ROM, compact Disc Read-Only Memory); the magnetic surface memory may be a disk memory or a tape memory. The volatile memory may be random access memory (RAM, random Access Memory) which acts as external cache memory. By way of example, and not limitation, many forms of RAM are available, such as static random access memory (SRAM, static Random Access Memory), synchronous static random access memory (SSRAM, synchronous Static Random Access Memory), dynamic random access memory (DRAM, dynamic Random Access Memory), synchronous dynamic random access memory (SDRAM, synchronous Dynamic Random Access Memory), double data rate synchronous dynamic random access memory (ddr SDRAM, double Data Rate Synchronous Dynamic Random Access Memory), enhanced synchronous dynamic random access memory (ESDRAM, enhanced Synchronous Dynamic Random Access Memory), synchronous link dynamic random access memory (SLDRAM, syncLink Dynamic Random Access Memory), direct memory bus random access memory (DRRAM, direct Rambus Random Access Memory). The memory 1103 described in the embodiments of the present disclosure is intended to comprise, without being limited to, these and any other suitable types of memory.

The method disclosed in the embodiments of the present disclosure may be applied to the processor 1101 or implemented by the processor 1101. The processor 1101 may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuitry in hardware in the processor 1101 or instructions in software. The Processor 1101 may be a general purpose Processor, a digital signal Processor (DSP, digital Signal Processor), or other programmable logic device, discrete gate or transistor logic device, discrete hardware components, or the like. The processor 1101 may implement or perform the methods, steps, and logic blocks disclosed in the embodiments of the present disclosure. The general purpose processor may be a microprocessor or any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present disclosure may be embodied directly in hardware, in a decoded processor, or in a combination of hardware and software modules in the decoded processor. The software modules may be located in a storage medium including memory 1103, and the processor 1101 reads information from the memory 1103 and performs the steps of the method in combination with the hardware.

In an exemplary embodiment, the index determining means of the splice filter may be implemented by one or more Application Specific Integrated Circuits (ASICs), DSPs, programmable logic devices (PLDs, programmable Logic Device), complex Programmable logic devices (CPLDs, complex Programmable Logic Device), field-Programmable gate arrays (FPGAs), general purpose processors, controllers, micro-controllers (MCUs, micro Controller Unit), microprocessors (micro processors), or other electronic components for performing the aforementioned methods.

In several embodiments provided in the present disclosure, it should be understood that the disclosed methods and apparatus may be implemented in other manners. The above-described embodiment of the apparatus is merely illustrative, and for example, the division of the units is merely a logic function division, and there may be other division manners in actual implementation, such as: multiple units or components may be combined or may be integrated into another observational quantity or some features may be omitted or not performed. In addition, the various components shown or discussed may be connected in an indirect coupling or communication via interfaces, devices, or units, which may be electrical, mechanical, or other forms.

The units described as separate units may or may not be physically separate, and units displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units; some or all of the units may be selected according to actual needs to achieve the object of the present embodiment.

Those of ordinary skill in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware related to program instructions, and the foregoing program may be stored in a computer readable storage medium, where the program, when executed, performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a Read-Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.

Or the integrated units described above in the embodiments of the present disclosure may be stored in a computer-readable storage medium if implemented in the form of software functional units and sold or used as separate products. Based on such understanding, the technical embodiments of the present disclosure may be embodied essentially or in part in the form of a software product stored in a storage medium, including instructions to cause a splice filter index determining device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the methods described in the various embodiments of the present disclosure. And the aforementioned storage medium includes: various media capable of storing program codes, such as a removable storage device, a ROM, a magnetic disk, or an optical disk.

The method, apparatus and computer storage medium for determining the index of the splice filter described in the examples are only examples of the embodiments of the disclosure, but are not limited thereto, and the method, apparatus and computer storage medium for determining the index of the splice filter are all within the scope of the disclosure.

It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present disclosure. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in various embodiments of the present disclosure, the sequence numbers of the foregoing processes do not mean the order of execution, and the order of execution of the processes should be determined by their functions and internal logic, and should not constitute any limitation on the implementation of the embodiments of the present disclosure. The foregoing embodiment numbers of the present disclosure are merely for description and do not represent advantages or disadvantages of the embodiments.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

The foregoing is merely an embodiment of the present disclosure, but the protection scope of the present disclosure is not limited thereto, and any person skilled in the art can easily think about the changes or substitutions within the technical scope of the present disclosure, and should be covered by the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.

Claims

1. An index determining method of a spliced filter, wherein the spliced filter comprises: a comb filter and a wavelength division multiplexer; the method comprises the following steps:

acquiring first data of the spliced filter at a first temperature;

2. The method of claim 1, wherein the determining second data for the splice filter at the second temperature based on the comb filter, the temperature related parameter for the wavelength division multiplexer at the second temperature, and the first data for the splice filter comprises:

3. The method according to claim 2, wherein the temperature-related parameter comprises at least: temperature dependent wavelength and temperature dependent loss;

4. A method according to claim 3, wherein the first data comprises at least: first wavelength data and first insertion loss data; the second data at least comprises: second wavelength data and second insertion loss data;

5. The method of claim 4, wherein the index value comprises: a precision index value;

6. The method of claim 4, wherein the index value comprises: an insertion loss index value within an effective bandwidth range;

7. The method of claim 4, wherein the index value comprises: a full bandwidth index value;

8. The method of claim 7, wherein the index value comprises: a net bandwidth index value;

9. The method of claim 4, wherein the index value comprises: an adjacent isolation index value;

10. The method of claim 4, wherein the index value comprises: a non-adjacent isolation index value;

11. The method according to any one of claims 1-10, characterized in that the method comprises:

acquiring a plurality of expected indexes of the spliced filter;

12. An index determining device of a splice filter, wherein the splice filter comprises: a comb filter and a wavelength division multiplexer, the apparatus comprising:

13. An index determining apparatus of a splice filter, comprising: a memory and a processor, the memory storing a computer program executable on the processor, characterized in that the processor implements the steps of the method of any one of claims 1 to 11 when the program is executed.

14. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 11.