CN117639947A

CN117639947A - Wave correction method, device, equipment and readable storage medium

Info

Publication number: CN117639947A
Application number: CN202210967351.4A
Authority: CN
Inventors: 孔祥健; 胡家艳; 谢雄冰; 陈宏刚; 张博; 罗勇; 马卫东
Original assignee: Accelink Technologies Co Ltd
Current assignee: Accelink Technologies Co Ltd
Priority date: 2022-08-12
Filing date: 2022-08-12
Publication date: 2024-03-01
Also published as: WO2024031808A1

Abstract

The embodiment of the invention provides a wave correction method, device and equipment and a readable storage medium. Wherein the method comprises the following steps: determining an operational offset of the wave; determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave; correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition. Determining a first offset of the wave at the first operating temperature; and under the condition that the first offset is larger than the working offset, correcting the center wavelength corresponding to the wave, so that the qualification rate of the product index is accurately, efficiently and obviously improved.

Description

Wave correction method, device, equipment and readable storage medium

Technical Field

The present invention relates to the field of optical fiber communications, and in particular, to a method, an apparatus, a device, and a readable storage medium for correcting a wave.

Background

In optical communication systems, particularly wavelength division multiplexed (Wavelength Division Multiplexing, WDM) optical networks, filters are core devices. Wavelength accuracy is a key index of the filter, and the change of the wavelength accuracy, that is, the shift of the wavelength, further causes the change of the Insertion LOSS (Insertion LOSS), the bandwidth and the crosstalk index of the filter, thereby preventing the normal operation of the communication network. On one hand, in the production process, the actual wavelength of the filter and the design wavelength have a certain difference due to process errors; on the other hand, the change in temperature also causes a shift in the wavelength of the filter, so that the wavelength of the filter needs to be corrected, which can be achieved by temperature control or by changing the refractive index by laser radiation.

The essence of the filter wavelength correction is the tuning of the filter performance index, and when the filter center wavelength is the international telecommunication union (International Telecommunication Union, ITU) standard wavelength, the filter performance index is the best, so the target center wavelength is corrected to select the ITU wavelength for the wavelength correction of the process error. The temperature also causes the wavelength shift of the filter, when the high temperature or low Wen Bochang is too much relative to the normal temperature, if the normal temperature correction target center wavelength is selected as the ITU wavelength, although the normal temperature index is optimal at this time, the phenomenon that the high and low temperature performance index does not meet the requirement due to the too much wavelength shift occurs, so that the qualification rate is reduced and the cost is increased, so that the correction target center wavelength of the filter is selected by combining the wavelength-temperature characteristics of the filter, thereby realizing the accurate correction, however, a method for guiding how to realize the accurate correction of the filter wavelength is still lacking at present.

There is currently no effective solution to the above problems.

Disclosure of Invention

In view of the above, a primary object of the present invention is to provide a method, apparatus, device and readable storage medium for wave correction.

In order to achieve the above purpose, the technical scheme of the invention is realized as follows:

the embodiment of the invention provides a wave correction method, which comprises the following steps:

determining an operational offset of the wave;

determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition.

In the above aspect, the determining the working offset of the wave includes:

acquiring loss data of the wave;

judging whether the loss data meet the requirement of a preset index or not;

and determining the working offset of the wave based on the loss data and the preset index under the condition that the loss data meets the requirement of the preset index.

In the above aspect, the determining the first offset of the wave at the first operating temperature includes:

determining a first wavelength of the wave at the first operating temperature;

a first offset of the wave at the first operating temperature is determined based on the first wavelength at the first operating temperature and a first wavelength at a first preset temperature.

In the above solution, when the first offset is greater than the working offset, correcting, according to the first offset, a center wavelength corresponding to the wave includes:

determining a correction parameter based on the first offset;

and correcting the center wavelength based on the correction parameter.

In the above scheme, the method further comprises:

based on the operating offset, an operating wavelength of the wave is determined.

In the above scheme, the method further comprises:

determining accuracy data of the wave based on the center wavelength;

and correcting the center wavelength corresponding to the wave according to the first offset under the condition that the precision data does not meet the requirement of a preset precision index.

The embodiment of the invention also provides a wave correction device, which comprises: the device comprises an interaction module, a control module, a storage module and a first correction module; the control module is respectively connected with the interaction module, the storage module and the first correction module;

The interaction module is used for inputting a correction instruction and sending the correction instruction to the control module;

the control module is used for receiving the correction instruction, calling a correction task corresponding to the correction instruction in the storage module, and distributing the correction task to the first correction module;

the first correction module is used for receiving the correction task, determining a corrected center wavelength based on the correction task, correcting the center wavelength of the wave based on the corrected center wavelength to obtain a correction result, and storing the correction result into the storage module;

the storage module is used for storing the correction task corresponding to the correction instruction and storing the correction result.

In the above solution, the apparatus further includes:

the control module is further used for sending the correction result stored in the storage module to the interaction module;

the interaction module is further used for receiving and displaying the correction result sent by the control module.

In the above aspect, the first correction module includes: the device comprises a laser emission unit, a polarization control unit, a light splitting unit, a filter to be tested, a power monitoring unit and a correction unit;

The laser emission unit is used for emitting laser with wavelength;

the polarization control unit is used for controlling the laser to traverse the polarization state;

the light splitting unit is used for splitting the laser;

the filter to be tested is used for passing the laser;

the power monitoring unit is used for monitoring the optical power of the laser;

the correction unit is configured to correct a center wavelength of the filter based on the wavelength-transmittance data corresponding to the optical power and the corrected center wavelength.

The embodiment of the invention also provides a wave correction device, which comprises:

a first determination module for determining an operational offset of the wave;

a second determination module for determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

the second correction module is used for correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition.

The embodiment of the invention also provides a wave correction device, which comprises a memory and a processor, wherein the memory stores a computer program which can be run on the processor, and the processor realizes the steps in the method when executing the program.

Embodiments of the present invention also provide a computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the method described above.

Drawings

FIG. 1 is a schematic diagram of a wave correction method according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a wavelength-transmittance spectrum of a filter according to a method of modifying a wave according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of the definition of the center wavelength and the wavelength accuracy of the method for correcting the wave according to the embodiment of the present invention;

FIG. 4 is a schematic diagram of a method for correcting a wave according to an embodiment of the present invention;

FIG. 5 is a schematic diagram of bandwidth definition of a wave correction method according to an embodiment of the present invention;

FIG. 6 is a schematic diagram of crosstalk definition of a method of modifying waves according to an embodiment of the present invention;

FIG. 7 is a graph showing the wavelength-temperature characteristics of a filter according to the method of correcting a wave according to an embodiment of the present invention;

FIG. 8 is a graph showing the wavelength-temperature characteristic of a wave corrected by the method for correcting a wave according to an embodiment of the present invention;

FIG. 9 is a schematic diagram showing the constitution of a wave correction device according to an embodiment of the present invention;

FIG. 10 is a schematic diagram showing the constitution of a wave correction device according to an embodiment of the present invention;

fig. 11 is a schematic diagram of a hardware entity structure of a wave correction device according to an embodiment of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the following detailed description of the specific technical solutions of the present invention will be given with reference to the accompanying drawings in the embodiments of the present invention. The following examples are illustrative of the invention and are not intended to limit the scope of the invention.

In the related art, the performance index of the filter is greatly affected by the process and the temperature, and the actual wavelength of the filter and the design wavelength have a certain gap due to the process error, so that the wavelength of the filter needs to be corrected, and the corrected target center wavelength is selected as the ITU standard wavelength. However, if the normal temperature correction wavelength is selected to be ITU wavelength when the high temperature or low Wen Bochang is excessively shifted from normal temperature, the normal temperature index is optimal at this time, but the high and low temperature performance index does not meet the requirement due to the excessive shift of the wavelength, so that the yield is reduced and the cost is increased. Therefore, to improve the yield and reduce the cost, the wavelength of the filter needs to be accurately corrected by combining the wavelength-temperature characteristics.

The present embodiment proposes a wave correction method applied to a wave correction device, the functions implemented by the method may be implemented by a processor in the wave correction device invoking program codes, and of course the program codes may be stored in a computer storage medium, and it is seen that the computing device includes at least a processor and a storage medium.

Fig. 1 is a schematic flow chart of an implementation of a method for correcting waves according to an embodiment of the present invention, as shown in fig. 1, the method includes:

Step 101: determining an operational offset of the wave;

step 102: determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

step 103: correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition.

In step 101: the wave correction process may be determined according to practical situations, and is not limited herein. As an example, the wave correction method may be a method of precisely correcting the filter wavelength.

The determining the working offset of the wave may be determining the working offset of the wave based on loss data of the wave. The loss data may be data defining an index of the wave at a plurality of temperatures. The loss data is related to the plurality of temperatures. Specifically, the loss data may be any one of precision data, insertion loss data, bandwidth data, and crosstalk data. The loss data may be index data such as passband flatness data and polarization-dependent loss data, and the offset calculation method of the corresponding wave is the same.

In step 102: the first operating temperature may be determined according to practical situations, and is not limited herein. As an example, the first operating temperature may be any one of a plurality of temperatures. The determining the first offset of the wave at the first operating temperature may be determining the first offset of the wave at the first operating temperature based on the first wavelength of the wave at the first operating temperature.

In step 103: the correcting the center wavelength corresponding to the wave according to the first offset may be correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the operating offset at any one of the plurality of operating temperatures.

The first preset condition may be determined according to practical situations, and is not limited herein. As an example, the first preset condition may be a decrease ndB in peak insertion loss. The wavelength corresponding to the center of the wave coverage spectrum range, in which the center wavelength characterization meets the first preset condition, may be a wavelength corresponding to the center of the wave coverage spectrum range in which the peak insertion loss is reduced ndB. As an example, the first preset condition may be a 3dB drop in peak insertion loss.

The embodiment of the invention provides a wave correction method, which is used for determining the working offset of a wave; determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave; correcting the center wavelength corresponding to the wave according to the first offset when the first offset is larger than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition. Determining a first offset of the wave at the first operating temperature; and correcting the center wavelength corresponding to the wave when the first offset is larger than the working offset. The method is accurate and efficient, and the qualification rate of the product index is obviously improved.

In an alternative embodiment of the present invention, said determining the working offset of said wave comprises:

acquiring loss data of the wave;

judging whether the loss data meet the requirement of a preset index or not;

In this embodiment, the determining the working offset of the wave may include: acquiring loss data of the wave at the first temperature; judging whether the loss data meet the requirement of a preset index or not; and determining the working offset of the wave at the first temperature based on the loss data and the preset index under the condition that the loss data meets the requirement of the preset index. The first temperature may be determined according to practical situations, and is not limited herein. As an example, the first temperature may be any one of a plurality of temperatures. The loss data may be data defining an index of the wave at the first temperature. The loss data is related to the first temperature.

As an example, the preset index may include an accuracy index; an operating offset of the wave at the first temperature is determined based on the accuracy index. Wherein the working offset may be a precision offset, and the precision offset may be a precision offset range.

The accuracy index may be determined according to practical situations, and is not limited herein. As an example, the accuracy index may be a wavelength accuracy requirement.

As one example, the loss data includes insertion loss data of the wave; the preset index comprises an insertion loss index; determining second wavelength data of the wave at the first temperature based on the insertion loss data; determining third wavelength data of the wave at the first temperature based on the insertion loss index; and determining the working offset of the wave at the first temperature based on the second wavelength data and the third wavelength data under the condition that the insertion loss data meets the requirement of the insertion loss index. The working offset may be an insertion loss offset, and the insertion loss offset may be an insertion loss offset range.

The insertion loss data can be determined according to actual conditions, and the insertion loss data can be any one of the maximum insertion loss, the peak insertion loss and the center wavelength insertion loss in the effective bandwidth of the channel, and the calculation thinking of the working offset of the wave is the same without limitation. As an example, the insertion loss data may be the maximum insertion loss within the effective bandwidth of the channel.

The determining the second wavelength data of the wave at the first temperature based on the insertion loss data may be determining the second wavelength data of the wave at the first temperature based on a maximum insertion loss within an effective bandwidth of a channel and wavelength-transmissivity data of the wave at normal temperature.

The insertion loss index may be determined according to an actual situation, and is not limited herein, and the insertion loss index may be an effective bandwidth insertion loss index requirement.

The determining the third wavelength data of the wave at the first temperature based on the insertion loss index may be determining the third wavelength data of the wave at the first temperature based on an effective bandwidth insertion loss index requirement and wavelength-transmittance data of the wave at normal temperature.

And under the condition that the insertion loss data meets the requirement of the insertion loss index, determining the working offset of the wave at the first temperature based on the second wavelength data and the third wavelength data, wherein under the condition that the maximum insertion loss in the effective bandwidth of the channel is smaller than the requirement of the insertion loss index of the effective bandwidth, the working offset of the wave at the first temperature is obtained by differentiating the third wavelength data and the second wavelength data.

As one example, the loss data includes bandwidth data of the wave, the bandwidth data including first bandwidth data and second bandwidth data; the preset index comprises a bandwidth index; determining fourth wavelength data for the wave at the first temperature; determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data; determining an operating offset of the wave at the first temperature based on the bandwidth indicator if the first bandwidth data and the second bandwidth data meet the requirement of the bandwidth indicator. Wherein the working offset may be a bandwidth offset, and the bandwidth offset may be a bandwidth offsetable range.

The fourth wavelength data may be determined according to practical situations, and is not limited herein. As an example, the fourth wavelength data may be a first wavelength value and a second wavelength value corresponding to a spectral range covered by the peak insertion loss reduction ndB. As an example, the first wavelength value may represent a short wavelength value corresponding to a peak insertion loss reduction ndB; the second wavelength value may be indicative of a long wavelength value corresponding to a peak insertion loss drop ndB and vice versa.

The bandwidth index may be determined according to practical situations, and is not limited herein. As an example, the bandwidth indicator may be an indicator requirement based on ndB net bandwidth.

The first bandwidth data may be determined according to practical situations, and is not limited herein. As an example, the first bandwidth data may be full bandwidth data. The second bandwidth data may be determined according to practical situations, which is not limited herein. As an example, the second bandwidth data may be net bandwidth data.

The determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data may be determining a first bandwidth value based on the first wavelength value; determining a second bandwidth value based on the second wavelength value; summing the first bandwidth value and the second bandwidth value to obtain the first bandwidth data; and accumulating the smaller wavelength value in the first wavelength value and the second wavelength value twice to obtain the second bandwidth data.

Determining, based on the bandwidth indicator, that the wave has an operational offset at the first temperature if the first bandwidth data and the second bandwidth data meet the bandwidth indicator requirement may be if the first bandwidth data and the second bandwidth data are greater than the ndB net bandwidth-based indicator requirement; an operating offset of the wave at the first temperature is determined based on the bandwidth indicator, fourth wavelength data, and the center wavelength.

As one example, the loss data includes crosstalk data of the wave; the preset index comprises a crosstalk index; and determining the working offset of the wave at the first temperature based on the crosstalk data and the crosstalk index when the crosstalk data meets the requirements of the crosstalk index. Wherein the working offset may be a crosstalk offset, and the crosstalk offset may be a crosstalk offset range.

The determining, based on the crosstalk data and the crosstalk index, the working offset of the wave at the first temperature may be determining, based on the crosstalk data and the crosstalk index, the working offset of the wave at the first temperature if the crosstalk data is greater than the crosstalk index.

The crosstalk data may be determined according to practical situations, and is not limited herein. As an example, the crosstalk data may be adjacent crosstalk data, non-adjacent crosstalk data, or total crosstalk data. The crosstalk index may be determined according to practical situations, and is not limited herein. As an example, the crosstalk index may be an adjacent crosstalk requirement index, a non-adjacent crosstalk requirement index, or a total crosstalk requirement index. The working offset may be an adjacent crosstalk offset, a non-adjacent crosstalk offset, or a total crosstalk offset, the adjacent crosstalk offset may be an adjacent crosstalk offset range, the non-adjacent crosstalk offset may be a non-adjacent crosstalk offset range, and the total crosstalk offset may be a total crosstalk offset range.

As one example, first loss data of a plurality of the loss data of the wave at a first temperature is acquired; wherein the first loss data is any loss data of the plurality of loss data; determining a target offset of the wave at the first temperature based on the first loss data and a first preset indicator of a plurality of preset indicators; wherein the first preset index characterizes an index corresponding to the first loss data; determining an operating offset of the wave at the first temperature based on the target offset and a second loss data of the plurality of loss data; wherein the second loss data characterizes any loss data of the plurality of loss data other than the first loss data.

The first loss data may be determined according to actual situations, and may be any one of accuracy data, insertion loss data, bandwidth data, and crosstalk data, which is not limited herein. The first preset index may be determined according to actual situations, and is not limited herein. As an example, the first preset index may be any one of an accuracy index, an insertion loss index, a bandwidth index, and a crosstalk index. As an example, the first loss data may be precision data, and the first preset index may be a precision index.

The determining the target offset of the wave at the first temperature based on the first loss data and a first preset index of the plurality of preset indexes may be determining the precision offset of the wave at the first temperature based on the precision data and the precision index.

The determining the working offset of the wave at the first temperature based on the precision offset and the second loss data of the plurality of loss data may be traversing the precision offset and the second loss data of the plurality of loss data to determine the working offset of the wave at the first temperature.

The second loss data may be determined according to actual situations, and may be any one of insertion loss data, bandwidth data, and crosstalk data except that the first loss data is precision data, which is not limited herein. As an example, the second preset index may be any one of an insertion loss index, a bandwidth index, and a crosstalk index. As an example, the second loss data may be insertion loss data, and the second preset index may be an insertion loss index.

The determining, based on the precision offset and second loss data of the plurality of loss data, a working offset of the wave at the first temperature may be determining whether the insertion loss data satisfies the precision offset; judging whether the bandwidth data meets the precision offset or not under the condition that the insertion loss data meets the precision offset; in the case where the bandwidth data satisfies the precision offset; judging whether the crosstalk data meets the precision offset or not; and determining an operating offset of the wave at the first temperature in the case that the crosstalk data satisfies the precision offset.

For ease of understanding, assuming a 48-channel 100GHz channel-spacing filter (wavelength division multiplexer), the starting frequencies are 196100GHz and 191400GHz, respectively, one of the ITU wavelengths is selected to be = 1529.553nm (f _ITU = 196000 GHz). Fig. 2 is a schematic diagram of a Wavelength-Transmittance spectrum of a filter according to an embodiment of the present invention, wherein the ordinate of fig. 2 represents Transmittance (transmissittance), and the abscissa of fig. 2 represents Wavelength (Wavelength), and the insertion loss and the Transmittance are in inverse relationship in the related art. Wavelength-transmittance data of the channel at room temperature 25 ℃ are shown in fig. 2. The wavelength of the filter is shifted due to the fluctuation of the chip process. Assuming that the wavelength accuracy requirement of the filter is [ -40,40]pm, the effective bandwidth + -12.5 GHz interpolation index requirement is within 6dB, the 3dB net bandwidth requirement based on peak interpolation is more than 120GHz, the adjacent crosstalk requirement is more than 4dB, the non-adjacent crosstalk requirement is more than 30B, and the total crosstalk requirement is more than 3 dB.

FIG. 3 is a schematic diagram showing the definition of the center wavelength and the wavelength accuracy of the method for correcting the wave according to the embodiment of the invention, wherein as shown in FIG. 3, the center wavelength lambda corresponding to the center of the spectrum covered by the 3dB drop of the peak insertion loss is determined according to the wavelength-transmittance data of the channel at the normal temperature of 25 DEG C _c 1529.426nm. The calculation of the accuracy data of the wave is as shown in formula (1):

Δλ＝λ _c -λ _ITU (1)

in the expression (1), Δλ is the accuracy data of the wave. The accuracy data Δλ of the wave was determined to be-127 pm according to the above-described formula (1). Based on the wavelength accuracy requirement delta lambda _WA [-40,40]pm, determining that the accuracy data of the wave does not meet the wavelength accuracy requirement, and determining that the accuracy data of the wave does not meet the wavelength accuracy requirement according to the wavelength accuracy requirement of [ -40,40]pm, wa=40pm, where WA represents a wavelength accuracy value, the accuracy-off-set range of the wave-based accuracy data is [ -40,40]pm。

FIG. 4 is a schematic diagram of the definition of the insertion loss of the wave correction method according to the embodiment of the present invention, as shown in FIG. 4, it can be assumed that the insertion loss data is within the effective bandwidth of the channelThe maximum insertion loss, it is particularly noted that the temperature dependent wavelength shift does not affect the peak insertion loss, but the temperature dependent loss affects the peak insertion loss. The calculation of the insertion loss offset based on the insertion loss data of the wave can be performed by adopting a central wavelength, and also can be performed by adopting an ITU wavelength. From the wavelength-transmittance data, lambda at room temperature 25℃was calculated _c 1529.426nm is the minimum value lambda of wavelengths in the effective bandwidth range of ITU wavelengths _min And a maximum value lambda _max The calculations are shown in equations (2) and (3), respectively:

in the formulas (2) and (3), c represents a constant speed of light, and c= 299792458m/s, Δf _passband Indicating the channel effective bandwidth. The present embodiment will be Δf _passband Substitution of =25 GHz, where Δf _passband Corresponding to 12.5GHz, - Δf _passband And/2 corresponds to-12.5 GHz.

According to the above formulas (2) and (3), the second wavelength data is calculated based on the insertion loss data, that is, lambda is calculated _c Effective bandwidth of = 1529.426nm for ITU wavelength is [1529.328,1529.524 ]]nm, based on the insertion loss index with the insertion loss requirement within 6dB, combining wavelength-transmissivity data at the normal temperature of 25 ℃, wherein the wavelength corresponding to the insertion loss of 6dB is 1529.054nm from 1529.328nm to the short wavelength direction; the third wavelength data, i.e., the bandwidth range corresponding to the insertion loss index is calculated to be [1529.054,1529.807 ] from 1529.524nm to the long wavelength direction, wherein the insertion loss of the third wavelength data is 1529.807nm]nm。

At this time, the second wavelength data and the third wavelength data are calculated based on the first wavelength data, and the wavelength is in the short wavelength direction from 1529.328nmIs delta lambda _IL- = 1529.328-1529.054 =0.274 nm=274 pm; the wave shift amount is Deltalambda from 1529.524nm to long wavelength _IL+ = 1529.807-1529.524 =0.283 nm=283 pm. In summary, the range of the insertion loss offset based on the wave required within 6dB of the insertion loss is [ -274,283]pm。

Fig. 5 is a schematic diagram of bandwidth definition of a correction method according to an embodiment of the present invention, as shown in fig. 5, assuming that ndB bandwidth is defined as a spectrum width covered by ndB with reduced peak insertion loss, full bandwidth=bbb1+bbw2, net bandwidth=2×min (BW 1, BW 2), and the full bandwidth index under the bandwidth definition is not affected by wavelength shift, and is based on index requirement BW of ndB net bandwidth _net GHz, maximum wavelength shift lambda shifted in short wave direction _nBW- With a maximum wavelength shift lambda shifted in the long-wave direction _nBW+ The calculations of (a) are shown in equations (4) and (5), respectively:

in the formulas (4) and (5), c represents a constant speed of light, and c= 299792458m/s, λ _n- Represents the short wavelength value, lambda, corresponding to the decrease in peak insertion loss ndB at room temperature of 25 DEG C _n+ The calculation and analysis thinking is also applicable to the definition of the ndB bandwidth as the calculation thinking of the bandwidth offset of the wave based on the situation that the ITU wavelength insertion loss is reduced, and the like. The key to the calculation of the bandwidth offset based on the bandwidth data of the wave is to calculate the bandwidth offset of the wave meeting the bandwidth requirement based on the center wavelength, namely, the bandwidth offset of the wave meeting the requirement of 3dB net bandwidth of 120GHz or more is calculated by taking the center wavelength as the ITU wavelength. According to the wavelength-transmissivity data, calculating that the short wavelength value and long wavelength value corresponding to 3dB of peak insertion loss drop at normal temperature 25 ℃ are respectively lambda _3- = 1528.925nm, λ ₃₊ = 1529.927nm. The first bandwidthThe calculation of the value BW1 and said second bandwidth value BW2 are shown in equations (6) and (7), respectively:

BW1＝c/λ _3- -f _ITU ＝c/1528.925-196000＝64.23GHz (6)

BW2＝f _ITU -c/λ ₃₊ ＝196000-c/1529.927＝64.19GHz (7)

at this time, bw1=64.23 GHz and bw2=64.19 GHz, so that the net bandwidth data and the full bandwidth data are 128.38GHz and 128.42GHz, respectively. Based on the 3dB net bandwidth index requirement of more than 120GHz, and combining wavelength-transmissivity data at the normal temperature of 25 ℃, if the shift to the short wave direction is carried out, the calculation of the maximum wavelength shift is shown as a formula (8):

Based on the 3dB net bandwidth index requirement of more than 120GHz, and combining wavelength-transmissivity data at the normal temperature of 25 ℃, if the wavelength is shifted to the wavelength direction, the calculation of the maximum wavelength shift is shown as a formula (9):

in summary, the bandwidth of the wave required to be within 120GHz based on the insertion loss 3dB bandwidth can be shifted by the range of [ -32,33] pm.

Fig. 6 is a schematic diagram of crosstalk definition in a method for correcting a wave according to an embodiment of the present invention, where it may be assumed that adjacent crosstalk (AX) is defined as a difference between a maximum value of insertion loss in an effective bandwidth range of a channel and a minimum value of insertion loss in an effective bandwidth range of a corresponding channel of an adjacent channel, and as shown in fig. 6, the adjacent crosstalk generally takes a minimum value of left adjacent crosstalk and right adjacent crosstalk, and the adjacent crosstalk is calculated to be 8.63dB at normal temperature of 25 ℃ according to wavelength-transmittance data. Based on the adjacent crosstalk requirement of more than 4dB, and by combining wavelength-transmissivity data at the normal temperature of 25 ℃, if the adjacent crosstalk is shifted to a short wave, the maximum value of the effective bandwidth interpolation loss in the channel and the minimum value of the effective bandwidth interpolation loss of the adjacent channel in the corresponding channel range are changed, the corresponding difference value is also changed, when the adjacent crosstalk is shifted to the short wave for the first time, the adjacent crosstalk offset to the short wave is calculated, and similarly, the adjacent crosstalk offset to the long wave is calculated, so that the adjacent crosstalk offset range is determined.

Assuming that non-adjacent crosstalk (NX) is defined as the difference between the maximum value of the insertion loss in the effective bandwidth range of the channel and the minimum value of the insertion loss in the effective bandwidth range of the non-adjacent channel, as shown in fig. 6, the non-adjacent crosstalk generally takes the minimum value of all the non-adjacent crosstalk, and the non-adjacent crosstalk is calculated to be 38.33dB at normal temperature 25 ℃ according to the wavelength-transmittance data. Based on the non-adjacent crosstalk requirement of more than 30dB, and combining wavelength-transmissivity data at the normal temperature of 25 ℃, if the non-adjacent crosstalk is smaller than 30dB for the first time, calculating the non-adjacent crosstalk offset to the short wave, and similarly, calculating the non-adjacent crosstalk offset to the long wave, thereby determining the non-adjacent crosstalk offset range.

Assuming total crosstalk (TX) is defined as the sum of all adjacent and non-adjacent crosstalk, the j-channel total crosstalk is calculated as shown in equation (10):

in the formula (10), j is more than or equal to 1 and less than or equal to N, i is more than or equal to 1 and less than or equal to N, N represents the total channel number, and i, j and N are positive integers. AX _j,i Representing adjacent crosstalk of j channels to i channels, where AX _j,j-1 Represents left-adjacent crosstalk, AX _j,j+1 Representing right adjacent crosstalk, NX _j,i Representing the non-adjacent crosstalk of the j channels to the i channels, i.e., i+.j, j+.1. From the wavelength-transmittance data, the total crosstalk index at room temperature 25 ℃ was calculated to be 5.7dB. Based on the total crosstalk requirement of more than 3dB, and combining wavelength-transmissivity data at the normal temperature of 25 ℃, if the total crosstalk is deflected to the short wave for the first time, calculating the total crosstalk deflection to the short wave when the total crosstalk is smaller than 3dB, and similarly, calculating the total crosstalk deflection to the long wave, thereby determining the total crosstalk deflection range.

Can be based on wavesAnd substituting the precision offset of the wave calculated by the precision data, calculating whether the insertion loss data meets the requirement or not, wherein the precision offset of the wave calculated based on the precision data of the wave is the working offset of the wave based on the precision data of the wave and the insertion loss data, otherwise, reducing the range on the basis of the precision offset of the wave calculated based on the precision data of the wave, and calculating the insertion loss offset corresponding to the insertion loss data. Substituting the insertion loss offset into bandwidth data and crosstalk data according to the method, and finally calculating the working offset [ -delta lambda ] meeting the requirements of wavelength accuracy, insertion loss, bandwidth and crosstalk indexes _- ,Δλ ₊ ]。

The working offset [ -delta lambda ] can also be obtained by taking the intersection of the precision offset, the insertion loss offset, the bandwidth offset and the crosstalk offset based on the precision offset, the insertion loss data, the bandwidth data and the crosstalk offset required by the indexes of the wave _- ,Δλ ₊ ]。

In an alternative embodiment of the invention, said determining a first offset of said wave at a first operating temperature comprises:

determining a first wavelength of the wave at the first operating temperature;

In this embodiment, the process of determining the first wavelength of the wave at the first operating temperature may be determined according to practical situations, which is not limited herein. As one example, a first wavelength of the wave at the first operating temperature is determined based on a wavelength-temperature characteristic of a filter.

The process of determining the first offset of the wave at the first working temperature based on the first wavelength at the first working temperature and the first wavelength at the first preset temperature may be determined according to actual situations, which is not limited herein. As one example, a first offset of the wave at the first operating temperature is determined based on a difference between a first wavelength at the first operating temperature and a first wavelength at a first preset temperature. The first preset temperature may be a normal temperature of a plurality of temperatures, and the first wavelength at the first preset temperature may be a first wavelength of the wave at normal temperature.

For convenience of understanding, fig. 7 is a wavelength-temperature characteristic diagram of a filter according to an embodiment of the present invention, and as shown in fig. 7, based on an operating wavelength [1529.521,1529.586] nm of the wave, an operating temperature range is required to be [ -5,65 ]. Degree centigrade, and a wavelength value of a first wavelength of the wave at normal temperature is determined to be minimum by combining the wavelength-temperature characteristic curves, and compared with normal temperature, the wavelength value of the first wavelength of the wave at-5 ℃ or 65 ℃ is larger than the wavelength value of the first wavelength of the wave at normal temperature. Determining a first wavelength of the wave at-5 ℃ and further determining a shift of the wave to the long wave by 30pm at-5 ℃, determining a first wavelength of the wave at 65 ℃ and further determining a shift of the wave to the long wave by 36pm at 65 ℃.

In an optional embodiment of the present invention, when the first offset is greater than the working offset, correcting the center wavelength corresponding to the wave according to the first offset includes:

determining a correction parameter based on the first offset;

and correcting the center wavelength based on the correction parameter.

In this embodiment, the process of determining the correction parameter based on the first offset may be determined according to an actual situation, which is not limited herein. As an example, half of the first offset is taken as the correction parameter.

The process of correcting the center wavelength based on the correction parameter may be determined according to practical situations, and is not limited herein. As an example, the ITU wavelength is differenced with the correction parameter to obtain a corrected center wavelength; and correcting the center wavelength based on the corrected center wavelength.

For easy understanding, it is determined that the wavelength shifts 36pm toward the long wave at 65 ℃, and if the ITU wavelength is selected as the correction target center wavelength, the net bandwidth index in the situation of 65 ℃ does not meet the requirement, so the correction target center wavelength should be shifted toward a direction smaller than the ITU wavelength, and it is critical that the corrected filter is located at a middle position of the operable wavelength range, where the wavelength shifts 36pm toward the long wave at 65 ℃ by half of the wavelength, and the correction parameter is 18pm. And the ITU wavelength and the correction parameter are subjected to difference, and fig. 8 is a wavelength-temperature characteristic diagram corrected by the method for correcting the wavelength according to the embodiment of the present invention, as shown in fig. 8, at this time, a wavelength value corresponding to normal temperature, that is, a corrected target center wavelength 1529.553-0.018= 1529.535nm is calculated, and a corrected center wavelength 1529.535nm is obtained.

In an alternative embodiment of the invention, the method further comprises:

In this embodiment, the determining the working wavelength of the wave based on the working offset may be calculating the working offset and the ITU wavelength based on a preset calculation formula, and determining the working wavelength of the wave.

The preset calculation formula may be determined according to actual situations, and is not limited herein. As an example, the preset calculation formula may be that the ITU wavelength and the working offset are summed to obtain a working wavelength range, and the working wavelength range is taken as the working wavelength of the wave.

For ease of understanding, the wave-based working offset [ -32,33]pm, the lambda _ITU Is 1529.553nm, combined with a calculation formula [ lambda ] _ITU -Δλ _- ,λ _ITU +Δλ ₊ ]Working out the working wavelength [1529.521,1529.586 ]]nm. And correcting the center wavelength corresponding to the wave according to the first offset under the condition that the first wavelength of the wave at the first working temperature is larger than the working wavelength.

In an alternative embodiment of the invention, the method further comprises:

determining accuracy data of the wave based on the center wavelength;

In this embodiment, the preset precision index may be determined according to an actual situation, which is not limited herein. As an example, the preset accuracy index may be a wavelength accuracy requirement.

The determining the accuracy data of the wave based on the center wavelength may be determining a center wavelength of the wave at the first operating temperature; and processing the center wavelength based on a preset mode, and determining accuracy data of the wave at the first working temperature.

The processing the center wavelength based on the preset mode, determining the accuracy data of the wave at the first working temperature may be determining preset wavelength data according to a preset criterion, processing the preset wavelength data and the center wavelength based on the preset mode, and determining the accuracy data of the wave at the first working temperature.

The determining the preset wavelength data according to the preset criteria may be determined according to practical situations, and is not limited herein. As an example, one of the ITU wavelengths may be selected according to the ITU standard. Processing the preset wavelength data and the central wavelength based on the preset mode, wherein determining the accuracy data of the wave at the first working temperature can be that the central wavelength and the preset wavelength data are subjected to difference, and determining the accuracy data of the wave at the first working temperature.

For easy understanding, the corresponding center wavelength lambda at the center of the spectral range covered by the 3dB peak insertion loss drop is determined according to the wavelength-transmissivity data of the channel at the normal temperature of 25 DEG C _c 1529.426nm. The accuracy data Δλ of the wave was determined to be-127 pm according to the above-described formula (1). Based on the wavelength accuracy requirement delta lambda _WA [-40,40]pm, determining that the wave is the precision data which does not meet the wavelength precision requirement, and correcting the center wavelength corresponding to the wave according to the first offset.

The embodiment of the invention calculates the working offset of the wave of the filter based on the wavelength-transmissivity data and by combining specific wave precision, insertion loss, bandwidth and crosstalk index requirements, and then calculates the correction target center wavelength by combining the wavelength-temperature characteristics. The correction method provided by the embodiment of the invention is accurate and efficient, and the qualification rate can be obviously improved.

Based on the method, the embodiment of the invention also provides a wave correction device, wherein the wave correction device can be a device for accurately correcting the wavelength of a filter. Fig. 9 is a schematic structural diagram of a wave correction device according to an embodiment of the present invention, and as shown in fig. 9, the device 900 includes: an interaction module 901, a control module 902, a storage module 903 and a first modification module 904; the control module 902 is respectively connected with the interaction module 901, the storage module 903 and the first correction module 904;

The interaction module 901 is configured to input a correction instruction, and send the correction instruction to the control module 902;

the control module 902 is configured to receive the correction instruction, call a correction task corresponding to the correction instruction in the storage module 903, and distribute the correction task to the first correction module 904;

the first correction module 904 is configured to receive the correction task, determine a corrected center wavelength based on the correction task, correct the center wavelength of the wave based on the corrected center wavelength to obtain a correction result, and store the correction result to the storage module 903;

the storage module 903 is configured to store a correction task corresponding to the correction instruction, and store the correction result.

In this embodiment, the interaction module 901 may be a web terminal, the control module 902 may be a server, the storage module 903 may be a database, and the first correction module 904 may be a wavelength correction system. Inputting a wavelength correction instruction through the web end and sending the correction instruction to the server; after receiving the wavelength correction instruction, the server invokes a recorded wavelength correction task in the database and distributes the wavelength correction task to a wavelength correction system; the result of each wavelength correction of the wavelength correction system is recorded in the database. The web end is used for inputting the wavelength correction instruction; the server is used for calling a wavelength correction task corresponding to the wavelength correction instruction in the database according to the wavelength correction instruction, distributing the wavelength correction task to the wavelength correction system, and determining a corrected center wavelength based on the wavelength correction task, wherein the corrected center wavelength can be a corrected target center wavelength; the database is used for recording a wavelength correction task and a wavelength correction result corresponding to the wavelength correction instruction; the wavelength correction system is used for receiving the wavelength correction task and performing wavelength correction.

In an alternative embodiment of the present invention, the apparatus 900 further includes:

the control module 902 is further configured to send the correction result stored in the storage module 903 to the interaction module 901;

the interaction module 901 is further configured to receive and display the correction result sent by the control module 902.

In this embodiment, the wavelength correction result stored in the database is uploaded to the web terminal through the server for display. The server is further configured to send a wavelength correction result stored in the database to the web end; the web end is also used for receiving and displaying the wavelength correction result sent by the server.

In an alternative embodiment of the present invention, the first correction module 904 includes: the device comprises a laser emitting unit 9041, a polarization control unit 9042, a light splitting unit 9043, a filter to be tested 9044, a power monitoring unit 9045 and a correcting unit 9046;

the laser emitting unit 9041 is used for emitting laser with wavelength;

the polarization control unit 9042 is used for controlling the laser to traverse the polarization state;

the beam splitting unit 9043 is configured to split the laser beam;

the filter 9044 to be tested is used for passing the laser;

The power monitoring unit 9045 is configured to monitor an optical power of the laser;

the correction unit 9046 is configured to correct a center wavelength of the filter based on the wavelength-transmittance data corresponding to the optical power and the corrected center wavelength.

In this embodiment, the laser emitting unit 9041 may be a tunable laser, the polarization control unit 9042 may be a polarization controller, the light splitting unit 9043 may be a light splitter, the power monitoring unit 9045 may be a multichannel power meter, and the correction unit 9046 may be a wavelength correction device. The tunable laser has the main function of emitting light with a certain wavelength range; the polarization controller has the main function of enabling the incoming light to traverse all polarization states; the optical splitter has the main function of splitting the light, so that a plurality of devices can be tested simultaneously, namely, the devices share one set of light source and polarization controller; the main function of the wavelength correction device is to correct the wavelength; the main function of the multichannel power meter is to monitor the power value.

The adjustable laser emits light, the wavelength value of the light emitted by the adjustable laser is scanned within a certain wavelength range, after traversing all polarization states through the polarization controller, the light emitted by the adjustable laser is split by the splitter, and at the moment, the splitter is connected with the multichannel power meter to obtain a light storage value; and connecting the beam splitter with the filter to be detected, enabling light split by the beam splitter to enter the filter to be detected respectively, outputting the light from the filter to be detected, obtaining a power value by reaching the multichannel power meter, obtaining a wavelength value by combining a synchronization function, subtracting the stored light value, finally obtaining wavelength-transmissivity data, and correcting the central wavelength to the correction target central wavelength by a wavelength correction device, thereby realizing wavelength correction, wherein the wavelength correction device can be a laser radiation device or a temperature control device.

According to the embodiment of the invention, the wavelength correction of the filter is completed through the wavelength correction equipment, and the correction device provided by the embodiment of the invention has the advantages that the correction system and the database are arranged on the cloud, so that the flexible calling and sharing of the device and the data are realized, the convenience and the high efficiency are realized, and the production is facilitated.

The embodiment of the present invention further provides a wave correction device, fig. 10 is a schematic diagram of a composition structure of the wave correction device according to the embodiment of the present invention, as shown in fig. 10, the device 1000 includes:

a first determining module 1001 for determining an amount of working shift of the wave;

a second determining module 1002 for determining a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

a second correction module 1003, configured to correct, according to the first offset, a center wavelength corresponding to the wave when the first offset is greater than the working offset; wherein the center wavelength characterizes a wavelength corresponding to the center of the wave coverage spectrum range satisfying a first preset condition.

In other embodiments, the first determining module 1001 is further configured to obtain loss data of the wave; judging whether the loss data meet the requirement of a preset index or not; and determining the working offset of the wave based on the loss data and the preset index under the condition that the loss data meets the requirement of the preset index.

In other embodiments, the second determining module 1002 is further configured to determine a first wavelength of the wave at the first operating temperature; a first offset of the wave at the first operating temperature is determined based on the first wavelength at the first operating temperature and a first wavelength at a first preset temperature.

In other embodiments, the second correction module 1003 is further configured to determine a correction parameter based on the first offset; and correcting the center wavelength based on the correction parameter.

In other embodiments, the apparatus 1000 further comprises: and a third determining module for determining an operating wavelength of the wave based on the operating offset.

In other embodiments, the apparatus 1000 further comprises: a fourth determination module and a fifth determination module, the fourth determination module configured to determine accuracy data of the wave based on the center wavelength; the fifth determining module is configured to correct, according to the first offset, a center wavelength corresponding to the wave when the accuracy data does not meet a requirement of a preset accuracy index.

In the embodiment of the present invention, if the wave correction method described above is implemented in the form of a software functional module, and sold or used as a separate product, the wave correction method may also be stored in a computer-readable storage medium. Based on such understanding, the technical embodiments of the present invention may be embodied essentially or in part in the form of a software product stored in a storage medium, including instructions for causing a wave modification device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the methods described in the various embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read Only Memory (ROM), a magnetic disk, an optical disk, or other various media capable of storing program codes. Thus, embodiments of the invention are not limited to any specific combination of hardware and software.

Correspondingly, an embodiment of the present invention provides a wave correction device, including a memory and a processor, where the memory stores a computer program executable on the processor, and the processor implements the steps in the wave correction method provided in the above embodiment when executing the program.

Correspondingly, an embodiment of the invention provides a computer-readable storage medium on which a computer program is stored, which computer program, when being executed by a processor, implements the steps of the wave modification method provided by the above-mentioned embodiment.

It should be noted here that: the description of the storage medium and apparatus embodiments above is similar to that of the method embodiments described above, with similar benefits as the method embodiments. For technical details not disclosed in the embodiments of the storage medium and the apparatus of the present invention, reference should be made to the description of the embodiments of the method of the present invention.

It should be noted that, fig. 11 is a schematic structural diagram of a hardware entity of a wave correction device according to an embodiment of the present invention, and as shown in fig. 11, a hardware entity of a wave correction device 1100 includes: the processor 1101 and memory 1103, the wave modification apparatus 1100 may optionally further comprise a communication interface 1102.

It is to be appreciated that the memory 1103 can be volatile memory or nonvolatile memory, and can include both volatile and nonvolatile memory. Wherein the nonvolatile Memory may be Read Only Memory (ROM), programmable Read Only Memory (PROM, programmable Read-Only Memory), erasable programmable Read Only Memory (EPROM, erasable Programmable Read-Only Memory), electrically erasable programmable Read Only Memory (EEPROM, electrically Erasable Programmable Read-Only Memory), magnetic random access Memory (FRAM, ferromagnetic random access Memory), flash Memory (Flash Memory), magnetic surface Memory, optical disk, or compact disk Read Only Memory (CD-ROM, compact Disc Read-Only Memory); the magnetic surface memory may be a disk memory or a tape memory. The volatile memory may be random access memory (RAM, random Access Memory), which acts as external cache memory. By way of example, and not limitation, many forms of RAM are available, such as static random access memory (SRAM, static Random Access Memory), synchronous static random access memory (SSRAM, synchronous Static Random Access Memory), dynamic random access memory (DRAM, dynamic Random Access Memory), synchronous dynamic random access memory (SDRAM, synchronous Dynamic Random Access Memory), double data rate synchronous dynamic random access memory (ddr SDRAM, double Data Rate Synchronous Dynamic Random Access Memory), enhanced synchronous dynamic random access memory (ESDRAM, enhanced Synchronous Dynamic Random Access Memory), synchronous link dynamic random access memory (SLDRAM, syncLink Dynamic Random Access Memory), direct memory bus random access memory (DRRAM, direct Rambus Random Access Memory). The memory 1103 described in connection with the embodiments of the present invention is intended to comprise, without being limited to, these and any other suitable types of memory.

The method disclosed in the above-described embodiment of the present invention may be applied to the processor 1101 or implemented by the processor 1101. The processor 1101 may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the methods described above may be performed by integrated logic circuitry in hardware in the processor 1101 or by instructions in software. The processor 1101 described above may be a general purpose processor, a digital signal processor (DSP, digital Signal Processor), or other programmable logic device, discrete gate or transistor logic device, discrete hardware components, or the like. The processor 1101 may implement or perform the methods, steps and logic blocks disclosed in embodiments of the present invention. The general purpose processor may be a microprocessor or any conventional processor or the like. The steps of the method disclosed in the embodiment of the invention can be directly embodied in the hardware of the decoding processor or can be implemented by combining hardware and software modules in the decoding processor. The software modules may be located in a storage medium including memory 1103, and the processor 1101 reads information from the memory 1103 and performs the steps of the method described above in connection with its hardware.

In an exemplary embodiment, the wave modifying device may be implemented by one or more application specific integrated circuits (ASIC, application Specific Integrated Circuit), DSPs, programmable logic devices (PLD, programmable Logic Device), complex programmable logic devices (CPLD, complex Programmable Logic Device), field-programmable gate arrays (FPGA, field-Programmable Gate Array), general purpose processors, controllers, microcontrollers (MCU, micro Controller Unit), microprocessors (Microprocessor), or other electronic components for performing the methods described herein.

In the several embodiments provided in the present invention, it should be understood that the disclosed method and apparatus may be implemented in other manners. The above-described embodiment of the apparatus is merely illustrative, and for example, the division of the units is merely a logic function division, and there may be other division manners in actual implementation, such as: multiple units or components may be combined or may be integrated into another observational quantity or some features may be omitted or not performed. In addition, the various components shown or discussed may be connected in an indirect coupling or communication via interfaces, devices, or units, which may be electrical, mechanical, or other forms.

The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units; some or all of the units may be selected according to actual needs to achieve the object of the present embodiment.

Those of ordinary skill in the art will appreciate that: all or part of the steps for implementing the above-described method embodiments may be implemented by hardware associated with program instructions, where the foregoing program may be stored in a computer readable storage medium, and where the program, when executed, performs steps including the above-described method embodiments; and the aforementioned storage medium includes: a mobile storage device, a Read-Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.

Alternatively, the integrated units described in the embodiments of the present invention may be stored in a computer readable storage medium if implemented in the form of software functional units and sold or used as separate products. Based on such understanding, the technical embodiments of the present invention may be embodied essentially or in part in the form of a software product stored in a storage medium, including instructions for causing a wave modification device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the methods described in the various embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a removable storage device, a ROM, a magnetic disk, or an optical disk.

The wave correction method, apparatus and computer storage medium described in the examples of the present invention are only examples of the embodiments of the present invention, but are not limited thereto, and the wave correction method, apparatus and computer storage medium are all within the scope of the present invention.

It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in various embodiments of the present invention, the sequence number of each process described above does not mean that the execution sequence of each process should be determined by its functions and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention. The foregoing description of the embodiments of the present invention is provided for illustrative purposes only, and does not represent the advantages or disadvantages of the embodiments.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

The foregoing is merely an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present invention, and the changes and substitutions are intended to be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A method for modifying a wave, comprising:

determining an operational offset of the wave;

2. The method of claim 1, wherein said determining the working offset of the wave comprises:

acquiring loss data of the wave;

judging whether the loss data meet the requirement of a preset index or not;

3. The method of claim 1, wherein said determining a first offset of said wave at a first operating temperature comprises:

determining a first wavelength of the wave at the first operating temperature;

4. The method of claim 1, wherein, in the case where the first offset is greater than the operating offset, correcting the center wavelength corresponding to the wave according to the first offset includes:

determining a correction parameter based on the first offset;

and correcting the center wavelength based on the correction parameter.

5. The method according to claim 1, wherein the method further comprises:

6. The method according to claim 1, wherein the method further comprises:

Determining accuracy data of the wave based on the center wavelength;

7. A wave modification apparatus, the apparatus comprising: the device comprises an interaction module, a control module, a storage module and a first correction module; the control module is respectively connected with the interaction module, the storage module and the first correction module;

8. The apparatus according to claim 7, comprising:

9. The apparatus of claim 7, wherein the first correction module comprises: the device comprises a laser emission unit, a polarization control unit, a light splitting unit, a filter to be tested, a power monitoring unit and a correction unit;

the laser emission unit is used for emitting laser with wavelength;

the light splitting unit is used for splitting the laser;

the filter to be tested is used for passing the laser;

10. A wave correction device, comprising:

a first determination module for determining an operational offset of the wave;

11. A wave modifying apparatus comprising a memory and a processor, the memory storing a computer program executable on the processor, wherein the processor implements the steps of the method of any one of claims 1 to 6 when the program is executed.

12. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 6.