CN117949458A - Defect detection device, defect detection system, and defect detection method - Google Patents

Abstract

The application discloses a defect detection device, a defect detection system and a defect detection method. The defect detection device comprises a bracket mechanism, a first detection mechanism and a second detection mechanism. The bracket mechanism comprises a first bracket component and a second bracket component, and the second bracket component is installed on the first bracket component. The first detection mechanism is movably arranged on the first bracket component and faces to the top of the to-be-detected piece, and is used for detecting the defect of the top of the to-be-detected piece. The first detection mechanism comprises a first illumination assembly, and the first illumination assembly is used for flashing and illuminating the top of the to-be-detected piece; the first illumination assembly includes a coaxial light source and an annular AOI light source coaxially disposed. The second detection mechanism is movably arranged on the first bracket component and the second bracket component and faces the side face of the to-be-detected piece, and the second detection mechanism is used for detecting the defect of the side face of the to-be-detected piece. The coaxial light source and the annular AOI light source which are coaxially arranged can be used for drawing out more kinds of light at the top of a piece to be detected, and different characteristics can be shown for the same defect through configuring the various color light sources in the annular AOI light source, so that the inspection precision is high, and the defect is difficult to miss.

Description

Defect detection device, defect detection system, and defect detection method

Technical Field

The present application relates to the field of defect detection, and more particularly, to a defect detection apparatus, a defect detection system, and a defect detection method.

Background

The parts to be inspected, such as battery poles, may have surface defects during the manufacturing process due to process reasons, such as: surface scratches, pits, rubber ring defects, poor welding or protrusions, and the like. Defects on the surface of the part to be inspected may cause safety hazards or affect the quality of the product. At present, single coaxial light sources are mostly used for machine vision detection of defects on the surface of a piece to be detected. The coaxial light source can overcome the interference caused by surface reflection. However, for a diffuse reflection to-be-detected piece with a rough surface, the contrast of the coaxial light source for the shallow scratch is weak, so that the shallow scratch can be submerged by the background, and the detection omission risk exists.

Disclosure of Invention

The embodiment of the application provides a defect detection device, a defect detection system and a defect detection method, which are at least used for solving the problem that the defect detection method of a single light source is easy to cause missed detection.

The defect detection device of the embodiment of the application comprises a bracket mechanism, a first detection mechanism and a second detection mechanism. The support mechanism comprises a first support assembly and a second support assembly, and the second support assembly is installed on the first support assembly. The first detection mechanism is movably arranged on the first bracket component and faces to the top of the to-be-detected piece, and the first detection mechanism is used for detecting the defect of the top of the to-be-detected piece. The first detection mechanism comprises a first illumination assembly, wherein the first illumination assembly is used for flashing and illuminating the top of the to-be-detected piece; the first illumination assembly includes a coaxial light source and an annular AOI light source coaxially disposed. The second detection mechanism is movably arranged on the first bracket component and the second bracket component and faces to the side face of the to-be-detected piece, and the second detection mechanism is used for detecting the defect of the side face of the to-be-detected piece.

In some embodiments, the first bracket component is provided with a containing space, and the first lighting component is movably installed in the first bracket component and is arranged in the containing space. The first detection mechanism further comprises a first shooting component, the first shooting component is movably arranged on the first bracket component, the first shooting component is coaxial with the first illumination component, and part of the structure of the first shooting component corresponds to the top of the piece to be detected through the first illumination component.

In some embodiments, the first detection mechanism further comprises a first adjustment assembly mounted to the first shooting assembly, the first adjustment assembly for adjusting a relative position between the first shooting assembly and the first bracket assembly in a first direction and a second direction. The first direction is parallel to a central axis of the first lighting assembly, and the first direction is perpendicular to the second direction.

In certain embodiments, the first bracket assembly includes a mounting plate and a support arm. The mounting plate is provided with a yielding hole, and the first shooting assembly is mounted on the first side of the mounting plate and corresponds to the yielding hole. The support arm install in the mounting panel stretches into in the hole of stepping down, first lighting assembly install in the support arm, just first lighting assembly with the hole of stepping down corresponds.

In some embodiments, the support arm includes a first portion secured to the mounting plate and a second portion movably disposed on the first portion, the first lighting assembly being mounted to the second portion. The first lighting assembly moves in a first direction relative to the mounting plate with the second portion moving in the first direction relative to the first portion.

In some embodiments, the second detection mechanism includes a plurality of second illumination assemblies and a plurality of second photographing assemblies. The second illumination component is arranged on the second bracket component and corresponds to at least one side face of the to-be-detected piece, and the second illumination component is used for flashing and illuminating the side face corresponding to the to-be-detected piece. The second shooting assemblies are movably arranged on the second bracket assemblies, and each second shooting assembly is located between two second illumination assemblies which are adjacently arranged so as to correspond to two connected side surfaces of the to-be-detected piece.

In some embodiments, the second detection mechanism further comprises a second adjustment assembly mounted to the second photographing assembly. The second adjusting component is used for adjusting the relative position between the second shooting component and the second bracket component along a third direction and a fourth direction, and the third direction is perpendicular to the fourth direction.

In some embodiments, the second bracket assembly includes a mounting frame and a plurality of support brackets. The second illumination component is movably arranged on any side wall of the mounting frame along the first direction and faces the side face of the to-be-detected piece. The first bracket component comprises a mounting plate, the support frame is connected with the mounting plate and located on the second side of the mounting plate, and the second shooting component is movably arranged on the support frame.

In some embodiments, the support frame is provided with a first adjusting groove, and the second shooting assembly is used for moving along the first adjusting groove to adjust an included angle between a shooting axis of the second shooting assembly and the side face of the piece to be detected. The mounting plate is provided with a second adjusting groove, and the support frame is used for moving along the second adjusting groove so as to adjust the distance between the second shooting assembly and the to-be-detected piece.

The defect detection system according to an embodiment of the present application includes the defect detection device according to any of the above embodiments, and a control unit electrically connected to both the first detection mechanism and the second detection mechanism of the defect detection device. The control component is used for controlling the first detection mechanism to detect the defect at the top of the to-be-detected piece under the condition that the to-be-detected piece moves and passes the detection position of the defect detection device; and controlling the second detection mechanism to detect the defects of the side surface of the piece to be detected after the detection of the first detection mechanism is finished.

In certain embodiments, the first detection mechanism comprises a first illumination assembly and a first photographing assembly, and the second detection mechanism comprises a second illumination assembly and a second photographing assembly; the control assembly comprises a relay, a digital stroboscopic controller and an explosion flash source controller. The relay is used for sending out a trigger signal when the to-be-detected piece moves and passes through the detection position of the defect detection device. The digital strobe controller is electrically connected with the relay, the first lighting assembly and the first shooting assembly, and a trigger port of the first shooting assembly is directly connected with an output port of the digital strobe controller. The digital strobe controller is used for receiving a trigger signal to control the first lighting component to flash to illuminate the top of the piece to be detected and control the first shooting component to shoot an image of the top of the piece to be detected so as to detect the defect of the top of the piece to be detected. The explosion flash source controller is electrically connected with the relay, the second lighting assembly and the second shooting assembly, and a triggering port of the second shooting assembly is directly connected with an output port of the explosion flash source controller. The explosion flash source controller is used for receiving the trigger signal and controlling the second lighting component to flash to illuminate the side face of the to-be-detected piece after the first detection mechanism finishes detecting, and controlling the second shooting component to shoot an image of the side face of the to-be-detected piece so as to detect the defect of the side face of the to-be-detected piece.

The defect detection method according to the embodiment of the present application is applied to the defect detection system according to any of the above embodiments, and includes: under the condition that the to-be-detected piece moves and reaches the detection position, the control component sends out a trigger signal; the first detection mechanism acquires a first defect image of the top of the piece to be detected according to the trigger signal; and after the first defect image is acquired, the second detection mechanism acquires a second defect image of the side face of the to-be-detected piece according to the trigger signal.

In some embodiments, the first detection mechanism comprises a first illumination assembly and a first shooting assembly, and the control assembly comprises a relay and a digital strobe controller which are electrically connected with each other; the first detection mechanism acquires a first defect image of the top of the piece to be detected according to the trigger signal, and the first detection mechanism comprises: the relay sends the trigger signal to the digital strobe controller; the digital strobe controller controls the first lighting assembly to flash according to the trigger signal so as to illuminate the top of the piece to be detected; and the digital strobe controller controls the first shooting component to shoot the top of the to-be-detected piece and obtain the first defect image while the first lighting component flickers according to the trigger signal.

In some embodiments, the second detection mechanism comprises a second illumination assembly and a second shooting assembly, and the control assembly comprises a relay and an explosion flash source controller which are electrically connected with each other; after the first defect image is acquired, the second detection mechanism acquires a second defect image of the side surface of the to-be-detected piece according to the trigger signal, and the second detection mechanism comprises: the relay sends the trigger signal to the explosion flash source controller so that the explosion flash source controller starts to record delay time; when the delay time reaches the preset time of the explosion flash source controller, the explosion flash source controller controls the second lighting assembly to flash according to the trigger signal so as to illuminate the side face of the piece to be detected; and the explosion flash source controller controls the second shooting component to shoot the side face of the to-be-detected piece and obtain the second defect image when the second lighting component flickers according to the trigger signal.

According to the defect detection device, the defect detection system and the defect detection method, the coaxial light source and the annular AOI light source which are coaxially arranged can emit more kinds of light on the top of the piece to be detected, and the first detection mechanism can distinguish different defects through colors. Or by configuring the light sources of various colors in the annular AOI light source, different characteristics are shown for the same defect, the inspection accuracy is higher, and the defect is not easy to miss.

Additional aspects and advantages of embodiments of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of embodiments of the application.

Drawings

The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:

FIG. 1 is a schematic perspective view of a defect detection apparatus according to some embodiments of the present application;

FIG. 2 is a perspective view of a bracket mechanism of the defect detection apparatus shown in FIG. 1;

FIG. 3 is a perspective view of a first detection mechanism of the defect detection apparatus shown in FIG. 1;

FIG. 4 is a perspective view showing a part of the structure of the defect detecting apparatus shown in FIG. 1;

FIG. 5 is a schematic plan view of a portion of the structure of a defect detection apparatus according to some embodiments of the present application;

FIG. 6 is a schematic plan view of another view of a portion of the structure of a defect detection device according to some embodiments of the present application;

FIG. 7 is a block diagram of a defect detection system according to certain embodiments of the present application;

FIG. 8 is a block diagram of a defect detection system according to certain embodiments of the present application;

FIG. 9 is a flow chart of a defect detection method according to some embodiments of the present application;

FIG. 10 is a flow chart of a defect detection method according to some embodiments of the present application;

FIG. 11 is a flow chart of a defect detection method according to some embodiments of the present application.

Description of main reference numerals:

1000. A defect detection system; 300. a control assembly; 301. a relay; 303. a digital strobe controller; 305. a burst flash source controller; 100. a defect detecting device; x, a first direction; y, second direction; m, the third direction; n, fourth direction; 10. a bracket mechanism; 11. a first bracket assembly; 101. an accommodation space; 111. a mounting plate; 1111. a first side of the mounting plate; 1113. a second side of the mounting plate; 1115. a relief hole; 1117. a second regulating groove; 113. a support arm; 1131. a first section; 1133. a second section; 13. a second bracket assembly; 131. a mounting frame; 133. a support frame; 1331. a first adjustment tank; 30. a first detection mechanism; 31. a first lighting assembly; 311. a coaxial light source; 313. a toroidal AOI light source; 33. a first photographing assembly; 35. a first adjustment assembly; 50. a second detection mechanism; 51. a second lighting assembly; 53. a second photographing assembly; 55. a second adjustment assembly.

Detailed Description

Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for explaining the embodiments of the present application and are not to be construed as limiting the embodiments of the present application.

In the description of the present application, it should be understood that the terms "thickness," "upper," "top," "bottom," "inner," "outer," and the like indicate an orientation or a positional relationship based on that shown in the drawings, merely for convenience of description and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the application. And the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more features. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.

In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly and may be fixedly connected, detachably connected, or integrally connected in one example; may be mechanically or electrically connected, or may be in communication with each other; either directly or indirectly through intermediaries, may be in communication with each other between two elements or in an interaction relationship between the two elements.

Referring to fig. 1 and 3, a defect detecting device 100 of the present application includes a bracket mechanism 10, a first detecting mechanism 30 and a second detecting mechanism 50. The bracket mechanism 10 includes a first bracket component 11 and a second bracket component 13, and the second bracket component 13 is mounted on the first bracket component 11. The first detecting mechanism 30 is movably disposed on the first bracket assembly 11 and faces to the top of the to-be-detected member, and the first detecting mechanism 30 is used for detecting the defect of the top of the to-be-detected member. The first detection mechanism 30 comprises a first illumination assembly 31, and the first illumination assembly 31 is used for flashing and illuminating the top of the to-be-detected piece; the first lighting assembly 31 comprises a coaxial light source 311 and an annular AOI light source 313 arranged coaxially. The second detecting mechanism 50 is movably arranged on the first bracket component 11 and the second bracket component 13 and faces the side face of the to-be-detected piece, and the second detecting mechanism 50 is used for detecting the defect of the side face of the to-be-detected piece.

The object to be detected is an object with a defect to be detected on the surface, and the types of the object to be detected include, but are not limited to, a battery shell, a battery pole, a mechanical part and the like. The material, color, etc. of the member to be detected are not limited. The to-be-detected piece comprises a top and a bottom which are arranged in a reverse way, and side surfaces which encircle the top and the bottom and are respectively connected with the top and the bottom. In the case where the piece to be inspected is placed on the movable platform, the movable platform can be in contact with the bottom of the piece to be inspected to carry the piece to be inspected. Moreover, the movable platform can also drive the to-be-detected piece to move to a position aligned with the first detection mechanism 30 and the second detection mechanism 50 relative to the defect detection device 100, so that the first detection mechanism 30 can correspond to the top of the to-be-detected piece, and the second detection mechanism 50 can correspond to the side of the to-be-detected piece, so as to acquire defect information of the top of the to-be-detected piece and defect information of the side of the to-be-detected piece respectively. Defect information includes, but is not limited to, an image of the defect, a distribution of the defect, a type of the defect, and the like.

The first lighting assembly 31 is an assembly capable of shining light on the top of the to-be-detected member, and since the defective portion and the non-defective portion of the to-be-detected member have different reflection effects and refraction effects on the light emitted by the same light source, in the first defect image obtained by the first detecting mechanism 30, the defective portion and the non-defective portion of the to-be-detected member can exhibit different brightness and/or colors, so that the defective portion and the non-defective portion have a relatively obvious difference, and are convenient to identify for subsequent analysis.

The coaxial light source 311 is a light source that can be applied to a surface with high reflectance and can clearly reflect irregularities on the surface. The coaxial light source 311 is provided with a lens in the shell, a surface light source with a high-reflectivity film layer on the surface and semi-transparent and semi-reflective glass opposite to the surface light source, and the reflective glass is arranged in the shell of the coaxial light source 311 at 45 degrees. Under the condition that the surface light source emits light along the transverse direction, the light emitted by the surface light source irradiates the semi-transparent and semi-reflective glass through the lens, and the light vertically irradiates the top of the piece to be detected through total reflection. Light reflected from the top of the part to be inspected can then also pass vertically upwards through the semi-transparent semi-reflective glass to enter the structure of the first inspection mechanism 30 where the image can be acquired. The use of the coaxial light source 311 can not only eliminate reflection at the top of the object to be detected, but also avoid reflection of the object to be detected on the structure of the first detection mechanism 30 that can collect images.

The annular AOI (Automated Optical Inspection) light source is formed by adopting an RGB three-color high-brightness LED array and can irradiate an object with various light rays with different angles and different colors. The annular AOI light source 313 is internally provided with a combined high-angle light source and a low-angle light source, so that the annular AOI light source 313 can polish the details of the to-be-detected piece at different layers at different angles and different colors, the imaging is more stereoscopic, and the defect display is clearer. For example: the annular AOI light source 313 is sequentially provided with an annular blue light source, a green light source, a red light source and a white light source from bottom to top. For relatively sharp defects on the top surface of the part to be inspected, the effect of blue light and green light at low angles on the defects is more obvious, and the defects can mainly reflect green light and blue light. For the relatively gentle defect of the top surface of the to-be-detected piece, the effect of the red light at a high angle on the defect is relatively obvious, and the defect can mainly reflect the red light. Therefore, the severity of the defect can be judged by the color of the defect in the acquired defect image.

In the defect detecting device 100 of the present application, the coaxial light source 311 and the annular AOI light source 313 which are coaxially arranged can emit more kinds of light on the top of the object to be detected, and the first detecting mechanism 30 can distinguish different defects by color. Or by configuring the light sources of various colors in the annular AOI light source 313, different characteristics are shown for the same defect, the inspection accuracy is higher, and the defect is not easy to miss.

The defect inspection apparatus 100 is further described below with reference to the accompanying drawings.

Referring to fig. 1 and 2, in some embodiments, the support mechanism 10 is a structure that mainly supports the first detecting mechanism 30 and the second detecting mechanism 50, and the material of the support mechanism 10 includes, but is not limited to, metal, plastic, rubber, or the like. Specifically, the first detecting mechanism 30 is mounted on the first bracket assembly 11, and the first detecting mechanisms 30 face the top of the to-be-detected member along a first direction X, which is a height direction of the bracket mechanism 10. The second detection mechanism 50 is movably mounted to the first bracket assembly 11 and the second bracket assembly 13. The first bracket mechanism 10 is used for installing the first detection mechanism 30 and the second bracket component 13, and the second bracket component 13 is used for installing the second detection mechanism 50.

Further, in some embodiments, the first bracket assembly 11 is provided with a receiving space 101, the receiving space 101 extends along the first direction X and is located at the center of the first bracket assembly 11, and the first lighting assembly 31 is movably mounted to the first bracket assembly 11 and is disposed in the receiving space 101 when the first detecting mechanism 30 is mounted to the first bracket assembly 11. The first lighting assembly 31 is movable relative to the first bracket assembly 11 in the first direction X to vary the distance between the first lighting assembly 31 and the top of the piece to be inspected. In case that the distance between the first illumination assembly 31 and the top of the object to be inspected is too short, the brightness of the top of the object to be inspected is too high, and it is difficult to obtain a clear defect image. In case that the distance between the first illumination assembly 31 and the top of the object to be inspected is too far, the brightness of the top of the object to be inspected is too low and the boundary between the defect and the non-defect is not obvious.

Specifically, in certain embodiments, the first bracket assembly 11 includes a mounting plate 111 and a support arm 113. The mounting plate 111 has a substantially plate-like structure, the mounting plate 111 is provided with a relief hole 1115, and the first lighting assembly 31 corresponds to the relief hole 1115. In the first direction X, the mounting plate 111 includes first and second opposite sides 1111 and 1113, the second bracket assembly 13 and the second detection mechanism 50 are each located on the second side 1113 of the mounting plate 111, a portion of the structure of the first detection mechanism 30 is located on the first side 1111 of the mounting plate 111, and another portion of the structure is located on the second side 1113 of the mounting plate 111. The support arm 113 is mounted to the first side 1111 of the mounting plate 111 and partially protrudes into the relief hole 1115, and the first lighting assembly 31 can be mounted to the support arm 113 such that the first lighting assembly 31 can be disposed in the accommodating space 101.

More specifically, in some embodiments, the support arm 113 includes first and second portions 1131, 1133 that meet, and the materials of the first and second portions 1131, 1133 may be the same or different. The first portion 1131 is fixed on the mounting plate 111 and partially extends into the accommodating space 101, the second portion 1133 is movably disposed at a portion of the first portion 1131 extending into the accommodating space 101 from the yielding hole 1115, so that the second portion 1133 is completely located in the accommodating space 101, the first lighting assembly 31 is mounted on the second portion 1133, the first lighting assembly 31 can be disposed on the second portion 1133 in a detachable manner such as a threaded connection, a clamping connection or a bolting connection, or can be disposed on the second portion 1133 in a non-detachable manner such as a gluing connection, a welding connection or a hot melting connection. Along the first direction X, under the condition that the second portion 1133 moves relative to the first portion 1131, the first lighting assembly 31 disposed on the second portion 1133 can move relative to the mounting plate 111 along the first direction X, so as to adjust the distance between the first lighting assembly 31 and the top of the to-be-detected member, so as to avoid overexposure or darkness of the top of the to-be-detected member.

Still further, in some embodiments, the second bracket assembly 13 includes a mounting frame 131 and a plurality of support frames 133. The materials of the mounting frame 131 and the supporting frame 133 may be the same or different, and are not limited herein. The mounting frame 131 and the plurality of support frames 133 are coupled to the mounting plate 111 and positioned on the second side 1113 of the mounting plate 111, respectively. In some embodiments, the mounting frame 131 is separate from any one of the support frames 133, i.e., the mounting frame 131 is not in contact with any one of the support frames 133. In other embodiments, the mounting frame 131 interfaces with at least one support frame 133.

Referring to fig. 2 and 3, in some embodiments, the first detecting mechanism 30 is configured to detect a defect on the top of the object to be detected. The first lighting assembly 31 is capable of illuminating the top of the to-be-detected member, and the manner in which the first lighting assembly 31 illuminates the top of the to-be-detected member includes, but is not limited to, normal lighting or flickering, and the first direction X is always parallel to the central axis a of the first lighting assembly 31, so that the light emitted by the first lighting assembly 31 exits to the top of the to-be-detected member in a parallel light manner.

Further, the first detecting mechanism 30 may further include a first shooting component 33, where the first shooting component 33 is movably disposed on the first support component 11 and can move relative to the first support along the first direction X and the second direction Y, so that the first shooting component 33 is always coaxial with the coaxial light source 311 and/or the annular AOI light source 313 of the first lighting component 31, and a part structure (e.g. a lens) of the first shooting component 33 capable of receiving the reflected light can be corresponding to the top of the to-be-detected piece through the first lighting component 31. The second direction Y is perpendicular to the first direction X and parallel to a plane of the mounting plate 111 where the first side 1111 is located. For example: the sidewall of the hole 1115 of the mounting plate 111 includes a first surface and a second surface opposite to each other, and a third surface and a fourth surface opposite to each other, where the third surface is respectively connected to the first surface and the second surface, and the fourth surface is also respectively connected to the first surface and the second surface. In the case where the support arm 113 of the first bracket assembly 11 is mounted on the side on which the first surface or the second surface is located, the second direction Y may be the direction in which the third surface points to the fourth surface, or the direction in which the fourth surface points to the third surface. In the case where the support arm 113 of the first bracket assembly 11 is mounted on the side of the third surface or the fourth surface, the second direction Y may be a direction in which the first surface points to the second surface or a direction in which the second surface points to the first surface. The first photographing assembly 33 is mounted to the first side 1111 of the mounting plate 111 and corresponds to the relief hole 1115. The first photographing assembly 33 is capable of photographing the top of the object to be inspected while the first lighting assembly 31 illuminates the top of the object to be inspected to obtain a defect image, which is a two-dimensional image. In some embodiments of the present application, the first photographing component 33 photographs the top of the object to be inspected in a fly-swatting manner. The shooting means shooting the moving object to be detected, that is, the object to be detected can move along any direction relative to the first shooting component 33, under the condition that the object to be detected moves to a detection position corresponding to the first shooting component 33, the first lighting component 31 can illuminate the top of the object to be detected, the coaxial light source 311 and the annular AOI light source 313 always light up simultaneously to increase the light types, so that the difference between the defects and the non-defects and/or the difference between the different defects are larger, and the difference is easier to distinguish, and the first shooting component 33 can shoot the top of the object to be detected simultaneously. At this time, the part to be detected is always in a moving state.

Still further, in some embodiments, the first detecting mechanism 30 may further include a first adjusting component 35, where the first adjusting component 35 is mounted on the first photographing component 33, and the first adjusting component 35 can adjust the relative position between the first photographing component 33 and the first bracket component 11 along the first direction X and the second direction Y. For example: the first adjusting component 35 includes a first adjusting portion and a second adjusting portion, where the first adjusting portion can drive the first shooting component 33 to move along the first direction X, so as to adjust a vertical distance between the first shooting component 33 and the to-be-detected member. The second adjusting portion can drive the first photographing assembly 33 to move along the second direction Y, so as to adjust the photographing axis of the first photographing assembly 33 to coincide (be coaxial) with the central axis a of the first lighting assembly 31, and avoid incomplete photographing caused by the offset of the first photographing assembly 33, thereby causing missed inspection of the defect.

Referring to fig. 2 and 4, in some embodiments, the second detecting mechanism 50 is configured to detect a defect on a side of the object to be detected. The second detecting mechanism 50 includes a plurality of second illumination assemblies 51 and a plurality of second photographing assemblies 53. The second illumination assembly 51 is disposed on the mounting frame 131 of the second bracket assembly 13 and corresponds to at least one side of the to-be-detected member, and the second illumination assembly 51 can illuminate the corresponding side of the to-be-detected member, and the manner in which the second illumination assembly 51 illuminates the side of the to-be-detected member includes, but is not limited to, normal lighting or flickering. The second illumination assembly 51 may be a flash light source. Because the second shooting components 53 all adopt the shooting mode of the fly shooting, the to-be-detected piece moves relative to the defect detection device 100, so that in the process of shooting by the second shooting components 53, a smear exists in the acquired image, and the smear has a serious influence on the measurement accuracy of the defect. The conditions that the smear does not affect the fly swatter are as follows: the exposure time multiplied by the object movement speed is less than or equal to the movement direction precision requirement. At a certain speed, the larger the camera exposure time, the more likely the smear will occur. Therefore, in order to make the smear length as short as possible (not more than 1/3 pixel or not more than one pixel, etc.), it is necessary to reduce the exposure time of the camera and achieve the required image brightness, at this time, the brightness of the burst light source can be increased to compensate, so that the brightness of the obtained defect image can meet the requirement.

Specifically, referring to fig. 5 and 6, in some embodiments, the second photographing components 53 are movably disposed on the supporting frame 133 of the second bracket component 13, and each second photographing component 53 is located between two second illumination components 51 disposed adjacently to correspond to two connected sides of the object to be detected. The second illumination assembly 51 is movably disposed on any one of the sidewalls of the mounting frame 131 along the first direction X and faces the side of the object to be inspected. For example: the cross section of the mounting plate 111 is approximately rectangular, the four supporting frames 133 are respectively located on two sets of opposite sides of the mounting plate 111, the outer contour of the cross section of the mounting frame 131 is approximately rectangular, and each side edge of two adjacent sides of the mounting frame 131 is corresponding to one supporting frame 133. At this time, the second photographing components 53 and the second illumination components 51 each include four, each second photographing component 53 is disposed on one supporting frame 133, and each second photographing component 53 can face the side edge of the mounting frame 131, each second illumination component 51 is mounted on one side surface of the mounting frame 131, and along the direction surrounding the central axis a of the first illumination component 31, each second photographing component 53 is located between two second illumination components 51 disposed on two adjacent side surfaces of the mounting frame 131, so that each second photographing component 53 is staggered with respect to the second illumination component 51. In the case that the side surface of the object to be inspected includes a first surface, a second surface, a third surface and a fourth surface which are sequentially connected and perpendicular to each other, the first and second illumination assemblies 51 can illuminate the first surface and the second surface, and the first and second photographing assemblies 53 can photograph a defect image of the first surface; the second illumination assembly 51 is capable of illuminating the second face and the third face, and the second photographing assembly 53 is capable of photographing a defective image of the second face; the third second illumination assembly 51 is capable of illuminating the third face and the fourth face, and the third second photographing assembly 53 is capable of photographing a defective image of the third face; the fourth second illumination assembly 51 is capable of illuminating the fourth face and the first face, and the fourth second photographing assembly 53 is capable of photographing a defect image of the fourth face.

Further, in some embodiments, the support frame 133 is provided with a first adjustment slot 1331, and the second photographing assembly 53 is configured to move along the first adjustment slot 1331. In some embodiments, the extending direction of the first adjusting slot 1331 is the first direction X, the photographing axis of the second photographing component 53 is always perpendicular to the side surface of the object to be detected, but the intersection point position of the photographing axis of the second photographing component 53 and the side surface of the object to be detected is different, so that the images photographed by the second photographing component 53 are also different. In other embodiments, the first adjusting slot 1331 is arc-shaped, and when the second photographing component 53 moves along the first adjusting slot 1331, the photographing axis of the second photographing component 53 rotates along a direction perpendicular to the side surface of the support frame 133 provided with the first adjusting slot 1331, and at this time, the included angle between the photographing axis of the second photographing component 53 and the side surface of the to-be-detected object will change, so that the defect image of the side surface of the to-be-detected object photographed by the second photographing component 53 will change in brightness or color due to the difference of the included angles. By adjusting the position of the second photographing assembly 53 within the first adjustment slot 1331, the user can acquire a defect image having the greatest difference between defects and non-defects.

Still further, in some embodiments, the mounting plate 111 is provided with a second adjustment slot 1117, and the support frame 133 is configured to move along the second adjustment slot 1117 to adjust the distance between the second photographing assembly 53 and the object to be inspected. The extending direction of the second adjustment groove 1117 may be the second direction Y, or may be a direction parallel to the plane of the first side 1111 of the mounting plate 111 and perpendicular to the second direction Y. The second adjustment slots 1117 may include a plurality, and each second adjustment slot 1117 corresponds to one support frame 133, such that the support frame 133 can move along the second adjustment slot 1117. In the case where the distance between the second photographing assembly 53 and the object to be detected is too short, the defect image obtained by the second photographing assembly 53 is not complete, and there is a defect omission. In the case where the distance between the second photographing assembly 53 and the object to be detected is too long, the defect image obtained by the second photographing assembly 53 is unclear, it is difficult to determine the type of defect, and the like.

Still further, in some embodiments, the second detection mechanism 50 further includes a second adjustment assembly 55, the second adjustment assembly 55 being mounted to the second photographing assembly 53. The second adjusting component 55 is configured to adjust a relative position between the second photographing component 53 and the second bracket component 13 along a third direction M and a fourth direction N, where the third direction M is a direction perpendicular to a side surface of the support frame 133 where the first adjusting slot 1331 is provided, and the third direction M is perpendicular to the fourth direction N. For example: the second adjusting component 55 includes a first adjusting component and a second adjusting component, where the first adjusting component can drive the second shooting component 53 to move along the third direction M so as to adjust a distance between the second shooting component 53 and a side surface of the piece to be detected. The second adjusting piece can drive the second shooting component 53 to move along the fourth direction N so as to adjust the shooting axis of the second shooting component 53 to be opposite to the geometric center of the side face of the piece to be detected, and the defect shooting insufficiency caused by the offset of the second shooting component 53 is avoided, so that the missing detection of the defect is avoided.

Referring to fig. 1 and 7, a defect detecting system 1000 according to an embodiment of the present application includes the defect detecting device 100 and the control unit 300 according to any of the above embodiments, and the control unit 300 is electrically connected to both the first detecting mechanism 30 and the second detecting mechanism 50 of the defect detecting device 100. The control assembly 300 is used for controlling the first detection mechanism 30 to detect the defect of the top of the piece to be detected when the piece to be detected moves and passes through the detection position of the defect detection device 100; and controlling the second detecting mechanism 50 to detect the defects of the side surface of the workpiece to be detected after the detection of the first detecting mechanism 30 is completed.

In the defect detection system 1000 of the present application, the control component 300 can control the first detection mechanism 30 that shoots the top of the to-be-detected object to flash and illuminate the top of the to-be-detected object to obtain a defect image of the top, and through setting delay, the second detection mechanism 50 that shoots the side surface of the to-be-detected object illuminates the side surface of the to-be-detected object to obtain a defect image of the side surface after the first detection mechanism 30 finishes shooting, so as to avoid overexposure of the surface of the to-be-detected object, and the obtained defect image is clearer.

Referring to fig. 8, in some embodiments, control assembly 300 includes a relay 301, a digital strobe controller 303, and an explosion flash source controller 305. The relay 301 is a structure capable of controlling the operations of the first detecting mechanism 30 and the second detecting mechanism 50 by controlling the digital strobe controller 303 and the burst light source controller 305, respectively, in the case where the object to be detected moves and passes the detection position of the defect detecting device 100, the relay 301 can be closed to form a circuit loop communicating in the defect detecting system 1000, and the relay 301 can also simultaneously issue a trigger signal to the digital strobe controller 303 and the burst light source controller 305. The digital strobe controller 303 is electrically connected with the relay 301, the first lighting assembly 31 and the first shooting assembly 33, and the digital strobe controller 303 can receive a trigger signal sent by the relay 301 and respectively control the first lighting assembly 31 to flash to illuminate the top of the piece to be detected according to the control signal, and control the first shooting assembly 33 to shoot an image of the top of the piece to be detected, so that defects of the top of the piece to be detected can be detected after the image of the top of the piece to be detected is obtained. The explosion flash source controller 305 is electrically connected with the relay 301, the second lighting assembly 51 and the second shooting assembly 53, and the explosion flash source controller 305 can receive a trigger signal sent by the relay 301, and after the detection of the first detection mechanism 30 is completed, control the second lighting assembly 51 to flash to illuminate the side surface of the to-be-detected piece and control the second shooting assembly 53 to shoot an image of the side surface of the to-be-detected piece, and after the image of the side surface of the to-be-detected piece is obtained, the defect of the side surface of the to-be-detected piece can be detected. In some embodiments, the trigger port of the first shooting assembly 33 is directly connected to the output port of the digital strobe controller 303. In other embodiments, the trigger port of the second shooting assembly 53 is directly connected to the output port of the burst light source controller 305.

The preset time for delaying is preset in the burst light source controller 305, that is, when the relay 301 sends trigger signals to the digital strobe controller 303 and the burst light source controller 305 at the same time, the digital strobe controller 303 immediately triggers the first detection mechanism 30, the burst light source controller 305 needs to record the delay time after receiving the trigger signal, and after the delay time reaches the preset time, the burst light source controller 305 triggers the second detection mechanism 50 again, so that the trigger time of the first detection mechanism 30 and the trigger time of the second detection mechanism 50 are staggered. The first shooting component 33 and the second shooting component 53 both adopt a shooting mode of fly shooting, because the piece to be detected moves relative to the defect detection device 100, and the top of the piece to be detected is more easily quantified, in the shooting process, the influence on the first shooting component 33 is smaller, and the second defect image acquired by the second shooting component 53 has a smear, which has a serious influence on the measurement accuracy of the defect. The conditions that the smear does not affect the fly swatter are as follows: the exposure time multiplied by the object movement speed is less than or equal to the movement direction precision requirement. At a certain speed, the larger the camera exposure time, the more likely the smear will occur. Therefore, in order to make the smear length as short as possible (not more than 1/3 pixel or not more than one pixel, etc.), it is necessary to reduce the camera exposure time and achieve the required image brightness, at this time, for the second detection mechanism 50, the smear length can be shortened by increasing the light source brightness, and in the case that the second illumination assembly 51 is a burst light source, the brightness of the second illumination assembly 51 can meet the requirement so that the accuracy of the obtained defect image of the side surface meets the requirement.

Referring to fig. 8 and 9, a defect detection method according to an embodiment of the present application is applied to the defect detection system 1000 according to any one of the above embodiments, and the defect detection method includes:

01: in the case that the object to be detected moves and reaches the detection position, the control assembly 300 sends out a trigger signal;

03: the first detection mechanism 30 acquires a first defect image of the top of the piece to be detected according to the trigger signal; and

05: After the first defect image is acquired, the second detecting mechanism 50 acquires a second defect image of the side surface of the object to be detected according to the trigger signal.

The object to be detected is an object with a defect to be detected on the surface, and the types of the object to be detected include, but are not limited to, a battery shell, a battery pole, a mechanical part and the like. The material, color, etc. of the member to be detected are not limited. The to-be-detected piece comprises a top and a bottom which are arranged in a reverse way, and side surfaces which encircle the top and the bottom and are respectively connected with the top and the bottom. In the case where the piece to be inspected is placed on the movable platform, the movable platform can be in contact with the bottom of the piece to be inspected to carry the piece to be inspected. Moreover, the movable platform can also drive the to-be-detected piece to move to a position aligned with the first detection mechanism 30 and the second detection mechanism 50 relative to the defect detection device 100, so that the first detection mechanism 30 can correspond to the top of the to-be-detected piece, and the second detection mechanism 50 can correspond to the side of the to-be-detected piece, so as to acquire defect information of the top of the to-be-detected piece and defect information of the side of the to-be-detected piece respectively. Defect information includes, but is not limited to, an image of the defect, a distribution of the defect, a type of the defect, and the like.

The inspection position is a position where the piece to be inspected is aligned with both the first inspection mechanism 30 and the second inspection mechanism 50. In some embodiments, the detection location may be at an intersection of the imaging axis of the first imaging assembly 33 in the first detection mechanism 30 and the imaging axis of at least two oppositely disposed second imaging assemblies 53 in the second detection mechanism 50.

The control assembly 300 includes a relay 301, a digital strobe controller 303, and an explosion flash source controller 305. The trigger signal is a signal sent by the relay 301 to the digital strobe controller 303 and the burst light source controller 305 at the same time, and the trigger signal can control the digital strobe controller 303 and the burst light source controller 305 to be turned on and shoot the part to be detected so as to obtain a first defect image of the top of the part to be detected and/or a second defect image of the side surface of the part to be detected. The first defect image is image information corresponding to defects and non-defects of the top of the piece to be detected, and the second defect image is image information corresponding to defects and non-defects of the side face of the piece to be detected.

The delay time is a preset period of time in the burst light source controller 305, under the condition that the first lighting assembly 31 and the second lighting assembly 51 flash at the same time, the light emitted by the second lighting assembly 51 inevitably irradiates the top surface of the to-be-detected piece, at this time, the instantaneous brightness of the top surface of the to-be-detected piece is too high, the imaging of the top surface of the to-be-detected piece can generate an overexposure phenomenon, and a clear first defect image is difficult to obtain, so that the burst light source controller 305 needs to delay triggering of the second shooting assembly 53 and the second lighting assembly 51 relative to the first shooting assembly 33 and the first lighting assembly 31 through the delay time, so that the detection time of the top surface of the to-be-detected piece and the detection time of the side surface of the to-be-detected piece are staggered, and interference of the two is avoided. Since the delay time is set short, the delay does not affect the second defective image obtained after photographing. Specifically, the preset delay time may be slightly longer than the time required for the first detection mechanism 30 to acquire the first defect image, and after the first detection mechanism 30 acquires the first defect image, the flash source controller 305 can control the second illumination assembly 51 to flash and control the second shooting assembly 53 to shoot so as to acquire the second defect image of the side surface of the object to be detected.

Specifically, referring to fig. 8, 9 and 10, in some embodiments, 03: the first detecting mechanism 30 obtains a first defect image of the top of the part to be detected according to the trigger signal, including:

031: relay 301 sends a trigger signal to digital strobe controller 303;

033: the digital strobe controller 303 controls the first lighting assembly 31 to flash to illuminate the top of the object to be inspected according to the trigger signal; and

035: The digital strobe controller 303 controls the first photographing assembly 33 to photograph the top of the object to be inspected and obtain a first defect image while the first lighting assembly 31 blinks according to the trigger signal.

The digital strobe controller 303 is capable of emitting an illumination signal and a photographing signal. The illumination signal is a signal that the digital strobe controller 303 sends out to the first illumination assembly 31 to cause the first illumination assembly 31 to blink to illuminate the top of the object to be inspected. The photographing signal is a signal that the digital strobe controller 303 sends out to the first photographing assembly 33 to cause the first photographing assembly 33 to start photographing the top of the object to be inspected. The illumination signal and the photographing signal are simultaneously emitted by the digital strobe controller 303, so that the first illumination assembly 31 and the first photographing assembly 33 can be operated simultaneously so that the first defect image can be acquired while the top of the object to be inspected is instantaneously illuminated.

More specifically, referring to fig. 8, 9 and 11, in some embodiments, 05: after the first defect image is acquired, the second detecting mechanism 50 acquires a second defect image of the side surface of the to-be-detected piece according to the trigger signal and the delay time, including:

051: the relay 301 sends a trigger signal to the burst light source controller 305 to cause the burst light source controller 305 to start recording the delay time;

053: in the case that the delay time reaches the preset time of the burst light source controller 305, the burst light source controller 305 controls the second illumination assembly 51 to flash according to the trigger signal to illuminate the side surface of the piece to be detected;

055: the burst light source controller 305 controls the second photographing assembly 53 to photograph the side of the object to be inspected and obtain a second defect image while the second illumination assembly 51 blinks according to the trigger signal.

The burst light source controller 305 can also emit an illumination signal and a photographing signal. The illumination signal is a signal that the burst light source controller 305 emits to the second illumination assembly 51 to flash the second illumination assembly 51 to illuminate the top of the piece to be inspected. The photographing signal is a signal that the burst light source controller 305 sends out to the second photographing assembly 53 to cause the second photographing assembly 53 to start photographing the top of the object to be inspected. Both the illumination signal and the photographing signal are simultaneously emitted from the burst light source controller 305, so that the second illumination assembly 51 and the second photographing assembly 53 can be operated simultaneously, so that the second defect image can be acquired while the top of the object to be inspected is instantaneously illuminated.

Immediately after the relay 301 simultaneously sends out the trigger signal to the digital strobe controller 303 and the burst light source controller 305, the digital strobe controller 303 simultaneously sends out the illumination signal and the photographing signal to the first illumination assembly 31 and the first photographing assembly 33. The burst light source controller 305 can start recording the delay time when receiving the trigger signal, and control the second photographing assembly 53 and the second lighting assembly 51 to delay triggering for a preset time with respect to the first detection mechanism 30 through the delay time. After the delay time reaches the preset time, the second lighting assembly 51 and the second shooting assembly 53 send lighting signals and shooting signals at the same time, so that the detection time of the top of the piece to be detected and the detection time of the side face of the piece to be detected are staggered, and interference of the two is avoided. At this time, the first illumination assembly 31 and the first photographing assembly 33 first acquire a first defect image. After the lapse of the predetermined time, the second illumination assembly 51 blinks to illuminate the side of the object to be inspected, and the second photographing assembly 53 simultaneously starts photographing the side of the object to be inspected, and then acquires the second defect image.

In summary, in the defect detection method of the present application, the first detection mechanism 30 capturing the top of the to-be-detected object flashes to illuminate the top of the to-be-detected object and obtain the first defect image corresponding to the top of the to-be-detected object, and the time delay is set to enable the time for capturing the second detection mechanism 50 capturing the side surface of the to-be-detected object to illuminate the side surface of the to-be-detected object to be staggered from the time for the first detection mechanism 30 flashing to illuminate the top of the to-be-detected object, so as to avoid overexposure of the surface of the to-be-detected object, and the obtained defect image is clearer.

In the description of the present specification, reference to the terms "certain embodiments," "in one example," "illustratively," and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiments or examples is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.

While embodiments of the present application have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the application, and that variations, modifications, alternatives and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the application.

Claims (14)

1. A defect detection apparatus, comprising:

The bracket mechanism comprises a first bracket component and a second bracket component, and the second bracket component is arranged on the first bracket component;

The first detection mechanism is movably arranged on the first bracket component and faces to the top of the to-be-detected piece, the first detection mechanism is used for detecting defects of the top of the to-be-detected piece, and the first detection mechanism comprises a first illumination component which is used for flashing and illuminating the top of the to-be-detected piece; the first illumination assembly comprises a coaxial light source and an annular AOI light source which are coaxially arranged; and

The second detection mechanism is movably arranged on the first bracket component and the second bracket component and faces to the side face of the to-be-detected piece, and the second detection mechanism is used for detecting the defect of the side face of the to-be-detected piece.

2. The defect inspection apparatus of claim 1 wherein the first bracket assembly defines a receiving space, the first illumination assembly being movably mounted to the first bracket assembly and disposed within the receiving space; the first detection mechanism further includes:

the first shooting assembly is movably arranged on the first bracket assembly, the first shooting assembly is coaxial with the first illumination assembly, and part of the structure of the first shooting assembly corresponds to the top of the piece to be detected through the first illumination assembly.

3. The defect detection apparatus of claim 2, wherein the first detection mechanism further comprises:

The first adjusting component is installed in the first shooting component, the first adjusting component is used for adjusting the relative position between the first shooting component and the first bracket component along a first direction and a second direction, the first direction is parallel to the central axis of the first lighting component, and the first direction is perpendicular to the second direction.

4. The defect detection apparatus of claim 2, wherein the first bracket assembly comprises:

The first shooting assembly is arranged on the first side of the mounting plate and corresponds to the abdication hole; and

The support arm is installed in the mounting panel and stretches into the hole of stepping down, the first lighting assembly is installed in the support arm, and the first lighting assembly with the hole of stepping down corresponds.

5. The defect detection apparatus of claim 4, wherein the support arm comprises a first portion and a second portion, the first portion being secured to the mounting plate, the second portion being movably disposed on the first portion, the first lighting assembly being mounted to the second portion; the first lighting assembly moves in a first direction relative to the mounting plate with the second portion moving in the first direction relative to the first portion.

6. The defect detection apparatus of claim 4, wherein the second detection mechanism comprises:

The second illumination assemblies are arranged on the second bracket assemblies and correspond to at least one side face of the to-be-detected piece, and the second illumination assemblies are used for flashing and illuminating the side face corresponding to the to-be-detected piece; and

The second shooting assemblies are movably arranged on the second bracket assembly, and each second shooting assembly is located between two second illumination assemblies which are adjacently arranged so as to correspond to two connected side surfaces of the to-be-detected piece.

7. The defect detection apparatus of claim 6, wherein the second detection mechanism further comprises:

The second adjusting component is installed on the second shooting component and used for adjusting the relative position between the second shooting component and the second bracket component along a third direction and a fourth direction, and the third direction is perpendicular to the fourth direction.

8. The defect detection apparatus of claim 6, wherein the second bracket assembly comprises:

The second lighting component is movably arranged on any side wall of the mounting frame along the first direction and faces the side face of the to-be-detected piece; and

The first bracket component comprises a mounting plate, the supporting frame is connected with the mounting plate and located on the second side of the mounting plate, and the second shooting component is movably arranged on the supporting frame.

9. The defect inspection apparatus of claim 8, wherein the support frame is provided with a first adjustment slot, and the second photographing assembly is configured to move along the first adjustment slot to adjust an angle between a photographing axis of the second photographing assembly and a side of the part to be inspected; the mounting plate is provided with a second adjusting groove, and the support frame is used for moving along the second adjusting groove so as to adjust the distance between the second shooting assembly and the to-be-detected piece.

10. A defect detection system, comprising:

The defect detecting apparatus according to any one of claims 1 to 9; and

The control assembly is electrically connected with the first detection mechanism and the second detection mechanism of the defect detection device and is used for controlling the first detection mechanism to detect defects on the top of the to-be-detected piece under the condition that the to-be-detected piece moves and passes through the detection position of the defect detection device; and controlling the second detection mechanism to detect the defects of the side surface of the piece to be detected after the detection of the first detection mechanism is finished.

11. The defect detection system of claim 10, wherein the first detection mechanism comprises a first illumination assembly and a first capture assembly, and the second detection mechanism comprises a second illumination assembly and a second capture assembly; the control assembly includes:

the relay is used for sending a trigger signal when the to-be-detected piece moves and passes through the detection position of the defect detection device;

The digital strobe controller is electrically connected with the relay, the first lighting assembly and the first shooting assembly, and a trigger port of the first shooting assembly is directly connected with an output port of the digital strobe controller; the digital strobe controller is used for receiving a trigger signal to control the first lighting component to flash to illuminate the top of the piece to be detected and control the first shooting component to shoot an image of the top of the piece to be detected so as to detect the defect of the top of the piece to be detected; and

The explosion flash source controller is electrically connected with the relay, the second lighting assembly and the second shooting assembly, and a trigger port of the second shooting assembly is directly connected with an output port of the explosion flash source controller; the explosion flash source controller is used for receiving the trigger signal and controlling the second lighting component to flash to illuminate the side face of the to-be-detected piece after the first detection mechanism finishes detecting, and controlling the second shooting component to shoot an image of the side face of the to-be-detected piece so as to detect the defect of the side face of the to-be-detected piece.

12. A defect detection method applied to the defect detection system according to any one of claims 10 to 11, comprising:

under the condition that the to-be-detected piece moves and reaches the detection position, the control component sends out a trigger signal;

The first detection mechanism acquires a first defect image of the top of the piece to be detected according to the trigger signal; and

After the first defect image is acquired, the second detection mechanism acquires a second defect image of the side face of the to-be-detected piece according to the trigger signal.

13. The defect detection method of claim 12, wherein the first detection mechanism comprises a first illumination assembly and a first photographing assembly, and the control assembly comprises a relay and a digital strobe controller electrically connected to each other; the first detection mechanism acquires a first defect image of the top of the piece to be detected according to the trigger signal, and the first detection mechanism comprises:

The relay sends the trigger signal to the digital strobe controller;

The digital strobe controller controls the first lighting assembly to flash according to the trigger signal so as to illuminate the top of the piece to be detected; and

And the digital strobe controller controls the first shooting assembly to shoot the top of the piece to be detected and obtain the first defect image while the first lighting assembly flashes according to the trigger signal.

14. The defect detection method of claim 12, wherein the second detection mechanism comprises a second illumination assembly and a second shooting assembly, and the control assembly comprises a relay and an explosion flash source controller electrically connected to each other; after the first defect image is acquired, the second detection mechanism acquires a second defect image of the side surface of the to-be-detected piece according to the trigger signal, and the second detection mechanism comprises:

The relay sends the trigger signal to the explosion flash source controller so that the explosion flash source controller starts to record delay time;

When the delay time reaches the preset time of the explosion flash source controller, the explosion flash source controller controls the second lighting assembly to flash according to the trigger signal so as to illuminate the side face of the piece to be detected; and

And the explosion flash source controller controls the second shooting component to shoot the side face of the to-be-detected piece and obtain the second defect image when the second lighting component flickers according to the trigger signal.