CN117871425A - Target short wave infrared full polarization characteristic measuring device and method for thermal radiation effect - Google Patents
Target short wave infrared full polarization characteristic measuring device and method for thermal radiation effect Download PDFInfo
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Abstract
The utility model provides a target short wave infrared full polarization characteristic measuring device and method of thermal radiation effect, belongs to polarization detection technical field, has solved prior art and has lacked in different environment thermal radiation ratio, utilizes the full polarization characteristic of short wave infrared to carry out the technical problem of target detection and discernment. The regulating device, the light source emitting device, the image acquisition device and the high-temperature heating table are all arranged in the incubator; the transmitting end guide rail and the receiving end guide rail are arc-shaped and are oppositely arranged, the transmitting end guide rail is used for fixing a light source transmitting device, the light source transmitting device is connected with a first driving motor, the receiving end guide rail is used for fixing an image acquisition device, and the image acquisition device is connected with a second driving motor; the tunable laser source and the attenuation sheet are coaxially arranged; the short-wave infrared full-automatic polaroid, the cage-type optical filter wheel and the short-wave infrared camera are coaxially arranged in sequence; the first driving motor and the second driving motor are both connected with the computer, and the short-wave infrared camera is in bidirectional communication with the computer.
Description
Technical Field
The invention relates to the technical field of polarization detection, in particular to a target shortwave infrared full polarization characteristic measuring device and method of a thermal radiation effect.
Background
The traditional short wave infrared polarization imaging device only distinguishes natural features and artifacts by a method of analyzing the polarization characteristics of the targets under specific background radiation, and has the defect of the target identification capability in environments with more complex conditions in face of changeable environmental heat radiation.
At present, a short wave infrared focal plane detector is provided with a corresponding polarized optical system, so that a time-sharing, aperture-dividing and amplitude-dividing polarized imaging mode can be realized, and the research on the influence of the environment and the target thermal radiation effect on the target polarization characteristic is relatively blank. Meanwhile, a sub-focal plane polarization imaging system in which micro-nano polarization elements are directly integrated in a focal plane array is greatly developed, but most of researches are still focused in a visible light range, meanwhile, the structure is complex, and the extinction ratio and the transmissivity of the imaging mode are required to be improved due to processing errors and great light loss of the polarization elements. Particularly, the polarization extinction ratio is used as a key index of a polarization imaging system, and the polarization detection capability, the anti-interference capability and the utilization efficiency of polarization information of the system are directly determined. Therefore, the design of the time-sharing full-polarization full-automatic imaging device based on the heat radiation effect, the structural design is simple, and the extinction ratio is high in consideration of the three angles of the comprehensive system structural complexity, the working temperature requirement and the extinction ratio requirement.
The ambient heat radiation ratio is the ratio of the ambient heat radiation intensity to the target spontaneous heat radiation intensity, and the macroscopic can be represented as the ratio of the ambient temperature to the target temperature. Because the environment thermal radiation can influence the infrared polarization characteristics of the targets, along with diversification and complicacy of the polarization detection environment, certain key equipment is often influenced by the environment thermal radiation, and further the infrared polarization detection work is easily disturbed, so that in different environment thermal radiation, the analysis of the full polarization characteristics of the targets in different environments by utilizing the thermal radiation effect has an important effect.
In summary, the prior art lacks a technology for detecting and identifying targets by utilizing the full polarization characteristic of short wave infrared in different environmental heat radiation ratios.
Disclosure of Invention
The invention solves the problem that the prior art lacks the technology of detecting and identifying the target by utilizing the full polarization characteristic of short wave infrared in different environmental heat radiation ratios.
The invention relates to a target short wave infrared full polarization characteristic measuring device of a heat radiation effect, which comprises an incubator, a regulating device, a light source emitting device, an image acquisition device, a high-temperature heating table and a computer, wherein the incubator is used for measuring the target short wave infrared full polarization characteristic of the heat radiation effect;
the regulating and controlling device comprises a transmitting end guide rail, a receiving end guide rail, a first driving motor and a second driving motor;
the light source emitting device comprises a tunable laser light source and an attenuation sheet;
the image acquisition device comprises a short-wave infrared full-automatic polaroid, a cage-type optical filter wheel and a short-wave infrared camera;
the regulating and controlling device, the light source emitting device, the image acquisition device and the high-temperature heating table are all arranged in the constant temperature box;
the transmitting end guide rail and the receiving end guide rail are arc-shaped and are oppositely arranged, the transmitting end guide rail is used for fixing a light source transmitting device, the light source transmitting device is connected with a first driving motor, the receiving end guide rail is used for fixing an image acquisition device, and the image acquisition device is connected with a second driving motor;
the tunable laser source and the attenuation sheet are coaxially arranged;
the short-wave infrared full-automatic polaroid, the cage-type optical filter wheel and the short-wave infrared camera are coaxially arranged in sequence;
the first driving motor and the second driving motor are connected with the computer, and the short-wave infrared camera is in bidirectional communication with the computer;
the diameter of the attenuation sheet is 7 mm-9 mm, the thickness is 1 mm-1.2 mm, and the light transmittance is 35%;
the diameter of the short-wave infrared full-automatic polaroid is 24-26 mm, the light transmission caliber is 18-20 mm, the light transmittance is more than 75%, and the wavelength of the short-wave infrared full-automatic polaroid is 0.8-1.7 mu m.
Further, in one embodiment of the present invention, the tunable laser source has a pulse width of 5ns, a repetition rate of 100Hz, an output of 410nm to 2300nm, and a linewidth of 6cm -1 Is a light source, and is a light source.
Further, in one embodiment of the present invention, the cage filter wheel is provided with 6 filters, and the center wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm, respectively.
Further, in one embodiment of the present invention, the spectrum of the short wave infrared camera is 0.4 μm to 1.7 μm.
Further, in one embodiment of the present invention, the temperature of the high temperature heating stage ranges from room temperature to 700 ℃.
The invention relates to a method for measuring the target short-wave infrared full polarization characteristic of a thermal radiation effect, which is realized by adopting the device for measuring the target short-wave infrared full polarization characteristic of the thermal radiation effect in the method, and comprises the following steps:
s1, after light intensity of light emitted by a tunable laser source is attenuated by an attenuation sheet, the light enters a target positioned on a high-temperature heating table;
step S2, stabilizing the incubator at-70-150 ℃, adjusting the light source emitting device to 10-70 degrees through a first driving motor, and adjusting the image acquisition device to 10-90 degrees through a second driving motor;
s3, polarizing the light reflected by the target on the high-temperature heating table in the polarization directions of 0 DEG, 60 DEG and 120 DEG through a short-wave infrared full-automatic polarizer;
s4, obtaining light with a required wavelength through a filter of the cage filter wheel by the light polarized by the short-wave infrared full-automatic polaroid, so that the light with the required wavelength enters a short-wave infrared camera for imaging;
step S5, changing the filter of the cage type filter wheel, and repeating the operations from step S1 to step S4 until the target completes imaging of 6 filters;
step S6, changing the temperature of the incubator and the angles of the light source emitting device and the image acquisition device respectively, and repeating the operations from step S2 to step S5;
and S7, extracting gray values of the short-wave infrared intensity images of different angles, different temperatures and the same target in the polarization directions of 0 DEG, 60 DEG and 120 DEG, which are acquired by the short-wave infrared camera, through a computer, and calculating the polarization degree according to the gray values.
The invention solves the problem that the prior art lacks the technology of detecting and identifying the target by utilizing the full polarization characteristic of short wave infrared in different environmental heat radiation ratios. The method has the specific beneficial effects that:
1. the invention relates to a target short wave infrared full polarization characteristic measuring device of thermal radiation effect, which is used for realizing acquisition of target short wave infrared intensity images with different radiation ratios and acquisition of polarization information under different observation angles through mutual allocation among a constant temperature box, a regulating device, a light source emitting device, an image acquisition device, a high temperature heating table and a computer, thereby solving the problem that the prior art lacks a device for detecting and identifying targets by utilizing the full polarization characteristic of the short wave infrared in different environmental thermal radiation ratios;
2. according to the method for measuring the target short-wave infrared full polarization characteristic of the thermal radiation effect, provided by the invention, the target short-wave infrared intensity images with different radiation ratios under different observation angles are rapidly acquired and the polarization information is acquired, so that the measurement time is saved, and the influence caused by solar motion and weather change during outdoor measurement of a short-wave infrared test is compensated.
Drawings
The foregoing and/or additional aspects and advantages of the invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a block diagram of an overall structure of a target short-wave infrared full polarization characteristic measurement device for thermal radiation effect according to an embodiment;
FIG. 2 is a view showing an internal structure of an incubator according to the first embodiment;
in the figure, 1 is a constant temperature box, 21 is a transmitting end guide rail, 22 is a receiving end guide rail, 23 is a first driving motor, 24 is a second driving motor, 3 is a light source transmitting device, 31 is a tunable laser light source, 32 is an attenuation sheet, 4 is an image acquisition device, 41 is a short wave infrared full-automatic polaroid, 42 is a cage type optical filter wheel, 43 is a short wave infrared camera, 5 is a high temperature heating table, and 6 is a computer.
Detailed Description
Various embodiments of the present invention will now be described more fully hereinafter with reference to the accompanying drawings. The embodiments described by referring to the drawings are exemplary and intended to be illustrative of the invention and are not to be construed as limiting the invention.
The device for measuring the target short wave infrared full polarization characteristic of the heat radiation effect comprises an incubator 1, a regulating and controlling device, a light source emitting device 3, an image acquisition device 4, a high-temperature heating table 5 and a computer 6;
the regulating and controlling device comprises a transmitting end guide rail 21, a receiving end guide rail 22, a first driving motor 23 and a second driving motor 24;
the light source emitting device 3 comprises a tunable laser light source 31 and an attenuation sheet 32;
the image acquisition device 4 comprises a short-wave infrared full-automatic polaroid 41, a cage-type optical filter wheel 42 and a short-wave infrared camera 43;
the regulating and controlling device, the light source emitting device 3, the image acquisition device 4 and the high-temperature heating table 5 are all arranged in the incubator 1;
the transmitting end guide rail 21 and the receiving end guide rail 22 are arc-shaped and are oppositely arranged, the transmitting end guide rail 21 is used for fixing the light source transmitting device 3, the light source transmitting device 3 is connected with the first driving motor 23, the receiving end guide rail 22 is used for fixing the image acquisition device 4, and the image acquisition device 4 is connected with the second driving motor 24;
the tunable laser source 31 and the attenuation sheet 32 are coaxially arranged;
the short-wave infrared full-automatic polaroid 41, the cage-type optical filter wheel 42 and the short-wave infrared camera 43 are coaxially arranged in sequence;
the first driving motor 23 and the second driving motor 24 are connected with the computer 6, and the short-wave infrared camera 43 is in bidirectional communication with the computer 6;
the diameter of the attenuation sheet 32 is 7 mm-9 mm, the thickness is 1 mm-1.2 mm, and the light transmittance is 35%;
the diameter of the short-wave infrared full-automatic polaroid 41 is 24 mm-26 mm, the light transmission caliber is 18-20 mm, the light transmittance is more than 75%, and the wavelength of the short-wave infrared full-automatic polaroid 41 is 0.8-1.7 mu m.
In the prior art, most of split focal plane polarization imaging systems which directly integrate micro-nano polarization elements in a focal plane array still focus on a visible light range, meanwhile, the structure is complex, and the extinction ratio and the transmissivity of the imaging mode are required to be improved due to processing errors and great light loss of the polarization elements. Moreover, the equipment is often affected by environmental thermal radiation, and interference is easily caused when infrared polarization detection work is carried out. Therefore, the design of the time-sharing full-polarization full-automatic imaging device based on the heat radiation effect is urgent.
In order to solve the technical problems, as shown in fig. 1 and 2, the present embodiment designs a target short wave infrared full polarization characteristic measuring device of heat radiation effect, wherein the device comprises an incubator 1, a regulating device, a light source emitting device 3, an image acquisition device 4, a high temperature heating table 5 and a computer 6;
the regulating and controlling device, the light source emitting device 3, the image acquisition device 4 and the high-temperature heating table 5 are all arranged in the incubator 1;
the incubator 1 is sized to accommodate access by a researcher for performing certain experiments or operations that need to be performed at a stable temperature and humidity, the incubator 1 being configured to maintain an ambient radiation temperature;
the regulating and controlling device comprises a transmitting end guide rail 21, a receiving end guide rail 22, a first driving motor 23 and a second driving motor 24, wherein the transmitting end guide rail 21 is used for fixing the light source transmitting device 3, the transmitting end guide rail 21 is mechanically connected with the light source transmitting device 3, the light source transmitting device 3 is regulated to be in an angle position in real time by the first driving motor 23, the receiving end guide rail 22 is used for fixing the image acquisition device 4, the receiving end guide rail 22 is mechanically connected with the image acquisition device 4, and the image acquisition device 4 is regulated to be in an angle position in real time by the second driving motor 24;
the light source emitting device 3 comprises a tunable laser source 31 and an attenuation sheet 32, the optical axes of the tunable laser source 31 and the attenuation sheet 32 are in the same straight line, the attenuation sheet 32 is positioned on the emergent light path of the tunable laser source 31, and the tunable laser source 31 is used for emitting light which is attenuated by the attenuation sheet 32 and then enters the center of a target;
the image acquisition device 4 comprises a short-wave infrared full-automatic polaroid 41, a cage-type optical filter wheel 42 and a short-wave infrared camera 43, wherein the short-wave infrared full-automatic polaroid 41, the cage-type optical filter wheel 42 and the short-wave infrared camera 43 are sequentially fixed on the receiving end guide rail 22 from bottom to top, and meanwhile, the optical axes of the three are on the same straight line, the short-wave infrared full-automatic polaroid 41 is used for acquiring light rays with the polarization directions of 0 DEG, 60 DEG and 120 DEG reflected by a target, the cage-type optical filter wheel 42 is used for acquiring light rays with different wavelengths for subsequent imaging, and the short-wave infrared camera 43 is used for imaging the intensity of the target with corresponding angles, wavelengths and polarization directions;
the high-temperature heating table 5 is used for controlling the target temperature and the spontaneous radiation intensity;
the computer 6 is used for controlling the first driving motor 23 and the second driving motor 24, processing the images of the image acquisition device 4 for resolving analysis, the image acquisition device 4 is in bidirectional communication connection with the computer 6, the image acquisition device 4 acquires short-wave infrared intensity images of polarization angles of 0 DEG, 60 DEG and 120 DEG of targets, and the short-wave infrared intensity images of the targets are input to the computer 6;
the device can achieve the purposes of acquiring target shortwave infrared intensity images with different radiation ratios and acquiring polarization information under different observation angles.
In the present embodiment, the diameter of the attenuation sheet 32 is 8mm, the thickness is 1.1mm, and the light transmittance is 35%.
In this embodiment, the short-wave infrared full-automatic polarizing plate 41 is a full-automatic polarizing plate, the size diameter is 25mm, the light transmission aperture is 19mm, the light transmittance is more than 75%, the transmission wavelength can be limited to 0.8 μm to 1.7 μm, and the operating temperature range is-40 ℃ to 93 ℃.
In the second embodiment, the present embodiment is further defined by the target short-wave infrared full polarization characteristic measuring device for thermal radiation effect according to the first embodiment, wherein the tunable laser source 31 has a pulse width of 5ns, a repetition frequency of 100Hz, an output of 410nm to 2300nm, and a line width of 6cm -1 Is a light source, and is a light source.
In the present embodiment, the tunable laser source 31 is a high-energy tunable nanosecond laser, the pulse width is 5ns, the repetition frequency can reach 100Hz, the tunable nanosecond laser outputs 410nm to 2300nm by using an OPO (optical parametric oscillation) mode, and the line width is about 6cm -1 Is a light source, and is a light source.
In the third embodiment, the device for measuring the full polarization characteristic of the target short wave infrared of the heat radiation effect in the first embodiment is further limited, and 6 filters are placed on the cage filter wheel 42, and the center wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm, respectively.
In this embodiment, the cage filter wheel 42 has 6 positions where 1 inch of filters can be fixed, and 6 filters are placed in the cage filter wheel 42, and the center wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm, and 1500nm, respectively.
In the fourth embodiment, the present embodiment is further limited to the target short-wave infrared full polarization characteristic measuring apparatus for thermal radiation effect according to the first embodiment, and the spectrum band of the short-wave infrared camera 43 is 0.4 μm to 1.7 μm.
In this embodiment, the short-wave infrared camera 43 is a wide-spectrum short-wave infrared array camera, the resolution can reach 1280×1024, the spectrum is 0.4 μm-1.7 μm, and the exposure time is adjustable.
In a fifth embodiment, the present embodiment is a further limitation of the apparatus for measuring the target short-wave infrared full polarization characteristic of the heat radiation effect according to the first embodiment, wherein the temperature of the high-temperature heating stage 5 is in a range of room temperature to 700 ℃.
In the present embodiment, the high-temperature heating stage 5 is a precision constant-temperature heating stage, the temperature control range is room temperature (generally defined as 25 ℃ C.) to 700 ℃ C., the temperature resolution is 0.1 ℃ C., the temperature control accuracy is + -1%. C., the power supply voltage is AC220V (50 Hz), and the power is 600W.
The method for measuring the full polarization characteristic of the target short wave infrared of the thermal radiation effect according to the sixth embodiment is realized by the full polarization characteristic measuring device of the target short wave infrared of the thermal radiation effect according to any one of the first to fifth embodiments, and comprises the following steps:
step S1, after the light emitted by the tunable laser source 31 is attenuated by the attenuation sheet 32, the light is incident on a target positioned on the high-temperature heating table 5;
step S2, stabilizing the incubator at-70-150 ℃, adjusting the light source emitting device to 10-70 degrees through a first driving motor, and adjusting the image acquisition device to 10-90 degrees through a second driving motor;
step S3, the light reflected by the target on the high-temperature heating table 5 is polarized in the polarization directions of 0 DEG, 60 DEG and 120 DEG through the short-wave infrared full-automatic polaroid 41;
step S4, the light polarized by the short-wave infrared full-automatic polaroid 41 passes through the filter of the cage filter wheel 42 to obtain the light with the required wavelength, so that the light with the required wavelength enters the short-wave infrared camera 43 for imaging;
step S5, changing the filter of the cage filter wheel 42, and repeating the operations of the steps S1 to S4 until the target completes the imaging of 6 filters;
step S6, changing the temperature of the incubator 1 and the angles of the light source emitting device 3 and the image acquisition device 4 respectively, and repeating the operations from step S3 to step S5;
in step S7, the computer 6 extracts gray values of the short-wave infrared intensity images of the targets with different angles, different temperatures and polarization directions of 0 °, 60 ° and 120 ° obtained by the short-wave infrared camera 43, and calculates the polarization degree according to the gray values.
The embodiment designs a target short wave infrared full polarization characteristic measurement method of a heat radiation effect, and the method comprises the following steps:
step S1, adjusting the relative positions of a transmitting end guide rail 21, a target and a receiving end guide rail 22, and simultaneously enabling a tunable laser light source 31 and an attenuation sheet 32 to be in the same light path, wherein a short-wave infrared full-automatic polaroid 41, a cage-type optical filter wheel 42 and a short-wave infrared camera 43 are in the same light path;
step S2, placing the target in the center of the high-temperature heating table 5, starting the tunable laser source 31, and ensuring that the light emitted by the tunable laser source 31 irradiates the center of the target;
step S3, adjusting the power of the incubator 1 so that the interior of the incubator 1 is stabilized at a required temperature;
step S4, the short-wave infrared camera 43 is started, the light source emitting device 3 is driven to a required angle through the first driving motor 23, and the image acquisition device 4 is driven to a required angle through the second driving motor 24;
step S5, after the light emitted by the tunable laser source 31 irradiates the center of the target, the light is reflected at the center of the target, and the polarization of the reflected light of the target in the polarization directions of 0 DEG, 60 DEG and 120 DEG is realized by adjusting the short-wave infrared full-automatic polaroid 41 through a built-in motor in the short-wave infrared full-automatic polaroid 41;
step S6, a filter with a required wavelength is arranged on a reflection light path through the cage-type filter wheel 42, and the light with the wavelength enters the short-wave infrared camera 43 for imaging;
step S7, changing the filter of the cage filter wheel 42, and repeating the operations from step S2 to step S6 until the image acquisition of the target 6 wavelengths is completed;
step S8, changing the temperature of the incubator 1 in step S3 and the angles of the light source emitting device 3 and the image acquisition device 4 in step S4 respectively, and repeating the operations of step S3 to step S7;
step S9, gray value extraction is performed on the short-wave infrared intensity images of different angles and different temperature targets obtained by the short-wave infrared camera 43 through gray value calculation software in the computer 6, wherein the specific gray value extraction flow is as follows: and carrying out frame selection on an intensity image of a certain polarization angle of the target, obtaining an average gray value of each pixel point of a frame selection part, obtaining image gray values of three polarization angles of 0 degree, 60 degrees and 120 degrees at the same moment, forming a polarization degree image by the three polarization angle images, and further carrying out polarization degree calculation on the polarization degree image.
In the present embodiment, the influence of the environmental heat radiation on the full polarization characteristic of the target infrared is explored by controlling the environmental radiation intensity and the target spontaneous radiation intensity by adopting the incubator 1 and the high-temperature workbench 5;
in the step S9, doLP Actual measurement The specific calculation formula of (polarization degree) is:
obtaining short-wave infrared intensity image gray values of three polarization angles of 0 degree, 60 degrees and 120 degrees respectively as a, b and c through gray value calculation software;
。
the method can be used for rapidly acquiring target short-wave infrared intensity images with different radiation ratios and acquiring polarization information under different high angles, so that the measurement time is saved, and the influence caused by solar motion and weather change during outdoor measurement of a short-wave infrared test is made up.
In the present embodiment, the incubator 1 is a walk-in type constant temperature and humidity incubator, the temperature range is-70 ℃ to 150 ℃, the control accuracy is the temperature + -2.0 ℃, and the temperature setting accuracy, the indication accuracy and the analysis accuracy are all + -0.1 ℃.
In this embodiment, the angle range of the light source emitting device 3 is adjusted from 10 ° to 70 ° by the emitting end rail 21, and the angle range of the image pickup device 4 is adjusted from 10 ° to 90 ° by the receiving end rail 22.
The specific working principle of the image acquisition device 4 is as follows:
the computer 6 controls the second driving motor 24 to drive the image acquisition device 4 to slide on the receiving end guide rail 22, the sliding angle range is 10-90 degrees, the precision is 0.5 degrees, and further, short-wave infrared intensity images with different observing height angles and different wavelengths are acquired through the polarization of the short-wave infrared full-automatic polaroid 41 and the cage-type filter wheel 42.
In order to better illustrate the method for measuring the target short-wave infrared full polarization characteristic of the thermal radiation effect described in the application, the following examples are used for detailed description:
the method comprises the steps of taking a magnesium alloy plate as a study object, placing the magnesium alloy plate in the center of a high-temperature heating table 5, driving an incidence height angle of a light source emitting device 3 by taking 10 degrees as a starting point and 70 degrees as an end point and taking 2 degrees as an interval, driving a total of 31 incidence height angles by taking 10 degrees as a starting point and 90 degrees as an end point and taking 2 degrees as an interval, driving 41 total observation height angles by taking the image collecting device 4 as an interval, and obtaining three angles of 0 degree, 60 degrees and 120 degrees of polarization directions, wherein a cage type filter wheel is provided with a filter with 6 wavelengths, so that images of the same object under the same heat radiation effect are 31 x 41 x 3 x 6= 22878, and three angles of 0 degree, 60 degree and 120 degree at the same moment form a polarized image, and 7626 total polarized degree values;
in order to facilitate the analysis of polarization characteristics, for a rough surface, the included angle between a micro-surface element and the normal diameter of a macroscopic surface of a target is assumed to be smaller, and only the incident light ray and the reflected light ray on the same plane are considered, and the linear polarization degree DoLP of the target is calculated according to the following formula:
；
in the method, in the process of the invention,depending on the ambient radiation ratio, it is regulated by changing the oven temperature and the high temperature heating stage temperature, R S And R is R P Reflectivity of the fresnel vertical component and the parallel component,/->For measuring the roughness of the object by means of a confocal laser microscope,/-> i Is a vertex angle of a light source emitting device;
wherein,，/>the solving formula is as follows:
in the method, in the process of the invention,is refraction angle>Refractive index of air>Is the target medium refractive index.
In order to better illustrate the method for measuring the target short-wave infrared full polarization characteristic of the thermal radiation effect described in the application, the following examples are used for detailed description:
model simulation is carried out through MATLAB (matrix factory) software, and DoLP (matrix factory) obtained through results of target short-wave infrared full-polarization characteristic measurement method adopting heat radiation effect in the embodiment mode Actual measurement Comparing, and analyzing the influence of different environmental radiation ratios on the full polarization characteristic of the target;
in order to more intuitively reflect the accuracy of the simulation value and the actual measurement value, the deviation between the simulation value and the actual measurement value is measured by adopting RMSE (root mean square error), and the smaller the numerical value is, the higher the model accuracy is, and the expression is as follows:
in the method, in the process of the invention,for the number of experiments, i=1, 2,3, … n, where n is the number of measurements and i is the deviation of a simulation value from an actual measurement value.
TABLE 1
The calculation results are shown in table 1, in which RMSE1 is a traditional model simulation, RMSE2 is a target short wave infrared full polarization characteristic measurement method adopting the heat radiation effect described in this embodiment, and the percentage is the decreasing proportion of the RMSE2 value relative to the RMSE1 value in this embodiment, and the greater the percentage, the greater the accuracy improvement and the more accurate. From the data in the table, the root mean square error value of the model established in the embodiment is smaller, the error of the model is reduced by at least 47.57%, the reduction percentage of the data precision of the surface model of the 99 alumina ceramic plate material reaches 71.19%, the reduction amplitude is maximum, and the method for measuring the target short wave infrared full polarization characteristic by adopting the heat radiation effect in the embodiment is higher in model precision and better in fitting effect.
The above describes the target short wave infrared full polarization characteristic measuring device and method of the heat radiation effect provided by the invention in detail, and specific examples are applied to the principle and implementation of the invention, and the description of the above examples is only used for helping to understand the method and core idea of the invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present invention, the present description should not be construed as limiting the present invention in view of the above.
Claims (6)
1. The target short wave infrared full polarization characteristic measuring device of the heat radiation effect is characterized by comprising an incubator (1), a regulating and controlling device, a light source emitting device (3), an image acquisition device (4), a high-temperature heating table (5) and a computer (6);
the regulating and controlling device comprises a transmitting end guide rail (21), a receiving end guide rail (22), a first driving motor (23) and a second driving motor (24);
the light source emitting device (3) comprises a tunable laser light source (31) and an attenuation sheet (32);
the image acquisition device (4) comprises a short-wave infrared full-automatic polaroid (41), a cage-type optical filter wheel (42) and a short-wave infrared camera (43);
the regulating device, the light source emitting device (3), the image acquisition device (4) and the high-temperature heating table (5) are all arranged in the constant temperature box (1);
the transmitting end guide rail (21) and the receiving end guide rail (22) are arc-shaped and are oppositely arranged, the transmitting end guide rail (21) is used for fixing the light source transmitting device (3), the light source transmitting device (3) is connected with the first driving motor (23), the receiving end guide rail (22) is used for fixing the image acquisition device (4), and the image acquisition device (4) is connected with the second driving motor (24);
the tunable laser source (31) and the attenuation sheet (32) are coaxially arranged;
the short-wave infrared full-automatic polaroid (41), the cage-type optical filter wheel (42) and the short-wave infrared camera (43) are coaxially arranged in sequence;
the first driving motor (23) and the second driving motor (24) are connected with the computer (6), and the short-wave infrared camera (43) is in bidirectional communication with the computer (6);
the diameter of the attenuation sheet (32) is 7-9 mm, the thickness is 1-1.2 mm, and the light transmittance is 35%;
the diameter of the short-wave infrared full-automatic polaroid (41) is 24-mm-26 mm, the light transmission caliber is 18-20 mm, the light transmittance is more than 75%, and the wavelength of the short-wave infrared full-automatic polaroid (41) is 0.8-1.7 mu m.
2. The device for measuring the full polarization characteristic of the short wave infrared target for the thermal radiation effect according to claim 1, wherein the tunable laser source (31) has a pulse width of 5ns, a repetition frequency of 100Hz, an output of 410nm to 2300nm, and a line width of 6cm -1 Is a light source, and is a light source.
3. The device for measuring the full polarization characteristics of the short wave infrared target for the thermal radiation effect according to claim 1, wherein 6 filters are placed on the cage filter wheel (42), and the center wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm, respectively.
4. The device for measuring the full polarization characteristics of the short-wave infrared target for the thermal radiation effect according to claim 1, wherein the spectrum of the short-wave infrared camera (43) is 0.4 μm to 1.7 μm.
5. The device for measuring the full polarization characteristic of the target short wave infrared of the thermal radiation effect according to claim 1, wherein the temperature of the high temperature heating table (5) ranges from room temperature to 700 ℃.
6. A method for measuring the full polarization characteristics of the target short wave infrared of the thermal radiation effect, which is realized by adopting the full polarization characteristics measuring device for the target short wave infrared of the thermal radiation effect according to any one of claims 1 to 5, and is characterized by comprising the following steps:
step S1, light emitted by a tunable laser source (31) is attenuated by an attenuation sheet (32) and then enters a target positioned on a high-temperature heating table (5);
step S2, stabilizing the incubator at-70-150 ℃, adjusting the light source emitting device to 10-70 degrees through a first driving motor, and adjusting the image acquisition device to 10-90 degrees through a second driving motor;
s3, the light reflected by the target on the high-temperature heating table (5) is polarized in the polarization directions of 0 DEG, 60 DEG and 120 DEG through the short-wave infrared full-automatic polaroid (41);
s4, obtaining light with a required wavelength through a filter of a cage filter wheel (42) by the light polarized by the short-wave infrared full-automatic polaroid (41), so that the light with the required wavelength enters a short-wave infrared camera (43) for imaging;
step S5, changing the filter of the cage type filter wheel (42), and repeating the operations of the steps S1 to S4 until the target finishes imaging of 6 filters;
step S6, changing the temperature of the incubator (1) and the angles of the light source emitting device (3) and the image acquisition device (4) respectively, and repeating the operations from step S2 to step S5;
and S7, carrying out gray value extraction on the short-wave infrared intensity images of different angles, different temperatures and the same targets in the polarization directions of 0 DEG, 60 DEG and 120 DEG acquired by a short-wave infrared camera (43) through a computer (6), and calculating the polarization degree according to the gray values.
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