CN117761502A - Method and device for verifying quality of board card, electronic equipment and storage medium - Google Patents

Abstract

The application provides a verification method, a verification device, electronic equipment and a storage medium for the quality of a board card, wherein the method comprises the steps of obtaining rated indexes of the board card and rated data corresponding to the rated indexes; performing index test on the board card based on the rated index to obtain test data corresponding to the rated index; and responding to the fact that the test data meets the preset conditions, and determining that the quality of the board card passes the verification, wherein the preset conditions are determined based on the rated data, so that the technical problem that the quality of the board card is not verified from the perspective of application requirements of users in the prior art is solved, and the accuracy of verifying the quality of the board card is improved.

Description

Method and device for verifying quality of board card, electronic equipment and storage medium

Technical Field

The present disclosure relates to the field of quality detection technologies, and in particular, to a method and an apparatus for verifying quality of a board, an electronic device, and a storage medium.

Background

With the continuous development and perfection of the electronic component industry system in China, the development, production and quality assurance capabilities of domestic components are rapidly improved, and the product series is more perfect. The quality of the domestic components is verified before the domestic components are put into use. At present, the domestic components can normally work to determine that the components pass quality verification, including performing verification tests such as functional performance, inherent reliability, ultimate stress and the like, so that the use reliability of the domestic components is ensured.

In the prior art, a user can customize the domestic components under the application requirement of the user, so that the parameters of the domestic components meet the requirement of the user. In addition, standard components and components with a relatively fuzzy technical base line compared with other integrated circuits exist in domestic components at present, for example, the components can be board cards carrying digital temperature sensing. When the quality of the board card is verified, the quality problem of the board card cannot be determined only through normal operation of the board card, and the quality of the board card needs to be verified from the aspect of application requirements of users.

Disclosure of Invention

In view of the foregoing, the present application is directed to a method, an apparatus, an electronic device and a storage medium for verifying the quality of a board card, so as to overcome all or part of the defects in the prior art.

Based on the above objects, the present application provides a method for verifying the quality of a board card, including: acquiring rated indexes of the board card and rated data corresponding to the rated indexes; performing index test on the board card based on the rated index to obtain test data corresponding to the rated index; and in response to determining that the test data meets a preset condition, determining that the quality of the board card passes the verification, wherein the preset condition is determined based on the rated data.

Optionally, the index test includes an interface test, a power consumption test, a voltage test, a working state test, a temperature test and a vibration test.

Optionally, the test data includes a waveform diagram corresponding to the interface test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: adjusting the board card to an on-power state, and determining a time sequence signal corresponding to an interface of the board card; based on the time sequence signal, the waveform diagram of the interface is read and recorded.

Optionally, the test data includes power consumption corresponding to the power consumption test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: for each temperature value in the first preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and recording the current of the board card; and determining and recording the power consumption of the board card based on the current.

Optionally, the test data includes a target pull bias voltage corresponding to the voltage test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: acquiring the actual temperature of a preset area where the board card is positioned; aiming at each pulling bias voltage in a preset pulling bias voltage set, when the voltage of the board card reaches the pulling bias voltage, controlling the board card to be electrified, and reading the temperature measurement value of the board card; and in response to determining that the difference between the temperature measurement value and the actual temperature is greater than a preset error, recording the pull bias voltage as a target pull bias voltage.

Optionally, the test data includes a working state corresponding to the working state test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: for each temperature value in the second preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and measuring the temperature measurement value of the board card after the first preset electrifying time length; and determining and recording the working state of the board card based on the temperature measurement value.

Optionally, the test data includes temperature detection data corresponding to the temperature test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: and adjusting the temperature of the area where the board card is positioned to a preset temperature, controlling the board card to alternately power up and power down according to preset times, and recording temperature detection data of the board card after the preset times.

Optionally, the test data includes vibration detection data corresponding to the vibration test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: and controlling the board card to be electrified, and adjusting the frequency of a preset platform where the board card is positioned so as to enable the frequency of the preset platform to randomly change within a preset frequency range, and recording vibration detection data of the board card after a second preset electrifying time length.

Optionally, the rated data includes a rated waveform diagram, rated power consumption, rated voltage range, rated working state, rated temperature detection data and rated vibration detection data; the test data comprise a waveform chart, power consumption, target bias voltage, a temperature measurement value, a working state, temperature detection data and vibration detection data; the determining that the test data meets the preset condition includes: in response to determining that the error of the amplitude of the waveform pattern and the amplitude in its associated nominal waveform pattern is less than a predetermined amplitude error, the error of the power consumption and its associated nominal power consumption is less than a predetermined power consumption error, the pull bias voltage does not belong to the nominal voltage range, the operating state is the same as its associated nominal operating state, the temperature detection data belongs to its associated nominal temperature detection data range and the vibration detection data belongs to its associated nominal vibration detection data range, determining that the test data meets a preset condition.

Based on the same inventive concept, the application also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and executable by the processor, the processor implementing the method as described above when executing the computer program.

From the above, it can be seen that the method, the device, the electronic device and the storage medium for verifying the quality of the board provided by the application, where the method includes obtaining the rated index of the board and the rated data corresponding to the rated index. And performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data can comprehensively reflect the performance of the board card. And in response to determining that the test data meets a preset condition, determining that the quality of the board card passes the verification, wherein the preset condition is determined based on the rated data, so that the accuracy of the quality verification of the board card is ensured, and the satisfaction degree of a user is improved.

Drawings

In order to more clearly illustrate the technical solutions of the present application or related art, the drawings that are required to be used in the description of the embodiments or related art will be briefly described below, and it is apparent that the drawings in the following description are only embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort to those of ordinary skill in the art.

Fig. 1 is a flow chart of a method for verifying quality of a board card according to an embodiment of the present application;

Fig. 2 is a schematic structural diagram of a verification device for quality of a board card according to an embodiment of the present application;

fig. 3 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.

Detailed Description

For the purposes of making the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings.

It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present application should be given the ordinary meaning as understood by one of ordinary skill in the art to which the present application belongs. The terms "first," "second," and the like, as used in embodiments of the present application, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to indicate relative positional relationships, which may also be changed when the absolute position of the object to be described is changed.

As described in the background art, with the continuous development and perfection of the electronic component industry system in China, the development, production and quality assurance capabilities of domestic components are rapidly improved, and the product series are more perfect. The quality of the domestic components is verified before the domestic components are put into use. At present, the domestic components can normally work to determine that the components pass quality verification, including performing verification tests such as functional performance, inherent reliability, ultimate stress and the like, so that the use reliability of the domestic components is ensured.

In the prior art, a user can customize the domestic components under the application requirement of the user, so that the parameters of the domestic components meet the requirement of the user. In addition, standard components and components with a relatively fuzzy technical base line compared with other integrated circuits exist in domestic components at present, for example, the components can be board cards carrying digital temperature sensing. When the quality of the board card is verified, the quality problem of the board card cannot be determined only through normal operation of the board card, and the quality of the board card needs to be verified from the aspect of application requirements of users. The application requirements of the user on the board card can be reflected in the following aspects: the function requirement is the function realized by using the board card for a user unit; the parameter requirement is a parameter concerned by a user unit in the process of using the board card or a parameter which has obvious influence on practical application; environmental requirements include temperature, humidity, mechanical and chemical conditions, and other application environments.

In view of this, the embodiment of the present application proposes a method for verifying the quality of a board card, referring to fig. 1, including the following steps:

and 101, acquiring rated indexes of the board card and rated data corresponding to the rated indexes.

In the step, the board card is one kind of printed circuit board, and has inserted core for controlling hardware operation, such as display, acquisition card, etc. after installing driver, the corresponding hardware function may be realized. Illustratively, the board in the present application may be a board carrying a digital temperature sensor model TC 7301. The board card manufacturer generally customizes the board card according to the application requirements of the user, wherein the application requirements of the user can be represented by the rated index and the rated data corresponding to the rated index. For example, in the case where the power consumption of the board is relatively large, there will be a case where the board has waste of electrical resources, and therefore, the user will generally limit the power consumption of the board accordingly, that is, the application requirement of the user includes the power consumption of the board and rated data of the power consumption. Therefore, when verifying the quality of the board, the quality of the board cannot be determined to be qualified only by normal use of the board, and the quality of the board needs to be verified based on the application requirements of the user in consideration of the application requirements of the user. For this purpose, the rated index of the board and the data corresponding to the rated index are first acquired, and for example, the rated index of the board and the data corresponding to the rated index may be acquired from a manual of the board.

It should be noted that the board card in the present application is disposed on a daughter board, and the daughter board is connected to the motherboard. The motherboard is a motherboard control board, and the singlechip is used as a core device to realize the function control, data reading and storage of the board. The mother board is also provided with a power supply module for supplying power to the child mother board and a clock module for providing time sequence for data transmission. Meanwhile, RS-232 communication is adopted between the sub-mother boards, and SPI interface (Serial Peripheral Interface ) communication is adopted between the board card and the sub-mother boards.

And 102, performing index test on the board card based on the rated index to obtain test data corresponding to the rated index.

In this step, the rating index is an important parameter for measuring the performance of the board card, and is determined according to the application requirement of the user on the board card. Therefore, in order to determine whether the application requirement of the user on the board is met, the board needs to be subjected to index test based on the rated index to obtain test data corresponding to the rated index. And on the premise of considering the application requirements of users, the board is subjected to index test, and the obtained test data can comprehensively reflect the performance of the board.

And step 103, determining that the quality of the board card passes the verification in response to determining that the test data meets a preset condition, wherein the preset condition is determined based on the rated data.

In this step, if the test data satisfies the preset condition, it is indicated that the board card meets the application requirement of the user, and the quality of the board card is determined to pass the verification. It should be noted that, if the test data does not meet the preset condition, even if the board card can work normally, the board card cannot meet the application requirement of the user, and it is determined that the quality of the board card fails to pass the verification. The preset conditions are determined according to the rated data, the relation which needs to be met by the test data and the rated data is reflected, and the quality of the board card can be determined to pass verification only if the test data meets the preset conditions. The quality of the board card is verified from the application demand angle of the user, so that the accuracy of the quality verification of the board card is ensured, and the satisfaction degree of the user is improved.

Through the scheme, the rated index of the board card and the rated data corresponding to the rated index are obtained. And performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data can comprehensively reflect the performance of the board card. And in response to determining that the test data meets a preset condition, determining that the quality of the board card passes the verification, wherein the preset condition is determined based on the rated data, so that the accuracy of the quality verification of the board card is ensured, and the satisfaction degree of a user is improved.

In some embodiments, the index test includes an interface test, a power consumption test, a voltage test, an operating state test, a temperature test, and a vibration test.

In the embodiment, the application requirement of the user on the board reflects a plurality of rated indexes associated with the board, and the board is ensured to work normally on the premise of meeting the user requirement. Thus, the index test includes various tests. The board card includes a plurality of interfaces through which the board card can be connected to other devices, but the interface of the board card may malfunction, resulting in the interface not functioning properly. The fault may be, for example, a welding fault that occurs during the welding process for the interface. Users often need to connect with other devices using a board card, and thus, the application requirements of the users include requirements for interfaces, and further, the index test includes interface test. The power consumption refers to the energy value consumed by the board in unit time, and the high power consumption not only can cause the board to waste more electric energy, but also can reduce the service life of the board. Therefore, in order to reduce the waste of the board card to the energy, the application requirement of the user includes the limitation of the power consumption of the board card, and the index test includes the power consumption test. The board card works by electric energy, so that the application requirement of a user comprises the range of voltage which the board card can bear, and further the index test comprises voltage test. The board may lose stability after a relatively long period of operation. Therefore, the application requirement of the user comprises a time range in which the board can continuously work, and the index test comprises a working state test. The temperature of the area where the board is located is not constant, so that the temperature corresponding to the working state of the board is variable. Therefore, the application requirements of the user include a temperature range that the board card can bear in a working state, and further the index test includes a temperature test. The vibration frequency of the area where the board card is located is not constant, so that the vibration frequency corresponding to the working state of the board card is variable. Therefore, the application requirements of the user include the vibration range that the board card can bear in the working state, and further the index test includes the vibration test. Through carrying out multiple index test to the board, can comparatively comprehensively confirm whether the quality of board satisfies user's application demand.

In some embodiments, the test data includes a waveform diagram corresponding to the interface test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: adjusting the board card to an on-power state, and determining a time sequence signal corresponding to an interface of the board card; based on the time sequence signal, the waveform diagram of the interface is read and recorded.

In this embodiment, under the condition that the board has an interface fault, the interface fault of the board can be reflected without placing the board in a specific application environment. Therefore, the board will be subjected to interface test under an application environment of normal temperature and general voltage, for example, normal temperature is 25 ℃, and general voltage is 3.3V. When the board card is subjected to interface test, the board card is required to be arranged on the daughter board and is connected with the mother board through the daughter board, and the singlechip in the mother board can control the board card to perform corresponding work. In addition, the board card is also connected with a direct current power supply and an oscilloscope, wherein the direct current power supply is used for providing current for the board card so as to enable the board card to generate a time sequence signal, and the oscilloscope is used for displaying the waveform diagram of the board card based on the time sequence signal. Whether the interface works normally or not can be reflected through the waveform diagram, and the aim of accurately testing the interface test of the board card is achieved.

In some embodiments, the test data includes power consumption corresponding to the power consumption test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: for each temperature value in the first preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and recording the current of the board card; and determining and recording the power consumption of the board card based on the current.

In this embodiment, the power consumption values of the board card at different temperatures are different, so that the power consumption test is required to be performed on the board card in the application environment of the first predetermined temperature set and the universal voltage, the influence of the temperature on the power consumption is comprehensively considered, and the power consumption at different temperatures is further limited. It should be noted that, the first predetermined temperature set includes three temperatures of high temperature, medium temperature and low temperature, so that the numerical difference between the predetermined temperatures is relatively large, for example, the temperatures in the first predetermined temperature set belong to-55 ℃ to 125 ℃ or belong to-40 ℃ to 85 ℃, and the range of the first predetermined temperature set can be selected according to the experimental environment. When the power consumption test is carried out on the board, the board is required to be arranged on the daughter board and is connected with the motherboard through the daughter board. In addition, the board card needs to be connected with a direct current power supply and an oscilloscope, wherein the oscilloscope can display the current of the board card. And for each temperature value in the first preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, the control board card is electrified. The singlechip on the motherboard can control the board card to work after the board card is electrified, the current of the board card is dynamically recorded, the power consumption of the board card can be calculated through the current and the universal voltage, and the purpose of accurately testing the power consumption test of the board card is achieved.

In some embodiments, the test data includes a target pull-bias voltage corresponding to the voltage test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: acquiring the actual temperature of a preset area where the board card is positioned; aiming at each pulling bias voltage in a preset pulling bias voltage set, when the voltage of the board card reaches the pulling bias voltage, controlling the board card to be electrified, and reading the temperature measurement value of the board card; and in response to determining that the difference between the temperature measurement value and the actual temperature is greater than a preset error, recording the pull bias voltage as a target pull bias voltage.

In this embodiment, the voltage of the board is provided by an external power source, and the voltage provided by the power source does not change with the temperature change of the predetermined area where the board is located. Therefore, the board is subjected to voltage test under the application environment of normal temperature and variable voltage, wherein the variable voltage is each bias voltage in the preset bias voltage set. It should be noted that, the user provides the voltage range of the board, that is, the rated voltage range for the manufacturer, but the manufacturer usually expands the voltage range that the board can bear, that is, expands the voltage range to the pulling bias voltage relative to the rated voltage range, so that the voltage passing through the board has a fault tolerance mechanism, and has a protection effect on the board, thereby prolonging the service life of the board. When the voltage test is carried out on the board card, the board card is required to be arranged on the daughter board and is connected with the motherboard through the daughter board. In addition, the board card needs to be connected with a direct current power supply and an oscilloscope, wherein the oscilloscope can display the voltage of the board card.

The predetermined set of pull-bias voltages includes a plurality of pull-bias voltages of a lowest voltage and a plurality of pull-bias voltages of a highest voltage of a rated voltage range of the board card. For example, in the case where the lowest voltage of the rated voltage range of the board is 2.7V, the plurality of bias voltages corresponding to the lowest voltage are changed in a first predetermined step, so as to obtain the plurality of bias voltages of the lowest voltage, for example, the first predetermined step may be 0.5V, and the bias voltages are 2.2V and 1.7V …. When the highest voltage of the rated voltage range of the board card is 3.3V, the plurality of bias voltages corresponding to the highest voltage change in a second predetermined step, so as to obtain a plurality of bias voltages of the highest voltage, for example, the second predetermined step may be 0.5V, and the bias voltages are 3.8V and 4.3V …. For each pulling bias voltage in the preset pulling bias voltage set, when the voltage reaches the pulling bias voltage, the control board card is electrified, and the singlechip on the motherboard can work by the control board card after the board card is electrified. Because the board in this embodiment is a board carrying sensing temperature, the board can measure temperature in the working process to obtain a temperature measurement value. The actual temperature of the preset area where the board card is positioned is obtained, and the actual temperature is compared with the temperature measurement value, so that whether the board card works normally under the bias voltage can be determined. Under the condition that the difference value between the temperature measurement value and the actual temperature is larger than a preset error, the temperature measurement value of the board card is inaccurate, the board card cannot work normally under the bias voltage, the bias voltage is recorded as a target bias voltage, and the target bias voltage comprises a target bias voltage with the lowest voltage and a target bias voltage with the highest voltage. The voltage test of the board is accurately tested by comparing the difference value between the temperature measurement value and the actual temperature with the preset error.

In some embodiments, the test data includes an operating state corresponding to the operating state test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: for each temperature value in the second preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and measuring the temperature measurement value of the board card after the first preset electrifying time length; and determining and recording the working state of the board card based on the temperature measurement value.

In this embodiment, the stability of the board is generally affected by temperature due to the relatively large difference between the different temperatures. Therefore, the power consumption test is required to be performed on the board under the application environment of the second preset temperature set and the universal voltage, the influence of the temperature on the working state is comprehensively considered, and the working states at different temperatures are further determined. It should be noted that the second predetermined temperature set includes three temperatures of high temperature, medium temperature and low temperature to construct application environments with different temperatures. When the working state of the board is tested, the board is required to be placed on the daughter board and connected with the mother board through the daughter board. In addition, the board card needs to be connected with a direct current power supply and an oscilloscope, wherein the oscilloscope can display the measured temperature of the board card. When the board card is provided with the temperature acquisition function, the board card can acquire the current working temperature. And for each temperature value in the second preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, the control board card is electrified. The temperature measurement value of the board is measured after the first predetermined time has elapsed, considering that the board may lose stability after a relatively long period of operation. In response to determining that the board card can normally measure the temperature value, the board card can still normally work even after a relatively long working time, and at this time, the working state of the board card is determined to be a normal working state. In response to determining that the board card cannot normally measure the temperature measurement value, the board card cannot collect the temperature measurement value or the collected temperature measurement value is abnormal, the board card cannot normally work after relatively long working time, stability is lost, at the moment, the working state of the board card is determined to be an abnormal working state, and the purpose of accurately testing the working state of the board card is achieved.

In some embodiments, the test data includes temperature detection data corresponding to the temperature test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: and adjusting the temperature of the area where the board card is positioned to a preset temperature, controlling the board card to alternately power up and power down according to preset times, and recording temperature detection data of the board card after the preset times.

In this embodiment, the working state of the board card is affected by the temperature of the area where the board card is located, so that the board card is subjected to temperature testing under application environments of different temperatures and universal voltages to construct application environments of different temperatures. It should be noted that, in order to more accurately reflect the influence of different temperatures on the board, the temperatures should be different, and further, the temperature difference between the different temperatures may be relatively large. When the temperature test is carried out on the board card, the board card is required to be arranged on the daughter board and is connected with the mother board through the daughter board. Besides, the board card is also connected with a direct current power supply, an oscilloscope and a universal meter, wherein the oscilloscope can display the measured temperature of the board card, and the universal meter is a multifunctional and multi-range measuring instrument which can measure parameters of the board card such as direct current, direct current voltage, alternating current voltage, resistance and audio level. And adjusting the temperature of the area where the board card is positioned to a preset temperature, wherein the preset temperature comprises a preset highest temperature and a preset lowest temperature. And adjusting the temperature of the area where the board card is positioned to a preset highest temperature according to a preset temperature increasing rate. The test chamber temperature is raised to the high test temperature of 125 c, illustratively at a rate of no more than 3 c/min. After the temperature is stable, the power supply is switched on, the mother board and the daughter board are debugged, and then the relevant test program is started on the board. And continuously starting and switching off the circuit board for a first preset number of times under a high-temperature environment, wherein the first preset number of times is 3, and recording temperature detection data of the circuit board. The temperature of the area where the board is located is adjusted to a predetermined minimum temperature at a predetermined temperature decrease rate, and the temperature of the test chamber is reduced to a low temperature test temperature of-55 ℃ at a rate of not more than 3 ℃/min, for example. After the temperature is stable, the power supply is switched on, the mother board and the daughter board are debugged, and then the relevant test program is started on the board. And continuously starting and switching off the board card for a second preset time, for example, 3 times in a low-temperature environment, and recording the temperature detection data of the board card, thereby achieving the purpose of accurately testing the temperature test of the board card.

In order to better reflect the influence of different temperatures on the board, the working time of the board at the temperature is prolonged, for example, the working time is prolonged by 10 minutes, and the temperature test of the board can be repeated for a plurality of times, for example, 10 times. It should be noted that, whether the appearance state of the board card has cracks can be detected to determine whether the alternating temperature has an influence on the quality of the board card, specifically, before the board card is subjected to temperature test, the initial appearance state of the board card is recorded, after the board card is tested in a high-temperature environment and after the board card is tested in a low-temperature environment, the appearance states of the board card are recorded respectively, and then the two appearance states are compared with the initial appearance states of the board card respectively. In response to determining that the similarity of the morphology state and the initial morphology state is greater than a predetermined value, it is indicated that the board is not affected by the alternating temperature.

In some embodiments, the test data includes vibration detection data corresponding to the vibration test; and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises: and controlling the board card to be electrified, and adjusting the frequency of a preset platform where the board card is positioned so as to enable the frequency of the preset platform to randomly change within a preset frequency range, and recording vibration detection data of the board card after a second preset electrifying time length.

In this embodiment, the working state of the board card is affected by external vibration, so that direct effects of different vibrations on the board card are also required to be tested. In order to reflect the influence of vibration on the board, the board is subjected to random vibration test under the application environment of normal temperature and general voltage. When the board card is subjected to vibration test, the board card is required to be placed on the daughter board and is connected with the mother board through the daughter board. The mother board is connected with the test fixture or the table top of the vibration table, the test is controlled by adopting multipoint average, and the control point is selected on the connection surface of the instrument and the table top of the vibration table or the fixture and is close to the mounting feet of the instrument and equipment. The test fixture should have sufficient rigidity and have a relatively flat frequency response characteristic in the test frequency band. Before the formal test, the pre-vibration should be performed first, and the pre-vibration condition is generally 1/4-1/3 of the formal test condition. In order to detect the resonance response condition of each order of the board card, a vibration test of 1/2-2/3 magnitude can be added again. In the test process, the working state of the board card is recorded in the whole process. The vibration state of the board in the practical application is simulated, and the purpose of accurately testing the vibration test of the board is achieved.

In order to better reflect the influence of the vibration on the board, the time for the board to vibrate randomly may be relatively long, i.e., the second predetermined power-on period is relatively long. It should be noted that, whether the appearance state of the board card has cracks can be detected to determine whether the vibration has an influence on the quality of the board card, specifically, before the board card is subjected to vibration test, the initial appearance state of the board card is recorded, after the board card is subjected to vibration test, the appearance states of the board card are recorded respectively, and then the two appearance states are compared with the initial appearance state of the board card respectively. And in response to determining that the similarity of the morphology state and the initial morphology state is greater than a preset value, the board card is not affected by vibration.

In some embodiments, the nominal data includes a nominal waveform diagram, a nominal power consumption, a nominal voltage range, a nominal operating state, nominal temperature detection data, and nominal vibration detection data; the test data comprise a waveform chart, power consumption, target bias voltage, a temperature measurement value, a working state, temperature detection data and vibration detection data; the determining that the test data meets the preset condition includes: in response to determining that the error of the amplitude of the waveform pattern and the amplitude in its associated nominal waveform pattern is less than a predetermined amplitude error, the error of the power consumption and its associated nominal power consumption is less than a predetermined power consumption error, the pull bias voltage does not belong to the nominal voltage range, the operating state is the same as its associated nominal operating state, the temperature detection data belongs to its associated nominal temperature detection data range and the vibration detection data belongs to its associated nominal vibration detection data range, determining that the test data meets a preset condition.

In this embodiment, the board card can pass the quality verification only when all application requirements of the user are satisfied, so that whether all test data satisfy preset conditions associated with rated data is determined, and the purpose of determining the relationship between the test data and the rated data can be accurately achieved. When the error of the amplitude of the waveform diagram and the amplitude of the associated rated waveform diagram is smaller than the predetermined amplitude error, the interface of the board card can smoothly pass through the current, the interface does not have faults, and the board card passes through the interface test. And under the condition that the error of the power consumption and the rated power consumption associated with the power consumption is smaller than the preset power consumption error, the power consumption of the board card is relatively close to the power consumption required by a user, and even if the error exists, the power consumption is within the acceptable range of the user, so that the board card is further indicated to be subjected to the power consumption test. Under the condition that the pulling bias voltage does not belong to the rated voltage range, the voltage of the board card is provided with a fault tolerance mechanism, and the board card is protected on the premise that the rated voltage range meets the application requirements of users, so that the board card is illustrated to pass the voltage test. And under the condition that the working state is the same as the rated working state associated with the working state, the working state of the board card is the same as the expected working state. The board card is not abnormal along with the change of temperature, and the working state has stability, so that the board card is proved to be tested in the working state. Under the condition that the temperature detection data belong to the rated temperature detection data range associated with the temperature detection data, the board card is indicated to work at different temperatures and no abnormal data is generated, and further the board card is indicated to be subjected to temperature test. When the vibration detection data belongs to the rated vibration detection data range associated with the vibration detection data, the abnormal data is not generated when the board card works under different vibrations, and the board card passes the vibration test.

It should be noted that, the method of the embodiments of the present application may be performed by a single device, for example, a computer or a server. The method of the embodiment can also be applied to a distributed scene, and is completed by mutually matching a plurality of devices. In the case of such a distributed scenario, one of the devices may perform only one or more steps of the methods of embodiments of the present application, and the devices may interact with each other to complete the methods.

It should be noted that some embodiments of the present application are described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments described above and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

Based on the same inventive concept, the application also provides a device for verifying the quality of the board corresponding to the method of any embodiment.

Referring to fig. 2, the verification device for the quality of the board card includes:

and the acquisition module 10 is configured to acquire the rated index of the board card and rated data corresponding to the rated index.

And the index testing module 20 is configured to perform index testing on the board card based on the rated index to obtain testing data corresponding to the rated index.

A determining module 30 configured to determine that the quality of the board card passes the verification in response to determining that the test data meets a preset condition, wherein the preset condition is determined based on the rated data.

Through the device, the rated index of the board card and the rated data corresponding to the rated index are obtained. And performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data can comprehensively reflect the performance of the board card. And in response to determining that the test data meets a preset condition, determining that the quality of the board card passes the verification, wherein the preset condition is determined based on the rated data, so that the accuracy of the quality verification of the board card is ensured, and the satisfaction degree of a user is improved.

In some embodiments, the index test includes an interface test, a power consumption test, a voltage test, an operating state test, a temperature test, and a vibration test.

In some embodiments, the indicator test module 20 is further configured to the test data include a waveform diagram corresponding to the interface test; adjusting the board card to an on-power state, and determining a time sequence signal corresponding to an interface of the board card; based on the time sequence signal, the waveform diagram of the interface is read and recorded.

In some embodiments, the indicator test module 20 is further configured to the test data to include power consumption corresponding to the power consumption test; for each temperature value in the first preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and recording the current of the board card; and determining and recording the power consumption of the board card based on the current.

In some embodiments, the indicator test module 20 is further configured such that the test data includes a target pull bias voltage corresponding to the voltage test; acquiring the actual temperature of a preset area where the board card is positioned; aiming at each pulling bias voltage in a preset pulling bias voltage set, when the voltage of the board card reaches the pulling bias voltage, controlling the board card to be electrified, and reading the temperature measurement value of the board card; and in response to determining that the difference between the temperature measurement value and the actual temperature is greater than a preset error, recording the pull bias voltage as a target pull bias voltage.

In some embodiments, the indicator test module 20 is further configured to test that the test data includes an operating state corresponding to the operating state test; for each temperature value in the second preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and measuring the temperature measurement value of the board card after the first preset electrifying time length; and determining and recording the working state of the board card based on the temperature measurement value.

In some embodiments, the indicator test module 20 is further configured to the test data comprise temperature detection data corresponding to the temperature test; and adjusting the temperature of the area where the board card is positioned to a preset temperature, controlling the board card to alternately power up and power down according to preset times, and recording temperature detection data of the board card after the preset times.

In some embodiments, the indicator test module 20 is further configured such that the test data includes vibration detection data corresponding to the vibration test; and controlling the board card to be electrified, and adjusting the frequency of a preset platform where the board card is positioned so as to enable the frequency of the preset platform to randomly change within a preset frequency range, and recording vibration detection data of the board card after a second preset electrifying time length.

In some embodiments, the determining module 30 is further configured such that the nominal data includes a nominal waveform diagram, a nominal power consumption, a nominal voltage range, a nominal operating state, nominal temperature detection data, and nominal vibration detection data; the test data comprise a waveform chart, power consumption, target bias voltage, a temperature measurement value, a working state, temperature detection data and vibration detection data; in response to determining that the error of the amplitude of the waveform pattern and the amplitude in its associated nominal waveform pattern is less than a predetermined amplitude error, the error of the power consumption and its associated nominal power consumption is less than a predetermined power consumption error, the pull bias voltage does not belong to the nominal voltage range, the operating state is the same as its associated nominal operating state, the temperature detection data belongs to its associated nominal temperature detection data range and the vibration detection data belongs to its associated nominal vibration detection data range, determining that the test data meets a preset condition.

For convenience of description, the above devices are described as being functionally divided into various modules, respectively. Of course, the functions of each module may be implemented in the same piece or pieces of software and/or hardware when implementing the present application.

The device of the foregoing embodiment is used to implement the verification method of the quality of the corresponding board card in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which is not described herein again.

Based on the same inventive concept, the application also provides an electronic device corresponding to the method of any embodiment, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the verification method of the quality of the board card of any embodiment when executing the program.

Fig. 3 shows a more specific hardware architecture of an electronic device according to this embodiment, where the device may include: a processor 1010, a memory 1020, an input/output interface 1030, a communication interface 1040, and a bus 1050. Wherein processor 1010, memory 1020, input/output interface 1030, and communication interface 1040 implement communication connections therebetween within the device via a bus 1050.

The processor 1010 may be implemented by a general-purpose CPU (Central Processing Unit ), microprocessor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), or one or more integrated circuits, etc. for executing relevant programs to implement the technical solutions provided in the embodiments of the present disclosure.

The Memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory ), static storage device, dynamic storage device, or the like. Memory 1020 may store an operating system and other application programs, and when the embodiments of the present specification are implemented in software or firmware, the associated program code is stored in memory 1020 and executed by processor 1010.

The input/output interface 1030 is used to connect with an input/output module for inputting and outputting information. The input/output module may be configured as a component in a device (not shown in the figure) or may be external to the device to provide corresponding functionality. Wherein the input devices may include a keyboard, mouse, touch screen, microphone, various types of sensors, etc., and the output devices may include a display, speaker, vibrator, indicator lights, etc.

Communication interface 1040 is used to connect communication modules (not shown) to enable communication interactions of the present device with other devices. The communication module may implement communication through a wired manner (such as USB, network cable, etc.), or may implement communication through a wireless manner (such as mobile network, WIFI, bluetooth, etc.).

Bus 1050 includes a path for transferring information between components of the device (e.g., processor 1010, memory 1020, input/output interface 1030, and communication interface 1040).

It should be noted that although the above-described device only shows processor 1010, memory 1020, input/output interface 1030, communication interface 1040, and bus 1050, in an implementation, the device may include other components necessary to achieve proper operation. Furthermore, it will be understood by those skilled in the art that the above-described apparatus may include only the components necessary to implement the embodiments of the present description, and not all the components shown in the drawings.

The electronic device of the foregoing embodiment is configured to implement the method for verifying the quality of the corresponding board card in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which is not described herein.

Based on the same inventive concept, corresponding to the method of any embodiment described above, the present application further provides a non-transitory computer-readable storage medium storing computer instructions for causing the computer to perform the method for verifying the quality of a board card according to any embodiment described above.

The computer readable media of the present embodiments, including both permanent and non-permanent, removable and non-removable media, may be used to implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of storage media for a computer include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device.

The computer instructions stored in the storage medium of the foregoing embodiments are used to make the computer execute the method for verifying the quality of the board card according to any one of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which are not described herein.

Those of ordinary skill in the art will appreciate that: the discussion of any of the embodiments above is merely exemplary and is not intended to suggest that the scope of the application (including the claims) is limited to these examples; the technical features of the above embodiments or in the different embodiments may also be combined within the idea of the present application, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of brevity.

Additionally, well-known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown within the provided figures, in order to simplify the illustration and discussion, and so as not to obscure the embodiments of the present application. Furthermore, the devices may be shown in block diagram form in order to avoid obscuring the embodiments of the present application, and this also takes into account the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform on which the embodiments of the present application are to be implemented (i.e., such specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the application, it should be apparent to one skilled in the art that embodiments of the application can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative in nature and not as restrictive.

While the present application has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of those embodiments will be apparent to those skilled in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.

The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Accordingly, any omissions, modifications, equivalents, improvements and/or the like which are within the spirit and principles of the embodiments are intended to be included within the scope of the present application.

Claims (10)

1. The verification method for the quality of the board card is characterized by comprising the following steps of:

acquiring rated indexes of the board card and rated data corresponding to the rated indexes;

performing index test on the board card based on the rated index to obtain test data corresponding to the rated index;

and in response to determining that the test data meets a preset condition, determining that the quality of the board card passes the verification, wherein the preset condition is determined based on the rated data.

2. The method of claim 1, wherein the index test comprises an interface test, a power consumption test, a voltage test, an operating state test, a temperature test, and a vibration test.

3. The method of claim 2, wherein the test data comprises a waveform diagram corresponding to the interface test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

Adjusting the board card to an on-power state, and determining a time sequence signal corresponding to an interface of the board card;

based on the time sequence signal, the waveform diagram of the interface is read and recorded.

4. The method of claim 2, wherein the test data includes power consumption corresponding to the power consumption test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

for each temperature value in the first preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and recording the current of the board card; and determining and recording the power consumption of the board card based on the current.

5. The method of claim 2, wherein the test data comprises a target pull-bias voltage corresponding to the voltage test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

acquiring the actual temperature of a preset area where the board card is positioned;

aiming at each pulling bias voltage in a preset pulling bias voltage set, when the voltage of the board card reaches the pulling bias voltage, controlling the board card to be electrified, and reading the temperature measurement value of the board card;

And in response to determining that the difference between the temperature measurement value and the actual temperature is greater than a preset error, recording the pull bias voltage as a target pull bias voltage.

6. The method of claim 2, wherein the test data comprises an operating state corresponding to the operating state test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

for each temperature value in the second preset temperature set, when the temperature in the preset area where the board card is positioned reaches the temperature value, controlling the board card to be electrified, and measuring the temperature measurement value of the board card after the first preset electrifying time length; and determining and recording the working state of the board card based on the temperature measurement value.

7. The method of claim 2, wherein the test data comprises temperature detection data corresponding to the temperature test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

and adjusting the temperature of the area where the board card is positioned to a preset temperature, controlling the board card to alternately power up and power down according to preset times, and recording temperature detection data of the board card after the preset times.

8. The method of claim 2, wherein the test data comprises vibration detection data corresponding to the vibration test;

and performing index test on the board card based on the rated index to obtain test data corresponding to the rated index, wherein the test data comprises:

and controlling the board card to be electrified, and adjusting the frequency of a preset platform where the board card is positioned so as to enable the frequency of the preset platform to randomly change within a preset frequency range, and recording vibration detection data of the board card after a second preset electrifying time length.

9. The method of claim 1, wherein the nominal data comprises a nominal waveform profile, a nominal power consumption, a nominal voltage range, a nominal operating state, nominal temperature detection data, and nominal vibration detection data; the test data comprise a waveform chart, power consumption, target bias voltage, a temperature measurement value, a working state, temperature detection data and vibration detection data;

the determining that the test data meets the preset condition includes:

in response to determining that the error of the amplitude of the waveform pattern and the amplitude in its associated nominal waveform pattern is less than a predetermined amplitude error, the error of the power consumption and its associated nominal power consumption is less than a predetermined power consumption error, the pull bias voltage does not belong to the nominal voltage range, the operating state is the same as its associated nominal operating state, the temperature detection data belongs to its associated nominal temperature detection data range and the vibration detection data belongs to its associated nominal vibration detection data range, determining that the test data meets a preset condition.

10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of any one of claims 1 to 9 when the program is executed by the processor.