CN117639961A - Radio frequency device testing system and method - Google Patents
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Abstract
The invention provides a system and a method for testing a radio frequency device, which concretely comprise the following steps: after the radio frequency device is in a working mode, when the small signal parameters of the radio frequency device need to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the network division test system; when the scene index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the modulation signal testing system; when the signaling index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the signaling test system. The system is combined together by using the radio frequency input switch and the radio frequency output switch, so that the matching of various test devices is realized, the test devices do not need to be manually switched, the test of various parameters such as small signal parameters, scene indexes, signaling indexes and the like of the test radio frequency devices can be completed in one test process, and the test efficiency is improved.
Description
Technical Field
The invention relates to the field of performance test of an amplifier of a radio frequency integrated circuit chip, in particular to a system and a method for testing a radio frequency device.
Background
The radio frequency device is an electronic device for processing radio frequency signals, and mainly comprises: power amplifiers, filters, low noise amplifiers, switches, diplexers, tuners, and the like. The test parameters corresponding to different devices are numerous, including but not limited to small signal testing, modulation signal testing, signaling testing, etc. For example, modulation signal testing needs to test to obtain at least one of parameters such as transmitting power, spurious, harmonic and adjacent channel leakage, EVM (vector amplitude modulation), noise coefficient, third-order intermodulation point, link gain, current, sensitivity, NF (noise coefficient), saturated output power, efficiency and the like; the small signal parameter test needs to test to obtain at least one of parameters such as P1dB (1 dB compression point), AM/AM distortion (distortion on output signal and input signal amplitude), AM/PM distortion (distortion caused by signal amplitude change), hot S22 (thermal state test), and the like, and the signaling test needs to test to obtain at least one of parameters such as signaling power, EVM (error vector magnitude), and the like.
In the prior art, the above parameters need to be tested independently by each testing device, that is, a plurality of testing steps are needed to complete the testing of a radio frequency device, so the following problems are unavoidable:
(1) A large number of manual testing and switching processes are required, and the testing efficiency is low;
(2) The devices cannot be matched with each other, so that the device utilization rate is very low;
(3) For temperature test of the radio frequency device, a tester is required to wait for high-low temperature equipment and start the test after long-time stabilization, so that a large amount of time is consumed, and the night time cannot be effectively utilized.
(4) In the manual test, the probability of manual error is greatly increased along with the increase of test items;
(5) The recording and the storage of the data are traditional manual recording, the systematic archiving and the arrangement consume a great deal of manpower, and the subsequent searching and the comparison are not intuitive;
these problems are the key to restrict the design and verification of the radio frequency device, so the scheme provides an automatic test platform for the radio frequency device, and the problems are solved.
Disclosure of Invention
The invention aims to provide a system and a method for testing a radio frequency device, which can finish the test of most radio frequency test parameters after the radio frequency device is connected, thereby accelerating the test efficiency, reducing the test time and reducing the manual repeated labor.
The invention provides a radio frequency device testing system, comprising: the system comprises a modulation signal test system, a network division test system, a signaling test system, a radio frequency input switch and a radio frequency output switch;
after the radio frequency device is in a working mode, when the small signal parameters of the radio frequency device need to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the network testing system; when the scene index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the modulation signal testing system; when the signaling index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the signaling test system.
Further, the modulation signal testing system includes: at least one of a radio frequency vector modulated signal source, a spectrometer, an input power meter, an output power meter, a waveform generator and a power probe.
Further, the network component test system comprises a vector network analyzer.
Further, the signaling test system comprises an integrated signaling tester.
Further, the small signal parameters include at least one of phase distortion, nonlinear distortion, network scattering characteristic parameters, output power values of different compression points and thermal state test parameters of the radio frequency device.
Further, the scene index includes at least one of a transmit power, a spurious, a harmonic, and an adjacent channel leakage of the radio frequency test device, a vector amplitude modulation, a third-order intermodulation point, a link gain, and a current.
Further, the signaling indicator includes at least one of signaling power, error vector magnitude, frequency offset, and acceptance sensitivity.
Further, the universal test device is used for controlling the radio frequency device to test in different working environments, and uploading the test result of the radio frequency device to the terminal device.
Further, the universal test equipment includes at least one of a MIPI controller, a universal asynchronous receiver transmitter, an I2C controller, a power supply, and an automatic control incubator.
The invention also provides a radio frequency device testing method, which adopts the radio frequency device testing system, and comprises the following steps:
after the radio frequency device is in a working mode, the radio frequency input switch and the radio frequency output switch are controlled to be switched to be connected with the network component testing system, and the network component testing system tests small signal parameters of the radio frequency device; controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the modulation signal testing system, and verifying scene indexes of the radio frequency device; and controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the signaling test system, and verifying the signaling index of the radio frequency device.
Further, after the radio frequency device is powered on, the network testing system is controlled to automatically configure at least one parameter including scanning start frequency, termination frequency, scanning power and scanning point number, and then the network testing system automatically tests the radio frequency device with small signal parameters.
Further, after the radio frequency device is powered on, when the scene index of the radio frequency device needs to be verified, performing at least one of reading the input power and the output power of the radio frequency device, calculating link gain, testing error vector amplitude of the radio frequency device after configuring a frequency point and a test signal type, testing adjacent channel leakage ratio of the radio frequency device after configuring the frequency point and the test signal type, testing third-order intermodulation point of the radio frequency device after configuring the frequency point and the test signal type, and operating.
Further, the radio frequency device is controlled to be tested under different working voltages, working temperatures and different test signal types.
Further, after any test is completed on the radio frequency device, uploading the test result to the terminal equipment, and classifying and archiving the test result according to different test conditions.
Compared with the prior art, the invention has at least the following beneficial effects:
according to the invention, the modulation signal testing system, the network division testing system and the signaling testing system are combined together by using the radio frequency input switch and the radio frequency output switch, so that the matching of various testing devices is realized, the testing devices are not required to be manually switched, the automation of parameter testing is realized, and the testing of various parameters such as small signal parameters, scene indexes, signaling indexes and the like of the tested radio frequency devices can be completed in one testing process by using the radio frequency device testing system and the method, so that the testing efficiency is improved.
Furthermore, the invention can realize the test of various radio frequency device parameters, and files each test result according to the test conditions after the test is completed, thereby further improving the test efficiency and simultaneously providing great convenience for the subsequent data analysis and search.
Drawings
FIG. 1 is a schematic diagram of a connection relationship of a radio frequency device testing system according to a first embodiment of the present invention;
FIG. 2 is a diagram showing a connection relationship between a modulation signal test system and a general test device in a radio frequency device test system according to an embodiment of the present invention;
FIG. 3 is a diagram showing the connection relationship between a network division test system and a general test device in a radio frequency device test system according to the first embodiment of the present invention;
FIG. 4 is a diagram showing the connection relationship between an integrated signaling tester and a general test device in a radio frequency device test system according to an embodiment of the present invention;
FIG. 5 is a diagram showing a connection relationship of a radio frequency device testing system according to a first embodiment of the present invention;
FIG. 6 is a general flowchart of a signal testing process of a radio frequency device in a second embodiment of the present invention;
FIG. 7 is a flow chart of a scene index testing process in a second embodiment of the invention;
FIG. 8 is a diagram of the S21 parameters of a RF device according to a second embodiment of the present invention;
fig. 9 is a diagram showing the ACLR versus output power of the rf device according to the second embodiment of the present invention.
Detailed Description
The following description of a system and method for testing a radio frequency device of the present invention, in conjunction with the accompanying schematic drawings, illustrates preferred embodiments of the present invention, it being understood that those skilled in the art may modify the invention described herein while still achieving the beneficial effects of the invention. Accordingly, the following description is to be construed as broadly known to those skilled in the art and not as limiting the invention.
The invention is more particularly described by way of example in the following paragraphs with reference to the drawings. The advantages and features of the present invention will become more apparent from the following description. It should be noted that the drawings are in a very simplified form and are all to a non-precise scale, merely for convenience and clarity in aiding in the description of embodiments of the invention.
Example 1
The present embodiment provides a system for testing a radio frequency device, please refer to fig. 1, including: the system comprises a modulation signal testing system, a network division testing system, a radio frequency input switch and a radio frequency output switch.
After the radio frequency device is in the operational mode,
when the small signal parameters of the radio frequency device need to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the network component test system;
when the scene index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the modulation signal testing system;
when the signaling index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the signaling test system.
Specifically, the working mode includes that when the test device is only in a power-on state, the test device can be tested for small signal parameters, and the reference performance of the test device can be tested; further, the working mode further includes that when the test device is in a working state, at this time, the test device can be subjected to scene index test and signaling test, so that the test of the actual application performance of the test device is realized.
In this example, the radio frequency device may be any one of a power amplifier, a filter, a low noise amplifier, a switch, a duplexer, and a tuner.
With continued reference to fig. 1, in a specific example, two input ends of the radio frequency input switch are respectively connected to the modulation signal testing system, the network division testing system and the signaling testing system, and an output end is connected to an input end of a radio frequency device; the input end of the radio frequency output switch is connected with the output end of the radio frequency device, and the output end of the radio frequency output switch is respectively connected with the modulation signal test system, the network component test system and the signaling test system.
The modulation signal testing system, the network division testing system and the signaling testing system are combined together by using the radio frequency input switch and the radio frequency output switch, so that the matching of various testing devices is realized, the testing devices are not required to be manually switched, the automation of parameter testing is realized, and the testing of various parameters such as small signal parameters, scene indexes, signaling indexes and the like of the tested radio frequency devices can be completed in one testing process by using the radio frequency device testing system and the method, so that the testing efficiency is improved.
Further, referring to fig. 2, the modulated signal testing system includes at least one of a radio frequency vector modulated signal source, a spectrometer, an input power meter, an output power meter, a waveform generator, and a power probe. The scene index includes at least one of transmit power, spurious, harmonic, adjacent channel leakage, vector amplitude modulation, third order intermodulation, link gain, and current of the radio frequency test device.
The waveform generator may be used to generate test signals of different waveforms; the radio frequency vector modulation signal source is used for generating radio frequency signals with different amplitudes, frequencies and phases; the power probe is used for measuring the power output of the radio frequency device; the input power meter and the output power meter can measure the input power and the output power of the radio frequency device, and the link gain can be calculated according to the input power and the output power; the frequency spectrograph is used for testing the distortion degree, modulation degree, frequency stability and intermodulation distortion of the signal.
It will be appreciated that the choice of test means in a modulated signal testing system is not limited to the above, and that different test means may need to be chosen depending on the specific test parameters.
Further, referring to fig. 3, the network testing system includes a vector network analyzer. The small signal parameters include at least one of the phase distortion (AM/PM distortion), nonlinear distortion (AM/AM distortion), network scattering characteristic parameters (S parameters), output power values of different compression points (e.g., P1dB compression point), and thermal state test parameters (High-power S22).
The vector network analyzer may be based on real-time measurements of the input signal, including amplitude and phase information, and then decode and analyze the measurements through complex signal processing algorithms and models. Such analysis may include frequency response, phase response, gain compression, group delay, and so forth, so that the performance and behavior of the system may be fully understood.
Further, the signaling test of the radio frequency device is mainly to simulate the communication process between the base station and the equipment. Referring to fig. 4, the signaling testing system includes an integrated signaling tester and a load, so as to implement signaling testing of a radio frequency device, the load is connected with the radio frequency device through the radio frequency input switch, the integrated signaling tester is connected with a radio frequency output switch, and the radio frequency output switch is also connected with another load. The signaling test system is used for testing at least one parameter of the transmitting power, the receiving sensitivity, the frequency deviation, the Error Vector Magnitude (EVM) and the Adjacent Channel Leakage Ratio (ACLR) of the tested radio frequency device.
The embodiment further includes a general test device, where the general test device includes at least one of an MIPI controller (mobile industry processor interface controller), a power supply, and an automatic control incubator, and is configured to control the radio frequency device to perform testing under different working environments, for example: testing under different working voltages and different working temperatures, and uploading the testing result of the radio frequency device to terminal equipment.
Preferably, the MIPI controller may be replaced by a Universal asynchronous receiver transmitter or an I2C controller (Inter-Integrated Circuit).
By way of example, the modulation signal testing system and the network division testing system may be connected in the manner illustrated in fig. 5:
specifically, a power supply is used for powering up the radio frequency device; the waveform generator generates electric signals with different frequencies, waveforms and amplitudes, and the waveform generator is combined with the radio frequency vector modulation signal source to generate test signals with different frequencies, different amplitudes and different types, and the test signals are controlled and input to the radio frequency device through an MIPI controller (also can be a universal asynchronous receiving and transmitting transmitter or a controller such as an I2C controller); the input power meter is connected with the radio frequency vector modulation signal source and is used for measuring and recording the power of the input test signal. The output power meter is combined with the output switch and used for recording the output power of the radio frequency device, and the output of the waveform generator and the output of the radio frequency device are input into the frequency spectrograph so as to test parameters such as signal frequency, amplitude, phase and frequency response. The vector network analyzer is independently used as a test path to be respectively connected with the input switch and the output switch for testing the small signal parameters of the radio frequency device.
Therefore, after the tested device is connected once, the radio frequency device testing system provided by the embodiment can complete the testing of most radio frequency testing parameters, obtain the basic performance overall view of the tested radio frequency device, and further reduce the efficiency of the device testing link in the radio frequency research and development process.
Example two
The present embodiment provides a method for testing a radio frequency device, with reference to fig. 6, by adopting the radio frequency device testing system in the first embodiment, the method includes:
after the radio frequency device is in a working mode, the radio frequency input switch and the radio frequency output switch are controlled to be switched to be connected with the network component testing system, and the network component testing system tests small signal parameters of the radio frequency device; controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the modulation signal testing system, and verifying scene indexes of the radio frequency device; and controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the signaling test system, and verifying the signaling index of the radio frequency device.
Further, the embodiment controls the radio frequency device to test under different working voltages, working temperatures and different test signal types by adjusting the radio frequency device with the test equipment so that the radio frequency device is in a working mode.
Referring to fig. 6 again, when the small signal parameter test of the radio frequency device is performed, the radio frequency input switch and the radio frequency output switch are controlled to be switched to be connected with the vector network analyzer, and the specific test process includes:
1.1. the input switch and the output switch are switched to the vector network analysis test path.
1.2. The temperature of the incubator is monitored and controlled to be raised to a specified temperature T in real time by a communication interface of the terminal equipment 1 。
1.3 terminal Equipment control Power supply set to the specified Voltage V 1 Providing a power supply voltage for the radio frequency device;
1.4 terminal device issuing Command C 1 The MIPI controller (or I2C controller or UART controller) is controlled to make the chip work on power.
1.5 terminal device issues command to control vector network analyzer, and configures the initial frequency f of required scanning 1 Termination frequency f 2 Power P of scan VNA And index such as the number of points, etc., thus test the radio frequency device.
1.6 changing the chip operating Voltage V 1 Target temperature T of incubator 1 And a switch control command C 1 Repeating the steps 1.2-1.5 to obtain a plurality of groups of test data.
And 1.7, the terminal equipment detects and transmits a plurality of groups of test results output by the vector network analyzer through the network port, and files, classifies and stores the test results according to the test conditions.
In a specific example, bringing specific test data into the test procedure described above, it is possible to:
1.1.1 input and output switches are switched to the vector network analysis test path.
1.2.1 real-time monitoring and controlling the temperature of the incubator to be raised to the designated temperature of 25 ℃ by a communication interface of the terminal equipment.
1.3.1 terminal equipment controls a power supply to be set to a specified voltage of 3.4V, and provides a power supply voltage for the radio frequency device;
1.4.1 terminal device issuing Command C 1 Control of MIPI controlAnd the controller (or an I2C controller, a UART controller and the like) is adopted to enable the chip to work in a power-on mode.
1.5.1 terminal Equipment issues a Command to control the vector network analyzer, configuring the starting frequency f of the required scanning 1 =1000 MHz, termination frequency f 2 7000MHz, scanned power P VNA Parameter indexes such as = -20dBm, intermediate frequency bandwidth 1kHz, point number 121 and the like, and the vector network analyzer starts testing.
1.6.1 changing the chip operating Voltage V 1 Target temperature T of incubator 1 And a switch control command C 1 Repeating the steps 1.2.1-1.5.1 to obtain a plurality of groups of test data.
1.7.1 terminal equipment detects and transmits a test result output by a vector network analyzer through a network cable port, a GPIB (general purpose interface bus), a serial port or a USB (universal serial bus), and files, classifies and stores the test result according to test conditions to obtain the following table data:
TABLE 1
Further, the terminal device obtains test data and pictures of the network analyzer through a network cable port, GPIB, serial port or USB, and draws an S21 (scattering parameter S21) parameter diagram shown in FIG. 7, so that the test data is visualized.
The small signal parameters of the radio frequency device can be accurately verified and displayed through the vector network analyzer, and the small signal parameters comprise at least one of amplitude modulation signals, reflection coefficients, transmission coefficients, output power values of different compression points and thermal state test parameters. And judging whether the reference performance of the radio frequency device is normal, and if the parameters are normal, performing subsequent scene index test.
Specifically, after the small signal parameter test of the radio frequency device is completed, when the scene index test of the radio frequency device is performed, the radio frequency input switch and the radio frequency output switch are controlled to be switched to be connected with the modulation signal test system, please refer to fig. 8, and the specific test process includes:
2.1 input and output switches are switched to the modulated signal test path.
2.2 the terminal equipment generates the modulation signals (such as 4G/5G test signals and double-tone test signals) required by the test scene, downloads the modulation signals to the radio frequency vector modulation signal source to play signals, and sets the initial frequency f 1 And initial power P SG The radio frequency vector modulated signal source is turned on.
2.3 configuring the input Power Meter and output Power Meter frequencies, respectively reading the input P in And output power P out And calculating to obtain the link gain.
2.4 configuring a spectrometer, setting frequency points in the spectrometer, and selecting test items of the spectrometer, such as EVM, ACLR, third-order intermodulation points, harmonic waves, power spectral density and the like.
2.5 changing the following test conditions, and repeating the steps 2.2-2.5:
2.5.1 input P in Power, for example: each time in 1dB steps.
2.5.2 switching test frequency f 1 。
2.5.3 adjusting the chip operating Voltage V 1 。
2.5.4 changing the temperature tank target temperature T 1 。
2.5.5 switch control command C 1 。
2.6 terminal equipment collects the data tested by the above equipment through network cable ports, GPIB (general purpose interface bus), serial ports or USB (universal serial bus) and other external ports, and files and sorts the records according to the test conditions.
In a specific example, bringing specific test data into the test procedure described above, it is possible to:
2.1.1 switching of input switch to 50 output switch to modulation signal test path.
2.2.1 generating a 4G test signal according to the 3gpp 136.101 protocol, e.g. FDD 10M LTE QPSK 50RB waveform signal input radio frequency vector modulated signal source, and setting the frequency f 1 =829 MHz sum power P SG And (3) turning on a radio frequency vector modulation signal source to input the test signal to the radio frequency device, wherein the range of the test signal is between 11dBm and 11 dBm.
2.3.1 formulationSetting the frequency of the input power meter and the output power meter, and respectively reading the input P in = -10dBm and output power P out =18.1 dBm, and the link Gain gain=p is calculated out -P in ＝29.5dB。
2.4.1 configuring a Spectrum, setting a frequency Point f 1 =829 MHz and test signal FDD 20M LTE QPSK 100RB, respectively switching spectrometer test items, reading and recording evm=0.8%, aclr= -42dBc.
2.5.1 changing the following test conditions, repeating steps 2.2.1-2.5.1:
(1) Input P in Power, for example: each time in 1dB steps.
(2) Switching test frequency f 1 。
(3) Adjusting the working voltage V of the chip 1 。
(4) Changing the temperature of the target temperature T of the temperature box 1 。
(5) Switch control command C 1 。
2.6.1 terminal equipment collects the data tested by the above equipment through network cable ports, GPIB (general purpose interface bus), serial ports or USB (universal serial bus) and other external ports, files and sorts the records according to the test conditions, and obtains the table 2:
TABLE 2
Further, the terminal equipment obtains test data and pictures of the network analyzer through a network cable port, GPIB, serial port or USB, and draws and obtains an ACLR comparison output power diagram shown in FIG. 9, so that the test data is further visualized.
The modulation signal testing system can accurately test key indexes such as transmitting power, spurious, harmonic wave and adjacent channel leakage, EVM, third-order intermodulation point, link gain, current and the like of the radio frequency device, and the automatic test of the parameters reflects the working performance of the testing device in practical application and finally reflects whether the testing device can meet the design requirement.
Further, after the scenario indicator test of the radio frequency device is completed, the integral signaling tester may be used to evaluate the signaling performance indicator of the radio frequency chip, please refer to fig. 6, and the specific test process is as follows:
and 3.1, switching the input switch and the output switch to a signaling test path and connecting the signaling test path and the signaling test path with the integrated signaling tester.
3.2 configuring the integrated signaling tester to the required test scenarios, such as Channel (CH), bandwidth (BW), and number of subcarriers (RB), etc.
And 3.3, after the signaling connection of the radio frequency device is successful, starting to test signaling indexes, wherein the signaling indexes comprise signaling power, EVM, ACLR and the like.
3.4 changing the following test conditions and repeating steps 3.2-3.3:
3.4.1 switching test channel, bandwidth or number of subcarriers.
3.4.2 adjusting the RF device to obtain the operating voltage V 1 。
3.4.3 changing the temperature tank target temperature T 1 。
3.4.4 Handover control Command C 1 。
And 3.5, the terminal equipment collects signaling index test data through network cable ports, GPIB, serial ports or USB and other external ports, and files and sorts the records according to test conditions. For example: catalog format is \temperature T 1 Command c1\channel ch_bandwidth bw_subcarrier number rb\.
In a specific example, bringing specific experimental data into the test procedure described above, it is possible to obtain:
3.1.1 input switches are switched to a 50ohm load and output switches are switched to the signaling test path.
3.2.1 configuring the integrated signaling tester to the required test scenario, e.g., ch=23230, bw=10m, rb=50r.
And 3.3.1, after the signaling connection of the radio frequency device is successful, starting to test signaling indexes, wherein the signaling indexes comprise signaling power, EVM, ACLR and the like.
3.4.1 changing the following test conditions, repeating steps 3.2.1-3.3.1:
(1) The test channel, bandwidth, or number of subcarriers are switched.
(2) Adjusting the RF device to obtain the working voltage V 1 。
(3) Changing the temperature of the target temperature T of the temperature box 1 。
(4) Switch control command C 1 。
And 3.5.1, the terminal equipment collects signaling index test data through a network cable port, GPIB, serial port or USB and other external ports, and files and sorts the records according to test conditions. And gives table 3:
TABLE 3 Table 3
The signaling test has the advantages of comprehensiveness, functionality, compatibility, reliability, economy and the like in the radio frequency device test, can help us comprehensively evaluate the performance and quality of the radio frequency device, discover and solve potential problems, and ensure the reliability and stability of the radio frequency device. Providing reliable basis for subsequent optimization or device shaping.
It will be appreciated by those skilled in the art that the specific testing process is not limited to the above, and that specific testing conditions and the testing sequence of small signal parameters and scene indicators may be selected according to the actual situation.
In summary, the embodiment integrates the testing device including the radio frequency vector modulation signal source, the switch, the spectrometer, the waveform generator and the power probe into the modulation signal testing system through the radio frequency switch, and integrates the modulation signal testing system with the network division testing system including the vector network analyzer, in addition, the universal testing equipment provides different working environments for the radio frequency device, and in one testing process, multiple tests on two types of parameters including the small signal parameter and the scene index of the tested radio frequency device under different working environments can be completed, thereby improving the testing efficiency. And in addition, each test result is accurately filed and classified according to the test conditions through the external terminal equipment, so that great convenience is provided for subsequent data analysis and searching.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (14)
1. A radio frequency device testing system, comprising: the system comprises a modulation signal test system, a network division test system, a signaling test system, a radio frequency input switch and a radio frequency output switch;
after the radio frequency device is in a working mode, when the small signal parameters of the radio frequency device need to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the network testing system; when the scene index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the modulation signal testing system; when the signaling index of the radio frequency device needs to be verified, the radio frequency input switch and the radio frequency output switch are switched to be connected with the signaling test system.
2. The radio frequency device testing system of claim 1, wherein the modulation signal testing system comprises: at least one of a radio frequency vector modulated signal source, a spectrometer, an input power meter, an output power meter, a waveform generator and a power probe.
3. The radio frequency device testing system of claim 1, wherein the network component testing system comprises a vector network analyzer.
4. The radio frequency device testing system of claim 1, wherein the signaling testing system comprises an integrated signaling tester.
5. The radio frequency device testing system of claim 1, wherein the small signal parameters include at least one of phase distortion, nonlinear distortion, network scattering characteristic parameters, output power values at different compression points, and thermal state test parameters.
6. The radio frequency device testing system of claim 1, wherein the scenario indicator comprises at least one of a transmit power, a spur, a harmonic, an adjacent channel leakage, a vector amplitude modulation, a third order intermodulation point, a link gain, and a current of a radio frequency test device.
7. The radio frequency device testing system of claim 1, wherein the signaling indicator comprises at least one of signaling power, error vector magnitude, frequency offset, and acceptance sensitivity.
8. The radio frequency device testing system of claim 1, further comprising a generic test device;
the universal test equipment is used for controlling the radio frequency device to be tested in different working environments and uploading the test result of the radio frequency device to the terminal equipment.
9. The radio frequency device testing system of claim 8, wherein the universal test equipment comprises at least one of a MIPI controller, a universal asynchronous receiver transmitter, an I2C controller, a power supply, and an automatic control incubator.
10. A method of testing a radio frequency device using the radio frequency device testing system of any of claims 1-9, the method comprising:
after the radio frequency device is in a working mode, the radio frequency input switch and the radio frequency output switch are controlled to be switched to be connected with the network component testing system, and the network component testing system tests small signal parameters of the radio frequency device; controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the modulation signal testing system, and verifying scene indexes of the radio frequency device; and controlling the radio frequency input switch and the radio frequency output switch to be switched to be connected with the signaling test system, and verifying the signaling index of the radio frequency device.
11. The method of claim 10, wherein after the radio frequency device is in the operation mode, the network testing system is controlled to automatically configure at least one parameter selected from a group consisting of a scan start frequency, a scan end frequency, a scan power and a scan count, and then automatically perform a test on the small signal parameters of the radio frequency device.
12. The method of testing a radio frequency device according to claim 10, wherein after controlling the radio frequency device in the operation mode, when a scene index of the radio frequency device needs to be verified, performing at least one of reading an input power and an output frequency of the radio frequency device and calculating a link gain, testing an error vector magnitude of the radio frequency device after configuring a frequency point and a test signal type, testing an adjacent channel leakage ratio of the radio frequency device after configuring a frequency point and a test signal type, and testing a third-order intermodulation point of the radio frequency device after configuring a frequency point and a test signal type.
13. The method of claim 11 or 12, wherein the radio frequency device is controlled to be tested at different operating voltages, operating temperatures and different test signal types.
14. The method for testing a radio frequency device according to claim 13, wherein after any one of the tests is completed, the test result is uploaded to a terminal device, and the test result is classified and filed according to different test conditions.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN118033386A (en) * | 2024-04-15 | 2024-05-14 | 上海知白智能科技有限公司 | Chip testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN118033386A (en) * | 2024-04-15 | 2024-05-14 | 上海知白智能科技有限公司 | Chip testing device |
| CN118033386B (en) * | 2024-04-15 | 2024-06-07 | 上海知白智能科技有限公司 | Chip testing device |
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