CN111707893A - Amplifier testing device - Google Patents
Amplifier testing device Download PDFInfo
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- CN111707893A CN111707893A CN202010563680.3A CN202010563680A CN111707893A CN 111707893 A CN111707893 A CN 111707893A CN 202010563680 A CN202010563680 A CN 202010563680A CN 111707893 A CN111707893 A CN 111707893A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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Abstract
The invention discloses an amplifier testing device, which comprises a testing module, a control terminal and a radio frequency switch, wherein the control terminal and the radio frequency switch are connected with an amplifier to be tested; the testing module constructs at least one group of testing loops for testing the amplifier to be tested through the radio frequency switch, and the group of testing loops comprise a triggering channel and a testing channel; the control terminal is used for: controlling the radio frequency switch to communicate with the trigger channel of the selected test loop, further enabling the amplifier to be tested to receive the trigger signal sent by the test module through the trigger channel, and generating a signal to be tested according to the trigger signal; controlling the radio frequency switch to communicate with the test channel of the selected test loop, and further enabling the amplifier to be tested to output a signal to be tested to the test module through the test channel; and controlling the test module to perform test analysis on the signal to be tested and receiving a test analysis result output by the test module. The test process of the invention is quicker and safer, and the test result is more accurate and complete.
Description
Technical Field
The invention relates to the technical field of amplifier testing, in particular to an amplifier testing device.
Background
With the development of mobile communication technology, the requirements for the rf power amplifier in the communication system are higher and higher, and the quality of the rf power amplifier determines the quality of the whole communication system, so it is important to test and control the performance of the rf power amplifier.
In the test system of the radio frequency power amplifier in the prior art, the radio frequency power amplifier is subjected to simple performance analysis mainly through a fixed signal generation source and a signal analysis device, and the test analysis result generated by the scheme is often low in accuracy and cannot accurately reflect the performance information of the radio frequency power amplifier; in addition, the test system in the prior art can only test a part of radio frequency power amplifiers matched with the test requirements, so that the applicability is low, and the test process is not intelligent enough.
Disclosure of Invention
The embodiment of the invention provides an amplifier testing device, which aims to improve the applicability of the amplifier testing device and improve the intelligence of the amplifier testing device.
An amplifier testing device comprises a testing module, a control terminal and a radio frequency switch, wherein the control terminal and the radio frequency switch are connected with an amplifier to be tested; the test module is connected with the radio frequency switch and the control terminal; the radio frequency switch is connected with the control terminal; the test module constructs at least one group of test loops for testing the amplifier to be tested through the radio frequency switch, and the group of test loops comprise a trigger channel and a test channel;
the control terminal is used for:
after a group of test loops are selected according to a preset selection rule, controlling the radio frequency switch to communicate with a trigger channel of the selected test loop, so that the amplifier to be tested receives a trigger signal sent by the test module through the trigger channel, and generating a signal to be tested according to the trigger signal;
controlling the radio frequency switch to communicate with the selected test channel of the test loop, and further enabling the amplifier to be tested to output the signal to be tested to the test module through the test channel;
and controlling the test module to test and analyze the signal to be tested and receiving a test and analysis result output by the test module.
The amplifier testing device comprises a testing module, a control terminal and a radio frequency switch, wherein the control terminal and the radio frequency switch are connected with an amplifier to be tested; the testing module constructs at least one group of testing loops for testing the amplifier to be tested through the radio frequency switch, and the group of testing loops comprise a triggering channel and a testing channel; the control terminal is used for: controlling the radio frequency switch to communicate with the trigger channel of the selected test loop, further enabling the amplifier to be tested to receive the trigger signal sent by the test module through the trigger channel, and generating a signal to be tested according to the trigger signal; controlling the radio frequency switch to communicate with the test channel of the selected test loop, and further enabling the amplifier to be tested to output a signal to be tested to the test module through the test channel; and controlling the test module to perform test analysis on the signal to be tested and receiving a test analysis result output by the test module. The test process of the invention is quicker and safer, and the test result is more accurate and complete.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.
FIG. 1 is a schematic block diagram of an amplifier test apparatus according to an embodiment of the present invention;
FIG. 2 is another schematic block diagram of an amplifier test apparatus in an embodiment of the invention;
FIG. 3 is another schematic block diagram of an amplifier test apparatus in an embodiment of the invention;
FIG. 4 is another schematic block diagram of an amplifier test apparatus according to an embodiment of the invention.
Wherein, in the figures, the respective reference numerals:
11-a control terminal; 12-a test module; 13-a radio frequency switch; 14-an amplifier to be tested; 15-a coupler; 16-a power monitoring module; 17-a power supply module; 18-a communication module; 19-a forwarding module; 121-a spectrum analysis module; 122-a noise source module; 123-a signal generation module; 124-vector network analysis module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In one embodiment, as shown in fig. 1, an amplifier testing apparatus is provided, which includes a testing module 12, and a control terminal 11 and a radio frequency switch 13 both connected to an amplifier 14 to be tested; the test module 12 is connected with the radio frequency switch 13 and the control terminal 11; the radio frequency switch 13 is connected with the control terminal 11; the test module 12 constructs at least one group of test loops for testing the amplifier to be tested 14 through the radio frequency switch 13, wherein one group of test loops comprises a trigger channel and a test channel;
wherein, the test module 12 sends a trigger signal to the amplifier to be tested 14 through the trigger channel, and the amplifier to be tested 14 sends a signal to be tested to the test module 12 through the test channel. The Amplifier to be tested 14 may be a chip or a communication unit that needs to be tested, such as a Low Noise Amplifier (LNA) or a Power Amplifier (PA).
The radio frequency switch 13 may be a single-pole multi-throw switch, and the radio frequency switch 13 is used for switching different test loops, that is, switching different trigger channels and test channels to realize switching different test loops, so that the test module 12 performs diversity test analysis on a signal to be tested sent by the amplifier 14 to be tested; and the radio frequency sub-switch is used for switching to the test module so as to communicate the test channel. The control terminal 11 is configured to implement automatic testing of the amplifier to be tested 14 by the control test module (that is, a user may input a corresponding test logic code in the control terminal 11 according to a test requirement, after the test logic code is input, the control terminal 11 may automatically identify the input test logic code, and control the test module in the amplifier testing apparatus to test the amplifier to be tested 14 by the identified test logic code, thereby implementing automatic testing), and the control terminal 11 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and portable wearable devices. Optionally, the control terminal 11 may be directly connected to the amplifier to be tested 14 (at this time, the connection between the control terminal and the amplifier to be tested should be satisfied in a manner that the control terminal establishes a communication connection with the amplifier to be tested on the basis of supplying power to the amplifier to be tested); the control terminal 11 may also be connected to the amplifier to be tested 14 through an intermediate module such as a communication module or a power supply module.
The control terminal 11 is configured to:
after selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch 13 to switch to communicate with the trigger channel of the selected test loop, so that the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel, and generates a signal to be tested according to the trigger signal.
The preset selection rule may refer to randomly selecting any test loop, or selecting according to a test requirement. The trigger signal is a signal for triggering the amplifier under test 14 to generate a signal under test, and sending the signal to the test module 12 for testing. The trigger signal may be at least one of a noise signal, a radio frequency signal, or a trigger instruction containing a noise signal or a radio frequency signal. The signal to be tested is a signal obtained by amplifying the received signal by the amplifier to be tested 14.
Specifically, after selecting a group of test loops according to a preset selection rule, the control terminal 11 controls the radio frequency switch 13 to switch to the test module 12 to communicate with the trigger channel in the selected test loop, so that the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel (understandably, when the radio frequency switch 13 does not switch the trigger channel communicating with the selected test loop, the amplifier to be tested 14 cannot receive the trigger signal sent by the test module 12 through the trigger channel), and generates the signal to be tested according to the trigger signal, so that the test module 12 performs test analysis on the signal to be tested.
Further, the rf switch 13 is composed of two rf sub-switches (a first rf sub-switch and a second rf sub-switch), that is, after a group of test loops is selected according to a preset selection rule, the control terminal 11 controls the first rf sub-switch to connect the trigger channel in the selected test loop. It is understood that the first rf sub-switch and the second rf sub-switch are independent from each other; preferably, when the first rf sub-switch is switched to connect the trigger channel of the selected test loop, the second rf sub-switch may be set to make no switching action. According to the test requirement, when the first rf sub-switch is switched to connect the trigger channel of the selected test loop, the second rf sub-switch may also be set to perform the switching action at the same time.
And controlling the radio frequency switch 13 to switch to communicate with the selected test channel of the test loop, so that the amplifier to be tested 14 outputs the signal to be tested to the test module 12 through the test channel.
Specifically, after the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel and generates the signal to be tested according to the trigger signal, the control terminal 11 controls the second radio frequency sub-switch in the radio frequency switch 13 to switch to the test module 12 so as to communicate with the test channel of the selected test loop, and further, the amplifier to be tested 14 outputs the signal to be tested to the test module 12 through the test channel.
And controlling the test module 12 to perform test analysis on the signal to be tested, and receiving a test analysis result output by the test module 12.
The test analysis result may be power data, a noise coefficient, sensitivity, or the like corresponding to the signal to be tested.
Specifically, after the amplifier to be tested 14 outputs the signal to be tested to the test module 12 through the test channel, the control terminal 11 controls the test module 12 to perform test analysis on the signal to be tested, and receives the test analysis result output by the test module 12 after the test module 12 generates the test analysis result corresponding to the signal to be tested.
Preferably, the control terminal 11 may be configured to display the test analysis result on a display screen of the control terminal 11 after receiving the test analysis result, or the control terminal 11 may send the test analysis result to a mobile terminal of the user for display, so as to generate a test analysis report corresponding to the test analysis result.
In the embodiment, the radio frequency switch 13 is controlled to switch different test loops to test the amplifier under test 14, and the control terminal 11 is accessed to implement automatic testing of the amplifier under test 14.
In one embodiment, the test module 12 includes a spectrum analysis module 121 and a noise source module 122; the spectrum analysis module 121 is connected to the radio frequency switch 13 and the control terminal 11; the noise source module 122 is connected between the spectrum analysis module 121 and the radio frequency switch 13 module; the test loop comprises a first loop; the first loop comprises a first trigger channel constructed by the spectrum analysis module 121, the noise source module 122 and the radio frequency switch 13 which are connected in sequence, and a first test channel constructed by the radio frequency switch 13 and the spectrum analysis module 121 which are connected in sequence;
the Spectrum Analyzer module 121 is substantially a Spectrum Analyzer (SA), and the Spectrum Analyzer module 121 is configured to measure and analyze signal parameters such as distortion degree, frequency stability, intermodulation distortion, and the like of the signal to be tested, and to provide a pulse voltage to the noise source module 122 to drive the noise source module 122 to generate a noise signal. The noise source module 122 is used to generate a random continuous spectrum signal (i.e., a noise signal).
After selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch 13 to switch to communicate with the trigger channel of the selected test loop, so that the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel, and generates a signal to be tested according to the trigger signal, including:
after the first test loop is selected according to the preset selection rule, the spectrum analysis module 121 is controlled to drive the noise source module 122 to generate a noise signal.
Specifically, after the first test loop is selected according to the preset selection rule, the control terminal 11 controls the spectrum analysis module 121 to provide a pulse voltage (preferably, the pulse voltage is + 28V) to the noise source module 122, so as to drive the noise source module 122 to generate a noise signal.
The rf switch 13 is controlled to switch to the noise source module 122, so as to connect the first triggering channel.
Specifically, after controlling the spectrum analysis module 121 to drive the noise source module 122 to generate the noise signal, the control terminal 11 controls the first rf sub-switch in the rf switch 13 to switch to the noise source module 122, so as to connect the first trigger channel.
The amplifier to be tested 14 receives the noise signal sent by the noise source module 122 through the first trigger channel, and amplifies the noise signal.
Specifically, after controlling the radio frequency switch 13 to switch to the noise source module 122 to connect the first trigger channel, the control terminal 11 causes the amplifier to be tested 14 to receive the noise signal sent by the noise source module 122 through the first trigger channel, and amplifies the noise signal.
The controlling the radio frequency switch 13 to switch to communicate the selected test channel of the test loop, so that the amplifier to be tested 14 outputs the signal to be tested to the test module 12 through the test channel includes:
the rf switch 13 is controlled to switch to the spectrum analysis module 121, so as to connect the first test channel.
Specifically, after the amplifier to be tested 14 receives the noise signal sent by the noise source module 122 through the first trigger channel and amplifies the noise signal, the second radio frequency sub-switch in the radio frequency switch 13 is controlled to be switched to the spectrum analysis module 121, so as to connect the first test channel.
The amplifier to be tested 14 outputs the amplified noise signal to the spectrum analysis module 121 through the first test channel.
Specifically, after the radio frequency switch 13 is controlled to be switched to the spectrum analysis module 121 to connect the first test channel, the control terminal 11 enables the amplifier to be tested 14 to output the amplified noise signal to the spectrum analysis module 121 through the first test channel, so that the spectrum analysis module 121 performs test analysis on the amplified noise signal.
The controlling the test module 12 to perform test analysis on the signal to be tested and receive the test analysis result output by the test module 12 includes:
the spectrum analysis module 121 is controlled to perform test analysis on the amplified noise signal, and receive a first test analysis result output by the spectrum analysis module 121.
The essence of the first test analysis result is the noise figure of the amplifier under test 14 (for example, the amplifier under test 14 in this embodiment is a low noise amplifier).
Specifically, after the amplifier to be tested 14 outputs the amplified noise signal to the spectrum analysis module 121 through the first test channel, the spectrum analysis module 121 is controlled to perform test analysis on the amplified noise signal to obtain an amplified noise signal coefficient; comparing the pre-calibrated noise coefficient with the amplified noise signal coefficient to obtain the noise coefficient of the amplifier 14 to be tested, namely a first test analysis result; the control terminal 11 receives the first test analysis result. Optionally, the first test analysis result may also be displayed on a display screen of the control terminal 11.
Wherein, the noise coefficient of the amplifier to be tested 14 is the difference between the amplified noise signal coefficient and the pre-calibrated noise coefficient. Further, the pre-calibrated noise figure is preset by the amplifier under test 14 at the time of factory shipment, the pre-calibrated noise figure is related to the frequency of the noise source module 122, and the pre-calibrated noise figure cannot be set too small. Illustratively, the pre-calibrated noise figure may range between 3dB and 7 dB.
In one embodiment, the test module 12 further includes a signal generation module 123; the control terminal 11 and the radio frequency switch 13 are both connected with the signal generating module 123; the test loop comprises a second loop; the second loop includes a second trigger channel constructed by the signal generating module 123 and the rf switch 13 connected in sequence, and a second test channel constructed by the rf switch 13 and the spectrum analyzing module 121 connected in sequence.
The signal generating module 123 is essentially a signal generating source, i.e. a Signal Generator (SG), and the signal generating module 123 is a device for providing electrical signals with various frequencies, waveforms and output levels.
After selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch 13 to switch and connect the trigger channel of the selected test loop, so that the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel, and generates a signal to be tested according to the trigger signal, including:
after the second test loop is selected according to the preset selection rule, the rf switch 13 is controlled to switch to the signal generating module 123, so as to connect the second trigger channel.
Specifically, after the second test loop is selected according to the preset selection rule, the control terminal 11 controls the first rf sub-switch in the rf switch 13 to switch to the signal generating module 123, so as to connect the second trigger channel.
The amplifier to be tested 14 receives the radio frequency signal sent by the signal generating module 123 through the second trigger channel, and generates a first signal to be tested according to the radio frequency signal.
The radio frequency signal is an electric wave with a certain transmission frequency. The first signal to be tested is a signal generated by the amplifier to be tested 14 according to the radio frequency signal.
Specifically, after controlling the radio frequency switch 13 to switch to the signal generating module 123 to connect the second trigger channel, the control terminal 11 causes the amplifier to be tested 14 to receive the radio frequency signal sent by the signal generating module 123 through the second trigger channel, and generates the first signal to be tested corresponding to the radio frequency signal according to the radio frequency signal.
The controlling the radio frequency switch 13 to switch and connect the selected test channel of the test loop so that the test amplifier outputs the signal to be tested to the test module 12 through the test channel includes:
and controlling the radio frequency switch 13 to switch to the spectrum analysis module 121 so as to connect the second test channel.
Specifically, after the amplifier to be tested 14 receives the radio frequency signal sent by the signal generating module 123 through the second trigger channel and generates the first signal to be tested according to the radio frequency signal, the control terminal 11 controls the second radio frequency sub-switch of the radio frequency switch 13 to switch to the spectrum analyzing module 121, so as to connect the second test channel.
The amplifier to be tested 14 outputs the first signal to be tested to the spectrum analysis module 121 in the ready-to-test state through the second test channel.
Specifically, after controlling the rf switch 13 to switch to the spectrum analysis module 121 to connect the second test channel, the control terminal 11 causes the amplifier to be tested 14 to output the first signal to be tested to the spectrum analysis module 121 in the ready-to-test state through the second test channel. When the radio frequency switch 13 is controlled to switch to the signal generating module 123 to connect the second trigger channel, the signal generating module 123 sends a trigger instruction to the spectrum analyzing module 121 in addition to the radio frequency signal, so as to make the spectrum analyzing module 121 in a ready-to-test state.
The controlling the test module 12 to perform test analysis on the signal to be tested and receive the test analysis result output by the test module 12 includes:
the spectrum analysis module 121 is controlled to perform test analysis on the first signal to be tested, and receive a second test analysis result output by the spectrum analysis module 121.
The second test analysis result may be radio frequency index data such as output power data, signal reception sensitivity, noise coefficient data, or the like in the radio frequency index data.
Specifically, after the amplifier to be tested 14 outputs the first signal to be tested to the spectrum analysis module 121 in the ready-to-test state through the second test channel, the control terminal 11 controls the spectrum analysis module 121 to perform test analysis on the first signal to be tested, so that the spectrum analysis module 121 generates a second test analysis result corresponding to the first signal to be tested; the control terminal 11 receives the second test analysis result, and optionally, the second test analysis result may also be displayed on a display screen of the control terminal 11.
In one embodiment, the spectrum analysis module 121 is connected to the signal generation module 123.
The controlling the radio frequency switch 13 to switch to communicate with the signal generating module 123 includes:
when the radio frequency switch 13 is controlled to switch to connect the signal generating module 123, the control signal generating module 123 synchronously sends the first trigger instruction to the spectrum analyzing module 121, so that the spectrum analyzing module 121 enters a test-ready state.
The first trigger instruction is used to trigger the spectrum analysis module 121 to prepare for performing test analysis on the first signal to be tested output by the amplifier to be tested 14.
Specifically, when the control terminal 11 controls the first rf sub-switch of the rf switch 13 to switch to the signal generating module, so that the amplifier to be tested is connected to the signal generating module 123, the control terminal 11 controls the signal generating module 123 to generate a first trigger instruction, and synchronously sends the first trigger instruction to the spectrum analyzing module 121, so that the spectrum analyzing module 121 enters a test-ready state. The spectrum analysis module 121 and the signal generation module 123 may be connected by a synchronization line.
In one embodiment, the test module 12 further includes a vector network analysis module 124; the vector network analysis module 124 is connected to the radio frequency switch 13 and the control terminal 11; the test loop comprises a third loop; the third loop includes a third trigger channel constructed by the vector network analysis module 124 and the radio frequency switch 13 connected in sequence, and a third test channel constructed by the radio frequency switch 13 and the vector network analysis module 124 connected in sequence.
The vector network analysis module 124 is a testing device for electromagnetic wave energy, the vector network analysis module 124 may be a vector network analyzer, and preferably, in this embodiment, the vector network analysis module 124 selects a PXI (PCI extensions for Instrumentation) vector network analyzer.
After selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch 13 to switch and connect the trigger channel of the selected test loop, so that the amplifier to be tested 14 receives the trigger signal sent by the test module 12 through the trigger channel, and generates a signal to be tested according to the trigger signal, including:
after the third test loop is selected according to the preset selection rule, the rf switch 13 is controlled to switch to the vector network analysis module 124, so as to connect the third trigger channel.
Specifically, after the third test loop is selected according to the preset selection rule, the control terminal 11 controls the first rf sub-switch of the rf switch 13 to switch to the vector network analysis module 124 (i.e., controls the first rf sub-switch of the rf switch 13 to switch the output end of the vector network analysis module 124), so as to connect the third trigger channel.
The amplifier to be tested 14 receives the test trigger signal sent by the vector network analysis module 124 through the third trigger channel, and generates a second signal to be tested according to the test trigger signal.
The essence of the test trigger signal is the excitation signal sent by the vector network analysis module 124. The second signal to be tested is a signal which is output correspondingly after the amplifier to be tested 14 receives the test trigger signal sent by the vector network analysis module 124.
Specifically, after the radio frequency switch 13 is controlled to be switched to the vector network analysis module 124 so as to connect the third trigger channel, the control terminal 11 causes the amplifier to be tested 14 to receive the test trigger signal sent by the vector network analysis module 124 through the third trigger channel, and generates a second signal to be tested according to the test trigger signal.
The controlling the radio frequency switch 13 to switch and connect the selected test channel of the test loop so that the test amplifier outputs the signal to be tested to the test module 12 through the test channel includes:
and controlling the radio frequency switch 13 to switch to the vector network analysis module 124 so as to connect the third test channel.
Specifically, after the amplifier to be tested 14 receives the test trigger signal sent by the vector network analysis module 124 through the third trigger channel and generates the second signal to be tested according to the test trigger signal, the control terminal 11 controls the second rf sub-switch of the rf switch 13 to be switched to the vector network analysis module 124 (that is, controls the second rf sub-switch of the rf switch 13 to be switched to the input end of the vector network analysis module 124), so that the third test channel is connected.
The amplifier under test 14 outputs the second signal to be tested to the vector network analysis module 124 through the third test channel.
Specifically, after controlling the rf switch 13 to switch to the vector network analysis module 124 so as to connect the third test channel, the control terminal 11 causes the amplifier to be tested 14 to output the second signal to be tested to the vector network analysis module 124 through the third test channel.
The controlling the test module 12 to perform test analysis on the signal to be tested and receive the test analysis result output by the test module 12 includes:
the control vector network analysis module 124 performs test analysis on the second signal to be tested, and receives a third test analysis result output by the vector network analysis module.
The third test analysis result is mainly a result obtained by performing test analysis on the second signal to be tested, which includes the S parameter (i.e., scattering parameter, where the S parameter represents the frequency domain characteristic transmitted by the amplifier to be tested) of the amplifier 14 to be tested.
Specifically, after the amplifier to be tested 14 outputs the second signal to be tested to the vector network analysis module 124 through the third test channel, the control terminal 11 controls the vector network analysis module 124 to perform test analysis on the second signal to be tested, so as to obtain and output a third test analysis result; and the control terminal receives a third test analysis result output from the vector network module. The third test analysis result is mainly a result of performing test analysis on the S parameter of the amplifier to be tested 14 included in the second signal to be tested. Optionally, the third test analysis result may also be displayed on the display screen of the control terminal 11.
In an embodiment, the amplifier arrangement further comprises a coupler 15; the radio frequency switch 13 and the amplifier under test 14 are both connected to the coupler 15.
The coupler 15 (Couple) is a device that divides one path of microwave power into several paths of microwave power.
The causing the amplifier under test 14 to output the signal under test to the test module 12 through the test channel includes:
the amplifier under test 14 is caused to send a signal under test to the coupler 15.
According to the power distribution characteristics of the coupler 15, the coupler 15 is enabled to separate the signal to be tested into a first coupled signal and a second coupled signal, and the first coupled signal is output to the test module 12 through the test channel.
The first coupling signal and the second coupling signal are obtained by separating the signal to be tested by the coupler 15 based on the power distribution characteristic. The first coupled signal is switched to the test module 12 through the rf switch for detection and analysis. The second coupling signal is used for being sent to the power monitoring module to carry out power monitoring.
Specifically, after controlling the radio frequency switch 13 to switch to connect the selected test channel of the test loop, the amplifier to be tested 14 sends a signal to be tested to the coupler 15; based on the power distribution characteristic, the coupler 15 divides the signal to be tested into a first coupling signal and a second coupling signal, and outputs the first coupling signal to the test module 12 through the test channel, so that the test module 12 performs test analysis on the first coupling signal to obtain a test analysis result.
In an embodiment, the amplifier arrangement further comprises a power monitoring module 16; the test module 12, the coupler 15 and the control terminal 11 are all connected to the power monitoring module 16.
The power monitoring module 16 is a device for measuring power of a signal to be tested.
After the step of causing the coupler 15 to split the signal to be tested into the first coupled signal and the second coupled signal, the method further includes:
the control coupler 15 outputs the second coupled signal to the power monitoring module 16 in a ready-to-monitor state.
Specifically, after the coupler 15 is caused to split the signal to be tested into the first coupled signal and the second coupled signal according to the split attribute information of the coupler 15, the control terminal 11 controls the coupler 15 to output the second coupled signal to the power monitoring module 16 in the ready-to-monitor state.
And controlling the power monitoring module 16 to perform power monitoring on the second coupling signal, and receiving power data output by the power monitoring module 16.
The power data may be a power value corresponding to the second coupled signal.
Specifically, after controlling the coupler 15 to output the second coupling signal to the power monitoring module 16 in the ready-to-monitor state, the control terminal 11 controls the coupler 15 to output the second coupling signal to the power monitoring module 16 in the ready-to-monitor state.
Further, the second coupling signal is obtained by separating the coupler 15 based on the power distribution characteristic, so that after the power monitoring module 16 performs power monitoring on the second coupling signal to obtain power data, the power data of the signal to be tested output by the amplifier to be tested 14 is obtained according to the power distribution characteristic. For example, if the first coupled signal and the second coupled signal each have 50% of the bits of the signal to be tested according to the power distribution characteristic of the coupler 15, and the power data corresponding to the second coupled signal is 1W, the power data of the signal to be tested output by the amplifier to be tested 14 may be 2W.
In one embodiment, the controlling the rf switch 13 to switch to connect the selected trigger channel of the test loop includes:
when the radio frequency switch 13 is controlled to switch to connect the test module 12, the test module 12 is controlled to synchronously send the second trigger instruction to the power monitoring module 16, so that the power monitoring module 16 enters a ready-to-monitor state.
The second trigger instruction is used to trigger the power monitoring module 16 to prepare for test analysis of the second coupling signal output by the coupler 15.
Specifically, when the control terminal 11 controls the radio frequency switch 13 to switch to connect the test module 12, the test module 12 is controlled to generate a second trigger instruction, and the second trigger instruction is synchronously sent to the power monitoring module 16, so that the power monitoring module 16 enters a ready-to-monitor state. The test module 12 and the power monitoring module 16 may be connected by a synchronization line.
In one embodiment, the amplifier test apparatus further comprises a power module 17 and a communication module 18; the power module 17 and the communication module 18 are connected in parallel between the control terminal 11 and the amplifier to be tested 14.
Wherein, the power module 17 is used for supplying power to the amplifier to be tested 14, and preferably, the power module 17 selects the direct current power module 17. The communication module 18 is used for enabling the control terminal 11 to provide a control instruction for the amplifier under test 14.
Further, the control terminal 11 is connected to the power module 17 through a usb (universal Serial bus) line, and the power module 17 is connected to the amplifier to be tested 14 through a power line, so as to supply power to the amplifier to be tested 14.
Further, the control terminal 11 is connected with the communication module 18 through a USB cable, and the communication module 18 is connected to the amplifier to be tested 14 through a signal line, so as to provide a control instruction to the amplifier to be tested 14.
In an embodiment, the amplifier test apparatus further comprises a forwarding module 19; the control terminal 11 is connected to the radio frequency switch 13 and the test module 12 through the forwarding module 19.
The forwarding module 19 is substantially a hub or a repeater, and the forwarding module 19 is configured to forward a test analysis result obtained by the test module 12 to the control terminal 11, and also configured to transmit an instruction sent by the control terminal 11 to each module in the amplifier testing apparatus, so as to implement automatic testing of the amplifier 14 to be tested, and enable the control terminal 11 to display the test analysis result returned by the test module 12 on a display screen.
In one embodiment, as shown in fig. 4, the rf switches in the amplifier test apparatus include SW1 (SWITCH 1, i.e., the first rf sub-SWITCH) and SW2 (SWITCH 2, i.e., the second rf sub-SWITCH). SA is shown as spectrum analysis module 121; noise Source is the Noise Source module 122; SG is the signal generating module 123; UE IN is the input of the amplifier under test 14; UE OUT is the output of the amplifier under test 14; PXI OUT is the output end of the vector network analysis module 124; PXIIN is the input to the vector network analysis module 124. Specifically, SW1 and SW2 are preferably single pole, multiple throw switches, with the stationary terminal of SW1 connected to UE IN and the select terminal of SW1 connectable to any of SG, PXI OUT or Noise Source. The stationary terminal of SW2 is connected to UE OUT, and the select terminal of SW2 is connected to either SA or PXI IN. In this embodiment, controlling the switching of the rf switch includes: when the stationary end of the SW1 is connected with the UE IN, the UE IN is controlled to be connected/conducted with any one of the Noise Source, SG or Noise Source IN the selection end. When the fixed terminal of the SW2 is connected with the UE OUT, the connection/conduction of the UE OUT and any one of SA or PXI IN IN the selection terminal is controlled.
Further, after the first test loop is selected according to a preset selection rule, controlling the SA to drive the NoiseSource to generate a noise signal; when the stationary end of the SW1 is connected with the UE IN, the SW1 is switched to the connection line corresponding to the Noise Source, so that the Noise Source is communicated with the UE IN, the amplifier to be tested 14 receives the Noise signal sent by the Noise Source through the UE IN, amplifies the Noise signal, and when the stationary end of the SW2 is fixedly connected with the UE OUT, the SW2 is switched to the connection line corresponding to the SA, so that the UE OUT is communicated with the SA, and the amplifier to be tested 14 outputs the amplified Noise signal to the SA through the UE OUT, so that the SA performs test analysis on the amplified Noise signal.
Further, after the second test loop is selected according to a preset selection rule, the SG is controlled to send out a radio frequency signal; when the stationary end of the SW1 is connected with the UE IN, the SW1 is switched to the connection line corresponding to the SG, so that the SG is communicated with the UE IN, the amplifier to be tested 14 receives the radio frequency signal sent by the SG through the UE IN, generates and outputs a corresponding first signal to be tested, when the stationary end of the SW2 is fixedly connected with the UE OUT, the SW2 is switched to the connection line corresponding to the SA, so that the UE OUT is communicated with the SA, and the amplifier to be tested 14 outputs the first signal to be tested to the SA through the UE OUT, so that the SA performs test analysis on the first signal to be tested.
Further, after the third test loop is selected according to the preset selection rule, the vector network analysis module 124 is controlled to send OUT a test trigger signal through the PXI OUT; when the stationary end of the SW1 is fixedly connected to the UE IN, the SW1 is switched to the connection line corresponding to the PXI OUT, so that the PXI OUT is communicated with the UE IN, the amplifier to be tested 14 receives the test trigger signal sent by the PXIOUT through the UE IN, generates and outputs the corresponding second signal to be tested, when the stationary end of the SW2 is connected to the UE OUT, the SW2 is switched to the connection line corresponding to the PXI IN, so that the UE OUT is communicated with the PXI IN, and the amplifier to be tested 14 outputs the first signal to be tested to the PXI IN through the UE OUT, that is, outputs the first signal to be tested to the vector network analysis module 124, so that the vector network analysis module 124 performs test analysis on the first signal to be tested.
In the above embodiment, the radio frequency switch 13 is controlled to switch different test loops to test the amplifier 14 to be tested, the control terminal 11 is added to realize the automatic test of the amplifier testing device, and the test report generated after the test is displayed. In the test module 12, a noise source module 122 is introduced to improve the accuracy and comprehensiveness of the test analysis result of the amplifier test; and on the basis of introducing the noise source module 122, introducing the vector network analysis module 124 can further test and analyze the amplifier 14 to be tested, thereby increasing the test function of the amplifier test and further improving the accuracy and comprehensiveness of the test and analysis result of the amplifier test. Compared with the traditional testing device, the amplifier testing device provided by the invention has the advantages that the testing process is quicker and safer, and the testing result is more accurate and complete on the basis of realizing automatic testing.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (10)
1. The amplifier testing device is characterized by comprising a testing module, a control terminal and a radio frequency switch, wherein the control terminal and the radio frequency switch are connected with an amplifier to be tested; the test module is connected with the radio frequency switch and the control terminal; the radio frequency switch is connected with the control terminal; the test module constructs at least one group of test loops for testing the amplifier to be tested through the radio frequency switch, and the group of test loops comprise a trigger channel and a test channel;
the control terminal is used for:
after a group of test loops are selected according to a preset selection rule, controlling the radio frequency switch to communicate with a trigger channel of the selected test loop, so that the amplifier to be tested receives a trigger signal sent by the test module through the trigger channel, and generating a signal to be tested according to the trigger signal;
controlling the radio frequency switch to communicate with the selected test channel of the test loop, and further enabling the amplifier to be tested to output the signal to be tested to the test module through the test channel;
and controlling the test module to test and analyze the signal to be tested and receiving a test and analysis result output by the test module.
2. The amplifier test apparatus of claim 1, wherein the test module comprises a spectral analysis module and a noise source module; the spectrum analysis module is connected with the radio frequency switch and the control terminal; the noise source module is connected between the spectrum analysis module and the radio frequency switch module; the test loop comprises a first loop; the first loop comprises a first trigger channel constructed by the spectrum analysis module, the noise source module and the radio frequency switch which are connected in sequence, and a first test channel constructed by the radio frequency switch and the spectrum analysis module which are connected in sequence;
after a group of test loops are selected according to a preset selection rule, controlling the radio frequency switch to communicate with the trigger channel of the selected test loop, so that the amplifier to be tested receives the trigger signal sent by the test module through the trigger channel, and generates a signal to be tested according to the trigger signal, wherein the method comprises the following steps:
after a first test loop is selected according to a preset selection rule, controlling the spectrum analysis module to drive the noise source module to generate a noise signal;
controlling the radio frequency switch to be switched to the noise source module so as to enable the first trigger channel to be communicated;
enabling the amplifier to be tested to receive the noise signal sent by the noise source module through the first trigger channel and amplify the noise signal;
the controlling the radio frequency switch to communicate the selected test channel of the test loop, so that the amplifier to be tested outputs the signal to be tested to the test module through the test channel, includes:
controlling the radio frequency switch to be switched to the spectrum analysis module so as to enable the first test channel to be communicated;
enabling the amplifier to be tested to output the amplified noise signal to the spectrum analysis module through the first test channel;
the controlling the test module to perform test analysis on the signal to be tested and receive a test analysis result output by the test module includes:
and controlling the spectrum analysis module to test and analyze the amplified noise signal, and receiving a first test analysis result output by the spectrum analysis module.
3. The amplifier testing apparatus of claim 2, wherein the testing module further comprises a signal generating module; the control terminal and the radio frequency switch are both connected with the signal generating module; the test loop comprises a second loop; the second loop comprises a second trigger channel constructed by the signal generation module and the radio frequency switch which are connected in sequence, and a second test channel constructed by the radio frequency switch and the spectrum analysis module which are connected in sequence;
after selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch to switch and communicate with the trigger channel of the selected test loop so that the amplifier to be tested receives the trigger signal sent by the test module through the trigger channel and generates a signal to be tested according to the trigger signal, including:
after a second test loop is selected according to a preset selection rule, controlling the radio frequency switch to be switched to the signal generation module so as to enable the second trigger channel to be communicated;
enabling the amplifier to be tested to receive the radio frequency signal sent by the signal generating module through the second trigger channel and generating a first signal to be tested according to the radio frequency signal;
the controlling the switching of the radio frequency switch and communicating the selected test channel of the test loop to enable the test amplifier to output the signal to be tested to the test module through the test channel includes:
controlling the radio frequency switch to be switched to the spectrum analysis module so as to enable the second test channel to be communicated;
enabling the amplifier to be tested to output the first signal to be tested to the spectrum analysis module in a ready test state through the second test channel;
the controlling the test module to perform test analysis on the signal to be tested and receive a test analysis result output by the test module includes:
and controlling the spectrum analysis module to perform test analysis on the first signal to be tested, and receiving a second test analysis result output by the spectrum analysis module.
4. The amplifier test apparatus of claim 3, wherein the spectrum analysis module is connected to the signal generation module;
the controlling the radio frequency switch to connect the signal generating module comprises:
when the radio frequency switch is controlled to be switched to be communicated with the signal generation module, the signal generation module is controlled to synchronously send a first trigger instruction to the spectrum analysis module, so that the spectrum analysis module enters a test preparation state.
5. The amplifier testing apparatus of claim 1, wherein the testing module further comprises a vector network analysis module; the vector network analysis module is connected with the radio frequency switch and the control terminal; the test loop comprises a third loop; the third loop comprises a third trigger channel constructed by the vector network analysis module and the radio frequency switch which are connected in sequence, and a third test channel constructed by the radio frequency switch and the vector network analysis module which are connected in sequence;
after selecting a group of test loops according to a preset selection rule, controlling the radio frequency switch to switch and communicate with the trigger channel of the selected test loop so that the amplifier to be tested receives the trigger signal sent by the test module through the trigger channel and generates a signal to be tested according to the trigger signal, including:
after a third test loop is selected according to a preset selection rule, controlling the radio frequency switch to be switched to the vector network analysis module so as to enable the third trigger channel to be communicated;
enabling the amplifier to be tested to receive the test trigger signal sent by the vector network analysis module through the third trigger channel and generating a second signal to be tested according to the test trigger signal;
the controlling the switching of the radio frequency switch and communicating the selected test channel of the test loop to enable the test amplifier to output the signal to be tested to the test module through the test channel includes:
controlling the radio frequency switch to be switched to the vector network analysis module so as to enable the third test channel to be communicated;
enabling the amplifier to be tested to output the second signal to be tested to the vector network analysis module through the third test channel;
the controlling the test module to perform test analysis on the signal to be tested and receive a test analysis result output by the test module includes:
and controlling the vector network analysis module to perform test analysis on the second signal to be tested, and receiving a third test analysis result output by the vector network analysis module.
6. The amplifier test apparatus of claim 1, wherein the amplifier apparatus further comprises a coupler; the radio frequency switch and the amplifier to be tested are both connected with the coupler;
the enabling the amplifier to be tested to output the signal to be tested to the test module through the test channel includes:
enabling the amplifier to be tested to send the signal to be tested to the coupler;
and according to the power distribution characteristic of the coupler, the coupler is enabled to separate the signal to be tested into a first coupling signal and a second coupling signal, and the first coupling signal is output to the test module through the test channel.
7. The amplifier test apparatus of claim 6, wherein the amplifier apparatus further comprises a power monitoring module; the test module, the coupler and the control terminal are all connected with the power monitoring module;
after the making the coupler separate the signal to be tested into a first coupled signal and a second coupled signal, the method further includes:
controlling the coupler to output the second coupled signal to the power monitoring module in a ready-to-monitor state;
and controlling the power monitoring module to carry out power monitoring on the second coupling signal, and receiving power data output by the power monitoring module.
8. The amplifier test apparatus of claim 7, wherein the controlling the switching of the rf switch to connect the selected trigger channel of the test loop comprises:
and when the radio frequency switch is controlled to be switched to communicate with the test module, the test module is controlled to synchronously send a second trigger instruction to the power monitoring module so as to enable the power monitoring module to enter a ready monitoring state.
9. The amplifier test device of claim 1, further comprising a power module and a communication module; the power supply module and the communication module are connected in parallel between the control terminal and the amplifier to be tested.
10. The amplifier test apparatus of claim 1, further comprising a forwarding module; the control terminal is connected with the radio frequency switch and the test module through the forwarding module.
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