CN117572677A - System and method for testing dynamic reflectivity of liquid crystal device - Google Patents
System and method for testing dynamic reflectivity of liquid crystal device Download PDFInfo
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- CN117572677A CN117572677A CN202311849573.7A CN202311849573A CN117572677A CN 117572677 A CN117572677 A CN 117572677A CN 202311849573 A CN202311849573 A CN 202311849573A CN 117572677 A CN117572677 A CN 117572677A
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 112
- 238000002310 reflectometry Methods 0.000 title claims abstract description 47
- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 14
- 239000011521 glass Substances 0.000 claims abstract description 11
- 238000006467 substitution reaction Methods 0.000 claims description 3
- 230000008859 change Effects 0.000 abstract description 8
- 230000003068 static effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Abstract
The invention discloses a method for testing dynamic reflectivity of a liquid crystal device, which comprises a laser, a liquid crystal device, a photoelectric detector, a driver and a three-dimensional beam splitter, wherein liquid crystal is filled on a back plate chip of the liquid crystal device and is fixed by an upper glass cover plate; according to the invention, different gray level images are sequentially loaded to the liquid crystal device through the driver, and the photoelectric detector records the reflected light intensity sequences of the liquid crystal device corresponding to the different gray level images respectively, so that the dynamic reflectivity of the liquid crystal device in different gray level states is obtained; according to the invention, the light path structure is not added, the reflectivity of the liquid crystal device which is closer to the actual application scene is obtained, the liquid crystal device can be characterized, and when the liquid crystal device works, the reflectivity of the liquid crystal device is closer to the actual application scene due to the change of the reflected light intensity caused by the change of the refractive index of the liquid crystal when the liquid crystal device is in different working voltage states.
Description
Technical Field
The invention relates to the technical field of liquid crystal device testing, in particular to a device and a method for testing dynamic reflectivity of a liquid crystal device.
Background
The prior art discloses a liquid crystal device reflectivity measuring device based on a coherent principle, which has the application number of CN202010285756.0, and comprises a light source, a beam splitter, a light intensity detector, a device reflector and a device to be measured; the light source, the beam splitter, the light intensity detector, the device reflector and the device to be measured form the following light path. The present invention provides an improvement over the prior art methods of measuring the reflectivity of reflective liquid crystal devices from device to method. The light source with certain wavelength distribution is adopted to be incident into the liquid crystal device through the beam splitter, reflected light is measured by the light intensity detector after passing through the beam splitter again and is subjected to Fourier transformation, and the accurate reflectivity of each reflecting layer of the liquid crystal device can be accurately and conveniently deduced.
The above-mentioned patent is disadvantageous in that the testing method is to perform a test in a state where the device does not enter into operation, thereby obtaining the static reflectance of the liquid crystal device. The static reflectivity can only reflect the reflectivity state when the liquid crystal device is not in operation, and cannot reflect the reflectivity when the liquid crystal device is in operation. In specific applications, such as the laser processing field, the refractive index of the liquid crystal device can be changed along with different voltage states under different working voltage states, the change of the refractive index of the liquid crystal can cause the change of the reflected light intensity, and the static reflectivity cannot well represent the performance of the liquid crystal spatial light modulator.
Therefore, we have devised a test method for testing the reflectivity of a liquid crystal device in the operating state.
Disclosure of Invention
The invention aims to provide a device and a method for testing dynamic reflectivity of a liquid crystal device, which are used for solving the problem that the refractive index of liquid crystal can be changed along with different voltage states under different working voltage states of the liquid crystal device, the change of the refractive index of the liquid crystal can cause the change of the reflected light intensity, and the static reflectivity cannot well represent the performance of a liquid crystal spatial light modulator.
In order to achieve the above purpose, the invention adopts the following technical scheme:
the system for testing the dynamic reflectivity of the liquid crystal device is characterized by comprising a laser 1, the liquid crystal device 2, a photoelectric detector 3, a driver 4 and a three-dimensional beam splitter 5, wherein a liquid crystal 12 is filled on a liquid crystal device backboard chip 13 and is fixed by an upper glass cover plate 11, the three-dimensional beam splitter 5 is placed between the liquid crystal device 2 and the laser 1, and the photoelectric detector 3 is fixed on the side edge of the three-dimensional beam splitter 3; the driver 4 is connected with the liquid crystal device 2 and applies voltage to the liquid crystal device backboard chip 13 and the upper glass cover plate; in the test, the laser light emitted by the laser 1 is required to be received by the photodetector 3 through the standard reflector 6 as the reference light intensity, then the standard reflector 6 is removed, and the laser light is required to pass through the liquid crystal device 2 for dynamic reflectivity test.
The method for testing the dynamic reflectivity of the liquid crystal device is characterized by comprising the following steps of;
s1, performing S1; firstly, assembling a testing system of dynamic reflectivity of a liquid crystal device, fixing and electrifying various devices, and communicating with a control device;
s2, performing S2; starting the laser 1, and emitting laser light by the laser 1;
s3, performing S3; the photodetector 3 records the reference light intensity I ref ；
S4, performing S4; the gray state n of the liquid crystal device is assigned to 0;
s5, performing S5; the liquid crystal device 2 is loaded with an n gray scale map;
s6, performing S6; the photodetector 3 records the intensity I of the reflected light 0 ；
S7, performing S7; judging whether n is the maximum gray level;
s8, performing S8; judging that n is not the maximum gray level, and sequentially accumulating the gray levels n, wherein n=0, 1,2,,, and max; the driver 4 applies voltage to the back plate chip 13 and the upper glass cover plate 11 of the liquid crystal device according to different gray scale image states, simulates the working state of the liquid crystal device 2, loads n gray scale images on the liquid crystal device 2, and records the reflected light intensity I by the photoelectric detector 3 0,1,2,3,,,,max 。
S9, performing S9; calculating the dynamic reflectivity of the liquid crystal device 2;
s10, performing S10; and (3) finishing.
In the step S8, each time the gray n on the liquid crystal device 2 is accumulated, the liquid crystal device 2 is loaded once, the photodetector 3 detects and records the intensity of primary reflected light, judges whether the primary n is the maximum gray, and sequentially loops until the judgment of the primary n is the maximum gray, and then the step S9 is performed.
The laser emitted by the laser 1 in the S2 irradiates onto the standard reflector 6 after passing through the stereoscopic beam splitter 5, passes through the stereoscopic beam splitter 5 again from the standard reflector 6, and reaches the photodetector 3, so that the photodetector 3 in the S3 receives a reference light source as a reflectivity test, and then the standard reflector 6 is removed for the next test.
And in the step S2, the included angle between the laser emission light path of the laser 1 and the incident light path received by the photoelectric detector 3 is any angle.
In S9, I is obtained by the steps ref And I 0,1,2,3,,,,max Substitution into
Dynamic reflectivity of the liquid crystal device 2 in each gray state can be obtained.
Compared with the prior art, the invention has the following beneficial effects:
according to the invention, different gray level images are sequentially loaded to the liquid crystal device through the driver, and the photoelectric detector records the reflected light intensity sequences of the liquid crystal device corresponding to the different gray level images respectively, so that the dynamic reflectivity of the liquid crystal device in different gray level states is obtained. According to the invention, the light path structure is not added, the reflectivity of the liquid crystal device which is closer to the actual application scene is obtained, the liquid crystal device can be characterized, and when the liquid crystal device works, the reflectivity of the liquid crystal device is closer to the actual application scene due to the change of the reflected light intensity caused by the change of the refractive index of the liquid crystal when the liquid crystal device is in different working voltage states.
Drawings
FIG. 1 is a schematic diagram of the overall structure of a test system according to the present invention;
FIG. 2 is a schematic diagram of a partial structure of a test system according to the present invention;
FIG. 3 is a flow chart of the testing method of the present invention
FIG. 4 is a schematic diagram of the applied voltage of the driver according to the present invention.
In the figure: 1. a laser; 2. a liquid crystal device; 3. a photodetector; 4. a driver; 5. a stereoscopic beam splitter; 6. a standard reflector; 11. an upper glass cover plate; 12. a liquid crystal; 13. a liquid crystal device back plate chip.
Detailed Description
The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, but not all embodiments, and all other embodiments obtained by persons skilled in the art without making creative efforts based on the embodiments in the present invention are all within the protection scope of the present invention.
As shown in fig. 1, a system for testing dynamic reflectivity of a liquid crystal device is characterized by comprising a laser 1, a liquid crystal device 2, a photoelectric detector 3, a driver 4 and a stereoscopic beam splitter 5, wherein a liquid crystal 12 is filled on a liquid crystal device backboard chip 13 and is fixed by an upper glass cover plate 11, the stereoscopic beam splitter 5 is placed between the liquid crystal device 2 and the laser 1, and the photoelectric detector 3 is fixed on the side edge of the stereoscopic beam splitter 3; the driver 4 is connected with the liquid crystal device 2 and applies voltage to the liquid crystal device backboard chip 13 and the upper glass cover plate; in the test, the laser light emitted by the laser 1 is required to be received by the photodetector 3 through the standard reflector 6 as the reference light intensity, then the standard reflector 6 is removed, and the laser light is required to pass through the liquid crystal device 2 for dynamic reflectivity test.
As shown in fig. 3, a method for testing dynamic reflectivity of a liquid crystal device is characterized by comprising the following steps of;
s1, performing S1; firstly, assembling a testing system of dynamic reflectivity of a liquid crystal device, fixing and electrifying various devices, and communicating with a control device;
s2, performing S2; starting the laser 1, and emitting laser light by the laser 1;
s3, performing S3; the photodetector 3 records the reference light intensity I ref ；
S4, performing S4; the gray state n of the liquid crystal device is assigned to 0;
s5, performing S5; the liquid crystal device 2 is loaded with an n gray scale map;
s6, performing S6; the photodetector 3 records the intensity I of the reflected light 0 ；
S7, performing S7; judging whether n is the maximum gray level;
s8, performing S8; judging that n is not the maximum gray level, and sequentially accumulating the gray levels n, wherein n=0, 1,2,,, and max; the driver 4 applies voltage to the back plate chip 13 and the upper glass cover plate 11 of the liquid crystal device according to different gray scale image states, simulates the working state of the liquid crystal device 2, loads n gray scale images on the liquid crystal device 2, and records the reflected light intensity I by the photoelectric detector 3 0,1,2,3,,,,max 。
S9, performing S9; calculating the dynamic reflectivity of the liquid crystal device 2;
s10, performing S10; and (3) finishing.
Each liquid crystal device has the maximum gray scale, and the gray scale sequential accumulation test times are different for different types of liquid crystal devices.
In the step S8, each time the gray n on the liquid crystal device 2 is accumulated, the liquid crystal device 2 is loaded once, the photodetector 3 detects and records the intensity of primary reflected light, judges whether the primary n is the maximum gray, and sequentially loops until the judgment of the primary n is the maximum gray, and then the step S9 is performed.
The laser emitted by the laser 1 in the S2 irradiates onto the standard reflector 6 after passing through the stereoscopic beam splitter 5, passes through the stereoscopic beam splitter 5 again from the standard reflector 6, and reaches the photodetector 3, so that the photodetector 3 in the S3 receives a reference light source as a reflectivity test, and then the standard reflector 6 is removed for the next test.
As shown in fig. 2, the included angle between the laser emission light path of the laser 1 and the incident light path received by the photodetector 3 in S2 is any angle.
In S9, I is obtained by the steps ref And I 0,1,2,3,,,,max Substitution into
The dynamic reflectivity R of the liquid crystal device 2 in each gray state can be obtained; the following indexes are easy to obtain;
R min is the smallest dynamic reflectivity among all gray scale reflectivities of the liquid crystal device.
R max Is the maximum dynamic reflectance among all gray scale reflectances of the liquid crystal device.
R avr Is the dynamic reflectance average value in all gray scale reflectances of the liquid crystal device.
R rms Is the dynamic reflectance root mean square value in all gray scale reflectances of the liquid crystal device.
The foregoing has shown and described the basic principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the foregoing embodiments, and that the foregoing embodiments and description are merely preferred embodiments of the invention, and are not intended to limit the invention, but that various changes and modifications may be made therein without departing from the novel spirit and scope of the invention, which is defined by the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (6)
1. The system for testing the dynamic reflectivity of the liquid crystal device is characterized by comprising a laser (1), the liquid crystal device (2), a photoelectric detector (3), a driver (4) and a three-dimensional beam splitter (5), wherein liquid crystal (12) is filled on a back plate chip (13) of the liquid crystal device and is fixed by an upper glass cover plate (11), the three-dimensional beam splitter (5) is arranged between the liquid crystal device (2) and the laser (1), and the photoelectric detector (3) is fixed on the side edge of the three-dimensional beam splitter (3); the driver (4) is connected with the liquid crystal device (2) and applies voltage to the liquid crystal device backboard chip (13) and the upper glass cover plate; during testing, laser light emitted by the laser (1) is required to be received by the photoelectric detector (3) through the standard reflector (6) as reference light intensity, then the standard reflector (6) is removed, and the laser light passes through the liquid crystal device (2) to perform dynamic reflectivity testing.
2. The method for testing the dynamic reflectivity of the liquid crystal device is characterized by comprising the following steps of;
s1, performing S1; firstly, assembling a testing system of dynamic reflectivity of a liquid crystal device, fixing and electrifying various devices, and communicating with a control device;
s2, performing S2; starting a laser (1), and emitting laser by the laser (1);
s3, performing S3; the photodetector (3) records the reference light intensity I ref ；
S4, performing S4; the gray state n of the liquid crystal device is assigned to 0;
s5, performing S5; the liquid crystal device (2) loads the n gray scale map through the driver (4);
s6, performing S6; the photodetector (3) records the intensity I of the reflected light 0 ；
S7, performing S7; judging whether n is the maximum gray level;
s8, performing S8; judging that n is not the maximum gray level, and sequentially accumulating the gray levels n, wherein n=0, 1,2,,, and max; the driver (4) applies voltage to the back plate chip (13) and the upper glass cover plate (11) of the liquid crystal device according to different gray level image states to simulate the working state of the liquid crystal device (2), the liquid crystal device (2) loads n gray level images, and the photoelectric detector (3) records the reflected light intensity I 0,1,2,3,,,,max 。
S9, performing S9; calculating the dynamic reflectivity of the liquid crystal device (2);
s10, performing S10; and (3) finishing.
3. The method for testing dynamic reflectivity of a liquid crystal device according to claim 2, wherein in S8, each time the gray scale n on the liquid crystal device (2) is accumulated, the liquid crystal device (2) is loaded once, the photo detector (3) detects and records the intensity of the reflected light once, judges whether the primary n is the maximum gray scale, and loops to the step after judging that the primary n is the maximum gray scale, and then the S9 is performed.
4. The method for testing the dynamic reflectivity of the liquid crystal device according to claim 2, wherein the laser light emitted by the laser (1) in the S2 irradiates the standard reflector (6) after passing through the stereoscopic beam splitter (5), passes through the stereoscopic beam splitter (5) again from the standard reflector (6) and reaches the photodetector (3), the reference light source used as the reflectivity test is received by the photodetector (3) in the S3, and then the standard reflector (6) is removed for the next test.
5. The method for testing the dynamic reflectivity of the liquid crystal device according to claim 1, wherein an included angle between a laser emission light path of the laser (1) and an incident light path received by the photodetector (3) in the S2 is any angle.
6. The method for testing dynamic reflectivity of liquid crystal device as claimed in claim 2, wherein in said S9, the step of obtaining I is performed by ref And I 0,1,2,3,,,,max Substitution into
The dynamic reflectivity R of the liquid crystal device (2) in each gray state can be obtained.
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