CN117494987A - Method for configuring quantity of detection instruments - Google Patents
Method for configuring quantity of detection instruments Download PDFInfo
- Publication number
- CN117494987A CN117494987A CN202311436028.5A CN202311436028A CN117494987A CN 117494987 A CN117494987 A CN 117494987A CN 202311436028 A CN202311436028 A CN 202311436028A CN 117494987 A CN117494987 A CN 117494987A
- Authority
- CN
- China
- Prior art keywords
- electronic unit
- success rate
- failure
- electronic
- detection instruments
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 88
- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000012423 maintenance Methods 0.000 claims description 27
- 238000004364 calculation method Methods 0.000 claims description 9
- 238000012360 testing method Methods 0.000 claims description 3
- 238000004088 simulation Methods 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0631—Resource planning, allocation, distributing or scheduling for enterprises or organisations
- G06Q10/06313—Resource planning in a project environment
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/20—Administration of product repair or maintenance
Landscapes
- Business, Economics & Management (AREA)
- Human Resources & Organizations (AREA)
- Engineering & Computer Science (AREA)
- Economics (AREA)
- Strategic Management (AREA)
- Entrepreneurship & Innovation (AREA)
- Physics & Mathematics (AREA)
- General Business, Economics & Management (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tourism & Hospitality (AREA)
- Marketing (AREA)
- Operations Research (AREA)
- Quality & Reliability (AREA)
- Biodiversity & Conservation Biology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Educational Administration (AREA)
- Game Theory and Decision Science (AREA)
- Development Economics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a method for configuring the number of detection instruments, which comprises the following steps: defining the service life of the electronic unit to obey the index distribution, and initializing the average service life of the electronic unit, the number of the electronic units, the working intensity of the electronic unit, the number of the detection instruments, the time of each time the electronic unit uses the detection instruments and the success rate index of the electronic unit using the detection instruments; calculating the failure probability of the electronic unit corresponding to different failure times, and determining the maximum failure times meeting the maximum failure probability of the electronic unit; calculating the overhaul success rate of the maximum failure times corresponding to the number of different detection instruments, and determining that the overhaul success rate meeting the maximum failure times corresponding to the number of different detection instruments is larger than the success rate index of the detection instruments used by the electronic unit so as to achieve the minimum number of the detection instruments; the method calculates the overhaul success rate of the maximum failure times corresponding to the number of different detection instruments, and finds the number of the detection instruments meeting the minimum success rate index so as to more reasonably configure the detection instruments.
Description
Technical Field
The invention relates to the technical field of equipment maintenance, in particular to a method for configuring the number of detection instruments.
Background
Reliability and serviceability are the two most critical features in the "six" of the device. In some application scenarios, when equipment fails, the equipment is required to quickly repair the failure and recover the work as soon as possible. The service manual will typically indicate which inspection tools, disassembly tools, make up the complete set of service tools that service the equipment, but will not tell how many sets of service tools to be provided when the X-station equipment is put into service. In practice, it is not possible to provide each device with a set of maintenance tools, especially when the number of devices is large and the associated instrumentation is expensive. However, too low a configuration of the number of service tools can result in failure to quickly repair the damaged equipment, with serious consequences in some cases.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides a method for configuring the number of detection instruments, which takes an electronic unit in equipment and a detection instrument corresponding to the electronic unit as an example, and calculates the probability that the detection instrument is available after the failure of the electronic unit corresponding to the number of the detection instruments occurs by considering the life distribution rule of the electronic unit, the number of the electronic units, the working strength, the average service time of the detection instruments and other factors, so as to find the number of the detection instruments meeting the minimum success rate index of the electronic unit using the detection instruments.
In order to achieve the aim of the invention, the invention adopts the following technical scheme:
a method of configuring a number of test instruments, comprising the steps of:
s1, defining service life obeying index distribution of an electronic unit, and initializing average service life of the electronic unit, the number of the electronic units, working intensity of the electronic unit, the number of detection instruments, time of each use of the detection instruments by the electronic unit and success rate indexes of the use of the detection instruments by the electronic unit;
s2, calculating the failure probability of the electronic units corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units, and determining the maximum failure times meeting the maximum failure probability of the electronic units;
s3, according to the maximum fault times in the step S2, the overhaul success rate of the maximum fault times corresponding to the number of different detection instruments is calculated, and the overhaul success rate meeting the condition that the maximum fault times corresponding to the number of different detection instruments is larger than the success rate index of the detection instruments used by the electronic unit is determined, so that the minimum number of the detection instruments is achieved.
Further, step S2 specifically includes:
s21, initializing the failure times of the electronic unit to be 0;
s22, calculating the failure probability of the electronic unit corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units;
s23, if the failure probability of the electronic unit corresponding to the different failure times calculated in the step S22 is smaller than the maximum failure probability of the electronic unit, the failure times of the electronic unit are overlapped one by one until the failure probability of the electronic unit is larger than or equal to the maximum failure probability of the electronic unit, and the maximum failure times of the electronic unit are obtained.
Further, in step S22, the calculation formula of the failure probability of the electronic unit corresponding to the different failure times is:
wherein Pf represents the failure probability of the electronic unit corresponding to different failure times, g represents the failure times of the electronic unit, i represents the current failure times, a represents the average service life of the electronic unit, m represents the number of the electronic units, T represents the working strength of the electronic unit, e (·) Representing an exponential function.
Further, the maximum probability of failure of the electronic unit is 0.999.
Further, the step S3 specifically includes:
s31, initializing the overhaul success rate to be 0 and the current failure times to be 0, and calculating the probability of no detection instrument availability;
s32, calculating the maintenance success rate corresponding to the current failure times;
s33, updating the maintenance success rate in the whole working period, and overlapping the current failure times one by one to obtain updated current failure times, namely:
i′＝i+1
wherein i represents the current failure times, i' represents the updated current failure times;
s34, if the updated current fault times are smaller than the maximum fault times in the step S2, executing the step S32, otherwise, executing the step S35;
and S35, if the overhauling success rate of the updated whole working period is smaller than the success rate index of the detection instrument used by the initialized electronic unit in the step S1, the number of the detection instruments is overlapped one by one, and the step S31 is executed, otherwise, the number of the detection instruments is output.
Further, in step S31, the calculation formula of the probability that no detection instrument is available is:
wherein P is 0 Denotes the probability that no detection instrument is available, Γ (n) denotes the gamma function, a denotes the average lifetime of the set electronics unit, m denotes the number of electronics units, n denotes the number of detection instruments, T n Representing the time of each use of the detecting instrument by the electronic unit, T representing the difference between the current fault time and the fault time of the first detecting instrument, T representing the working strength of the electronic unit, e (·) Representing an exponential function.
Further, in step S32, the calculation formula of the overhaul success rate corresponding to the current failure frequency is:
wherein P is t The corresponding maintenance success rate when the current failure times are i is represented, and i represents the current failure times.
Further, in step S33, the calculation formula for updating the maintenance success rate during the whole working period is:
wherein P is s ' indicates the success rate of maintenance throughout the working period of the update, P s Indicating the maintenance success rate during the whole working period, wherein a indicates the average service life of the set electronic units, m indicates the number of the electronic units, T indicates the working strength of the electronic units, i indicates the current failure times, e (·) Representing an exponential function, P t And indicating the corresponding maintenance success rate when the current failure frequency is i.
The invention has the following beneficial effects:
the invention provides a method for configuring the number of detection instruments, which takes an electronic unit in equipment and a detection instrument corresponding to the electronic unit as an example, considers factors such as a service life distribution rule of the electronic unit, the number of the electronic units, working intensity, average service time of the detection instruments and the like, calculates the overhaul success rate of the maximum number of faults corresponding to the number of different detection instruments by calculating the maximum number of faults, thereby determining that the overhaul success rate of the maximum number of faults corresponding to the number of different detection instruments is higher than the success rate index of the detection instruments used by the electronic unit, and achieving the minimum number of the detection instruments, so that the detection instruments are configured more economically and reasonably, and the efficiency of configuring the detection instruments is improved.
Drawings
FIG. 1 is a flow chart of a method for configuring the number of detecting instruments according to the present invention;
FIG. 2 is a graph showing the success rate results of two methods in the examples.
Detailed Description
The following description of the embodiments of the present invention is provided to facilitate understanding of the present invention by those skilled in the art, but it should be understood that the present invention is not limited to the scope of the embodiments, and all the inventions which make use of the inventive concept are protected by the spirit and scope of the present invention as defined and defined in the appended claims to those skilled in the art.
As shown in fig. 1, a method for configuring the number of detection instruments includes the following steps S1-S3:
s1, defining service life of the electronic units to obey exponential distribution, and initializing average service life of the electronic units, the number of the electronic units, working intensity of the electronic units, the number of detection instruments, time of each time the electronic units use the detection instruments and success rate indexes of the electronic units using the detection instruments.
In an alternative embodiment of the invention, the electronics lifetime generally follows an exponential distribution. For example: printed circuit board packages, electronic components, resistors, capacitors, integrated circuits, and the like. In this embodiment, taking an electronic unit in a device and a corresponding detecting instrument thereof as an example, by comprehensively considering factors such as a life distribution rule of the electronic unit, the number of the electronic units, working intensity of the electronic units, average use time of the detecting instrument and the like, a method for configuring the number of the detecting instrument is provided, and by utilizing the method and combining with experience of maintenance personnel, the detecting instrument is configured more and more quickly and reasonably. In this embodiment, the number of the detecting instruments is n=1 during initialization, and the service life of the electronic unit follows an exponential distribution Exp (a), wherein the density function of the exponential distribution isIn this embodiment, under normal conditions, m mutually independent electronic units operate simultaneously in the T period; when one electronic unit fails, the other electronic units are not affected to continue to work. When a certain electronic unit fails and stops working, a detection instrument is needed to locate the failure cause, and the detection instrument is used to assist in completing repair.
S2, calculating the failure probability of the electronic units corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units, and determining the maximum failure times meeting the maximum failure probability of the electronic units.
Specifically, step S2 specifically includes S21-S23:
s21, initializing the failure times of the electronic unit to be 0.
S22, calculating the failure probability of the electronic unit corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units, namely:
wherein Pf represents the failure probability of the electronic unit corresponding to different failure times, g represents the failure times of the electronic unit, i represents the current failure times, a represents the average service life of the electronic unit, m represents the number of the electronic units, T represents the working strength of the electronic unit, e (·) Representing an exponential function.
S23, if the failure probability of the electronic unit corresponding to the different failure times calculated in the step S22 is smaller than the maximum failure probability of the electronic unit, the failure times of the electronic unit are overlapped one by one until the failure probability of the electronic unit is larger than or equal to the maximum failure probability of the electronic unit, and the maximum failure times of the electronic unit are obtained.
Specifically, the maximum probability of failure of the electronic unit is 0.999.
S3, according to the maximum fault times in the step S2, the overhaul success rate of the maximum fault times corresponding to the number of different detection instruments is calculated, and the overhaul success rate meeting the condition that the maximum fault times corresponding to the number of different detection instruments is larger than the success rate index of the detection instruments used by the electronic unit is determined, so that the minimum number of the detection instruments is achieved.
In this embodiment, after a fault occurs, if an idle detecting instrument is available for the electronic unit to be used immediately, that is, the detecting instrument guarantees that the electronic unit is successfully repaired by the fault, and if no idle detecting instrument is available for the electronic unit to be used immediately, that is, the detecting instrument guarantees that the electronic unit is failed in the fault repair. In this embodiment, by configuring a certain number of detecting apparatuses, the probability that the detecting apparatuses are available after the failure of the electronic unit is not lower than the success rate index of the electronic unit using the detecting apparatuses, so as to ensure that the device has the characteristic of quick repair. In this embodiment, the maintenance success rate refers to the probability that the detecting instrument is available after the failure of the electronic unit occurs, and the maintenance failure rate refers to the probability that no detecting instrument is available after the failure of the electronic unit occurs.
Specifically, step S3 specifically includes S31-S35:
s31, initializing the overhaul success rate to be 0 and the current fault times to be 0, and calculating the probability of no detection instrument availability, namely:
wherein P is 0 Denotes the probability that no detection instrument is available, Γ (n) denotes the gamma function, a denotes the average lifetime of the set electronics unit, m denotes the number of electronics units, n denotes the number of detection instruments, T n Representing the time of each use of the detecting instrument by the electronic unit, T representing the difference between the current fault time and the fault time of the first detecting instrument, T representing the working strength of the electronic unit, e (·) Representing an exponential function.
In the present embodiment, parameter P 0 The subscript 0 in this embodiment may be considered as a "01" success or failure event, i.e. a failure event is denoted by 0, indicating the probability that no detection instrument is available, i.e. whether there is a probability that a detection instrument is used immediately after a failure of the electronic unit. In this embodiment Γ (n) represents a gamma function, i.eIn this embodiment, the physical meaning of the parameter t is that when n detecting apparatuses are all in use, a fault occurs again, t is the difference between the time of the fault and the time of the fault using the first detecting apparatus, that is, t is the time between the (n+1) th fault and the (1) th fault. The parameter t follows the gamma distribution Ga (n, a/m), and the parameter P 0 To calculate the fault interval time t using the gamma distribution<T n I.e. the probability that no detection instrument is available for maintenance after the failure of the electronic unit at the present moment.
S32, calculating the maintenance success rate corresponding to the current fault times, namely:
wherein P is t The corresponding maintenance success rate when the current failure times are i is represented, and i represents the current failure times.
In the present embodiment, parameter P t Is the calculated parameter P s Intermediate variable of (i.e. P) t When the number of times of faults of the electronic unit is i, the i times of faults can be successfully and immediately available for detection instruments, namely the overhaul success rate.
S33, updating the maintenance success rate in the whole working period, and overlapping the current failure times one by one to obtain updated current failure times, namely:
i′＝i+1
wherein P is s ' indicates the success rate of maintenance throughout the working period of the update, P s Indicating the maintenance success rate during the whole working period, wherein a indicates the average service life of the set electronic units, m indicates the number of the electronic units, T indicates the working strength of the electronic units, i indicates the current failure times, e (·) Representing an exponential function, P t The corresponding maintenance success rate when the current failure frequency is i is represented, and i' represents the updated current failure frequency.
In the present embodiment, parameter P s When the number of times of failure of the electronic unit is 0, 1, 2, 3 and …, the probability that the detection instrument is available after the failure of the electronic unit can be realized.
And S34, if the updated current fault times are smaller than the maximum fault times in the step S2, executing the step S32, otherwise, executing the step S35.
And S35, if the overhauling success rate of the updated whole working period is smaller than the success rate index of the detection instrument used by the initialized electronic unit in the step S1, the number of the detection instruments is overlapped one by one, and the step S31 is executed, otherwise, the number of the detection instruments is output.
In this embodiment, an electronic unit is taken as an example to perform an experiment by using a simulation method and a method for configuring the number of detection instruments provided by the present invention. The average life of an electronic unit is 100h, the life obeys an exponential distribution Exp (100), the number of the electronic units is 20, the working intensity is 50h, the service time of a certain detecting instrument for detecting the electronic unit is 1h, and the probability that the detecting instrument can be used for detecting the electronic unit after the fault is not lower than 0.95 is required, then the method for configuring the number of the detecting instruments provided by the invention is utilized to calculate at least how many detecting instruments need to be configured, namely: step one, initializing. Inputting the average life of the electronic units as a=100, the number of the electronic units as m=20, the working strength of the electronic units as T=50, and the time of each time the electronic units use the detecting instrument as T n The success rate index of the electronic unit using the detection instrument is p=0.95, and let the number of detection instruments be n=1. And step two, calculating the maximum fault frequency as g=21. Step three, executing the step three for multiple times, and calculating the success rate corresponding to the number n of the detecting instruments, namely the probability P that the detecting instruments are available after the failure of the electronic unit occurs s The calculation results are shown in table 1:
TABLE 1 success rate results for different numbers of detection instruments
| Quantity of | Success rate |
| 1 | 0.199 |
| 2 | 0.869 |
| 3 | 0.991 |
As can be seen from table 1, when the number of the obtained detecting instruments is n=3, the third step is terminated, and when the number of the output detecting instruments is n=3, the probability that the detecting instruments are available after the fault of the electronic unit occurs is 0.991 and the requirement that the success rate index of the electronic unit using the detecting instruments is not lower than 0.95 is satisfied. In this embodiment, the success rate refers to the probability that the detection instrument is available after the failure of the electronic unit occurs.
As shown in fig. 2, fig. 2 is a schematic diagram of success rate results of two methods, that is, experiments are performed by using a simulation method and a method for configuring the number of detection instruments according to the present invention, where an abscissa of fig. 2 represents the number of detection instruments, and an ordinate represents success rate, that is, probability that a detection instrument is available after a failure of an electronic unit occurs. In this embodiment, by establishing a simulation model of the maintenance and protection process during the operation of the electronic unit, the probability that the electronic unit is available after the fault occurs when the number of the detection instruments is different is simulated, and fig. 2 shows that the error between two results obtained by adopting the simulation method and the method for configuring the number of the detection instruments provided by the invention is smaller, thereby meeting the engineering application requirements.
The principles and embodiments of the present invention have been described in detail with reference to specific examples, which are provided to facilitate understanding of the method and core ideas of the present invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present invention, the present description should not be construed as limiting the present invention in view of the above.
Those of ordinary skill in the art will recognize that the embodiments described herein are for the purpose of aiding the reader in understanding the principles of the present invention and should be understood that the scope of the invention is not limited to such specific statements and embodiments. Those of ordinary skill in the art can make various other specific modifications and combinations from the teachings of the present disclosure without departing from the spirit thereof, and such modifications and combinations remain within the scope of the present disclosure.
Claims (8)
1. A method of configuring a number of test instruments, comprising the steps of:
s1, defining service life obeying index distribution of an electronic unit, and initializing average service life of the electronic unit, the number of the electronic units, working intensity of the electronic unit, the number of detection instruments, time of each use of the detection instruments by the electronic unit and success rate indexes of the use of the detection instruments by the electronic unit;
s2, calculating the failure probability of the electronic units corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units, and determining the maximum failure times meeting the maximum failure probability of the electronic units;
s3, according to the maximum fault times in the step S2, the overhaul success rate of the maximum fault times corresponding to the number of different detection instruments is calculated, and the overhaul success rate meeting the condition that the maximum fault times corresponding to the number of different detection instruments is larger than the success rate index of the detection instruments used by the electronic unit is determined, so that the minimum number of the detection instruments is achieved.
2. The method according to claim 1, wherein the step S2 specifically includes:
s21, initializing the failure times of the electronic unit to be 0;
s22, calculating the failure probability of the electronic unit corresponding to different failure times according to the number of the electronic units, the working intensity of the electronic units and the average service life of the electronic units;
s23, if the failure probability of the electronic unit corresponding to the different failure times calculated in the step S22 is smaller than the maximum failure probability of the electronic unit, the failure times of the electronic unit are overlapped one by one until the failure probability of the electronic unit is larger than or equal to the maximum failure probability of the electronic unit, and the maximum failure times of the electronic unit are obtained.
3. The method according to claim 2, wherein the calculation formula of the failure probability of the electronic unit corresponding to the different failure times in step S22 is:
wherein Pf represents the failure probability of the electronic unit corresponding to different failure times, g represents the failure times of the electronic unit, i represents the current failure times, a represents the average service life of the electronic unit, m represents the number of the electronic units, T represents the working strength of the electronic unit, e (·) Representing an exponential function.
4. A method of configuring a number of test instruments according to claim 2, wherein the maximum probability of failure of the electronic unit is 0.999.
5. The method according to claim 1, wherein the step S3 specifically includes:
s31, initializing the overhaul success rate to be 0 and the current failure times to be 0, and calculating the probability of no detection instrument availability;
s32, calculating the maintenance success rate corresponding to the current failure times;
s33, updating the maintenance success rate in the whole working period, and overlapping the current failure times one by one to obtain updated current failure times, namely:
i ′ ＝+1
wherein i represents the current failure number, i ′ Representing the updated current fault times;
s34, if the updated current fault times are smaller than the maximum fault times in the step S2, executing the step S32, otherwise, executing the step S35;
and S35, if the overhauling success rate of the updated whole working period is smaller than the success rate index of the detection instrument used by the initialized electronic unit in the step S1, the number of the detection instruments is overlapped one by one, and the step S31 is executed, otherwise, the number of the detection instruments is output.
6. The method according to claim 5, wherein the calculation formula of the probability that no detecting instrument is available in step S31 is:
wherein P is 0 Denotes the probability that no detection instrument is available, Γ (n) denotes the gamma function, a denotes the average lifetime of the set electronics unit, m denotes the number of electronics units, n denotes the number of detection instruments, T n Representing the time of each use of the detecting instrument by the electronic unit, T representing the difference between the current fault time and the fault time of the first detecting instrument, T representing the working strength of the electronic unit, e (·) Representing an exponential function.
7. The method for configuring the number of detecting instruments according to claim 5, wherein the calculation formula of the overhaul success rate corresponding to the current failure times in step S32 is:
wherein P is t The corresponding maintenance success rate when the current failure times are i is represented, and i represents the current failure times.
8. The method according to claim 5, wherein the calculation formula for updating the maintenance success rate during the entire operation in step S33 is as follows:
wherein P is s ′ Indicating the success rate of maintenance throughout the working period of the update, P s Indicating the maintenance success rate during the whole working period, wherein a indicates the average service life of the set electronic units, m indicates the number of the electronic units, T indicates the working strength of the electronic units, i indicates the current failure times, e (·) Representing an exponential function, P t And indicating the corresponding maintenance success rate when the current failure frequency is i.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311436028.5A CN117494987A (en) | 2023-10-31 | 2023-10-31 | Method for configuring quantity of detection instruments |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311436028.5A CN117494987A (en) | 2023-10-31 | 2023-10-31 | Method for configuring quantity of detection instruments |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117494987A true CN117494987A (en) | 2024-02-02 |
Family
ID=89671916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311436028.5A Pending CN117494987A (en) | 2023-10-31 | 2023-10-31 | Method for configuring quantity of detection instruments |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117494987A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116579578A (en) * | 2023-05-23 | 2023-08-11 | 中国人民解放军海军工程大学 | Electronic equipment spare part demand amount calculation method considering maintenance time consumption |
| CN116757308A (en) * | 2023-05-23 | 2023-09-15 | 中国人民解放军海军工程大学 | Spare part demand prediction method and system for electronic voting component |
| CN116843119A (en) * | 2023-05-23 | 2023-10-03 | 中国人民解放军海军工程大学 | Electronic unit spare part design method and system considering maintenance time consumption |
| CN116955914A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Mechanical unit spare part guarantee task success rate calculation method and system |
| CN116955912A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Success rate assessment method and system for spare part guarantee task of electronic equipment |
| CN116955910A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Method and system for calculating success rate of guarantee tasks of mechanical serial components |
-
2023
- 2023-10-31 CN CN202311436028.5A patent/CN117494987A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116579578A (en) * | 2023-05-23 | 2023-08-11 | 中国人民解放军海军工程大学 | Electronic equipment spare part demand amount calculation method considering maintenance time consumption |
| CN116757308A (en) * | 2023-05-23 | 2023-09-15 | 中国人民解放军海军工程大学 | Spare part demand prediction method and system for electronic voting component |
| CN116843119A (en) * | 2023-05-23 | 2023-10-03 | 中国人民解放军海军工程大学 | Electronic unit spare part design method and system considering maintenance time consumption |
| CN116955914A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Mechanical unit spare part guarantee task success rate calculation method and system |
| CN116955912A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Success rate assessment method and system for spare part guarantee task of electronic equipment |
| CN116955910A (en) * | 2023-07-19 | 2023-10-27 | 中国人民解放军海军工程大学 | Method and system for calculating success rate of guarantee tasks of mechanical serial components |
Non-Patent Citations (1)
| Title |
|---|
| 易勇华;傅健;王春枝;张志华;: "指数型有寿件备件需求预测模型", 兵器装备工程学报, no. 11, 25 November 2017 (2017-11-25) * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106844953B (en) | Guarantee probability calculation method for Weibull-type spare parts with service lives | |
| EP2977770A1 (en) | Leakage current detection method and device | |
| CN115374658B (en) | Method and system for optimizing troubleshooting sequence of electronic equipment with least time consumption | |
| CN115270078A (en) | Method and system for calculating average repair time of electromechanical equipment | |
| CN116777298A (en) | Electronic equipment use availability evaluation method considering maintenance time consumption | |
| CN106950422B (en) | A kind of high voltage frequency converter power self-checking circuit and method | |
| JP3511632B2 (en) | Mounting process failure factor analysis method | |
| CN117494987A (en) | Method for configuring quantity of detection instruments | |
| CN110287523B (en) | Spare part scheme optimization method and device for multi-batch parts in modularized storage mode | |
| CN116955912A (en) | Success rate assessment method and system for spare part guarantee task of electronic equipment | |
| CN107688708A (en) | A kind of reliability prediction analysis system and method based on multi-platform data fusion | |
| CN116579578A (en) | Electronic equipment spare part demand amount calculation method considering maintenance time consumption | |
| CN110688759A (en) | Voting component spare part amount calculation method, voting component spare part amount simulation method, voting component terminal, and storage medium | |
| CN115688025A (en) | Method and system for estimating probability distribution of equipment fault repair time | |
| CN115686898A (en) | Multi-stage fault mode and influence analysis method and system | |
| CN109543276B (en) | Method for determining spare part demand of multi-Gamma unit of long-term guarantee task of large cargo ship | |
| CN117829820B (en) | Method for calculating repair timely response degree | |
| CN105303315B (en) | A kind of power equipment reliability appraisal procedure counted and maintenance randomness influences | |
| CN116502845B (en) | Method and system for estimating average consumption number of electromechanical equipment spare parts considering maintenance time consumption | |
| CN112986863A (en) | Line detection method and device of temperature detection system and electronic equipment | |
| CN110309487B (en) | Exponential unit life distribution parameter estimation method based on spare part guarantee data | |
| CN116502846B (en) | Method for estimating average consumption number of spare parts of electronic part in consideration of maintenance time consumption | |
| CN116930725B (en) | Marine circuit board card service life test and evaluation method and system | |
| CN110147906A (en) | Part preventative maintenance scheme optimization method is changed in a kind of part | |
| CN110147893A (en) | A kind of string part is cannibalized the optimization method of the preventative maintenance spare part under mode |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |