CN117214661B - Input offset voltage testing device for operational amplifier - Google Patents
Input offset voltage testing device for operational amplifier Download PDFInfo
- Publication number
- CN117214661B CN117214661B CN202311170750.9A CN202311170750A CN117214661B CN 117214661 B CN117214661 B CN 117214661B CN 202311170750 A CN202311170750 A CN 202311170750A CN 117214661 B CN117214661 B CN 117214661B
- Authority
- CN
- China
- Prior art keywords
- operational amplifier
- resistor
- voltage
- inverting input
- offset voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 82
- 239000003990 capacitor Substances 0.000 claims abstract description 22
- 230000003321 amplification Effects 0.000 claims description 5
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 5
- 238000010998 test method Methods 0.000 description 4
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000002498 deadly effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Landscapes
- Amplifiers (AREA)
Abstract
The invention relates to the technical field of circuit testing, and particularly discloses a testing device for input offset voltage of an operational amplifier, which comprises the following components: the non-inverting input end of the first operational amplifier is connected with the common-mode voltage input end, and the output end of the first operational amplifier is respectively connected with the inverting input end of the first operational amplifier, the first capacitor, the third resistor and the second test end; the third resistor is respectively connected with the fourth resistor and the inverting input end of the second operational amplifier, and the fourth resistor is respectively connected with the output end of the second operational amplifier and the first test end; the second capacitor is connected in parallel with the two ends of the fourth resistor; the non-inverting input end of the second operational amplifier is connected with the output end of the tested operational amplifier, the output end of the second operational amplifier is connected with a second resistor, and the second resistor is respectively connected with the non-inverting input ends of the first resistor and the third operational amplifier; the first resistor is connected with the second test end, and the output end of the third operational amplifier is respectively connected with the inverting input end of the third operational amplifier and the inverting input end of the tested operational amplifier; the non-inverting input end of the tested operational amplifier is connected with the common mode voltage input end.
Description
Technical Field
The invention relates to the technical field of circuit testing, in particular to a testing device for input offset voltage of an operational amplifier.
Background
The operational amplifier is widely applied to the fields of electronic measurement, automatic control, communication and computers. The operational amplifier has a very large number of parameters, wherein offset voltage is a key parameter for measuring the performance of the operational amplifier. The offset voltage of the operational amplifier determines the magnitude of an error signal actually introduced in the operation process, so that the accuracy of the operational amplifier for amplifying the real signal in the whole use process is affected.
At present, three methods for testing input offset voltage of operational amplifier exist.
As shown in fig. 1, the first method is to short-circuit the input end of the operational amplifier to be tested, and then directly test the voltage of the output end, namely, the offset voltage of the operational amplifier is tested. The test method has a very simple structure, can normally test in some operational amplifiers with lower open loop gain, but when the operational amplifier with high open loop gain is encountered, even if the offset voltage is very small, the voltage swing of the output end of the operational amplifier can reach the power supply voltage or the zero point voltage, and the true input offset voltage of the operational amplifier cannot be tested at all.
As shown in fig. 2, the second method is to short-circuit the input end of the operational amplifier to be tested, and then connect the input end with the output end through the feedback resistor Rf to form a closed-loop negative feedback structure. The test method is simpler, but has poor loop stability and lower test precision, and the problem of large fluctuation of test result errors often occurs in the mass production test process.
As shown in fig. 3, the third method is to form a negative feedback structure by using the existing auxiliary operational amplifier and the tested operational amplifier, then adjust the common mode level Vcm of the tested operational amplifier and the reference level of the voltage dividing resistor end of the input end of the auxiliary operational amplifier, then test the voltage of the output end of the auxiliary operational amplifier, and finally calculate the input offset voltage of the tested operational amplifier. The method has higher test precision, but the test steps are complicated, and the most deadly problem of the test method is that after an auxiliary operational amplifier is introduced to form a single-loop closed-loop test structure, the frequency compensation adjustment of a test loop is difficult to complete. Therefore, the test method is extremely easy to generate self-oscillation phenomenon in a test system, so that the tested offset voltage data have larger errors, and the requirement of large-scale mass production test cannot be met at all.
Disclosure of Invention
Aiming at the problems, the invention aims to provide the input offset voltage testing device for the operational amplifier, which has the advantages of extremely high testing precision, stable performance, simple structure and strong operability.
The invention provides a testing device for input offset voltage of an operational amplifier, which comprises: a test circuit unit and a circuit unit under test;
the test circuit unit includes: the first operational amplifier, the second operational amplifier, the third operational amplifier, the first resistor, the second resistor, the third resistor, the fourth resistor, the first capacitor and the second capacitor;
The circuit unit under test includes: a tested operational amplifier;
The non-inverting input end of the first operational amplifier is connected with a common-mode voltage input end, and the output end of the first operational amplifier is respectively connected with the inverting input end of the first operational amplifier, one end of the first capacitor, one end of the third resistor and a second test end; the other end of the first capacitor is grounded;
The other end of the third resistor is respectively connected with one end of the fourth resistor and the inverting input end of the second operational amplifier, and the other end of the fourth resistor is respectively connected with the output end of the second operational amplifier and the first test end; the second capacitor is connected in parallel with two ends of the fourth resistor;
The non-inverting input end of the second operational amplifier is connected with the output end of the tested operational amplifier, the output end of the second operational amplifier is connected with one end of the second resistor, and the other end of the second resistor is respectively connected with one end of the first resistor and the non-inverting input end of the third operational amplifier; the other end of the first resistor is connected with the second test end, and the output end of the third operational amplifier is respectively connected with the inverting input end of the third operational amplifier and the inverting input end of the tested operational amplifier;
And the non-inverting input end of the tested operational amplifier is connected with the common mode voltage input end.
In one possible implementation, the third resistor, the fourth resistor, and the second op-amp together form a first stage closed-loop negative feedback loop.
In one possible implementation, the first resistor, the second resistor, and the second op-amp together form a second stage closed-loop negative feedback loop.
In one possible implementation manner, the inverting input terminal of the first operational amplifier is connected with the output terminal of the first operational amplifier to form a voltage follower, so that the voltage of the inverting input terminal of the first operational amplifier is the same as the voltage of the output terminal of the first operational amplifier.
In one possible implementation manner, the inverting input terminal of the third operational amplifier is connected with the output terminal of the third operational amplifier to form a voltage follower, so that the voltage of the inverting input terminal of the third operational amplifier is the same as the voltage of the output terminal of the third operational amplifier.
In one possible implementation, the input offset voltage of the tested op-amp is a voltage difference between the non-inverting input terminal and the inverting input terminal of the tested op-amp.
In one possible implementation manner, a voltage difference between the output voltage of the first operational amplifier and the output voltage of the second operational amplifier is as follows:
Wherein, vt2 is the output voltage of the first operational amplifier, vt1 is the output voltage of the second operational amplifier, N is the amplification factor of the input offset voltage, vos is the input offset voltage, R1 is the resistance of the first resistor, and R2 is the resistance of the second resistor.
In one possible implementation, the common mode voltage input is an applied voltage.
The input offset voltage testing device for the operational amplifier has the advantages of extremely high testing precision, stable performance, simple structure and strong operability.
Drawings
FIG. 1 is a schematic diagram of an operational amplifier input offset voltage test circuit in the prior art;
FIG. 2 is a schematic diagram of another conventional operational amplifier input offset voltage test circuit;
FIG. 3 is a schematic diagram of another conventional operational amplifier input offset voltage test circuit;
Fig. 4 is a schematic diagram of a testing device for input offset voltage of an op-amp according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention are described in further detail below with reference to the accompanying drawings and examples. The following detailed description of the embodiments and the accompanying drawings are provided to illustrate the principles of the invention and are not intended to limit the scope of the invention, i.e. the invention is not limited to the preferred embodiments described, which is defined by the claims.
In the description of the present invention, it is to be noted that, unless otherwise indicated, the meaning of "plurality" means two or more; the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; the specific meaning of the above terms in the present invention can be understood as appropriate by those of ordinary skill in the art.
Fig. 4 is a schematic diagram of a testing device for an input offset voltage of an operational amplifier according to an embodiment of the present invention, as shown in fig. 4, where the testing device for an input offset voltage of an operational amplifier includes: and the test circuit unit and the tested circuit unit. The test circuit unit includes: the first operational amplifier A1, the second operational amplifier A2 and the third operational amplifier A3, the first resistor R1, the second resistor R2, the third resistor R3, the fourth resistor R4, the first capacitor C1 and the second capacitor C2. The circuit unit under test includes:
And the tested operational amplifier A.
The non-inverting input end of the first operational amplifier A1 is connected with the common-mode voltage input end Vcm, and the output end of the first operational amplifier A1 is respectively connected with the inverting input end of the first operational amplifier A1, one end of the first capacitor C1, one end of the third resistor R3 and the second test end T2. The other end of the first capacitor C1 is grounded.
The other end of the third resistor R3 is respectively connected with one end of the fourth resistor R4 and the inverting input end of the second operational amplifier A2, and the other end of the fourth resistor R4 is respectively connected with the output end of the second operational amplifier A2 and the first test end T1. The second capacitor C2 is connected in parallel to both ends of the fourth resistor R4.
The non-inverting input end of the second operational amplifier A2 is connected with the output end of the tested operational amplifier A, the output end of the second operational amplifier A2 is connected with one end of the second resistor R2, and the other end of the second resistor R2 is respectively connected with one end of the first resistor R1 and the non-inverting input end of the third operational amplifier A3. The other end of the first resistor R1 is connected with a second test end T2, and the output end of the third operational amplifier A3 is respectively connected with the inverting input end of the third operational amplifier A3 and the inverting input end of the tested operational amplifier A.
The noninverting input end of the operational amplifier A to be tested is connected with the common mode voltage input end Vcm.
The third resistor R3, the fourth resistor R4 and the second operational amplifier A2 form a first-stage closed-loop negative feedback loop together.
The first resistor R1, the second resistor R2 and the second operational amplifier A2 form a second-stage closed-loop negative feedback loop together.
The reverse input end of the first operational amplifier A1 is connected with the output end of the first operational amplifier A1 to form a voltage follower, so that the voltage of the reverse input end of the first operational amplifier A1 is the same as the voltage of the output end of the first operational amplifier A1, namely vp=vp 1=vcm.
The reverse input end of the third operational amplifier A3 is connected with the output end of the third operational amplifier A3 to form a voltage follower, so that the voltage of the reverse input end of the third operational amplifier A3 is the same as the voltage of the output end of the third operational amplifier A3, namely vn=vn1.
The input offset voltage of the tested operational amplifier a is the voltage difference between the non-inverting input terminal and the inverting input terminal of the tested operational amplifier a, i.e., vos=vp-Vp 0=vp-Vn.
The voltage difference between the output voltage of the first operational amplifier A1 and the output voltage of the second operational amplifier A2 is as follows:
Wherein, vt2 is the output voltage of the first operational amplifier A1, vt1 is the output voltage of the second operational amplifier, N is the amplification factor of the input offset voltage, vos is the input offset voltage, R1 is the resistance of the first resistor, and R2 is the resistance of the second resistor.
The common-mode voltage input end Vcm is an external voltage, and is used as a common-mode input voltage of the tested operational amplifier A and the first operational amplifier A1. The external voltage can more conveniently set the proper common-mode input voltage for different types of tested operational amplifiers. The common-mode voltage input end Vcm is preset, after the testing device is electrified, the input offset voltage of the tested operational amplifier can be directly measured without redundant operation steps, and the testing is extremely simple and practical.
By adopting the testing device, the voltage Vt1 is tested through the first testing port T1, the voltage Vt2 is tested through the second testing port T2, the voltage difference between the two testing ports is V=vt1-Vt 2, and the input offset voltage Vos of the tested operational amplifier A can be accurately calculated according to the formula deduced from the above because the R1 and the R2 are both known quantities.
The invention discloses a testing device for input offset voltage of an operational amplifier, which is characterized in that an existing operational amplifier forms a double closed-loop negative feedback loop as a testing circuit, self-oscillation phenomenon of a testing system can be completely eliminated, the testing circuit can accurately amplify the input offset voltage Vos of the operational amplifier in a tested circuit by N times, and then the amplified voltage is measured to be V=N×Vos, so that the self-oscillation phenomenon of the testing system can be calculatedIts magnification/>The magnification N can thus be set by changing the resistance values of R1, R2.
The invention relates to a testing device for input offset voltage of an operational amplifier, which specifically uses a mathematical formula to deduce and analyze the following details:
For the third resistor R3, the fourth resistor R4 and the second operational amplifier A2 together form a first-stage closed-loop negative feedback loop, since the second operational amplifier A2 works in a linear region, the principle of 'virtual short' and 'virtual break' can be obtained:
From the formula (1), the formula (2) can be deduced as follows:
for the first resistor R1, the second resistor R2 and the second operational amplifier A2 together form a second-stage closed-loop negative feedback loop, since the second operational amplifier A2 works in a linear region, it can be obtained according to the principles of "virtual short" and "virtual break":
substituting the formula (2) into the formula (3) to obtain:
From equation (4), vo can be deduced as follows:
The formula (6) is derived from the formula (5) as follows:
substituting the formula (6) into the formula (2) to obtain:
Also, since vt2=vp 1=vp, so:
Also, since Vp 0=vn, vp-Vp 0=vos:
Vp-Vn＝Vos (9)
so that:
from equation (10), it can be deduced that:
from the above derived equation (10), it can be seen that the output voltage difference of the test circuit unit: deltaV=Vt2-Vt 1, which is exactly the input offset voltage Vos amplification of the measured operational amplifier A Voltage after multiplication.
From the formula (11) finally deduced from the formula (10), it can be seen that the input offset voltage Vos of the tested op-amp a in the tested circuit unit can be directly and accurately tested by the test circuit unit, namely: Meanwhile, the amplification times of the input offset voltage Vos of the tested operational amplifier a can be set by changing the resistance values of the first resistor R1 and the second resistor R2.
The invention is characterized in that a first capacitor C1 to the ground and a second capacitor C2 serving as a feedforward capacitor are added in a tested circuit unit to serve as frequency compensation, and meanwhile, a double-closed-loop structure formed by the first capacitor C1, the second capacitor C2, the second operational amplifier A2, the first resistor R1, the second resistor R2, the third resistor R3 and the fourth resistor R4 can eliminate the self-oscillation problem of a test system.
The reverse input end of the third operational amplifier A3 is connected with the output end of the third operational amplifier A3 to form a voltage follower, and the voltage follower has the functions of increasing input impedance and reducing output impedance, so that distortion change of a small signal in the transmission and conversion process of the small signal in a system can be reduced.
According to the testing device for the input offset voltage of the operational amplifier, the existing operational amplifier forms a double closed-loop negative feedback loop to serve as a testing circuit, so that the self-excitation problem in a testing system can be completely eliminated; the power supply can be carried out by any one of a double-power supply mode, a single-power supply mode and a single-double-power supply mode, and meanwhile, the common-mode voltage Vcm of the power supply can be adjusted arbitrarily by the outside; the device has the advantages of extremely high test precision, stable performance, simple structure and strong operability.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (8)
1. The utility model provides a testing arrangement to input offset voltage of fortune is put which characterized in that includes: a test circuit unit and a circuit unit under test;
The test circuit unit includes: the first operational amplifier (A1), the second operational amplifier (A2), the third operational amplifier (A3), the first resistor (R1), the second resistor (R2), the third resistor (R3), the fourth resistor (R4), the first capacitor (C1) and the second capacitor (C2);
The circuit unit under test includes: a tested operational amplifier (A);
The non-inverting input end of the first operational amplifier (A1) is connected with a common-mode voltage input end (Vcm), and the output end of the first operational amplifier (A1) is respectively connected with the inverting input end of the first operational amplifier (A1), one end of the first capacitor (C1), one end of the third resistor (R3) and a second test end (T2); the other end of the first capacitor (C1) is grounded;
The other end of the third resistor (R3) is respectively connected with one end of the fourth resistor (R4) and the inverting input end of the second operational amplifier (A2), and the other end of the fourth resistor (R4) is respectively connected with the output end of the second operational amplifier (A2) and the first test end (T1); the second capacitor (C2) is connected in parallel to two ends of the fourth resistor (R4);
The non-inverting input end of the second operational amplifier (A2) is connected with the output end of the tested operational amplifier (A), the output end of the second operational amplifier (A2) is connected with one end of the second resistor (R2), and the other end of the second resistor (R2) is respectively connected with one end of the first resistor (R1) and the non-inverting input end of the third operational amplifier (A3); the other end of the first resistor (R1) is connected with the second test end (T2), and the output end of the third operational amplifier (A3) is respectively connected with the inverting input end of the third operational amplifier (A3) and the inverting input end of the tested operational amplifier (A);
the non-inverting input end of the tested operational amplifier (A) is connected with the common-mode voltage input end (Vcm).
2. The test device for an input offset voltage of an operational amplifier according to claim 1, wherein the third resistor (R3), the fourth resistor (R4) and the second operational amplifier (A2) together form a first-stage closed-loop negative feedback loop.
3. The test device for an input offset voltage of an operational amplifier according to claim 1, wherein the first resistor (R1), the second resistor (R2) and the second operational amplifier (A2) together form a second-stage closed-loop negative feedback loop.
4. The test device for an input offset voltage of an operational amplifier according to claim 1, wherein an inverting input terminal of the first operational amplifier (A1) is connected with an output terminal of the first operational amplifier (A1) to form a voltage follower, so that the inverting input terminal of the first operational amplifier (A1) is the same as a voltage of the output terminal of the first operational amplifier (A1).
5. The device for testing an input offset voltage of an operational amplifier according to claim 1, wherein an inverting input terminal of the third operational amplifier (A3) is connected with an output terminal of the third operational amplifier (A3) to form a voltage follower, so that the inverting input terminal of the third operational amplifier (A3) is the same as the voltage of the output terminal of the third operational amplifier (A3).
6. The device for testing an input offset voltage of an op-amp according to claim 1, wherein the input offset voltage of the op-amp (a) under test is a voltage difference between a non-inverting input terminal and an inverting input terminal of the op-amp (a) under test.
7. The test device for an input offset voltage of an operational amplifier according to claim 1, wherein a voltage difference between an output voltage of the first operational amplifier (A1) and an output voltage of the second operational amplifier (A2) is as follows:
Wherein, vt2 is the output voltage of the first operational amplifier, vt1 is the output voltage of the second operational amplifier, N is the amplification factor of the input offset voltage, vos is the input offset voltage, R1 is the resistance of the first resistor, and R2 is the resistance of the second resistor.
8. The test device for input offset voltage of operational amplifier according to claim 1, wherein the common mode voltage input terminal (Vcm) is an applied voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311170750.9A CN117214661B (en) | 2023-09-11 | 2023-09-11 | Input offset voltage testing device for operational amplifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311170750.9A CN117214661B (en) | 2023-09-11 | 2023-09-11 | Input offset voltage testing device for operational amplifier |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN117214661A CN117214661A (en) | 2023-12-12 |
| CN117214661B true CN117214661B (en) | 2024-04-19 |
Family
ID=89036442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311170750.9A Active CN117214661B (en) | 2023-09-11 | 2023-09-11 | Input offset voltage testing device for operational amplifier |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117214661B (en) |
Citations (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54126476A (en) * | 1978-03-24 | 1979-10-01 | Nec Corp | Offset voltage measuring method of semiconductor integrated operational amplifier circuit |
| US6268734B1 (en) * | 2000-03-10 | 2001-07-31 | Analog Devices, Inc. | Operational amplifier input offset voltage and input bias current test circuit |
| US6762634B1 (en) * | 2003-08-13 | 2004-07-13 | Pericom Semiconductor Corp. | Dual-loop PLL with DAC offset for frequency shift while maintaining input tracking |
| US7548115B1 (en) * | 2006-09-21 | 2009-06-16 | Linear Technology Corporation | Common mode rejection ratio trim circuit and methodology |
| CN203414570U (en) * | 2013-08-02 | 2014-01-29 | 聚辰半导体(上海)有限公司 | Testing circuit for zero-drift operation amplifier |
| WO2017148044A1 (en) * | 2016-02-29 | 2017-09-08 | 上海鸣志自动控制设备有限公司 | Sampling device compensating for operational amplifier offset voltage by increasing operational amplifier input voltage |
| CN108627686A (en) * | 2018-06-27 | 2018-10-09 | 北京励芯泰思特测试技术有限公司 | It is a kind of measure amplifier bias current circuit and method and shielding control unit |
| CN110133403A (en) * | 2019-05-15 | 2019-08-16 | 西北核技术研究院 | A kind of operational amplifier on-line testing circuit and method suitable for radiation environment |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN111064401A (en) * | 2019-12-20 | 2020-04-24 | 浙江理工大学 | High-precision voltage-regulating constant-current source system suitable for strong inductive load |
| CN111416582A (en) * | 2020-04-08 | 2020-07-14 | 上海必阳科技有限公司 | Self-calibration circuit for input offset voltage of operational amplifier integrated circuit |
| CN212514879U (en) * | 2020-03-02 | 2021-02-09 | 北京华峰测控技术股份有限公司 | Operational amplifier test system |
| CN113687125A (en) * | 2020-05-18 | 2021-11-23 | 广州汽车集团股份有限公司 | Offset voltage correction method and system for operational amplifier in current detection circuit |
| CN114062900A (en) * | 2021-12-13 | 2022-02-18 | 中国电子科技集团公司第四十七研究所 | Operational amplifier circuit offset voltage testing method |
| CN114518486A (en) * | 2020-11-18 | 2022-05-20 | 华大半导体有限公司 | Method and circuit for measuring input offset voltage |
| KR20220084487A (en) * | 2020-12-14 | 2022-06-21 | 서울시립대학교 산학협력단 | Offset cancellation circuit for operational amplifier |
| CN217718009U (en) * | 2022-06-28 | 2022-11-01 | 北京华峰测控技术股份有限公司 | High-speed operational amplifier test circuit |
| CN115441841A (en) * | 2022-09-17 | 2022-12-06 | 深圳市英锐恩科技有限公司 | Circuit, method and system for reducing operational amplifier offset voltage output error |
| CN115656775A (en) * | 2022-10-26 | 2023-01-31 | 天水七四九电子有限公司 | Method and device for testing offset voltage of instrument amplifier |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4152676B2 (en) * | 2002-06-13 | 2008-09-17 | 株式会社アドバンテスト | Differential voltage measuring equipment, semiconductor testing equipment |
-
2023
- 2023-09-11 CN CN202311170750.9A patent/CN117214661B/en active Active
Patent Citations (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54126476A (en) * | 1978-03-24 | 1979-10-01 | Nec Corp | Offset voltage measuring method of semiconductor integrated operational amplifier circuit |
| US6268734B1 (en) * | 2000-03-10 | 2001-07-31 | Analog Devices, Inc. | Operational amplifier input offset voltage and input bias current test circuit |
| US6762634B1 (en) * | 2003-08-13 | 2004-07-13 | Pericom Semiconductor Corp. | Dual-loop PLL with DAC offset for frequency shift while maintaining input tracking |
| US7548115B1 (en) * | 2006-09-21 | 2009-06-16 | Linear Technology Corporation | Common mode rejection ratio trim circuit and methodology |
| CN203414570U (en) * | 2013-08-02 | 2014-01-29 | 聚辰半导体(上海)有限公司 | Testing circuit for zero-drift operation amplifier |
| WO2017148044A1 (en) * | 2016-02-29 | 2017-09-08 | 上海鸣志自动控制设备有限公司 | Sampling device compensating for operational amplifier offset voltage by increasing operational amplifier input voltage |
| CN108627686A (en) * | 2018-06-27 | 2018-10-09 | 北京励芯泰思特测试技术有限公司 | It is a kind of measure amplifier bias current circuit and method and shielding control unit |
| CN110133403A (en) * | 2019-05-15 | 2019-08-16 | 西北核技术研究院 | A kind of operational amplifier on-line testing circuit and method suitable for radiation environment |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN111064401A (en) * | 2019-12-20 | 2020-04-24 | 浙江理工大学 | High-precision voltage-regulating constant-current source system suitable for strong inductive load |
| CN212514879U (en) * | 2020-03-02 | 2021-02-09 | 北京华峰测控技术股份有限公司 | Operational amplifier test system |
| CN111416582A (en) * | 2020-04-08 | 2020-07-14 | 上海必阳科技有限公司 | Self-calibration circuit for input offset voltage of operational amplifier integrated circuit |
| CN113687125A (en) * | 2020-05-18 | 2021-11-23 | 广州汽车集团股份有限公司 | Offset voltage correction method and system for operational amplifier in current detection circuit |
| CN114518486A (en) * | 2020-11-18 | 2022-05-20 | 华大半导体有限公司 | Method and circuit for measuring input offset voltage |
| KR20220084487A (en) * | 2020-12-14 | 2022-06-21 | 서울시립대학교 산학협력단 | Offset cancellation circuit for operational amplifier |
| CN114062900A (en) * | 2021-12-13 | 2022-02-18 | 中国电子科技集团公司第四十七研究所 | Operational amplifier circuit offset voltage testing method |
| CN217718009U (en) * | 2022-06-28 | 2022-11-01 | 北京华峰测控技术股份有限公司 | High-speed operational amplifier test circuit |
| CN115441841A (en) * | 2022-09-17 | 2022-12-06 | 深圳市英锐恩科技有限公司 | Circuit, method and system for reducing operational amplifier offset voltage output error |
| CN115656775A (en) * | 2022-10-26 | 2023-01-31 | 天水七四九电子有限公司 | Method and device for testing offset voltage of instrument amplifier |
Non-Patent Citations (2)
| Title |
|---|
| New Input Offset Voltage Measurement Setup for Ultra Low-Voltage Fully Differential Amplifier;Potocny, M等;《 2018 23RD INTERNATIONAL CONFERENCE ON APPLIED ELECTRONICS (AE)》;20181231;全文 * |
| 一种数字自 动校准运放失调 电压技术;郭书苞等;《电子器件》;20061231;第29卷(第4期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN117214661A (en) | 2023-12-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN214041554U (en) | Wide digital ground resistance tester of application scope | |
| CN114062900A (en) | Operational amplifier circuit offset voltage testing method | |
| CN117214661B (en) | Input offset voltage testing device for operational amplifier | |
| CN105334378A (en) | Prepositioned difference measuring circuit and measuring device with circuit | |
| CN208334490U (en) | A kind of micro-current Precision measurement circuit | |
| CN212875747U (en) | Adjustable amplifying circuit of each sensitivity range of pressure sensor | |
| CN111464136A (en) | Integrated chopper and automatic zero-setting high-precision operational amplification circuit | |
| CN101123419A (en) | Automatic control method for RF amplifier gain based on varying electrical bridge principle | |
| CN217718009U (en) | High-speed operational amplifier test circuit | |
| CN211063578U (en) | T-shaped resistance network trans-impedance amplifying circuit with automatic voltage compensation function | |
| CN210835177U (en) | Battery detection circuit | |
| CN102042828A (en) | Coupling signal suppression circuit in quartz tuning fork gyroscope | |
| CN221202543U (en) | Signal acquisition circuit and signal acquisition equipment | |
| CN112904071A (en) | Zero-flux current transformer | |
| CN219740328U (en) | High common-mode voltage input differential amplifier | |
| CN113114139B (en) | Sensor exciting circuit based on D-type power amplifier | |
| CN110412485A (en) | A kind of output current detection circuit | |
| CN112904111B (en) | Ion signal detection circuit | |
| CN220915258U (en) | Power supply circuit for compensating offset of operational amplifier VOS in amplifying circuit through MCU | |
| CN104639053A (en) | High-precision weak signal amplification and measurement method | |
| CN214755476U (en) | Circuit of microcomputer protection device | |
| CN221263774U (en) | High common mode rejection ratio amplifying circuit | |
| CN117890664A (en) | Bipolar pulse voltage sampling circuit and sampling method | |
| CN113804959B (en) | High-precision high-speed weak current measurement circuit and measurement method based on transimpedance amplification | |
| CN114879797B (en) | High-voltage current source control system and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |