CN117073604B - Coating thickness measuring method, device, equipment and storage medium - Google Patents
Coating thickness measuring method, device, equipment and storage medium Download PDFInfo
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- 238000000576 coating method Methods 0.000 title claims abstract description 78
- 239000011248 coating agent Substances 0.000 title claims abstract description 77
- 238000000034 method Methods 0.000 title claims abstract description 52
- 238000003860 storage Methods 0.000 title claims abstract description 14
- 238000005070 sampling Methods 0.000 claims abstract description 117
- 239000013077 target material Substances 0.000 claims abstract description 78
- 239000000463 material Substances 0.000 claims abstract description 52
- 238000005303 weighing Methods 0.000 claims abstract description 51
- 238000004364 calculation method Methods 0.000 claims abstract description 44
- 238000007781 pre-processing Methods 0.000 claims abstract description 11
- 238000012544 monitoring process Methods 0.000 claims abstract description 9
- 238000009675 coating thickness measurement Methods 0.000 claims description 10
- 238000012545 processing Methods 0.000 claims description 5
- 230000004044 response Effects 0.000 claims description 5
- 230000008859 change Effects 0.000 claims description 4
- 230000004913 activation Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 238000004590 computer program Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 239000013307 optical fiber Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 1
- 230000005250 beta ray Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004984 smart glass Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
The embodiment of the specification provides a coating thickness measuring method, a device, equipment and a storage medium, wherein the coating thickness measuring method comprises the following steps: the coating thickness measuring method is characterized by comprising the following steps: responding to a device starting instruction, and monitoring a target material; acquiring at least one initial sample data in case it is recognized that the target material has a coating; preprocessing at least one initial sampling data to obtain at least one target sampling data; determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material; the thickness of the target material is determined based on weighing data, at least one target sampling data and a preset calculation rule, and manual operation is avoided through automatic data acquisition, material weighing and thickness calculation, so that the measurement efficiency is improved, and the safety is improved.
Description
Technical Field
The embodiment of the specification relates to the technical field of measurement, in particular to a coating thickness measuring method.
Background
In the coating production, it is necessary to detect the coated areal density using a beta-ray thickness gauge. When the thickness gauge is calibrated, the calibrated material is needed to be manually placed between the sensors of the thickness gauge, then the detection value is collected, and the actual surface density is input into software. In this process, the operator is located closer to the beta radiation source and inevitably suffers from less radiation, which is detrimental to health. Therefore, it is necessary to use a calibration method that does not require manual contact.
The conventional manual calibration method needs to manually take materials between the sensors, so that operators can receive radiation. Thus, a better solution is needed.
Disclosure of Invention
In view of this, the present description embodiments provide a coating thickness measuring method. One or more embodiments of the present specification are also directed to a coating thickness measuring apparatus, a computing device, a computer-readable storage medium, and a computer program that address the technical shortcomings of the prior art.
According to a first aspect of embodiments of the present specification, there is provided a coating thickness measuring method, comprising:
responding to a device starting instruction, and monitoring a target material;
acquiring at least one initial sample data in case it is recognized that the target material has a coating;
preprocessing at least one initial sampling data to obtain at least one target sampling data;
determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material;
the thickness of the target material is determined based on the weighing data, the at least one target sampling data and the preset calculation rules.
In one possible implementation, in the event that the presence of a coating of the target material is identified, at least one initial sample data is obtained, including:
determining pump speed data of the device upon identifying the presence of a coating of the target material;
at least one initial sample data is obtained from the pump speed data.
In one possible implementation, obtaining at least one initial sample data from pump speed data includes:
under the condition that pump speed data change in a set time period, at least two pieces of current initial sampling data corresponding to the current pump speed data are obtained;
at least one initial sample data is obtained based on at least two current initial sample data.
In one possible implementation, preprocessing at least one initial sample data to obtain at least one target sample data includes:
acquiring each initial sampling data in at least one initial sampling data, and determining at least two current initial sampling data corresponding to each initial sampling data;
and carrying out average calculation on at least two pieces of current initial sampling data corresponding to each piece of initial sampling data to obtain at least one piece of target sampling data.
In one possible implementation, determining weighing data of a portion of material corresponding to the at least one target sampling data includes:
determining a preset length, and sampling the target material based on the preset length and at least one target sampling data to obtain at least one part of material;
and weighing at least one part of the materials to obtain weighing data of the part of the materials corresponding to the at least one target sampling data.
In one possible implementation, determining the thickness of the target material based on the weighing data, the at least one target sampling data, and the preset calculation rule includes:
determining an attenuation coefficient calculation rule according to a preset calculation rule, and determining an attenuation coefficient according to weighing data and at least one target sampling data through the attenuation coefficient calculation rule;
the thickness of the target material is determined based on the attenuation coefficient and the at least one target sample data.
In one possible implementation, determining the thickness of the target material based on the attenuation coefficient and the at least one target sample data includes:
determining a thickness sampling value of the target material according to at least one target sampling data;
determining a target attenuation coefficient based on the thickness sample value and the attenuation coefficient;
the thickness of the target material is determined based on the at least one target sample data and the target attenuation coefficient.
According to a second aspect of embodiments of the present specification, there is provided a coating thickness measuring device comprising:
a device monitoring module configured to monitor a target material in response to a device activation instruction;
a data acquisition module configured to acquire at least one initial sample data upon identifying the presence of a coating of a target material;
the data processing module is configured to preprocess at least one initial sampling data to obtain at least one target sampling data;
a material weighing module configured to determine weighing data of a portion of material corresponding to the at least one target sampling data; wherein the portion of material is a portion of the target material;
and a thickness calculation module configured to determine a thickness of the target material based on the weighing data, the at least one target sampling data, and the preset calculation rules.
According to a third aspect of embodiments of the present specification, there is provided a computing device comprising:
a memory and a processor;
the memory is configured to store computer-executable instructions that, when executed by the processor, perform the steps of the coating thickness measurement method described above.
According to a fourth aspect of embodiments of the present specification, there is provided a computer readable storage medium storing computer executable instructions which, when executed by a processor, implement the steps of the coating thickness measuring method described above.
According to a fifth aspect of embodiments of the present specification, there is provided a computer program, wherein the computer program, when executed in a computer, causes the computer to perform the steps of the coating thickness measuring method described above.
The embodiment of the specification provides a coating thickness measuring method, a device, equipment and a storage medium, wherein the coating thickness measuring method comprises the following steps: the coating thickness measuring method is characterized by comprising the following steps: responding to a device starting instruction, and monitoring a target material; acquiring at least one initial sample data in case it is recognized that the target material has a coating; preprocessing at least one initial sampling data to obtain at least one target sampling data; determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material; the thickness of the target material is determined based on weighing data, at least one target sampling data and a preset calculation rule, and manual operation is avoided through automatic data acquisition, material weighing and thickness calculation, so that the measurement efficiency is improved, and the safety is improved.
Drawings
Fig. 1 is a schematic view of a scenario of a coating thickness measurement method according to an embodiment of the present disclosure;
FIG. 2 is a flow chart of a coating thickness measurement method provided in one embodiment of the present disclosure;
FIG. 3 is a system architecture diagram of a coating thickness measurement method according to one embodiment of the present disclosure;
FIG. 4 is a schematic view of an apparatus for a coating thickness measurement method according to one embodiment of the present disclosure;
FIG. 5 is a schematic structural view of a coating thickness measuring device according to an embodiment of the present disclosure;
FIG. 6 is a block diagram of a computing device provided in one embodiment of the present description.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present description. This description may be embodied in many other forms than described herein and similarly generalized by those skilled in the art to whom this disclosure pertains without departing from the spirit of the disclosure and, therefore, this disclosure is not limited by the specific implementations disclosed below.
The terminology used in the one or more embodiments of the specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the one or more embodiments of the specification. As used in this specification, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used in one or more embodiments of the present specification refers to and encompasses any or all possible combinations of one or more of the associated listed items.
It should be understood that, although the terms first, second, etc. may be used in one or more embodiments of this specification to describe various information, these information should not be limited by these terms. These terms are only used to distinguish one type of information from another. For example, a first may also be referred to as a second, and similarly, a second may also be referred to as a first, without departing from the scope of one or more embodiments of the present description. The word "if" as used herein may be interpreted as "at … …" or "at … …" or "responsive to a determination", depending on the context.
In the present specification, a coating thickness measuring method is provided, and the present specification relates to a coating thickness measuring apparatus, a computing device, and a computer-readable storage medium, which are described in detail one by one in the following examples.
Referring to fig. 1, fig. 1 shows a schematic view of a scenario of a coating thickness measuring method according to an embodiment of the present disclosure.
In the application scenario of fig. 1, a computing device 101 may monitor 103 a target material in response to a device start-up instruction 102; in the event that a coating of the target material is identified, at least one initial sample data 104 is acquired; preprocessing the at least one initial sample data 104 to obtain at least one target sample data 105; determining weighing data 106 for the portion of material corresponding to the at least one target sample data 105, the computing device 101 may determine a thickness of the target material based on the weighing data 106, the at least one target sample data 105, and a preset calculation rule, as indicated by reference numeral 107.
The computing device 101 may be hardware or software. When the computing device 101 is hardware, it may be implemented as a distributed cluster of multiple servers or terminal devices, or as a single server or single terminal device. When the computing device 101 is embodied as software, it may be installed in the hardware devices listed above. It may be implemented as a plurality of software or software modules, for example, for providing distributed services, or as a single software or software module. The present invention is not particularly limited herein.
Referring to fig. 2, fig. 2 shows a flowchart of a coating thickness measuring method according to an embodiment of the present disclosure, which specifically includes the following steps.
Step 201: in response to the device start-up instruction, the target material is monitored.
In practical applications, referring to fig. 3, the embodiment of the present disclosure may employ a thickness measuring device, where the thickness measuring device includes a computer, a controller, a radiation sensor, and an additional optical fiber sensor, an electronic scale. The electronic scale data sends weighing data to the computer through the serial port. The controller collects data according to the on-off signals of the optical fiber sensor, and sends each collected group of data to the computer in the form of data packets.
Step 202: at least one initial sample data is acquired in the event that the presence of a coating of the target material is identified.
In one possible implementation, in the event that the presence of a coating of the target material is identified, at least one initial sample data is obtained, including: determining pump speed data of the device upon identifying the presence of a coating of the target material; at least one initial sample data is obtained from the pump speed data.
Specifically, the automatic calibration module of the thickness measuring software is started first, a calibration interface is popped up, a coating machine is enabled to coat intermittent coatings on a substrate according to a set pump speed, and referring to fig. 4, a pump speed 1 coating, a pump speed 2 coating, a pump speed 3 coating, a pump speed 4 coating and a pump speed 5 coating can exist on a target material.
In one possible implementation, obtaining at least one initial sample data from pump speed data includes: under the condition that pump speed data change in a set time period, at least two pieces of current initial sampling data corresponding to the current pump speed data are obtained; at least one initial sample data is obtained based on at least two current initial sample data.
Specifically, when the optical fiber sensor detects that the coating exists, namely, the sampling data starts to be recorded, and the pump speed 1 coating, the pump speed 2 coating, the pump speed 3 coating, the pump speed 4 coating and the pump speed 5 coating exist, an acquisition data array of 5 pump speeds is finally formed, and the table 1 is referred to.
TABLE 1
Step 203: and preprocessing at least one initial sampling data to obtain at least one target sampling data.
In one possible implementation, preprocessing at least one initial sample data to obtain at least one target sample data includes: acquiring each initial sampling data in at least one initial sampling data, and determining at least two current initial sampling data corresponding to each initial sampling data; and carrying out average calculation on at least two pieces of current initial sampling data corresponding to each piece of initial sampling data to obtain at least one piece of target sampling data.
In practical application, the average value of the data arrays collected at each pump speed is obtained and recorded in a system database.
For example, the data for pump speed 1 coating, pump speed 2 coating, pump speed 3 coating, pump speed 4 coating, and pump speed 5 coating described above are averaged and stored in a database.
Step 204: weighing data of the portion of material corresponding to the at least one target sampling data is determined. Wherein the portion of material is part of the target material.
In one possible implementation, determining weighing data of a portion of material corresponding to the at least one target sampling data includes: determining a preset length, and sampling the target material based on the preset length and at least one target sampling data to obtain at least one part of material; and weighing at least one part of the materials to obtain weighing data of the part of the materials corresponding to the at least one target sampling data.
In practical applications, the sampler is triggered to sample the slice when the material passes through the sampling roller (obtained by delaying the signal of the optical fiber sensor) according to the set length. And an operator sequentially places the sampling slices on the electronic scale according to the pump speed sequence, and after each slice is placed, the electronic scale automatically sends the sampling slices to the thickness measuring software through the serial port. The sample data look-up table is stored in a database. See table 2.
TABLE 2
Step 205: the thickness of the target material is determined based on the weighing data, the at least one target sampling data and the preset calculation rules.
In one possible implementation, determining the thickness of the target material based on the weighing data, the at least one target sampling data, and the preset calculation rule includes: determining an attenuation coefficient calculation rule according to a preset calculation rule, and determining an attenuation coefficient according to weighing data and at least one target sampling data through the attenuation coefficient calculation rule; the thickness of the target material is determined based on the attenuation coefficient and the at least one target sample data.
In practical applications, the attenuation coefficient may be calculated using a formula, as described below.
U n = 1/|ln(I n /I 0 ) ×d n |
Wherein U is n I is the attenuation coefficient at the pump speed n n Is the signal sampling value at the pump speed n, I 0 D is the sampling value of the signal to the air when no load is applied n Is the actual areal density at pump speed n.
In one possible implementation, determining the thickness of the target material based on the attenuation coefficient and the at least one target sample data includes: determining a thickness sampling value of the target material according to at least one target sampling data; determining a target attenuation coefficient based on the thickness sample value and the attenuation coefficient; the thickness of the target material is determined based on the at least one target sample data and the target attenuation coefficient.
In practical applications, the calculation may be based on the following steps when measuring the actual material thickness.
(1) Reading a sampling value I of the actual material thickness x ；
(2) Sampling value I according to thickness x Checking a calibration data table, and calculating the value of n to ensure that the value of n meets the following conditions: calibrating sampling value I n Real-time sampling value I is less than or equal to x < calibration sample value I n+1 The method comprises the steps of carrying out a first treatment on the surface of the Wherein n is the pump speed index determined in table 2 above;
(3) According to the n value, the attenuation coefficient U is calculated by table lookup x . The formula is as follows;
U x = (sample value-calibration sample value n)/(calibration sample value +1-calibration sample value n) ×u n+1 -U n ) + U n
(4) Calculating the actual material thickness value d x 。
Specifically, the actual thickness of the material can be calculated using the following formula.
d x = 1/|ln(I x /I 0 ) *U x |
Wherein U is x To be in the sampling value I x Attenuation coefficient at time, I x Is of surface density d x Signal sampling value, I 0 D is the sampling value at idle x To measure the areal density of the material.
The embodiment of the specification provides a coating thickness measuring method, a device, equipment and a storage medium, wherein the coating thickness measuring method comprises the following steps: the coating thickness measuring method is characterized by comprising the following steps: responding to a device starting instruction, and monitoring a target material; acquiring at least one initial sample data in case it is recognized that the target material has a coating; preprocessing at least one initial sampling data to obtain at least one target sampling data; determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material; the thickness of the target material is determined based on weighing data, at least one target sampling data and a preset calculation rule, and manual operation is avoided through automatic data acquisition, material weighing and thickness calculation, so that the measurement efficiency is improved, and the safety is improved.
Corresponding to the method embodiment, the present disclosure further provides an embodiment of a coating thickness measuring device, and fig. 5 shows a schematic structural diagram of the coating thickness measuring device according to one embodiment of the present disclosure. As shown in fig. 5, the apparatus includes:
a device monitoring module 501 configured to monitor a target material in response to a device activation instruction;
a data acquisition module 502 configured to acquire at least one initial sample data upon identifying the presence of a coating of a target material;
a data processing module 503 configured to pre-process at least one initial sample data to obtain at least one target sample data;
a material weighing module 504 configured to determine weighing data for a portion of the material corresponding to the at least one target sampling data; wherein the portion of material is a portion of the target material;
the thickness calculation module 505 is configured to determine the thickness of the target material based on the weighing data, the at least one target sampling data, and the preset calculation rules.
In one possible implementation, the data acquisition module 502 is further configured to:
determining pump speed data of the device upon identifying the presence of a coating of the target material;
at least one initial sample data is obtained from the pump speed data.
In one possible implementation, the data acquisition module 502 is further configured to:
under the condition that pump speed data change in a set time period, at least two pieces of current initial sampling data corresponding to the current pump speed data are obtained;
at least one initial sample data is obtained based on at least two current initial sample data.
In one possible implementation, the data processing module 503 is further configured to:
acquiring each initial sampling data in at least one initial sampling data, and determining at least two current initial sampling data corresponding to each initial sampling data;
and carrying out average calculation on at least two pieces of current initial sampling data corresponding to each piece of initial sampling data to obtain at least one piece of target sampling data.
In one possible implementation, the material weighing module 504 is further configured to:
determining a preset length, and sampling the target material based on the preset length and at least one target sampling data to obtain at least one part of material;
and weighing at least one part of the materials to obtain weighing data of the part of the materials corresponding to the at least one target sampling data.
In one possible implementation, the thickness calculation module 505 is further configured to:
determining an attenuation coefficient calculation rule according to a preset calculation rule, and determining an attenuation coefficient according to weighing data and at least one target sampling data through the attenuation coefficient calculation rule;
the thickness of the target material is determined based on the attenuation coefficient and the at least one target sample data.
In one possible implementation, the thickness calculation module 505 is further configured to:
determining a thickness sampling value of the target material according to at least one target sampling data;
determining a target attenuation coefficient based on the thickness sample value and the attenuation coefficient;
the thickness of the target material is determined based on the at least one target sample data and the target attenuation coefficient.
The embodiment of the specification provides a coating thickness measuring method, a device, equipment and a storage medium, wherein the coating thickness measuring device comprises: the coating thickness measuring method is characterized by comprising the following steps: responding to a device starting instruction, and monitoring a target material; acquiring at least one initial sample data in case it is recognized that the target material has a coating; preprocessing at least one initial sampling data to obtain at least one target sampling data; determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material; the thickness of the target material is determined based on weighing data, at least one target sampling data and a preset calculation rule, and manual operation is avoided through automatic data acquisition, material weighing and thickness calculation, so that the measurement efficiency is improved, and the safety is improved.
The above is a schematic solution of a coating thickness measuring device of the present embodiment. It should be noted that, the technical solution of the coating thickness measuring device and the technical solution of the coating thickness measuring method belong to the same conception, and details of the technical solution of the coating thickness measuring device which are not described in detail can be referred to the description of the technical solution of the coating thickness measuring method.
Fig. 6 illustrates a block diagram of a computing device 600 provided in accordance with one embodiment of the present description. The components of computing device 600 include, but are not limited to, memory 610 and processor 620. The processor 620 is coupled to the memory 610 via a bus 630 and a database 650 is used to hold data.
Computing device 600 also includes access device 640, access device 640 enabling computing device 600 to communicate via one or more networks 660. Examples of such networks include public switched telephone networks (PSTN, public Switched Telephone Network), local area networks (LAN, local Area Network), wide area networks (WAN, wide Area Network), personal area networks (PAN, personal Area Network), or combinations of communication networks such as the internet. The access device 640 may include one or more of any type of network interface, wired or wireless, such as a network interface card (NIC, network interface controller), such as an IEEE802.11 wireless local area network (WLAN, wireless Local Area Network) wireless interface, a worldwide interoperability for microwave access (Wi-MAX, worldwide Interoperability for Microwave Access) interface, an ethernet interface, a universal serial bus (USB, universal Serial Bus) interface, a cellular network interface, a bluetooth interface, near field communication (NFC, near Field Communication).
In one embodiment of the present description, the above-described components of computing device 600, as well as other components not shown in FIG. 6, may also be connected to each other, such as by a bus. It should be understood that the block diagram of the computing device shown in FIG. 6 is for exemplary purposes only and is not intended to limit the scope of the present description. Those skilled in the art may add or replace other components as desired.
Computing device 600 may be any type of stationary or mobile computing device, including a mobile computer or mobile computing device (e.g., tablet, personal digital assistant, laptop, notebook, netbook, etc.), mobile phone (e.g., smart phone), wearable computing device (e.g., smart watch, smart glasses, etc.), or other type of mobile device, or a stationary computing device such as a desktop computer or personal computer (PC, personal Computer). Computing device 600 may also be a mobile or stationary server.
The processor 620 is configured to execute computer-executable instructions that, when executed by the processor, perform the steps of the coating thickness measurement method described above. The foregoing is a schematic illustration of a computing device of this embodiment. It should be noted that, the technical solution of the computing device and the technical solution of the coating thickness measuring method belong to the same conception, and details of the technical solution of the computing device, which are not described in detail, can be referred to the description of the technical solution of the coating thickness measuring method.
An embodiment of the present disclosure also provides a computer-readable storage medium storing computer-executable instructions that, when executed by a processor, implement the steps of the coating thickness measurement method described above.
The above is an exemplary version of a computer-readable storage medium of the present embodiment. It should be noted that, the technical solution of the storage medium and the technical solution of the coating thickness measuring method belong to the same concept, and details of the technical solution of the storage medium which are not described in detail can be referred to the description of the technical solution of the coating thickness measuring method.
An embodiment of the present disclosure also provides a computer program, where the computer program, when executed in a computer, causes the computer to perform the steps of the coating thickness measuring method described above.
The above is an exemplary version of a computer program of the present embodiment. It should be noted that, the technical solution of the computer program and the technical solution of the coating thickness measuring method belong to the same conception, and details of the technical solution of the computer program which are not described in detail can be referred to the description of the technical solution of the coating thickness measuring method.
The foregoing describes specific embodiments of the present disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
The computer instructions include computer program code that may be in source code form, object code form, executable file or some intermediate form, etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth.
It should be noted that, for simplicity of description, the foregoing method embodiments are all expressed as a series of combinations of actions, but it should be understood by those skilled in the art that the embodiments are not limited by the order of actions described, as some steps may be performed in other order or simultaneously according to the embodiments of the present disclosure. Further, those skilled in the art will appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily all required for the embodiments described in the specification.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to the related descriptions of other embodiments.
The preferred embodiments of the present specification disclosed above are merely used to help clarify the present specification. Alternative embodiments are not intended to be exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the teaching of the embodiments. The embodiments were chosen and described in order to best explain the principles of the embodiments and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention.
Claims (8)
1. A coating thickness measurement method, comprising:
responding to a device starting instruction, and monitoring a target material;
acquiring at least one initial sample data in case it is identified that the target material has a coating;
preprocessing the at least one initial sampling data to obtain at least one target sampling data;
determining weighing data of a part of materials corresponding to at least one target sampling data; wherein the portion of material is a portion of the target material;
determining the thickness of the target material based on the weighing data, the at least one target sampling data and a preset calculation rule;
the determining the thickness of the target material based on the weighing data, the at least one target sampling data and a preset calculation rule comprises:
determining an attenuation coefficient calculation rule according to the preset calculation rule, and determining an attenuation coefficient according to the weighing data and the at least one target sampling data through the attenuation coefficient calculation rule;
determining a thickness of the target material based on the attenuation coefficient and the at least one target sample data;
the determining the thickness of the target material based on the attenuation coefficient and the at least one target sample data includes:
determining a thickness sample value of the target material according to the at least one target sample data;
determining a target attenuation coefficient based on the thickness sample value and the attenuation coefficient;
and determining the thickness of the target material according to the at least one target sampling data and the target attenuation coefficient.
2. The method of claim 1, wherein the acquiring at least one initial sample data upon identifying the presence of a coating of the target material comprises:
determining pump speed data of the device upon identifying the presence of a coating of the target material;
and acquiring at least one initial sampling data according to the pump speed data.
3. The method of claim 2, wherein said obtaining at least one initial sample data from said pump speed data comprises:
under the condition that the pump speed data change in a set time period, at least two pieces of current initial sampling data corresponding to the current pump speed data are obtained;
and obtaining at least one initial sampling data based on the at least two current initial sampling data.
4. A method according to claim 3, wherein said preprocessing said at least one initial sample data to obtain at least one target sample data comprises:
acquiring each initial sampling data in the at least one initial sampling data, and determining at least two current initial sampling data corresponding to each initial sampling data;
and carrying out average calculation on the at least two pieces of current initial sampling data corresponding to each piece of initial sampling data to obtain at least one piece of target sampling data.
5. The method of claim 1, wherein determining weighing data for a portion of material corresponding to the at least one target sample data comprises:
determining a preset length, and sampling the target material based on the preset length and the at least one target sampling data to obtain at least one part of material;
and weighing the at least one part of material to obtain weighing data of the part of material corresponding to the at least one target sampling data.
6. A coating thickness measuring apparatus, comprising:
a device monitoring module configured to monitor a target material in response to a device activation instruction;
a data acquisition module configured to acquire at least one initial sample data upon identifying the presence of a coating of the target material;
the data processing module is configured to preprocess the at least one initial sampling data to obtain at least one target sampling data;
a material weighing module configured to determine weighing data of a portion of material corresponding to the at least one target sampling data; wherein the portion of material is a portion of the target material;
a thickness calculation module configured to determine a thickness of the target material based on the weighing data, the at least one target sampling data, and a preset calculation rule;
the determining the thickness of the target material based on the weighing data, the at least one target sampling data and a preset calculation rule comprises:
determining an attenuation coefficient calculation rule according to the preset calculation rule, and determining an attenuation coefficient according to the weighing data and the at least one target sampling data through the attenuation coefficient calculation rule;
determining a thickness of the target material based on the attenuation coefficient and the at least one target sample data;
the determining the thickness of the target material based on the attenuation coefficient and the at least one target sample data includes:
determining a thickness sample value of the target material according to the at least one target sample data;
determining a target attenuation coefficient based on the thickness sample value and the attenuation coefficient;
and determining the thickness of the target material according to the at least one target sampling data and the target attenuation coefficient.
7. A computing device, comprising:
a memory and a processor;
the memory is configured to store computer executable instructions that, when executed by the processor, implement the steps of the coating thickness measurement method of any one of claims 1 to 5.
8. A computer readable storage medium storing computer executable instructions which when executed by a processor perform the steps of the coating thickness measurement method of any one of claims 1 to 5.
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