CN116577597A - Method and system for testing offset voltage of high-precision comparator - Google Patents
Method and system for testing offset voltage of high-precision comparator Download PDFInfo
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- CN116577597A CN116577597A CN202310861793.5A CN202310861793A CN116577597A CN 116577597 A CN116577597 A CN 116577597A CN 202310861793 A CN202310861793 A CN 202310861793A CN 116577597 A CN116577597 A CN 116577597A
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000005070 sampling Methods 0.000 claims abstract description 23
- 238000009966 trimming Methods 0.000 claims description 28
- 238000001914 filtration Methods 0.000 claims description 19
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000004590 computer program Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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Abstract
The application relates to a method for testing offset voltage of a high-precision comparator, which comprises the steps of applying input voltage to an input end of the comparator; setting a fine tuning value of the offset voltage of the comparator as a first preset value, and sampling a first output voltage of the comparator; setting a fine tuning value of the offset voltage of the comparator as a second preset value, and sampling a second output voltage of the comparator; and judging whether the comparator meets the requirement according to the first output voltage and the second output voltage. The input end of the comparator is short-circuited, the fine tuning value of the offset voltage of the comparator is adjusted to simulate the voltage difference of the input end for testing, and then whether the offset voltage of the comparator is in a specified range is judged according to the output voltage of the comparator; therefore, the requirement on the accuracy of the input voltage of the comparator is reduced, and a very accurate voltage difference is not needed; meanwhile, the output end of the comparator is filtered to remove interference, so that the anti-interference performance of the test is improved, and the occurrence of false detection is avoided.
Description
Technical Field
The present application relates to the field of comparator technology, and more particularly, to a method and system for testing offset voltage of a high-precision comparator.
Background
The high-precision comparator is widely applied to various electronic systems due to the advantages of high precision, quick response, low power consumption, wide working voltage range and the like, and comprises the fields of analog signal processing, measuring instruments, automatic control systems, communication equipment, sensor interfaces and the like, and plays an important role in circuits and systems requiring high-precision comparison and judgment.
The offset voltage of the high-precision comparator means that the input terminal of the high-precision comparator should be symmetrical under ideal conditions, but the offset exists in actual conditions. In order to evaluate the performance and reliability of the high-precision comparator to ensure that the high-precision comparator can meet the expected precision requirement in practical application, the offset voltage of the high-precision comparator needs to be tested.
The method for testing offset voltage (offset) of high-precision comparator is generally as follows: fixing a trimming value of the offset voltage of the comparator to a trimming target value, wherein the trimming target value is a value for adjusting the characteristic of the comparator to an optimal state (offset=0); two voltages greater than the offset voltage are applied across the comparator input; whether the precision of the product meets the requirements of the specification is judged by directly sampling the output of the comparator (0 or 1).
The testing method mainly has the following problems: the requirement on the input voltage is high, a very accurate voltage difference is required, and particularly on a high-precision comparator, when the voltage difference is 1mV or lower, the precision of the tester is required to be at a uV level; the anti-interference is poor, when the external environment causes interference to the applied voltage of the tester, the output of the comparator can shake, and the situation of false detection occurs.
Based on this, a new solution is needed.
Disclosure of Invention
The application aims to provide a method for testing offset voltage of a high-precision comparator, so as to eliminate the problem of inaccurate voltage input of a tester and the problem of output jitter caused by external environment interference.
According to an aspect of the present application, there is provided a method for testing offset voltage of a high-precision comparator, comprising the steps of:
applying an input voltage to an input of the comparator, wherein a forward input and a reverse input of the comparator are shorted;
setting a fine tuning value of the offset voltage of the comparator as a first preset value, and sampling a first output voltage of the comparator, wherein the first preset value is a sum of a fine tuning target value and the offset voltage;
setting a fine tuning value of the offset voltage of the comparator as a second preset value, and sampling a second output voltage of the comparator, wherein the second preset value is a difference between a fine tuning target value and the offset voltage; and
and judging whether the comparator meets the requirement according to the first output voltage and the second output voltage.
In the method for testing offset voltage of high-precision comparator provided by the application, before the step of judging whether the comparator meets the requirement according to the first output voltage and the second output voltage, the method further comprises the following steps:
the first output voltage and the second output voltage are filtered.
In the method for testing the offset voltage of the high-precision comparator, when the values of the first output voltage and the second output voltage are opposite, the comparator is judged to meet the requirement.
According to another aspect of the present application, there is also provided a system for testing offset voltage of a high-precision comparator, including:
the setting module is used for setting a fine tuning value of the offset voltage of the comparator, wherein the positive input end and the negative input end of the comparator are in short circuit;
the sampling module is used for sampling the output voltage of the comparator; and
the judging module is used for judging whether the comparator meets the requirement according to a first output voltage when the trimming value of the offset voltage of the comparator is set to a first preset value and a second output voltage when the trimming value of the offset voltage of the comparator is set to a second preset value, wherein the first preset value is the sum of the trimming target value and the offset voltage, and the second preset value is the difference between the trimming target value and the offset voltage.
In the system for testing offset voltage of high-precision comparator provided by the application, the system further comprises:
and the filtering module is used for filtering the first output voltage and the second output voltage.
In the system for testing the offset voltage of the high-precision comparator provided by the application, when the values of the first output voltage and the second output voltage are opposite, the judging module judges that the comparator meets the requirement.
The method and the system for testing the offset voltage of the high-precision comparator have the following beneficial effects: according to the method for testing the offset voltage of the high-precision comparator, the input end of the comparator is short-circuited, the fine tuning value of the offset voltage of the comparator is adjusted to simulate the voltage difference of the input end for testing, and then whether the offset voltage of the comparator is in a specified range is judged according to the output voltage of the comparator; therefore, the requirement on the accuracy of the input voltage of the comparator is reduced, and a very accurate voltage difference is not needed; meanwhile, the output end of the comparator is filtered to remove interference, so that the anti-interference performance of the test is improved, and the occurrence of false detection is avoided.
Drawings
For a clearer description of an embodiment of the application or of a technical solution in the prior art, the drawings that are needed in the description of the embodiment or of the prior art will be briefly described, it being obvious that the drawings in the description below are only embodiments of the application, and that other drawings can be obtained, without inventive effort, by a person skilled in the art from the drawings provided:
FIG. 1 is a flow chart of a method for testing offset voltage of a high-precision comparator according to the present application;
fig. 2 is a schematic diagram of a system for testing offset voltage of a high-precision comparator according to the present application.
Detailed Description
In order that the application may be readily understood, a more complete description of the application will be rendered by reference to the appended drawings. Exemplary embodiments of the present application are illustrated in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
The application has the following general ideas: aiming at the problems of inaccurate voltage input of a tester and output jitter caused by external environment interference in the existing offset voltage testing method, the method for testing the offset voltage of the high-precision comparator is provided, the input end of the comparator is short-circuited, the fine tuning value of the offset voltage of the comparator is adjusted to simulate the voltage difference of the input end for testing, and then whether the offset voltage of the comparator is in a specified range is judged according to the output voltage of the comparator; therefore, the requirement on the accuracy of the input voltage of the comparator is reduced, and a very accurate voltage difference is not needed; meanwhile, the output end of the comparator is filtered to remove interference, so that the anti-interference performance of the test is improved, and the occurrence of false detection is avoided.
In order to better understand the above technical solutions, the following detailed description will be made with reference to the accompanying drawings and specific embodiments, and it should be understood that specific features in the embodiments and examples of the present application are detailed descriptions of the technical solutions of the present application, and not limit the technical solutions of the present application, and the technical features in the embodiments and examples of the present application may be combined with each other without conflict.
Fig. 1 is a flowchart of a method for testing offset voltage of a high-precision comparator according to the present application. As shown in fig. 1, the method for testing offset voltage of high-precision comparator provided by the application comprises the following steps:
step S1, an input voltage is applied to the input end of the comparator, wherein the positive input end and the negative input end of the comparator are in short circuit;
specifically, in one embodiment of the present application, two input terminals of the comparator to be tested are shorted, and then an arbitrary fixed voltage is applied to the input terminals. In the prior art, the output voltage is tested by fixing the fine tuning value of the offset voltage to judge whether the offset voltage is in a reasonable range, so that the voltage difference of two input ends of the comparator needs to be very accurate.
And S2, setting a fine tuning value of the offset voltage of the comparator as a first preset value, and sampling a first output voltage of the comparator, wherein the first preset value is the sum of a fine tuning target value and the offset voltage.
And S3, setting the fine tuning value of the offset voltage of the comparator as a second preset value, and sampling the second output voltage of the comparator, wherein the second preset value is the difference between the fine tuning target value and the offset voltage.
Specifically, in one embodiment of the present application, after a test is started, a first preset value is input to a trimming input port of a comparator, that is, the trimming value of the comparator is changed to a trimming target value+a trimming voltage (offset) value, wherein the trimming voltage value is a voltage value specified in a product specification. At this time, since the two input terminals of the comparator are short-circuited, the input voltages at the two ends corresponding to the analog comparator are Vin and vin+offset values, respectively, and the output voltage of the comparator at this time is sampled. Then, a second preset value is input to the fine tuning input port of the comparator, namely, the fine tuning value of the comparator is changed into a fine tuning target value-offset voltage (offset) value, at this time, the two input ends of the comparator are in short circuit, so that the input voltages at the two ends of the analog comparator are Vin and Vin-offset values, and the output voltage of the comparator at this time is sampled. It will be understood by those skilled in the art that the order of steps S2 and S3 is merely an example, and not limiting the application, i.e. the trimming value of the offset voltage of the comparator may be set to a trimming target value-offset voltage (offset) value, the output voltage may be sampled, and then the trimming value of the offset voltage of the comparator may be set to a trimming target value + offset voltage (offset) value, and the output voltage may be sampled.
Further, after the first output voltage and the second output voltage are obtained through sampling, filtering is needed to be carried out on the first output voltage and the second output voltage so as to eliminate jitter generated by the output of the comparator when the external environment interferes with the applied voltage of the testing machine. In order to eliminate the interference of the external environment to the test result and the jitter of the output of the comparator, the first output voltage and the second output voltage can be subjected to filtering processing, high-frequency noise and interference can be eliminated through filtering, and the test accuracy is improved. The filtering method includes digital filtering and analog filtering. For digital filtering, a digital filter such as an FIR filter or an IIR filter may be used to filter the sampled output voltage. This can obtain a smooth output signal by removing unnecessary high frequency components and noise. For analog filtering, an analog filter such as an RC filter or an LC filter may be used to filter the output voltage. This filtering method filters out high frequency noise and interference by selecting appropriate filter parameters and frequency response characteristics to obtain a stable output signal. Those skilled in the art will appreciate that the appropriate filtering methods and parameters may be selected according to the particular application and requirements, and the application is not limited thereto.
And S4, judging whether the comparator meets the requirement according to the first output voltage and the second output voltage.
Specifically, in an embodiment of the present application, for the first output voltage and the second output voltage obtained by sampling, it is determined whether the first output voltage and the second output voltage are equal, if they are equal (i.e., both are 0 or both are 1), it is indicated that after the trimming voltage is transformed, the output is not inverted, the test is failed, and if they are not equal (i.e., one is 0 and one is 1), it is indicated that the test is passed.
According to the method for testing the offset voltage of the high-precision comparator, the input end of the comparator is short-circuited, the fine tuning value of the offset voltage of the comparator is adjusted to simulate the voltage difference of the input end for testing, namely, the voltages at two ends of the comparator can be fixed on two voltages with different offset values, and the requirement on the precision of the input voltage of the comparator is reduced; filtering and removing interference from the output end of the comparator to judge whether the offset voltage of the comparator is in the range specified by the specification; therefore, the anti-interference performance of the test is improved, and the occurrence of false detection is avoided.
Fig. 2 is a schematic diagram of a system for testing offset voltage of a high-precision comparator according to the present application. As shown in fig. 2, the system for testing offset voltage of high-precision comparator provided by the application is connected to the output end and the trimming end of the comparator 10, and the positive input end and the negative input end of the comparator are short-circuited. The system comprises a setting module 210 for setting a trim value of an offset voltage of the comparator, a sampling module 220 for sampling an output voltage of the comparator, a filtering module 230 for filtering the first output voltage and the second output voltage, and a judging module 240 for judging whether the comparator meets requirements.
Specifically, in one embodiment of the present application, two input terminals of the comparator to be tested are shorted, and then an arbitrary fixed voltage is applied to the input terminals. In the prior art, the output voltage is tested by fixing the fine tuning value of the offset voltage to judge whether the offset voltage is in a reasonable range, so that the voltage difference of two input ends of the comparator needs to be very accurate.
Specifically, in one embodiment of the present application, after a test is started, an input voltage of a trimming input port of a comparator is set to a first preset value through a setting module, that is, a trimming value of the comparator is changed to a trimming target value+a trimming voltage (offset) value, wherein the trimming voltage value is a voltage value specified in a specification of a product specification. At this time, since the two input terminals of the comparator are short-circuited, the input voltages at the two ends corresponding to the analog comparator are Vin and vin+offset values, respectively, and the output voltage of the comparator at this time is sampled by the sampling module. Then, the voltage of the fine tuning input port of the comparator is set to a second preset value through the setting module, namely, the fine tuning value of the comparator is changed to a fine tuning target value-offset voltage (offset) value, at this time, because two input ends of the comparator are in short circuit, the voltage is equivalent to the input voltages at two ends of the analog comparator to be Vin and Vin-offset values, and then the output voltage of the comparator at this time is sampled through the sampling module.
Further, after the first output voltage and the second output voltage are obtained through sampling, the first output voltage and the second output voltage are filtered through a filtering module, so that jitter generated by the output of the comparator when the external environment interferes with the applied voltage of the testing machine is eliminated. Those skilled in the art will appreciate that the appropriate filtering methods and parameters may be selected according to the particular application and requirements, and the application is not limited thereto.
Specifically, in an embodiment of the present application, for the first output voltage and the second output voltage obtained by sampling, the judging module judges whether the first output voltage and the second output voltage are equal, if they are equal (i.e. both are 0 or both are 1), it is indicated that after the trimming voltage is transformed, the output is not flipped, the test is failed, and if they are not equal (i.e. one is 0 and one is 1), it is indicated that the test is passed.
The embodiment of the application also provides a computer readable storage medium, wherein the computer readable storage medium stores a computer program, and the computer program can realize the following steps when being executed by a processor;
applying an input voltage to an input of the comparator, wherein a forward input and a reverse input of the comparator are shorted; setting a fine tuning value of the offset voltage of the comparator as a first preset value, and sampling a first output voltage of the comparator, wherein the first preset value is a sum of a fine tuning target value and the offset voltage; setting a fine tuning value of the offset voltage of the comparator as a second preset value, and sampling a second output voltage of the comparator, wherein the second preset value is a difference between a fine tuning target value and the offset voltage; and judging whether the comparator meets the requirement according to the first output voltage and the second output voltage.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the application may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the application, various features of the application are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be construed as reflecting the intention that: i.e., the claimed application requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this application.
Those skilled in the art will appreciate that the modules in the apparatus of the embodiments may be adaptively changed and disposed in one or more apparatuses different from the embodiments. The modules or units or components of the embodiments may be combined into one module or unit or component and, furthermore, they may be divided into a plurality of sub-modules or sub-units or sub-components. Any combination of all features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or units of any method or apparatus so disclosed, may be used in combination, except insofar as at least some of such features and/or processes or units are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Furthermore, those skilled in the art will appreciate that while some embodiments herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the application and form different embodiments. For example, in the following claims, any of the claimed embodiments can be used in any combination.
Various component embodiments of the application may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that some or all of the functions of some or all of the components in accordance with embodiments of the present application may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present application can also be implemented as an apparatus or device program (e.g., a computer program and a computer program product) for performing a portion or all of the methods described herein. Such a program embodying the present application may be stored on a computer readable medium, or may have the form of one or more signals. Such signals may be downloaded from an internet website, provided on a carrier signal, or provided in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the application, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names.
Claims (6)
1. A method for testing offset voltage of a high precision comparator, comprising the steps of:
applying an input voltage to an input of the comparator, wherein a forward input and a reverse input of the comparator are shorted;
setting a fine tuning value of the offset voltage of the comparator as a first preset value, and sampling a first output voltage of the comparator, wherein the first preset value is a sum of a fine tuning target value and the offset voltage;
setting a fine tuning value of the offset voltage of the comparator as a second preset value, and sampling a second output voltage of the comparator, wherein the second preset value is a difference between a fine tuning target value and the offset voltage; and
and judging whether the comparator meets the requirement according to the first output voltage and the second output voltage.
2. The method for testing offset voltage of high-precision comparator according to claim 1, further comprising, before the step of determining whether the comparator satisfies a requirement based on the first output voltage and the second output voltage:
the first output voltage and the second output voltage are filtered.
3. The method for testing offset voltage of high-precision comparator according to claim 1, wherein the comparator is judged to satisfy a requirement when the values of the first output voltage and the second output voltage are opposite.
4. A system for testing offset voltages of a high precision comparator, comprising:
the setting module is used for setting a fine tuning value of the offset voltage of the comparator, wherein the positive input end and the negative input end of the comparator are in short circuit;
the sampling module is used for sampling the output voltage of the comparator; and
the judging module is used for judging whether the comparator meets the requirement according to a first output voltage when the trimming value of the offset voltage of the comparator is set to a first preset value and a second output voltage when the trimming value of the offset voltage of the comparator is set to a second preset value, wherein the first preset value is the sum of the trimming target value and the offset voltage, and the second preset value is the difference between the trimming target value and the offset voltage.
5. The system for testing the offset voltage of the high-precision comparator according to claim 4, further comprising:
and the filtering module is used for filtering the first output voltage and the second output voltage.
6. The system for testing offset voltages of high precision comparators of claim 4, wherein said determination module determines that said comparator meets a requirement when values of said first output voltage and said second output voltage are opposite.
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Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60142610A (en) * | 1983-12-28 | 1985-07-27 | Fujitsu Ltd | Comparator circuit |
| EP0509585A1 (en) * | 1991-04-15 | 1992-10-21 | Koninklijke Philips Electronics N.V. | Clocked comparator with offset-voltage compensation |
| CN102435818A (en) * | 2011-11-24 | 2012-05-02 | 福州大学 | Test method of high-precision dynamic comparator and test circuit thereof |
| CN102843136A (en) * | 2012-09-15 | 2012-12-26 | 复旦大学 | Method for correcting offset of high-speed high-precision large-range low-power-consumption dynamic comparator |
| CN203164811U (en) * | 2013-03-06 | 2013-08-28 | 山东力创赢芯集成电路有限公司 | Offset voltage compensating circuit of comparator |
| CN105158672A (en) * | 2015-08-24 | 2015-12-16 | 北京中科汉天下电子技术有限公司 | Test circuit |
| CN208424341U (en) * | 2018-07-04 | 2019-01-22 | 珠海市一微半导体有限公司 | A kind of correcting circuit of SAR_ADC unbalance of system voltage |
| CN110348157A (en) * | 2019-07-18 | 2019-10-18 | 北京智芯微电子科技有限公司 | The noise simulation method and system of dynamic comparer |
| CN113726339A (en) * | 2021-08-19 | 2021-11-30 | 江苏润石科技有限公司 | Error feedback-based offset voltage reduction method and data converter |
| CN114062900A (en) * | 2021-12-13 | 2022-02-18 | 中国电子科技集团公司第四十七研究所 | Operational amplifier circuit offset voltage testing method |
| CN115656775A (en) * | 2022-10-26 | 2023-01-31 | 天水七四九电子有限公司 | Method and device for testing offset voltage of instrument amplifier |
| CN116032282A (en) * | 2022-12-19 | 2023-04-28 | 重庆中星微人工智能芯片技术有限公司 | Comparator in successive approximation analog-to-digital converter and offset calibration method |
-
2023
- 2023-07-14 CN CN202310861793.5A patent/CN116577597B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60142610A (en) * | 1983-12-28 | 1985-07-27 | Fujitsu Ltd | Comparator circuit |
| EP0509585A1 (en) * | 1991-04-15 | 1992-10-21 | Koninklijke Philips Electronics N.V. | Clocked comparator with offset-voltage compensation |
| CN102435818A (en) * | 2011-11-24 | 2012-05-02 | 福州大学 | Test method of high-precision dynamic comparator and test circuit thereof |
| CN102843136A (en) * | 2012-09-15 | 2012-12-26 | 复旦大学 | Method for correcting offset of high-speed high-precision large-range low-power-consumption dynamic comparator |
| CN203164811U (en) * | 2013-03-06 | 2013-08-28 | 山东力创赢芯集成电路有限公司 | Offset voltage compensating circuit of comparator |
| CN105158672A (en) * | 2015-08-24 | 2015-12-16 | 北京中科汉天下电子技术有限公司 | Test circuit |
| CN208424341U (en) * | 2018-07-04 | 2019-01-22 | 珠海市一微半导体有限公司 | A kind of correcting circuit of SAR_ADC unbalance of system voltage |
| CN110348157A (en) * | 2019-07-18 | 2019-10-18 | 北京智芯微电子科技有限公司 | The noise simulation method and system of dynamic comparer |
| WO2021008621A1 (en) * | 2019-07-18 | 2021-01-21 | 北京智芯微电子科技有限公司 | Noise simulation method and system for dynamic comparator, and storage medium and computer device |
| CN113726339A (en) * | 2021-08-19 | 2021-11-30 | 江苏润石科技有限公司 | Error feedback-based offset voltage reduction method and data converter |
| CN114062900A (en) * | 2021-12-13 | 2022-02-18 | 中国电子科技集团公司第四十七研究所 | Operational amplifier circuit offset voltage testing method |
| CN115656775A (en) * | 2022-10-26 | 2023-01-31 | 天水七四九电子有限公司 | Method and device for testing offset voltage of instrument amplifier |
| CN116032282A (en) * | 2022-12-19 | 2023-04-28 | 重庆中星微人工智能芯片技术有限公司 | Comparator in successive approximation analog-to-digital converter and offset calibration method |
Non-Patent Citations (1)
| Title |
|---|
| 吴佩: "一种比较器失调电压和漂移的测试方法", 《今日电子》, pages 47 * |
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