CN116203288A - Testing device and testing method for static performance of optical device - Google Patents
Testing device and testing method for static performance of optical device Download PDFInfo
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- 230000003068 static effect Effects 0.000 title claims abstract description 27
- 238000011990 functional testing Methods 0.000 claims abstract description 4
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- 238000004891 communication Methods 0.000 claims description 5
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The application discloses a testing device and a testing method for static performance of an optical device, belongs to the technical field of optical device testing, and relates to a testing device for static performance of an optical device, which comprises the following components: the device comprises a control module, a measuring instrument and a test circuit board; the control module is respectively connected with the measuring instrument and the test circuit board in a signal mode, and the measuring instrument is connected with the test circuit board in a signal mode. The control module controls the measuring instrument to sequentially perform functional tests of resistance, unidirectional conductivity and junction capacitance on the optical device to be tested which is arranged on the test circuit board; the test circuit board is provided with a plurality of CR interfaces, the number of the CR interfaces is larger than the number of IO interfaces on the optical device to be tested, one end of each CR interface is connected to the measuring instrument, the other end of each CR interface is connected to the IO interface, each CR interface is provided with a change-over switch, and the control module controls the change-over switch to be closed so as to form a test loop.
Description
Technical Field
The application relates to the technical field of optical device detection, in particular to a device and a method for testing static performance of an optical device.
Background
The performance of each component needs to be judged after the assembly of the optoelectronic components such as TEC, RTH, LD, PD in the optical device and before the power-on, and the electrical performance and the optical performance are measured after the confirmation. The damage of other related components caused by the damage of the components caused by burning out the components during the electrical property measurement due to human factors is avoided.
In the prior art, an artificial sampling test instrument tests optical devices one by one, and whether the test is qualified is judged according to the data of the instrument test. However, this test method is very cumbersome, requires a worker to sequentially perform multiple tests on loops formed by all the IO ports, and in practice, a condition of missing test is easy to occur.
The existing test instrument generally only has an access port and an access port, although the computer can be used for recording data, and the IO port of the optical device to be tested is sequentially connected to the test instrument in a manual or automatic mode, the test instrument needs to be frequently connected and disconnected in the detection mode, namely, when the IO port detected by the optical device to be tested is replaced, a circuit between the output end and the access port of the test instrument needs to be disconnected first, then the contact end of the test instrument is connected with the IO port of the optical device to be tested, and after the output end and the contact end of the test instrument are closed, the test current of the test instrument is prevented from flowing into the optical device to be tested in the process of replacing the IO port.
In summary, there is a lack of a testing apparatus and a testing method for testing static performance of an optical device, which can prevent the optical device from being damaged during the process of replacing the IO port by the testing current of the testing instrument on the basis of increasing the testing efficiency of the optical device.
Disclosure of Invention
The content of the present application is intended to introduce concepts in a simplified form that are further described below in the detailed description. The section of this application is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.
As a first aspect of the present application, in order to solve the technical problems mentioned in the background section above, some embodiments of the present application provide a testing apparatus for static performance of an optical device, including: the device comprises a control module, a measuring instrument and a test circuit board; the control module is respectively connected with the measuring instrument and the test circuit board in a signal way, and the measuring instrument is connected with the test circuit board in a signal way; the control module controls the measuring instrument to sequentially perform functional tests of resistance, unidirectional conductivity and junction capacitance on the optical device to be tested which is arranged on the test circuit board;
the test circuit board is provided with a plurality of CR interfaces, the number of the CR interfaces is larger than the number of IO interfaces on the optical device to be tested, one end of each CR interface is connected to the measuring instrument, the other end of each CR interface is connected to the IO interface, each CR interface is provided with a change-over switch, and the control module controls the change-over switch to be closed so as to form a test loop.
According to the optical device testing device, the plurality of CR interfaces are arranged on the testing circuit board and are connected to the measuring instrument, so that after the control module is used for controlling the on-off of the change-over switch, each testing loop of the optical device to be tested can be tested in sequence. In specific application, the test mode can greatly improve the test efficiency, compared with the traditional manual test scheme, the test scheme adopts an automatic control scheme, the condition of missing detection does not exist, the whole test process is continuous, an automatic or manual operation scheme is not needed, the access point and the access point of the measuring instrument are controlled to be connected with the IO port of the optical device to be tested, and the test efficiency can be improved; meanwhile, when the IO ports are switched, the IO ports are not required to be frequently accessed and accessed, but are controlled through a change-over switch of the CR interface, so that on one hand, the switching efficiency can be improved, and on the other hand, the influence of test current generated by the measuring instrument on the IO ports when the IO ports are switched can be avoided.
Further, the number of CR interfaces is greater than the number of IO interfaces on the optical device to be tested.
The number of CR interfaces is larger than that of IO interfaces, so that the optical device to be tested is convenient to adapt to different types of optical devices to be tested, the situation that the number of IO ports of the optical devices is too large, the CR interfaces are too small to construct all test loops is avoided, and therefore the optical devices do not need to be taken down to be tested repeatedly when the optical devices are tested.
In the testing process of the IO ports of the optical devices, for the same IO ports, not only forward testing but also reverse testing are needed, so in practice, for the same IO ports, the access points and the access points of the measuring instruments are needed to be replaced so as to perform forward and reverse testing on the same IO interfaces, but in the prior art, when the access points and the access points of the measuring instruments are replaced, the connection conditions of the access points and the access points with the IO interfaces are needed to be controlled manually, so that the method is very inconvenient.
Further, the measuring instrument includes at least: the access point and the access point are respectively connected with the first CR interfaces and the second CR interfaces with the same number, and the access point of the measuring instrument is connected with one IO interface of the optical device to be tested, the other IO interface of the optical device to be tested and the first CR interface to the access point to form a test loop.
The access point and the exit point of the measuring instrument are respectively connected through the first CR interface and the second CR interface, so that after the first CR interface is used for connecting all IO interfaces and the second CR interface is used for connecting all IO interfaces, all test loops can be formed by switching the control switch; moreover, for the same IO interface, the method can complete the test in the same direction and in the opposite direction only by switching the switch, and the test efficiency can be increased.
Further, the first CR interface and the second CR interface constitute all CR interfaces of the measuring instrument.
Further, the number of the first CR interfaces is equal to that of the second CR interfaces and is greater than or equal to that of the IO interfaces of the optical devices to be tested.
The number of CR interfaces is larger than the number of IO interfaces, so that the optical device to be tested is convenient to adapt to different types of optical devices to be tested, the number of the IO interfaces of the optical devices to be tested is prevented from being larger than the number of the CR interfaces, and all the IO interfaces of the optical devices to be tested cannot be tested.
Further, when the optical device to be tested needs to be tested, the optical device to be tested is mounted on the test circuit board, the control module controls the switching of the change-over switch so as to select different test loops for the optical device to be tested, and the tests of the resistance, the unidirectional conductivity and the junction capacitance of all the test loops are sequentially completed.
The test loop can be switched by only controlling the switching switch to be closed, the whole operation process is concise, the test efficiency is high, and errors are not easy to occur under the control of the control module.
For the optical device, the test items between each IO interface are different, in general, it is required to manually judge or relate to a table according to a circuit diagram, and control the test instrument to perform item test between the corresponding IO ports, so that in the test process, the test items are easy to be inconsistent with the situation between the corresponding IO ports, for example, a small capacitor exists between two IO ports, so that resistance test cannot be performed, but the capacitor is easy to be broken down due to manual operation, so that the optical device is damaged.
Further, the control module stores test items of each test loop of the optical device to be tested.
Therefore, the test items existing in the test loops every day are stored in each control module, and the damage of the optical device caused by the fact that the optical device adopts an incorrect test mode can be avoided.
When testing the resistance, the resistance needed by us is the resistance between two IO ports of the optical device to be tested, but the actually measured resistance is the resistance between the access point of the measuring instrument, so the existing line resistance may cause too low measurement accuracy.
Further, the control module also records the line resistance of each test loop.
According to the method and the device, the line resistance of each test loop is recorded, so that when the test is performed, the measured resistance obtained through measurement is subtracted from the line resistance, and more accurate resistance can be obtained.
Further, the testing method of the line resistance is that the loop formed by shorting each first CR interface and each second CR interface is tested, so as to obtain the line resistance of the corresponding testing loop.
The line resistance of each first CR interface and each second CR interface is measured in a short circuit mode, so that the corresponding line resistance of each line can be accurately obtained, the measurement precision is further improved, and the influence of the line resistance on the measurement precision is avoided.
Further, when the optical device to be tested is required to be tested, the method specifically comprises the following steps:
the first step: measuring the line resistance of all the test loops;
and a second step of: and mounting the optical device to be tested on a test circuit board, loading test items of each test loop of the optical device to be tested by a control module, and sequentially completing the test items of all the test circuits.
As a second aspect of the present application, in order to solve the problem that in the static performance test of an optical device, the tested IO port needs to be replaced frequently, which causes the optical device to be damaged easily in the test process, some embodiments of the present application provide a method for testing the static performance of the optical device, which includes the following steps:
step 1: mounting the optical device to be tested on a test circuit board;
step 2: the control module controls the switching of the change-over switch so that the measuring instrument and the IO port of the optical device to be tested form a test loop;
step 3: the control module controls the measuring instrument to finish the resistance test under the test loop, then controls the switching switch to be closed, sequentially finishes the resistance test of all the test loops, and records the test result;
step 4: the control module controls the measuring instrument to finish unidirectional conductivity test of all the test loops and records test results;
step 5: the control module controls the measuring instrument to finish junction capacitance testing of all the test loops, and records a test result;
step 6: summarizing the test results in the steps 3-5, making the summarized test results into a result file, carrying out data analysis on the result file to form a data report, and then sending the data report to a server or a storage through a communication module.
According to the technical scheme, the whole testing process can be continuously carried out, after the optical device to be tested is mounted on the testing circuit board, multiple tests of all the testing loops can be completed, so that performance parameters can be provided for specific IO ports of the optical device to be tested, and when the quality of a subsequent product is traced, the production flow of the optical device can be controlled according to the testing results of all the IO ports of the optical device; the whole testing process is continuous, an automatic or manual operation scheme is not needed, the access point and the access point of the measuring instrument are controlled to be connected with the IO port of the optical device to be tested, and the testing efficiency can be improved; meanwhile, when the IO ports are switched, the IO ports are not required to be frequently accessed and accessed, but are controlled through a change-over switch of the CR interface, so that on one hand, the switching efficiency can be improved, and on the other hand, the influence of test current generated by the measuring instrument on the IO ports when the IO ports are switched can be avoided.
Further, the step 3 specifically includes: and the control module controls the measuring instrument to sequentially perform resistance tests on all the test loops at least three times, and if the results of the resistance tests are not in a preset range, the test loops are recorded according to disqualification.
Further, the step 4 specifically includes: and the control module controls the measuring instrument to sequentially perform at least three unidirectional conductivity tests on all the test loops, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
Further, the step 5 specifically includes: and the control module controls the measuring instrument to sequentially perform junction capacitance tests on all the test loops at least three times, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
In the steps 3 to 5, at least three times of measurement are performed on all the test loops of the test loops, so that the accuracy of the measurement can be ensured; in addition, in the test process, because the test process does not need to be manually controlled, even if the test process is carried out for multiple times, the test efficiency is not greatly influenced, and the adverse influence on the test efficiency can be avoided on the basis of ensuring the measurement accuracy.
Further, step 1 further includes loading test items of each test loop of the optical device to be tested by the control module.
Further, step 1 further includes measuring a line resistance of each test loop.
To sum up:
according to the optical device testing device, the plurality of CR interfaces are arranged on the testing circuit board and are connected to the measuring instrument, so that after the control module is used for controlling the on-off of the change-over switch, each testing loop of the optical device to be tested can be tested in sequence. In specific application, the test mode can greatly increase test efficiency, compared with a traditional manual test scheme, the test scheme adopts an automatic control scheme, the condition of missing detection does not exist, the whole test process is continuous, an automatic or manual operation scheme is not needed, and an access point of a control measuring instrument are connected with an IO port of an optical device to be tested.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the application and to provide a further understanding of the application with regard to the other features, objects and advantages of the application. The drawings of the illustrative embodiments of the present application and their descriptions are for the purpose of illustrating the present application and are not to be construed as unduly limiting the present application.
In addition, the same or similar reference numerals denote the same or similar elements throughout the drawings. It should be understood that the figures are schematic and that elements and components are not necessarily drawn to scale.
In the drawings:
fig. 1 is a schematic structural diagram of a device for testing static performance of an optical device.
Fig. 2 is a schematic structural diagram of a device for testing static performance of an optical device.
Fig. 3 is a flow chart of a method of testing the static performance of an optical device.
Detailed Description
Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete. It should be understood that the drawings and embodiments of the present disclosure are for illustration purposes only and are not intended to limit the scope of the present disclosure.
It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings. Embodiments of the present disclosure and features of embodiments may be combined with each other without conflict.
The present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
Referring to fig. 1, a test apparatus for static performance of an optical device includes a control module, a measuring instrument, and a test circuit board; the control module is respectively connected with the measuring instrument and the test circuit board in a signal mode, and the measuring instrument is connected with the test circuit board in a signal mode. The control module controls the measuring instrument to sequentially perform functional tests of resistance, unidirectional conductivity and junction capacitance on the optical device to be tested which is arranged on the test circuit board.
The test circuit board is provided with a plurality of CR interfaces, the number of the CR interfaces is larger than the number of IO interfaces on the optical device to be tested, one end of each CR interface is connected to the measuring instrument, the other end of each CR interface is connected to the IO interface, each CR interface is provided with a change-over switch, and the control module controls the change-over switch to be closed so as to form a test loop.
The measuring instrument includes at least: the access point and the access point are respectively connected with a first CR interface and a second CR interface which are the same in number, and the access point of the measuring instrument is connected with the first CR interface to one IO interface of the optical device to be tested to the other IO interface of the optical device to be tested, and the second CR interface is connected with the access point finally to form a test loop. The test loop can be simply expressed as: COMB > A > B > COMA.
The measuring instrument is a desk-top universal meter, so that the on-off of the CR interface can be controlled through the control chip.
The first CR interface and the second CR interface form all CR interfaces of the measuring instrument. The number of the first CR interfaces is equal to the number of the second CR interfaces and is larger than or equal to the number of IO interfaces of the optical device to be tested.
When the optical device to be tested is required to be tested, the optical device to be tested is arranged on the test circuit board, the control module controls the switching of the change-over switch so as to select different test loops for the optical device to be tested, and the tests of the resistance, the unidirectional conductivity and the junction capacitance of all the test loops are sequentially completed.
The device for testing the static performance of the optical device further comprises a communication module, wherein the control module is used for finishing the testing of the resistance, the unidirectional conductivity and the junction capacitance of all the testing loops in sequence, then finishing the testing result into a result file, then carrying out data analysis on the result file by using SQL (structured query language) to form a data report, and then uploading the data report to a server or a storage through the communication module.
The test loops formed by every two IO interfaces on the optical device to be tested are different in test content. For example, for the two IO interfaces A/B, the two IO interfaces have two test loops COMB > A > B > COMA and COMB > B > A > COMA, the first test loop needs to test the capacitance and the resistance, and the other test loop cannot test the capacitance and the resistance, because when testing the resistance, the test current input into the test loop may cause damage to the optical device to be tested.
Further, the control module stores test items of each test loop of the optical device to be tested.
The control module stores the test items of each test loop, so that the test items which are wrong are prevented from being applied to the test loops, and the optical device to be tested is damaged. Test items include resistance testing, unidirectional conductivity testing, and junction capacitance testing.
In the actual test process, the resistance test is also affected by the resistance of the line, taking the loop COMB > A > B > COMA as an example, when the resistance of the line is measured, the required test result is the resistance from the port A to the port B in the optical device to be tested, but in the actual measurement, the resistance of COMB > A > B > COMA is obtained, so that the line resistances of COMB > A and B > COMA exist, and the influence on the test line is caused.
For this purpose, the control module also records the line resistance of each test loop.
The circuit resistance testing method is that loops formed by short-circuiting each first CR interface and each second CR interface are tested, so that the circuit resistance of the corresponding testing loop is obtained.
Referring to fig. 2, a more specific embodiment is provided below in conjunction with the examples:
the total of A, B, C, D optical devices to be tested is 4 IO interfaces, and for this purpose, 4 first CR interfaces and 4 second CR interfaces are respectively arranged on the measuring instrument. Each first CR interface is connected with an access point COMA and each second CR interface is connected with an access point COMB. The 4 first CR interfaces include CR5, CR6, CR7, CR8. The 4 second CR interfaces include CR1, CR2, CR3, CR4. And a change-over switch is arranged on each of the first CR interface and the second CR interface. The measuring instrument is a desk-type universal meter; the control module is a computer; the test circuit board is composed of PWBA substrates.
When the resistance test is required to be carried out on the optical device to be tested, the method specifically comprises the following steps:
the first step: the line resistance of all test loops was measured.
The circuit resistance testing method is that loops formed by short-circuiting each first CR interface and each second CR interface are tested, so that the circuit resistance of the corresponding testing loop is obtained. For example, COMB needs to be obtained>A>B>When the line resistance of COMA test loop is measured, CR 2-4 and CR 6-8 can be firstly disconnected, then CR5 and CR1 are closed, and finally the two switches are short-circuited, so that the line resistance R can be measured X 。
And a second step of: and mounting the optical device to be tested on a test circuit board, loading test items of each test loop of the optical device to be tested by a control module, and sequentially completing the test items of all the test circuits.
Specifically, by COMA>B>A>For example, when testing the resistance of the test loop, the control module controls the switching switches of CR1 and CR6 to be closed, and the rest switching switches to be opened, so as to form a test loop from the point COMA to the port B of the optical device to be tested, to the port A of the optical device to be tested and to the point COMB, wherein the resistance obtained by testing is Ry; the port B of the optical device to be tested and the port A of the optical device to be tested are R Z The method comprises the steps of carrying out a first treatment on the surface of the And rz=ry-Rx. Thus, by adopting the method, the test items of all the test loops can be completed.
Referring to fig. 3, the present application further provides a method for testing the static performance of an optical device, and the device for testing the static performance of an optical device is used. The method for testing the static performance of the optical device comprises the following steps:
step 1: and mounting the optical device to be tested on the test circuit board.
Step 1 further includes the control module loading test items of each test loop of the optical device to be tested.
After loading the test items of each test loop of the optical device to be tested, the control module can intelligently complete the test items of all the test loops.
Step 1 also includes measuring the line resistance of each test loop.
The measuring method of the line resistance in the test loop is that the corresponding switch in the test loop is closed, the rest switches are opened, and then the closed switches are short-circuited.
Step 2: the control module controls the switching of the change-over switch so that the measuring instrument and the IO port of the optical device to be tested form a test loop.
Step 3: the control module controls the measuring instrument to finish the resistance test under the test loop, then controls the switching switch to be closed, sequentially finishes the resistance test of all the test loops, and records the test result.
In step 3, when the resistance test is performed, the line resistance needs to be subtracted from the direct measurement.
The step 3 is specifically as follows: and the control module controls the measuring instrument to sequentially perform resistance tests on all the test loops at least three times, and if the results of the resistance tests are not in a preset range, the test loops are recorded according to disqualification.
Step 4: the control module controls the measuring instrument to finish unidirectional conductivity test of all the test loops, and records test results.
The step 4 is specifically as follows: and the control module controls the measuring instrument to sequentially perform at least three unidirectional conductivity tests on all the test loops, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
Step 5: the control module controls the measuring instrument to finish junction capacitance testing of all the test loops, and records the test result.
The step 5 is specifically as follows: and the control module controls the measuring instrument to sequentially perform junction capacitance tests on all the test loops at least three times, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
In the steps 3 to 5, the test result is set up for three times, so if the test result of three times is failed, the test result is failed on the project when the test circuit is indicated.
Step 6: summarizing the test results in the steps 3-5, making the summarized test results into a result file, carrying out data analysis on the result file to form a data report, and then sending the data report to a server or a storage through a communication module.
In step 6, the server and the storage refer to devices or means for storing data or distributing data.
The foregoing description is only of the preferred embodiments of the present disclosure and description of the principles of the technology being employed. It will be appreciated by those skilled in the art that the scope of the invention in the embodiments of the present disclosure is not limited to the specific combination of the above technical features, but encompasses other technical features formed by any combination of the above technical features or their equivalents without departing from the spirit of the invention. Such as the above-described features, are mutually substituted with (but not limited to) the features having similar functions disclosed in the embodiments of the present disclosure.
Claims (10)
1. A device for testing the static performance of an optical device, comprising: the device comprises a control module, a measuring instrument and a test circuit board; the control module is respectively connected with the measuring instrument and the test circuit board in a signal way, the measuring instrument is connected with the test circuit board in a signal way, and the control module controls the measuring instrument to sequentially perform functional tests of resistance, unidirectional conductivity and junction capacitance on the optical device to be tested which is arranged on the test circuit board;
the test circuit board is provided with a plurality of CR interfaces, the number of the CR interfaces is larger than the number of IO interfaces on the optical device to be tested, one end of each CR interface is connected to the measuring instrument, the other end of each CR interface is connected to the IO interface, each CR interface is provided with a change-over switch, and the control module controls the change-over switch to be closed so as to form a test loop.
2. The device for testing the static performance of an optical device according to claim 1, wherein: the number of CR interfaces is greater than the number of IO interfaces on the optical device to be tested.
3. The device for testing the static performance of an optical device according to claim 1, wherein: the measuring instrument at least comprises an access point and an access point, the access point and the access point are respectively connected with a first CR interface and a second CR interface with the same number, and a test loop is formed from the access point of the measuring instrument to the first CR interface to the optical device to be tested to the second CR interface and finally to the access point.
4. A device for testing the static performance of an optical device according to claim 3, wherein: the first CR interface and the second CR interface form all CR interfaces of the measuring instrument.
5. A device for testing the static performance of an optical device according to claim 3, wherein: the number of the first CR interfaces is equal to that of the second CR interfaces and is larger than or equal to that of the IO interfaces of the optical devices to be tested.
6. The device for testing the static performance of an optical device according to claim 1, wherein: when the optical device to be tested is required to be tested, the optical device to be tested is arranged on the test circuit board, the control module controls the switching of the change-over switch so as to select different test loops for the optical device to be tested, and the tests of the resistance, the unidirectional conductivity and the junction capacitance of all the test loops are sequentially completed.
7. A method for testing the static performance of an optical device is characterized by comprising the following steps: the method comprises the following steps:
step 1: mounting the optical device to be tested on a test circuit board;
step 2: the control module controls the switching of the change-over switch so that the measuring instrument and the IO port of the optical device to be tested form a test loop;
step 3: the control module controls the measuring instrument to finish the resistance test under the test loop, then controls the switching switch to be closed, sequentially finishes the resistance test of all the test loops, and records the test result;
step 4: the control module controls the measuring instrument to finish unidirectional conductivity test of all the test loops and records test results;
step 5: the control module controls the measuring instrument to finish junction capacitance testing of all the test loops, and records a test result;
step 6: summarizing the test results in the steps 3-5, making the summarized test results into a result file, carrying out data analysis on the result file to form a data report, and then sending the data report to a server or a storage through a communication module.
8. The method for testing the static performance of an optical device according to claim 7, wherein: the step 3 is specifically as follows: and the control module controls the measuring instrument to sequentially perform resistance tests on all the test loops at least three times, and if the results of the resistance tests are not in a preset range, the test loops are recorded according to disqualification.
9. The method for testing the static performance of an optical device according to claim 7, wherein: the step 4 is specifically as follows: and the control module controls the measuring instrument to sequentially perform at least three unidirectional conductivity tests on all the test loops, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
10. The method for testing the static performance of an optical device according to claim 7, wherein: the step 5 is specifically as follows: and the control module controls the measuring instrument to sequentially perform junction capacitance tests on all the test loops at least three times, and if the test results obtained by the test loops are not within a preset range, the test loops are recorded according to disqualification.
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