CN1158522C - 计算机层析x射线摄影机 - Google Patents
计算机层析x射线摄影机 Download PDFInfo
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- CN1158522C CN1158522C CNB971033293A CN97103329A CN1158522C CN 1158522 C CN1158522 C CN 1158522C CN B971033293 A CNB971033293 A CN B971033293A CN 97103329 A CN97103329 A CN 97103329A CN 1158522 C CN1158522 C CN 1158522C
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- 238000002591 computed tomography Methods 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 claims description 7
- 238000001514 detection method Methods 0.000 abstract description 2
- 230000001154 acute effect Effects 0.000 abstract 1
- 230000005540 biological transmission Effects 0.000 description 2
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- 238000000034 method Methods 0.000 description 1
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/027—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis characterised by the use of a particular data acquisition trajectory, e.g. helical or spiral
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- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
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Abstract
一种带有面探测器和螺旋扫描装置的计算机层析X射线摄影机,使得在螺旋扫描时可使用所有的探测数据。探测器(4)的对称轴(12)相对***轴线(6)翻转一个角度(θ),其中该角度可被调节。
Description
本发明涉及一种计算机层析X射线摄影机。
在一种已公开的计算机层析X射线摄影机中,X射线源发射出一角锥形的X射线束,撞击到一个面探测器上。该面探测器由一列平行的探测器行组成且每个探测器行由一列探测元件构成。采用这种方法可在由X射线源和探测器组成的测量***旋转时同时透射多个层面并因此只有很短的拍摄时间。
此外还公开了一种计算机层析X射线摄影机,它发射出一扇形X射线束,撞击到一行状探测器上,该探测器由一列探测元件组成。通过由X射线源和探测器组成的测量***持续旋转一个大于360°的角度,可以实现对检查对象整个体积的螺旋式扫描。
在一个带有面探测器的计算机层析X射线摄影机中,原则上同样可以实现螺旋式扫描。相对于仅由一行探测元件组成的探测器来说,扫描时间更短。从多个相互对置的焦点位置发出的投影沿***轴向必须严密地相互连接。在此会产生不同投影间的重叠。因此所提供的面探测器不能得以最佳利用。沿***轴线(Z方向)的探测器长度对应于扫描螺旋的螺距,位于边缘处的探测器行相互平行,由于螺旋扫描其探测到的数据不能充分利用来再现图像。
本发明的目的在于设计一种带有角锥形的X射线束和面探测器以及用于对被检测物体进行螺旋扫描装置的计算机层析X射线摄影机,使得在应用简单结构的探测器情况下,可完全充分地利用探测器的所有探测数据,以用于图象再现。
本发明的目的是这样实现的,即采用一种计算机层析X射线摄影机,它具有一个由带有一焦点的X射线源和一面探测器组成的测量装置,该面探测器由多个平行的行组成,其中每行均由一列探测元件构成,在此通过测量装置的旋转并同时在测量装置和位于旋转轴线方向上的被检查对象之间进行相对运动,可实现对被检查对象体积的螺旋扫描,其中,该面探测器横向于旋转轴线可翻转地设置,使得在其对称轴线和旋转轴线之间的一锐夹角可调节。
按照本发明,利用一个在俯视图中呈矩形的,具有弯曲柱面的面探测器可实现对被检查物体体积的快速螺旋扫描,其中在每次投影中都充分利用了整个探测面。
下面借助附图所示实施例对本发明作进一步详细说明,附图中:
图1为一个带有面探测器的计算机层析X射线摄影机;
图2为图1所示本发明计算机层析X射线摄影机的探测装置。
在图1中示出X射线源10的焦点1,从它发射出一束通过一未示出的光阑遮光后呈角锥形的X射线束2,光束穿透一物体3并撞击到一探测器4上,该探测器由多个平行的探测器行组成,其中每个探测器行均由一列探测元件构成。测量***1,4可绕***轴线6旋转,使物体3在不同投影下得到透射。一计算机7由在其中构成的探测器信号计算出物体3的图像,并将其再转送到一个监视器8。探测器信号的采集通过一多路转换器(Multiplexer)9进行。
由X射线源10和探测器4组成的测量***在旋转情况下螺旋扫描(图1中所示螺旋线11)所要求的体积范围,从而可实现体积扫描。在这种情况下,在测量装置1,4和位于***轴线6方向上的病人之间进行一相对运动,为进行螺旋扫描,图2所示探测器4相对于***轴线6翻转,在***轴线6和探测器4的对称轴线12之间的该翻转角在图2中用θ表示,探测器4构成柱状表面部分。在所示图例情况下,该翻转角θ具有下列关系式:
在等式中h/a为螺旋11的螺距与半径的比例。通过调整角度θ可采用一确定的探测器用于具有不同螺距的螺旋扫描。通过将角度θ置为0,也即通过调整探测器4使轴线6和12重合,可制造出普通的计算机层析X射线图片。
Claims (1)
1.一种计算机层析X射线摄影机,它具有一个由带有一焦点(1)的X射线源(10)和一面探测器(4)组成的测量装置,该面探测器由多个平行的行组成,其中每行均由一列探测元件构成,在此通过测量装置(1,4)的旋转并同时在测量装置和位于旋转轴线(6)方向上的被检查对象(3)之间进行相对运动,可实现对被检查对象(3)体积的螺旋扫描,其中,该面探测器(4)横向于旋转轴线(6)可翻转地设置,使得在其对称轴线(12)和旋转轴线(6)之间的一锐夹角(θ)可调节。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19626095A DE19626095C2 (de) | 1996-06-28 | 1996-06-28 | Computertomograph |
DE19626095.7 | 1996-06-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1169531A CN1169531A (zh) | 1998-01-07 |
CN1158522C true CN1158522C (zh) | 2004-07-21 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CNB971033293A Expired - Fee Related CN1158522C (zh) | 1996-06-28 | 1997-03-19 | 计算机层析x射线摄影机 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5815546A (zh) |
JP (1) | JPH1068702A (zh) |
CN (1) | CN1158522C (zh) |
DE (1) | DE19626095C2 (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999001736A2 (en) * | 1997-07-01 | 1999-01-14 | Analogic Corporation | Improved helical scan computed tomography detector geometry |
GB9815809D0 (en) * | 1998-07-22 | 1998-09-16 | Appleton Robert P | Casing running tool |
DE19905974A1 (de) * | 1999-02-12 | 2000-09-07 | Siemens Ag | Verfahren zur Abtastung eines Untersuchungsobjekts mittels eines CT-Geräts |
US6332013B1 (en) * | 1999-12-28 | 2001-12-18 | General Electric Company | Methods and apparatus for tilted helical reconstruction multislice CT |
US7099428B2 (en) * | 2002-06-25 | 2006-08-29 | The Regents Of The University Of Michigan | High spatial resolution X-ray computed tomography (CT) system |
EP1743579A1 (en) * | 2005-07-15 | 2007-01-17 | Kabushi Kaisha Toshiba | X-Ray CT apparatus |
US7555097B2 (en) * | 2005-09-28 | 2009-06-30 | Kabushiki Kaisha Toshiba | X-ray computer tomography system |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4015180A1 (de) * | 1990-05-11 | 1991-11-28 | Bruker Analytische Messtechnik | Roentgen-computer-tomographie-system mit geteiltem detektorring |
US5469486A (en) * | 1992-08-07 | 1995-11-21 | General Electric Company | Projection domain reconstruction method for helical scanning computed tomography apparatus with multi-column detector array employing overlapping beams |
US5291402A (en) * | 1992-08-07 | 1994-03-01 | General Electric Company | Helical scanning computed tomography apparatus |
US5390112A (en) * | 1993-10-04 | 1995-02-14 | General Electric Company | Three-dimensional computerized tomography scanning method and system for imaging large objects with smaller area detectors |
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1996
- 1996-06-28 DE DE19626095A patent/DE19626095C2/de not_active Expired - Fee Related
-
1997
- 1997-03-19 CN CNB971033293A patent/CN1158522C/zh not_active Expired - Fee Related
- 1997-06-24 US US08/881,331 patent/US5815546A/en not_active Expired - Lifetime
- 1997-06-27 JP JP9171674A patent/JPH1068702A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE19626095A1 (de) | 1998-01-02 |
CN1169531A (zh) | 1998-01-07 |
DE19626095C2 (de) | 2001-02-08 |
US5815546A (en) | 1998-09-29 |
JPH1068702A (ja) | 1998-03-10 |
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