CN1157736C - 用于生成参考电压来读出铁电存储器的电路装置 - Google Patents
用于生成参考电压来读出铁电存储器的电路装置 Download PDFInfo
- Publication number
- CN1157736C CN1157736C CNB998137146A CN99813714A CN1157736C CN 1157736 C CN1157736 C CN 1157736C CN B998137146 A CNB998137146 A CN B998137146A CN 99813714 A CN99813714 A CN 99813714A CN 1157736 C CN1157736 C CN 1157736C
- Authority
- CN
- China
- Prior art keywords
- bit line
- read
- voltage
- reference voltage
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000000295 complement effect Effects 0.000 claims abstract description 5
- 210000004027 cell Anatomy 0.000 abstract description 11
- 210000000352 storage cell Anatomy 0.000 abstract description 2
- 238000011156 evaluation Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 description 19
- 230000001105 regulatory effect Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- ZUJVZHIDQJPCHU-UHFFFAOYSA-N [Ba].[Bi] Chemical compound [Ba].[Bi] ZUJVZHIDQJPCHU-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
Description
Claims (3)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19844101A DE19844101A1 (de) | 1998-09-25 | 1998-09-25 | Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers |
DE19844101.0 | 1998-09-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1328688A CN1328688A (zh) | 2001-12-26 |
CN1157736C true CN1157736C (zh) | 2004-07-14 |
Family
ID=7882285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB998137146A Expired - Fee Related CN1157736C (zh) | 1998-09-25 | 1999-09-17 | 用于生成参考电压来读出铁电存储器的电路装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6392918B2 (zh) |
EP (1) | EP1099224B1 (zh) |
JP (1) | JP2002526881A (zh) |
KR (1) | KR100567971B1 (zh) |
CN (1) | CN1157736C (zh) |
DE (2) | DE19844101A1 (zh) |
TW (1) | TW454188B (zh) |
WO (1) | WO2000019443A2 (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19844101A1 (de) | 1998-09-25 | 2000-03-30 | Siemens Ag | Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers |
JP4405094B2 (ja) * | 2001-01-29 | 2010-01-27 | Okiセミコンダクタ株式会社 | 強誘電体メモリ |
US6785629B2 (en) * | 2002-07-02 | 2004-08-31 | Agilent Technologies, Inc. | Accuracy determination in bit line voltage measurements |
US6898104B2 (en) * | 2002-11-12 | 2005-05-24 | Kabushiki Kaisha Toshiba | Semiconductor device having semiconductor memory with sense amplifier |
US6856535B2 (en) | 2003-01-21 | 2005-02-15 | Texas Instruments Incorporated | Reference voltage generator for ferroelectric memory |
CN100375195C (zh) * | 2003-10-24 | 2008-03-12 | 上海宏力半导体制造有限公司 | 光刻式只读存储器的感测放大器 |
US7200027B2 (en) * | 2004-12-29 | 2007-04-03 | Texas Instruments Incorporated | Ferroelectric memory reference generator systems using staging capacitors |
US7342819B2 (en) * | 2006-03-03 | 2008-03-11 | Infineon Technologies Ag | Methods for generating a reference voltage and for reading a memory cell and circuit configurations implementing the methods |
JP5060403B2 (ja) * | 2008-06-19 | 2012-10-31 | 株式会社東芝 | 半導体記憶装置 |
KR101783873B1 (ko) * | 2010-10-12 | 2017-10-11 | 삼성전자주식회사 | 데이터 감지를 위한 반도체 메모리 장치 |
US9042150B2 (en) * | 2013-01-09 | 2015-05-26 | Cypress Semiconductor Corporation | Programmable and flexible reference cell selection method for memory devices |
US9715919B1 (en) | 2016-06-21 | 2017-07-25 | Micron Technology, Inc. | Array data bit inversion |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0713877B2 (ja) | 1988-10-19 | 1995-02-15 | 株式会社東芝 | 半導体メモリ |
US5621680A (en) * | 1996-04-01 | 1997-04-15 | Motorola, Inc. | Data storage element and method for reading data therefrom |
KR100224673B1 (ko) * | 1996-12-13 | 1999-10-15 | 윤종용 | 불휘발성 강유전체 메모리장치 및 그의 구동방법 |
KR100234877B1 (ko) * | 1997-01-13 | 1999-12-15 | 윤종용 | 강유전체 랜덤 억세스 반도체 메모리 장치 및 그 동작 방법 |
KR100268444B1 (ko) * | 1997-08-30 | 2000-10-16 | 윤종용 | 강유전체 랜덤 액세스 메모리 장치 |
DE19844101A1 (de) | 1998-09-25 | 2000-03-30 | Siemens Ag | Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers |
KR100316241B1 (ko) * | 1998-11-26 | 2002-04-24 | 오길록 | 비휘발성 강유전체 메모리 |
-
1998
- 1998-09-25 DE DE19844101A patent/DE19844101A1/de not_active Ceased
-
1999
- 1999-09-17 JP JP2000572857A patent/JP2002526881A/ja not_active Withdrawn
- 1999-09-17 WO PCT/DE1999/002984 patent/WO2000019443A2/de active IP Right Grant
- 1999-09-17 EP EP99955733A patent/EP1099224B1/de not_active Expired - Lifetime
- 1999-09-17 CN CNB998137146A patent/CN1157736C/zh not_active Expired - Fee Related
- 1999-09-17 KR KR1020017003755A patent/KR100567971B1/ko not_active IP Right Cessation
- 1999-09-17 DE DE59901953T patent/DE59901953D1/de not_active Expired - Lifetime
- 1999-09-22 TW TW088116298A patent/TW454188B/zh not_active IP Right Cessation
-
2001
- 2001-03-26 US US09/817,578 patent/US6392918B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1099224B1 (de) | 2002-07-03 |
TW454188B (en) | 2001-09-11 |
US20010038557A1 (en) | 2001-11-08 |
KR100567971B1 (ko) | 2006-04-07 |
EP1099224A2 (de) | 2001-05-16 |
KR20010100839A (ko) | 2001-11-14 |
DE19844101A1 (de) | 2000-03-30 |
WO2000019443A3 (de) | 2000-05-25 |
JP2002526881A (ja) | 2002-08-20 |
US6392918B2 (en) | 2002-05-21 |
WO2000019443B1 (de) | 2000-06-29 |
WO2000019443A2 (de) | 2000-04-06 |
DE59901953D1 (de) | 2002-08-08 |
CN1328688A (zh) | 2001-12-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
C10 | Entry into substantive examination | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: INFINEON TECHNOLOGIES AG |
|
TR01 | Transfer of patent right |
Effective date of registration: 20120918 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Munich, Germany Patentee before: Infineon Technologies AG |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160118 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20040714 Termination date: 20170917 |
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CF01 | Termination of patent right due to non-payment of annual fee |