CN115308483A - Microwave frequency measurement system and method based on machine learning - Google Patents

Abstract

The present disclosure provides a microwave frequency measurement system including: the amplitude measurement module is used for modulating a microwave signal to be measured on a continuous broad spectrum light wave signal to generate a modulation signal, dividing the modulation signal into an upper path modulation signal and a lower path modulation signal, respectively introducing first time delay and second time delay, and then converting the upper path modulation signal and the lower path modulation signal into a first electric signal and a second electric signal; and the frequency measurement module is used for calculating a power comparison value of the first electric signal and the second electric signal and obtaining the frequency of the microwave signal to be measured based on a mapping relation between a preset power comparison value and the frequency of the microwave signal. According to the method, parameters which are difficult to measure are removed and common-mode noise is suppressed by constructing the power comparison value, differential-mode noise in a preset power comparison function is suppressed through a machine learning algorithm, and the precision of frequency measurement is improved.

Description

Microwave frequency measurement system and method based on machine learning

Technical Field

The disclosure relates to the technical field of microwave photon, and more particularly, to a reconfigurable microwave frequency measurement device and method based on machine learning.

Background

In recent years, with the development of microwave photonic technology, microwave frequency measurement systems have gained extensive research and attention. The system has wide application in the fields of radar, communication and electronic warfare.

The microwave frequency measuring system has the principle that the microwave frequency to be measured is mapped into a parameter which is easier to measure in the microwave frequency measuring device, and the frequency of a microwave signal is obtained by depending on the mapping relation of the frequency and the measurable parameter.

A microwave frequency measurement system based on frequency-power mapping maps frequency information of a microwave signal to power information of the microwave signal. However, in the practical application process of the system, the power jitter of the microwave signal to be measured may generate common mode noise, which affects the measurement accuracy. Meanwhile, differential mode noise can be generated due to optical link jitter in the transmission process of the microwave signal to be detected in the system. Therefore, it is important to build a microwave frequency measurement system capable of suppressing common mode noise and differential mode noise at the same time.

Disclosure of Invention

In view of this, the present disclosure provides a microwave frequency measurement system, including: a microwave frequency measurement system comprising: the amplitude measurement module is used for modulating a microwave signal to be measured on a continuous broad spectrum light wave signal to generate a modulation signal, dividing the modulation signal into an upper path modulation signal and a lower path modulation signal, respectively introducing first time delay and second time delay, and then converting the upper path modulation signal and the lower path modulation signal into a first electric signal and a second electric signal; and the frequency measurement module is used for calculating a power comparison value of the first electric signal and the second electric signal and obtaining the frequency of the microwave signal to be measured based on a mapping relation between a preset power comparison value and the frequency of the microwave signal.

Optionally, the system further includes a power comparison function training module, configured to construct a power comparison function, where the power comparison training module includes: the acquisition module is used for acquiring training data of a plurality of groups of first electric signals and second electric signals, and calculating a power comparison value between every two training data aiming at each group of training data to obtain a plurality of microwave signal frequencies and corresponding power comparison values; the training data are obtained by inputting microwave signals with a plurality of known frequencies into an amplitude measurement module; and the function optimization module is used for fitting a power comparison function obtained by utilizing a machine learning algorithm based on the microwave signal frequencies and the corresponding power comparison values.

Optionally, the amplitude measurement module comprises: the light source module is used for providing a continuous broad spectrum light wave signal; the microwave signal modulation module to be detected is used for modulating the microwave signal to be detected on the broad spectrum light wave signal to generate a modulation signal; a delay introducing module, configured to divide the modulation signal into the upper modulation signal and the lower modulation signal, and introduce different delays respectively; and the photoelectric conversion module is used for converting the upper path modulation signal and the lower path modulation signal into the first electric signal and the second electric signal.

Optionally, the delay introducing module includes: the second polarization controller is used for adjusting the polarization state of the modulation signal to be aligned with the main shaft of the polarization division multiplexing simulator; a polarization division multiplexing simulator for introducing the modulation signal into the first delay; the optical coupler is used for dividing the modulation signal into an upper path modulation signal and a lower path modulation signal; the first polarizer is used for polarizing and combining the polarization state of the uplink modulation signal; the third polarization controller is used for adjusting the polarization state of the downlink modulation signal to be aligned with the polarization-maintaining optical fiber main shaft; a polarization maintaining fiber for introducing the down modulation signal into the second delay; the second polarizer is used for carrying out polarization beam combination on the polarization state of the downlink modulation signal; the first optical circulator is used for injecting the upper path modulation signal into the dispersion element and injecting the lower path modulation signal output by the dispersion element into the first photoelectric detection unit; a dispersion element for introducing a delay to different frequency components of the up-link modulated signal and the down-link modulated signal, thereby constructing a continuous time impulse response; and the second optical circulator is used for injecting the downlink modulation signal into the dispersion element and injecting the uplink modulation signal output by the dispersion element into the second photoelectric detection unit.

Optionally, the polarization multiplexing simulator includes a second polarization beam splitter, a mirror group, and a second polarization beam combiner; wherein the first delay time is adjusted by adjusting the position of the mirror group.

Optionally, the microwave signal modulation module to be tested includes: the first polarization controller is used for adjusting the polarization state of the wide-spectrum light wave signal to form an angle of 45 degrees with the input main axis of the polarization multiplexing double-drive Mach-Zehnder modulator; the polarization multiplexing dual-drive Mach-Zehnder modulator is used for modulating a microwave signal to be measured on the wide-spectrum light wave signal to generate a modulation signal; wherein, polarization multiplexing dual drive mach zehnder modulator includes: a first polarization beam splitter, a first double-driven mach-zender modulator, a second double-driven mach-zender modulator and a first polarization beam combiner; and inputting the microwave signal to be detected into the first double-drive Mach-Zehnder modulator, and modulating the microwave signal to be detected on the wide-spectrum light wave signal to generate the modulation signal.

Optionally, the light source module comprises: the wide-spectrum light source is used for generating a continuous wide-spectrum light wave signal; and the spectrum shaping device is used for carrying out spectrum shaping on the wide-spectrum light wave signal.

Optionally, the photoelectric conversion module comprises: the first photoelectric detection unit is used for converting the upper path modulation signal into the first electric signal; and the second photoelectric detection unit is used for converting the downlink modulation signal into the second electric signal.

In another aspect, the present disclosure provides a microwave frequency measurement method, including: modulating a microwave signal to be detected on a continuous broad-spectrum light wave signal to generate a modulation signal, dividing the modulation signal into an upper path modulation signal and a lower path modulation signal, respectively introducing different time delays, and converting the upper path modulation signal and the lower path modulation signal into a first electric signal and a second electric signal; and calculating a power comparison value of the first electric signal and the second electric signal, and obtaining the frequency of the microwave signal to be detected based on a mapping relation between a preset power comparison value and the frequency of the microwave signal.

Optionally, the microwave frequency measurement method further includes constructing a power comparison function, where constructing the power comparison function includes: acquiring training data of a plurality of groups of first electric signals and second electric signals, and calculating power comparison values between every two training data aiming at each group of training data to obtain a plurality of microwave signal frequencies and corresponding power comparison values; wherein the training data is obtained by inputting a plurality of microwave signals with known frequencies into an amplitude measurement module; and fitting a power comparison function obtained by using a machine learning algorithm based on the microwave signal frequencies and the corresponding power comparison values.

According to the technical scheme, the microwave frequency measuring system and method based on the machine learning method have the following beneficial effects:

(1) Parameters which are difficult to measure of the microwave signals to be measured can be eliminated by constructing a power comparison value, and common mode noise is eliminated.

(2) And optimizing a plurality of groups of power comparison functions by utilizing a machine learning algorithm to obtain the optimal mapping relation between the frequency and the power comparison value, and eliminating errors caused by differential mode noise. The result of the frequency measurement is more accurate.

(3) The method can realize flexible reconstruction of the power comparison value only by adjusting the polarization division multiplexer, can widen the frequency measurement range of the microwave frequency measurement system, and improves the reconfigurability.

(4) By utilizing the wide-spectrum light source and the dispersion element, the microwave signal to be measured is loaded on the light source with multiple frequencies, and different time delays are introduced to different frequencies, so that continuous-time impulse response is formed, and the measurement precision is improved.

Drawings

The above and other objects, features and advantages of the present disclosure will become more apparent from the following description of embodiments of the present disclosure with reference to the accompanying drawings, in which:

FIG. 1 schematically illustrates a microwave frequency measurement system according to an embodiment of the disclosure

Fig. 2 schematically shows a structural diagram of a specific device of a microwave frequency measurement system according to an embodiment of the present disclosure.

Fig. 3 schematically illustrates a structural schematic diagram of a polarization multiplexing dual drive mach-zender modulator 520 according to an embodiment of the present disclosure.

Fig. 4 schematically shows a structural diagram of the polarization division multiplexing simulator 620 according to an embodiment of the present disclosure.

Fig. 5 schematically illustrates a power comparison function training module schematic of a microwave frequency measurement system according to an embodiment of the present disclosure.

Fig. 6 schematically illustrates a microwave frequency measurement method according to an embodiment of the present disclosure.

FIG. 7A schematically shows a spectral diagram of a lightwave signal before it enters a modulator according to an embodiment of the present disclosure.

Fig. 7B schematically shows a spectral diagram of a lightwave signal modulated by a modulator according to an embodiment of the present disclosure.

Fig. 8A schematically illustrates a spectral diagram of an optical signal after the optical signal passes through a polarization division multiplexing simulator according to an embodiment of the disclosure.

Fig. 8B schematically shows a spectral diagram of an optical signal passing through a polarization division multiplexing simulator and a polarization maintaining fiber according to an embodiment of the disclosure.

Fig. 9A schematically illustrates a spectral diagram of constructing a frequency transfer function for an add optical signal according to an embodiment of the disclosure.

Fig. 9B schematically illustrates a spectral diagram of a drop optical signal construction frequency transfer function according to an embodiment of the disclosure.

Fig. 10A schematically illustrates a power comparison function spectrum before optimization of a machine learning algorithm according to an embodiment of the disclosure.

Fig. 10B schematically shows a power comparison function spectrum after optimization of a machine learning algorithm according to an embodiment of the disclosure.

Fig. 11A schematically illustrates a test result graph before machine learning algorithm optimization according to an embodiment of the present disclosure.

Fig. 11B is a test result diagram after the optimization of the machine learning algorithm according to the embodiment of the present invention.

Detailed Description

Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood that the description is illustrative only and is not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.

All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs, unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.

Fig. 1 schematically illustrates a microwave frequency measurement system provided by an embodiment of the present disclosure. The system comprises: an amplitude measurement module 100 and a frequency measurement module 200. Referring to fig. 1, a microwave frequency measurement system provided by the present disclosure is described in detail with reference to fig. 2 to 5.

The amplitude measurement module 100 is configured to modulate a microwave signal to be measured on a continuous broadband optical wave signal to generate a modulation signal, divide the modulation signal into an upper modulation signal and a lower modulation signal, introduce a first delay and a second delay respectively, and convert the upper modulation signal and the lower modulation signal into a first electrical signal and a second electrical signal.

The amplitude measurement module 100 further includes: the system comprises a light source module 400, a microwave signal modulation module 500 to be tested, a delay lead-in module 600 and a photoelectric conversion module 700. Fig. 2 schematically shows a specific apparatus structure diagram of each module in the amplitude measurement module 100 according to the embodiment of the present disclosure.

In the embodiment of the present disclosure, the light source module 400 of the amplitude measurement module 100 is used to provide a continuous broad spectrum lightwave signal. The light source module 400 includes 410 and a spectral shaping device 420.

A broad spectrum light source 410 for generating a continuous broad spectrum lightwave signal.

A spectral shaping means 420 for performing spectral shaping on the lightwave signal. And carrying out Fourier transform on the light wave of the wide-spectrum light source.

The microwave signal modulation module 500 to be tested provided by the embodiment of the present disclosure is configured to modulate a microwave signal to be tested on the optical wave signal to generate a modulation signal. The microwave signal modulation module 500 to be tested comprises a first polarization controller 510 and a polarization multiplexing dual-drive mach zehnder modulator 520.

In this disclosure, the first polarization controller 510 is configured to adjust the polarization state of the wide-spectrum optical wave signal generated by the wide-spectrum light source to form an angle of 45 ° with the main axis of the polarization beam combiner 521 in the polarization multiplexing dual-drive mach-zender modulator 520, so as to ensure that the powers of the wide-spectrum optical wave signals entering the two dual-drive mach-zender modulators are equal. The spectrum diagram of the optical signal output by the first polarization controller 521 is shown in fig. 7A.

The polarization multiplexing dual-drive mach zehnder modulator 520 is used for modulating the microwave signal to be measured on the wide-spectrum light wave signal to generate a modulation signal.

In the embodiment of the disclosure, a schematic structural diagram of the polarization multiplexing dual-drive mach-zender modulator 520 is shown in fig. 3. The modulator is composed of a first polarization beam splitter 521, a first double-driven mach-zender modulator 522, a second double-driven mach-zender modulator 523, and a first polarization beam combiner 524. The first polarization beam splitter is used for splitting the shaped wide-spectrum light wave signals into two beams of wide-spectrum light wave signals with equal power. The modulator includes a first double-drive mach-zender modulator 522 and a second double-drive mach-zender modulator 523 disposed on the upper and lower arms, respectively. A phase modulator 525 is placed in each of the upper arm and the lower arm of each dual drive mach-zender modulator. The first polarization beam combiner 524 combines the two polarized beams output by the first double-driven mach-zender modulator 522 and the second double-driven mach-zender modulator 523.

The microwave signal to be measured is divided into two paths of signals with equal energy, and the two paths of signals are respectively input into the two phase modulators 525 of the first double-drive mach zehnder modulator 522 and modulated on the broad-spectrum lightwave signal. The second double-drive mach zehnder modulator 523 does not input the microwave signal to be measured.

Fig. 7B is a schematic diagram of a spectrum of an output modulation signal of the polarization multiplexing dual-drive mach-zender modulator 520, where modulated optical signals in two polarization states can be respectively represented as:

wherein, N (omega) _k ) Is the k-th effective frequency component, Q, in the spectrum of the wide-spectrum light source _k The angular frequency of the kth effective frequency component, the amplitude and angular frequency of the incident optical signal, ω _uf For the angular frequency of the microwave signal to be measured, J ₀ Is a zero order Bessel function, J ₁ Is a first order bessel function. Beta- _u ＝πV _u /V _π For the modulation factor of the microwave signal to be measured, E _x (t) is the signal modulated by the first double-drive mach-zender modulator 522, E _y (t) is the signal modulated by the second double-drive mach-zender modulator 523.

The delay introducing module 600 provided in the embodiment of the present disclosure is configured to divide the modulation signal into the upper modulation signal and the lower modulation signal, and introduce different delays respectively. And (7) delaying. The lead-in module 600 includes: a second polarization controller 310, a polarization division multiplexing simulator 620, an optical coupler 630, a first polarizer 640, a third polarization controller 650, a polarization maintaining fiber 660, a second polarizer 670, a first optical circulator 680, a dispersive element 690, and a second optical circulator 685.

The modulated signal passes through the second polarization controller 610 to align the orthogonal polarization state modulated signal with the principal axis of the polarization division multiplexing simulator 620 d. The polarization division multiplexing simulator 620 is schematically shown in fig. 4, and includes a second polarization beam splitter 621, a lens group 622, and a second polarization beam combiner 623. The lens group 622 is composed of a first lens 624, a second lens 625, and a third lens 626.

The modulation signal introduces a first time delay delta tau to the modulation signal in the orthogonal polarization state through a polarization division multiplexing simulator ₁ . The frequency spectrum diagram is shown in fig. 8A, and the output signals of the polarization division multiplexing simulator are:

in the embodiment of the present disclosure, the first delay time may be adjusted by adjusting the position of each lens in the lens group 322 of the polarization division multiplexing simulator 620.

In the disclosed embodiment, the optical coupler 630 may be a T-type optical coupler, which introduces the first delay Δ τ ₁ The latter modulated signal is divided into an up-modulated signal and a down-modulated signal on average.

The spectrum diagram of the uplink modulated signal is shown in fig. 8B. The on-path modulated signal passes through a first polarizer 640, a first channel of a first optical circulator 680, a dispersive element 690, and a second optical circulator 685.

The downlink modulation signal of the downlink modulation signal is adjusted by the third polarization controller 650, so that the polarization state for adjusting the downlink modulation signal is aligned with the polarization maintaining fiber spindle, and after passing through the polarization maintaining fiber 660, an unchangeable second delay delta tau is introduced ₂ The spectrum diagram is shown in fig. 8B. Introducing a second delay delta tau into the down-link modulation signal ₂ Then, after being combined by the second polarizer 670, the combined light passes through the second optical circulator 685, the dispersion element 690, and the first optical circulator 680.

In the disclosed embodiment, polarization maintaining fiber 660 is used to introduce a second delay Δ τ ₂ To the down modulation signal. Make the way toThe modulated signal has a different time delay than the downstream modulated signal.

In the disclosed embodiment, the first polarizer 640 and the second polarizer 670 are used to combine the polarization states of the upper modulation signal and the lower modulation signal in both vertical and parallel directions. The first optical circulator 680 and the second optical circulator 685 in the delay module 600 of the embodiment of the present disclosure are multi-port isolation devices, which can change the direction of light and output without loss. For example, the first optical circulator 680 and the second optical circulator 685 may be four-port circulators, with the up-modulated signal being input from port 1 of the first optical circulator, output from port 2, passed through the dispersive element 690, input to port 1 of the second optical circulator, and output from port 2. The drop modulated signal is output from port 3 of the second optical circulator, from port 4, passes through the dispersive element 690, is input to port 3 of the 1 st optical circulator, and is output from port 4. The upper and lower modulated signals do not affect each other when propagating through the first optical circulator 680 and the second optical circulator 685.

In the disclosed embodiment, the dispersive element 690 introduces different frequency components of the add modulated signal and the drop modulated signal into a relative delay, thereby forming a continuous-time impulse response.

In the embodiment of the present disclosure, the delay module 600 constructs two optical links with different delays, and the introduced delay can be adjusted by using the polarization multiplexing simulator 620. The two optical circulators can lead the system to use only one dispersion element to introduce different time delays to different frequencies of two paths of modulation signals, thereby reducing the cost of the system.

The photoelectric conversion module 700 in the embodiment of the present disclosure is configured to perform photoelectric conversion on the upper and lower modulation signals. The photoelectric conversion module 700 includes a first photo-detection unit 710 and a second photo-detection unit 720.

The uplink modulated signal passes through the first polarizer 640, the first channel of the first optical circulator 680, the dispersion element 690, and the second optical circulator 685, is detected by the first photodetection unit 720, and is converted into a first electrical signal. The spectral diagram of the first electrical signal is shown in fig. 9A, with the magnitude response expressed as:

wherein H _b And (omega) is the relationship between the baseband response of the microwave frequency measurement system and the shape of the wide-spectrum light source obtained after shaping, wherein the shape has a Fourier transform pair. And omega is the frequency of the microwave signal to be measured. The polarization division multiplexing simulator 620 is adjusted to shift the response in frequency, which is proportional to the first delay of the uplink modulated signal.

The downlink modulation signal is adjusted by the third polarization controller 650, passes through the polarization maintaining fiber 660, and is introduced into the second delay delta tau ₂ Then, the second electric signal is converted into a second electric signal through the second polarizer 670, the second optical circulator 685, the dispersion element 690 and the first optical circulator 680, and finally detected by the second photodetection unit 710. The spectral diagram of the second electrical signal is shown in fig. 9B, with the magnitude response expressed as:

wherein, the polarization division multiplexing simulator 620 is adjusted to respond to the frequency shift, the magnitude of the frequency shift is also equal to the first delay delta tau of the down-link modulation signal ₁ Is in direct proportion.

The function building module 510 obtains a power comparison value according to the first electrical signal and the second electrical signal detected by the first detector 410 and the second detector 420, and a schematic spectrum diagram of the power comparison value is shown in fig. 10A and is represented as:

wherein, beta ₂ Is the dispersion coefficient of the dispersive element. Due to the coefficient of dispersion beta ₂ A second delay time delta tau ₂ And the frequency omega of the microwave signal to be measured can not be changed, so that the first time delay delta tau ₁ The only adjustable parameter is the above formula. By adjusting the first delay delta tau ₁ Different frequency measurement ranges can be obtained. Example (b)E.g. when the first delay is Δ τ ₁ When the value is 12.5ps, the frequency measurement range of 4-6 GHz can be realized, and when the first delay delta tau is adopted ₁ The frequency measurement range of 8-10 GHz can be realized when the value is 25 ps.

And obtaining the frequency of the microwave signal to be detected based on the mapping relation between the preset power comparison value and the frequency of the microwave signal.

The microwave measurement system provided by the disclosure can eliminate parameters which are difficult to measure by constructing the power comparison value, and can suppress common mode noise. By varying the first delay delta tau ₁ The range of the measuring frequency of the microwave frequency measuring system can be changed, and the system can be reconstructed.

The microwave measurement system provided by the present disclosure further includes a power comparison function training module 300, configured to construct a mapping relationship between the power comparison value and the frequency, that is, a power comparison function. As shown in FIG. 5, the power comparison training module 300 includes an acquisition module 310 and a function optimization module 320.

The obtaining module 310 is configured to obtain training data of multiple groups of the first electrical signal and the second electrical signal, and calculate a power comparison value between every two training data for each group of the training data to obtain multiple groups of microwave signal frequencies and corresponding power comparison values.

The training data are obtained by inputting microwave signals with a plurality of known frequencies into the amplitude measurement module 100. And each group of the first electric signals and the second electric signals are divided pairwise to obtain a plurality of power comparison values. By varying the first delay delta tau over a plurality of measurements ₁ And more accurate power comparison values of different frequency ranges are measured.

Parameters which are difficult to measure for microwave signals can be eliminated by constructing a power comparison function comparison value, and common mode noise is eliminated. And the power comparison value and the microwave signal frequency have a unique mapping relation. However, the detected amplitude signal also has differential mode noise generated by optical path jitter during transmission, as shown in fig. 11A.

The function optimization module 320 of the power comparison training module 300 of the embodiment of the present disclosure is configured to obtain fitting discrete data and a power comparison function by using a machine learning algorithm based on a plurality of groups of microwave signal frequencies obtained by the power comparison training module 310 and corresponding power comparison function values. The machine algorithms may include a variety of machine learning algorithms including, but not limited to, K-nearest neighbor algorithms, support vector machine algorithms, polynomial regression algorithms, random forest algorithms, and ensemble learning algorithms. The frequency spectrum of the optimized power comparison function is shown in fig. 10B, and the measurement result is shown in fig. 11B.

The power comparison function is obtained by fitting through a machine learning algorithm, errors caused by differential mode noise can be optimized, and a more accurate mapping relation between the microwave frequency and the power comparison value is obtained. And the optimized mapping relation is utilized to measure the microwave signal with unknown frequency, so that the measurement precision can be improved.

The embodiment of the present disclosure further provides a microwave frequency measurement method, as shown in fig. 6, which includes operations S201 to S204.

Operation S210 is performed to modulate the microwave signal to be detected on the continuous broad-spectrum optical wave signal to generate a modulation signal, divide the modulation signal into an upper modulation signal and a lower modulation signal, introduce different delays, and convert the upper modulation signal and the lower modulation signal into a first electrical signal and a second electrical signal.

Operation S210 is performed to calculate a power comparison value between the first electrical signal and the second electrical signal, and obtain the frequency of the microwave signal to be detected based on a mapping relationship between a preset power comparison value and the frequency of the microwave signal.

The microwave frequency measurement method provided by the embodiment of the disclosure further includes constructing a power comparison function, including: acquiring training data of a plurality of groups of first electric signals and second electric signals, and calculating power comparison values between every two training data aiming at each group of training data to obtain a plurality of microwave signal frequencies and corresponding power comparison values. Wherein the training data is obtained by inputting microwave signals of a plurality of known frequencies into the amplitude measurement module 100. And fitting a power comparison function obtained by using a machine learning algorithm based on the microwave signal frequencies and the corresponding power comparison values.

It should be noted that, the method in the embodiment of the present disclosure is applied to the system in the embodiment of the present disclosure, and the beneficial effects of the microwave frequency measurement method refer to the microwave frequency measurement system part, which is not described herein again.

It will be appreciated by those skilled in the art that various combinations and/or combinations of the features recited in the various embodiments of the disclosure and/or the claims may be made even if such combinations or combinations are not explicitly recited in the disclosure. In particular, various combinations and/or combinations of the features recited in the various embodiments and/or claims of the present disclosure may be made without departing from the spirit or teaching of the present disclosure. All such combinations and/or associations are within the scope of the present disclosure.

The embodiments of the present disclosure are described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described separately above, this does not mean that the measures in the embodiments cannot be used advantageously in combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the present disclosure, and such alternatives and modifications are intended to be within the scope of the present disclosure.

Claims (10)

1. A microwave frequency measurement system, comprising:

the amplitude measurement module (100) is used for modulating a microwave signal to be measured on a continuous broad spectrum light wave signal to generate a modulation signal, dividing the modulation signal into an upper path modulation signal and a lower path modulation signal, respectively introducing first time delay and second time delay, and then converting the upper path modulation signal and the lower path modulation signal into a first electric signal and a second electric signal;

and the frequency measurement module (200) is used for calculating a power comparison value of the first electric signal and the second electric signal and obtaining the frequency of the microwave signal to be measured based on a preset power comparison function.

2. Microwave frequency measurement system according to claim 1, wherein the system further comprises a power comparison function training module (300) for constructing a power comparison function, the power comparison training module (300) comprising:

an obtaining module (310) configured to obtain training data of a plurality of groups of the first electrical signals and the second electrical signals, and calculate a power comparison value between every two training data for each group of the training data to obtain a plurality of microwave signal frequencies and corresponding power comparison values;

wherein the training data is obtained by inputting microwave signals of a plurality of known frequencies into an amplitude measurement module (100);

and the function optimization module (320) is used for fitting the obtained power comparison function by utilizing a machine learning algorithm based on a plurality of microwave signal frequencies and the corresponding power comparison values.

3. Microwave frequency measurement system according to claim 1, characterized in that the amplitude measurement module (100) comprises:

a light source module (400) for providing a continuous broad spectrum lightwave signal;

the microwave signal modulation module (500) to be tested is used for modulating the microwave signal to be tested on the broad spectrum light wave signal to generate a modulation signal;

a delay introducing module (600) for dividing the modulation signal into the upper path modulation signal and the lower path modulation signal and respectively introducing different delays;

a photoelectric conversion module (700) for converting the add modulation signal and the drop modulation signal into the first electrical signal and the second electrical signal.

4. Microwave frequency measurement system according to claim 3, characterized in that the delay introducing module (600) comprises:

a second polarization controller (610) for adjusting the polarization state of the modulated signal to align with a principal axis of a polarization division multiplexing simulator (620);

a polarization division multiplexing simulator (620) for introducing the modulated signal into the first delay;

an optical coupler (630) for splitting the modulated signal into an add modulated signal and a drop modulated signal;

a first polarizer (640) for polarization-combining the polarization state of the add modulation signal;

a third polarization controller (650) for adjusting the polarization state of the drop modulation signal to align with the polarization maintaining fiber principal axis;

a polarization maintaining fiber (660) for introducing the drop modulated signal into the second delay;

a second polarizer (670) for polarization combining the polarization states of the down-link modulated signals;

a first optical circulator (680) for injecting the up-modulated signal into a dispersive element (690) and simultaneously injecting the down-modulated signal output by the dispersive element (690) into a first photodetector unit (710);

a dispersive element (690) for introducing a time delay to different frequency components of the add modulated signal and the drop modulated signal, thereby constructing a continuous time impulse response;

a second optical circulator (685) for injecting the drop-modulated signal into the dispersive element (690) while injecting the up-modulated signal output by the dispersive element (690) into a second photodetector unit (710).

5. The microwave frequency measurement system according to claim 4, wherein the polarization multiplexing simulator (620) comprises a second polarization beam splitter (621), a mirror group (622), and a second polarization beam combiner (623); wherein the first delay is adjusted by adjusting the position of the set of mirrors (622).

6. Microwave frequency measurement system according to claim 3, characterized in that the microwave signal modulation module under test (500) comprises:

a first polarization controller (510) for adjusting the polarization state of the broad spectrum lightwave signal to be at an angle of 45 ° to the input principal axis of the polarization multiplexing dual-drive mach-zender modulator (520);

the polarization multiplexing dual-drive Mach Zehnder modulator (520) is used for modulating a microwave signal to be measured on the wide-spectrum light wave signal to generate a modulation signal;

wherein the polarization multiplexing dual drive mach zehnder modulator (520) comprises: a first polarization beam splitter (521), a first dual-drive mach-zender modulator (522), a second dual-drive mach-zender modulator (523), and a first polarization beam combiner (524);

and inputting the microwave signal to be detected into the first double-drive Mach Zehnder modulator (522), and modulating the microwave signal on the wide-spectrum light wave signal to generate the modulation signal.

7. A microwave frequency measurement system according to claim 3, characterized in that the light source module (400) comprises:

a broad spectrum light source (410) for generating a continuous broad spectrum lightwave signal;

-spectral shaping means (420) for spectrally shaping said broad spectrum lightwave signal.

8. A microwave frequency measurement system according to claim 3, characterized in that the photoelectric conversion module (700) comprises:

a first photo-detection unit (710) for converting the uplink modulation signal into the first electrical signal;

and the second photoelectric detection unit (720) is used for converting the downlink modulation signal into the second electric signal.

9. A microwave frequency measurement method applied to the system of claims 1 to 8, comprising:

modulating a microwave signal to be detected on a continuous broad-spectrum light wave signal to generate a modulation signal, dividing the modulation signal into an upper path modulation signal and a lower path modulation signal, respectively introducing different time delays, and converting the upper path modulation signal and the lower path modulation signal into a first electric signal and a second electric signal;

and calculating a power comparison value of the first electric signal and the second electric signal, and obtaining the frequency of the microwave signal to be detected based on a mapping relation between a preset power comparison value and the frequency of the microwave signal.

10. A microwave frequency measurement method in accordance with claim 9, the method further comprising constructing a power comparison function, the constructing a power comparison function comprising:

acquiring training data of a plurality of groups of first electric signals and second electric signals, and calculating power comparison values between every two training data aiming at each group of training data to obtain a plurality of microwave signal frequencies and corresponding power comparison values;

wherein the training data is obtained by inputting microwave signals of a plurality of known frequencies into an amplitude measurement module (100);

and fitting a power comparison function obtained by using a machine learning algorithm based on the microwave signal frequencies and the corresponding power comparison values.

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