CN1151593A - Sense amplifier circuit of nonvolatile semiconductor memory device - Google Patents
Sense amplifier circuit of nonvolatile semiconductor memory device Download PDFInfo
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- CN1151593A CN1151593A CN96110457A CN96110457A CN1151593A CN 1151593 A CN1151593 A CN 1151593A CN 96110457 A CN96110457 A CN 96110457A CN 96110457 A CN96110457 A CN 96110457A CN 1151593 A CN1151593 A CN 1151593A
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Abstract
Disclosed is a sense amplifier circuit of nonvolatile semiconductor memory device with NAND structured cells, comprising a bit line isolation section A sense amplifier circuit for a nonvolatile semiconductor memory device, with NAND structured cells, includes a bit line isolation section located between a pair of bit lines connected to a memory cell array and a pair of sub-bit lines connected to an input/output gate circuit, a latch type voltage-controlled current source having n-channel MOS transistors connected to the sub-bit lines, and a switching section connected between the voltage-controlled current source and a signal line. The bit lines are electrically isolated from the sub-bit lines by provision of a bit line isolation section receiving an isolation control signal during the sensing operation. The sense amplifier circuit sensing operation is not affected by bit line load impedance and, accordingly, the sensing speed is improved and peak current is reduced.
Description
The present invention relates to the detecting amplifier circuit of Nonvolatile semiconductor memory device, particularly have flash (flash) EEPROM (electrically era-sable and programmable read-onlymemory) the Device Testing amplifier circuit of enable nand gate unit (NAND Structured cell).
Generally, in the microcomputer system of the portable, battery powered that looks like notebook-sized, because of the hard disk of using mainly as auxilary unit occupies sizable area, thereby system designer occupies more to exploitation, and high density, the high performance EEPROM of small size deeply feel deeply concerned.In order to make this high density, high performance EEPROM, dwindling the occupied area of storage unit is an important topic.For solving this problem, the someone has developed the EEPROM with enable nand gate unit that the number of the contact hole of the transistorized number of selection that can make each unit and bit line reduces.This improved NAND eeprom structure and adopt device improved of this kind structure to wipe and see the Symposium on VLSI Technology that nineteen ninety publishes with programming technique, pp.129～130, " A NAND STRUCTURED CELL WITH A NEW PROGRAMMINGTECHNOLOGY FOR HIHGLY RELIABLE 5V-ONLY FLASHEEPROM ".The NAND EEPROM that aforementioned documents discloses has the pattern of the information of wiping in the memory cell to be programmed.EEPROM with this pattern is commonly referred to as flash-EEPROM or is called flash memory.
Common flash memory is when carrying out read operation, and the transistorized gate terminal in selected unit is to apply 0V voltage on the word line.At this moment, have the programming situation of positive threshold voltage at selected cell transistor, the bit line that is connected with aforesaid cell transistor is kept the precharge level at initial stage.In contrast, when above-mentioned selected cell transistor had the programming of negative threshold voltage, the bit line discharges that is connected with above-mentioned selected cell transistor was an earth level.Adopt the sense amplifier circuit of this flash memory, because the threshold voltage of selected cell transistor in the read operation, and have reading and amplify or keep pre-charge level or keep the current potential of bit line of ground voltage level and the current potential of reference bit line between the function of difference.Fig. 1 represents to adopt the detecting amplifier circuit of the prior art of the NAND flash-EEPROM with folded bit line structure.
With reference to Fig. 1, detecting amplifier circuit 1 is between cell array 100 and I/O gate circuit 200.Said units array 100 comprises the reference cell array of supplying with reference voltage.I/O gate circuit 200 will be passed to each input/output line by the data that above-mentioned detecting amplifier circuit 1 amplifies.In detecting amplifier circuit 1, be connected to the bit line BLi of cell array 100, BLj and the sub-bit-line SBLi that is connected to I/O gate circuit 200 are provided with bit line insulation division 2 between the SBLj.This bit line insulation division 2 is by N-channel MOS FET Q1, and Q2 constitutes.By means of this, make bit line BLi, BLj and sub-bit-line SBLi, SBLj be electrical isolation selectively mutually separately.At sub-bit-line SBLi, connecting on the SBLj by N-channel MOS transistor Q3, the N that Q4 constitutes latchs and reads enlarging section 3, by P ditch MOS transistor Q5, the P that Q6 constitutes latchs and reads enlarging section 4, by P channel MOS transistor Q7, precharge portion 5 that Q8 constitutes and the balanced portion 6 that constitutes by P channel MOS transistor Q9.Before the operation of explanation sense amplifier circuit 1, for ease of explanation, suppose, transmit sparking voltage at bit line BLi according to the selective erasing unit, transmit the available reference voltage of reading according to the reference cell of selecting bit line BLj.At this moment, usually said reference voltage is designed to the intermediate level of the selected voltage and the selected voltage of programming unit of erase unit.
Fig. 2 represents to be used for the sequential chart of read operation of detecting amplifier circuit 1 shown in Figure 1 of the read operation of NAND flash memory.With reference to Fig. 2, bit line BLi, BLj and the drive wire LA that latchs amplification, LA is pre-charged to supply voltage earlier.In addition, sub-bit-line SBLi, SBLj also are pre-charged to the Vcc level according to precharge control signal φ EQ.According to the selection of unit, make bit line BLi, the voltage of BLj fully charges, and just produces the insulation control signal ISO of pulse waveform.According to this insulation control signal ISO insulated transistor Q1, Q2 becomes conducting state separately, and it is 0V that the current potential that N latchs the drive wire LA of amplifier drops to earth level GND.At this moment, in order to prevent bit-line voltage because of insulated transistor Q1, Q2 and descending must make the high level of aforementioned dielectric control signal ISO maintain Vcc+2Vtn (Vtn wherein is the transistorized threshold voltage of N-channel MOS) more than the level.As insulated transistor Q1, Q2 becomes conducting state, by bit line BLi, and BLj and sub-bit-line SBLi, the charge distributing between the SBLj, and change sub-bit-line voltage.At this moment, the relative low speed of the current potential ground of the sub-bit-line SBLi that carries out charge distributing between the bit line BLi of erase unit and electrical connection is changed, make transistor Q3, the Q6 conducting.Its result, by latching the drive wire LA of amplifier, LA makes the current potential of sub-bit-line SBLi drop to the GND level, and the current potential of sub-bit-line SBLi rises to the Vcc level.At this moment, bit line BLi, the fine potential difference (PD) between the BLj offers I/O gate circuit 200 after being amplified by detecting amplifier circuit 1.
Yet aforesaid detecting amplifier circuit is in read operation, and insulation control signal ISO must have pulse waveform LA, and the high level of above-mentioned insulation control signal also must be controlled at more than the Vcc+2Vtn level.In addition, when read operation, therefore the become influence of the bit-line load that is subjected to cell array of above-mentioned detecting amplifier circuit 1, has produced problems such as the delay of reading speed and peak point current increase.And then this detecting amplifier circuit can only be carried out normal read operation, and can not carry out the backward reading operation that output is stored in the radix-minus-one complement data of the data in the selected unit.These effects limit the design of input/output circuitry.
Fig. 3 represents to adopt the detecting amplifier circuit of the another kind of prior art of the NAND flash-EEPROM with folded bit line structure.With reference to Fig. 3, by P channel MOS transistor Q10, between precharge portion 7 that Q11 constitutes and the balanced portion 8 that constitutes by N-channel MOS transistor Q12 cell array 100 is set.The bit line BLi of cell array 100, BLj and sub-bit-line SBLi are provided with by N road ditch MOS transistor Q13 the bit line insulation division 9 that Q14 constitutes between the SBLj.Make bit line BLi by this bit line insulation division 9, BLj and sub-bit-line SBLi, SBLj be electrical isolation separately mutually.At sub-bit-line SBLi, among the SBLj, connecting by N-channel MOS transistor Q15, the N that Q16 constitutes latchs enlarging section 10 and by P channel MOS transistor Q17, the P that Q18 constitutes latchs enlarging section 11.N-channel MOS transistor Q15, the drain electrode of Q16 is connected to latch jointly amplifies drive wire Vsal, and P channel MOS transistor Q17, the source electrode of Q18 are connected to jointly to latch and amplify drive wire Vsah.
Fig. 4 represents to be used for the sequential chart of read operation of detecting amplifier circuit shown in Figure 3 of the read operation of NAND flash memory.With reference to Fig. 4, at first, after precharge and balanced action,, make the current potential discharge of bit line BLi according to by the state of the selected unit of the signal WL of word line.At this moment, when selected unit is that closing unit (off-cell) is promptly during programmed cells, because of selected cell transistor has positive threshold voltage, on the grid of above-mentioned selected cell transistor, apply the selection signal of the word line of 0V, make above-mentioned selected not conducting of cell transistor, in view of the above, make the current potential of bit line BLi still maintain pre-charge level.On the contrary, when selected unit is that open cell (on-cell) is when being erase unit, because of selected cell transistor has negative threshold voltage, even on the grid of above-mentioned selected cell transistor, apply the selection signal of the word line of 0V, the also conducting of above-mentioned selected cell transistor.Therefore, bit line BLi, the current potential of BLj become also lower than the current potential of the bit line BLj that is connected with reference cell.Then, produce the insulation control signal ISOi with predetermined pulse width, ISOj makes insulated transistor Q13, and Q14 becomes conducting state respectively.On the contrary, during the insulation control signal ISO of pulse waveform is in effective status, N latchs the current potential that amplifies drive wire Vsal and drops to low level (0V) from pre-charge level (high level), and P latchs the current potential that amplifies drive wire Vsah and rises to high level from pre-charge level (low level).Its result, the data on the bit line BLi latch enlarging section 10 and P by N and latch enlarging section 11 and read.At this moment, bit line BLi, the small electric potential difference between the BLj offers I/O gate circuit 200 by the amplification of detecting amplifier circuit.
Fig. 5 represents to be used for the sequential chart of the read operation of the detecting amplifier circuit shown in Figure 3 that the program verification of NAND flash memory and programming prohibit.The program verification is meant when the negative threshold voltage of the selected open cell threshold voltage positive along with programming operation changes into, assert that the programming of predetermined threshold voltage finishes, and stops programming operation.Programming is forbidden being meant when programming operation, and non-selected open cell can not be programmed.
At first, in programming operation, be not programmed for making the open cell that is connected with selected bit line BLi, the sub-bit-line SBLi corresponding with above-mentioned selected bit line BLi must maintain the Vcc level constantly.In forbidding this programming operation, with reference to Fig. 5,, make sub-bit-line SBLi by the external data signal that I/O gate circuit 200 is provided, the current potential of SBLj is in the state that is pre-charged to Vcc level and GND level (0V) respectively, and insulation control signal ISOj becomes activated state.Therefore, the non-selected bit line BLj discharge that is connected with reference cell makes described bit line BLi, and the current potential of BLj is fallen the GND level.Latch drive signal Vsal this moment, and Vsah becomes unactivated state.Its result is in follow-up read operation, because the level of the bit line BLi that is connected with open cell has discharged into low level, so even the current potential of sub-bit-line SBLj is the GND level, the level of sub-bit-line SBLi also still maintains the Vcc level.
Then, in the programming operation (chosen bit line BLi maintains the GND level in this operation) that the open cell (unit that promptly is wiped free of) that is connected with the bit line BLi that selectes is programmed, according to external data signal with sub-bit-line SBLi, after the current potential of SBLj is pre-charged to GND level and Vcc level respectively, carries out and press and known programming check pattern identical operations.In unit read operation after this, the current potential of sub-bit-line SBLi is the Vcc level from the GND level transitions, becomes the programming illegal state, and the programming action is ended automatically.
In this detecting amplifier circuit, between the bit line reading duration, according to making insulation control signal ISOi, ISOj and latch drive signal Vsal, degree that Vsah is overlapping and technological parameter produce variation that is used as the decoupling nargin that makes the decoupling between each bit line and each sub-bit-line and the variation of reading nargin.In addition, in programming verification and quiescing, because at first must make the insulated transistor Q14 that is connected with bit line BLj be in conducting state, so different with the detecting amplifier circuit of carrying out normal read operation, need other steering logic, produced the problem that makes checking time elongated.
The object of the present invention is to provide a kind of bit line insulation signal that does not use pulse waveform, carry out the detecting amplifier circuit of the Nonvolatile semiconductor memory device of stablizing read operation with folded bit line structure.
Another object of the present invention is to provide a kind of detecting amplifier circuit of the load effect that is not subjected to the bit line that is connected with storage unit of the Nonvolatile semiconductor memory device with folded bit line structure.
Another purpose of the present invention is to provide the detecting amplifier circuit of the little Nonvolatile semiconductor memory device of a kind of power consumption.
Another purpose of the present invention is to provide a kind of detecting amplifier circuit that is used for flash memory devices of not only carrying out normal read operation but also can carrying out the backward reading operation.
A further object of the present invention is to provide a kind of variation that can make decoupling nargin and read nargin when reading to reduce to the minimum detecting amplifier circuit that is used for flash memory devices.
Another object of the present invention is to provide a kind of detecting amplifier circuit that is used for flash memory device of carrying out quick read operation.
Another purpose of the present invention is to provide the detecting amplifier circuit that is used for flash memory device of a kind of smooth execution programming school inspection operation and programming quiescing.
For achieving the above object, one of feature of the present invention is that a kind of detecting amplifier circuit of Nonvolatile semiconductor memory device comprises: be connected to the memory cell array of the enable nand gate that is used to store the data that deposited in and supply with first and second bit lines of the reference cell array of predetermined reference voltage; With corresponding first and second sub-bit-lines of aforementioned first and second bit lines difference; Insulation control signal that be connected with each sub-bit-line with aforementioned each bit line and that basis is predetermined selectively makes the bit line seal of aforementioned each bit line and aforementioned each sub-bit-line insulation; Between predetermined precharge phase, make the balanced precharge device of aforementioned each sub-bit-line; The signal wire that is connected with the predetermined external voltage signal; Have first and second current paths that are connected with aforementioned first and second sub-bit-lines respectively, between predetermined reading duration, voltage level according to aforementioned first bit line, the electric current of aforementioned second current path is flow through in control, according to the voltage level of aforementioned second bit line, the Voltage-controlled Current Source of the electric current of aforementioned first current path is flow through in control; According to predetermined switch-over control signal, the switching device shifter that aforementioned first and second current paths are connected with aforementioned signal wire selectively; And the potential difference (PD) between the voltage of the voltage of aforementioned first sub-bit-line and aforementioned second sub-bit-line makes aforementioned first and second sub-bit-lines be latched in the multiplying arrangement that latchs of the first and second predetermined voltage levels separately when predetermined value is above.
In above-mentioned detecting amplifier circuit, the seal of described bit line insulate described each bit line and described each sub-bit-line between described precharge phase and between described reading duration fully.Thereby detecting operation is not influenced by bit-line load fully.Its result has improved reading speed, has reduced peak point current.In addition, in aforementioned amplifier circuit, at described signal wire precharging to the Vcc level, when the state that aforementioned sub-bit-line is pre-charged to the GND level is separately down carried out read operation, the data that access is opposite with the phase place of memory cell data.
According to another characteristic of the invention, a kind of detecting amplifier circuit of Nonvolatile semiconductor memory device comprises: be connected to the memory cell array of the enable nand gate that is used to store the data that deposited in and supply with first and second bit lines of the reference cell array of predetermined reference voltage; Between predetermined precharge phase, make the precharge device of described each bit line equalization; With aforementioned first and second bit lines precharge separately first and second sub-bit-lines of data-signal corresponding respectively, that provide according to the outside; The first and second insulation control signals that are connected with each sub-bit-line with aforementioned each bit line, basis is predetermined selectively make the bit line seal of aforementioned each bit line and aforementioned each sub-bit-line insulation; Have first and second current paths that are connected with aforementioned first and second sub-bit-lines respectively, between predetermined reading duration, voltage level according to aforementioned first bit line, the electric current of aforementioned second current path is flow through in control, according to the voltage level of aforementioned second bit line, the Voltage-controlled Current Source of the electric current of aforementioned first current path is flow through in control; The stabilized voltage supply of the predetermined constant voltage signal of output; The switching device shifter that aforementioned first and second current paths is connected selectively according to first and second switch-over control signals with aforementioned stabilized voltage supply; And the potential difference (PD) between the voltage of the voltage of aforementioned first sub-bit-line and aforementioned second sub-bit-line makes aforementioned first and second sub-bit-lines be latched in the multiplying arrangement that latchs of the first and second predetermined voltage levels separately when predetermined value is above.
According to the detecting amplifier circuit of formation like this, even the seal of bit line does not apply the bit line insulation signal of pulse, still can carry out read operation, but and save program verification and forbidding the needed time.
The detecting amplifier circuit of this feature has third and fourth current path that mutual difference connects side by side between described switching device shifter and described stabilized voltage supply; Also additional: as between described reading duration, to control the magnitude of current that flows through aforementioned the 3rd current path, flow through another Voltage-controlled Current Source of the magnitude of current of aforementioned the 4th current path according to the voltage level control of described second bit line according to the voltage level of described first bit line.
Describing embodiments of the present invention in detail below in conjunction with accompanying drawing, at first is description of drawings:
Fig. 1 is the circuit diagram of structure of the detecting amplifier of expression prior art.
Fig. 2 is the read operation sequential chart of expression detecting amplifier shown in Figure 1.
Fig. 3 is the circuit diagram of structure of the detecting amplifier of another prior art of expression.
Fig. 4 is the sequential chart of read operation that expression is used for the read operation of detecting amplifier shown in Figure 3.
Fig. 5 is the sequential chart that expression is used for the programming verification and the read operation that programming is forbidden of detecting amplifier shown in Figure 3.
Fig. 6 is the circuit diagram of the detecting amplifier structure of the expression first embodiment of the present invention.
Fig. 7 is the sequential chart that expression is used for the normal read operation of detecting amplifier shown in Figure 6.
Fig. 8 is the sequential chart that expression is used for the backward reading operation of detecting amplifier shown in Figure 6.
Fig. 9 is the bit-line voltage oscillogram according to analog result that expression is used for the normal read operation of detecting amplifier shown in Figure 6.
Figure 10 is the bit-line voltage oscillogram according to analog result that expression is used for the backward reading operation of detecting amplifier shown in Figure 6.
Figure 11 is the circuit diagram of the detecting amplifier structure of the expression second embodiment of the present invention.
Figure 12 is the sequential chart of read operation that expression is used for the read operation of detecting amplifier shown in Figure 11.
Figure 13 is the sequential chart that expression is used for the inspection of programming school and the read operation that programming is forbidden of detecting amplifier shown in Figure 11.
Figure 14 is the circuit diagram of the detecting amplifier structure of the expression third embodiment of the present invention.
Figure 15 is the sequential chart of read operation that expression is used for the read operation of detecting amplifier shown in Figure 14.
Figure 16 is the sequential chart that expression is used for the inspection of programming school and the read operation that programming is forbidden of detecting amplifier shown in Figure 14.
Below, with reference to the accompanying drawings the preferred embodiments of the present invention are described in detail.For ease of explanation, suppose, transmit the voltage that is sent at bit line BLi according to the unit of selective erasing, transmit the available reference voltage of reading at bit line BLj according to the selection reference unit, the detecting amplifier circuit according to embodiment is described then.
[embodiment 1] Fig. 6 is the detecting amplifier circuit of flash memory devices that be used to have folded bit line structure NAND of expression according to present embodiment.With reference to Fig. 6, the detecting amplifier circuit of present embodiment is comprising the memory cell array that is made of enable nand gate that is used for canned data and is being used to supply with between the cell array 100 and I/O gate circuit 200 of reference cell array of reference voltage.In the detecting amplifier circuit, bit line seal 12 is positioned at the bit line BLi that is connected with cell array 100, and BLj and the sub-bit-line SBLi that is connected with I/O gate circuit 200 are between the SBLj.This bit line seal 12 is by N-channel MOS transistor Q19, and Q20 constitutes.At N-channel MOS transistor Q19, apply insulation control signal ISO on the grid of Q20.Bit line BLi, BLj and sub-bit-line SBLi, SBLi select mutually by bit line seal 12 electrical isolations.N-channel MOS transistor Q21, the Voltage-controlled Current Source 13 of the latch mode that Q22 constitutes is connected sub-bit-line SBLi, and on the SBLj, by N-channel MOS transistor Q23, the switching part 14 that Q24 constitutes is connected between this Voltage-controlled Current Source 13 and the signal wire VSA.In Voltage-controlled Current Source 13, the drain electrode of transistor Q1 is connected with sub-bit-line SBLi, and its source electrode is connected with the drain electrode of transistor Q23, and the grid of aforesaid transistor Q21 is connected jointly with the drain electrode of bit line BLj and insulated transistor Q20.In addition, the drain electrode of transistor Q22 is connected on the sub-bit-line SBLj, and its source electrode is connected with the drain electrode of transistor Q24.The grid of described transistor Q22 is connected with the drain electrode of transistor Q19 jointly with bit line BLi.Constitute the transistor Q23 of switching part 14, the source electrode of Q24 is connected jointly with signal wire VSA, and their grid applies the switch controlling signal φ SA of pulse mode.In addition, by N-channel MOS transistor Q25, the N that Q26 constitutes latchs and reads enlarging section 15, by P channel MOS transistor Q27, the P that Q28 constitutes latchs and reads enlarging section 16, by N-channel MOS transistor Q29, precharge portion 17 that Q30 constitutes and the balanced portion 18 that is made of N-channel MOS transistor Q31 all are connected sub-bit-line SBLi, on the SBLj.
Fig. 7 is the sequential chart that expression is used for the normal read operation of detecting amplifier shown in Figure 6.With reference to Fig. 7, make bit line BLi, BLj is pre-charged to the Vcc level.During the control signal φ EQ of precharge and equilibrium keeps Vcc+2Vtn (Vtn herein is the transistorized threshold voltage of N-channel MOS) level, sub-bit-line SBLi, SBLj is pre-charged to the Vcc level separately by precharge portion 17 and balanced portion 18.In this read operation, signal wire VSA and P latch the current potential of the drive wire LA that reads amplification and keep GND level and Vcc level respectively, before the switch-over control signal φ of pulse condition SA produced, N latched the drive wire LA that reads amplification and also keeps the Vcc level.Under this state, according to word-line signal WL select storage unit.Fig. 7 only represent with selected memory cell be open cell situation as an example.According to the state of selecting the unit (promptly, whether be open cell, or be not closing unit), discharge bit line BLi, BLj current potential separately is in case at two bit line BLi, it is poor to produce predetermined potential between the BLj, promptly begins through preset time from the current potential of the bit line BLi current potential step-down than bit line BLj, and switch-over control signal φ SA becomes effective status.Begin readout bit line BLi, the read operation of the potential difference (PD) between the BLj this moment.In case switch-over control signal φ SA is converted to high level, transistor Q23, Q24 is with regard to conducting.At this moment, because the current potential of bit line BLj is faster than sub-bit-line SBLj discharge by transistor Q21 sub-bit-line SBLi than the current potential height of bit line BLi.Its result, it is also lower than the current potential of sub-bit-line SBLj that the current potential of sub-bit-line SBLi becomes.At this moment, the current potential Vcc electrical level transfer of the drive wire LA of N latch sense is to the GND level, and the current potential of the drive wire LA of P latch sense is kept the Vcc level, thereby transistor Q25, the Q28 conducting.Therefore, the current potential of sub-bit-line SBLi becomes the GND level, and the current potential of sub-bit-line SBLj becomes the Vcc level, thereby bit line BLi, and the detected amplifier circuit of the small potential difference (PD) between the BLj amplifies.
In aforesaid read operation, as shown in Figure 7, be pre-charged to the GND level at signal wire VSA, sub-bit-line SBLi, SBLj are pre-charged under the condition of Vcc level, carry out read operation.With reference to Fig. 7, such as, for to discharge under the open cell data conditions of GND level 0V and reference voltage level (Vref) separately, can see that sub-bit-line SBLi and SBLj discharge into GND level and Vcc level separately at readout bit line BLi and BLj.Therefore, according to above-mentioned condition, can carry out the data access identical with the phase place of cell data with the detecting amplifier circuit of present embodiment.
On the other hand, in the present embodiment, because the bit line BLi of discharge, BLj, in order to prevent to continue to form from sub-bit-line SBLi after the essence read operation, SBLj is through the DC current path of Voltage-controlled Current Source 13 and switching part 14 to GND (being signal wire VSA), and above-mentioned switch-over control signal φ SA has pulse waveform as shown in Figure 7.In addition, in the present embodiment, ISO becomes disarmed state in read operation because of the insulation control signal, keeps the GND level, and owing to make the bit line BLi of read operation, BLj and sense amplifier circuit insulate fully, and read operation is not influenced by bit-line load then fully.Therefore, the reading speed that can be improved reduces the effect of peak point current.
Fig. 8 represents to be used for the sequential chart of the backward reading operation of detecting amplifier circuit shown in Figure 6.With reference to Fig. 8, bit line BLi, BLj are precharged to the Vcc level.During precharge and balanced control signal φ EQ keep the Vcc+2Vtn level, sub-bit-line SBLi, SBLj is pre-charged to the GND level respectively by precharge portion 17 and balanced portion 18.In this read operation, i.e. in the backward reading operation, the current potential that signal wire VSA and P latch the drive wire LA that reads amplification maintains Vcc and GND level respectively.Before the switch-over control signal φ of pulse condition SA produces, latch the drive wire LA of amplifier, LA keeps the GND level respectively.Under this state, by word-line signal WL select storage unit.According to selected location mode, discharge bit line BLi, BLj current potential separately, as two bit line BLi, when producing predetermined voltage difference between the BLj, switch-over control signal FSA becomes effective status.After switch-over control signal φ SA is transformed into high level, transistor Q23, Q24 conducting, beginning read operation.At this moment, because of the current potential of bit line BLj current potential height, make sub-bit-line SBLi faster than sub-bit-line SBLj charging by transistor Q21 than bit line BLi.Its result, it is also higher than the current potential of sub-bit-line SBLj that the current potential of sub-bit-line SBLi becomes.At this moment, to the Vcc level, P latchs the current potential of the drive wire LA that reads amplification and keeps the GND level current potential that P latchs the drive wire LA that reads amplification from the GND electrical level transfer, thereby, the transistor Q26 of Voltage-controlled Current Source 15,16,27 conductings.Therefore, because the current potential of sub-bit-line SBLi becomes the Vcc level, the current potential of sub-bit-line SBLj becomes the GND level, makes bit line BLi, and the detected amplifier circuit of the small potential difference (PD) between the BLj amplifies.
With such read operation, as shown in Figure 8, signal wire VSA is pre-charged to the Vcc level, and sub-bit-line SBLi, SBLj are pre-charged under the condition of GND level separately, carries out read operation.With reference to Fig. 8, such as, when readout bit line BLi and BLj discharge into the open cell data of GND level and reference voltage (Vref) level respectively, can see that sub-bit-line SBLi and SBLj discharge into GND level and Vcc level separately.Thereby, according to aforementioned condition, can the access data opposite with the detecting amplifier circuit of present embodiment with the phase place of cell data.
Fig. 9 and Figure 10 represent normally reading and the bit-line voltage waveform of the analog result of backward reading operation according to the detecting amplifier circuit of embodiment shown in Figure 6.This simulation is to be 3.8V in power source voltage Vcc, and temperature is for carrying out under-5 ℃ the condition.In Fig. 9 and Figure 10, at the label of other this line of mark of the waveform corresponding with each line.According to present embodiment, when read operation, make the bit line BLi of detecting amplifier circuit and cell array, therefore the Blj electrically insulated from one another, shown in the accompanying drawing, can be seen and improve reading speed as described above, and almost not have peak point current.
As mentioned above, according to present embodiment, still can not carry out stable read operation even do not apply insulation control signal ISO at the bit line insulation division.In addition,, can carry out normal read operation and backward reading operation in addition, have and use advantage freely in design except that having improved reading speed and having reduced the peak point current.
[embodiment 2] Figure 11 represents the formation according to the detecting amplifier circuit of the NAND flash memory devices with folded bit line structure of present embodiment.With reference to Figure 11, the detecting amplifier circuit is between cell array 100 that comprises reference cell array and I/O gate circuit 200.In the detecting amplifier circuit, at the bit line BLi that is connected with cell array 100, BLj and the sub-bit-line SBLi that is connected with I/O gate circuit 200 between the SBLj, are provided with by N-channel MOS transistor Q35 the bit line insulation division 21 that Q36 constitutes.Bit line BLi between this bit line insulation division 21 and cell array 100 is connecting on the BLj by P channel MOS transistor Q32, precharge portion 19 that Q33 constitutes and the balanced portion 20 that is made of N-channel MOS transistor Q34.At sub-bit-line SBLi, connecting on the SBLj by N-channel MOS transistor Q37, the Voltage-controlled Current Source 22 that Q38 constitutes is between this Voltage-controlled Current Source 22 and ground connection (perhaps being lower than the predetermined potential of Vcc level), connecting by N-channel MOS transistor Q39 the switching part 23 that Q40 constitutes.In Voltage-controlled Current Source 22, the drain electrode of transistor Q37 is connected with sub-bit-line BLi, and its source electrode is connected with the drain electrode of transistor Q39, and the grid of aforesaid transistor Q37 is connected with the drain electrode of insulated transistor Q36 with bit line BLj jointly.In addition, the drain electrode of transistor Q38 is connected with sub-bit-line SBLj, and its source electrode is connected with the drain electrode of transistor Q40.The grid of aforementioned transistor Q38 is connected with the drain electrode of insulated transistor Q35 with bit line BLi jointly.Constitute the transistor Q39 of switching part 23, the source electrode of Q40 is connected to ground connection or the predetermined potential lower than Vcc level jointly, applies the switch-over control signal φ SAi of pulse mode respectively on each grid, φ SAj.At sub-bit-line SBLi, SBLj is connecting by N-channel MOS transistor Q41 in addition, and the N that Q42 constitutes latchs and reads enlarging section 24 and by P channel MOS transistor Q43, the P that Q44 constitutes latchs and reads enlarging section 25.
Figure 12 represents to be used for the sequential chart of read operation of the detecting amplifier circuit as shown in figure 11 of read operation.With reference to Figure 12, keep between low period at word-line signal WL, bit line BLi, BLj are pre-charged to the Vcc level.At this moment, insulation control signal ISOi, ISOj and P latch the current potential of the drive wire Vsah that reads amplification and keep the GND level, and the current potential that N latchs the drive wire Vsal that reads amplification maintains the Vcc level.Under this state, move to high level and select storage unit by word-line signal WL.According to the state of selected unit, as shown in figure 12, discharge bit line BLi, BLj current potential separately at two bit line BLi, has produced predetermined potential difference (PD) between the BLj.After this, switch-over control signal φ SAi, φ SAj becomes effective status, and P latchs the current potential of the drive wire Vsah that reads amplification and current potential that N latchs the drive wire Vsal that reads amplification is moved to high level (Vcc level) and low level (GND level) from pre-charge level respectively.From then on this begins to read sub-bit-line SBLi, the read operation of the potential difference (PD) between the SBLj.In case switch-over control signal φ SAi, φ SAj is moved to high level, transistor Q39, just conducting separately of Q40.
At this moment, be under the situation of open cell (being erase unit) in the unit selected by word-line signal WL, because the current potential of bit line BLj is than the current potential height of bit line BLi, and make the magnitude of current that flows through transistor Q37 become more than the magnitude of current that flows through transistor Q38.Therefore, sub-bit-line SBLi is faster than sub-bit-line SBLj discharge.Its result, it is also lower than the current potential of sub-bit-line SBLj that the current potential of sub-bit-line SBLi becomes.At this moment, the transistor Q41 of Voltage-controlled Current Source 24,25, Q42 is latched drive wire Vsal, the Vsah conducting.Therefore, the current potential of sub-bit-line SBLi discharges into the GND level, and the current potential of sub-bit-line SBLj discharges into the Vcc level, amplifies bit line BLi, the small potential difference (PD) between the BLj by the detecting amplifier circuit.
On the contrary, when being open cell (being programming unit),, and make the magnitude of current that flows through transistor Q38 become more than the magnitude of current that flows through transistor Q37 because of the current potential of bit line BLi current potential height than bit line BLj in selected unit.Therefore, sub-bit-line SBLj is faster than sub-bit-line SBLi discharge.Its result makes the current potential of sub-bit-line SBLj become lower than the current potential of sub-bit-line SBLi.At this moment, the current potential of sub-bit-line SBLj becomes the GND level, and the current potential of sub-bit-line SBLi becomes the Vcc level, amplifies bit line BLi, the small electric potential difference between the BLj by the detecting amplifier circuit.
Present embodiment is identical with last embodiment, for preventing during actual read operation in addition by the bit line BLi that discharges, BLj continues to form from precharge sub-bit-line SBLi, SBLj passes through by the DC electric current of Voltage-controlled Current Source 22 and switching part 23 to GND, described switch-over control signal φ SAi, φ SAj has pulse waveform as described in Figure 12.In addition, in the present embodiment,, become disarmed state in the ISOj read operation, keep the GND level, in detecting operation, make bit line BLi, BLj and sub-bit-line SBLi, the complete decoupling of SBLj because of insulation control signal ISOi.Under this state, factor bit line SBLi, SBLj can discharge, so improve reading speed, reduces loss current, carries out stable read operation.
Figure 13 represent to be used to programme sequential chart of read operation of the detecting amplifier shown in Figure 11 that school inspection and programming forbid.At first, in programming operation, be not programmed for making the open cell that is connected with selected bit line BLi, the sub-bit-line SBLi corresponding with above-mentioned selected bit line BLi must continue to keep the Vcc level.In this programming quiescing, latch by N and to read the external data signal that latch enlarging section 24,25 is provided from I/O gate circuit 200, sub-bit-line SBLi, SBLj become Vcc level and GND level respectively.Under this state, with reference to Figure 13, insulation control signal ISOi, ISOj becomes disarmed state, carries out and reads (promptly reading) operation.At this moment, because just switch-over control signal φ SAj becomes effective status, owing to have only transistor Q40 conducting, selected sub-bit-line SBLj is pre-charged to the GND level, latchs drive signal Vsal Vsah and becomes effective status at switching part 23.In contrast, latch the drive signal Vsal that reads enlarging section 24 at N and temporarily become disarmed state, when switch-over control signal φ SAj becomes effective status, the possibility that becomes effective status with it is together arranged.As previously mentioned, because sub-bit-line SBLj keeps the GND level, in follow-up read operation, the current potential of selected bit line BLi discharges to electronegative potential, and the current potential of above-mentioned sub-bit-line SBLi has been the GND level, so the current potential of sub-bit-line SBLi is still kept the Vcc level.Therefore, forbid the programming of selected open cell.
Then, in the programming operation (this bit line BLi selected during moving keeps the GND level) of the open cell (being erase unit) that programming is connected with selected bit line BLi, the external data signal that is provided according to I/O gate circuit 200, sub-bit-line SBLi, after SBLj is latched in GND level and Vcc level respectively, carry out and well-known programming check pattern identical operations.In the middle of the programming operation, programme completely in selected unit, and promptly the current potential of bit line BLi becomes also higher than the reference level of bit line BLj, become better than transistor Q37 of the electric conductivity of transistor Q38.The result, selected unit is under complete programming state, switch-over control signal φ SAj becomes when effective, and the magnitude of current (this magnitude of current changes along with the degree of unit programming) that flows to ground from the transistor Q38 of sub-bit-line SBLj through latching amplifier 22 is sharply increased.Therefore, above-mentioned sub-bit-line SBLj is fully discharged, become the GND level.After this, latch according to N and to read enlarging section 24,25, the current potential that makes sub-bit-line SBLi behind the Vcc level, just becomes the programming illegal state from the GND electrical level transfer.Therefore, end the programming operation of selected open cell automatically.As mentioned above, in order to programme verification and forbidding, before the insulated transistor Q36 that is connected with reference bit line begins read operation, conducting in advance, in view of the above, before read operation, because need not make the other steering logic of above-mentioned insulated transistor Q36 conducting, compared with the prior art, storage arrangement is not only simple in structure, and save program verification and forbidding the time.
On the contrary, in programming operation, for the current potential by the precharge sub-bit-line SBLi of external data signal passes to bit line BLi, only make the conducting of transistor Q31 of bit line insulation division 21 own, for the unit that is connected with the non-selected bit line BLi programming that is under an embargo, only make the conducting of precharge transistor Q33 own, above-mentioned bit line BLj is pre-charged to the Vcc level.
As mentioned above, according to present embodiment, even do not apply insulation control signal ISOi at the bit line insulation division, ISOj can not only carry out stable read operation, and can the save program verification and forbid the time.
[embodiment 3] Figure 14 represents to be used to have the formation according to the detecting amplifier circuit of the NAND flash memory device of the folded bit line structure of embodiment.With reference to Figure 14, the detecting amplifier circuit of present embodiment has the structure that has increased another Voltage-controlled Current Source 30 on the formation of the circuit of aforesaid second embodiment again.Aforementioned electric voltage-controlled current source 30 is by N-channel MOS transistor Q45, and Q46 constitutes.These two transistor Q45, the drain electrode of Q46 interconnects, aforesaid transistor Q45, the source electrode of Q46 also interconnects, transistor Q39, the source electrode of Q40 and transistor Q45, the drain electrode of Q46 interconnects, transistor Q45, the source electrode of Q46 is connected with signal wire Vsan.The grid of transistor Q45 is connected with bit line BLj.The grid of transistor Q46 is connected with bit line BLj.
Figure 15 represents to be used for the read operation sequential chart of the detecting amplifier circuit shown in Figure 14 of read operation.With reference to Figure 15, after precharge and equalization operation, WL moves to high level by word-line signal, the selection memory unit, according to the state of selected unit, as shown in figure 15, make bit line BLi, each self-potential discharge of BLj at these two bit line BLi, produces predetermined potential difference (PD) between the BLj.Then, switch-over control signal φ SAi, φ SAj becomes effective status, P latch the current potential of the drive wire Vsah that reads amplification and current potential that N latchs the drive wire Vsal that reads amplification from pre-charge level respectively to high level (Vcc level) and low level (CND level) migration.Begin readout bit line BLi, the read operation of the potential difference (PD) between the BLj from this moment.When read operation, by the transistor Q45 of the Vsan signal wire of keeping the GND level to Voltage-controlled Current Source 30, Q46 provides sufficient gate bias.In case switch-over control signal φ SAi, φ SAj is transformed into high level, and transistor Q39, Q40 be conducting respectively just.Because of the identical read operation of another read operation execution of this detecting amplifier circuit and embodiment 2, omit its explanation.Also because, identical with last embodiment, for preventing bit line BLi owing to discharge, BLj forms in the read operation of reality from sub-bit-line SBLi, SBLj is through the DC current path of Voltage-controlled Current Source 22 and switching part 23 to GND, above-mentioned switch-over control signal φ SAi, φ SAj has pulse waveform as shown in figure 12.In addition, because present embodiment insulation control signal ISOi, ISOj becomes disarmed state in read operation, and keeps the GND level, read operation neutrality line BLi, BLj and sub-bit-line SBLi, the complete decoupling of SBLj.Under this state, factor bit line SBLi, SBLj can discharge, and has improved reading speed, and has reduced loss current, can carry out stable read operation.
Figure 16 represent to be used to programme sequential chart of read operation of the detecting amplifier shown in Figure 14 that verification and programming forbid.At first for the open cell that is connected with selected bit line BLi is not programmed, by the external data signal that is provided by I/O gate circuit 200, sub-bit-line SBLi, SBLj are in the state that is pre-charged to Vcc level and GND level respectively, carry out read operation.At this moment, on signal wire Vsan, apply than the high slightly current potential of voltage that deducts the rising threshold voltage (Vtn) of transistor Q45 or Q46 from reference voltage (Vref), in view of the above, grid being connected the transistor Q46 of bit line BLj and transistor Q45 that grid is connected bit line BLi ends simultaneously.Its result, sub-bit-line SBLi and SBLj still keep pre-charge level, i.e. Vcc level and GND level.Thereby, can prevent the programming of selected open cell.On the contrary, as shown in figure 16, latch after the drive wire Vsah that reads amplification becomes temporary transient disarmed state, when switch-over control signal φ SAi becomes effective status, the possibility that becomes effective status with it is simultaneously arranged also at P.
Secondly, in the programming operation that makes open cell (the being erase unit) programming that is connected with selected bit line BLi, according to the external data that is provided by I/O gate circuit 200, sub-bit-line SBLi, after SBLj is pre-charged to GND level and Vcc level, carry out identical operations with well-known programmed check pattern.Selected unit is programmed fully, make the current potential of bit line BLi become Vsan+Vtn after, transistor Q45 conducting.Under the state of programming fully in selected unit, in case switch-over control signal φ SAj becomes effective status, sub-bit-line SBLj just becomes the GND level of discharge fully.After this, latch according to N and to read enlarging section 24,25, in case the current potential of sub-bit-line SBLi just becomes the programming illegal state from the GND electrical level transfer to the Vcc level, in view of the above, the programming of selected open cell action is ended automatically.
Claims (25)
1, a kind of detecting amplifier circuit of Nonvolatile semiconductor memory device comprises:
Be connected to the memory cell array of the enable nand gate that is used to store the data that deposited in and supply with the reference cell array of predetermined reference voltage first and second bit lines (BLi, BLj);
First and second sub-bit-lines corresponding respectively with aforementioned first and second bit lines (SBLi, SBLj);
The bit line seal (12) that is connected with each sub-bit-line with aforementioned each bit line, the predetermined insulation control signal (ISO) of basis makes aforementioned each bit line and aforementioned each sub-bit-line insulate selectively;
Between predetermined precharge phase, make the balanced precharge device (17,18) of aforementioned each sub-bit-line;
The signal wire (VSA) that is connected with the predetermined external voltage signal;
Have first and second current paths that are connected with aforementioned first and second sub-bit-lines respectively, between predetermined reading duration, voltage level according to aforementioned first bit line, the electric current of aforementioned second current path is flow through in control, according to the voltage level of aforementioned second bit line, the Voltage-controlled Current Source (13) of the electric current of aforementioned first current path is flow through in control;
According to predetermined switch-over control signal (φ AS), the switching device shifter that aforementioned first and second current paths are connected with aforementioned signal wire selectively; And
Potential difference (PD) between the voltage of the voltage of aforementioned first sub-bit-line and aforementioned second sub-bit-line makes aforementioned first and second sub-bit-lines be latched in the multiplying arrangement that latchs of the first and second predetermined voltage levels separately when predetermined value is above.
2, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 1, wherein,
The seal of described bit line between described precharge phase and between described reading duration, makes described each bit line and described each sub-bit-line insulation.
3, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 2, wherein, described Voltage-controlled Current Source comprises:
Have the source that is connected with described first sub-bit-line leak raceway groove and the grid that is connected with described second bit line the first N-channel MOS transistor (Q21) and
Have the source that is connected with described second sub-bit-line and leak the second N-channel MOS transistor (Q22) of raceway groove and the grid that is connected with described first bit line.
4, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 3, wherein, described switching device shifter comprises:
Have with the transistorized described source of described signal wire, described first N-channel MOS and leak the MOS transistor that raceway groove and the grid that is connected with described switch-over control signal are leaked in source that raceway groove is connected in series, and
Have with the transistorized described source of described signal wire, described second N-channel MOS and leak the MOS transistor that raceway groove and the grid that is connected with described switch-over control signal are leaked in source that raceway groove is connected in series.
5, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 4, wherein, described switch-over control signal be from read operation zero hour to the pulse signal that is constantly produced through the schedule time.
6, a kind of circuit of detecting amplifier of the Nonvolatile semiconductor memory device of putting down in writing as claim 5, wherein, described multiplying arrangement comprises:
Have the source between first drive wire (LA) that applies the first predetermined drive voltage signal and described first sub-bit-line of being connected and leak the N-channel MOS transistor (Q25) of raceway groove and the grid that is connected with described second sub-bit-line;
Have the source between first drive wire and described second sub-bit-line of being connected and leak the N-channel MOS transistor (Q26) of raceway groove and the grid that is connected with described first sub-bit-line;
Have the source between second drive wire (LA) that applies the second predetermined drive voltage signal and described first sub-bit-line of being connected and leak the P channel MOS transistor (Q27) of raceway groove and the grid that is connected with described second sub-bit-line, and
Have the source between second drive wire and described second sub-bit-line of being connected and leak the P channel MOS transistor (Q28) of raceway groove and the grid that is connected with described first sub-bit-line.
7, a kind of circuit of detecting amplifier of the Nonvolatile semiconductor memory device of putting down in writing as claim 6, wherein, described precharge and equalizing device make described sub-bit-line be pre-charged to mains voltage level separately.
8, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 7, wherein, described external signal is maintaining ground voltage level between described precharge phase and between described reading duration.
9, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 8, wherein, described first drive voltage signal maintains described mains voltage level between described precharge phase, keep ground voltage level between described reading duration;
Described second drive voltage signal is maintaining described mains voltage level between described precharge phase and between described reading duration.
10, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 6, wherein, described precharge and equalizing device make described each sub-bit-line be pre-charged to ground voltage level respectively.
11, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 10, wherein, described external voltage signal is maintaining described mains voltage level between described precharge phase and between described reading duration.
12, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 11, wherein, described first drive voltage signal is maintaining described ground voltage level between described precharge phase and between described reading duration;
Described second drive voltage signal is kept described ground voltage level between described precharge phase, keep described mains voltage level between described reading duration.
13, a kind of detecting amplifier circuit of Nonvolatile semiconductor memory device comprises:
Be connected to the memory cell array of the enable nand gate that is used to store the data that deposited in and supply with the reference cell array of predetermined reference voltage first and second bit lines (BLi, BLj);
Between predetermined precharge phase, make the precharge device of described each bit line equalization (19,20);
Corresponding respectively with aforementioned first and second bit lines, and precharge separately first and second sub-bit-lines of data-signal that provide according to the outside (SBLi, SBLj);
The first and second insulation control signals (ISOi, ISOj) that are connected with each sub-bit-line with aforementioned each bit line, basis is predetermined make the bit line seal (21) of aforementioned each bit line and aforementioned each sub-bit-line insulation selectively;
Have first and second current paths that are connected with aforementioned first and second sub-bit-lines respectively, between predetermined reading duration, voltage level according to aforementioned first bit line, the electric current of aforementioned second current path is flow through in control, according to the voltage level of aforementioned second bit line, the Voltage-controlled Current Source (22) of the electric current of aforementioned first current path is flow through in control;
The stabilized voltage supply of the predetermined constant voltage signal of output;
Corresponding first and second switch-over control signals (φ ASi, φ ASj) are connected aforementioned first and second current paths selectively with aforementioned stabilized voltage supply switching device shifter; And
Potential difference (PD) between the voltage of the voltage of aforementioned first sub-bit-line and aforementioned second sub-bit-line makes aforementioned first and second sub-bit-lines be latched in the multiplying arrangement that latchs of the first and second predetermined voltage levels separately when predetermined value is above.
14, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 13, wherein,
Described bit line seal reaches aforementioned each bit line of described reading duration chien shih and described each sub-bit-line insulation between described precharge phase.
15, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 14, wherein, described Voltage-controlled Current Source comprises:
Have the source that is connected with described first sub-bit-line leak raceway groove and the grid that is connected with described second bit line the first N-channel MOS transistor (Q37) and
Have the source that is connected with described second sub-bit-line and leak the second N-channel MOS transistor (Q38) of raceway groove and the grid that is connected with described first bit line.
16, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 15, wherein, described switching device shifter comprises:
Have with the transistorized described source of described stabilized voltage supply and described first N-channel MOS and leak the MOS transistor that raceway groove and the grid that is connected with described switch-over control signal (φ SAi) are leaked in source that raceway groove is connected in series, and
Have with the transistorized described source of described supply voltage and described second N-channel MOS and leak the MOS transistor that raceway groove and the grid that is connected with described second switch-over control signal (φ SAj) are leaked in source that raceway groove is connected in series.
17, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 16, wherein, described multiplying arrangement comprises:
Have and be connected between first drive wire (Vsal) that applies the first predetermined drive voltage signal and described first sub-bit-line source and leak raceway groove and the grid N-channel MOS transistor (Q41) that is connected with described second sub-bit-line;
Have the source between first drive wire and described second sub-bit-line of being connected and leak the N-channel MOS transistor (Q42) of raceway groove and the grid that is connected with described first sub-bit-line;
Have the source between second drive wire (Vsah) that applies the second predetermined drive voltage signal and described first sub-bit-line of being connected and leak the P channel MOS transistor (Q43) of raceway groove and the grid that is connected with described second sub-bit-line; And
Have the source between second drive wire and described second sub-bit-line of being connected and leak the P channel MOS transistor (Q44) of raceway groove and the grid that is connected with described first sub-bit-line.
18, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 17, wherein, described precharge and equalizing device make described each bit line be pre-charged to mains voltage level respectively.
19, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 18, wherein, described voltage regulation signal is maintaining described ground voltage level between precharge phase and between reading duration.
20, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 19, wherein, described first drive voltage signal maintains described mains voltage level between described precharge phase, keep ground voltage level between described reading duration;
Described second drive voltage signal maintains described ground voltage level between described precharge phase, keep the aforementioned power source voltage level between aforementioned reading duration.
21, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 20 also comprises:
Has third and fourth current path that is connected between wherein said switching device shifter and the described stabilized voltage supply parallel with one another respectively, between described reading duration, voltage level according to described first bit line, the magnitude of current of described the 3rd current path is flow through in control, flows through another voltage-controlled current source (30) of the magnitude of current of described the 4th current path according to the voltage level control of described second bit line.
22, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 21, wherein,
Described first and each switch-over control signal be to begin up to pulse signal through being produced respectively between the schedule time from the read operation that is used to read.
23, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 22, wherein,
Described first drive voltage signal is maintaining described ground voltage level between precharge phase and between reading duration;
Described second drive voltage signal maintains the aforementioned power source voltage level between described programming verification and described precharge of forbidding and aforementioned reading duration.
24, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 21, wherein,
Described first switch-over control signal is being kept ground voltage level between the precharge phase that is used to programme verification and forbids and between reading duration, and described second switch-over control signal is to begin up to the pulse signal through being produced between the schedule time in the read operation that is used for programmed check and forbid.
25, a kind of detecting amplifier circuit of the Nonvolatile semiconductor memory device of putting down in writing as claim 13, wherein,
Described bit line seal, make be connected the programming operation that the open cell on described first bit line programmes during, become activated state according to described second switch-over control signal, aforementioned first bit line is connected with described first sub-bit-line.
Applications Claiming Priority (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR19950015577 | 1995-06-13 | ||
| KR15577/1995 | 1995-06-13 | ||
| KR15577/95 | 1995-06-13 | ||
| KR1019950018965A KR0177770B1 (en) | 1995-06-30 | 1995-06-30 | Non-volatile semiconductor memory device |
| KR18968/1995 | 1995-06-30 | ||
| KR18968/95 | 1995-06-30 | ||
| KR18965/95 | 1995-06-30 | ||
| KR18965/1995 | 1995-06-30 | ||
| KR1019950018968A KR0158114B1 (en) | 1995-06-30 | 1995-06-30 | A non-volatile semiconductor memory device |
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| Publication Number | Publication Date |
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| CN1151593A true CN1151593A (en) | 1997-06-11 |
| CN1107323C CN1107323C (en) | 2003-04-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN96110457A Expired - Fee Related CN1107323C (en) | 1995-06-13 | 1996-06-13 | Sense amplifier circuit of nonvolatile semiconductor memory device |
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|---|---|
| US (1) | US5761123A (en) |
| EP (1) | EP0758127B1 (en) |
| JP (1) | JP3661162B2 (en) |
| CN (1) | CN1107323C (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04114395A (en) * | 1990-09-05 | 1992-04-15 | Nec Corp | Semiconductor storage circuit |
| JP3279615B2 (en) * | 1991-04-15 | 2002-04-30 | 株式会社日立製作所 | Semiconductor device |
| KR940004406B1 (en) * | 1991-09-27 | 1994-05-25 | 현대전자산업 주식회사 | Nand type cell sense amplifier |
| JPH05159575A (en) * | 1991-12-04 | 1993-06-25 | Oki Electric Ind Co Ltd | Dynamic random-access memory |
| JPH06290591A (en) * | 1993-03-31 | 1994-10-18 | Sony Corp | Semiconductor non-volatile memory |
| KR970001344B1 (en) * | 1993-07-12 | 1997-02-05 | 삼성전자 주식회사 | Semiconductor memory device |
| KR960011207B1 (en) * | 1993-11-17 | 1996-08-21 | 김광호 | Data sensing method of semiconductor memory device and the same circuit |
| US5539701A (en) * | 1994-08-05 | 1996-07-23 | Nippon Steel Corporation | Sense circuit for semiconductor memory devices |
-
1996
- 1996-06-13 EP EP96304435A patent/EP0758127B1/en not_active Expired - Lifetime
- 1996-06-13 DE DE69615483T patent/DE69615483T2/en not_active Expired - Lifetime
- 1996-06-13 US US08/663,350 patent/US5761123A/en not_active Expired - Lifetime
- 1996-06-13 JP JP15227796A patent/JP3661162B2/en not_active Expired - Fee Related
- 1996-06-13 CN CN96110457A patent/CN1107323C/en not_active Expired - Fee Related
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| CN100345216C (en) * | 2002-07-19 | 2007-10-24 | 海力士半导体有限公司 | dynamic random access memory (RAM) for high-speed data access |
| CN101615428B (en) * | 2002-09-24 | 2014-04-23 | 桑迪士克科技公司 | Non-volatile memory and method for controlling a plurality of detection circuits in the non-volatile memory |
| CN101615428A (en) * | 2002-09-24 | 2009-12-30 | 桑迪士克股份有限公司 | Detection method in the Nonvolatile memory devices and reading system |
| CN101084556B (en) * | 2002-09-24 | 2010-05-05 | 桑迪士克股份有限公司 | Non-volatile memory and method with improved sensing |
| CN1745432B (en) * | 2002-12-12 | 2011-12-14 | 桑迪士克股份有限公司 | Nonvolatile memory integrated circuit storing device and method of error recovery to operate the same |
| CN100407335C (en) * | 2003-05-09 | 2008-07-30 | 联发科技股份有限公司 | Precharge and detecting circuit for differential read-only storage |
| CN1747063B (en) * | 2004-08-02 | 2011-11-09 | 三星电子株式会社 | Semiconductor memory devices |
| CN1959837B (en) * | 2005-10-31 | 2010-06-09 | 尔必达存储器株式会社 | Semiconductor memory device |
| CN101425339A (en) * | 2008-12-05 | 2009-05-06 | 上海贝岭股份有限公司 | Reading circuit for large capacity EEPROM memory |
| CN101425339B (en) * | 2008-12-05 | 2010-12-29 | 上海贝岭股份有限公司 | Reading circuit for large capacity EEPROM memory |
| CN108736879A (en) * | 2017-04-18 | 2018-11-02 | 爱思开海力士有限公司 | Semiconductor device |
| CN112885394A (en) * | 2019-11-29 | 2021-06-01 | 爱思开海力士有限公司 | Memory device and method of operating the same |
| CN112885394B (en) * | 2019-11-29 | 2023-12-29 | 爱思开海力士有限公司 | Memory device and method of operating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1107323C (en) | 2003-04-30 |
| JPH097382A (en) | 1997-01-10 |
| EP0758127A2 (en) | 1997-02-12 |
| DE69615483D1 (en) | 2001-10-31 |
| EP0758127B1 (en) | 2001-09-26 |
| EP0758127A3 (en) | 1997-07-23 |
| DE69615483T2 (en) | 2002-05-29 |
| JP3661162B2 (en) | 2005-06-15 |
| US5761123A (en) | 1998-06-02 |
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