CN114966360A - System and method for testing avalanche voltage of optical device - Google Patents

System and method for testing avalanche voltage of optical device Download PDF

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CN114966360A
CN114966360A CN202210889008.2A CN202210889008A CN114966360A CN 114966360 A CN114966360 A CN 114966360A CN 202210889008 A CN202210889008 A CN 202210889008A CN 114966360 A CN114966360 A CN 114966360A
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dark current
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CN114966360B (en
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张林波
许远忠
张强
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Chengdu Eugenlight Technologies Co ltd
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Abstract

The invention relates to the technical field of optical device production, and discloses an optical device avalanche voltage testing system and method, wherein a parameter setting module is used for setting testing parameters, and a power-up unit is used for powering up an optical device according to the set testing parameters; receiving a dark current value generated by the light device when the light device is powered up through a feedback unit, converting the dark current value into a corresponding signal and transmitting the signal to an analysis module; in the analysis module, curve fitting is carried out after bad point data is removed, and the power-on voltage of the optical device when the dark current is regulated is calculated according to the fitted curve. The method avoids the problem that a method of electrifying to a certain value below a dark current specified value and then fitting the last section of curve by using a straight line requires multiple times of experimental verification to obtain a better result, also avoids the problem of influence of test dead-point data on a curve expression, and improves the measurement precision.

Description

System and method for testing avalanche voltage of optical device
Technical Field
The invention relates to the technical field of optical device production, in particular to an optical device avalanche voltage testing system and method.
Background
The avalanche voltage of the optical device is used as an important detection index of the optical device, and whether the optical device is qualified or not needs to be checked in the production process. There are two common test methods currently used:
the method 1 comprises the steps of gradually powering up the device from zero by using a self-made power-up circuit board, and stopping applying reverse voltage when the dark current applied to the device reaches a dark current specified value.
And 2, gradually powering the device from zero by using a self-made power-up circuit board, adding the power-up circuit board to a certain value below the dark current specified value of the device, fitting the last section of curve by using a straight line, and calculating to obtain the dark current finally.
The avalanche voltage is measured by a method of directly electrifying to a dark current specified value, so that the device is hidden from being damaged. By adopting a method of electrifying to a certain value below the dark current specified value and then fitting a last section of curve by using a straight line, the data points of the last section (such as the number of the points of the last section or whether a part of the points need to be removed) are sampled, and a better result can be obtained by multiple times of experimental verification, otherwise, the problem of insufficient measurement precision is caused.
Disclosure of Invention
Based on the above problems, the invention provides a system and a method for testing avalanche voltage of an optical device, which can avoid the problem that a better result can be obtained only by adopting a method of electrifying to a certain value below a specified value of dark current and then fitting the last section of curve with a straight line through multiple experimental verifications, and can also avoid the problem of influence of test bad point data on a curve expression, thereby improving the measurement accuracy.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows:
a system for testing avalanche voltage of an optical device comprises a parameter setting module, a testing module and an analysis module, wherein the testing module comprises a power-on unit, a feedback unit and a power supply unit for supplying power to the testing module;
the parameter setting module is used for setting test parameters and sending the test parameters to the power-on unit, wherein the test parameters comprise a power-on voltage initial value, a power-on step and a power-on voltage end value;
the power-up unit is used for receiving the test parameters sent by the parameter setting module and powering up the optical device;
the feedback unit is used for receiving a dark current value generated by the optical device when the optical device is powered on, converting the dark current value into a corresponding signal and transmitting the signal to the analysis module;
the analysis module is used for removing the dead point data according to the power-on voltage and the fed back corresponding dark current value, then performing multiple function curve fitting, and calculating the power-on voltage when the dark current of the optical device is regulated according to the multiple functions obtained by fitting, wherein the power-on voltage is the avalanche voltage.
The analysis module includes:
the data acquisition submodule is used for acquiring a power-on voltage and a corresponding dark current value;
the dead pixel data removing submodule is used for cleaning the dark current value data and removing dead pixel data;
the curve fitting submodule is used for fitting a multi-time function curve by taking the dark current values left after the dead point data is removed as output and the power-on voltage corresponding to each dark current value as input, and analyzing a function expression of the multi-time function curve;
and the avalanche voltage determination submodule is used for calculating the energizing voltage when the dark current is regulated according to the function expression, and the energizing voltage is the avalanche voltage.
The dead-point data removing submodule is specifically configured to:
derivation
Figure 611157DEST_PATH_IMAGE001
Removal of
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The data of (a);
for removing
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Later data is subjected to second derivative calculation
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Removing data having an absolute value of the second derivative greater than a set value, wherein i is an integer greater than 1,x i is as followsiThe power-up voltage of the next power-up,y i is composed ofx i Corresponding dark current.
The curve fitting submodule adopts a least square method to fit a cubic function curve
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，
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In order to apply the voltage to the electric power,
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to collect the resulting corresponding dark current values,
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、
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、
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、
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respectively as constant coefficients, and solving the cubic function curve based on the minimum error accumulationa、b、c、dA value of (a), i.e.
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，
Solve the above formulaa、b、c、dThe partial derivatives of (d) can be given by:
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solved based on the partial derivative formulaa、b、c、dAnd then determining a functional expression of a cubic function curve, where n is the number of applied voltages,
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is composed of
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Average value of (a).
The parameter setting module and the analysis module are integrated in a test computer, the power-up unit and the feedback unit are integrated in a test circuit board, and the test circuit board is connected with the test computer through a serial port.
The invention also provides a method for testing avalanche voltage of the optical device, which comprises the following steps:
step 1, gradually powering up the optical device by a set power-up step, and acquiring a dark current value corresponding to each power-up voltage;
step 2, removing bad data in the acquired dark current value data, taking the residual data as output, taking the power-on voltage corresponding to each dark current value as input, fitting a multiple function curve, and analyzing a function expression of the multiple function curve;
and 3, calculating the energizing voltage at the dark current specified value according to the function expression, wherein the energizing voltage is the avalanche voltage.
Power was gradually applied during the test to 85% of the dark current specification value. In the scheme, the voltage is added to 85% of the specified value of the dark current, and then multiple times of function curve fitting are carried out, so that the verified effect is ideal, and the test precision can be better improved.
In the step 2, the step of removing the dead pixel data in the collected dark current value data includes:
derivation
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Removal of
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The data of (a);
for removing
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Later data is subjected to second derivative calculation
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Removing data having a second derivative with an absolute value greater than a set value, where i is an integer greater than 1,x i is as followsiThe power-up voltage of the next power-up,y i is composed ofx i Corresponding dark current.
In the step 2, the step of fitting a multiple function curve by using the residual data as output and the applied voltage corresponding to each dark current value as input, and analyzing a function expression of the multiple function curve includes:
using the residual data as output, using the corresponding applied voltage of each dark current value as input, fitting a cubic function curve by using a least square method,
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，
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in order to apply the voltage to the battery,
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to collect the resulting corresponding dark current values,
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、
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、
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、
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are respectively constant coefficients;
solving cubic function curve based on minimum error accumulationa、b、c、dA value of (i), i.e
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，
Solve the above formulaa、b、c、dThe partial derivatives of (d) can be given by:
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solved based on the partial derivative formulaa、b、c、dAnd then determining a functional expression of a cubic function curve, where n is the number of applied voltages,
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is composed of
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The expected value of (c) is,
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is composed of
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To
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Is determined by the average value of (a) of (b),
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Average value of (a).
Compared with the prior art, the invention has the beneficial effects that: according to the method, only one time of curve fitting is needed after data acquisition, the problem that a better result can be obtained only by adopting a method of electrifying to a certain value below a dark current specified value and then fitting the last section of curve by using a straight line through multiple times of experimental verification can be avoided by testing the avalanche voltage of the optical device, and the problem that the bad point data is influenced on the curve expression by testing can be avoided by adopting the data after the bad point data is removed, so that the measurement precision is improved.
The power is gradually applied to 85% of the specified value of the dark current in the test process, the risk of hidden damage of the device caused by directly applying the power to the specified value of the dark current in the test process is avoided, and the avalanche voltage of the optical device can be obtained within a certain precision range.
Drawings
FIG. 1 is a block diagram of an avalanche voltage testing system for an optical device in embodiment 1 or 2;
FIG. 2 is a block diagram showing the structure of the avalanche voltage test performed on the optical device in example 2;
FIG. 3 is a flowchart of an avalanche voltage testing method for the optical device in embodiment 1 or 2;
FIG. 4 is a graph showing theoretical characteristics between a power-on voltage and a dark current of the optical device in example 2;
FIG. 5 is a graph showing the distribution of the original data in example 2;
FIG. 6 is a diagram showing a distribution of remaining data after removing dead pixels in example 2;
FIG. 7 is a graph obtained by the fitting in example 2;
FIG. 8 is a graph comparing the fitted curve in example 2 with the actual collected value when the voltage is greater than the dark current specified value by 85% and equal to or less than the dark current.
Wherein: 1. a parameter setting module; 2. a test module; 3. an analysis module; 4. a power-up unit; 5. a feedback unit; 6. a power supply unit.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Example 1:
referring to fig. 1 and 3, the embodiment provides a system for testing avalanche voltage of a photonic device, which includes a parameter setting module 1, a testing module 2, and an analyzing module 3, where the testing module 2 includes a power-up unit 4, a feedback unit 5, and a power supply unit 6 for supplying power to the testing module 2.
The parameter setting module 1 is used for setting test parameters and sending the test parameters to the power-on unit 4; the test process in this embodiment is to use step-by-step power up to 85% of the dark current specified value, so the test parameters include a power-up voltage initial value, a power-up step, and a power-up voltage end value, the power-up voltage initial value is 0, the power-up voltage end value is 85% of the dark current specified value, and the power-up step is set to 0.1V in this embodiment, which is relatively small, and has the advantage that more data can be acquired to improve the precision. Of course, the test parameters are the embodiments that have been well verified, but other embodiments are not excluded, i.e. different parameter settings are allowed in different implementations.
The power-on unit 4 is used for receiving the test parameters sent by the parameter setting module 1 and powering on the optical device according to the test parameters.
The feedback unit 5 is used for receiving a dark current value generated by the optical device after power-up, converting the dark current value into a corresponding signal, and transmitting the signal to the analysis module 3.
The analysis module 3 is used for removing the dead point data and then performing curve fitting for a plurality of times according to the power-on voltage and the corresponding feedback dark current value, and calculating the power-on voltage when the dark current of the optical device is regulated according to the curve obtained by fitting, wherein the power-on voltage is the avalanche voltage obtained by testing.
The testing system can be used for testing the avalanche voltage of the optical device. Specifically, the method for testing the avalanche voltage of the optical device in the embodiment includes the following steps:
setting test parameters, and gradually powering up the optical device by the power-up unit 4 according to the test parameters, and acquiring a dark current value corresponding to each power-up voltage;
and removing dead point data from the acquired dark current value data, fitting a multi-time curve by using the residual data after the dead point data is removed, namely taking the applied voltage as input, taking the corresponding dark current value generated by the optical device after power-on as output, performing multi-time curve fitting, solving a function expression of the multi-time curve, and calculating the applied voltage when the dark current of the optical device is regulated on the basis of the function expression.
In the test process, by gradually electrifying and collecting test data, then carrying out curve fitting for a plurality of times after dead points of the test data are removed, the problem that a method of electrifying to a certain value below a dark current specified value and then fitting the last section of curve by using a straight line needs a plurality of times of experimental verification to obtain a better result is solved, and the influence of the test dead point data on the curve expression is also solved, so that the test flow can be simplified, and the measurement precision is improved.
The analysis module 3 in this embodiment includes:
the data acquisition submodule is used for acquiring a power-on voltage and a corresponding dark current value;
the dead pixel data removing submodule is used for cleaning the dark current value data and removing dead pixel data;
the curve fitting submodule is used for fitting a multi-time function curve by taking the dark current values left after the dead point data is removed as output and the power-on voltage corresponding to each dark current value as input, and analyzing a function expression of the multi-time function curve;
and the avalanche voltage determination submodule is used for calculating the energizing voltage when the dark current is regulated according to the function expression, and the energizing voltage is the avalanche voltage.
In this embodiment, as an example of an implementable manner, the bad point data removing sub-module is specifically configured to:
data derivation
Figure 531194DEST_PATH_IMAGE001
Removing the residual components with reference to theoretical characteristic curve and test experience
Figure 141691DEST_PATH_IMAGE002
The data of (2), i.e., the data that the removal voltage does not change the current, for example, includes the data that the removal voltage does not change the current for the first period (i.e., the flat area) because these data cannot reflect the characteristic between the applied voltage and the dark current value.
For removing
Figure 410998DEST_PATH_IMAGE002
Later data is subjected to second derivative calculation
Figure 930972DEST_PATH_IMAGE003
Removing data of which the absolute value of the second derivative is larger than a set value, namely removing data which change too fast; through verification, the set value of 10 is a better choice, and the accuracy of the final result is higher. Wherein i is an integer greater than 1,x i is as followsiThe power-up voltage of the next power-up (i.e. the ith value of x),y i is the corresponding dark current value.
The curve fitting submodule performs curve fitting on the data left after the dead point data is removed, and fits out the voltage for power upxFor input, dark current valueyAnd analyzing the functional relation of the output to obtain an expression. The fitting of the functional relationship in this embodiment uses a least square method to fit a cubic function curve
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，
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In order to apply the voltage to the battery,
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to collect the resulting corresponding dark current values,
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、
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、
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、
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respectively constant coefficient, and solving cubic function curve according to least square methoda、 b、c、dWith minimal accumulation of error for an appropriate value, i.e.
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I.e. based on the minimum accumulated errora、b、c、dA value of (d);
solve the above formulaa、b、c、dThe partial derivatives of (d) can be given by:
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wherein n is the number of the power-on voltage, namely the number of the values of x,
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is composed of
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The expected value of (c) is,
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is composed of
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Is determined by the average value of (a) of (b),
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Average value of (a). Can be calculated according to the formulaa、b、c、dThen a cubic curve is obtained
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The specific expression of (1).
Example 2
Referring to fig. 2-8, the parameter setting module 1 and the analysis module 3 in this embodiment are both installed in a testing computer, and the avalanche voltage of a certain optical device is tested by the system and method of the present invention (the theoretical relationship curve between the power-up voltage and the dark current of the optical device is shown in fig. 4), and the testing steps are as follows:
setting test parameters through a parameter setting module 1 in a test computer, and transmitting signals related to the test parameters to an analysis module 3 for recording and a power-on unit 4 of a test module 2; the power-up unit 4 powers up the optical device according to the test parameters, and the feedback unit 5 receives a corresponding dark current value generated after the optical device is powered up and transmits the dark current value to the analysis module 3.
The power-up unit 4 in this embodiment adopts a DAC chip, and can convert the digital signal transmitted by the parameter setting module 1 into an analog voltage signal to power up the optical device; the feedback unit 5 converts a dark current analog signal generated when the optical device is powered on into a digital signal using an ADC chip. The power-on unit and the feedback unit are integrated on a test circuit board, and the test circuit board is connected with a test computer through a serial port.
In the process of processing the relevant power-on voltage and the corresponding dark current value in the analysis module 3, firstly removing the dead point data, then using the power-on voltage as input of the residual data, using the corresponding dark current value generated by the optical device during power-on as output, carrying out curve fitting, and solving a function expression of a curve; the specific process of the analysis module 3 in this embodiment is as follows:
step 1, obtaining power-on voltagexAnd corresponding dark current valuey，The relevant data are shown in fig. 5;
step 2, cleaning the data and removing bad point data; the specific removal process comprises the following steps:
data derivation
Figure 376189DEST_PATH_IMAGE001
Removing the theoretical characteristic curve (such as FIG. 3) and test experience
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The data of (a);
for removing
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Second derivative of the data
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Determining a value according to the data acquired for multiple times, and removing the data with the absolute value larger than the value, namely removing the data with too fast change; wherein the content of the first and second substances,x i is as followsiThe power-up voltage of the secondary test,y i corresponding to dark current. The relevant data obtained after removing the dead pixel data is shown in fig. 6.
Step 3, fitting the rest data to add the voltagexFor input, dark currentyAnalyzing the output function relation to obtain an expression; the fitting of the functional relationship in this embodiment uses a least squares fit to obtain a cubic curve
Figure 247530DEST_PATH_IMAGE004
，
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In order to apply the voltage to the battery,
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to collect the resulting corresponding dark current values,
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、
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、
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、
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respectively, are constant coefficients.
Solving a cubic curve according to the principle of least square methoda,b,c,dWith minimal accumulation of error for an appropriate value, i.e.
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，
Solve the above formulaa,b,c,dThe partial derivatives of (d) can be given by:
Figure 117955DEST_PATH_IMAGE012
wherein the content of the first and second substances,
Figure 296126DEST_PATH_IMAGE013
is composed of
Figure 702224DEST_PATH_IMAGE014
The expected value of (a) is determined,
Figure 256834DEST_PATH_IMAGE015
is composed of
Figure 406055DEST_PATH_IMAGE016
To
Figure 4396DEST_PATH_IMAGE014
Is determined by the average value of (a) of (b),
Figure 380013DEST_PATH_IMAGE017
is composed of
Figure 987581DEST_PATH_IMAGE018
To
Figure 866675DEST_PATH_IMAGE019
Is determined by the average value of (a) of (b),
Figure 776863DEST_PATH_IMAGE020
is composed of
Figure 623465DEST_PATH_IMAGE021
To
Figure 519876DEST_PATH_IMAGE022
Is determined by the average value of (a) of (b),
Figure 30974DEST_PATH_IMAGE023
is composed of
Figure 987428DEST_PATH_IMAGE024
To
Figure 931114DEST_PATH_IMAGE025
Is determined by the average value of (a) of (b),
Figure 880484DEST_PATH_IMAGE026
is composed of
Figure 734170DEST_PATH_IMAGE027
To
Figure 376373DEST_PATH_IMAGE028
Is determined by the average value of (a) of (b),
Figure 948300DEST_PATH_IMAGE029
is composed of
Figure 311148DEST_PATH_IMAGE030
To
Figure 534188DEST_PATH_IMAGE031
Is determined by the average value of (a),
Figure 832445DEST_PATH_IMAGE032
is composed of
Figure 878286DEST_PATH_IMAGE033
To
Figure 185771DEST_PATH_IMAGE034
Is determined by the average value of (a) of (b),
Figure 263317DEST_PATH_IMAGE035
is composed of
Figure 857109DEST_PATH_IMAGE036
To
Figure 138049DEST_PATH_IMAGE037
Is determined by the average value of (a) of (b),
Figure 967334DEST_PATH_IMAGE038
is composed of
Figure 650119DEST_PATH_IMAGE039
To
Figure 414813DEST_PATH_IMAGE040
Is determined by the average value of (a) of (b),
Figure 432316DEST_PATH_IMAGE041
is composed of
Figure 816024DEST_PATH_IMAGE042
To is that
Figure 865233DEST_PATH_IMAGE043
Average value of (a). The fitting results are shown in fig. 7.
And finally, calculating the power-on voltage of the light-emitting device when the dark current is regulated according to the fitted curve. In the test process in the embodiment, the step-by-step power-up is adopted to 85% of the specified value of the dark current, so that the device hidden damage risk caused by directly adding the current to the specified value of the dark current in the test process is solved, and the avalanche voltage of the optical device can be obtained within a certain precision range. Fig. 8 shows the fitting effect of the fitting curve and the actual values (several dots in the rear section of the figure) when the voltage is greater than the specified value of the dark current by 85% and less than or equal to the dark current, and the actual values greater than the dark current by 85% are substantially close to the fitting curve.
The above is an embodiment of the present invention. The embodiments and specific parameters in the embodiments are only for the purpose of clearly illustrating the verification process of the invention and are not intended to limit the scope of the invention, which is defined by the claims, and all equivalent structural changes made by using the contents of the specification and the drawings of the present invention should be covered by the scope of the present invention.

Claims (9)

1. The avalanche voltage test system for the optical device is characterized by comprising a parameter setting module, a test module and an analysis module, wherein the test module comprises a power-on unit, a feedback unit and a power supply unit for supplying power to the test module;
the parameter setting module is used for setting test parameters and sending the test parameters to the power-on unit, wherein the test parameters comprise a power-on voltage initial value, a power-on step and a power-on voltage end value;
the power-up unit is used for receiving the test parameters sent by the parameter setting module and powering up the optical device;
the feedback unit is used for receiving a dark current value generated by the optical device when the optical device is powered on, converting the dark current value into a corresponding signal and transmitting the signal to the analysis module;
the analysis module is used for removing bad point data according to the power-on voltage and the corresponding feedback dark current value, then performing multiple function curve fitting, and calculating the power-on voltage when the dark current of the optical device is regulated according to the multiple functions obtained by fitting, wherein the power-on voltage is the avalanche voltage.
2. The optical device avalanche voltage test system according to claim 1, wherein the analysis module includes:
the data acquisition submodule is used for acquiring a power-on voltage and a corresponding dark current value;
the dead pixel data removing submodule is used for cleaning the dark current value data and removing dead pixel data;
the curve fitting submodule is used for fitting a multi-time function curve by taking the dark current values left after the dead point data is removed as output and the power-on voltage corresponding to each dark current value as input, and analyzing a function expression of the multi-time function curve;
and the avalanche voltage determination submodule is used for calculating the energizing voltage when the dark current is regulated according to the function expression, and the energizing voltage is the avalanche voltage.
3. The optical device avalanche voltage test system according to claim 2, wherein the bad point data removal submodule is specifically configured to:
derivation
Figure 344865DEST_PATH_IMAGE001
Removing of
Figure 334817DEST_PATH_IMAGE002
The data of (a);
for removing
Figure 646850DEST_PATH_IMAGE002
Later data is subjected to second derivative calculation
Figure 553495DEST_PATH_IMAGE003
Removing data having an absolute value of the second derivative greater than a set value, wherein i is an integer greater than 1,x i is as followsiThe power-up voltage of the next power-up,y i is composed ofx i Corresponding dark current.
4. The optical device avalanche voltage testing system of claim 3, wherein the curve fitting submodule fits a cubic function curve using least squares
Figure 800937DEST_PATH_IMAGE004
，
Figure 527453DEST_PATH_IMAGE005
In order to apply the voltage to the battery,
Figure 518543DEST_PATH_IMAGE006
to collect the resulting corresponding dark current values,
Figure 279694DEST_PATH_IMAGE007
、
Figure 557092DEST_PATH_IMAGE008
、
Figure 52795DEST_PATH_IMAGE009
、
Figure 568615DEST_PATH_IMAGE010
respectively as constant coefficients, and solving the cubic function curve based on the minimum error accumulationa、b、c、dA value of (i), i.e
Figure 200585DEST_PATH_IMAGE011
，
Solve the above formulaa、b、c、dThe partial derivatives of (d) can be given by:
Figure 39096DEST_PATH_IMAGE012
solved based on the partial derivative formulaa、b、c、dAnd then determining a functional expression of a cubic function curve, where n is the number of applied voltages,
Figure 490938DEST_PATH_IMAGE013
is composed of
Figure 682884DEST_PATH_IMAGE014
The expected value of (c) is,
Figure 418628DEST_PATH_IMAGE015
is composed of
Figure 913195DEST_PATH_IMAGE016
To
Figure 367178DEST_PATH_IMAGE014
Is determined by the average value of (a) of (b),
Figure 238183DEST_PATH_IMAGE017
is composed of
Figure 703799DEST_PATH_IMAGE018
To
Figure 904621DEST_PATH_IMAGE019
Is determined by the average value of (a) of (b),
Figure 331055DEST_PATH_IMAGE020
is composed of
Figure 255017DEST_PATH_IMAGE021
To
Figure 716085DEST_PATH_IMAGE022
Is determined by the average value of (a) of (b),
Figure 801722DEST_PATH_IMAGE023
is composed of
Figure 840085DEST_PATH_IMAGE024
To
Figure 52892DEST_PATH_IMAGE025
Is determined by the average value of (a) of (b),
Figure 352155DEST_PATH_IMAGE026
is composed of
Figure 625004DEST_PATH_IMAGE027
To
Figure 885084DEST_PATH_IMAGE028
Is determined by the average value of (a) of (b),
Figure 153779DEST_PATH_IMAGE029
is composed of
Figure 58281DEST_PATH_IMAGE030
To
Figure 751300DEST_PATH_IMAGE031
Is determined by the average value of (a) of (b),
Figure 498676DEST_PATH_IMAGE032
is composed of
Figure 53285DEST_PATH_IMAGE033
To
Figure 327141DEST_PATH_IMAGE034
Is determined by the average value of (a) of (b),
Figure 941793DEST_PATH_IMAGE035
is composed of
Figure 176465DEST_PATH_IMAGE036
To
Figure 784033DEST_PATH_IMAGE037
Is determined by the average value of (a) of (b),
Figure 663127DEST_PATH_IMAGE038
is composed of
Figure 695018DEST_PATH_IMAGE039
To
Figure 416987DEST_PATH_IMAGE040
Is determined by the average value of (a) of (b),
Figure 313398DEST_PATH_IMAGE041
is composed of
Figure 561846DEST_PATH_IMAGE042
To
Figure 252721DEST_PATH_IMAGE043
Average value of (a).
5. The optical device avalanche voltage testing system according to claim 3, wherein the parameter setting module and the analysis module are integrated in a testing computer, the power-up unit and the feedback unit are integrated in a testing circuit board, and the testing circuit board is connected with the testing computer through a serial port.
6. A method for testing avalanche voltage of an optical device is characterized by comprising the following steps:
step 1, gradually powering up the optical device by a set power-up step, and acquiring a dark current value corresponding to each power-up voltage;
step 2, removing bad data in the acquired dark current value data, taking the residual data as output, taking the power-on voltage corresponding to each dark current value as input, fitting a multiple function curve, and analyzing a function expression of the multiple function curve;
and 3, calculating the energizing voltage at the dark current specified value according to the function expression, wherein the energizing voltage is the avalanche voltage.
7. The method as claimed in claim 6, wherein the step-up is performed to 85% of the dark current threshold during the test.
8. The method as claimed in claim 6, wherein the step of removing the dead pixel data in the collected dark current value data in step 2 comprises:
derivation
Figure 461986DEST_PATH_IMAGE001
Removing of
Figure 145777DEST_PATH_IMAGE002
The data of (a);
for removing
Figure 999463DEST_PATH_IMAGE002
Later data is subjected to second derivative calculation
Figure 641666DEST_PATH_IMAGE003
Removing data having an absolute value of the second derivative greater than a set value, wherein i is an integer greater than 1,x i is a firstiThe power-up voltage of the next power-up,y i is composed ofx i Corresponding dark current.
9. The method as claimed in claim 8, wherein the step 2 of fitting a multi-function curve with the residual data as output and the applied voltage corresponding to each dark current value as input and analyzing the function expression of the multi-function curve comprises:
using the residual data as output, using the power-on voltage corresponding to each dark current value as input, fitting a cubic function curve by adopting a least square method,
Figure 807068DEST_PATH_IMAGE044
，
Figure 45283DEST_PATH_IMAGE045
in order to apply the voltage to the battery,
Figure 536832DEST_PATH_IMAGE046
to collect the resulting corresponding dark current values,
Figure 694143DEST_PATH_IMAGE047
、
Figure 487787DEST_PATH_IMAGE048
、
Figure 778960DEST_PATH_IMAGE049
、
Figure 607239DEST_PATH_IMAGE050
are respectively constant coefficients;
solving cubic function curve based on minimum error accumulationa、b、c、dA value of (a), i.e.
Figure 201031DEST_PATH_IMAGE051
，
Solve the above formulaa、b、c、dThe partial derivative of (c) can be given by:
Figure 731238DEST_PATH_IMAGE012
solved out based on the partial derivative formulaa、b、c、dAnd then determining a functional expression of a cubic function curve, where n is the number of applied voltages,
Figure 311255DEST_PATH_IMAGE052
is composed of
Figure 243308DEST_PATH_IMAGE053
The expected value of (c) is,
Figure 8002DEST_PATH_IMAGE054
is composed of
Figure 776238DEST_PATH_IMAGE055
To
Figure 671863DEST_PATH_IMAGE053
Is determined by the average value of (a),
Figure 209155DEST_PATH_IMAGE056
is composed of
Figure 269383DEST_PATH_IMAGE057
To
Figure 790495DEST_PATH_IMAGE058
Is determined by the average value of (a) of (b),
Figure 102527DEST_PATH_IMAGE020
is composed of
Figure 743593DEST_PATH_IMAGE021
To
Figure 725455DEST_PATH_IMAGE022
Is determined by the average value of (a) of (b),
Figure 717551DEST_PATH_IMAGE023
is composed of
Figure 567695DEST_PATH_IMAGE024
To
Figure 79579DEST_PATH_IMAGE025
Is determined by the average value of (a) of (b),
Figure 484540DEST_PATH_IMAGE026
is composed of
Figure 714665DEST_PATH_IMAGE027
To
Figure 102921DEST_PATH_IMAGE028
Is determined by the average value of (a) of (b),
Figure 718579DEST_PATH_IMAGE029
is composed of
Figure 307823DEST_PATH_IMAGE030
To
Figure 8931DEST_PATH_IMAGE031
Is determined by the average value of (a) of (b),
Figure 935299DEST_PATH_IMAGE032
is composed of
Figure 421775DEST_PATH_IMAGE033
To
Figure 165609DEST_PATH_IMAGE034
Is determined by the average value of (a) of (b),
Figure 229380DEST_PATH_IMAGE059
is composed of
Figure 100384DEST_PATH_IMAGE060
To
Figure 687705DEST_PATH_IMAGE061
Is determined by the average value of (a) of (b),
Figure 353172DEST_PATH_IMAGE038
is composed of
Figure 904239DEST_PATH_IMAGE039
To
Figure 297044DEST_PATH_IMAGE040
Is determined by the average value of (a) of (b),
Figure 758112DEST_PATH_IMAGE041
is composed of
Figure 109328DEST_PATH_IMAGE042
To
Figure 147691DEST_PATH_IMAGE043
Average value of (a).
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