CN114829902A

CN114829902A - Atomic absorption spectrophotometer

Info

Publication number: CN114829902A
Application number: CN201980102983.0A
Authority: CN
Inventors: 太田黑敦彦; 小林央祐
Original assignee: Shimadzu Corp
Current assignee: Shimadzu Corp
Priority date: 2019-12-19
Filing date: 2019-12-19
Publication date: 2022-07-29
Also published as: TWI788691B; TW202124939A; JP7331945B2; JPWO2021124513A1; WO2021124513A1

Abstract

An atomic absorption spectrophotometer (100), comprising: an atomization part (2), a nozzle (40), a nozzle moving mechanism (41), a position adjusting mechanism (10), at least one image pickup part (12) and a display (16). The atomization part (2) comprises: a furnace (21) in which a hole (22) for sample injection is formed is heated to atomize the sample injected into the furnace. The nozzle (40) sucks and ejects a sample. The nozzle moving mechanism (41) moves the nozzle (40) to a position directly above the hole (22). The position adjustment mechanism (10) is configured to: the relative position of the tip of the nozzle (40) with respect to the hole (22) can be adjusted by moving the nozzle moving mechanism (40). At least one imaging unit (12) is arranged so that the tip of the nozzle (40) and the hole (22) are included in the imaging field of view in a state in which the tip of the nozzle (40) is positioned directly above the hole (22). A display (16) displays a captured image obtained by at least one imaging unit (12).

Description

Atomic absorption spectrophotometer

Technical Field

The invention relates to an atomic absorption spectrophotometer.

Background

Japanese patent laid-open No. Sho 61-190856 (patent document 1) discloses: an automatic sample injection device used in a furnace-type atomic absorption spectrophotometer. The automatic sample injection device described in patent document 1 includes: and an injection mechanism. The injection mechanism is composed of: a liquid sample is injected into a cylindrical graphite tube by passing through a small-diameter hole (sample injection hole) formed in a side surface of the tube. Specifically, the arm of the injection mechanism holds the nozzle at the tip and is fixed to the arm rotation shaft. The injection mechanism moves the nozzle from a position directly above the container containing the sample to a position directly above the hole by the rotational movement of the arm rotation shaft, and then stops the rotation of the arm. Then, the injection mechanism lowers the arm to insert the tip of the nozzle into the hole, and injects the sample from the nozzle into the tube.

[ Prior art documents ]

[ patent document ]

Patent document 1: japanese patent laid-open No. 61-190856

Disclosure of Invention

[ problems to be solved by the invention ]

However, in order to inject a sample into the graphite tube using the automatic sample injection device, it is necessary to adjust the relative position of the nozzle with respect to the hole of the graphite tube in advance so that the nozzle is moved to a position directly above the hole by the rotation of the arm.

In the prior art, this position adjustment is performed by allowing a user to visually confirm the position of the hole and horizontally move the injection mechanism so that the tip of the nozzle is positioned directly above the hole.

However, since the diameter of the hole is as small as about 1mm to 2mm, it takes time and effort to visually confirm the position of the hole by a user, and as a result, the position adjustment of the nozzle is not necessarily easy. Therefore, the preparation of the analysis requires a long time, and the efficiency of the analysis operation is reduced. In addition, in the position adjustment by the user's visual observation, there is a case where a deviation from the position immediately above the hole remains, and the accuracy of the position adjustment may be unstable.

The present invention has been made to solve the above-described problems, and an object of the present invention is to facilitate the position adjustment of a nozzle and to improve the accuracy of the position adjustment in an atomic absorption spectrophotometer.

[ means for solving problems ]

An atomic absorption spectrophotometer according to a first aspect of the present invention includes: an atomization part, a nozzle moving mechanism, a position adjusting mechanism, at least one image pick-up part and a display. The atomization portion includes: the furnace in which the hole for sample injection is formed is heated to atomize the sample injected into the furnace. The nozzle sucks and ejects a sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjusting mechanism is composed of: the relative position of the tip of the nozzle with respect to the hole can be adjusted by moving the nozzle moving mechanism. At least one imaging unit is disposed so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is positioned directly above the hole. The display displays a captured image obtained by at least one imaging unit.

[ Effect of the invention ]

According to the present invention, in an atomic absorption spectrophotometer, the position of a nozzle can be easily adjusted, and the accuracy of the position adjustment can be improved.

Drawings

Fig. 1 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to embodiment 1.

FIG. 2 is a schematic diagram showing a configuration example of the atomization unit and the auto sampler shown in FIG. 1.

FIG. 3 is a schematic diagram showing a configuration example of the atomization unit and the auto sampler shown in FIG. 1.

Fig. 4 is a flowchart for explaining a processing procedure of the nozzle position adjustment by the controller.

Fig. 5 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to embodiment 2.

Fig. 6 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to embodiment 3.

Fig. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to embodiment 4.

Detailed Description

Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. In the drawings, the same or corresponding portions are denoted by the same reference numerals, and description thereof will not be repeated in principle.

[ embodiment 1]

Fig. 1 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to embodiment 1. The atomic absorption spectrophotometer 100 according to embodiment 1 is a furnace-type atomic absorption spectrophotometer. In a furnace-type atomic absorption spectrophotometer, a sample is accommodated in a graphite tube, and the tube is heated to heat and atomize the sample. The absorbance is measured by passing light through atomic vapor (atomic vapor).

Referring to fig. 1, an atomic absorption spectrophotometer 100 includes: a light source 1, an atomization unit 2, a spectroscope 3, an auto sampler 4, a detector 5, a heater 6, an actuator 8, a position adjustment mechanism 10, an imaging unit 12, and a controller 15.

The light source 1 includes: a lamp emitting light of a wavelength intrinsic to the element. The lamp is for example a hollow cathode lamp. Hollow cathode lamps emit light comprising the bright line spectrum.

The atomization portion 2 includes: the cylindrical graphite tube 21 is configured to heat and atomize the liquid sample injected into the graphite tube 21. The graphite tube 21 corresponds to an embodiment of the "furnace". A hole 22 (sample injection hole) for injecting a sample is formed in a side surface of the graphite tube 21. The hole 22 has a circular shape with a diameter of about 1mm to 2 mm.

The automatic sampler 4 is configured to automatically perform the following operations: the sample is sucked from a sample container (not shown) containing the sample by the nozzle 40, and the sample is injected into the hole 22 of the graphite tube 21 of the atomization portion 2. Specifically, the auto sampler 4 includes: a cylindrical nozzle 40 and a nozzle moving mechanism 41. The nozzle 40 is connected to a tip portion of a sampling flow path, not shown, and sucks and discharges a liquid. The sampling flow path is formed, for example, by a flexible tube, and a syringe pump for causing a pumping action is connected to the side opposite to the nozzle 40. By this operation of the syringe pump, the liquid can be sucked and discharged by the nozzle 40.

The nozzle moving mechanism 41 includes: an arm 42, a rotary shaft 43, and a motor 44. The arm 42 supports the nozzle 40. The arm 42 is constituted such that: is rotated about the rotary shaft 43 by the motor 44 and is lifted and lowered along the rotary shaft 43. The driver 8 is connected to the motor 44, and drives the motor 44 in accordance with a control command from the controller 15. The nozzle 40 is movable between a position directly above the sample container, not shown, and a position directly above the hole 22 of the graphite tube 21 by rotation of the arm 42 by the motor 44.

The position adjustment mechanism 10 is configured to: the relative position of the nozzle 40 and the graphite tube 21 can be adjusted by moving the nozzle moving mechanism 41 (the arm 42, the rotary shaft 43, and the motor 44). The position adjustment mechanism 10 includes, for example, an XY stage, and can move the nozzle movement mechanism 41 to two axes (X axis and Y axis) parallel to the optical axis of the light source 1.

The heater 6 heats the graphite tube 21 by passing an electric current through the graphite tube 21. The sample in graphite tube 21 is heated, and the elements in the sample are atomized.

The spectroscope 3 includes: entrance slit 31, exit slit 32, mirror 33, mirror 34, and diffraction grating 35. As shown in fig. 1, light emitted from the light source 1 passes through the graphite tube 21 and is guided to the spectroscope 3. The light introduced into the spectroscope 3 passes through the slit opening of the entrance slit 31, and enters the diffraction grating 35 via the mirror 33. By rotation of the diffraction grating 35, light of a specific wavelength selectively passes in the slit opening of the exit slit 32 via the mirror 34. The light of a specific wavelength passing in the exit slit 32 reaches the detector 5. When receiving light of a specific wavelength from the spectroscope 3, the detector 5 outputs an electric signal according to the received light intensity to the controller 15.

Although not shown, appropriate condensing optical systems are disposed between the light source 1 and the atomization portion 2 and between the atomization portion 2 and the spectroscope 3, respectively, and the light is appropriately condensed and introduced into the next stage.

The controller 15 controls the entirety of the atomic absorption spectrophotometer 100. The controller 15 includes: a processor 150, a memory 152, an input/output interface (I/F)154, and a communication interface (I/F)156 are main constituent elements. These units are connected so as to be able to communicate with each other via a bus not shown.

The processor 150 is typically an arithmetic Processing Unit such as a Central Processing Unit (CPU) or a Micro Processing Unit (MPU). The processor 150 reads and executes the program stored in the memory 152 to control the operation of each part of the atomic absorption spectrophotometer 100. Specifically, the processor 150 executes the program to realize each process of the atomic absorption spectrophotometer 100 described later. In the example of fig. 1, although a single processor is illustrated, the controller 15 may be configured to include a plurality of processors.

The Memory 152 is implemented by a nonvolatile Memory such as a Random Access Memory (RAM), a Read Only Memory (ROM), and a flash Memory (flash Memory). The memory 152 stores a program executed by the processor 150, data used by the processor 150, and the like.

The input/output I/F154 is: an interface for exchanging various data between the processor 150 and each of the light source 1, the detector 5, the heater 6, the driver 8, and the position adjusting mechanism 10.

The communication I/F156 is: an interface for exchanging various data between the atomic absorption spectrophotometer 100 and other devices is realized by an adapter, a connector, or the like. The communication method may be a wireless communication method such as a Local Area Network (LAN) or a wired communication method using a Universal Serial Bus (USB).

The controller 15 is connected to a display 16 and an operation unit 18. The display 16 includes a liquid crystal panel or the like. The operation unit 18 receives an operation input from the user to the atomic absorption spectrophotometer 100. The operation unit 18 typically includes: touch screen, keyboard, mouse, etc.

In the atomic absorption spectrophotometer 100, in quantitative analysis of a sample, the automatic sampler 4 injects the sample into the graphite tube 21, and then the current is passed from the heater 6 to the graphite tube 21, thereby heating the graphite tube 21 to a high temperature (for example, about 3000 ℃). Thereby, the sample is dried and ashed in the graphite tube 21, and further, elements in the sample are atomized. When light emitted from the light source 1 passes through the graphite tube 21, light having a wavelength specific to an element contained in the sample is strongly absorbed. The light passing through the graphite tube 21 is subjected to wavelength dispersion by the spectroscope 3, and light having a wavelength specific to the target element is selectively introduced into the detector 5. The controller 15 can calculate the absorbance from the difference in the light receiving intensities of the detector 5 caused by the presence or absence of the sample, and can quantitatively analyze the sample based on the calculated absorbance.

In the atomic absorption spectrophotometer 100, the position of the nozzle 40 of the auto-sampler 4 with respect to the hole 22 (sample injection hole) of the graphite tube 21 is adjusted before the actual analysis of the sample. This position adjustment is performed before the analysis of the sample when the nozzle 40 and/or graphite tube 21 has been replaced. The position adjustment of the nozzle 40 will be described below.

Fig. 2 and 3 are schematic diagrams showing a configuration example of the atomization unit 2 and the auto sampler 4 shown in fig. 1. Fig. 2 schematically shows a cross section of the atomization portion 2. Fig. 3 shows a schematic plan configuration of the auto-sampler 4.

Referring to fig. 2, the atomization portion 2 includes: graphite tube 21, electrode 23, electrode 24, and window plate 26. The

electrodes

23 and 24 hold both ends of the cylindrical graphite tube 21. The window plates 26 are made of a transparent quartz plate, and are provided at both ends in the optical axis direction with the graphite tube 21 interposed therebetween.

A hole 25 having a circular shape is formed in the electrode 23 located on the upper side surface of the graphite tube 21. The hole 25 is disposed at a position overlapping the hole 22 formed in the graphite tube 21. The diameter of the hole 25 is equal to or larger than the diameter of the hole 22. Further, the

holes

22 and 25 have a diameter larger than the outer diameter of the nozzle 40 in order to allow the nozzle 40 to be inserted into the graphite tube 21.

Referring to fig. 3, the automatic sampler 4 includes not only the nozzle moving mechanism 41 (the arm 42, the rotary shaft 43, and the motor 44) but also the turntable 9. The turntable 9 includes a platform 92 of circular shape, and a motor 90 to rotate the platform 92. On the stage 92, there are mounted:

containers

94a, 94b, 94c, … and the like including sample containers in which liquid samples are stored. Further, in the container class, there are included: an empty container, a container containing a standard solution for manufacturing a calibration curve (calibration curve), a container containing a dilution series, and the like.

By rotating the platform 92 with the motor 90, the selected container is moved to the working position P. By rotating the arm 42 by the motor 44 and moving the nozzle 40 to the working position P, the liquid can be sucked and discharged by the nozzle 40 to the container moved to the working position P.

In quantitative analysis of a sample, the nozzle 40 is moved to the working position P to suck the sample from the sample container, and then the nozzle 40 is moved to a position directly above the hole 22 of the graphite tube 21 by rotation of the arm 42. At this position, the nozzle 40 is lowered, the tip of the nozzle 40 is inserted into the hole 22, and the sample is discharged from the nozzle 40. After the sample is discharged, the nozzle 40 is returned to the working position P by the rotation of the arm 42 again. Thus, a sample is injected into the graphite tube 21, and atomic absorption analysis is performed.

When a plurality of samples are analyzed successively, the same operation is repeated for the next sample container. Further, immediately before the continuous analysis, during the continuous analysis, or immediately after the continuous analysis is completed, a step of washing the nozzle 40 with a washing liquid can be performed.

In order to inject a sample using the automatic sampler 4, the relative position of the nozzle 40 with respect to the hole 22 needs to be adjusted in advance so that the nozzle 40 is moved to a position directly above the hole 22 of the graphite tube 21 by the rotation of the arm 42. In the position adjustment, the user visually confirms the position of the hole 22 of the graphite tube 21, and the position adjustment mechanism 10 is operated so that the tip of the nozzle 40 is positioned directly above the hole 22, and the nozzle moving mechanism 41 is moved in the two-axis (X-axis, Y-axis) direction parallel to the optical axis.

However, since the diameter of the hole 22 is as small as about 1mm to 2mm, it takes time and effort to capture the position of the hole 22 by the user's visual observation, and as a result, the position adjustment of the nozzle 40 is not necessarily easy work. Thus, there are: the preparation of the analysis requires a long time, and the efficiency of the analysis operation is reduced. Further, there are position adjustments by visual observation of a user, which are: if the deviation of the position directly above hole 22 remains, the accuracy of the position adjustment may become unstable.

Therefore, the atomic absorption spectrophotometer 100 of embodiment 1 includes: the imaging unit 12 is configured to detect the relative position of the nozzle 40 with respect to the hole 22. The imaging unit 12 is provided so as to include the tip of the nozzle 40 in the imaging range (imaging field). Specifically, the imaging unit 12 is provided so that the focus position thereof is located at the tip of the nozzle 40. As shown in fig. 2, the imaging unit 12 is disposed so that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is positioned directly above the hole 22.

Here, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22, it is desirable that the imaging unit 12 be disposed as close as possible to the position directly above the hole 22. Therefore, the imaging unit 12 is disposed close to a position directly above the tip of the nozzle 40. In the example of fig. 2, the imaging unit 12 is mounted on a portion of the arm 42 located immediately above the tip of the nozzle 40. Thus, the imaging unit 12 can be disposed close to the position directly above the hole 22 in a state where the tip of the nozzle 40 is positioned directly above the hole 22.

The imaging unit 12 includes: an optical system such as a lens, and an imaging element. The image sensor is realized by, for example, a Charge Coupled Device (CCD) sensor, a Complementary Metal Oxide Semiconductor (CMOS) sensor, or the like. The imaging element generates an imaged image by converting light incident through the optical system into an electric signal. The imaging unit 12 generates image data by imaging the tip of the nozzle 40, and transmits the generated image data to the controller 15.

Upon receiving the image data from the imaging unit 12, the controller 15 displays the captured image on the display 16. Thus, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the display 16. Therefore, the user can move the nozzle moving mechanism 41 so that the tip of the nozzle 40 is positioned directly above the hole 22 by operating the position adjustment mechanism 10 while checking the relative position of the tip of the nozzle 40 with respect to the hole 22. This makes it easier to perform the position adjustment operation of the nozzle 40 than the position adjustment operation by visual observation in the related art. As a result, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle 40 can be improved.

Further, the controller 15 may be configured as follows: the position adjustment of the nozzle 40 is automatically performed by using a well-known image processing technique. Specifically, when the image data is acquired from the imaging unit 12, the controller 15 selects the tip of the nozzle 40 and the hole 22 from the image data by using an image processing technique, thereby acquiring the positional relationship between the tip of the nozzle 40 and the hole 22. The controller 15 operates the position adjustment mechanism 10 so that the tip end of the nozzle 40 is positioned at a preset reference position. This reference position can be set based on the relative position of the tip of the nozzle 40 and the hole 22 in a state where the nozzle 40 is positioned directly above the hole 22. This eliminates the need for a position adjustment operation by the user, and therefore, the analysis efficiency can be further improved.

Fig. 4 is a flowchart for explaining a processing procedure of the position adjustment of the nozzle 40 by the controller 15.

Referring to fig. 4, first, in step S01, the controller 15 rotates the arm 42 of the nozzle moving mechanism 41 to set the nozzle 40 above the hole 22 of the graphite tube 21.

Next, in step S02, the controller 15 uses the imaging unit 12 to image the tip of the nozzle 40. In step S03, the controller 15 performs known image processing on the image data captured by the imaging unit 12 to select the tip of the nozzle 40 and the hole 22. The controller 15 detects the relative position of the tip of the nozzle 40 with respect to the hole portion 22 based on the selection result.

In step S04, the controller 15 calculates the amount of displacement of the position of the tip of the nozzle 40 from the reference position based on the detected relative position of the hole 22 and the tip of the nozzle 40.

The controller 15 proceeds to step S05, and operates the position adjustment mechanism 10 to adjust the relative position of the nozzle 40 with respect to the hole 22 based on the offset amount calculated in step S04. The position adjustment mechanism 10 moves the nozzle moving mechanism 41 in a direction in which the offset amount decreases. When the offset amount becomes equal to or less than the predetermined value by the adjustment in step S05, the controller 15 fixes the nozzle 40 at the position in accordance with step S06, and ends the position adjustment.

As described above, according to the atomic absorption spectrophotometer 100 of embodiment 1, the relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 can be detected by the imaging unit 12 that images the tip of the nozzle 40, and therefore, the relative position of the nozzle 40 with respect to the hole 22 can be easily adjusted. This can improve the efficiency of the analysis work and the accuracy of the position adjustment of the nozzle 40.

Further, in embodiment 1, when the nozzle 40 is moved to the working position P by mounting the imaging unit 12 on the arm 42 and rotating the arm 42, the imaging unit 12 is also moved away from the graphite tube 21 toward the turntable 9 together with the nozzle 40. That is, the nozzle moving mechanism 41 may function as a moving mechanism of the imaging unit 12.

When the imaging unit 12 is provided in the vicinity of the position directly above the hole 22, if the graphite tube 21 is heated to a high temperature, the imaging unit 12 may be overheated and damaged. Therefore, when the position adjustment of the nozzle 40 is completed, a moving mechanism for moving the imaging unit 12 away from the graphite tube 21 is necessary. In the atomic absorption spectrophotometer 100 according to embodiment 1, the nozzle moving mechanism 41 is used in common with the moving mechanism of the imaging unit 12, and thus, if the nozzle 40 is spaced apart from the graphite tube 21 as described above, the distance between the imaging unit 12 and the graphite tube 21 can be increased. Therefore, a moving mechanism of the imaging unit 12 is not required. This makes it possible to retract the imaging unit 12 from the graphite tube 21, which has been heated during the analysis of the sample, with a simple configuration, thereby protecting the imaging unit 12 from overheating.

In embodiment 1, the imaging unit 12 is mounted on the arm 42, and the imaging unit 12 is moved by the rotation of the arm 42, and the atomic absorption spectrophotometer 100 may be configured to separately include a moving mechanism of the imaging unit 12. In this case, the moving mechanism of the imaging unit 12 is configured to: the imaging unit 12 can be moved between a first position close to a position directly above the hole 22 and including the tip of the nozzle 40 and the hole 22 in the imaging field of view, and a second position distant from the graphite tube 21 from the first position.

[ embodiment 2]

In embodiment 1, the configuration in which the imaging unit 12 that images the tip of the nozzle 40 is mounted on the arm 42 has been described as an example. In embodiment 2, a configuration in which the imaging unit 12 is used in combination with a mirror to image the tip of the nozzle 40 will be described.

Fig. 5 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to embodiment 2. Fig. 5 schematically shows an example of the structure of the atomization unit 2 and the auto sampler 4.

The atomic absorption spectrophotometer 100 of embodiment 2 is different from the atomic absorption spectrophotometer 100 of embodiment 1 in that it further includes: a mirror 14. The other structures are the same as those in embodiment 1, and therefore, description thereof will not be repeated.

Referring to fig. 5, an atomic absorption spectrophotometer 100 of embodiment 2 includes: the mirror 14 and the imaging unit 12 are configured to detect the relative position of the nozzle 40 with respect to the hole 22. The reflector 14 is disposed at a position where an image including the tip of the nozzle 40 can be reflected. As shown in fig. 5, the mirror 14 is disposed so that the tip of the nozzle 40 and the hole 22 are included in the reflected image in a state where the nozzle 40 is positioned directly above the hole 22.

The reflector 14 is disposed near a position directly above the tip of the nozzle 40. In the example of fig. 5, the mirror 14 is mounted on a portion of the arm 42 located immediately above the tip of the nozzle 40. Thus, the mirror 14 can be disposed close to the position directly above the hole 22 in a state where the tip of the nozzle 40 is positioned directly above the hole 22.

The imaging unit 12 is provided at a position where a reflected image of the tip of the nozzle 40 obtained by the mirror 14 can be obtained. As shown in fig. 5, when the nozzle 40 is moved to a position directly above the hole 22, a reflected image including the tip of the nozzle 40 and the hole 22 is formed on the mirror 14. The imaging unit 12 can detect the relative position of the nozzle 40 with respect to the hole 22 by acquiring the reflected image of the mirror 14.

The imaging unit 12 generates image data of the tip of the nozzle 40 based on the reflected image, and transmits the generated image data to the controller 15. The controller 15 displays the captured image obtained by the imaging unit 12 on the display 16. Thus, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the display 16. Therefore, similarly to embodiment 1, the user can move the nozzle moving mechanism 41 so that the tip of the nozzle 40 is positioned directly above the hole 22 by operating the position adjustment mechanism 10 while checking the relative position of the tip of the nozzle 40 with respect to the hole 22.

Alternatively, the controller 15 may acquire the relative position between the tip of the nozzle 40 and the hole 22 by performing known image processing on the image data acquired by the imaging unit 12. Therefore, the controller 15 can automatically adjust the position of the tip of the nozzle 40 with respect to the hole 22 based on the obtained relative position.

As described above, according to the atomic absorption spectrophotometer 100 of embodiment 2, since the imaging unit 12 can image the tip of the nozzle 40 by the mirror 14, the user can detect the relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 from the image obtained by the imaging unit 12. Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of embodiment 1 can be obtained.

Further, according to the atomic absorption spectrophotometer 100 of embodiment 2, the imaging unit 12 can be provided away from the graphite tube 21 by configuring the imaging unit 12 to acquire the reflected image of the tip of the nozzle 40 obtained by the mirror 14. Therefore, the imaging unit 12 can be provided at a greater distance from the graphite tube 21 that has reached a high temperature during sample analysis, and therefore the imaging unit 12 can be protected from overheating.

[ embodiment 3]

In embodiment 1, the configuration in which the tip of the nozzle 40 is imaged using one imaging unit 12 has been described, but a configuration in which the tip of the nozzle 40 is imaged from a plurality of directions using a plurality of imaging units 12 may be employed.

Fig. 6 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to embodiment 3. Fig. 6 schematically shows an example of the structure of the atomization unit 2 and the auto sampler 4.

The atomic absorption spectrophotometer 100 of embodiment 3 is different from the atomic absorption spectrophotometer 100 of embodiment 1 in that it includes: a plurality of

imaging units

12A and 12B. The other structures are the same as those in embodiment 1, and therefore, description thereof will not be repeated. The configurations of the imaging unit 12A and the imaging unit 12B are the same as those of the imaging unit 12, and therefore, a description thereof will not be repeated.

Referring to fig. 6, the imaging unit 12A and the imaging unit 12B are arranged so as to include the tip of the nozzle 40 in the imaging field of view. The imaging unit 12A and the imaging unit 12B are arranged so that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is positioned directly above the hole 22.

However, the imaging unit 12A and the imaging unit 12B are arranged such that: the front ends of the nozzles 40 are imaged at different angles from each other. In the example of fig. 6, the imaging unit 12A and the imaging unit 12B are disposed at positions to be targeted around the nozzle 40. The imaging unit 12A and the imaging unit 12B are both mounted on the arm 42.

The imaging unit 12A and the imaging unit 12B each image the tip of the nozzle 40 to generate image data, and transmit the generated image data to the controller 15. Upon receiving the image data from the imaging unit 12A and the imaging unit 12B, the controller 15 displays two captured images on the display 16.

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16. Since the two captured images capture the tip of the nozzle 40 from different angles, the relative position of the tip of the nozzle 40 with respect to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two relative positions obtained from the two captured images, respectively.

As described in embodiment 1, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22, it is desirable to dispose the imaging unit 12 close to the position directly above the hole 22, but there is a case where it is difficult to bring the imaging unit 12 close to the position directly above the hole 22 due to restrictions on the disposition of the imaging unit 12. In this case, as shown in fig. 6, by providing a plurality of

imaging units

12A and 12B and imaging the tip of the nozzle 40 at different angles from each other, the relative position of the tip of the nozzle 40 with respect to the hole 22 can be detected from a plurality of directions, and the relative position of the tip of the nozzle 40 with respect to the hole 22 can be obtained based on a value derived from a plurality of detection results. For example, the controller 15 can generate an image obtained by imaging the tip of the nozzle 40 from a position directly above the hole 22 by synthesizing a plurality of captured images obtained by the plurality of

imaging units

12A and 12B using a known image processing technique. Thus, the user can detect the relative position of the tip of the nozzle 40 with respect to the hole 22 from the composite image displayed on the display 16. Therefore, in embodiment 3 as well, the user can move the nozzle moving mechanism 41 so that the tip of the nozzle 40 is positioned directly above the hole 22 by operating the position adjustment mechanism 10 while checking the relative position of the tip of the nozzle 40 with respect to the hole 22, as in embodiment 1.

The controller 15 may be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, when the image data is acquired from each of the imaging unit 12A and the imaging unit 12A, the controller 15 combines the two types of image data to generate an image of the tip of the nozzle 40 and the hole 22 as viewed from a position directly above the hole 22. The controller 15 obtains the relative position of the tip of the nozzle 40 and the hole 22 based on the generated image, and operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is located at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of embodiment 3, the relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 can be detected based on the captured images obtained by the plurality of

imaging units

12A and 12B that capture the tip of the nozzle 40. Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of embodiment 1 is exhibited.

In addition, according to the atomic absorption spectrophotometer 100 of embodiment 3, since the moving mechanism of the plurality of

imaging units

12A and 12B is shared with the nozzle moving mechanism 41, if the nozzle 40 is made to be distant from the graphite tube 21, the distance between the imaging unit 12A, the imaging unit 12B, and the graphite tube 21 can be increased. This makes it possible to retract imaging unit 12A and imaging unit 12B from graphite tube 21, which has a high temperature during analysis of a sample, with a simple configuration, thereby protecting imaging unit 12A and imaging unit 12B from overheating.

In embodiment 3, the imaging unit 12A and the imaging unit 12B are mounted on the arm 42, and the imaging unit 12A and the imaging unit 12B are moved by the rotation of the arm 42, but the atomic absorption spectrophotometer 100 may be configured to include a moving mechanism for the imaging unit 12A and the imaging unit 12B separately. In this case, the moving mechanism of the imaging unit 12A and the imaging unit 12B is configured to: the

imaging units

12A and 12B can be moved between a first position close to the hole 22 and capable of including the tip of the nozzle 40 in the imaging field of view and a second position further from the graphite tube 21 than the first position.

Furthermore, according to the atomic absorption spectrophotometer 100 of embodiment 3, by combining a plurality of captured images and generating an image of the hole 22 and the tip of the nozzle 40 viewed from the position directly above the hole 22, the relative position of the tip of the nozzle 40 with respect to the hole 22 can be detected even when the arrangement of the captured images is restricted.

In the example of fig. 6, the configuration in which two

image pickup units

12A and 12B are provided has been described, but the number of image pickup units is not limited to this, and three or more image pickup units may be provided.

[ embodiment 4]

Fig. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to embodiment 4. Fig. 7 schematically shows an example of the structure of the atomization unit 2 and the auto sampler 4.

The atomic absorption spectrophotometer 100 of embodiment 4 is different from the atomic absorption spectrophotometer 100 of embodiment 1 in that it includes: a plurality of

image pickup units

12A and 12B and a plurality of

mirrors

14A and 14B. The other structures are the same as those in embodiment 1, and therefore, description thereof will not be repeated. The configurations of the imaging unit 12A and the imaging unit 12B are the same as those of the imaging unit 12, and therefore, a description thereof will not be repeated.

Referring to fig. 7, an atomic absorption spectrophotometer 100 of embodiment 4 includes: the mirror 14A, the mirror 14B, the imaging unit 12A, and the imaging unit 12B are configured to detect a positional relationship of the nozzle 40 with respect to the hole 22. The

mirrors

14A and 14B are provided at positions where images including the front end of the nozzle 40 can be reflected. As shown in fig. 7, the mirror 14A and the mirror 14B are arranged so that the tip of the nozzle 40 and the hole 22 are included in an image in a state where the nozzle 40 is positioned directly above the hole 22. However, the

mirrors

14A and 14B are arranged to reflect the image including the tip of the nozzle 40 at different angles from each other. In the example of fig. 7, both the mirror 14A and the mirror 14B are mounted on the arm 42.

The imaging unit 12A is provided at a position where an image reflected by the mirror 14A can be acquired. The imaging unit 12B is provided at a position where an image reflected by the mirror 14B can be acquired. As shown in fig. 7, when the nozzle 40 is moved to a position directly above the hole 22, the mirror 14A and the mirror 14B form images including the tip of the nozzle 40 and the hole 22, respectively. The imaging unit 12A can detect the positional relationship of the nozzle 40 with respect to the hole 22 by acquiring the image reflected by the mirror 14A. The imaging unit 12B can detect the positional relationship of the nozzle 40 with respect to the hole 22 by acquiring an image reflected by the mirror 14B.

The

imaging units

12A and 12B image the tip of the nozzle 40 to generate image data, and send the generated image data to the controller 15. Upon receiving the image data from the imaging unit 12A and the imaging unit 12B, the controller 15 displays two captured images on the display 16.

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16. Since the two captured images capture the tip of the nozzle 40 from different angles, the positional relationship of the tip of the nozzle 40 with respect to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two positional relationships obtained from the two captured images, respectively.

When it is difficult to bring the imaging unit 12 close to the position directly above the hole 22, the positional relationship of the tip of the nozzle 40 with respect to the hole 22 can be detected from a plurality of directions by using a configuration in which the tip of the nozzle 40 is imaged from different angles by using the plurality of

mirrors

14A and 14B and the plurality of

imaging units

12A and 12B in combination, and the positional relationship of the tip of the nozzle 40 with respect to the hole 22 can be obtained based on a value (for example, an average value) calculated from a plurality of detection results. Therefore, in embodiment 4 as well, similarly to embodiment 1, the user can move the nozzle moving mechanism 41 so that the nozzle 40 is positioned directly above the hole 22 by operating the position adjusting mechanism 10 while checking the positional relationship of the tip of the nozzle 40 with respect to the hole 22.

The controller 15 may be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, when the controller 15 acquires image data from each of the imaging unit 12A and the imaging unit 12A, the tip and the hole 22 of the nozzle 40 are selected for each image data by using an image processing technique. The controller 15 obtains the positional relationship between the tip of the nozzle 40 and the hole 22 based on the plurality of selection results, and operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is located at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of embodiment 4, the relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 can be detected based on the picked-up images obtained by the plurality of image pickup units that pick up the tip of the nozzle 40. Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of embodiment 1 is exhibited.

Further, according to the atomic absorption spectrophotometer 100 of embodiment 4, the plurality of

imaging units

12A and 12B can be provided apart from the graphite tube 21 by configuring the plurality of

imaging units

12A and 12B to acquire the reflected images of the tip of the nozzle 40 obtained by the plurality of

mirrors

14A and 14B, respectively. Therefore, since the imaging unit 12A and the imaging unit 12B can be provided at a greater distance from the graphite tube 21 that has reached a high temperature during sample analysis, the imaging unit 12A and the imaging unit 12B can be protected from overheating.

In the example of fig. 7, the configuration in which two

mirrors

14A and 14B and two

imaging units

12A and 12B are provided has been described, but the number of mirrors and imaging units is not limited to this, and three or more mirrors and three or more imaging units may be provided.

[ form ]

As will be understood by those skilled in the art, the exemplary embodiments are specific examples of the following forms.

An atomic absorption spectrophotometer according to an aspect of (item 1) includes: an atomization part, a nozzle moving mechanism, a position adjusting mechanism, at least one image pick-up part and a display. The atomization portion includes a furnace in which a hole portion for sample injection is formed, and the sample injected into the furnace is atomized by heating. The nozzle sucks and ejects a sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjusting mechanism is composed of: the relative position of the tip of the nozzle with respect to the hole can be adjusted by moving the nozzle moving mechanism. At least one imaging unit is disposed so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is positioned directly above the hole. The display displays a captured image obtained by at least one imaging unit.

According to the atomic absorption spectrophotometer of item 1, since the relative position of the tip of the nozzle with respect to the hole of the furnace can be detected by at least one imaging unit that images the tip of the nozzle, the adjustment of the relative position of the nozzle with respect to the hole can be facilitated. This can improve the efficiency of the analysis work and the accuracy of the position adjustment of the nozzle.

(item 2) the atomic absorption spectrophotometer of item 1 further comprising: and a moving mechanism for moving the at least one imaging unit between a first position close to a position directly above the hole and a second position distant from the furnace than the first position.

According to the atomic absorption spectrophotometer described in item 2, after the position adjustment of the nozzle is completed, the distance between the furnace and each imaging unit can be increased by the moving mechanism. Thus, the at least one imaging unit can be retracted from the furnace in which the temperature is high during the analysis of the sample, thereby protecting the at least one imaging unit from overheating.

(item 3) the atomic absorption spectrophotometer according to item 2, wherein the nozzle moving mechanism is configured to: the nozzle can be moved between a position directly above the hole and a position directly above the container containing the sample. The moving mechanism of the image pickup unit is shared with the nozzle moving mechanism.

According to the atomic absorption spectrophotometer of item 3, since the nozzle moving mechanism is shared with the moving mechanism of at least one imaging unit, the distance between each imaging unit and the furnace can be increased by distancing the nozzle from the furnace. Therefore, a moving mechanism of the image pickup unit is not required. Thus, the at least one imaging unit can be retracted from the furnace, which has a high temperature during the analysis of the sample, with a simple configuration.

(item 4) the atomic absorption spectrophotometer according to item 3, wherein the nozzle moving mechanism includes: an arm supporting the nozzle. The nozzle moving mechanism is configured as follows: the nozzle can be moved between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one imaging unit is mounted on the arm.

The atomic absorption spectrophotometer according to item 4, wherein the distance between each imaging unit and the furnace can be increased by moving the nozzle from a position directly above the hole by moving the arm. Therefore, the at least one imaging unit can be retracted from the furnace having a high temperature during the analysis of the sample with a simple configuration.

(item 5) the atomic absorption spectrophotometer of item 1 further comprising: at least one mirror. At least one mirror forms a reflected image of the front end of the nozzle. At least one imaging unit is provided corresponding to each of the at least one mirror, and acquires a reflected image of the corresponding mirror.

According to the atomic absorption spectrophotometer of item 5, since the at least one imaging unit can image the tip of the nozzle by the at least one mirror, the relative position of the tip of the nozzle with respect to the hole of the furnace can be detected from the image obtained by the at least one imaging unit. Therefore, the relative position of the nozzle with respect to the hole can be easily adjusted. Further, the at least one imaging unit may be provided apart from the furnace by being configured to acquire a reflected image of the tip end of the nozzle by the at least one mirror. Therefore, at least one imaging unit can be provided at a greater distance from the furnace that becomes a high temperature during sample analysis, and therefore, each imaging unit can be protected from overheating.

(item 6) the atomic absorption spectrophotometer according to item 5, wherein the nozzle moving mechanism includes: an arm supporting the nozzle. The nozzle moving mechanism is configured to: the nozzle can be moved between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one mirror is mounted on the arm.

The atomic absorption spectrophotometer according to item 6, wherein the distance between each of the reflecting mirrors and the furnace can be increased by moving the nozzle from a position directly above the hole by moving the arm. Therefore, at least one mirror can be retracted from the furnace having a high temperature during the analysis of the sample with a simple configuration.

(item 7) the atomic absorption spectrophotometer of items 1 to 6 further comprising: and a controller. The controller detects a relative position of the tip of the nozzle with respect to the hole portion based on a captured image obtained by at least one imaging unit. The controller operates the position adjustment mechanism in accordance with the amount of deviation of the detected relative position from the reference position.

The atomic absorption spectrophotometer according to claim 7, wherein the position of the nozzle is not adjusted by a user, thereby further improving the analysis efficiency.

Embodiments 1 to 4 and modifications are previously defined from the beginning of the application, and the configurations described in the respective embodiments are appropriately combined to the extent that no problem or contradiction occurs, including combinations not mentioned in the specification.

The embodiments disclosed herein are to be considered in all respects as illustrative and not restrictive. The scope of the present invention is defined not by the description but by the claims, and is intended to include meanings equivalent to the claims and all modifications within the scope.

[ description of symbols ]

1: light source

2: atomization part

3: light splitter

4: automatic sampler

5: detector

6: heating device

8: driver

9: rotary disc

10: position adjusting mechanism

12. 12A, 12B: image pickup unit

14. 14A, 14B, 33, 34: reflecting mirror

15: controller

16: display device

18: operation part

21: graphite tube

22. 25: hole part

23. 24: electrode for electrochemical cell

26: window board

31: entrance slit

32: outlet slit

35: diffraction grating

40: nozzle with a nozzle body

41: nozzle moving mechanism

42: arm(s)

43: rotating shaft

44. 90: motor with a stator having a stator core

92: platform

100: atomic absorption spectrophotometer

150: processor with a memory having a plurality of memory cells

152: memory device

154: input/output interface (I/F)

156: communication interface (I/F).

Claims

1. An atomic absorption spectrophotometer, comprising:

an atomization moiety comprising: a furnace in which a hole for sample injection is formed, the sample injected into the furnace being atomized by heating;

a nozzle for sucking and ejecting a sample;

a nozzle moving mechanism for moving the nozzle to a position directly above the hole;

a position adjustment mechanism configured to: the relative position of the tip of the nozzle with respect to the hole portion can be adjusted by moving the nozzle moving mechanism;

at least one imaging unit arranged so that a distal end of the nozzle and the hole are included in an imaging field of view in a state where the distal end of the nozzle is positioned directly above the hole; and

and a display unit for displaying the captured image obtained by the at least one imaging unit.

2. An atomic absorption spectrophotometer according to claim 1, further comprising:

and a moving mechanism for moving the imaging unit between a first position close to a position directly above the hole and a second position away from the furnace than the first position.

3. The atomic absorption spectrophotometer according to claim 2,

the nozzle moving mechanism is configured to: the nozzle can be moved between a position directly above the hole and a position directly above a container containing a sample, and

the moving mechanism of the imaging unit is shared with the nozzle moving mechanism.

4. The atomic absorption spectrophotometer according to claim 3,

the nozzle moving mechanism includes: an arm supporting the nozzle, the nozzle moving mechanism being configured to: the nozzle can be moved between a position directly above the hole and a position directly above a container containing a sample by moving the arm; and is

The at least one imaging unit is mounted on the arm.

5. The atomic absorption spectrophotometer according to claim 1, further comprising:

at least one mirror forming a reflected image of the front end of the nozzle; and is

The at least one imaging unit is provided in correspondence with each of the at least one mirror, and acquires a reflected image of the corresponding mirror.

6. The atomic absorption spectrophotometer according to claim 5,

the nozzle moving mechanism includes: an arm supporting the nozzle, the nozzle moving mechanism being configured to: the nozzle can be moved between a position directly above the hole and a position directly above a container containing a sample by rotating the arm, and the nozzle can be moved between the positions

The at least one mirror is mounted on the arm.

7. The atomic absorption spectrophotometer according to any one of claims 1 to 6, further comprising: a controller for controlling the operation of the electronic device,

the controller detects a relative position of a tip of the nozzle with respect to the hole based on the captured image obtained by the at least one imaging unit, and

the position adjusting mechanism is operated based on the amount of displacement of the detected relative position from a reference position.