CN114579372A - 一种串口测试方法及*** - Google Patents
一种串口测试方法及*** Download PDFInfo
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- CN114579372A CN114579372A CN202111631876.2A CN202111631876A CN114579372A CN 114579372 A CN114579372 A CN 114579372A CN 202111631876 A CN202111631876 A CN 202111631876A CN 114579372 A CN114579372 A CN 114579372A
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- 238000012360 testing method Methods 0.000 title claims abstract description 45
- 230000002159 abnormal effect Effects 0.000 claims abstract description 12
- 238000010998 test method Methods 0.000 claims abstract description 9
- 230000005540 biological transmission Effects 0.000 claims description 26
- 238000000034 method Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- Engineering & Computer Science (AREA)
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- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
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Priority Applications (1)
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CN202111631876.2A CN114579372A (zh) | 2021-12-29 | 2021-12-29 | 一种串口测试方法及*** |
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CN202111631876.2A CN114579372A (zh) | 2021-12-29 | 2021-12-29 | 一种串口测试方法及*** |
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Publication Number | Publication Date |
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CN114579372A true CN114579372A (zh) | 2022-06-03 |
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CN202111631876.2A Pending CN114579372A (zh) | 2021-12-29 | 2021-12-29 | 一种串口测试方法及*** |
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CN (1) | CN114579372A (zh) |
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2021
- 2021-12-29 CN CN202111631876.2A patent/CN114579372A/zh active Pending
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PB01 | Publication | ||
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SE01 | Entry into force of request for substantive examination | ||
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TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20240122 Address after: Room 409, 4th Floor, Building 1, No. 199 Weikang Road, Xiangzhou District, Zhuhai City, Guangdong Province, 519000 Applicant after: Zhuhai Hongpeihan Electronic Technology Co.,Ltd. Country or region after: China Address before: 2501, 2401, block a, building 1, Shenzhen new generation industrial park, 136 Zhongkang Road, Meidu community, Meilin street, Futian District, Shenzhen, Guangdong 518000 Applicant before: Shenzhen deminli Technology Co.,Ltd. Country or region before: China |