CN114252746A - GIL equipment aging test method - Google Patents
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- 230000032683 aging Effects 0.000 title claims abstract description 68
- 238000010998 test method Methods 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 95
- 238000005259 measurement Methods 0.000 claims abstract description 20
- 230000008859 change Effects 0.000 claims description 7
- 238000012797 qualification Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 21
- 238000007689 inspection Methods 0.000 abstract description 4
- 230000007547 defect Effects 0.000 description 13
- 230000008569 process Effects 0.000 description 13
- 238000009413 insulation Methods 0.000 description 7
- 208000028659 discharge Diseases 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000011946 reduction process Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000009421 internal insulation Methods 0.000 description 1
- 239000011859 microparticle Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a GIL equipment aging test method, which comprises the following steps: connecting the test equipment with GIL equipment, and building a sophisticated test loop; boosting the voltage value of the GIL equipment for the first time through the test equipment, and performing a preliminary aging test; boosting the voltage value of the GIL equipment for the second time, and performing a second-step aging test on the GIL equipment; boosting the voltage value of the GIL equipment for the third time, and carrying out a highest working voltage examination test on the GIL equipment; and reducing the voltage value of the GIL equipment, carrying out parameter measurement on the GIL equipment, and reducing the voltage value to zero after the parameter measurement is finished. The method combines the primary aging and the second aging, and accurately controls the time and the voltage of the aging test, so that the inspection level and the inspection precision of the aging test of the GIL equipment can be effectively improved, and the safety and the stability of the GIL equipment are improved.
Description
Technical Field
The invention relates to the technical field of power transmission and transformation insulating equipment, in particular to a GIL equipment aging test method.
Background
At present, a gas insulated transmission line (GIL) adopts a metal outer shell to seal compressed xF6 gas or xF6/N2 mixed gas for insulation, and different types of insulators are used for supporting an inner conductor of the shell or separating a gas chamber to form high-voltage and high-current power transmission equipment with the outer shell and the conductor coaxially arranged. The GIL has the advantages of high reliability, small capacitance, low loss, strong overload capacity, electromagnetic environment friendliness and the like, and is more and more widely applied to the field of long-distance and large-capacity power transmission. However, GLI has a certain disadvantage, once micro defects such as particles and metal bumps exist in the GIL, the micro defects gradually evolve and deteriorate, and when the micro defects develop to a certain degree, phenomena such as partial discharge and abnormal heating are induced, so that insulation aging is accelerated, the performance of the insulator is reduced, and the safe operation of the GIL is seriously affected.
In the aging test detection of defects such as particles and metal bulges in the GIL in-situ handover test, at present, because the GIL aging test method is imperfect and has no uniform test standard, a few micro defects are not detected, and the insulation safety of the GIL is threatened.
Disclosure of Invention
In order to solve the above technical problems, an object of the present invention is to provide a GIL device aging test method that combines primary aging and secondary aging, precisely controls aging time and test voltage, and can effectively improve detection level and test accuracy of a GIL device aging test.
The invention provides a GIL equipment aging test method, which comprises the following steps:
connecting the test equipment with GIL equipment, and building a sophisticated test loop;
boosting the voltage value of the GIL equipment for the first time through the test equipment, and performing a preliminary aging test;
boosting the voltage value of the GIL equipment for the second time, and performing a second-step aging test on the GIL equipment;
boosting the voltage value of the GIL equipment for the third time, and carrying out a highest working voltage examination test on the GIL equipment;
and reducing the voltage value of the GIL equipment, carrying out parameter measurement on the GIL equipment, and reducing the voltage value to zero after the parameter measurement is finished.
Further, the step of boosting the voltage value of the GIL device through the test device to perform a preliminary burn-in test includes:
boosting, by the test equipment, a voltage value of the GIL equipment to a first voltage value for a first time period;
and keeping the voltage value unchanged at the first voltage value in a second time period.
Further, the first voltage value is aUm, the first time duration is aUm/x, the second time duration is t1, a is a constant smaller than 1, Um is a rated voltage value of the GIL device, x is a boost change rate, and the value range of t1 is [20min, 40min ].
Further, the step of boosting the voltage value of the GIL device for the second time and performing the second-step aging test on the GIL device comprises:
boosting the voltage value of the GIL equipment to a rated voltage value within a third time period;
and keeping the voltage value unchanged at the rated voltage value in the fourth time period.
Further, the third time period is (Um-aUm)/x, and the fourth time period is t 1/2.
Further, the step of boosting the voltage value of the GIL device for the third time and performing the highest working voltage examination test on the GIL device comprises:
boosting the voltage value of the GIL device to a second voltage value within a fifth time period;
and keeping the voltage value unchanged at the second voltage value in a sixth time period.
Further, the second voltage value is bUm, the fifth time period is (bUm-Um)/x, and the sixth time period is 2min, wherein b is a constant greater than 1.
Further, the step of reducing the voltage value of the GIL device to zero after the parameter measurement is completed comprises:
reducing the voltage value of the GIL equipment to a third voltage value within a seventh time period;
maintaining the voltage value at the third voltage value for an eighth time period;
and reducing the voltage value to zero in a ninth time period.
Further, the third voltage value is cUm, the seventh time period is (Um-cUm)/x1, the eighth time period is 5min, and the ninth time period is cUm/x1, wherein c is a constant less than 1, and x1 is the voltage reduction change rate.
Further, the test equipment comprises a transformer and a variable frequency resonance voltage withstand device.
The invention provides a GIL equipment aging test method. By the method, the time and the voltage of the aging test are accurately controlled, and the unified test standard of the aging test is established.
Drawings
FIG. 1 is a schematic flow chart of a GIL facility burn-in test method in an embodiment of the present invention;
FIG. 2 is a schematic flow chart of step S20 in FIG. 1;
FIG. 3 is a schematic flow chart of step S30 in FIG. 1;
FIG. 4 is a schematic flow chart of step S40 in FIG. 1;
fig. 5 is a schematic flowchart of step S50 in fig. 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, a GIL apparatus aging test method according to a first embodiment of the present invention includes steps S10 to S50:
and step S10, connecting the test equipment with GIL equipment to build a sophisticated test loop.
The burn-in test is generally a test in which a low level voltage is applied and then the voltage level is gradually increased. Therefore, when the aging test is carried out, because the GIS/GIL has some impurities before the voltage-withstand test, such as uncleaned dust and hair, the impurities can be burnt out or particles can be transferred to a low electric field intensity area through the aging test, and accordingly, even if the insulation margin is improved, extra workload of uncovering and overhauling and the like caused by discharging can be avoided during the voltage-withstand test. Meanwhile, the aging test is also a phase-change test for checking insulation performance, and provides certain information support for the conditions such as equipment quality, so that the aging test is necessary for the equipment.
Before the aging test, firstly, an aging test loop needs to be built, test equipment and GIL equipment are connected, the test equipment is mainly used for boosting, reducing voltage and the like of the GIL equipment, a transformer or a variable-frequency resonance voltage-withstanding device and the like can be selected and used, the actually used equipment can be flexibly set according to the field condition, specific limitation is not made here, the actually built process can refer to a conventional building method, and the conventional building method is not described one by one here.
And step S20, boosting the voltage value of the GIL equipment for the first time through the test equipment, and performing a preliminary aging test.
After the test loop is built, a burn-in test is performed on the GIL device, where the burn-in test in this embodiment includes two times of burn-in, and as shown in fig. 2, the step of preliminary burn-in includes:
step S201, boosting the voltage value of the GIL equipment to a first voltage value within a first time period through the test equipment;
step S202, in a second time period, the voltage value is kept unchanged at the first voltage value.
And starting the preliminary aging from zero, linearly boosting the test voltage value of the GIL equipment to a first voltage value within a first time length, and keeping the voltage value unchanged within a preset second time length to finish the preliminary aging test.
In this embodiment, the set first voltage value is aUm, where Um is a rated voltage value of the GIL device, a is a constant smaller than 1, and a specific value of a needs to be determined according to an installation layout of the GIL device on a substation site, and when the GIL distance is long and the layout is complex, stray capacitance, inductance and the like increase, so that the impedance of the whole loop increases, and energy loss in the boosting process increases, therefore, in order to ensure stable energy in the test process, the value of a should be large, and on the contrary, the value of a should be small, and experiments show that the value of a in the range of 0.5-0.75 is a better choice.
In the preliminary aging, a set first time duration is aUm/x, wherein x is a boosting change rate, in a stable boosting process of the preliminary aging, the boosting time is too fast, dU/dt is too large, charging current is increased rapidly in the whole boosting process, overcurrent is generated, and stability of the GIL equipment is directly threatened, so that the boosting time of the GIL equipment needs to be controlled, the boosting time cannot be too fast, the boosting time, namely the first time duration, is set to be aUm/x, in a specific implementation process, the value of x can be 10kV/s, and under the boosting change rate, if a first voltage value of a GIL equipment aging test is 1000kV, the first time duration is 100 s.
After the voltage value of the GIL equipment is boosted to the first voltage value, the voltage value needs to be kept unchanged for a certain time period to complete preliminary aging, a stable electric field is maintained for a period of time to preliminarily form in the GIL equipment, and internal defects of the equipment, such as micro-particles, solid insulation defects, metal protruding burrs and the like, are preliminarily detected and screened, because the inside of the GIL equipment is filled with SF6 gas, the development of discharge caused by the defects in the stable electric field of the SF6 gas needs a period of time, theoretically, the larger the maintenance time is, the higher the defect detection rate is, the higher the GIL voltage grade is, in order to improve the field aging test efficiency, the maintenance time in the current engineering is about 20min, but in the period, the undetected defects still exist in the engineering experience, so the second time t1 in the embodiment is higher than the current commonly-used 20min, and the value range is between 25min and 40min, meanwhile, due to the difference of the rated voltage values of the GIL equipment, in the actual test process, t1 can take values of [25min, 40min ] for the GIL equipment with the voltage class of 500kV or above, t1 can take values of [20min, 25min ] for the GIL equipment with the voltage class of below 500kV, and the specific values are flexibly set according to the voltage of the GIL equipment.
And step S30, boosting the voltage value of the GIL equipment for the second time, and performing a second-step aging test on the GIL equipment.
Since it is possible that internal defects are not exposed after the preliminary burn-in test is completed, a second burn-in test is also required, the steps of which are shown in fig. 3:
step S301, boosting the voltage value of the GIL equipment to a rated voltage value within a third time period;
step S302, in a fourth time period, the voltage value is kept unchanged at the rated voltage value.
After the preliminary aging test is completed, the voltage value of the GIL equipment is continuously linearly boosted to the rated voltage value of the equipment through the test equipment, and like the boosting process in the above steps, if the boosting time is too fast, dU/dt is too large, so that the charging current is suddenly increased in the whole boosting process to generate overcurrent, thereby threatening the stability of the GIL equipment, therefore, the boosting time also needs to be controlled.
After the voltage boosting is completed, the voltage value still needs to be kept unchanged for a certain time, a second-step aging test is completed, and the primary aging and the second-step aging are matched with each other to check the internal insulation characteristic of the GIL equipment under the rated voltage, so that the internal defects which induce the slow discharge development or are not easy to expose in the primary aging process can accelerate the discharge or quickly expose when the voltage is raised to the rated voltage in the second-step aging. Because the second-step aging is connected in series after the preliminary aging, and the energy maintaining time in the preliminary aging process is longer, in order to improve the field test efficiency, the second-step aging time can be not more than the preliminary aging holding time and can be obtained through the field test, the maintaining time in the second-step aging test is more suitable to be half of the first time in the preliminary aging test, namely the fourth time is t 1/2.
And step S40, boosting the voltage value of the GIL equipment for the third time, and performing the highest working voltage examination test on the GIL equipment.
After two aging tests, the maximum operating voltage of the GIL device needs to be examined, and the specific test steps are shown in fig. 4:
step S401, boosting the voltage value of the GIL equipment to a second voltage value within a fifth time period;
step S402, in a sixth time period, the voltage value is kept unchanged at the second voltage value.
In this embodiment, the third boosting of the GIL device is to linearly boost the device from the rated voltage value to the second voltage value, which is the highest operating voltage of the device, within a certain time period, that is, to linearly boost the device from Um to bUm, so as to prepare for the GIL device to accept the highest voltage check.
The b is a constant larger than 1, the specific value of the b is determined according to the installation layout of the GIL equipment in a substation site, when the distance of the GIL equipment is long, the layout is complex or the redundancy of the actual working condition of the GIL equipment is high, the value of the b is large, and otherwise, the value of the b is small; through field tests, the value range of b is 1.2-1.5 under general conditions. Similarly, the third boosting time, that is, the fifth time duration, still needs to be controlled, and the value is (bUm-Um)/x, because the reason is consistent with the reason for setting the boosting time of the last two times, and details are not described here.
When the test voltage of the GIL equipment rises to bUm, the voltage is kept unchanged, the GIL equipment is maintained for a certain time, the examination experiment of the highest working voltage is completed, the highest working voltage is generally the output voltage of a generator or a transformer under special working conditions after instability, the GIL has short-time operation capability under the highest working voltage, and in the embodiment, the sixth time for maintenance is 2min, so that the GIL equipment can be operated for a short time without damaging the equipment.
And step S50, reducing the voltage value of the GIL equipment, carrying out parameter measurement on the GIL equipment, and reducing the voltage value to zero after the parameter measurement is finished.
After the experiment on the boosting process of the GIL device is completed, the device needs to be stepped down, the step-down process includes two step-down, and the specific step-down steps are shown in fig. 5:
step S501, the voltage value of the GIL equipment is reduced to a third voltage value within a seventh time period;
step S502, in an eighth time period, keeping the voltage value unchanged at the third voltage value;
in step S503, the voltage value is decreased to zero in the ninth time period.
In this embodiment, the voltage value of the GIL device is linearly reduced from a second voltage value bUm to a third voltage value cUm, and a first voltage reduction process is completed, where c is a constant smaller than 1, the specific value of c is determined according to the installation layout of the GIL on the substation site, and when the GIL distance is long and the layout is complex, the value of c is large, and otherwise, the value of c is small; through field tests, the value range of c is 0.65-0.85 under general conditions. As with the boosting process, the buck duration of the buck process also needs to be controlled, since too fast a buck rate can also cause over-current and affect the stability of the GIL device. Here, the step-down change rate is set to be x1, the step-down time duration, that is, the seventh time duration, should be (Um-cUm)/x1, in an actual test, x1 may be 10kV/s, and a specific value needs to be flexibly set according to a field situation, which is not limited herein.
Because parameter measurement on the GIL equipment is generally completed in a step-down stage, after the equipment is subjected to voltage reduction for the first time, the voltage value of the GIL equipment needs to be kept unchanged within eighth time, tests such as partial discharge measurement of the GIL equipment and the like are conveniently completed, the maintenance time is related to the time required by the parameter measurement, the parameter measurement such as partial discharge, shell vibration and the like can be completed within 1min, but in order to ensure the statistics and the scientificity of the parameter measurement, in the embodiment, the eighth time is set to 5min, so that the parameter can be measured for multiple times, and the measurement result is more accurate.
After parameter measurement is completed, the voltage value of the GIL equipment is gradually reduced to zero, of course, the voltage reduction time length in the final voltage reduction process still needs to be controlled, wherein the ninth time length is set to cUm/x1, for example, the third voltage value is 1200kV, x1 is 10kV/s, and the ninth time length is 2 min.
Compared with the traditional method, the GIL equipment aging test method provided by the embodiment has the advantages that due to the fact that the GIL aging test method is incomplete and has no uniform test standard, a few micro defects are not detected, and accordingly insulation safety of the GIL is threatened.
In summary, according to the aging test method for the GIL equipment provided by the embodiment of the invention, the test equipment is connected with the GIL equipment, and an aging test loop is set up; boosting the voltage value of the GIL equipment for the first time through the test equipment, and performing a preliminary aging test; boosting the voltage value of the GIL equipment for the second time, and performing a second-step aging test on the GIL equipment; boosting the voltage value of the GIL equipment for the third time, and carrying out a highest working voltage examination test on the GIL equipment; and reducing the voltage value of the GIL equipment, carrying out parameter measurement on the GIL equipment, and reducing the voltage value to zero after the parameter measurement is finished. The method combines the primary aging and the second aging, and accurately controls the time and the voltage of the aging test, so that the inspection level and the inspection precision of the aging test of the GIL equipment can be effectively improved, and the safety and the stability of the GIL equipment are improved.
The embodiments in this specification are described in a progressive manner, and all the same or similar parts of the embodiments are directly referred to each other, and each embodiment is described with emphasis on differences from other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment. It should be noted that, the technical features of the embodiments may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express some preferred embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, various modifications and substitutions can be made without departing from the technical principle of the present invention, and these should be construed as the protection scope of the present application. Therefore, the protection scope of the present patent shall be subject to the protection scope of the claims.
Claims (10)
1. A GIL equipment aging test method is characterized by comprising the following steps:
connecting the test equipment with GIL equipment, and building a sophisticated test loop;
boosting the voltage value of the GIL equipment for the first time through the test equipment, and performing a preliminary aging test;
boosting the voltage value of the GIL equipment for the second time, and performing a second-step aging test on the GIL equipment;
boosting the voltage value of the GIL equipment for the third time, and carrying out a highest working voltage examination test on the GIL equipment;
and reducing the voltage value of the GIL equipment, carrying out parameter measurement on the GIL equipment, and reducing the voltage value to zero after the parameter measurement is finished.
2. The GIL facility burn-in test method of claim 1, wherein the step of performing a preliminary burn-in test by the test facility boosting the voltage level of the GIL facility comprises:
boosting, by the test equipment, a voltage value of the GIL equipment to a first voltage value for a first time period;
and keeping the voltage value unchanged at the first voltage value in a second time period.
3. The GIL plant burn-in test method of claim 2, wherein the first voltage value is aUm, the first time period is aUm/x, the second time period is t1, wherein a is a constant less than 1, Um is the GIL plant rated voltage value, x is the boost rate of change, and t1 is in the range of [20min, 40min ].
4. The GIL device burn-in test method of claim 3, wherein said step of boosting the voltage level of the GIL device a second time and performing a second burn-in test on the GIL device comprises:
boosting the voltage value of the GIL equipment to a rated voltage value within a third time period;
and keeping the voltage value unchanged at the rated voltage value in the fourth time period.
5. The GIL facility burn-in test method of claim 4, wherein said third time period is (Um-aUm)/x and said fourth time period is t 1/2.
6. The GIL facility burn-in test method according to claim 5, wherein said step of boosting the voltage level of the GIL facility for a third time and performing a maximum operating voltage qualification test on the GIL facility comprises:
boosting the voltage value of the GIL device to a second voltage value within a fifth time period;
and keeping the voltage value unchanged at the second voltage value in a sixth time period.
7. The GIL facility burn-in test method of claim 6, wherein said second voltage value is bUm, a fifth time period is (bUm-Um)/x, and a sixth time period is 2min, wherein b is a constant greater than 1.
8. The GIL device burn-in test method of claim 7, wherein said step of dropping a voltage value of said GIL device, performing a parametric measurement on said GIL device, and after the parametric measurement is completed, dropping said voltage value to zero comprises:
reducing the voltage value of the GIL equipment to a third voltage value within a seventh time period;
maintaining the voltage value at the third voltage value for an eighth time period;
and reducing the voltage value to zero in a ninth time period.
9. The GIL facility burn-in test method of claim 8, wherein the third voltage value is cUm, the seventh time period is (Um-cUm)/x1, the eighth time period is 5min, the ninth time period is cUm/x1, wherein c is a constant less than 1 and x1 is a rate of change of the step-down voltage.
10. The GIL facility burn-in test method according to claim 1, wherein said test facility includes a transformer and a variable frequency resonant withstand voltage device.
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Application publication date: 20220329 |