CN114130712A

CN114130712A - Function test's carborundum diode check out test set

Info

Publication number: CN114130712A
Application number: CN202111394176.6A
Authority: CN
Inventors: 朱淑丹
Original assignee: Shenzhen Kunlian Technology Co ltd
Current assignee: Shenzhen Kunlian Technology Co ltd
Priority date: 2021-11-23
Filing date: 2021-11-23
Publication date: 2022-03-04

Abstract

The invention discloses a silicon carbide diode detection device for functional test, which relates to the technical field of silicon carbide diodes and comprises a base and a stabilizing frame, wherein a frame is arranged on the outer side of the top of the base, auxiliary components are connected to two sides of the frame, conveying belts are arranged on two sides of the base, limiting components are arranged on the surfaces of the conveying belts, and a feeding component is arranged on the inner side of the conveying belts. According to the invention, through the mutual matching arrangement of the multiple assemblies, different diodes can be automatically positioned when being conveyed, the loading process is facilitated, the lengths of the pins can be cut to be the same, the detection of the diodes of different types is facilitated, the multi-group synchronous test can be realized through the rotary continuous loading of the loading assembly, the test efficiency is improved, the diodes can be conveniently taken out through the ejection assembly, unqualified products can be taken out through the waste cleaning assembly, and the qualification rate of the products is improved.

Description

Function test's carborundum diode check out test set

Technical Field

The invention relates to the technical field of silicon carbide diodes, in particular to a silicon carbide diode detection device for functional test.

Background

A silicon carbide diode, that is, a schottky diode is a type of semiconductor device that is made by a contact barrier formed between a metal and an N-type semiconductor having a rectifying property. The basic structure of the Schottky diode is a heavily doped N-type 4H-SiC piece, a 4H-SiC epitaxial layer, a Schottky contact layer and an ohmic contact layer, the Schottky diode has good characteristics, functional detection needs to be carried out on the finished product of the silicon carbide diode before the silicon carbide diode is put into the market, and the product is guaranteed to have good qualified rate.

Silicon carbide diode check out test set on market is because the silicon carbide diode has different types for its pin length respectively has the difference, makes when detecting just lead to the pin when too long with detect the bending that the platform contact excessively arouses the pin easily, inconvenient the inserting detects the use.

Disclosure of Invention

The invention aims to provide a silicon carbide diode detection device for functional test, so as to solve the problems in the background technology.

In order to achieve the purpose, the invention provides the following technical scheme: a silicon carbide diode detection device for functional testing comprises a base and a stabilizing frame, wherein a frame is installed on the outer side of the top of the base, auxiliary assemblies are connected to two sides of the frame, a conveying belt is arranged on two sides of the base, a limiting assembly is arranged on the surface of the conveying belt, a feeding assembly is arranged on the inner side of the conveying belt, each auxiliary assembly comprises a sliding rail, a pneumatic sliding block, an auxiliary frame, an infrared distance sensor, pneumatic scissors and a binocular detection camera, the pneumatic sliding block is installed inside the sliding rail, the auxiliary frame is connected to the other end of the pneumatic sliding block, the infrared distance sensor is connected inside the auxiliary frame, the pneumatic scissors are arranged on the right side inside the auxiliary frame, the binocular detection camera is installed below the inner side of the frame, the stabilizing frame is installed at the center of the top of the base, and the surface of the stabilizing frame is provided with a groove, the stabilizing frame is internally provided with a detection table, and the bottom of the detection table is connected with an adjusting motor.

Further, spacing subassembly includes base, servo motor, damping centre gripping platform, settles spring, grip block and cardboard, base internally mounted have servo motor, just the servo motor output is connected with the damping centre gripping platform, damping centre gripping platform internally mounted have settle the spring, just it is connected with to settle the spring other end the grip block, the cardboard install in damping centre gripping bench top.

Furthermore, the damping clamping table is in rotary connection with the base through the servo motor, the rotation angle of the servo motor is degrees, the clamping plates are symmetrically distributed around the center of the damping clamping table, and the surfaces of the clamping plates are concave.

Further, the material loading subassembly includes work or material rest, step motor, locating rack, small-size push rod, locating plate, electronic telescopic link and snatchs the sucking disc, just work or material rest one side is connected with step motor, it installs to go up the work or material rest inner wall the locating rack, just the locating rack both sides all are connected with small-size push rod, the small-size push rod output is connected with the locating plate, electronic telescopic link install in locating rack surface central point puts, just the electronic telescopic link output is connected with snatch the sucking disc.

Furthermore, the locating rack is about the inner wall of going up the work or material rest is equidistance circumference form and distributes, just the locating plate with the extension line of locating rack is parallel form and distributes, moreover the locating plate is L column structure.

Further, examine test table surface mounting and have a detection subassembly, just detection subassembly includes test rack, circuit board, power, resistance piece, connecting seat, slot and elasticity conducting element, test rack internally mounted has the circuit board, just circuit board skin weld has the power, the power right side is from top to bottom is provided with the resistance piece, just the power right side corresponds the position and is provided with the connecting seat, the slot has been seted up at the connecting seat top, just the elastic conducting element is installed to the connecting seat inner wall.

Furthermore, the elastic guide pieces are communicated with the circuit board through the connecting seat, the elastic guide pieces are elastically connected with the connecting seat, and the resistor pieces are provided with two groups and have different resistance values.

Furthermore, ejection assemblies are installed on two sides of the connecting seat and comprise a micro push rod, an ejection frame, a sliding groove, a micro spring and an oblique positioning hole block, the output end of the micro push rod is connected with the ejection frame, the sliding groove is formed in the upper surface of the ejection frame, the micro spring is installed inside the sliding groove, and the other end of the micro spring is connected with the oblique positioning hole block.

Further, the clear useless subassembly is installed at the frame top, just clear useless subassembly includes hydraulic push rod, clear useless frame, straight-bar, temperature sensor, clearance frame and rotation motor, the hydraulic push rod bottom is connected with clear useless frame, just clear useless frame bottom is connected with the straight-bar, shown straight-bar bottom is connected with temperature sensor, clear useless frame one side is connected with the clearance frame, just clearance frame one side is connected with the rotation motor.

Furthermore, the temperature sensor is fixedly connected with the waste cleaning frame through the straight rod, the temperature sensor, the straight rod and the waste cleaning frame are located on the same axis, and extension lines of the temperature sensor and the straight rod are vertically distributed.

The invention provides a silicon carbide diode detection device for functional test, which has the following beneficial effects: according to the silicon carbide diode detection equipment for functional test, through the mutually matched arrangement of the multiple components, the diodes can be automatically positioned according to different types when being conveyed, the loading process is facilitated, the lengths of pins can be cut according to the length, the detection of the diodes of different types is facilitated, the diodes can be continuously loaded in a rotating mode through the loading component, multiple groups of synchronous tests can be realized through the matched detection component, the test efficiency of the diodes is improved, the diodes can be conveniently taken out through the ejection component, unqualified products can be taken out through the matched waste removal component, and the qualification rate of the products is improved;

1. according to the invention, the limiting assembly is arranged on the surface of the conveying belt in a matched manner through the conveying belt and the limiting assembly, so that the limiting assembly can move along with the conveying belt simultaneously, and through the arrangement of the damping clamping table and the clamping plate on the surface of the limiting assembly, when the diode is manually placed in the damping clamping table from the upper part of the damping clamping table, the inclined clamping block is extruded by the outer part of the diode to enable the clamping block to synchronously contract with the mounting spring, and the diode can be quickly positioned to the central position of the damping clamping table through the clamping blocks on the two sides, so that the loading process is facilitated, meanwhile, the limiting is also facilitated for diodes of different types, and the universality is improved.

2. According to the invention, through the arrangement of the auxiliary assembly, the pneumatic sliding block can drive the auxiliary frame to move up and down along the sliding rail for adjusting the length of the pins of the diode, the overlong pins of the diode can be detected through the infrared distance sensor in the pneumatic sliding block, and the overlong pins of the diode can be quickly cut off through the pneumatic scissors, so that the diodes with different types and different pin lengths can be unified in size, the subsequent detection process is facilitated, the arrangement of the binocular detection camera is matched with the arrangement of the servo motor in the base, the damping clamping table can be driven to rotate by the arrangement spring, the rotating angle of each time is 180 degrees, the front side and the back side of the diode can be adjusted, and the detection precision is improved.

3. According to the invention, through the mutually matched arrangement of the feeding assembly and the limiting assembly, when the conveying belt drives the limiting assembly to feed materials, the feeding frame can synchronously rotate under the driving of the stepping motor, and through the positioning frame arranged on the surface of the feeding frame, when the feeding frame is contacted with the diode, the small push rods on two sides synchronously move to push the positioning plate to position and clamp the diode, and the grabbing sucker is pushed to be attached to the surface of the diode through the electronic telescopic rod, so that the diode can be adsorbed and grabbed.

4. The invention is provided with the feeding component and the detecting component which are matched with each other, the detecting component is arranged on the surface of the detecting platform, when the feeding frame works, the detection table works under the uniform-speed drive of the adjusting motor, so that the diode can be inserted into the connecting seat on the detection surface when the feeding frame rotates, and meanwhile, the small push rod and the electronic telescopic rod synchronously contract, the pin of the diode can be inserted into the connecting seat and contacted with the elastic conducting piece in the connecting seat to realize the communication with the circuit board, in this test circuit, a resistor having a resistance as low as about 0.1 ohm is connected in series, another resistor having a very high resistance is connected in parallel with a diode, and a power supply voltage is set to be a sine wave of 1V, so that the following instructions are executed for AC simulation, the capacitive reactance of the power diode is measured in the frequency range of 200 MHz to 2 MHz.

5. According to the invention, through the mutual matching arrangement between the ejection assembly and the connecting seat, the lower surface of the diode can be in contact with the oblique positioning hole block on the surface of the ejection frame before the diode is inserted, so that the diode can slide along the sliding groove, the diode can be extruded from two sides by matching with the micro spring to realize positioning, the detection accuracy of the diode is improved, the ejection frame can be pushed to rise under the driving of the micro push rod after the detection is finished, the diode can be ejected by the lifted ejection frame, and the integrity of the pins is further ensured in the blanking process.

6. According to the invention, through the mutual matching arrangement between the waste cleaning assembly and the detection table, the waste cleaning frame can be driven to descend by the hydraulic push rod in the waste cleaning assembly, the infrared temperature sensor connected with the straight rod at the bottom of the waste cleaning frame is used for detecting, and then the temperature of the diode is recorded.

Drawings

FIG. 1 is a schematic diagram of the overall structure of a silicon carbide diode detection device for functional testing according to the present invention;

FIG. 2 is a schematic structural diagram of an auxiliary assembly of the SiC diode testing apparatus for functional testing according to the present invention;

FIG. 3 is a schematic structural diagram of a limiting assembly of the SiC diode testing apparatus for functional testing according to the present invention;

FIG. 4 is a schematic structural diagram of a feeding assembly of the silicon carbide diode detection device for functional testing according to the present invention;

FIG. 5 is a schematic top view of a stable rack of the SiC diode testing apparatus for functional testing according to the present invention;

FIG. 6 is a schematic structural diagram of a testing assembly of the SiC diode testing apparatus for functional testing according to the present invention;

FIG. 7 is a schematic structural diagram of an ejection assembly of the SiC diode testing apparatus according to the present invention;

fig. 8 is a partial structural schematic diagram of a waste cleaning assembly of the silicon carbide diode detection device for functional test according to the invention.

In the figure: 1. a base; 2. a frame; 3. an auxiliary component; 301. a slide rail; 302. a pneumatic slider; 303. an auxiliary frame; 304. an infrared distance sensor; 305. pneumatic scissors; 306. a binocular detection camera; 4. a conveyor belt; 5. a limiting component; 501. a base; 502. a servo motor; 503. a damping clamping table; 504. arranging a spring; 505. a clamping block; 506. clamping a plate; 6. a feeding assembly; 601. a feeding frame; 602. a stepping motor; 603. a positioning frame; 604. a small push rod; 605. positioning a plate; 606. an electronic telescoping rod; 607. grabbing a sucker; 7. a stabilizing frame; 8. a trench; 9. a detection table; 10. adjusting the motor; 11. a detection component; 1101. a detection frame; 1102. a circuit board; 1103. a power source; 1104. a resistance member; 1105. a connecting seat; 1106. a slot; 1107. an elastic guide; 12. ejecting the assembly; 1201. a micro push rod; 1202. an ejection frame; 1203. a chute; 1204. a micro-spring; 1205. an oblique positioning hole block; 13. clearing the waste component; 1301. a hydraulic push rod; 1302. clearing waste racks; 1303. a straight rod; 1304. a temperature sensor; 1305. cleaning the rack; 1306. the motor is rotated.

Detailed Description

Referring to fig. 1-8, the present invention provides a technical solution: a silicon carbide diode detection device for functional test comprises a base 1 and a stabilizing frame 7, wherein a frame 2 is installed on the outer side of the top of the base 1, auxiliary components 3 are connected to two sides of the frame 2, a conveying belt 4 is arranged on two sides of the base 1, a limiting component 5 is arranged on the surface of the conveying belt 4, a feeding component 6 is arranged on the inner side of the conveying belt 4, each auxiliary component 3 comprises a sliding rail 301, a pneumatic sliding block 302, an auxiliary frame 303, an infrared distance sensor 304, pneumatic scissors 305 and a binocular detection camera 306, the pneumatic sliding block 302 is installed inside the sliding rail 301, the auxiliary frame 303 is connected to the other end of the pneumatic sliding block 302, the infrared distance sensor 304 is connected inside the auxiliary frame 303, the pneumatic scissors 305 are arranged on the right side inside the auxiliary frame 303, the binocular detection camera 306 is installed below the inner side of the frame 2, the stabilizing frame 7 is installed at the center position of the top of the base 1, and a groove 8 is formed in the surface of the stabilizing frame 7, a detection table 9 is arranged in the stabilizing frame 7, and the bottom of the detection table 9 is connected with an adjusting motor 10;

the operation is as follows, through the arrangement of the auxiliary assembly 3, the pneumatic slider 302 can drive the auxiliary frame 303 to move up and down along the slide rail 301 for adjusting the length of the pins of the diode, the overlong pins of the diode can be detected through the infrared distance sensor 304 in the auxiliary frame, and the overlong pins of the diode can be quickly cut off through the pneumatic scissors 305, so that the diodes with different types and different pin lengths can be unified in size, the subsequent detection process is facilitated, and through the arrangement of the binocular detection camera 306, in cooperation with the arrangement of the servo motor 502 in the base 501, the servo motor 502 can drive the damping clamping table 503 to rotate, the rotating angle of each time is 180 degrees, the front and back surfaces of the diode can be adjusted, and the detection precision is improved;

referring to fig. 1-3, the position limiting assembly 5 includes a base 501, a servo motor 502, a damping clamping table 503, a mounting spring 504, a clamping block 505 and a clamping plate 506, the servo motor 502 is installed inside the base 501, the output end of the servo motor 502 is connected with the damping clamping table 503, the mounting spring 504 is installed inside the damping clamping table 503, the clamping block 505 is connected to the other end of the mounting spring 504, the clamping plate 506 is installed on the top of the damping clamping table 503, the damping clamping table 503 is rotatably connected with the base 501 through the servo motor 502, the rotation angle of the servo motor 502 is 180 °, the clamping plate 506 is symmetrically distributed about the center position of the damping clamping table 503, and the surface of the clamping plate 506 is concave;

the specific operation is as follows, through the mutual matching arrangement between the conveyer belt 4 and the limiting component 5, the limiting component 5 is arranged on the surface of the conveyer belt 4, so that the limiting component can move along with the conveyer belt 4 at the same time, and through the arrangement of the damping clamping table 503 and the clamping plate 506 on the surface of the limiting component, when the diode is manually placed in the damping clamping table 503 from the upper part of the damping clamping table 503, the inclined clamping block 505 is extruded by the outer part of the diode, so that the diode and the arranging spring 504 synchronously contract, and the diode can be quickly positioned to the central position of the damping clamping table 503 through the clamping blocks 505 on the two sides, so that the loading process is facilitated, meanwhile, the limiting is also facilitated for diodes of different types, and the universality is improved;

referring to fig. 1 and 4, the feeding assembly 6 includes a feeding frame 601, a stepping motor 602, a positioning frame 603, a small push rod 604, a positioning plate 605, an electronic telescopic rod 606 and a gripping suction cup 607, wherein one side of the feeding frame 601 is connected with the stepping motor 602, the positioning frame 603 is installed on the inner wall of the feeding frame 601, the small push rod 604 is connected on both sides of the positioning frame 603, the output end of the small push rod 604 is connected with the positioning plate 605, the electronic telescopic rod 606 is installed at the central position of the surface of the positioning frame 603, the gripping suction cup 607 is connected with the output end of the electronic telescopic rod 606, the positioning frame 603 is circumferentially distributed at equal intervals with respect to the inner wall of the feeding frame 601, the positioning plate 605 and the extension line of the positioning frame 603 are distributed in parallel, and the positioning plate 605 is in an L-shaped structure;

the operation is as follows, through the mutual matching arrangement between the feeding assembly 6 and the limiting assembly 5, when the conveying belt 4 drives the limiting assembly 5 to feed, the feeding frame 601 can synchronously rotate under the driving of the stepping motor 602, through the positioning frame 603 arranged on the surface of the feeding frame, when the feeding frame is contacted with the diode, the small push rods 604 on the two sides synchronously move to push the positioning plate 605 to position and clamp the diode, and push the grabbing sucker 607 to be attached to the surface of the diode through the electronic telescopic rod 606, so that the diode can be adsorbed and grabbed, through the arrangement of the feeding frame 601, the automatic continuous feeding can be realized, the manual feeding is not needed, and the detection efficiency is improved;

referring to fig. 4-6, the surface of the detection table 9 is provided with the detection assembly 11, the detection assembly 11 includes a detection frame 1101, a circuit board 1102, a power supply 1103, a resistor 1104, a connection seat 1105, a slot 1106 and an elastic guide member 1107, the circuit board 1102 is installed inside the detection frame 1101, the power supply 1103 is welded on the surface of the circuit board 1102, the resistor 1104 is installed above and below the right side of the power supply 1103, the connection seat 1105 is installed at a corresponding position on the right side of the power supply 1103, the slot 1106 is opened at the top of the connection seat 1105, the elastic guide member 1107 is installed on the inner wall of the connection seat 1105, the elastic guide member 1107 is communicated with the circuit board 1102 through the connection seat 1105, the elastic guide member 1107 is elastically connected with the connection seat 1105, and the resistor 1104 is provided with two groups and has different resistances;

the specific operation is as follows, through the mutual cooperation arrangement between the feeding assembly 6 and the detection assembly 11, the detection assembly 11 is installed on the surface of the detection table 9, when the feeding table 601 works, the detection table 9 works under the constant speed drive of the adjusting motor 10, so that the feeding table 601 can insert the diode into the connecting seat 1105 on the surface of the detection table 9 when rotating, meanwhile, the miniature push rod 604 and the electronic telescopic rod 606 contract synchronously, the pin of the diode can be inserted into the connecting seat 1105 and contact with the elastic conducting element 1107 inside, so as to realize the communication with the circuit board 1102, in the test circuit, a resistance element 1104 with the resistance value as low as about 0.1 ohm is connected in series, another resistance element 1104 with the resistance value as high as is connected in parallel with the diode, the voltage of the power supply 1103 is set to be a sine wave of 1V, so as to execute the following instructions to perform AC simulation, within the frequency range of 200 MHz to 2 MHz, the capacitive reactance of the power diode is measured.

Referring to fig. 6-7, the two sides of the connecting seat 1105 are installed with the ejection assemblies 12, each ejection assembly 12 includes a micro push rod 1201, an ejection frame 1202, a sliding slot 1203, a micro spring 1204 and an oblique positioning hole block 1205, the output end of the micro push rod 1201 is connected to the ejection frame 1202, the sliding slot 1203 is formed on the upper surface of the ejection frame 1202, the micro spring 1204 is installed inside the sliding slot 1203, and the other end of the micro spring 1204 is connected to the oblique positioning hole block 1205;

the specific operation is as follows, through the mutual matching arrangement between the ejection assembly 12 and the connecting seat 1105, the lower surface of the diode can be in contact with the oblique positioning hole block 1205 on the surface of the ejection frame 1202 before the diode is inserted, so that the diode can slide along the sliding groove 1203, the diode can be extruded from two sides by matching the micro push rod 1201 to realize positioning, the detection accuracy is improved, after the detection is finished, the ejection frame 1202 can be pushed to ascend under the driving of the micro push rod 1201, the ascending ejection frame 1202 can eject the diode, and the integrity of the pin is ensured in the blanking process.

Referring to fig. 1 and 8, a waste cleaning assembly 13 is mounted on the top of the frame 2, the waste cleaning assembly 13 includes a hydraulic push rod 1301, a waste cleaning frame 1302, a straight rod 1303, a temperature sensor 1304, a cleaning frame 1305 and a rotating motor 1306, the bottom of the hydraulic push rod 1301 is connected with the waste cleaning frame 1302, the bottom of the waste cleaning frame 1302 is connected with the straight rod 1303, the bottom of the straight rod 1303 is connected with the temperature sensor 1304, one side of the waste cleaning frame 1302 is connected with the cleaning frame 1305, one side of the cleaning frame 1305 is connected with the rotating motor 1306, the temperature sensor 1304 is fixedly connected with the waste cleaning frame 1302 through the straight rod 1303, the temperature sensor 1304, the straight rod 1303 and the waste cleaning frame 1302 are located on the same axis, and extension lines of the temperature sensor 1304 and the straight rod 1303 are vertically distributed;

the concrete operation is as follows, through clear useless subassembly 13 and the setting of mutually supporting between the test table 9, can promote clear useless frame 1302 and descend under the drive of hydraulic putter 1301 in this clear useless subassembly 13, and detect through the infrared temperature sensor 1304 that clear useless frame 1302 bottom straight-bar 1303 is connected, and then carry out the record to the temperature of diode, when the diode takes place to be unexpected, drive clearance frame 1305 through rotating motor 1306 and rotate, thereby can dismantle the inside diode of determine module 11, and then conveniently classify unqualified product.

In summary, when the silicon carbide diode detection device for functional test is used, firstly, the diodes are conveyed through the conveyer belt 4, the surface of the conveyer belt 4 is provided with the limiting component 5, so that the diodes can move along with the conveyer belt 4 at the same time, and through the arrangement of the damping clamping table 503 and the clamping plate 506 on the surface of the conveyer belt, when the diodes are manually placed in the damping clamping table 503 from above the damping clamping table 503, the inclined clamping blocks 505 are extruded by the outside of the diodes, so that the diodes and the placing springs 504 synchronously contract, and the diodes can be quickly positioned to the central position of the damping clamping table 503 through the clamping blocks 505 on the two sides, so that the feeding process is facilitated, meanwhile, the diodes of different types are conveniently limited, the universality is improved, and meanwhile, through the arrangement of the auxiliary component 3, the pneumatic slider 302 can drive the auxiliary frame 303 to move up and down along the slide rail 301 for adjusting the length of the diode pins, the overlong pins of the diode can be detected by an infrared distance sensor 304 in the diode, the overlong pins of the diode can be quickly cut by a pneumatic scissors 305, the diodes with different types and different pin lengths can be unified in size, the subsequent detection process is convenient, the arrangement of a binocular detection camera 306 is matched with the arrangement of a servo motor 502 in a base 501, the servo motor 502 can drive a damping clamping table 503 to rotate, the rotating angle of each time is 180 degrees, the front and back sides of the diode can be adjusted, the detection precision is improved, then a feeding frame 601 can synchronously rotate under the drive of a stepping motor 602, small push rods 604 on the two sides synchronously move through a positioning frame 603 arranged on the surface of the positioning frame when the positioning frame is contacted with the diode, a positioning plate 605 is pushed to position and clamp the diode, and a grabbing sucker 607 is pushed to be attached to the surface of the diode through an electronic telescopic rod 606, further, the diode can be sucked and grabbed, automatic continuous feeding can be realized through the arrangement of the feeding frame 601, manual feeding is not needed, the detection efficiency is improved, when the feeding frame 601 works, the detection table 9 works under the constant-speed driving of the adjusting motor 10, so that the feeding frame 601 can insert a diode into the connecting seat 1105 on the surface of the detection table 9 when rotating, the diode can be contacted with the oblique positioning hole block 1205 on the surface of the ejection frame 1202 to slide along the sliding groove 1203, the diode can be extruded from two sides to realize the positioning by matching with the micro push rod 1201, the detection accuracy is improved, meanwhile, the small push rod 604 and the electronic telescopic rod 606 synchronously contract, the pin of the diode can be inserted into the connecting seat 1105 and contacted with the elastic guide piece 1107 inside to realize the communication with the circuit board 1102, and the test circuit is connected with a resistor piece 1104 with the resistance value as low as about 0.1 ohm in series, another resistance component 1104 with a very high resistance value is connected in parallel with the diode, the voltage of the power supply 1103 is set to be 1V sine wave, so that the following instruction is executed to perform AC simulation, the capacitance reactance of the power diode is measured in the frequency range of 200 MHz to 2 MHz, then through the mutual matching arrangement between the waste cleaning component 13 and the detection platform 9, the waste cleaning rack 1302 can be pushed to descend under the driving of the hydraulic push rod 1301 in the waste cleaning component 13, the infrared temperature sensor 1304 connected with the straight rod 1303 at the bottom of the waste cleaning rack 1302 is used for detecting, the temperature of the diode is recorded, when an accident occurs to the diode, the ejection rack 1202 can be pushed to ascend under the driving of the micro push rod 1201, the ascending ejection rack 1202 can eject the diode, the integrity of the pin is ensured in the blanking process, and finally, the cleaning rack 1305 is driven to rotate by the rotating motor 1306, thereby can dismantle the inside diode of determine module 11, and then conveniently classify unqualified product.

Claims

1. The silicon carbide diode detection equipment for functional test is characterized by comprising a base (1) and a stabilizing frame (7), wherein a frame (2) is installed on the outer side of the top of the base (1), auxiliary assemblies (3) are connected to two sides of the frame (2), conveying belts (4) are arranged on two sides of the base (1), a limiting assembly (5) is arranged on the surface of each conveying belt (4), a feeding assembly (6) is arranged on the inner side of each conveying belt (4), each auxiliary assembly (3) comprises a sliding rail (301), a pneumatic sliding block (302), an auxiliary frame (303), an infrared distance sensor (304), a pneumatic shear (305) and a binocular detection camera (306), the pneumatic sliding block (302) is installed inside the sliding rail (301), the auxiliary frame (303) is connected to the other end of the pneumatic sliding block (302), and the infrared distance sensor (304) is connected inside the auxiliary frame (303), the pneumatic scissors (305) are arranged on the right side inside the auxiliary frame (303), the binocular detection camera (306) is installed below the inner side of the frame (2), the stabilizing frame (7) is installed at the center of the top of the base (1), a groove (8) is formed in the surface of the stabilizing frame (7), the detecting table (9) is installed inside the stabilizing frame (7), and the bottom of the detecting table (9) is connected with an adjusting motor (10).

2. The silicon carbide diode detection device for functional test according to claim 1, wherein the limiting component (5) comprises a base (501), a servo motor (502), a damping clamping table (503), a placing spring (504), a clamping block (505) and a clamping plate (506), the servo motor (502) is installed inside the base (501), the damping clamping table (503) is connected to the output end of the servo motor (502), the placing spring (504) is installed inside the damping clamping table (503), the clamping block (505) is connected to the other end of the placing spring (504), and the clamping plate (506) is installed on the top of the damping clamping table (503).

3. The silicon carbide diode detection device for functional testing according to claim 2, characterized in that the damping clamping table (503) is connected with the base (501) in a rotating mode through the servo motor (502), the rotation angle of the servo motor (502) is 180 degrees, the clamping plates (506) are symmetrically distributed about the center position of the damping clamping table (503), and the surface of the clamping plates (506) is concave.

4. The silicon carbide diode detection device for functional testing according to claim 1, wherein the feeding assembly (6) comprises a feeding frame (601), a stepping motor (602), a positioning frame (603), a small push rod (604), a positioning plate (605), an electronic telescopic rod (606) and a grabbing suction cup (607), the stepping motor (602) is connected to one side of the feeding frame (601), the positioning frame (603) is mounted on the inner wall of the feeding frame (601), the small push rod (604) is connected to both sides of the positioning frame (603), the positioning plate (605) is connected to the output end of the small push rod (604), the electronic telescopic rod (606) is mounted at the center of the surface of the positioning frame (603), and the grabbing suction cup (607) is connected to the output end of the electronic telescopic rod (606).

5. The silicon carbide diode detection device for functional test according to claim 4, wherein the positioning frames (603) are distributed in a circle shape with equal distance with respect to the inner wall of the loading frame (601), the positioning plates (605) are distributed in a parallel shape with the extension lines of the positioning frames (603), and the positioning plates (605) are in an L-shaped structure.

6. The silicon carbide diode detection device for the functional test according to claim 1, wherein a detection assembly (11) is installed on the surface of the detection table (9), the detection assembly (11) comprises a detection frame (1101), a circuit board (1102), a power supply (1103), a resistor (1104), a connection seat (1105), a slot (1106) and an elastic guide (1107), the circuit board (1102) is installed inside the detection frame (1101), the power supply (1103) is welded on the surface of the circuit board (1102), the resistor (1104) is arranged above and below the right side of the power supply (1103), the connection seat (1105) is arranged at the corresponding position of the right side of the power supply (1103), the slot (1106) is formed in the top of the connection seat (1105), and the elastic guide (1107) is installed on the inner wall of the connection seat (1105).

7. The SiC diode testing apparatus as claimed in claim 6, wherein the elastic leads (1107) are connected to the PCB (1102) via the connecting socket (1105), the elastic leads (1107) are elastically connected to the connecting socket (1105), and the resistors (1104) are provided in two groups and have different resistances.

8. The silicon carbide diode detection device for functional testing according to claim 1, wherein an ejection assembly (12) is installed on two sides of the connection seat (1105), the ejection assembly (12) comprises a micro push rod (1201), an ejection frame (1202), a sliding groove (1203), a micro spring (1204) and an oblique positioning hole block (1205), the output end of the micro push rod (1201) is connected with the ejection frame (1202), the sliding groove (1203) is formed in the upper surface of the ejection frame (1202), the micro spring (1204) is installed inside the sliding groove (1203), and the other end of the micro spring (1204) is connected with the oblique positioning hole block (1205).

9. The silicon carbide diode detection device for functional testing according to claim 1, wherein a waste cleaning assembly (13) is installed on the top of the frame (2), the waste cleaning assembly (13) comprises a hydraulic push rod (1301), a waste cleaning frame (1302), a straight rod (1303), a temperature sensor (1304), a cleaning frame (1305) and a rotating motor (1306), the waste cleaning frame (1302) is connected to the bottom of the hydraulic push rod (1301), the straight rod (1303) is connected to the bottom of the waste cleaning frame (1302), the temperature sensor (1304) is connected to the bottom of the straight rod (1303), the cleaning frame (1305) is connected to one side of the waste cleaning frame (1302), and the rotating motor (1306) is connected to one side of the cleaning frame (1305).

10. The silicon carbide diode detection device for functional testing according to claim 9, wherein the temperature sensor (1304) is fixedly connected with the waste cleaning frame (1302) through the straight rod (1303), the temperature sensor (1304), the straight rod (1303) and the waste cleaning frame (1302) are in the same axis, and extension lines of the temperature sensor (1304) and the straight rod (1303) are vertically distributed.