CN113916854A - 一种辨别精密元件表面缺陷与灰尘的设备及方法 - Google Patents
一种辨别精密元件表面缺陷与灰尘的设备及方法 Download PDFInfo
- Publication number
- CN113916854A CN113916854A CN202111153773.XA CN202111153773A CN113916854A CN 113916854 A CN113916854 A CN 113916854A CN 202111153773 A CN202111153773 A CN 202111153773A CN 113916854 A CN113916854 A CN 113916854A
- Authority
- CN
- China
- Prior art keywords
- light source
- dust
- precision
- dark field
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000428 dust Substances 0.000 title claims abstract description 99
- 230000007547 defect Effects 0.000 title claims abstract description 86
- 238000000034 method Methods 0.000 title claims description 14
- 238000002073 fluorescence micrograph Methods 0.000 claims abstract description 14
- 238000003384 imaging method Methods 0.000 claims abstract description 11
- 230000001678 irradiating effect Effects 0.000 claims abstract description 5
- 230000007246 mechanism Effects 0.000 claims description 27
- 238000012216 screening Methods 0.000 claims description 4
- 238000010276 construction Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 22
- 230000000694 effects Effects 0.000 abstract description 6
- 238000004458 analytical method Methods 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- 238000004020 luminiscence type Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 102000004169 proteins and genes Human genes 0.000 description 3
- 108090000623 proteins and genes Proteins 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 241000238631 Hexapoda Species 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111153773.XA CN113916854A (zh) | 2021-09-29 | 2021-09-29 | 一种辨别精密元件表面缺陷与灰尘的设备及方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111153773.XA CN113916854A (zh) | 2021-09-29 | 2021-09-29 | 一种辨别精密元件表面缺陷与灰尘的设备及方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN113916854A true CN113916854A (zh) | 2022-01-11 |
Family
ID=79237015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202111153773.XA Pending CN113916854A (zh) | 2021-09-29 | 2021-09-29 | 一种辨别精密元件表面缺陷与灰尘的设备及方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113916854A (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114791430A (zh) * | 2022-06-23 | 2022-07-26 | 广州粤芯半导体技术有限公司 | 晶圆缺口检测装置及其检测方法 |
CN114858357A (zh) * | 2022-05-06 | 2022-08-05 | 南通泽恒机电制造厂(普通合伙) | 一种微米级精密模具密封性检测装置 |
CN115015206A (zh) * | 2022-07-15 | 2022-09-06 | 合肥工业大学 | 基于紫外荧光法的玻璃表面洁净度检测装置及检测方法 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0949717A (ja) * | 1995-08-07 | 1997-02-18 | Toyota Motor Corp | ワーク表面キズ検出方法及び装置 |
JPH11326224A (ja) * | 1998-03-15 | 1999-11-26 | Omron Corp | 検査方法及び検査装置 |
US20040012775A1 (en) * | 2000-11-15 | 2004-01-22 | Kinney Patrick D. | Optical method and apparatus for inspecting large area planar objects |
TW200844425A (en) * | 2006-10-31 | 2008-11-16 | Bayer Materialscience Ag | Method and device for detecting defects in a transparent solid article |
CN104279456A (zh) * | 2013-07-05 | 2015-01-14 | 牧德科技股份有限公司 | 用于光学检测的照明***及使用其的检测***、检测方法 |
CN207992608U (zh) * | 2018-01-25 | 2018-10-19 | 惠州高视科技有限公司 | 液晶玻璃屏表面灰尘与内部异物区分的成像机构 |
CN110186937A (zh) * | 2019-06-26 | 2019-08-30 | 电子科技大学 | 剔除灰尘影响的镜面物体表面二维缺陷检测方法及*** |
CN110849906A (zh) * | 2016-06-08 | 2020-02-28 | 周娇 | 一种新型显示面板表面缺陷检测*** |
-
2021
- 2021-09-29 CN CN202111153773.XA patent/CN113916854A/zh active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0949717A (ja) * | 1995-08-07 | 1997-02-18 | Toyota Motor Corp | ワーク表面キズ検出方法及び装置 |
JPH11326224A (ja) * | 1998-03-15 | 1999-11-26 | Omron Corp | 検査方法及び検査装置 |
US20040012775A1 (en) * | 2000-11-15 | 2004-01-22 | Kinney Patrick D. | Optical method and apparatus for inspecting large area planar objects |
TW200844425A (en) * | 2006-10-31 | 2008-11-16 | Bayer Materialscience Ag | Method and device for detecting defects in a transparent solid article |
CN104279456A (zh) * | 2013-07-05 | 2015-01-14 | 牧德科技股份有限公司 | 用于光学检测的照明***及使用其的检测***、检测方法 |
CN110849906A (zh) * | 2016-06-08 | 2020-02-28 | 周娇 | 一种新型显示面板表面缺陷检测*** |
CN207992608U (zh) * | 2018-01-25 | 2018-10-19 | 惠州高视科技有限公司 | 液晶玻璃屏表面灰尘与内部异物区分的成像机构 |
CN110186937A (zh) * | 2019-06-26 | 2019-08-30 | 电子科技大学 | 剔除灰尘影响的镜面物体表面二维缺陷检测方法及*** |
Non-Patent Citations (1)
Title |
---|
李维娟: "《材料科学与工程实验指导书》", 31 March 2016, 冶金工业出版社, pages: 29 - 30 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114858357A (zh) * | 2022-05-06 | 2022-08-05 | 南通泽恒机电制造厂(普通合伙) | 一种微米级精密模具密封性检测装置 |
CN114791430A (zh) * | 2022-06-23 | 2022-07-26 | 广州粤芯半导体技术有限公司 | 晶圆缺口检测装置及其检测方法 |
CN115015206A (zh) * | 2022-07-15 | 2022-09-06 | 合肥工业大学 | 基于紫外荧光法的玻璃表面洁净度检测装置及检测方法 |
CN115015206B (zh) * | 2022-07-15 | 2022-11-11 | 合肥工业大学 | 基于紫外荧光法的玻璃表面洁净度检测装置及检测方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN113916854A (zh) | 一种辨别精密元件表面缺陷与灰尘的设备及方法 | |
US9810633B2 (en) | Classification of surface features using fluoresence | |
US10161883B2 (en) | Wafer inspection method and wafer inspection apparatus | |
US9766179B2 (en) | Chemical characterization of surface features | |
TWI797296B (zh) | 檢測浸於溶液中眼用鏡片屈光度及厚度之系統及方法 | |
EP1001460A1 (en) | Method and apparatus for detecting, monitoring and characterizing edge defects on semiconductor wafers | |
US9201019B2 (en) | Article edge inspection | |
US20160363540A1 (en) | Surface features mapping | |
WO2014089377A1 (en) | Reflective surfaces for surface features of an article | |
CN110208269B (zh) | 一种玻璃表面异物与内部异物区分的方法及*** | |
US20140104604A1 (en) | Distinguishing foreign surface features from native surface features | |
CN110073203B (zh) | 检查透明基材上的缺陷的方法和设备 | |
WO2014194014A1 (en) | A photon emitter array | |
US10024790B2 (en) | Imaging a transparent article | |
JP2004309426A (ja) | 透光性基板の評価方法及び透光性基板の評価装置 | |
CN203069524U (zh) | 大口径光学元件表面缺陷的检测分类装置 | |
KR100965409B1 (ko) | 기판 검사 장치 | |
WO2005054807A2 (en) | Lens inspection | |
JP2024504715A (ja) | ガラス検査 | |
CN114264658B (zh) | Led芯片检测装置及设备 | |
GB2292603A (en) | Testing systems for counting contaminant particles | |
JPH09288063A (ja) | 透明基板の傷検査装置 | |
JP5100371B2 (ja) | ウェハ周縁端の異物検査方法、及び異物検査装置 | |
JP2004309137A (ja) | 石英ガラス材内部の欠陥検査方法および欠陥検査装置 | |
JP2003307499A (ja) | 基板の欠陥観察方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information |
Address after: Room 425, Block C, Bao'an New Generation Information Technology Industrial Park, No. 3, North Second Lane, Chuangye Second Road, 28 Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong 518000 Applicant after: Shenzhen Yibi Technology Co.,Ltd. Address before: 518000 406, block C, Bao'an new generation information technology industrial park, No. 3, North 2nd Lane, Chuangye 2nd Road, Dalang community, Xin'an street, Bao'an District, Shenzhen, Guangdong Province Applicant before: Shenzhen Yibi Technology Co.,Ltd. |
|
CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 518000, 1st Floor, Building B5, Taohuayuan Science and Technology Innovation Ecological Park, Tiegang Community, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province Applicant after: Shenzhen Yibi Technology Co.,Ltd. Address before: Room 425, Block C, Bao'an New Generation Information Technology Industrial Park, No. 3, North Second Lane, Chuangye Second Road, 28 Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong 518000 Applicant before: Shenzhen Yibi Technology Co.,Ltd. |
|
CB02 | Change of applicant information |