CN113899306A - Four-quadrant detector calibration device and method based on optical tweezers system - Google Patents
Four-quadrant detector calibration device and method based on optical tweezers system Download PDFInfo
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- CN113899306A CN113899306A CN202111157751.0A CN202111157751A CN113899306A CN 113899306 A CN113899306 A CN 113899306A CN 202111157751 A CN202111157751 A CN 202111157751A CN 113899306 A CN113899306 A CN 113899306A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
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Abstract
The invention provides a four-quadrant detector calibration device based on an optical tweezers system and a method thereof. The method is characterized in that: the device is composed of a laser light control function module and a light beam positioning function module. The calibration device and the calibration method of the four-quadrant detector in the optical tweezers system utilize the scanning galvanometer to control laser deflection, so that a focused optical trap moves on the focal plane of an objective lens, the four-quadrant detector records four paths of changed voltage signals, the resolution ratio plate is compared, and the relationship between the voltage signals and the displacement of the optical trap is obtained, thereby realizing the high-precision calibration of the four-quadrant detector. The invention improves the positioning precision of the light beam by moving the transverse position of the optical trap of the optical tweezers; the sample does not need to be moved, and the measurement error caused by the movement of the sample is avoided; the method can be used for optical tweezers optical trap rigidity calibration and accurate control of micro-nano particles.
Description
(I) technical field
The invention relates to a calibration device and a calibration method for a four-quadrant detector based on an optical tweezers system, which can be used for calibrating the rigidity of an optical trap and accurately measuring the force of the optical trap in the optical tweezers system and belong to the technical field of optical control.
(II) background of the invention
The optical tweezers technology is rapidly developed, and from the beginning of simple microparticle operation to the reference measurement of cell particle piconiu level, the optical tweezers become an indispensable control and measurement means in important fields of physics, chemistry, biology and the like. The rigidity calibration of the optical trap is the basis for realizing accurate control of the micro-nano particles. In recent years, widely used optical trap rigidity calibration methods mainly adopt a high-price nano-resolution piezoelectric moving platform, move a micron ball fixed on a sample table under the condition that laser is not moved, record voltage signals received by a position detector and a four-quadrant detector, and extract a linear part in scattered light, so that the position calibration is carried out on the four-quadrant detector, and the optical trap detection precision of dozens of nano-resolution is achieved. However, during the movement of the nano platform, the intensity of the small ball scattering signal changing along with time is almost non-linear, only a part similar to the linear can be extracted for calibrating the four-quadrant detector, and the error is large.
The invention discloses a calibration device and a calibration method for a four-quadrant detector based on an optical tweezers system, which are characterized in that under the condition of not moving a sample, a scanning galvanometer is utilized to deflect a light beam, the displacement of an optical trap on a resolution plate is compared, so that the two-dimensional high-precision movement of the optical trap on a focal plane is controlled, voltage signals output by the four-quadrant detector are recorded, the linear relation between the signals and the displacement of the optical trap is obtained, and the calibration of the four-quadrant detector is realized. The invention utilizes laser beams to form an optical trap through the focusing of a high-magnification microscope objective, utilizes a scanning galvanometer to deflect the beams to realize the high-precision movement of the optical trap, uses a second microscope objective to collect forward scattered light, uses a third microscope objective to enable the forward scattered light to uniformly irradiate the surface of a four-quadrant detector, collects the spatial position information of the optical trap and realizes the high-precision calibration of the four-quadrant detector.
Disclosure of the invention
The invention aims to provide a high-precision four-quadrant detector calibration device and a method thereof, which have the advantages of simple and compact structure, easy operation and adjustment, high spatial resolution and the like.
The purpose of the invention is realized as follows:
a calibration device and method for a four-quadrant detector based on an optical tweezers system. The method is characterized in that: the system consists of a laser light control function module and a light beam positioning function module, wherein the laser light control function module is used for controlling the high-precision displacement of the optical trap on the focal plane, and the light beam positioning function module is used for measuring the displacement information of the optical trap and calibrating the four-quadrant detector. The system mainly comprises a laser light source 1, scanning galvanometers 2 and 3, dichroic mirrors 4 and 8, microscope objectives 5, 7 and 9, a culture dish 6, a four-quadrant detector 10, a PC (personal computer) end 11, a scanning galvanometer controller 12, a light beam transverse displacement control module 13, a Kohler lighting system 14 and a CCD (charge coupled device) camera 15.
The laser light control function module mainly comprises a laser light source 1, scanning galvanometers 2 and 3, a dichroic mirror 4, a microscope objective 5, a culture dish 6, a PC computer terminal 11, a scanning galvanometer controller 12 and a light beam transverse displacement control module 13. Laser beams output by the laser light source 1 are reflected by the scanning galvanometers 2 and 3 and the dichroic mirror 4 to enter the microscope objective 5 and penetrate through the culture dish 6 to generate a focused light trap. The PC computer end 11 sends signals to the scanning galvanometer controller 12 to control the scanning galvanometers 2 and 3 to deflect laser, namely the beam transverse displacement control module 13 controls the laser beam to have deflection capability of microradian resolution before entering the microscope objective 5, thereby controlling the high-precision movement of the optical trap on the focal plane of the microscope objective 5. And a USAF1951 resolution plate is placed on the sample stage, the initial angles of the scanning galvanometers 2 and 3 are adjusted, the two-dimensional transverse displacement of the light spots on the CCD image is ensured to be the minimum value, the linear relation between the rotation angles of the scanning galvanometers 2 and 3 and the moving distance of the light spots on the resolution plate is determined, and the displacement of the light traps corresponding to the rotation angles of the scanning galvanometers 2 and 3 on the focal plane of the microscope objective lens 5 is obtained. The light beam positioning function module mainly comprises microscope objectives 7 and 9, a dichroic mirror 8, a four-quadrant detector 10 and a PC (personal computer) terminal 11. The microscope objective 7 collects forward scattering signals of the light trap in the culture dish 6, the forward scattering signals are reflected by the dichroic mirror 8 to enter the microscope objective 9, the distance between the microscope objective 9 and the four-quadrant detector 10 is adjusted, and uniformly amplified light spots are formed and projected to the center of the four-quadrant detector 10. The transverse displacement control module 13 controls the transverse movement of the optical trap on the focal plane to cause the four-quadrant detector 10 to output four voltage signals changing along with time, and measures the linear relation between the light spot displacement and the voltage ratio of the four-quadrant detector, thereby realizing the calibration of the four-quadrant detector.
The four-quadrant position detector 10 is implemented by dividing 1 circular photosurface window into 4 quadrants with equal area, same shape and symmetrical position by using integrated circuit lithography technology. When the light spot moves on the surface of the four-quadrant position detector 10, the light receiving area of each quadrant changes to cause the potential of 4 quadrants to change. And defining signal values of an x axis and a y axis by taking a central point of the surface of the detector as a position zero point and respectively taking boundaries between adjacent quadrant detectors as the x axis and the y axis:
in the formula SxRepresenting the signal value, S, of the four-quadrant position detector 10 in the x-axis directionyRepresenting the signal value, V, of the four-quadrant position detector 10 in the y-axis direction1,V2，V3And V4Respectively representing the voltage values, L, measured in the four quadrants of the four-quadrant position detector 10xAnd LyRepresenting the length of the spot on the surface of the four quadrant detector in the x and y directions. The scanning galvanometers 2 and 3 deflect the laser beams with the precision of micro radian, the laser beams are focused by the high-power microscope objective 5, and the displacement precision of the optical trap is improved by the magnification of the microscope objective 5.
Comparing the displacement of the optical trap on the USAF1951 resolution plate on the focal plane of the microscope objective 5, determining the linear relationship between the rotation angle of the scanning galvanometers 2 and 3 and the displacement of the spot on the resolution plate, and obtaining the rotation angle theta of the scanning galvanometers 2 and 31And theta2Corresponding to the displacement F of the optical trap in the focal plane of the microscope objective 5xAnd Fy. Calculating the signal values S of the x-axis and the y-axis measured by the four-quadrant detectorxAnd SyFor light trap in microscope objective5 focal plane displacement FxAnd FyRatio R ofx＝Sx/FxAnd Ry＝Sy/FyThe linear relation between the signal value of the four-quadrant detector 10 and the displacement of the optical trap on the focal plane of the microscope objective 5 is obtained, so that the calibration of the four-quadrant detector is realized.
(IV) description of the drawings
Fig. 1 is a structural schematic diagram of a calibration device and a calibration method thereof based on an optical tweezers system four-quadrant detector.
FIG. 2 is a schematic diagram of a beam lateral displacement control module.
FIG. 3 is a schematic diagram of a four-quadrant detector and its pre-microscope objective lens for collecting scattered light spots.
(V) detailed description of the preferred embodiments
The invention is further illustrated below with reference to specific examples.
A calibration device and method for a four-quadrant detector based on an optical tweezers system. Laser beams output by a laser light source 1 with the central wavelength of 1064nm are reflected by scanning galvanometers 2 and 3 and a dichroic mirror 4 to enter a 100-time oil-immersed microscope objective 5 to generate a focusing light trap, a PC (personal computer) end 11 sends signals to a scanning galvanometer controller 12 to control the scanning galvanometers 2 and 3 to deflect the laser beams, namely a beam transverse displacement control module 13 controls the laser beams to have deflection capacity of micro-radian resolution before entering the microscope objective 5, so that the high-precision movement of the light trap on a focal plane of the microscope objective 5 is controlled.
In the system, a USAF1951 resolution plate is placed on a sample table, initial angles of scanning galvanometers 2 and 3 are adjusted, two-dimensional transverse displacement of a light spot on a CCD image is guaranteed to be the minimum value, a light beam transverse displacement control module 13 controls an optical trap to move on the resolution plate, a CCD camera 15 measures actual displacement of the optical trap on the resolution plate, a linear relation between a rotation angle of the scanning galvanometers 2 and 3 and a moving distance of the optical trap on the resolution plate is determined, and displacement of the optical trap corresponding to the rotation angle of the scanning galvanometers 2 and 3 on a focal plane of a microscope objective lens 5 is obtained.
The light trap penetrates through the culture dish 6, the forward scattering signal is collected by the 40-time microscope 7, the forward scattering signal is reflected by the dichroic mirror 8 to enter the microscope objective 9, the distance between the microscope objective 9 and the four-quadrant detector 10 is adjusted, the distance r1 between the four-quadrant detector 10 and the focal plane of the microscope objective 9 is slightly smaller than the focal length f1 of the microscope objective 9, a uniformly amplified light spot is formed and projected to the center of the four-quadrant detector 10, and the positioning accuracy is improved.
The transverse displacement control module 13 controls the transverse movement of the optical trap on the focal plane to cause the four-quadrant detector 10 to output four paths of voltage signals changing with time, and the signal values S of the x axis and the y axis of the four-quadrant detector are calculated according to the formula (1-2)xAnd SyAccording to the angle of rotation theta of the scanning mirrors 2 and 31And theta2Corresponding to the displacement F of the optical trap in the focal plane of the microscope objective 5xAnd FxTo obtain the linear relation R between the signal value of the four-quadrant detector 10 and the displacement of the optical trap on the focal plane of the microscope objective 5x＝Sx/FxAnd Ry＝Sy/FyTherefore, the calibration of the four-quadrant detector is realized. After calibration, only the signal value of the four-quadrant detector 10 needs to be measured, and the actual displacement of the optical trap can be obtained according to the linear relation between the signal value of the four-quadrant detector 10 and the displacement of the optical trap on the focal plane of the microscope objective 5.
Claims (4)
1. A calibration device and method for a four-quadrant detector based on an optical tweezers system. The method is characterized in that: the system consists of a laser light control function module and a light beam positioning function module, wherein the laser light control function module is used for controlling the high-precision displacement of the optical trap on the focal plane, and the light beam positioning function module is used for measuring the displacement information of the optical trap and calibrating the four-quadrant detector. The system mainly comprises a laser light source 1, scanning galvanometers 2 and 3, dichroic mirrors 4 and 8, microscope objectives 5, 7 and 9, a culture dish 6, a four-quadrant detector 10, a PC (personal computer) end 11, a scanning galvanometer controller 12, a light beam transverse displacement control module 13, a Kohler lighting system 14 and a CCD (charge coupled device) camera 15.
2. The calibration device and method for the four-quadrant detector based on the optical tweezers system according to claim 1, wherein the laser light control module mainly comprises a laser light source 1, scanning galvanometers 2 and 3, a dichroic mirror 4, a microscope objective 5, a culture dish 6, a PC (personal computer) terminal 11, a scanning galvanometer controller 12 and a light beam lateral displacement control module 13. Laser beams output by the laser light source 1 are reflected by the scanning galvanometers 2 and 3 and the dichroic mirror 4 to enter the microscope objective 5 and penetrate through the culture dish 6 to generate a focused light trap. The PC computer end 11 sends signals to the scanning galvanometer controller 12 to control the scanning galvanometers 2 and 3 to deflect laser, namely the beam transverse displacement control module 13 controls the laser beam to have deflection capability of microradian resolution before entering the microscope objective 5, thereby controlling the high-precision movement of the optical trap on the focal plane of the microscope objective 5.
3. The calibration device and method for the four-quadrant detector based on the optical tweezers system according to claim 1, wherein a USAF1951 resolution plate is placed on the sample stage, the initial angles of the scanning galvanometers 2 and 3 are adjusted, the two-dimensional transverse displacement of the light spots on the CCD image is guaranteed to be the minimum value, the linear relation between the rotation angles of the scanning galvanometers 2 and 3 and the moving distance of the optical trap on the resolution plate is determined, and the displacement of the optical trap corresponding to the rotation angles of the scanning galvanometers 2 and 3 on the focal plane of the microscope objective lens 5 is obtained.
4. The calibration device and method for the four-quadrant detector based on the optical tweezers system according to claim 1, wherein the light beam positioning function module mainly comprises microscope objectives 7 and 9, a dichroic mirror 8, a four-quadrant detector 10 and a PC (personal computer) terminal 11. The microscope objective 7 collects forward scattering signals of the light trap in the culture dish 6, the forward scattering signals are reflected by the dichroic mirror 8 to enter the microscope objective 9, the distance between the microscope objective 9 and the four-quadrant detector 10 is adjusted, and uniformly amplified light spots are formed and projected to the center of the four-quadrant detector 10. The transverse displacement control module 13 controls the transverse movement of the optical trap on the focal plane to cause the four-quadrant detector 10 to output four voltage signals changing along with time, and measures the linear relation between the light spot displacement and the voltage ratio of the four-quadrant detector, thereby realizing the calibration of the four-quadrant detector.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116233606A (en) * | 2023-05-09 | 2023-06-06 | 之江实验室 | Automatic focus following device and method for light spots |
| CN117191714A (en) * | 2023-09-06 | 2023-12-08 | 深圳市凯佳光学科技有限公司 | Single-molecule mechanical testing system and method based on double-optical-trap optical tweezers |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110799829A (en) * | 2017-07-06 | 2020-02-14 | 特拉维夫大学拉莫特有限公司 | System and method for three-dimensional label-free optical imaging of biological cell samples in environmental chambers |
-
2021
- 2021-09-27 CN CN202111157751.0A patent/CN113899306A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110799829A (en) * | 2017-07-06 | 2020-02-14 | 特拉维夫大学拉莫特有限公司 | System and method for three-dimensional label-free optical imaging of biological cell samples in environmental chambers |
Non-Patent Citations (3)
| Title |
|---|
| 梁言生 等: "功率谱密度法标定光镊的三维光阱刚度", 《光子学报》, vol. 43, no. 5, pages 0535001 - 1 * |
| ***;魏衡华;谷勇强;李银妹;: "光镊***中QD器件标定与非线性修正技术研究", 自动化仪表, no. 09, pages 4 - 6 * |
| 黄璐 等: "四象限探测器位移测量的标定方法", 《光学学报》, vol. 31, no. 10, pages 1004001 - 1 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116233606A (en) * | 2023-05-09 | 2023-06-06 | 之江实验室 | Automatic focus following device and method for light spots |
| CN117191714A (en) * | 2023-09-06 | 2023-12-08 | 深圳市凯佳光学科技有限公司 | Single-molecule mechanical testing system and method based on double-optical-trap optical tweezers |
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