CN113866192A - Microscopic imaging method and system based on transparent scintillator film - Google Patents
Microscopic imaging method and system based on transparent scintillator film Download PDFInfo
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- CN113866192A CN113866192A CN202111138816.7A CN202111138816A CN113866192A CN 113866192 A CN113866192 A CN 113866192A CN 202111138816 A CN202111138816 A CN 202111138816A CN 113866192 A CN113866192 A CN 113866192A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Abstract
The invention relates to a microscopic imaging method and a system based on a transparent scintillator film, which belong to the field of high-resolution X-ray imaging and are used for solving the problem that a microscope cannot obtain a complete microstructure, wherein the method comprises the following steps: arranging a transparent scintillator film on an observation surface of a sample to be observed; determining an observation area on the observation surface of the sample to be observed by using a microscope; irradiating a non-observation surface of the sample to be observed by using X rays, wherein the observation surface and the non-observation surface are front and back surfaces; and observing the X ray through the observation area and the transparent scintillator film by using the microscope to obtain an image. The technical scheme provided by the invention can improve the precision of microscopic imaging.
Description
Technical Field
The invention belongs to the field of high-resolution X-ray imaging, and particularly relates to a microscopic imaging method and system based on a transparent scintillator film.
Background
The microscope is an optical instrument composed of a lens or a combination of several lenses, and is mainly used for magnifying tiny objects which can be seen by naked eyes of people.
When observing microstructures, such as cellular structures, a local area of the object surface is magnified by a microscope to obtain a clear image.
However, the microscope detects by using visible light, and in the observation process, some microstructures refract and reflect the visible light or even block the visible light path, so that some microstructures are not completely displayed, and the imaging accuracy is affected.
Disclosure of Invention
In view of the above analysis, the present invention aims to provide a method and a system for microscopic imaging based on a transparent scintillator film, so as to avoid the influence of microstructures on the observation result of a microscope, thereby improving the precision of the microscopic imaging.
The purpose of the invention is mainly realized by the following technical scheme:
in one aspect, the present invention provides a microscopic imaging method based on a transparent scintillator film, comprising:
arranging a transparent scintillator film on an observation surface of a sample to be observed;
determining an observation area on the observation surface of the sample to be observed by using a microscope;
irradiating a non-observation surface of the sample to be observed by using X rays, wherein the observation surface and the non-observation surface are front and back surfaces;
and observing the X ray through the observation area and the transparent scintillator film by using the microscope to obtain an image.
Further, the microscope is an inverted microscope.
Further, the material of the transparent scintillator thin film is perovskite scintillator.
Further, the transparent scintillator thin film is a thin film obtained by filtering the dispersion system of the perovskite scintillator.
Further, the particle size of the perovskite scintillator in the dispersion system of the perovskite scintillator is in a nanometer level.
In another aspect, an embodiment of the present invention provides a microscopic imaging system based on a transparent scintillator film, including:
an X-ray source, a transparent scintillator film, and a microscope;
the X-ray emitted by the X-ray source passes through the transparent scintillator film to obtain a visible light beam; the microscope is used for observing the visible light beam and observing a sample to be observed through the transparent scintillator film.
Further, the microscope is an inverted microscope, and the X-ray source is arranged in an illumination system of the inverted microscope.
Furthermore, the microscope is an inverted microscope, the transparent scintillator film is arranged on an object stage of the inverted microscope, a sample to be observed is arranged on the transparent scintillator film, and the X-ray source is arranged above the sample to be observed.
Further, the material for preparing the transparent scintillator film comprises: CsPbBr3:Ce3+Scintillator, CsPbBr3+ PPO scintillator or CsPbBr3A scintillator.
Further, the system further comprises: a charge coupled device and a computer;
the charge coupling element is arranged on the microscope and is in communication connection with the computer;
the charge coupled device is used for uploading the image observed by the microscope to the computer.
Compared with the prior art, the invention can at least realize one of the following technical effects:
1. the imaging based on the X-ray can reflect the characteristics of the internal structure of the object, and the influence of the microstructure on the observation of the microscope can be eliminated by combining the two images. The transparent scintillator film can transmit all visible light, so that the observation of a detection person on an observation surface of a sample to be observed is not influenced, X rays can be converted into visible light, and visible light imaging and X ray imaging are respectively carried out on an observation target. The X-ray source is used in conjunction with a microscope to allow the examiner to see both optical microscopy and X-ray imaging of the observation area through the microscope alone. Therefore, the method can avoid the influence of the microstructure on the observation result of the microscope, thereby improving the precision of microscopic imaging.
2. The only difference between a normal microscope and an inverted microscope is that the objective lens is inverted from the illumination system, the former being below the stage and the latter being above the stage. Whereas in the present invention, X-rays are used in the observation in addition to the visible light emitted by the illumination system, it is clear that the structure of the inverted microscope provides sufficient space for the placement and use of the X-ray source.
3. In order to ensure the definition of X-ray imaging, the perovskite scintillator with the nano-grade grain diameter is selected as the material of the transparent scintillator film. Meanwhile, a transparent film is obtained by filtering the dispersion system of the perovskite scintillator.
4. The charge coupled device and the computer are used for recording visible light images and X-ray images observed by the microscope, so that subsequent data processing and image analysis are facilitated, and the observation precision is further improved.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and drawings.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, wherein like reference numerals are used to designate like parts throughout.
FIG. 1 is an optical microscopic image of a capped syringe needle;
FIG. 2 is an X-ray image of a capped syringe needle;
FIG. 3 is a glass-based transparent scintillator film placed over the Chinese academy of sciences' logo;
FIG. 4 is a transparent scintillator film based microscopic imaging system according to an embodiment of the present invention;
FIG. 5 is optical microscopy imaging of onion epidermal cells;
FIG. 6 is an X-ray image of epidermal cells of onion;
FIG. 7 is an optical microscopic image of a copper mesh;
fig. 8 is an X-ray image of a copper mesh.
Reference numerals:
1-X-ray source, 2-transparent scintillator film, 3-microscope, 4-visible light CCD, 5-computer, 6-sample to be observed, 31-objective table, 32-microscope conversion disk, 33-focusing knob, 34-eyepiece, A-X ray and B-scintillator irradiation luminescence.
Detailed Description
The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, which form a part hereof, and which together with the embodiments of the invention serve to explain the principles of the invention and not to limit its scope.
When an object is observed by a microscope, the observation effect is easily affected by the structure of the object, for example, a capped syringe needle is observed by a microscope, and the observation result is shown in fig. 1. In fig. 1, the middle dark colored region is the observed capped syringe needle. In practice, there is a gap between the cap and the syringe needle, as shown in figure 2.
Since the macroscopic gap, such as a capped syringe needle, is subject to errors during microscopic observation, the microstructure, such as a cell, is subject to errors that interfere with the observation of the inspector.
In view of the above technical problems, an embodiment of the present invention provides a microscopic imaging method based on a transparent scintillator film, including:
a. and arranging a transparent scintillator film on the observation surface of the sample to be observed.
b. And determining an observation area on an observation surface of the sample to be observed by using a microscope.
c. And irradiating the non-observation surface of the sample to be observed by utilizing X rays, wherein the observation surface and the non-observation surface are front and back surfaces.
d. An image is obtained by observing X-rays through the observation region and the transparent scintillator film with a microscope.
It should be noted that the serial numbers a-d are only for convenience of description and do not represent the process flow, i.e. the technical features do not exist in the sequence of the process.
In the embodiment of the invention, after the sample to be observed is observed by using the microscope, the sample to be observed is subjected to X-ray imaging, and meanwhile, the X-ray passing through the sample to be observed is converted into visible light by the scintillator so as to be convenient for a detection person to observe.
In order to implement the above method, the following two points need to be satisfied:
first, a sample to be observed is observed using a microscope.
Second, a transparent scintillator film is used.
In the first place, the imaging principle of the microscope is to magnify a part of the sample to be observed, usually several hundred or even thousands of times, i.e. the cells or other microstructures in the field of view of the microscope are actually only a very small part of the sample to be observed. The structure of the material within the field of view of the microscope is usually only known to the detector, whereas conventional X-ray detection is usually performed on a relatively macroscopic area. For example, CT (Computed Tomography) of the brain scans a functional region of the human brain, but does not obtain X-ray images of cellular tissues such as neurons in the region. Therefore, when a sample to be observed is observed using a microscope, the X-ray imaging to be observed includes not only conventional X-ray imaging but also X-ray imaging of a microstructure such as a cell. That is, X-ray imaging (feature b and feature c) is performed on the observation region observed by the microscope.
For the second strip, a scintillator film was used for converting X-rays into visible light for observing X-ray imaging with a microscope. Specifically, a transparent scintillator film (feature a and feature d) is provided on the observation surface of the sample to be observed to both convert X-rays into visible light and acquire X-ray imaging by a microscope. The transparent scintillator film is used, so that a detection person can determine the observation area of the sample to be observed through the scintillator film. The transparency of the transparent scintillator film is shown in fig. 3, and the mark under the film can be clearly seen by covering the transparent scintillator film on the mark. Specifically, in general, the closer an object to be observed is to human eyes, the smaller the influence of the transparency of a medium between the object to be observed and the human eyes on the observation of an observer. For a microscope, the observation distance is not more than 2 cm. Therefore, in the embodiment of the present invention, the transparency of the transparent scintillator film must be satisfied within the above-described observation range, and not affect the observation of the object by the microscope.
In the embodiment of the invention, an inverted microscope is selected in order to facilitate the installation of the X-ray source on the microscope or the arrangement of the X-ray source in the detection process. The illumination system of the inverted microscope is above the stage, i.e., outside the microscope, thus making it easier to mount and locate the X-ray source.
In the embodiment of the invention, the scintillator film is prepared by adopting the perovskite scintillator with the nano-scale particle size, so that the conversion efficiency of X rays into visible light is improved. The scintillator material with the particle size of nanometer level, such as scintillator nanometer particles, is selected. According to the cube tight packing model, the smaller the cube is, the more densely the cube distribution on the surface of the stack is, and finally the surface of the stack approaches to be smooth. The filter cake on the filter membrane can be regarded as a stacking body obtained by stacking the scintillator material, so when the particles of the scintillator material are in a nanometer level, the flatness of the surface of the film can be effectively ensured.
In order to obtain a transparent scintillator film, embodiments of the present invention provide a method of preparing a transparent scintillator film, in which a dispersion of a perovskite scintillator is a film obtained by filtration. After filtration of the dispersion, the scintillator material is spread evenly over the filter membrane, and the dispersion medium is passed through the filter membrane. In this way, the scintillator material is spread evenly over the filter membrane in a filtering manner, so that a scintillator film of uniform texture is obtained. In the film, the scintillator is uniformly distributed and has unique components, compared with the prior art that the polystyrene and the scintillator material are mixed together, the content of the scintillator material in unit area of the film is far greater than that in the prior art. Even if a protective layer is formed on the film by using a film protective material polystyrene, due to the compactness of a filter cake, the content of the scintillator material in a unit area is not reduced by adding the polystyrene in a single layer of the scintillator material, so that the film prepared by the embodiment of the invention has extremely high resolution.
Specifically, the method comprises the following steps:
step 1, preparing a scintillator dispersion system.
In an embodiment of the present invention, the scintillator is a perovskite scintillator, comprising: CsPbBr3、CsPbBr3+ PPO (diphenyloxazole) and CsPbBr3:Ce3+The concentration of the scintillator in the scintillator dispersion system is positively correlated with the thickness of the scintillator layer.
Step 2, uniformly distributing the scintillator dispersion system on a filter membrane;
step 3, allowing the dispersion liquid of the scintillator dispersion system to pass through a filter membrane to form a scintillator layer on the filter membrane;
and 4, forming a protective layer on the surface of the scintillator layer by using the thin film protective material.
In the embodiment of the invention, in the scintillator dispersion system, the concentration of the scintillator nano-particles is controlled to be 60 mg/ml-80 mg/ml, and preferably, the concentration of the scintillator nano-particles is 70 mg/ml.
Aiming at the scintillator material with the nano-scale particle size, the filter membrane adopted by the invention comprises: polyvinylidene fluoride membranes. The filter membrane can also be a polycarbonate membrane, an alumina filter membrane, a nylon membrane or a nitrocellulose membrane.
In order to further obtain a thin film with uniform and compact texture, the pressure on the side of the filter membrane where the dispersion system is poured is higher than the pressure on the side of the filter membrane where the liquid dispersion medium flows out by creating a pressure difference on two sides of the filter membrane. The filter cake obtains pressure by virtue of the pressure difference on two sides of the filter membrane, so that the filter cake is more compact. Manufacturing pressure differentials include pressure filtration and pressure reduction filtration. For reduced pressure filtration, the pressure on the side of the filtration membrane where the dispersion system is poured is atmospheric pressure, and the pressure on the side of the filtration membrane where the liquid dispersion medium flows out is negative pressure. Meanwhile, the method can also reduce the filtering time, thereby shortening the process of forming the scintillator film.
An embodiment of the present invention further provides a microscopic imaging system based on a transparent scintillator film, as shown in fig. 4, including: an X-ray source 1, a transparent scintillator film 2 and a microscope 3. Wherein the microscope 3 comprises: a stage 31, a power conversion plate 32, a focusing knob 33 and an eyepiece 34.
X-rays A emitted by an X-ray source 1 pass through a transparent scintillator film 2 to obtain radiation luminescence B (visible light beam) of a scintillator; the microscope is used to observe the irradiance B of the scintillator and to observe the sample 6 to be observed through the transparent scintillator film 2. Preferably, the microscope 3 is selected from an inverted microscope.
In an embodiment of the present invention, the X-ray source 1 may be integrated in the illumination system of the microscope 3, or may be a separate X-ray source. When the microscope 3 is an inverted microscope and a separate X-ray source is used, the transparent scintillator film 2 is disposed on the stage 31 of the inverted microscope 3, the sample 6 to be observed is disposed on the transparent scintillator film 2, and the X-ray source 1 is disposed above the sample 6 to be observed.
As can be seen from fig. 4, the examiner can observe two images through the eyepiece 34, and in order to facilitate further analysis, a visible-light CCD (Charge-coupled Device) 4 is provided on the microscope 3, and the observed images are uploaded to the computer 5 through the visible-light CCD 4. Wherein, visible light CCD4 and computer 5 are communication connection, include: wired connections and wireless connections.
In the embodiment of the invention, CsPbBr is selected3:Ce3+Scintillator, CsPbBr3+ PPO scintillator or CsPbBr3The scintillator is used as a material for preparing the transparent scintillator film 2.
For the feasibility of the above examples, the present invention takes the observation of copper mesh and onion epidermal cells as examples, respectively, and example 1 and example 2 are given, respectively, and example 3 is given to illustrate the process of preparing the transparent scintillator film 2.
Example 1
(1) The transparent scintillator film 2 is placed on an object stage 31 of a microscope 3 (a fluorescence inverted microscope), the onion epidermal cell slice is placed above the transparent scintillator film 2, the onion epidermal cell slice needs to be tightly attached to the transparent scintillator film 2, the X-ray source 1 is placed right above an imaging object, before use, the angle of the X-ray source 1 needs to be adjusted, the emission plane of the X-ray A is parallel to the onion epidermal cell slice, and the intensity of the X-ray A emitted by the X-ray source 1 reaching all the onion epidermal cell slice is the same.
(2) The onion epidermal cell section is observed through an ocular lens 34 of a microscope 3 (a fluorescence inverted microscope), an area needing imaging is found, a zoom lens switching disc 32 is adjusted to obtain the required magnification, and then a focusing knob 33 is adjusted to enable the field of vision of the onion epidermal cell section in the ocular lens 34 to be clear. Visible light enters the microscope 3 (fluorescence inverted microscope) and is imaged in the microscope 3. The visible light CCD4 transmits the optical microscopic image to the computer 5 via a data transmission line to obtain the optical microscopic image of the onion epidermal cell slice.
(3) The X-ray source 1 is started, the X-ray A emitted by the X-ray source 1 penetrates through the onion epidermal cell slice, and the X-ray A reaching the transparent scintillator film 2 has different intensity due to different absorption of X-rays by each part of the onion epidermal cell slice, so that the X-ray A received by each part of the transparent scintillator film 2 has different intensity, and the irradiation luminescence B intensity of each part of the scintillator is different. Since the focal plane of the X-ray imaging is different from that of the optical imaging, the focus knob 33 of the microscope 3 (fluorescence inverted microscope) is adjusted to make the X-ray microscopic imaging image clear. The radiation emitted by the transparent scintillator film 2 enters the microscope 3 (fluorescence inverted microscope) to reach the visible light CCD4, and then is transmitted to the computer 5 through the data transmission line, so as to obtain the X-ray microscopic imaging image of the imaging object.
(4) And obtaining an optical microscopic imaging picture and an X-ray microscopic imaging picture of the same position of the onion epidermal cell slice, and realizing the co-positioning of the optical microscopic imaging and the X-ray microscopic imaging.
As shown in fig. 5, the boundaries between epidermal cells observed by the microscope are clear and regular, but in fig. 6, the X-ray image shows that the boundaries between cells are not as clear as in fig. 5, nor are the boundaries regular, and some white substance is present between the boundaries. That is, FIG. 6 shows many details that are not observed in FIG. 5, and the microstructure of the onion epidermal cells apparently affects the observation of the onion epidermis by the microscope.
Example 2
(1) The method comprises the steps of placing a transparent scintillator film 2 on an object stage 31 of a microscope 3 (a fluorescence inverted microscope), placing a copper mesh above the transparent scintillator film 2, wherein the copper mesh needs to be tightly attached to the transparent scintillator film 2, placing an X-ray source 1 right above the copper mesh, and adjusting the angle of the X-ray source 1 before use to enable the emission plane of an X-ray A to be parallel to the copper mesh, so that the intensity of the X-ray A emitted by the X-ray source 1 reaching all parts of the copper mesh is the same.
(2) The copper mesh is observed through an eyepiece 34 of a microscope 3 (a fluorescence inverted microscope), an area needing imaging is found, a lens conversion disc 32 is adjusted to obtain a desired magnification factor, a focusing knob 33 is adjusted to enable the visual field of an object to be imaged in the eyepiece 34 to be clear, visible light enters the microscope 3 (the fluorescence inverted microscope) through a light passage 6, the imaged object passes through a visible light CCD4 to be transmitted to a computer 5 through a data transmission line 12, and an optical microscopic imaging image of the copper mesh is obtained.
(3) The X-ray source 1 is started, X-rays A emitted by the X-ray source 1 penetrate through the copper mesh, and the X-rays A reaching the transparent scintillator film 2 are different in intensity due to different absorption of X-rays by each part of the copper mesh, so that the X-rays A received by each part of the transparent scintillator film 2 are different in intensity, and therefore the irradiation luminescence B intensity of each scintillator is different. Since the focal plane of the X-ray imaging is different from that of the optical imaging, the focus knob 33 of the microscope 3 (fluorescence inverted microscope) is adjusted to make the X-ray microscopic imaging image clear. The radiation emitted from the transparent scintillator film 2 enters the microscope 3 (fluorescence inverted microscope) to reach the visible light CCD4, and is transmitted to the computer 5 through the data transmission line 12, so as to obtain the X-ray microscopic image of the copper mesh.
(4) And obtaining an optical microscopic imaging picture and an X-ray microscopic imaging picture of the same position of the copper mesh, and realizing the co-positioning of the optical microscopic imaging and the X-ray microscopic imaging.
Fig. 7 shows the copper mesh structure obtained by the microscope imaging, and fig. 8 shows the copper mesh structure obtained by the X-ray imaging. Since both images were taken by the same microscope at the same magnification, the mesh pore diameters should be theoretically the same, but it is clear that the mesh pore diameters in fig. 8 are larger than those in fig. 7. Namely, the structure of the copper mesh or impurities on the copper mesh influence the observation of the copper mesh by the microscope.
Example 3
Preparation of scintillator CsPbBr3The film comprises the following specific preparation steps:
firstly, washing a suction filtration upper bottle and a volumetric flask by using absolute ethyl alcohol and pure water, selecting the volumetric flask with the sand core diameter of 20mm, putting the volumetric flask into a 70-degree oven after washing, and before film manufacturing, firstly ensuring that no water and no ethyl alcohol exist in the suction filtration upper bottle and the volumetric flask.
Step two, weighing 500mg of polystyrene, dissolving the polystyrene in 10ml of toluene, and preparing a 50mg/ml polystyrene toluene solution.
Rinsing the upper vacuum-filtration bottle with toluene for three times, placing a smooth and scratch-free polyvinylidene fluoride membrane with the size of 25mm multiplied by 25mm and the pore diameter of 200nm between the upper vacuum-filtration bottle and the volumetric flask, clamping the upper vacuum-filtration bottle and the volumetric flask with a stainless steel clamp, rinsing the upper vacuum-filtration bottle with toluene again, observing whether toluene leaks between the upper vacuum-filtration bottle and the polyvinylidene fluoride membrane, and if no toluene leaks, sucking 2ml of CsPbBr with the concentration of 70mg/ml with a plastic suction pipe3The vacuum pump is started, the toluene slowly falls into the volumetric flask along with the gradual increase of the air pressure difference between the volumetric flask and the ambient atmospheric pressure, and CsPbBr3The nano particles (with the particle diameter of 5nm-10nm) can be remained on the polyvinylidene fluoride film to form a scintillator film layer.
And fourthly, after the vacuum pump works for a period of time, removing the stainless steel clamp at the moment until the filtering of the scintillator dispersion system in the suction filtration upper bottle is finished, then removing the suction filtration upper bottle, and turning off the vacuum pump at the moment.
Observing the pressure in the volumetric flask to return to the standard atmospheric pressure through an instrument on a vacuum pump, then sucking 1ml of polystyrene solution by using a plastic suction pipe, slowly dripping the polystyrene solution on a scintillator film layer on a polyvinylidene fluoride film until the scintillator film layer is fully paved with the polystyrene solution, starting the vacuum pump at the moment, slowly dropping toluene in the polystyrene solution into the volumetric flask, and leaving polystyrene in CsPbBr3On the scintillator film layer, the vacuum pump is closed until the toluene is completely volatilized and filtered, and the inside of the bottle is treatedAfter the pressure of the reaction solution is restored to the standard atmospheric pressure, the prepared CsPbBr is taken down3A scintillator film.
And step six, carefully lifting the prepared film along the edge of the film by using tweezers, and transferring the scintillator film onto a quartz plate.
The obtained scintillator film has uniform texture, and comprises a polystyrene protective layer and CsPbBr3A scintillator thin film layer, wherein the protective layer has a thickness of 5 μm and the scintillator layer has a thickness of 30 μm.
The degree of transparency of the film obtained in example 3 is shown in FIG. 3. With CsPbBr3:Ce3+Scintillator and CsPbBr3+ PPO scintillator as raw material to prepare scintillator film, the method is the same as example 3.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (10)
1. A method of microscopic imaging based on a transparent scintillator film, comprising:
arranging a transparent scintillator film on an observation surface of a sample to be observed;
determining an observation area on the observation surface of the sample to be observed by using a microscope;
irradiating a non-observation surface of the sample to be observed by using X rays, wherein the observation surface and the non-observation surface are front and back surfaces;
and observing the X ray through the observation area and the transparent scintillator film by using the microscope to obtain an image.
2. The method of claim 1,
the microscope is an inverted microscope.
3. The method of claim 1,
the transparent scintillator film is made of perovskite scintillator.
4. The method of claim 3,
the transparent scintillator film is a film obtained by filtering the dispersion system of the perovskite scintillator.
5. The method of claim 4,
the particle size of the perovskite scintillator in the perovskite scintillator dispersion system is nano-scale.
6. A microscopic imaging system based on a transparent scintillator film, comprising:
an X-ray source, a transparent scintillator film, and a microscope;
the X-ray emitted by the X-ray source passes through the transparent scintillator film to obtain a visible light beam; the microscope is used for observing the visible light beam and observing a sample to be observed through the transparent scintillator film.
7. The system of claim 6,
the microscope is an inverted microscope, and the X-ray source is arranged in an illumination system of the inverted microscope.
8. The production system according to claim 6,
the microscope is an inverted microscope, the transparent scintillator film is arranged on an objective table of the inverted microscope, a sample to be observed is arranged on the transparent scintillator film, and the X-ray source is arranged above the sample to be observed.
9. The system of claim 6,
the preparation material of the transparent scintillator film comprises: CsPbBr3:Ce3+Scintillator, CsPbBr3+ PPO scintillator or CsPbBr3A scintillator.
10. The system as claimed in claims 6-8, further comprising: a charge coupled device and a computer;
the charge coupling element is arranged on the microscope and is in communication connection with the computer;
the charge coupled device is used for uploading the image observed by the microscope to the computer.
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