CN113777416A - Compact millimeter wave test system and method for microchip antenna - Google Patents
Compact millimeter wave test system and method for microchip antenna Download PDFInfo
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- CN113777416A CN113777416A CN202111066088.3A CN202111066088A CN113777416A CN 113777416 A CN113777416 A CN 113777416A CN 202111066088 A CN202111066088 A CN 202111066088A CN 113777416 A CN113777416 A CN 113777416A
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Abstract
The invention discloses a compact millimeter wave test system and a compact millimeter wave test method for a microchip antenna, which belong to the field of microchip antenna test; the instrument subsystem comprises a main control computer, a switch, a vector network analyzer and a turntable control device; the camera bellows divides the system to include microchip antenna feed platform module, test revolving stage module, S parameter test module, probe, microchip antenna, auxiliary antenna and receiving module. The system has high integration level, compact structure and convenient movement; the spherical near field and far field test functions are supported; the testing distance is adjustable, and the testing requirements of antennas with different calibers are met.
Description
Technical Field
The invention belongs to the field of microchip antenna testing, and particularly relates to a compact millimeter wave testing system and method for a microchip antenna.
Background
In recent years, with the rapid development of equipment such as high-precision end guidance seeker, short-distance communication, millimeter wave array radar, remote sensing and safety monitoring in China, the equipment is continuously developed towards high frequency band and miniaturization, and the used antenna is rapidly developed towards an on-chip antenna. The microchip antenna is a product of equipment high integration development, and the differences from the traditional antenna comprise: the structure size is more compact, the integration level can be very high, and the size is smaller in a millimeter wave frequency band; the feed forms such as microstrip lines and metal interconnection are adopted instead of the traditional coaxial or waveguide feed forms, so that the integrated design is facilitated; the chip integration process or the substrate integration process can be adopted, the method is more suitable for integrating the back-end circuit, array assembling is facilitated, and batch processing is facilitated. The compact millimeter wave test system of the microchip antenna has the characteristics of wide frequency coverage range, large dynamic range, flexible feeding form, compact structure, comprehensive test parameters and the like, and can solve the problem of testing the performance parameters of various unconventional feeding forms such as a packaged antenna, an integrated antenna, a chip antenna and the like.
In the field of microchip antenna testing, the existing realization scheme most similar to the invention is a darkroom-based millimeter wave microchip antenna testing system which is built based on a darkroom, a high-precision two-dimensional turntable and a customized probe station are installed in the darkroom, the system supports a spherical far-field testing function, and the system can test a far-field directional pattern of a microchip antenna.
The prior art has the following disadvantages:
1 is large in volume, heavy in weight and immovable.
2 only supports far-field test function and does not support spherical near-field test.
3 the turntable of the system only supports pitching and azimuth adjustment, and the testing distance is fixed and cannot be adjusted.
Disclosure of Invention
Aiming at the technical problems in the prior art, the invention provides a compact millimeter wave test system and method for a microchip antenna, which are reasonable in design, overcome the defects of the prior art and have good effects.
In order to achieve the purpose, the invention adopts the following technical scheme:
a compact millimeter wave test system for a microchip antenna comprises an instrument subsystem and a dark box subsystem; the instrument subsystem comprises a main control computer, an exchanger, a vector network analyzer and a turntable control device, wherein the main control computer, the exchanger, the vector network analyzer and the turntable control device are integrally arranged in a standard cabinet; the camera bellows subsystem comprises a microchip antenna feeding platform module, a testing rotary table module, an S parameter testing module, a probe, a microchip antenna, an auxiliary antenna and a receiving module, wherein the microchip antenna feeding platform module, the testing rotary table module, the S parameter testing module, the probe, the microchip antenna and the auxiliary antenna are integrally placed in a shielding camera bellows;
the main control computer is a control and data processing center of the system and is configured to be used for connecting and communicating with the vector network analyzer and the rotary table control device through a LAN (local area network) bus by using a switch, respectively controlling the vector network analyzer and the rotary table control device, realizing remote control and remote acquisition of data and realizing automatic execution of a test flow;
the vector network analyzer is configured to provide a radio frequency signal, frequency-doubled by the S parameter testing module, then sent to the microchip antenna to be emitted, and returned to the vector network analyzer as a reference signal;
the rotary table control device is configured to receive a motion instruction of the system, realize rotation of the test rotary table, complete required mechanical motion action and send a trigger signal to the vector network analyzer;
a microchip antenna feed platform configured to carry an S parameter test module, a probe and a microchip antenna; the S parameter module is connected with the probe through a straight waveguide and a bent waveguide;
a test turret module configured for azimuth, pitch, and polarization rotation;
the S parameter testing module is configured to be used for signal frequency multiplication and transmitting the frequency-multiplied signal;
a probe configured for signal injection of a microchip antenna;
a microchip antenna configured for transmitting signals;
an auxiliary antenna configured for receiving a signal;
the receiving module is fixed on a pitching shaft of the testing turntable; is configured to down-convert the received signal and return the down-converted signal to the vector network analyzer.
Preferably, the vector network analyzer, the S parameter testing module and the microchip antenna form a transmitting unit of the system; the receiving module and the auxiliary antenna form a receiving unit of the system, and are responsible for the generation of microwave and millimeter wave signals, the frequency conversion receiving, the digital quantization processing of intermediate frequency signals and the extraction of amplitude and phase information.
Preferably, the turntable control device is provided with an external interface unit, a motion control unit, a motor driving unit, a display unit and a power supply unit; the peripheral interface unit receives a motion instruction of the system, and the motion instruction is processed by the motion control unit and then sent to the motor driving unit to realize the rotation of the test turntable.
Preferably, the testing turntable module comprises an azimuth turntable, a pitch turntable and a polarization turntable; the device comprises an azimuth turntable, a pitching turntable and a polarization turntable; the azimuth revolving stage can carry out the azimuth and rotate, and the every single move revolving stage can carry out the every single move rotation, and the polarization revolving stage can carry out the polarization and rotate.
Preferably, the microchip antenna feed platform is provided with a microscopic auxiliary feed unit, a vibration reduction unit and a four-dimensional high-precision micro-adjustment unit;
the microscopic auxiliary feed unit adopts an electron microscope; the probe and the feed point position can be observed through a display of an electron microscope;
the damping unit adopts an isolation damping table;
the four-dimensional high-precision micro-adjustment unit adopts a precise four-axis adjustment mechanism.
Preferably, the microchip antenna feeding platform is further provided with a vacuum adsorption device configured to adsorb the microchip antenna, so that the microchip antenna is fixed on the slide holder.
Preferably, a receiving antenna is placed on the testing turntable module, the receiving antenna is fixed on a pitching shaft of the testing turntable, the receiving antenna and the testing turntable module rotate together, the receiving antenna sends a received signal to the receiving module, and the received signal is mixed with a local oscillator signal in the receiving module to obtain an intermediate frequency signal which is then sent back to the vector network analyzer and used as a testing intermediate frequency of the vector network analyzer.
Preferably, the pitching axis of the test turntable is in a liftable form, the test distance between the transmitting and receiving antennas is changed, and the near field test and the far field test of the transmitting and receiving antennas are met.
In addition, the invention also provides a compact millimeter wave test method for a microchip antenna, which adopts the compact millimeter wave test system for the microchip antenna, and specifically comprises the following steps:
step 1: the main control computer respectively controls the vector network analyzer and the turntable control device through the switch;
step 2: the vector network analyzer provides radio frequency signals, the radio frequency signals are subjected to frequency multiplication by the S parameter testing module and then sent out by the microchip antenna, and reference intermediate frequency signals are returned to the vector network analyzer to serve as reference signals of the vector network analyzer;
and step 3: the receiving antenna rotates together with the testing turntable, the receiving antenna sends the received signal to a receiving module, and the received signal is mixed with the local oscillator signal in the receiving module to obtain an intermediate frequency signal which is then sent back to the vector network analyzer and used as the testing intermediate frequency of the vector network analyzer;
and 4, step 4: after collecting the test intermediate frequency data and the reference intermediate frequency data, the main control computer finishes directional diagram drawing and antenna test related parameter analysis;
and 5: under the assistance of an electron microscope, the probe is adjusted to align to the position of a feed point of the microchip antenna, and the probe can be moved downwards to feed after the probe is observed on a display of the electron microscope to align to the microchip antenna;
step 6: the turntable control device controls the test turntable to move under the control of the main control computer and sends a trigger signal to the vector network analyzer, the vector network analyzer collects signals of the receiving antenna after receiving the trigger signal, and amplitude phase information of the microchip antenna at different angles can be obtained along with the scanning of the test turntable.
The invention has the following beneficial technical effects:
(1) the system integration level is high, compact structure, convenient removal.
(2) Spherical near-field and far-field test functions are supported.
(3) The testing distance is adjustable, and the testing requirements of antennas with different calibers are met.
Drawings
FIG. 1 is a block diagram of a test system.
Detailed Description
The invention is described in further detail below with reference to the following figures and detailed description:
1. overall hardware scheme
The hardware general scheme of the invention adopts a high integration degree partition design concept according to the system function and index requirements and the functional characteristics of hardware composition, and the whole system hardware is divided into an instrument subsystem and a dark box subsystem, wherein the instrument subsystem comprises a main control computer, a vector network analyzer, a turntable control device and the like, and the equipment is integrally placed in a standard cabinet; the camera bellows divides the system to include equipment such as microchip antenna feed platform module, test revolving stage module, S parameter test module, probe, auxiliary antenna, and above-mentioned equipment integration is placed in shielding camera bellows, can guarantee the purity of test electromagnetic environment, is favorable to improving the precision of test result.
The vector network analyzer, the S parameter testing module, the receiving module, the auxiliary antenna, the microchip antenna and the like form a signal transmitting and receiving unit of the system, and the signal transmitting and receiving unit is responsible for the generation of microwave and millimeter wave signals, the frequency conversion receiving, the digital quantization processing of intermediate frequency signals, the amplitude and phase information extraction and the like.
The microchip antenna feed platform is used for bearing the S parameter test module, the probe and the microchip antenna. In order to realize convenient and accurate probe feed and protect the probe and the microchip antenna from being damaged, the microchip antenna feed platform is provided with a microscopic auxiliary feed unit, a vibration reduction unit and a four-dimensional high-precision micro-adjustment unit.
The rotary table control device receives a motion instruction of the system, the motion instruction is processed by the motion control unit and then is sent to the motor driving unit to rotate the test rotary table, required mechanical motion action is completed, and a trigger signal is sent to the vector network analyzer.
The main control computer is a control and data processing center of the system, and is connected and communicated with the vector network analyzer, the turntable control device and the like through a LAN (local area network) bus by utilizing a network switch, so that the remote control of instrument equipment and the remote acquisition of data are realized, and the automatic execution of a test flow is realized.
2. System hardware technical scheme
The system structure is shown in fig. 1, the main control computer respectively controls the vector network analyzer and the turntable control device through the switch, and the vector network analyzer, the S parameter testing module and the receiving module form a signal receiving and transmitting unit of the system. The vector network analyzer provides radio frequency signals, the radio frequency signals are subjected to frequency multiplication through the S parameter testing module and then sent to the microchip antenna to be emitted out, reference intermediate frequency signals are returned to the vector network analyzer to serve as reference signals, the receiving antenna is placed on the rotary table to rotate with the rotary table, the signals received by the receiving antenna are sent to the receiving module, the intermediate frequency signals are obtained after frequency mixing with local oscillation signals in the receiving module and then sent back to the vector network analyzer to serve as test intermediate frequencies of the vector network analyzer. And after collecting the test intermediate frequency data and the reference intermediate frequency data, the main control computer finishes directional diagram drawing and antenna test related parameter analysis in test software. The S parameter testing module, the probe and the microchip antenna are arranged on the microchip antenna feed platform, and the S parameter testing module and the probe are connected through the straight waveguide and the bent waveguide. Because the microchip antenna and the probe are very small, the system adopts the electron microscope to carry out auxiliary feeding, the position of the probe and the position of the feed point can be clearly observed through a display of the electron microscope, the microchip antenna feed platform has a four-dimensional adjusting function, the probe is adjusted to be aligned to the position of the feed point of the microchip antenna under the assistance of the electron microscope, and the probe can be moved downwards to carry out feeding after the observation probe is aligned to the microchip antenna on the display. Because the probe is a consumable product and is brittle, in order to prevent the probe from being damaged by vibration caused by the movement of a mechanical device, the microchip antenna feeding platform system is subjected to vibration reduction treatment. The receiving module and the receiving antenna are fixed on a pitching shaft of the testing turntable, the turntable can rotate in azimuth, pitching and polarization, and the pitching shaft of the turntable is designed to be in a lifting mode, so that the testing distance between the receiving and transmitting antennas can be changed, and the near field test and the far field test of the antennas are met. The turntable control device controls the turntable to move under the control of the main control computer and sends a trigger signal to the vector network analyzer, the vector network analyzer collects signals of the receiving antenna after receiving the trigger signal, and amplitude phase information of the microchip antenna at different angles can be obtained along with the scanning of the turntable.
3. Structural appearance
The whole system structure comprises an instrument subsystem and a dark box subsystem. In order to ensure that all parts, cables and instruments of the system are reasonable and compact in layout, neat and attractive and convenient to operate, the instrument subsystem adopts a 1.6m cabinet form, the overall dimension is 600mm multiplied by 1600mm multiplied by 800mm, a vector network analyzer, a rotary table control device, a main control computer and a display and a mouse keyboard thereof are placed in the cabinet, and a small network switch is also arranged in the cabinet.
The box adopts the cuboid design, external dimension: 1520mm 2130mm, weight about 1500Kg, the surface is the metallic shield shell, clean absorbing material is pasted inside, high accuracy four-dimensional revolving stage and microchip antenna feed platform are fixed inside the box, microchip antenna feed platform installation electron microscope, the electron microscope position is adjustable, the auxiliary feed of being convenient for, after the feed is accomplished, can adjust electron microscope to be close to the camera bellows edge position, do not disturb the antenna test. The inside equipment such as illumination, control that still is equipped with of camera bellows, the camera bellows adopts integration steel frame structure chassis design, has the characteristics that bear heavily, stable in structure, support the bulk movement.
The key points are as follows:
(1) the system has compact structure: 1520mm 2130mm (length, width, height).
(2) Spherical near-far field test capability.
(3) The testing distance is adjustable.
Protection points:
a compact millimeter wave test system and method for microchip antennas.
It is to be understood that the above description is not intended to limit the present invention, and the present invention is not limited to the above examples, and those skilled in the art may make modifications, alterations, additions or substitutions within the spirit and scope of the present invention.
Claims (9)
1. A compact millimeter wave test system for microchip antennas, characterized in that: the system comprises an instrument subsystem and a dark box subsystem; the instrument subsystem comprises a main control computer, an exchanger, a vector network analyzer and a turntable control device, wherein the main control computer, the exchanger, the vector network analyzer and the turntable control device are integrally arranged in a standard cabinet; the camera bellows subsystem comprises a microchip antenna feeding platform module, a testing rotary table module, an S parameter testing module, a probe, a microchip antenna, an auxiliary antenna and a receiving module, wherein the microchip antenna feeding platform module, the testing rotary table module, the S parameter testing module, the probe, the microchip antenna and the auxiliary antenna are integrally placed in a shielding camera bellows;
the main control computer is a control and data processing center of the system and is configured to be used for connecting and communicating with the vector network analyzer and the rotary table control device through a LAN (local area network) bus by using a switch, respectively controlling the vector network analyzer and the rotary table control device, realizing remote control and remote acquisition of data and realizing automatic execution of a test flow;
the vector network analyzer is configured to provide a radio frequency signal, frequency-doubled by the S parameter testing module, then sent to the microchip antenna to be emitted, and returned to the vector network analyzer as a reference signal;
the rotary table control device is configured to receive a motion instruction of the system, realize rotation of the test rotary table, complete required mechanical motion action and send a trigger signal to the vector network analyzer;
a microchip antenna feed platform configured to carry an S parameter test module, a probe and a microchip antenna; the S parameter module is connected with the probe through a straight waveguide and a bent waveguide;
a test turret module configured for azimuth, pitch, and polarization rotation;
the S parameter testing module is configured to be used for signal frequency multiplication and transmitting the frequency-multiplied signal;
a probe configured for signal injection of a microchip antenna;
a microchip antenna configured for transmitting signals;
an auxiliary antenna configured for receiving a signal;
the receiving module is fixed on a pitching shaft of the testing turntable; is configured to down-convert the received signal and return the down-converted signal to the vector network analyzer.
2. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: the vector network analyzer, the S parameter testing module and the microchip antenna form a transmitting unit of the system; the receiving module and the auxiliary antenna form a receiving unit of the system, and are responsible for the generation of microwave and millimeter wave signals, the frequency conversion receiving, the digital quantization processing of intermediate frequency signals and the extraction of amplitude and phase information.
3. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: the turntable control device is provided with an external interface unit, a motion control unit, a motor driving unit, a display unit and a power supply unit; the peripheral interface unit receives a motion instruction of the system, and the motion instruction is processed by the motion control unit and then sent to the motor driving unit to realize the rotation of the test turntable.
4. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: the testing rotary table module comprises an azimuth rotary table, a pitching rotary table and a polarization rotary table; the device comprises an azimuth turntable, a pitching turntable and a polarization turntable; the azimuth revolving stage can carry out the azimuth and rotate, and the every single move revolving stage can carry out the every single move rotation, and the polarization revolving stage can carry out the polarization and rotate.
5. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: the microchip antenna feed platform is provided with a microscopic auxiliary feed unit, a vibration reduction unit and a four-dimensional high-precision micro-adjustment unit;
the microscopic auxiliary feed unit adopts an electron microscope; the probe and the feed point position can be observed through a display of an electron microscope;
the damping unit adopts an isolation damping table;
the four-dimensional high-precision micro-adjustment unit adopts a precise four-axis adjustment mechanism.
6. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: the microchip antenna feed platform is also provided with a vacuum adsorption device which is configured to adsorb the microchip antenna so that the microchip antenna is fixed on the slide holder.
7. The compact millimeter wave testing system for microchip antennas of claim 1, wherein: a receiving antenna is placed on the testing rotary table module, the receiving antenna is fixed on a pitching shaft of the testing rotary table and rotates together with the testing rotary table module, the receiving antenna sends a received signal to the receiving module, and the received signal is mixed with a local oscillator signal in the receiving module to obtain an intermediate frequency signal which is then sent back to the vector network analyzer and used as a testing intermediate frequency of the vector network analyzer.
8. The compact millimeter wave testing system for microchip antennas of claim 7, wherein: the pitching shaft of the test turntable is in a liftable form, the test distance between the receiving and transmitting antennas is changed, and the near field test and the far field test of the receiving and transmitting antennas are met.
9. A compact millimeter wave test method for a microchip antenna is characterized in that: the compact millimeter wave test system for microchip antennas as defined in claim 7, comprising in particular the steps of:
step 1: the main control computer respectively controls the vector network analyzer and the turntable control device through the switch;
step 2: the vector network analyzer provides radio frequency signals, the radio frequency signals are subjected to frequency multiplication by the S parameter testing module and then sent out by the microchip antenna, and reference intermediate frequency signals are returned to the vector network analyzer to serve as reference signals of the vector network analyzer;
and step 3: the receiving antenna rotates together with the testing turntable, the receiving antenna sends the received signal to a receiving module, and the received signal is mixed with the local oscillator signal in the receiving module to obtain an intermediate frequency signal which is then sent back to the vector network analyzer and used as the testing intermediate frequency of the vector network analyzer;
and 4, step 4: after collecting the test intermediate frequency data and the reference intermediate frequency data, the main control computer finishes directional diagram drawing and antenna test related parameter analysis;
and 5: under the assistance of an electron microscope, the probe is adjusted to align to the position of a feed point of the microchip antenna, and the probe can be moved downwards to feed after the probe is observed on a display of the electron microscope to align to the microchip antenna;
step 6: the turntable control device controls the test turntable to move under the control of the main control computer and sends a trigger signal to the vector network analyzer, the vector network analyzer collects signals of the receiving antenna after receiving the trigger signal, and amplitude phase information of the microchip antenna at different angles can be obtained along with the scanning of the test turntable.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866522A (en) * | 2021-12-07 | 2021-12-31 | 成都锐芯盛通电子科技有限公司 | Directional diagram test method and system of phased array antenna |
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2021
- 2021-09-13 CN CN202111066088.3A patent/CN113777416A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866522A (en) * | 2021-12-07 | 2021-12-31 | 成都锐芯盛通电子科技有限公司 | Directional diagram test method and system of phased array antenna |
| CN113866522B (en) * | 2021-12-07 | 2022-02-22 | 成都锐芯盛通电子科技有限公司 | Directional diagram test method and system of phased array antenna |
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