CN211374898U

CN211374898U - Antenna test system

Info

Publication number: CN211374898U
Application number: CN201921695255.9U
Authority: CN
Inventors: 卜景鹏; 东君伟; 刘煜; 秦然
Original assignee: Zhongshan Xiangshan Microwave Technology Co ltd
Current assignee: Zhongshan Xiangshan Microwave Technology Co ltd
Priority date: 2019-10-09
Filing date: 2019-10-09
Publication date: 2020-08-28
Anticipated expiration: 2029-10-09

Abstract

The utility model provides an antenna test system, including testboard and the radio frequency test instrument that is used for placing the antenna that awaits measuring to and the testing arrangement who is connected with radio frequency test instrument electricity, testing arrangement includes manipulator, linear guide and mounting panel to and waveguide test probe and standard gain horn antenna on the mounting panel are located to the alternative, the mounting panel is configured to with manipulator lug connection or locate on the manipulator through linear guide, and the mounting panel can be under the drive of manipulator in the top of the antenna that awaits measuring along predetermineeing the orbit removal. The utility model provides an antenna test system accessible is changed hardware and is switched different antenna test method, but the manipulator direct configuration drives waveguide test probe or standard gain horn antenna and scans in the top of the antenna that awaits measuring to realize near field, far field test respectively, still can drive standard gain horn antenna behind the installation linear guide and carry out the vertical linear motion of high accuracy in order to realize the extrapolation gain test.

Description

Antenna test system

Technical Field

The utility model relates to an antenna test technical field especially relates to an antenna test system.

Background

With the rapid development of communication technology, communication equipment has higher and higher performance requirements on antennas, and a high-precision antenna test system becomes a very important factor in the antenna development and production process for accurately measuring performance parameters such as directional patterns, gains and the like of the antennas so as to check whether the antenna performance meets design indexes or judge whether the antenna is qualified in production.

However, in the existing antenna testing technology, testing equipment for near field testing and far field testing cannot be compatible, multiple sets of independent testing systems need to be arranged to complete testing of different types of antennas, and construction investment cost is high. Secondly, the research and development of the automatic test equipment for the millimeter wave on-chip antenna in China are in the starting stage, the technology is still imperfect, the test precision is not sufficient, the frequency band coverage is not high, and the extrapolation gain test is difficult to realize for the millimeter wave on-chip antenna.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a can carry out near field, far field and the antenna test system of extrapolation gain test of high accuracy to the antenna that awaits measuring.

In order to achieve the above object, the present invention provides the following technical solutions:

the utility model provides an antenna test system, including be used for placing the antenna that awaits measuring testboard and be used for with the radio frequency test instrument that the antenna that awaits measuring electricity on the testboard is connected, and with the testing arrangement that the radio frequency test instrument electricity is connected, testing arrangement includes manipulator, linear guide and mounting panel, and the alternative is located on the mounting panel and all be used for the test the waveguide test probe and the standard gain horn antenna of antenna that awaits measuring, the mounting panel be configured to with manipulator lug connection or pass through linear guide locates on the manipulator, just the mounting panel can under the drive of manipulator in the top of antenna that awaits measuring is along predetermineeing the orbit removal.

Preferably, the testing device further comprises a spread spectrum module electrically connected to the standard gain horn antenna.

Preferably, the testing device further comprises an optical positioning assembly electrically connected with the manipulator and used for improving the positioning accuracy of the manipulator.

Further, the optical locating component comprises an infrared locating module which can be located through infrared rays and/or an image locating module which can be located through machine vision.

Preferably, the manipulator is a six-axis manipulator which can drive the mounting plate to move along a hemispherical track.

Preferably, the tail end of the manipulator is provided with a mounting flange matched with the mounting plate and the linear guide rail.

Preferably, the test bench comprises a chip table top for arranging an antenna to be tested and a probe for connecting with a feed port of the antenna to be tested, and the other end of the probe is connected with a signal transmitting end of the radio frequency test instrument.

Preferably, the test bench further comprises a probe adjuster, and the probe is arranged on the probe adjuster and can be adjusted in position through the probe adjuster.

Preferably, wave-absorbing materials are arranged on the chip table surface and the mounting plate.

Furthermore, the antenna test system also comprises a display and control device electrically connected with the radio frequency test instrument.

Compared with the prior art, the utility model discloses a scheme has following advantage:

1. the utility model provides an antenna test system accessible is changed hardware and is switched different antenna test method, but the manipulator direct configuration drives waveguide test probe or standard gain horn antenna and scans in the top of the antenna that awaits measuring, in order to realize the near field to the antenna that awaits measuring, far field test respectively, still can drive standard gain horn antenna behind the installation linear guide and carry out the vertical linear motion of high accuracy in order to realize the gain test of extrapolation, one set of system alright be suitable for multiple antenna test method, effectively improve antenna efficiency of software testing and reduce antenna test cost.

2. The utility model provides an among the antenna test system, through the spread spectrum module of configuration and standard gain horn antenna electricity connection, make its test ability can cover the on-chip antenna of 18 ~ 110GHz frequency channel, can upgrade to 400GHz even, application scope is wide.

3. The utility model provides an antenna test system is equipped with optical locating component, and the supplementary calibration manipulator of accessible infrared location or machine vision to improve the positioning accuracy of manipulator, can ensure the straightness in conformity with the requirements of hanging down when carrying out the extrapolation gain test, with the high accuracy test of antenna on the adaptation millimeter wave piece.

4. The utility model provides an antenna test system adopts six manipulators as the driving piece of scanning test, and it can be directional with the azimuth in nimble location coordinate position in three-dimensional space, can drive waveguide test probe or standard gain horn antenna to optional position, arbitrary angle to carry out omnidirectional scanning test to the antenna that awaits measuring steadily, guarantee test data's accuracy.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

fig. 1 is a perspective view of an antenna testing system according to an embodiment of the present invention;

FIG. 2 is an enlarged view of a portion of area A of the antenna test system shown in FIG. 1;

FIG. 3 is a perspective view of the antenna test system shown in FIG. 1 in another use state;

fig. 4 is a partially enlarged view of a region B in the antenna test system shown in fig. 3.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below by referring to the drawings are exemplary only for explaining the present invention, and should not be construed as limiting the present invention.

It will be understood by those within the art that, unless expressly stated otherwise, the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the term "and/or" includes all or any element and all combinations of one or more of the associated listed items.

Fig. 1 to fig. 4 show jointly the utility model provides an antenna test system 1000, it is used for testing the antenna, is particularly useful for the capability test of on-chip antenna, through the changeable different antenna test methods of the mode of changing the hardware to need not to dispose many sets of independent test systems, effectively improve space utilization and reduce the cost of antenna test.

As shown in fig. 1, the antenna test system 1000 includes a control center 1, a test device 2, a test bench 3 and a display control device 4, all of which are electrically connected with the control center 1, the test bench 3 is used for placing an antenna to be tested, the test device 2 is used for collecting performance data of the antenna to be tested through scanning and feeding back the collected data to the control center 1, and the display control device 4 is used for controlling each device and displaying relevant data in real time.

Further, the control center 1 at least includes a rack 11, and a radio frequency test instrument 12 and a servo control box 13 both disposed on the rack 11. The radio frequency test instrument 12 is a complete radio frequency test closed loop consisting of a network analyzer or equivalent signal source and spectrum analyzer equipment, as well as cable assemblies and other related radio frequency accessories.

Referring to fig. 2, the testing apparatus 2 includes a manipulator 21, a base 22 for supporting the manipulator 21, and a mounting flange 23, a mounting plate 24 and a standard gain horn antenna 25 sequentially disposed at the end of the manipulator 21, where the mounting flange 23 is connected to the manipulator 21, the mounting plate 24 is used to mount the standard gain horn antenna 25 and is connected to an end of the mounting flange 23 away from the manipulator 21, the standard gain horn antenna 25 is electrically connected to the rf testing instrument 12, and the manipulator 21 is electrically connected to the servo control box 13.

In this embodiment, the antenna to be tested is the on-chip antenna 6, the servo control box 13 can control the manipulator 21 to drive the standard gain horn antenna 25 to move and scan above the test board 3 along a hemispherical track, so that the radiation data of the on-chip antenna 6 are comprehensively collected by the standard gain horn antenna 25 to the radio frequency test instrument 12, performance parameters such as a directional diagram and gain of the on-chip antenna 6 are obtained through analysis and calculation of the radio frequency test instrument 12, and finally the performance parameters are displayed through the display control device 4 to complete a far-field test of the on-chip antenna 6.

Specifically, the standard gain horn antenna 25 is configured to induce an electromagnetic field around the on-chip antenna 6, and form a coupling electromagnetic signal to be transmitted to the radio frequency test instrument 12, so as to complete a radio frequency loop test.

In another embodiment, the standard gain horn antenna 25 may be replaced by a waveguide test probe (not shown, the same applies below), that is, the test apparatus 2 further includes a waveguide test probe, when the near field test of the on-chip antenna 6 is required, the waveguide test probe may be disposed on the mounting plate 24 and driven by the manipulator 21 to move and scan above the on-chip antenna 6 along a hemispherical track, so as to collect data to complete the near field test of the on-chip antenna 6.

Preferably, as shown in fig. 3 and 4, the testing device 2 further includes a high-precision linear guide 26, the linear guide 26 is detachably disposed between the mounting flange 23 and the mounting plate 24, in order to ensure the testing precision, the positioning precision of the linear guide 26 is 40um, the stepping precision is less than 1um, and the linearity is less than 60 um. The standard gain horn antenna 25 on the mounting plate 24 can be driven by the linear guide rail 26 to perform high-precision linear movement in the vertical direction above the on-chip antenna 6, so that the extrapolation gain test of the antenna is realized.

Because the standard gain horn antenna 25 and/or the antenna to be tested need to be driven to complete high-precision linear movement in the extrapolation gain test, in the range of 1/5-1/10 of the far-field distance, the received data is used as a function of the distance to correct errors caused by a near effect, multipath interference and mutual coupling, so that the gain of the antenna can be accurately calibrated. However, the existing manipulator is difficult to complete the action, so the existing extrapolation gain test is usually completed by adopting a precise guide rail and two high towers, the transmitting and receiving antennas are respectively installed on the two high towers during the test, and the distance extrapolation measurement is completed by moving the two high-speed rails along the precisely calibrated guide rail, so that the hardware investment is high, the equipment is huge, and the test of the on-chip antenna is not suitable. In the application, the high-precision linear guide rail 26 is arranged on the manipulator 21, so that the extrapolation gain test can be realized, the structure is simple, the test precision is high, and the method is suitable for the millimeter wave on-chip antenna.

To sum up, the utility model provides an antenna test system 1000 accessible is changed hardware and is switched different antenna test methods, but manipulator 21 direct configuration and drive standard gain horn antenna 25 is in the top scanning of on-chip antenna 6 is realized right the far field test of on-chip antenna 6, perhaps direct configuration and drive waveguide test probe are in the top scanning of on-chip antenna 6 is realized right the near field test of on-chip antenna 6, perhaps through the installation drive behind the linear guide 26 standard gain horn antenna 25 carries out the vertical linear motion of high accuracy in order to realize right the gain test of the extrapolation of on-chip antenna 6, one set of system alright realize multiple antenna test method, and application scope is wide, effectively improves antenna test efficiency and reduces antenna test cost.

Preferably, the testing device 2 further includes a spectrum spreading module (not shown, the same applies below) electrically connected to the standard gain horn antenna 25, so that the far field test and the extrapolation gain test can cover the on-chip antenna in the frequency band of 18 to 110GHz, and the coverage can be upgraded to 400GHz by replacing the spectrum spreading modules in different frequency bands, and the application range is wide.

Specifically, the standard gain horn antenna 25 can be directly adopted to perform data acquisition in the frequency band of 18-50 GHz to complete the test, and the spread spectrum module can be configured to cooperate with the standard gain horn antenna 25 to perform data acquisition in the frequency band of 50-110 GHz to complete the test.

Preferably, the testing device 2 further includes an optical positioning assembly (not shown, the same below) electrically connected to the manipulator 21 and configured to improve the positioning accuracy of the manipulator 21, where the optical positioning assembly includes an image positioning module capable of being positioned by machine vision, and the image positioning module is configured to construct a spatial coordinate system by acquiring features such as points, lines, edges and corners in the testing platform 3 or the testing device 2, so as to calculate a moving coordinate of the standard gain horn antenna 25 on the manipulator 21 by capturing a position of each movement of the standard gain horn antenna, and determine whether the position meets the accuracy requirement, so as to perform correction adjustment.

Further, the optical positioning assembly further comprises an infrared positioning module capable of positioning through infrared rays, and the positioning precision of the manipulator 21 is further improved by combining infrared positioning.

Specifically, when carrying out the extrapolation gain test, will through manipulator 21 standard gain horn antenna 25 drives to directly over on-chip antenna 6 after, manipulator 21 with on-chip antenna 6 all remains motionless, only through linear guide 26's high accuracy transmission drives standard gain horn antenna 25 reciprocates. The position and the perpendicularity of the linear guide rail 26 are determined by the positioning accuracy of the manipulator 21, but the existing manipulator 21 is difficult to realize ultra-high positioning accuracy, so the position and the perpendicularity of the linear guide rail 26 can be corrected by combining the optical positioning assembly, the accuracy is improved, the reliability of the antenna test system 1000 is improved, and the antenna test system is suitable for antenna test with higher frequency.

Preferably, the manipulator 21 is a six-axis manipulator, which can flexibly position a coordinate position and an azimuth direction in a three-dimensional space, and can drive the waveguide test probe or the standard gain horn antenna 25 to any position and any angle, so that the on-chip antenna 6 is stably subjected to an omnidirectional scanning test, and accuracy of test data is ensured.

Furthermore, the inside of the rotary joint of the manipulator 21 is a hollow structure, and a slip ring is added in each rotary joint to connect the radio frequency cables of the manipulator into a coupling rotary structure (or a communicated rotary body) so as to realize the butt joint transmission of the radio frequency signals, and the radio frequency cables can rotate 360 degrees in the shaft, so that the problems of distortion, unstable signal transmission, cable damage, aging and the like can be avoided.

Preferably, the mounting flange 23 is adapted to both the mounting plate 24 and the linear guide rail 26, so that hardware can be conveniently and quickly disassembled and replaced, different testing methods can be switched, and interfaces with different specifications do not need to be configured for different accessories.

In a specific embodiment, the mounting flange 23, the mounting plate 24, the standard gain horn antenna 25, the waveguide test probe, the spectrum spreading module and each accessory of the linear guide rail 26 can be connected in a detachable connection manner, so that the accessories can be replaced, and parts of the accessories can be connected in a fixed connection manner, so that the connection precision is ensured, and the positioning difficulty in the later stage is reduced.

Further, the test bench 3 includes a cabinet 31, and the cabinet 31 can be used to place the mounting flange 23, the mounting plate 24, the standard gain horn antenna 25, the waveguide test probe, the frequency spreading module, the linear guide rail 26, and other related accessories.

Both shown in fig. 2 and fig. 4, the test bench 3 further includes a chip table 32 disposed on the cabinet 31 and used for setting the on-chip antenna 6, a probe adjuster 33 disposed on the periphery of the chip table 32, and a probe 34 disposed on the probe adjuster 33, wherein one end of the probe 34 is used for connecting with a feeding port of the on-chip antenna 6, and the other end is connected with a signal transmitting end of the radio frequency test instrument 12, and the probe 34 can perform position adjustment in the three-axis direction through the probe adjuster 32 so as to precisely position the on-chip antenna 60.

Further, the test bench 3 further comprises a magnifier 35 arranged at the periphery of the chip table surface 32 and rotating to the position above the chip table surface 32, and the installation difficulty of the on-chip antenna 6 and the positioning difficulty of the probe 34 can be reduced through the magnifying effect of the magnifier 35.

Preferably, wave absorbing materials 5 are attached to the chip table surface 32 and the mounting plate 24, so that reflection can be reduced, and accuracy of antenna test data is guaranteed.

Further, the display and control device 4 at least includes a display panel 41 and a control keyboard 42, so that a tester can control the operation of the system and observe test data, statistical data, and the like in real time.

The foregoing is only a partial embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims

1. The utility model provides an antenna test system, including be used for placing the antenna that awaits measuring testboard and be used for with the radio frequency test instrument that the antenna that awaits measuring on the testboard electricity is connected, and with the testing arrangement that the radio frequency test instrument electricity is connected, its characterized in that, testing arrangement includes manipulator, linear guide and mounting panel, and the replacement is located on the mounting panel and all be used for the test the waveguide test probe and the standard gain horn antenna of antenna that awaits measuring, the mounting panel configured with manipulator lug connection or pass through linear guide locates on the manipulator, just the mounting panel can under the drive of manipulator in the top of antenna that awaits measuring is along presetting the orbit removal.

2. The antenna test system of claim 1, wherein the test apparatus further comprises a spread spectrum module electrically connected to the standard gain horn antenna.

3. The antenna testing system of claim 1, wherein the testing device further comprises an optical positioning assembly electrically connected to the robot for improving the positioning accuracy of the robot.

4. The antenna testing system according to claim 3, wherein the optical positioning assembly comprises an infrared positioning module positionable by infrared and/or an image positioning module positionable by machine vision.

5. The antenna testing system of claim 1, wherein the robot is a six-axis robot that moves the mounting plate along a hemispherical trajectory.

6. The antenna test system of claim 1, wherein the end of the manipulator is provided with a mounting flange adapted to both the mounting plate and the linear guide.

7. The antenna test system according to claim 1, wherein the test platform comprises a chip platform for arranging the antenna to be tested and a probe for connecting with a feed port of the antenna to be tested, and the other end of the probe is connected with a signal transmitting end of the radio frequency test instrument.

8. The antenna test system of claim 7, wherein the test station further comprises a prober conditioner, and wherein the prober is disposed on the prober conditioner and is adjustable in position by the prober conditioner.

9. The antenna testing system of claim 7, wherein a wave absorbing material is disposed on both the chip mesa and the mounting plate.

10. The antenna test system of claim 1, further comprising a display and control device electrically connected to the radio frequency test instrument.