CN113760614A - Test control device and test system of PCIE expansion card - Google Patents
Test control device and test system of PCIE expansion card Download PDFInfo
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- CN113760614A CN113760614A CN202110873216.9A CN202110873216A CN113760614A CN 113760614 A CN113760614 A CN 113760614A CN 202110873216 A CN202110873216 A CN 202110873216A CN 113760614 A CN113760614 A CN 113760614A
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F2213/0026—PCI express
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Abstract
The invention discloses a test control device and a test system of a PCIE expansion card.A control command generating module firstly generates a control command, the control command comprises a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested, a first logic control module generates pulse signals with corresponding quantity based on the corresponding relation between the control command and the configuration of the preset transmission rate and the pulse quantity, and sends the pulse signals to RX pins of the PCIE expansion card which are in one-to-one correspondence with the output pins through the output pins of the first logic control module so that the TX pins of the PCIE expansion card which are in one-to-one correspondence with the RX pins can output the corresponding PCIE signals. By the device, the automatic switching of the transmission rate and the configuration of the PCIE expansion card is realized, the working efficiency and the accuracy are improved, and the consistency test of the PCIE signal output by the TX pin of the PCIE expansion card is facilitated.
Description
Technical Field
The invention relates to the field of computer expansion cards, in particular to a test control device and a test system of a PCIE expansion card.
Background
With the development of computer technology, when the capacity of a hard disk configured on a computer cannot meet the requirement, the computer is usually matched with a PCIE (Peripheral Component Interconnect Express) expansion card, so as to expand the storage capacity. At present, the transmission rate of PCIE is upgraded from 1.0 to 5.0, and in order to ensure the transmission quality of signals, it is necessary to perform a consistency test on a PCIE signal output by a TX (transmit) pin of a PCIE expansion card. At present, a CBB (compatibility Base Board) test fixture is generally used to switch the transmission rate and configuration of a PCIE expansion card, and in the prior art, a pulse signal needs to be manually generated by a button or a key to complete the switching of multiple configurations of PCIE1.0 to 4.0. For example, when testing configuration 7 of PCIE4.0, 21 buttons or keys are manually pressed 21 times to generate 21 pulse signals, which has the problems of large workload and high switching error rate.
Disclosure of Invention
The invention aims to provide a test control device and a test system of a PCIE expansion card, which realize the automatic switching of the transmission rate and the configuration of the PCIE expansion card, improve the working efficiency and the accuracy and facilitate the consistency test of a PCIE signal output by a TX pin of the PCIE expansion card.
In order to solve the above technical problem, the present invention provides a test control device for a PCIE expansion card, including:
the control command generating module is used for generating a control command, and the control command comprises a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested;
and the first logic control module is used for generating pulse signals with corresponding number based on the corresponding relation between the control command and the preset transmission rate configuration and the pulse number, and sending the pulse signals to RX pins of the PCIE expansion cards which are in one-to-one correspondence with the output pins through the output pins of the first logic control module so that the TX pins of the PCIE expansion cards which are in one-to-one correspondence with the RX pins can output the corresponding PCIE signals.
Preferably, the PCIE expansion card includes N RX pins, where N is an integer not less than 2; the N output pins of the first logic control module are connected with the N RX pins of the PCIE expansion card in a one-to-one correspondence manner;
sending the pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module, including:
and sequentially sending the pulse signals to N RX pins of the PCIE expansion card which are in one-to-one correspondence with the output pins through N output pins of the first logic control module according to a preset sequence.
Preferably, the control command generating module is specifically configured to periodically send the control command; the control commands of two adjacent cycles are different.
Preferably, the control command further includes a to-be-tested TX pin of the PCIE expansion card;
sending the pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module, including:
and sending the pulse signal to the RX pins of the PCIE expansion card which are in one-to-one correspondence with the TX pins to be tested through the output pins of the first logic control module which are in one-to-one correspondence with the TX pins to be tested.
Preferably, the control command generating module includes:
the trigger module is used for generating a trigger signal;
and the BMC is used for generating a control command based on the trigger signal.
Preferably, the method further comprises the following steps:
the power module is used for supplying power to the PCIE expansion card;
the first logic control module is further configured to send a first level to the PCIE expansion card when the first logic control module is powered on; when an in-place signal generated after the PCIE expansion card is electrified is detected, a second level is sent to the PCIE expansion card so as to control the PCIE expansion card to enter a working state; the first level and the second level are opposite.
Preferably, the method further comprises the following steps:
the second logic control module is used for determining the standard number of the pulse signals based on the control command and the corresponding relation between the preset transmission rate configuration and the pulse number; acquiring the actual number of the pulse signals output by the output pins of the first logic control module, which are in one-to-one correspondence with the acquisition pins of the first logic control module, judging whether the actual number of the pulse signals is consistent with the standard number of the pulse signals, and if so, judging that the actual number of the pulse signals output by the output pins of the first logic control module is correct; and if the number of the pulse signals output by the output pin of the first logic control module is inconsistent, judging that the actual number of the pulse signals output by the output pin of the first logic control module is wrong.
Preferably, the second logic control module is further configured to send a reset signal to the PCIE expansion card when it is determined that the actual number of the pulse signals output by the output pin of the first logic control module is incorrect.
Preferably, the method further comprises the following steps:
and the input end of the prompting module is connected with the output end of the second logic control module and is used for prompting a judgment result whether the actual number of the pulse signals is consistent with the standard number of the pulse signals.
In order to solve the above technical problem, the present invention further provides a test system for a PCIE expansion card, including the test control device for a PCIE expansion card, further including:
and the test control device of the PCIE expansion card is connected with a test module and used for outputting a corresponding PCIE signal to carry out consistency test based on a TX pin of the PCIE expansion card.
The invention discloses a test control device and a test system of a PCIE expansion card.A control command generating module firstly generates a control command, the control command comprises a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested, a first logic control module generates pulse signals with corresponding quantity based on the corresponding relation between the control command and the configuration of the preset transmission rate and the pulse quantity, and sends the pulse signals to RX pins of the PCIE expansion card which are in one-to-one correspondence with the output pins through the output pins of the first logic control module so that the TX pins of the PCIE expansion card which are in one-to-one correspondence with the RX pins can output the corresponding PCIE signals. Through the device, the control command generation module, the first logic control module and the PCIE expansion card are interconnected, so that the automatic switching of the transmission rate and the configuration of the PCIE expansion card is realized, the working efficiency and the accuracy are improved, and the consistency test of the PCIE signal output by the TX pin of the PCIE expansion card is facilitated.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test control apparatus for a PCIE expansion card provided in the present application;
fig. 2 is a schematic structural diagram of another test control apparatus for a PCIE expansion card provided in the present application;
fig. 3 is a flowchart of a test control apparatus for a PCIE expansion card provided in the present application;
fig. 4 is a schematic structural diagram of a test system for a PCIE expansion card provided in the present application.
Detailed Description
The core of the invention is to provide a test control device and a test system for a PCIE expansion card, which realize the automatic switching of the transmission rate and the configuration of the PCIE expansion card, improve the working efficiency and the accuracy and facilitate the consistency test of the PCIE signal output by the TX pin of the PCIE expansion card.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test control apparatus for a PCIE expansion card provided in the present application.
The invention provides a test control device of a PCIE expansion card, which comprises:
the control command generating module 1 is used for generating a control command, and the control command comprises a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested;
the first logic control module 2 is configured to generate a corresponding number of pulse signals based on the control command and the corresponding relationship between the preset transmission rate configuration and the number of pulses, and send the pulse signals to the RX pins of the PCIE expansion cards corresponding to the output pins one to one through the output pins of the first logic control module 2, so that the TX pins of the PCIE expansion cards corresponding to the RX pins one to one output corresponding PCIE signals.
In view of the fact that when the PCIE transmission rate and configuration are switched to the PCIE expansion card, the workload is large and the switching error rate is high in a manner of manually pressing a button or a key to generate a pulse signal, and in order to solve the technical problem, the application provides a test control device for a PCIE expansion card, where the test control device for a PCIE expansion card includes a control command generation module 1 and a first logic control module 2.
Specifically, the first logic control module 2 stores a corresponding relationship between the transmission rate configuration and the number of pulses in advance, and when the transmission rate and/or the configuration are different, the number of pulses generated by the first logic control module 2 is also different. When an RX pin of a PCIE expansion card receives a pulse signal, a corresponding PCIE signal is output through a TX pin corresponding to the RX pin based on the number of the pulse signal. Based on this, when the test control device of the PCIE expansion card works, the control command generation module 1 first generates a control command, where the control command includes a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested. The first logic control module 2 generates a corresponding number of pulse signals based on the control command and the corresponding relationship between the preset transmission rate configuration and the number of pulses, and sends the pulse signals to RX (Receive) pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module 2, so that the TX pins of the PCIE expansion card corresponding to the RX pins one to one output the corresponding PCIE signals.
The transmission rate to be tested can be PCIE1.0-PCIE5.0, the number of to-be-tested configurations of PCIE1.0 is 1, the number of to-be-tested configurations of PCIE2.0 is 2, the number of to-be-tested configurations of PCIE3.0 and PCIE4.0 is 11, and the to-be-tested configurations can be any configuration under the transmission rate to be tested.
For example, the control command generated by the control command generating module 1 includes that the transmission rate to be tested is PCIE4.0, the configuration to be tested of the transmission rate to be tested is configuration 7 of PCIE4.0, the first logic control module 2 generates 21 times of pulse signals based on the correspondence between the control command and the preset transmission rate configuration and the pulse number, and sends the 21 times of pulse signals to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module 2, so that the TX pins of the PCIE expansion card corresponding to the RX pins one to one output corresponding PCIE signals.
In addition, be equipped with the slot on the CBB tool, PCIE expansion card can set up on the slot, has advantages such as plug simple, convenience, easily change, and this application does not do not make special restriction here.
The PCIE expansion card may be, but is not limited to, an FC (Fibre Channel) card, a compression card, an NVME (Non-Volatile Memory host controller interface specification) card, and an SAS (Serial Attached SCSI) card.
The first Logic control module 2 may be, but is not limited to, a CPLD (Complex Programmable Logic Device).
In summary, according to the test control device for the PCIE expansion card of the present application, the control command generation module 1, the first logic control module 2, and the PCIE expansion card are interconnected, so that automatic switching of the transmission rate and configuration of the PCIE expansion card is realized, and the working efficiency and the accuracy are improved.
On the basis of the above-described embodiment:
as a preferred embodiment, the PCIE expansion card includes N RX pins, where N is an integer not less than 2; the N output pins of the first logic control module 2 are correspondingly connected with the N RX pins of the PCIE expansion card one by one;
sending a pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module 2, includes:
and sequentially sending pulse signals to the N RX pins of the PCIE expansion card corresponding to the output pins one to one through the N output pins of the first logic control module 2 according to a preset sequence.
The PCIE expansion card comprises N RX pins, wherein N is an integer not less than 2, and N output pins of the first logic control module 2 are connected with the N RX pins of the PCIE expansion card in a one-to-one correspondence manner; in order to transmit pulse signals to all RX pins of the PCIE expansion card, in this embodiment, the first logic control module 2 sequentially sends pulse signals to the N RX pins of the PCIE expansion card corresponding to the output pins one to one through the N output pins according to a preset sequence. The preset sequence may be a sequence from the 1 st output pin to the nth output pin, or a sequence from the nth output pin to the 1 st output pin, which is not particularly limited herein. For example, the first logic control module 2 sends a pulse signal to the 1 st RX pin of the PCIE expansion card corresponding to the 1 st output pin through the 1 st output pin, then the 2 nd output pin of the first logic control module 2 sends a pulse signal to the 2 nd RX pin of the PCIE expansion card corresponding to the 2 nd output pin, … …, and finally the nth output pin of the first logic control module 2 sends a pulse signal to the nth RX pin of the PCIE expansion card corresponding to the nth output pin, so that a full channel transmission pulse signal to the RX pins of the PCIE expansion card is realized, so as to perform a full channel consistency test on the PCIE signal sent by the TX pin of the PCIE.
For example, the PCIE expansion card includes 16 RX pins, and the 16 output pins of the first logic control module 2 are connected to the 16 RX pins of the PCIE expansion card in a one-to-one correspondence. When the test control device of the PCIE expansion card works, after the first logic control module 2 receives the control command of the PCIE4.0 configuration 7 sent by the control command generation module 1, first, the 1 st output pin of the first logic control module 2 sends 21 times pulse signals to the 1 st RX pin of the PCIE expansion card corresponding to the 1 st output pin, then the 2 nd output pin of the first logic control module 2 sends 21 times pulse signals to the 2 nd RX pin, … …, of the PCIE expansion card corresponding to the 2 nd output pin, and finally, the 16 th output pin of the first logic control module 2 sends 21 times pulse signals to the 16 th RX pin of the PCIE expansion card corresponding to the 16 th output pin.
As a preferred embodiment, the control command generating module 1 is specifically configured to periodically send a control command; the control commands of two adjacent periods are different.
In order to meet the PCIE signal test requirements for the configurations of the transmission rates of multiple PCIE and the transmission rates of multiple PCIE, in this embodiment, the control command generating module 1 sends the control command periodically, the transmission rate to be tested in the control commands in two adjacent periods and the configuration to be tested of the transmission rate to be tested are not completely the same, and the first logic control module 2 implements transmission of pulse signals corresponding to the multiple control commands based on the periodic control command, so as to perform consistency test on the PCIE signals of the configurations of the transmission rates of multiple PCIE and the transmission rates of multiple PCIE.
For example, the control command generating module 1 first generates a control command of PCIE4.0 configuration 7, the first logic control module 2 implements transmission of the pulse signal 21 times based on the control command, then the control command generating module 1 generates a control command of PCIE4.0 configuration 8 again, and the first logic control module 2 implements transmission of the pulse signal 22 times based on the control command.
As a preferred embodiment, the control command further includes a to-be-tested TX pin of the PCIE expansion card;
sending a pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module 2, includes:
and sending a pulse signal to the RX pins of the PCIE expansion card which are in one-to-one correspondence with the TX pins to be tested through the output pins of the first logic control module 2 which are in one-to-one correspondence with the TX pins to be tested.
Referring to fig. 2, fig. 2 is a schematic structural diagram of another test control apparatus for a PCIE expansion card provided in the present application.
In order to implement single channel testing on the TX pins to be tested of the PCIE expansion card, in this embodiment, the control command sent by the control command generating module 1 further includes the TX pins to be tested of the PCIE expansion card, and the first logic control module 2 sends the pulse signal to the RX pins of the PCIE expansion card corresponding to the TX pins to be tested one by one through the output pins of the first logic control module 2 corresponding to the TX pins to be tested one by one, so that single channel transmission of the pulse signal is implemented, so as to perform consistency testing on the PCIE signal transmitted by the TX pins to be tested.
For example, the to-be-tested TX pin of the PCIE expansion card is a TX0 pin, and the first logic control module 2 sends a pulse signal to the RX0 pin of the PCIE expansion card corresponding to the to-be-tested TX0 pin through the gpiorane 0 output pin corresponding to the to-be-tested TX0 pin.
As a preferred embodiment, the control command generating module 1 includes:
a trigger module 11, configured to generate a trigger signal;
a BMC12 for generating control commands based on the trigger signal.
In this embodiment, the control command generating module 1 includes a trigger module 11 and a BMC12(Baseboard Management Controller), where the trigger module 11 generates the control command first, and the BMC12 generates the control command after receiving the trigger signal, and the overall structure is simple and the automation degree is high.
In addition, the trigger module 11 may include a computer for generating a trigger signal when receiving a user instruction, and a conversion module for converting the trigger signal from a USB (Universal Serial-General Bus) signal to a UART (Universal Asynchronous Receiver/Transmitter) signal. Specifically, the conversion module here may be an RS232 serial port connection circuit, the computer is connected to the input terminal of the RS232 serial port connection circuit through a USB serial port, and the output terminal of the RS232 serial port connection circuit is connected to the input terminal of the BMC12 through a UART serial port. The computer generates a trigger signal when receiving a user instruction, the RS232 serial port connection circuit converts the trigger signal from a USB signal to an RS232 signal, converts the RS232 signal to a UART signal and sends the UART signal to the BMC12, the BMC12 generates a control command based on the trigger signal, and sends the control command to the first logic control module 2 through the IIC serial port, which is not particularly limited herein.
BMC12 may be, but is not limited to, AST 2500.
Referring to fig. 3, fig. 3 is a flowchart illustrating a working process of a test control apparatus for a PCIE expansion card provided in the present application.
As a preferred embodiment, the method further comprises the following steps:
the power supply module is used for supplying power to the PCIE expansion card;
the first logic control module 2 is further configured to send a first level to the PCIE expansion card when the first logic control module is powered on; when an in-place signal generated after the PCIE expansion card is electrified is detected, a second level is sent to the PCIE expansion card so as to control the PCIE expansion card to enter a working state; the first level and the second level are opposite.
In order to automatically control the PCIE expansion card to enter the working state, in this embodiment, the test control device of the PCIE expansion card further includes a power module, which may supply power to the PCIE expansion card. In the working process of the device, the first logic control module 2 sends the first level to the PCIE expansion card when being powered on, and at this time, because the first logic control module 2 has not detected the in-place signal of the PCIE expansion card yet, even if the first level is sent to the PCIE expansion card, the PCIE expansion card does not perform the working state. When the first logic control module 2 detects an in-place signal generated after the PCIE expansion card is powered on, a second level is sent to the PCIE expansion card, and at this time, the PCIE expansion card is controlled to enter a working state, and the first level and the second level are opposite, so that the automatic control of the working state of the PCIE expansion card is realized.
The first level may be low, PERST ═ 0; the second level may be high, PERST ═ 1; the default PCIE expansion card enters PCIE1.0_ TX signal output during normal operation, which is not particularly limited in this application.
As a preferred embodiment, the method further comprises the following steps:
the second logic control module 3 is used for determining the standard number of the pulse signals based on the corresponding relation between the control command and the preset transmission rate configuration and the pulse number; acquiring the actual number of the pulse signals output by the output pins of the first logic control module 2 corresponding to the acquisition pins of the first logic control module one by one, judging whether the actual number of the pulse signals is consistent with the standard number of the pulse signals, and if so, judging that the actual number of the pulse signals output by the output pins of the first logic control module 2 is correct; if the difference is not consistent, the actual number of the pulse signals output by the output pin of the first logic control module 2 is judged to be wrong.
In order to monitor whether the number of the pulse signals output by the first logic control module 2 to the PCIE expansion card is incorrect, in this embodiment, the test control apparatus of the PCIE expansion card further includes a second logic control module 3, which can determine the standard number X of the pulse signals based on the control command and the corresponding relationship between the preset transmission rate configuration and the pulse number, then collect, through a collection pin of the second logic control module, the actual number Y of the pulse signals output by the output pins of the first logic control module 2 that are one-to-one corresponding to the collection pin, and judge whether the actual number Y is consistent with the value of the standard number X, if Y is X, determine that the actual number of the pulse signals output by the output pins of the first logic control module 2 is correct; if Y is not equal to X, the actual number of the pulse signals output by the output pins of the first logic control module 2 is judged to be wrong, the comparison and verification of the pulse signals generated by the first logic control module 2 are realized by adding the second logic control module 3, the accuracy of the pulse signals is improved, and whether the configuration of the switched PCIE transmission rate and the PCIE transmission rate meets the requirement of a PCIE _ TX consistency test or not can be verified easily and conveniently.
In addition, the second logic control module 3 may be, but is not limited to, a CPLD, and the control command generated by the BMC12 is sent to the second logic control module 3 through the IIC serial port, which is not limited in this application.
As a preferred embodiment, the second logic control module 3 is further configured to send a reset signal to the PCIE expansion card when it is determined that the actual number of the pulse signals output by the output pin of the first logic control module 2 is incorrect.
In order to further improve the working efficiency under the condition of ensuring the accuracy of the transmission of the pulse signal, in this embodiment, when the second logic control module 3 determines that the actual number of the pulse signals output by the output pin of the first logic control module 2 is incorrect, a reset signal is sent to the PCIE expansion card, so that the configuration switching work of automatically restarting the PCIE transmission rate and the PCIE transmission rate is realized, and the efficiency of the device operation is improved.
The reset signal may be low, and PERST is 0, which is not particularly limited herein.
As a preferred embodiment, the method further comprises the following steps:
and the input end of the prompting module 4 is connected with the output end of the second logic control module 3 and is used for prompting a judgment result whether the actual number of the pulse signals is consistent with the standard number of the pulse signals.
In consideration of the requirement that real-time detection needs to be performed on the operating state of the device in research and development tests, in this embodiment, the prompt module 4 is arranged, so that a determination result of whether the actual number of the pulse signals is consistent with the standard number of the pulse signals can be prompted, real-time prompt of the accuracy of pulse signal output is realized, research and development testers can conveniently and accurately grasp the information of the pulse signals, and the accuracy of the PCIE _ TX consistency test is improved.
In addition, the prompt module 4 may be an LED display screen, and when it is determined that the actual number of the pulse signals output by the output pin of the first logic control module 2 is correct, the LED display screen displays the output pulse number N0N1, the PCIE transmission rate PX0X1 to be tested, and the configuration PX2X3 to be tested of the transmission rate to be tested; when the actual number of the pulse signals output by the output pin of the first logic control module 2 is determined to be wrong, the LED display screen displays a wrong code, which is not particularly limited herein.
For example, when the actual number of the pulse signals corresponding to the PCIE4.0 configuration 7 output by the output pin of the first logic control module 2 is determined to be correct, the LED display screen displays 21P40P 07; when the actual number of the pulse signals corresponding to the PCIE4.0 configuration 7 output by the output pin of the first logic control module 2 is determined to be wrong, the LED display screen displays eeeeeeeeee.
The prompting module 4 includes a voice prompting module and/or a display prompting module, and the voice prompting module can be but is not limited to a buzzer and prompts the determination result in a voice prompting mode.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a test system for a PCIE expansion card provided in the present application.
The present invention also provides a testing system for a PCIE expansion card, including the testing control apparatus for a PCIE expansion card described above, further including:
and the test control device connected with the PCIE expansion card is connected with the test module 5 and used for outputting a corresponding PCIE signal to carry out consistency test based on a TX pin of the PCIE expansion card.
In addition, the test module 5 may be, but is not limited to, a high-speed oscilloscope, and performs a consistency test on the PCIE signal output by the TX pin of the PCIE expansion card.
The test system of the PCIE expansion card further includes a clock module, configured to output a clock signal to the PCIE expansion card, so that the PCIE expansion card operates based on the clock signal, where the clock signal may be a 100M clock signal, and the application is not limited herein.
For more contents of the working principle and the working mode of the test system of the PCIE expansion card, reference may be made to the relevant description of the above embodiment, and details are not described here again.
It is to be noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A test control device of a PCIE expansion card is characterized by comprising:
the control command generating module is used for generating a control command, and the control command comprises a transmission rate to be tested and a configuration to be tested of the transmission rate to be tested;
and the first logic control module is used for generating pulse signals with corresponding number based on the corresponding relation between the control command and the preset transmission rate configuration and the pulse number, and sending the pulse signals to RX pins of the PCIE expansion cards which are in one-to-one correspondence with the output pins through the output pins of the first logic control module so that the TX pins of the PCIE expansion cards which are in one-to-one correspondence with the RX pins can output the corresponding PCIE signals.
2. The device of claim 1, wherein the PCIE expansion card includes N RX pins, N being an integer not less than 2; the N output pins of the first logic control module are connected with the N RX pins of the PCIE expansion card in a one-to-one correspondence manner;
sending the pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module, including:
and sequentially sending the pulse signals to N RX pins of the PCIE expansion card which are in one-to-one correspondence with the output pins through N output pins of the first logic control module according to a preset sequence.
3. The device for testing and controlling a PCIE expansion card according to claim 2, wherein the control command generating module is specifically configured to send the control command periodically; the control commands of two adjacent cycles are different.
4. The test control apparatus of a PCIE expansion card of claim 1, wherein the control command further includes a TX pin to be tested of the PCIE expansion card;
sending the pulse signal to the RX pins of the PCIE expansion card corresponding to the output pins one to one through the output pins of the first logic control module, including:
and sending the pulse signal to the RX pins of the PCIE expansion card which are in one-to-one correspondence with the TX pins to be tested through the output pins of the first logic control module which are in one-to-one correspondence with the TX pins to be tested.
5. The test control apparatus of a PCIE expansion card according to claim 1, wherein the control command generation module includes:
the trigger module is used for generating a trigger signal;
and the BMC is used for generating a control command based on the trigger signal.
6. The test control apparatus of a PCIE expansion card according to claim 1, further comprising:
the power module is used for supplying power to the PCIE expansion card;
the first logic control module is further configured to send a first level to the PCIE expansion card when the first logic control module is powered on; when an in-place signal generated after the PCIE expansion card is electrified is detected, a second level is sent to the PCIE expansion card so as to control the PCIE expansion card to enter a working state; the first level and the second level are opposite.
7. The test control apparatus of a PCIE expansion card according to any one of claims 1 to 6, further comprising:
the second logic control module is used for determining the standard number of the pulse signals based on the control command and the corresponding relation between the preset transmission rate configuration and the pulse number; acquiring the actual number of the pulse signals output by the output pins of the first logic control module, which are in one-to-one correspondence with the acquisition pins of the first logic control module, judging whether the actual number of the pulse signals is consistent with the standard number of the pulse signals, and if so, judging that the actual number of the pulse signals output by the output pins of the first logic control module is correct; and if the number of the pulse signals output by the output pin of the first logic control module is inconsistent, judging that the actual number of the pulse signals output by the output pin of the first logic control module is wrong.
8. The device as claimed in claim 7, wherein the second logic control module is further configured to send a reset signal to the PCIE expansion card when it is determined that the actual number of the pulse signals output from the output pin of the first logic control module is incorrect.
9. The test control apparatus of a PCIE expansion card according to claim 7, further comprising:
and the input end of the prompting module is connected with the output end of the second logic control module and is used for prompting a judgment result whether the actual number of the pulse signals is consistent with the standard number of the pulse signals.
10. A test system for PCIE expansion cards, including the test control apparatus for PCIE expansion cards according to any one of claims 1 to 9, further comprising:
and the test control device of the PCIE expansion card is connected with a test module and used for outputting a corresponding PCIE signal to carry out consistency test based on a TX pin of the PCIE expansion card.
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