CN113760130A - TP chip scanning method avoiding noise - Google Patents
TP chip scanning method avoiding noise Download PDFInfo
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- CN113760130A CN113760130A CN202111037719.9A CN202111037719A CN113760130A CN 113760130 A CN113760130 A CN 113760130A CN 202111037719 A CN202111037719 A CN 202111037719A CN 113760130 A CN113760130 A CN 113760130A
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- 238000000034 method Methods 0.000 title claims abstract description 16
- 238000012546 transfer Methods 0.000 claims abstract description 16
- 238000006243 chemical reaction Methods 0.000 claims abstract description 9
- 230000000630 rising effect Effects 0.000 claims abstract description 8
- 230000008569 process Effects 0.000 claims description 6
- 230000003111 delayed effect Effects 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 230000009467 reduction Effects 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000013501 data transformation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/04166—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
- G06F3/04182—Filtering of noise external to the device and not generated by digitiser components
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- Theoretical Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Position Input By Displaying (AREA)
Abstract
The invention discloses a TP chip scanning method for avoiding noise, which takes a line synchronizing signal Hsync rising edge as a mark to control the scanning and data conversion of TP to avoid a DP pre-charging area, and actually measures to obtain the period of the Hsync and the pre-charging time of the DP before configuring a TP time sequence; configuring a related time sequence of TP, starting timing inside the TP when the rising edge of Hsync arrives, starting the CA after the time exceeds the DP pre-charging time, and formally starting scanning; after the scanning is finished, the Sample Hold is normally established, and Data Transfer is sequentially carried out, so that one scanning is finished. The invention uses hsync as a flag bit, changes the scanning time sequence of TP, and makes the data conversion of TP avoid DP pre-charging area, thereby realizing the function of noise reduction.
Description
Technical Field
The invention relates to the technical field of chip scanning, in particular to a TP chip scanning method for avoiding noise.
Background
With the development of semiconductor technology, only mobile phones, watches and bracelets in terminals are rapidly developed towards the direction of lighter, thinner and lower power consumption. In the direction of thinner development, the conventional screens are gradually replaced by fully conformable screens. In-Cell and On-Cell technologies are mainly developed by panel factories In the market at present, and OGS is a mainly developed technology by touch module factories.
The traditional screen has three layers from top to bottom, namely a glass layer, a touch layer and a display layer. In the OGS technology, a glass layer and a touch layer are generally bonded together, and are characterized by being touch sensitive but thick. The On-Cell technology integrates the touch layer On the upper glass substrate of the display layer, and compared with the OGS technology, the thickness of a screen is reduced, certain panel cost is saved, but the sensitivity and the transmittance are reduced. In-Cell technology integrates the touch layer into the liquid crystal layer, making it more elegant In screen thickness. In either technique, the TP is disturbed by the LCD since the touch layer is integrated in the vicinity of the display layer.
In the prior art, hsync signals are used as marks to control TP to scan in a non-display area of an LCD, and during scanning, voltages on channels are collected through CA, and then converted into corresponding digital code values through ADC. Because the static power consumption of the ADC is much larger than that of the CA, and the overall area is also very large, in order to reduce the power consumption and the area, generally, in the design process, the number of the CAs is a multiple of the number of the ADCs, so that there is not enough ADC to convert the voltages of all the CAs into digital code values at one time. Therefore, before ADC conversion, Sample Hold is performed, and then Data Transfer is performed serially for each CA Data. The overall timing chart is shown in fig. 1.
Disclosure of Invention
The invention aims to make up the defects of the prior art and provides a TP chip scanning method for avoiding noise. The invention avoids the noise interference on the LCD by changing the scanning time sequence of the TP, so that the TP can accurately report points and draw lines.
The invention is realized by the following technical scheme:
a TP chip scanning method avoiding noise takes a rising edge of a line synchronizing signal Hsync as a mark, controls scanning and data conversion of TP to avoid a DP pre-charging area, and specifically comprises the following steps:
(1) before configuring TP time sequence, firstly, actually measuring to obtain Hsync period and DP pre-charging time;
(2) configuring a related time sequence of TP, starting timing inside the TP when the rising edge of Hsync arrives, starting the CA after the time exceeds the DP pre-charging time, and formally starting scanning;
(3) after the scanning is finished, the Sample Hold is normally established, and Data Transfer is sequentially carried out, so that one scanning is finished.
When the resolution of the screen is high, the display area time of the DP is long, and the Sample Hold or the Data Transfer cannot be completed in the DP non-display area, the establishment of the Sample Hold needs to be delayed through digital internal configuration after the TP scanning is completed, the Sample Hold is performed after the DP pre-charging is completed, the Data Transfer is completed, and the scanning of the TP and the Data processing of the ADC are ensured to avoid the pre-charging area of the DP in the whole process.
IC-integrated circuit;
TP-touch chip;
LCD-display chip;
hsync-line synchronization signal;
source Driver-Source drive;
CA-charge amplifier;
ADC-analog to digital converter;
sample Hold-Sample Hold;
data Transfer — Data transformation.
The invention has the advantages that: the invention uses hsync as a flag bit, changes the scanning time sequence of TP, and makes the data conversion of TP avoid DP pre-charging area, thereby realizing the function of noise reduction.
Drawings
FIG. 1 is a timing diagram of scan and data conversion in the prior art.
FIG. 2 is a timing diagram illustrating a normal resolution scenario of the present invention.
FIG. 3 is a timing diagram for a high resolution scenario of the present invention.
Detailed Description
In the DP, each line is displayed by using Hsync signal as flag bit, and when Hsync signal is high, the time zone where the source driver of DP is inverted is the time zone, and it is generally considered that this time zone is DP display zone, and noise is large. When the Hsync signal is low, the display of the DP is considered to be completed, the source driver is not turned over, and the noise is small at this time. In the front part of the DP display area, the noise influence of TP of the LCD is the largest before the source driver is turned on and during the charging time.
The invention mainly uses hsync as a flag bit to change the scanning time sequence of TP, so that the data conversion of TP avoids DP pre-charging area, thereby realizing the function of noise reduction.
In some application scenarios with higher screen resolution, the time of one Hsync period may be shortened, and meanwhile, the specific gravity of the DP display area in one Hsync period may be increased, and the time left for TP scanning may be small. Therefore, if TP scanning is strictly performed in the DP non-display area, a scenario may occur in which Sample Hold or Data Transfer is performed in the DP precharge area. Due to the pre-charging area of DP, the noise is very large, and at this time, if Sample Hold or Data Transfer is performed, the Data is seriously interfered by the noise.
Meanwhile, in the practical application process of each screen, the frequency of Hsync is kept unchanged, so if Hsync is used as a mark signal for scanning, the frequency point of TP is also kept unchanged, and the frequency hopping function cannot be realized.
In the actual measurement process, the main noise source of the DP is considered to be in the DP precharge region, and the noise interference to the ADC is more serious than that of the CA. Therefore, the present invention is optimized mainly for the above problems, and in the TP operation process, not only the non-display area of the DP is scanned, but it is ensured that the Sample Hold or Data Transfer avoids the DP pre-charge area; ensuring that the TP supports the frequency hopping function.
The invention takes the Hsync rising edge as a mark to control the scanning and data conversion of the TP to avoid the DP pre-charging area. Before configuring TP timing sequence, the period of Hsync and the pre-charging time of DP can be obtained by actual measurement. Then, configuring the related timing of TP, when the rising edge of Hsync comes, the TP starts to count time internally, when the time exceeds DP pre-charging time, CA starts to work, and scanning starts formally. After the scanning is finished, the Sample Hold is normally established, and Data Transfer is sequentially carried out, so that one scanning is finished. The overall timing chart is shown in fig. 2.
In some application scenarios with higher screen resolution, the display area time of the DP is very long, and the Sample Hold or Data Transfer cannot be completed in the DP non-display area. If the Sample Hold or Data Transfer is interfered by the signal of DP precharge, it can be reported that the function of dot-dash line has a great influence. For such a scenario, the establishment node of Sample Hold needs to be designed to be flexible and configurable. In the conventional architecture, after the TP scan is completed, the hobby horse performs Sample Hold, whereas in the present invention, after the TP scan is completed, the setup of Sample Hold can be delayed through digital internal configuration. After the completion of the precharge of the DP, Sample Hold is performed again, followed by completion of Data Transfer. In the whole process, the scanning of the TP and the data processing of the ADC are ensured, the pre-charging area of the DP is avoided, and the noise interference received by the TP integrally is ensured to be minimum. Meanwhile, the TP is not limited to work in the DP non-display area, so that the frequency hopping operation can be normally carried out on the TP. The timing chart is shown in fig. 3.
Claims (2)
1. A TP chip scanning method avoiding noise is characterized in that: taking the rising edge of the line synchronizing signal Hsync as a mark, controlling the scanning and data conversion of the TP to avoid the DP pre-charging area, specifically as follows:
(1) before configuring TP time sequence, firstly, actually measuring to obtain Hsync period and DP pre-charging time;
(2) configuring a related time sequence of TP, starting timing inside the TP when the rising edge of Hsync arrives, starting the CA after the time exceeds the DP pre-charging time, and formally starting scanning;
(3) after the scanning is finished, the Sample Hold is normally established, and Data Transfer is sequentially carried out, so that one scanning is finished.
2. The method of claim 1, wherein the method further comprises: when the resolution of the screen is high, the display area time of the DP is long, and the Sample Hold or the Data Transfer cannot be completed in the DP non-display area, the establishment of the Sample Hold needs to be delayed through digital internal configuration after the TP scanning is completed, the Sample Hold is performed after the DP pre-charging is completed, the Data Transfer is completed, and the scanning of the TP and the Data processing of the ADC are ensured to avoid the pre-charging area of the DP in the whole process.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111037719.9A CN113760130A (en) | 2021-09-06 | 2021-09-06 | TP chip scanning method avoiding noise |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111037719.9A CN113760130A (en) | 2021-09-06 | 2021-09-06 | TP chip scanning method avoiding noise |
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| CN113760130A true CN113760130A (en) | 2021-12-07 |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102467281A (en) * | 2010-11-15 | 2012-05-23 | 联咏科技股份有限公司 | Touch controller of touch display device and drive method thereof |
| CN104795018A (en) * | 2015-05-08 | 2015-07-22 | 上海天马微电子有限公司 | Shifting register, driving method, grid drive circuit and display device |
| CN109491533A (en) * | 2017-09-11 | 2019-03-19 | 夏普株式会社 | Display device |
| CN109634473A (en) * | 2019-01-15 | 2019-04-16 | 深圳禾苗通信科技有限公司 | A kind of noise-reduction method, terminal and the storage medium of capacitance touching control screen |
| CN109670466A (en) * | 2018-12-25 | 2019-04-23 | 厦门天马微电子有限公司 | Display panel and its driving method and display device |
| CN112735335A (en) * | 2020-11-30 | 2021-04-30 | 上海天马有机发光显示技术有限公司 | Organic light-emitting display panel, display device and driving method |
-
2021
- 2021-09-06 CN CN202111037719.9A patent/CN113760130A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102467281A (en) * | 2010-11-15 | 2012-05-23 | 联咏科技股份有限公司 | Touch controller of touch display device and drive method thereof |
| CN104795018A (en) * | 2015-05-08 | 2015-07-22 | 上海天马微电子有限公司 | Shifting register, driving method, grid drive circuit and display device |
| CN109491533A (en) * | 2017-09-11 | 2019-03-19 | 夏普株式会社 | Display device |
| CN109670466A (en) * | 2018-12-25 | 2019-04-23 | 厦门天马微电子有限公司 | Display panel and its driving method and display device |
| CN109634473A (en) * | 2019-01-15 | 2019-04-16 | 深圳禾苗通信科技有限公司 | A kind of noise-reduction method, terminal and the storage medium of capacitance touching control screen |
| CN112735335A (en) * | 2020-11-30 | 2021-04-30 | 上海天马有机发光显示技术有限公司 | Organic light-emitting display panel, display device and driving method |
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