CN113742153B - Equipment testing method and device, readable medium and electronic equipment - Google Patents
Equipment testing method and device, readable medium and electronic equipment Download PDFInfo
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
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Abstract
The disclosure relates to a device testing method, a device, a readable medium and an electronic device. The method comprises the following steps: obtaining equipment testing parameters corresponding to target equipment; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. In this way, the device test under the environment to be tested can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, and the same test effect as that in the actual environment to be tested can be obtained, so that the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
Description
Technical Field
The disclosure relates to the technical field of computers, and in particular relates to a device testing method and device, a readable medium and electronic equipment.
Background
With the development and progress of internet technology, many target servers are required to provide services for users, and in order to ensure the reliability and availability of the target servers, many stress tests are performed during the development and production of the target servers. However, after the pressure test is performed on the target server in the conventional environment, a problem that the failure rate of the target server is high still occurs in actual use. In order to better discover the failure of the target server through the pressure test, the pressure test can be performed in a high-temperature and high-humidity environment, which can make the problematic module more easily exposed to the problem. For example, a memory module is difficult to find problems in a conventional environment, but problems are easy to test in a high-temperature and high-humidity environment. However, in the related art, the construction of the high-temperature and high-humidity environment is complicated, resulting in high test cost and low test efficiency.
Disclosure of Invention
This summary is provided to introduce a selection of concepts in a simplified form that are further described below in the detailed description. This summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.
In a first aspect, the present disclosure provides a device testing method, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Optionally, the environment to be tested comprises a high-temperature and high-humidity environment, and the high-temperature and high-humidity environment is a test environment with an environmental temperature greater than or equal to a preset temperature threshold and an environmental humidity greater than or equal to a preset humidity threshold; the obtaining the corresponding target parameter value of the equipment test parameter in the environment to be tested comprises the following steps:
Under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the testing the target device according to the target parameter value in the current environment includes:
setting a value of a device test parameter of the target device to the target parameter value;
and testing the target equipment in the current environment.
Optionally, the testing the target device in the current environment includes:
running a target load program through the target equipment in the current environment so as to test the target equipment; the target load program is a program comprising an operating system and a target service system.
Optionally, the target device is a target server; before the target parameter values corresponding to the device test parameters in the environment to be tested are obtained, the method further comprises:
and determining the environment to be tested according to the starting parameters of the target server.
Optionally, the starting parameters of the target server include preset parameters of a motherboard basic input output system of the target server.
Optionally, the starting parameter of the target server includes a pin voltage of a preset pin of a motherboard starting chip of the target server.
In a second aspect, the present disclosure provides a device testing apparatus, the apparatus comprising:
the test parameter acquisition module is used for acquiring equipment test parameters corresponding to the target equipment;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in the environment to be tested;
and the device testing module is used for testing the target device in the current environment according to the target parameter value to obtain a test result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Optionally, the environment to be tested comprises a high-temperature and high-humidity environment, and the high-temperature and high-humidity environment is a test environment with an environmental temperature greater than or equal to a preset temperature threshold and an environmental humidity greater than or equal to a preset humidity threshold; the parameter value acquisition module is used for acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation under the condition that the environment to be tested is the high-temperature high-humidity environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the device testing module is configured to set a value of a device testing parameter of the target device to the target parameter value; and testing the target equipment in the current environment.
Optionally, the device testing module is configured to run a target load program through the target device in the current environment so as to test the target device; the target load program is a program comprising an operating system and a target service system.
Optionally, the apparatus further comprises:
and the environment to be tested determining module is used for determining the environment to be tested according to the starting parameters of the target server.
Optionally, the starting parameters of the target server include preset parameters of a motherboard basic input output system of the target server.
Optionally, the starting parameter of the target server includes a pin voltage of a preset pin of a motherboard starting chip of the target server.
In a third aspect, the present disclosure provides a computer readable medium having stored thereon a computer program which when executed by a processing device performs the steps of the method of the first aspect of the present disclosure.
In a fourth aspect, the present disclosure provides an electronic device comprising:
A storage device having a computer program stored thereon;
processing means for executing said computer program in said storage means to carry out the steps of the method of the first aspect of the disclosure.
By adopting the technical scheme, the equipment test parameters corresponding to the target equipment are obtained; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. In this way, the device test under the environment to be tested (such as a high-temperature high-humidity environment) can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, so that the same test effect as that in the actual environment to be tested can be obtained, the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
Additional features and advantages of the present disclosure will be set forth in the detailed description which follows.
Drawings
The above and other features, advantages, and aspects of embodiments of the present disclosure will become more apparent by reference to the following detailed description when taken in conjunction with the accompanying drawings. The same or similar reference numbers will be used throughout the drawings to refer to the same or like elements. It should be understood that the figures are schematic and that elements and components are not necessarily drawn to scale. In the drawings:
Fig. 1 is a flow chart illustrating a device testing method according to an exemplary embodiment.
Fig. 2 is a flowchart illustrating a step S103 according to the embodiment shown in fig. 1.
Fig. 3 is a flow chart illustrating another device testing method according to an exemplary embodiment.
Fig. 4 is a block diagram illustrating a device testing apparatus according to an example embodiment.
Fig. 5 is a block diagram illustrating another device testing apparatus according to an example embodiment.
Fig. 6 is a block diagram of an electronic device, according to an example embodiment.
Detailed Description
Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present disclosure have been shown in the accompanying drawings, it is to be understood that the present disclosure may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are for illustration purposes only and are not intended to limit the scope of the present disclosure.
It should be understood that the various steps recited in the method embodiments of the present disclosure may be performed in a different order and/or performed in parallel. Furthermore, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the present disclosure is not limited in this respect.
The term "including" and variations thereof as used herein are intended to be open-ended, i.e., including, but not limited to. The term "based on" is based at least in part on. The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments. Related definitions of other terms will be given in the description below.
It should be noted that the terms "first," "second," and the like in this disclosure are merely used to distinguish between different devices, modules, or units and are not used to define an order or interdependence of functions performed by the devices, modules, or units.
It should be noted that references to "one", "a plurality" and "a plurality" in this disclosure are intended to be illustrative rather than limiting, and those of ordinary skill in the art will appreciate that "one or more" is intended to be understood as "one or more" unless the context clearly indicates otherwise.
The names of messages or information interacted between the various devices in the embodiments of the present disclosure are for illustrative purposes only and are not intended to limit the scope of such messages or information.
First, an application scenario of the present disclosure will be described. The present disclosure may be applied to device testing scenarios, such as stress testing of a target server. In order to be able to better discover equipment faults by pressure testing, the pressure testing can be performed in a high temperature and high humidity environment, which can make problematic modules more easily exposed to problems. For example, the memory module of the target server is difficult to find problems under the conventional environment, but the problems are easy to detect under the high-temperature and high-humidity environment. In the related art, in order to perform a test under a high-temperature and high-humidity environment, a specialized temperature and humidity test room needs to be constructed, and the high-temperature and high-humidity environment is constructed through the temperature and humidity of the paper temperature and humidity test room to perform the test. In the method, the temperature and humidity test room is complex in structure and temperature and humidity control, and special test equipment is generally required to construct the test environment, so that the test cost is high, and the test efficiency is low.
In order to solve the above problems, the present disclosure provides a method and apparatus for testing devices, a readable medium, and an electronic device, by acquiring device testing parameters corresponding to a target device; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. In this way, the device test under the environment to be tested can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, and the same test effect as that in the actual environment to be tested can be obtained, so that the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
Specific embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.
Fig. 1 is a device testing method, as shown in fig. 1, according to an exemplary embodiment, the method comprising:
step 101, acquiring equipment test parameters corresponding to target equipment.
Step 102, obtaining a target parameter value corresponding to the equipment test parameter in the environment to be tested.
And step 103, testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested.
Wherein the current environment and the environment to be tested are different environments.
The target device may be, for example, a target server, terminal, or other electronic device. The target device may include a processor, which may be a CPU (Central Processing Unit ) or a GPU (Graphics Processing Unit, image processor), and a memory, which may be a memory or a hard disk; the device test parameters may include device parameters of a processor or memory. For example, the device test parameters may include refresh rate, voltage, or other parameters of the memory.
Further, the environment to be tested may be a high temperature and high humidity environment, a high temperature environment, a high humidity or low temperature environment, etc., and the current environment may be a normal environment with moderate temperature and humidity. By way of example, a test environment having a temperature of 18 to 30 degrees celsius and a humidity of 30% to 60% may be taken as a conventional environment. It should be noted that the temperature and humidity are moderate.
By adopting the method, the equipment test parameters corresponding to the target equipment are obtained; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. In this way, the device test under the environment to be tested (such as a high-temperature high-humidity environment) can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, so that the same test effect as that in the actual environment to be tested can be obtained, the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
In another embodiment of the present disclosure, different target parameter values are preset for different environments to be tested, and specifically may include any one of the following ways:
in a first mode, the environment to be tested includes a high-temperature and high-humidity environment, where the high-temperature and high-humidity environment is a test environment with an environmental temperature greater than or equal to a preset temperature threshold and an environmental humidity greater than or equal to a preset humidity threshold. In this way, under the condition that the environment to be tested is the high-temperature high-humidity environment, a first target parameter value corresponding to the high-temperature high-humidity environment can be obtained according to the corresponding relation of the preset parameter environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
For example, the preset temperature threshold may be 40 degrees celsius, 60 degrees celsius, or 85 degrees celsius, and the preset humidity threshold may be 60%, 70%, or 85%; and taking the test environment with the environment temperature being greater than or equal to a preset temperature threshold value and the environment humidity being greater than or equal to a preset humidity threshold value as the high-temperature high-humidity environment. In the case that the target device includes a memory, the device test parameters may include tREF (Refresh Period), tWR (Write Recovery Time, write recovery delay), VDD (Voltage Drain-to-Drain) of the memory. The obtaining of the first target parameter value of the equipment test parameter in the high temperature environment according to the preset parameter environment correspondence includes: tref=15.6 microseconds, twr=10 nanoseconds, vdd=1.2 volts.
It should be noted that, the first target parameter value is taken as an example, and the corresponding relationships of the preset parameter environments corresponding to different device types may be different, for example, different corresponding relationships of the preset parameter environments may be preset according to different memory types.
In this way, the target parameter value of the equipment test parameter corresponding to the high-temperature high-humidity environment can be obtained through the preset parameter environment corresponding relation, the target equipment is tested in the current environment (such as normal-temperature environment) according to the target parameter value, the high-temperature high-humidity environment can be simulated, the test result of the target equipment in the high-temperature high-humidity environment is obtained, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
In the second mode, the environment to be tested may include a high temperature environment, where the high temperature environment is a test environment with an environmental temperature greater than or equal to a preset temperature threshold. In this way, when the environment to be tested is the high-temperature environment, a second target parameter value corresponding to the high-temperature environment can be obtained according to the corresponding relation of the preset parameter environments; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Likewise, the preset temperature threshold may be 40 degrees celsius, 60 degrees celsius, or 85 degrees celsius; and taking the environment which is larger than or equal to the preset temperature threshold value as a high-temperature environment. In the case where the target device includes memory, the device test parameters may include tREF, tWR, VDD of the memory. The obtaining of the second target parameter value of the equipment test parameter in the high temperature environment according to the preset parameter environment correspondence includes: tref=7.8 microseconds, twr=10 nanoseconds, vdd=1.2 volts.
It should be noted that, the second target parameter value is taken as an example, and the corresponding relationships of the preset parameter environments corresponding to different device types may be different, for example, different corresponding relationships of the preset parameter environments may be preset according to different memory types.
In this way, the target parameter value of the equipment test parameter corresponding to the high-temperature environment can be obtained through the preset parameter environment corresponding relation, the target equipment is tested in the current environment (normal-temperature environment) according to the target parameter value, and the high-temperature environment can be simulated, so that the test result of the target equipment in the high-temperature environment is obtained, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
In the second mode, the environment to be tested may include a high humidity environment, where the high humidity environment is a test environment with an environmental humidity greater than or equal to a preset humidity threshold. In this way, under the condition that the environment to be tested is the high humidity environment, a third target parameter value corresponding to the high humidity environment is obtained according to the corresponding relation of the preset parameter environments; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
For example, the preset humidity threshold may be 60%, 70% or 85%, and an environment greater than or equal to the preset humidity threshold may be regarded as a high humidity environment. Under the condition that the target device comprises a memory, obtaining a third target parameter value of the device test parameter in the high humidity environment according to the preset parameter environment correspondence comprises: tref=7.8 microseconds, twr=10 nanoseconds, vdd=1.21 volts.
It should be noted that, the first target parameter value is taken as an example, and the corresponding relationships of the preset parameter environments corresponding to different device types may be different, for example, different corresponding relationships of the preset parameter environments may be preset according to different memory types.
In this way, the target parameter value of the equipment test parameter corresponding to the high humidity environment can be obtained through the preset parameter environment corresponding relation, the target equipment is tested according to the target parameter value in the current environment, the high humidity environment can be simulated, the test result of the target equipment in the high humidity environment is obtained, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
In another embodiment of the present disclosure, the step 103 of testing the target device according to the target parameter value in the current environment may include the steps of:
first, the value of the device test parameter of the target device is set to the target parameter value.
The target device is then tested in the current environment.
Also by way of example, in the case where the target device includes a memory, tREF of the memory may be set to 15.6 microseconds, tWR to 10 nanoseconds, and VDD to 1.2 volts by the preset parameter context correspondence; the target device is then tested in the current environment.
Therefore, the environment to be tested can be simulated by changing the value of the equipment test parameter, the target equipment is tested, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
Further, in the case that the device test parameters of the target device are plural, the target parameter value of each device test parameter may be set in sequence, and the target device may be tested plural times in the current environment.
Fig. 2 is a flowchart of a step S103 shown in the embodiment shown in fig. 1, where the device test parameters of the target device include tREF, tWR, and VDD, as shown in fig. 2, the step 103 of testing the target device according to the target parameter values in the current environment may include the following steps:
step 1031, setting the device test parameter as a default value, and testing the target device in the current environment.
Step 1032, setting tREF to a preset tREF test value, and testing the target device in the current environment.
For example, the preset tREF test value may be 7.8 microseconds.
Further, the value of tREF may also be set to vary back and forth between 7.8 microseconds and 15.6 microseconds at a preset period.
Step 1033, setting tREF to a first preset tWR test value, and testing the target device in the current environment.
The first preset tWR test value may be, for example, 8 ns or 10 ns.
Likewise, the value of tWR may also be set to vary back and forth between 8 nanoseconds and 10 nanoseconds in accordance with a preset period.
Step 1034, setting tREF to a first preset VDD test value, and testing the target device in the current environment.
Illustratively, the first preset VDD test value may be any value within a range of 1.2v±10%.
Step 1035, setting tREF to the second preset VDD test value, and testing the target device in the current environment.
Illustratively, the second preset VDD test value may be any value within a range of 1.2v±10%; the second preset tWR test value may be 8 nanoseconds.
Therefore, the fault detection rate of the target equipment can be further improved by testing the target parameter values of the plurality of equipment testing parameters of the equipment and performing multiple rounds of testing.
Further, the manner in which the target device is tested in the current environment may include: running a target load program through the target device in the current environment so as to test the target device; the target load program is a program comprising an operating system and a target service system.
It should be noted that, in the related art, the test under the high temperature and high humidity environment is the test under the Pre-OS (Pre Operating System, without the operating system) mode, that is, the test is performed by using the device without the operating system and the service system, and the simple test is performed under the high temperature and high humidity environment only through the fixed test program or code stream. The method is difficult to simulate the actual target load program, so that problems cannot be found during testing, but problems are easy to occur during actual running of the target load program, and the problem of testing is high in omission ratio. By adopting the method in the disclosure, the target load program can be operated in the current environment through the target equipment, and the target load program is a program comprising an operating system and a target service system, so that the target load program can be tested in a targeted manner by operating the actual operating system and the target service system program, the problem in the actual operation of the equipment can be found more easily, and the accuracy of the test of the target equipment is improved.
Further, the manner in which the target device is tested in the current environment may include: running a memory read-write test program through the target equipment in the current environment so as to test the target equipment; the memory read-write test program is used for repeatedly performing read-write operation on the target memory position according to a preset sequence.
The memory read/write test program may run in an environment without an operating system, and for example, the memory read/write program may include:
and performing multiple read-write operations on the target memory location according to a preset sequence, and determining whether the memory location is faulty or not by comparing the read data with the written data. Or,
and performing multiple read-write operations on the target memory location and the adjacent location of the target memory location, and determining whether the memory location and the adjacent location are faulty or not by comparing the read data with the written data.
Thus, under the condition that the target equipment is not deployed with an operating system and a real service system, the target equipment can be tested through the memory read-write test program.
In another embodiment of the present disclosure, the target device is a target server; before the obtaining the corresponding target parameter value of the device test parameter in the environment to be tested, the method may further include: and determining the environment to be tested according to the starting parameters of the target server.
The startup parameters of the target server may include preset parameters of a motherboard BIOS (Basic Input Output System ) of the target server, where the preset parameters may be used to determine an environment to be tested. For example, the environment to be tested may be a high temperature and high humidity environment by the preset parameter value of 1, the environment to be tested may be a high temperature environment by the preset parameter value of 2, the environment to be tested may be a high humidity environment by the preset parameter value of 3, and the environment to be tested may be a low temperature environment by the preset parameter value of 4.
Further, the starting parameter of the target server may further include a pin voltage of a preset pin of a motherboard starting chip of the target server. The preset pins may be one or more pins of the motherboard start chip. The pin voltage may be used to determine the environment to be tested.
Therefore, the environment to be tested is determined through the starting parameters, automatic test can be realized, and the test efficiency is improved.
FIG. 3 is another device testing method, as shown in FIG. 3, according to an exemplary embodiment, which may include:
step 301, starting up the target device.
Step 302, initializing a target device bottom layer platform component.
Illustratively, the initialization of various platform components including DDR SDRAM (Double Data Rate Synchronous Dynamic Random Access Memory ), PCIe (Peripheral Component Interconnect express, high speed serial computer expansion bus standard), and the like.
Step 303, acquiring a starting parameter of the target device, and determining an environment to be tested according to the starting parameter.
For example, the start-up parameter may be a preset parameter of a motherboard BIOS (Basic Input Output System ) of the target server, or a pin voltage of a preset pin of a motherboard start-up chip of the target server.
Step 304, obtaining device test parameters corresponding to the target device.
Step 305, according to the environment to be tested, obtaining the corresponding target parameter value of the device test parameter in the environment to be tested.
Step 306, setting the value of the device test parameter of the target device to the target parameter value.
Step 307, in the current environment, starting the operating system in the target load program through the target device.
And 308, running a target service system in a target load program through target equipment in the current environment to obtain a test result of the target equipment in the environment to be tested.
In summary, by adopting the above scheme, the device test parameters corresponding to the target device are obtained; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. In this way, the device test under the environment to be tested (such as a high-temperature high-humidity environment) can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, so that the same test effect as that in the actual environment to be tested can be obtained, the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
Fig. 4 is a block diagram illustrating a device testing apparatus according to an example embodiment. As shown in fig. 4, the device testing apparatus includes:
a test parameter obtaining module 401, configured to obtain device test parameters corresponding to a target device;
a parameter value obtaining module 402, configured to obtain a target parameter value corresponding to the device test parameter in the environment to be tested;
the device testing module 403 is configured to test the target device in a current environment according to the target parameter value, so as to obtain a test result of the target device in the environment to be tested, where the current environment is different from the environment to be tested.
Optionally, the environment to be tested includes a high-temperature and high-humidity environment, where the high-temperature and high-humidity environment is a test environment with an environmental temperature greater than or equal to a preset temperature threshold and an environmental humidity greater than or equal to a preset humidity threshold; the parameter value obtaining module 402 is configured to obtain, according to a preset parameter environment correspondence, a first target parameter value corresponding to the high-temperature and high-humidity environment when the environment to be tested is the high-temperature and high-humidity environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the device testing module 403 is configured to set a value of a device testing parameter of the target device to the target parameter value; the target device is tested in the current environment.
Optionally, the device testing module 403 is configured to run, in the current environment, a target load program through the target device, so as to test the target device; the target load program is a program comprising an operating system and a target service system.
Fig. 5 is a block diagram illustrating a device testing apparatus according to an example embodiment. As shown in fig. 5, the device testing apparatus further includes:
the environment to be tested determining module 501 is configured to determine the environment to be tested according to the start-up parameter of the target server.
Optionally, the startup parameters of the target server include preset parameters of a motherboard basic input output system of the target server.
Optionally, the starting parameter of the target server includes a pin voltage of a preset pin of a motherboard starting chip of the target server.
By adopting the device, the equipment test parameters corresponding to the target equipment can be obtained; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. In this way, the device test under the environment to be tested can be simulated by setting the target parameter value of the device test parameter in the current conventional environment, and the same test effect as that in the actual environment to be tested can be obtained, so that the device problem can be found more efficiently, the test cost is reduced, and the test efficiency is also improved.
Referring now to fig. 6, a schematic diagram of an electronic device 600 suitable for use in implementing embodiments of the present disclosure is shown. The terminal devices in the embodiments of the present disclosure may include, but are not limited to, mobile terminals such as mobile phones, notebook computers, digital broadcast receivers, PDAs (personal digital assistants), PADs (tablet computers), PMPs (portable multimedia players), in-vehicle terminals (e.g., in-vehicle navigation terminals), and the like, and stationary terminals such as digital TVs, desktop computers, and the like. The electronic device shown in fig. 6 is merely an example and should not be construed to limit the functionality and scope of use of the disclosed embodiments.
As shown in fig. 6, the electronic device 600 may include a processing means (e.g., a central processing unit, a graphics processor, etc.) 601, which may perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM) 602 or a program loaded from a storage means 608 into a Random Access Memory (RAM) 603. In the RAM603, various programs and data required for the operation of the electronic apparatus 600 are also stored. The processing device 601, the ROM602, and the RAM603 are connected to each other through a bus 604. An input/output (I/O) interface 605 is also connected to bus 604.
In general, the following devices may be connected to the I/O interface 605: input devices 606 including, for example, a touch screen, touchpad, keyboard, mouse, camera, microphone, accelerometer, gyroscope, and the like; an output device 607 including, for example, a Liquid Crystal Display (LCD), a speaker, a vibrator, and the like; storage 608 including, for example, magnetic tape, hard disk, etc.; and a communication device 609. The communication means 609 may allow the electronic device 600 to communicate with other devices wirelessly or by wire to exchange data. While fig. 6 shows an electronic device 600 having various means, it is to be understood that not all of the illustrated means are required to be implemented or provided. More or fewer devices may be implemented or provided instead.
In particular, according to embodiments of the present disclosure, the processes described above with reference to flowcharts may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a non-transitory computer readable medium, the computer program comprising program code for performing the method shown in the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network via communication means 609, or from storage means 608, or from ROM 602. The above-described functions defined in the methods of the embodiments of the present disclosure are performed when the computer program is executed by the processing device 601.
It should be noted that the computer readable medium described in the present disclosure may be a computer readable signal medium or a computer readable storage medium, or any combination of the two. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples of the computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this disclosure, a computer-readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. In the present disclosure, however, the computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, with the computer-readable program code embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: electrical wires, fiber optic cables, RF (radio frequency), and the like, or any suitable combination of the foregoing.
In some implementations, the clients, servers may communicate using any currently known or future developed network protocol, such as HTTP (HyperText Transfer Protocol ), and may be interconnected with any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network ("LAN"), a wide area network ("WAN"), the internet (e.g., the internet), and peer-to-peer networks (e.g., ad hoc peer-to-peer networks), as well as any currently known or future developed networks.
The computer readable medium may be contained in the electronic device; or may exist alone without being incorporated into the electronic device.
The computer readable medium carries one or more programs which, when executed by the electronic device, cause the electronic device to: obtaining equipment testing parameters corresponding to target equipment; obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments.
Computer program code for carrying out operations of the present disclosure may be written in one or more programming languages, including, but not limited to, an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider).
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The modules described in the embodiments of the present disclosure may be implemented in software or hardware. The name of the module is not limited to the module itself in some cases, and for example, the test parameter obtaining module may also be described as "a module for obtaining the device test parameter corresponding to the target device".
The functions described above herein may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: a Field Programmable Gate Array (FPGA), an Application Specific Integrated Circuit (ASIC), an Application Specific Standard Product (ASSP), a system on a chip (SOC), a Complex Programmable Logic Device (CPLD), and the like.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. The machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
In accordance with one or more embodiments of the present disclosure, example 1 provides a device testing method, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
According to one or more embodiments of the present disclosure, example 2 provides the method of example 1, the environment to be tested comprising a high temperature, high humidity environment, the high temperature, high humidity environment being a test environment having an ambient temperature greater than or equal to a preset temperature threshold and an ambient humidity greater than or equal to a preset humidity threshold; the obtaining the corresponding target parameter value of the equipment test parameter in the environment to be tested comprises the following steps:
under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
In accordance with one or more embodiments of the present disclosure, example 3 provides the method of example 1, the testing the target device in the current environment according to the target parameter value comprising:
setting a value of a device test parameter of the target device to the target parameter value;
and testing the target equipment in the current environment.
In accordance with one or more embodiments of the present disclosure, example 4 provides the method of example 3, the testing the target device in the current environment comprising:
running a target load program through the target equipment in the current environment so as to test the target equipment; the target load program is a program comprising an operating system and a target service system.
According to one or more embodiments of the present disclosure, example 5 provides the method of any one of examples 1 to 4, the target device being a target server; before the target parameter values corresponding to the device test parameters in the environment to be tested are obtained, the method further comprises:
and determining the environment to be tested according to the starting parameters of the target server.
In accordance with one or more embodiments of the present disclosure, example 6 provides the method of example 5, the startup parameters of the target server include preset parameters of a motherboard base input output system of the target server.
In accordance with one or more embodiments of the present disclosure, example 7 provides the method of example 5, the start-up parameter of the target server includes a pin voltage of a preset pin of a motherboard start-up chip of the target server.
Example 8 provides a device testing apparatus according to one or more embodiments of the present disclosure, the apparatus comprising:
the test parameter acquisition module is used for acquiring equipment test parameters corresponding to the target equipment;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in the environment to be tested;
and the device testing module is used for testing the target device in the current environment according to the target parameter value to obtain a test result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
According to one or more embodiments of the present disclosure, example 9 provides a computer-readable medium having stored thereon a computer program which, when executed by a processing device, implements the steps of the methods described in examples 1 to 7.
In accordance with one or more embodiments of the present disclosure, example 10 provides an electronic device, comprising: a storage device having a computer program stored thereon; processing means for executing the computer program in the storage means to realize the steps of the method described in examples 1 to 7.
The foregoing description is only of the preferred embodiments of the present disclosure and description of the principles of the technology being employed. It will be appreciated by persons skilled in the art that the scope of the disclosure referred to in this disclosure is not limited to the specific combinations of features described above, but also covers other embodiments which may be formed by any combination of features described above or equivalents thereof without departing from the spirit of the disclosure. Such as those described above, are mutually substituted with the technical features having similar functions disclosed in the present disclosure (but not limited thereto).
Moreover, although operations are depicted in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order. In certain circumstances, multitasking and parallel processing may be advantageous. Likewise, while several specific implementation details are included in the above discussion, these should not be construed as limiting the scope of the present disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are example forms of implementing the claims. The specific manner in which the various modules perform the operations in the apparatus of the above embodiments have been described in detail in connection with the embodiments of the method, and will not be described in detail herein.
Claims (10)
1. A method of device testing, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
obtaining a corresponding target parameter value of the equipment test parameter in an environment to be tested;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
2. The method of claim 1, wherein the environment to be tested comprises a high temperature and high humidity environment, the high temperature and high humidity environment being a test environment having an ambient temperature greater than or equal to a preset temperature threshold and an ambient humidity greater than or equal to a preset humidity threshold; the obtaining the corresponding target parameter value of the equipment test parameter in the environment to be tested comprises the following steps:
Under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
3. The method of claim 1, wherein said testing the target device in the current environment according to the target parameter value comprises:
setting a value of a device test parameter of the target device to the target parameter value;
and testing the target equipment in the current environment.
4. The method of claim 3, wherein the testing the target device in the current environment comprises:
running a target load program through the target equipment in the current environment so as to test the target equipment; the target load program is a program comprising an operating system and a target service system.
5. The method according to any one of claims 1 to 4, wherein the target device is a target server; before the target parameter values corresponding to the device test parameters in the environment to be tested are obtained, the method further comprises:
And determining the environment to be tested according to the starting parameters of the target server.
6. The method of claim 5, wherein the start-up parameters of the target server comprise preset parameters of a motherboard base input output system of the target server.
7. The method of claim 5, wherein the start-up parameters of the target server include a pin voltage of a preset pin of a motherboard start-up chip of the target server.
8. A device testing apparatus, the apparatus comprising:
the test parameter acquisition module is used for acquiring equipment test parameters corresponding to the target equipment;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in the environment to be tested;
and the device testing module is used for testing the target device in the current environment according to the target parameter value to obtain a test result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
9. A computer readable medium on which a computer program is stored, characterized in that the program, when being executed by a processing device, carries out the steps of the method according to any one of claims 1 to 7.
10. An electronic device, comprising:
a storage device having a computer program stored thereon;
processing means for executing said computer program in said storage means to carry out the steps of the method of any one of claims 1 to 7.
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| CN202111082941.0A CN113742153B (en) | 2021-09-15 | 2021-09-15 | Equipment testing method and device, readable medium and electronic equipment |
| PCT/CN2022/119077 WO2023040976A1 (en) | 2021-09-15 | 2022-09-15 | Device testing method and apparatus, and readable medium and electronic device |
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| CN113742153B (en) * | 2021-09-15 | 2023-12-26 | 北京字节跳动网络技术有限公司 | Equipment testing method and device, readable medium and electronic equipment |
| CN114236276B (en) * | 2021-12-07 | 2022-10-04 | 安徽中家智锐科技有限公司 | Method and system for remotely testing electric appliance |
| CN115018301A (en) * | 2022-05-30 | 2022-09-06 | 佛山市美的清湖净水设备有限公司 | Performance detection method and device for water softening equipment and electronic equipment |
| CN116520816B (en) * | 2023-07-05 | 2023-09-05 | 天津信天电子科技有限公司 | Servo control driver testing method, device, testing equipment and storage medium |
| CN116955208B (en) * | 2023-09-18 | 2024-03-15 | 荣耀终端有限公司 | Test method, terminal equipment, chip and storage medium |
| CN117516969A (en) * | 2023-10-31 | 2024-02-06 | 广州五所环境仪器有限公司 | Device testing method, device, computer device and storage medium |
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| WO2023040976A1 (en) | 2023-03-23 |
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