CN113702791A - Semiconductor discrete device testing arrangement - Google Patents

Semiconductor discrete device testing arrangement Download PDF

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Publication number
CN113702791A
CN113702791A CN202110788344.3A CN202110788344A CN113702791A CN 113702791 A CN113702791 A CN 113702791A CN 202110788344 A CN202110788344 A CN 202110788344A CN 113702791 A CN113702791 A CN 113702791A
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China
Prior art keywords
fixedly connected
diode
cylinder
box body
detection
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CN202110788344.3A
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Chinese (zh)
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CN113702791B (en
Inventor
杜秋平
李亚飞
李盼
马开鹏
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Chengdu Cisco Microelectronics Co Ltd
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Chengdu Cisco Microelectronics Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses a semiconductor discrete device testing device, which comprises a bottom plate, wherein a protective shell is fixedly connected to the top surface of the bottom plate, a box body is fixedly connected to the top surface of the protective shell, the box body is arranged in a circular shape, a circular plate is arranged in the inner cavity of the box body, a plurality of arc-shaped grooves are formed in the side wall of the circular plate, diodes are arranged in the arc-shaped grooves, a reciprocating mechanism is arranged on the side wall of the box body, the reciprocating mechanism is provided with a detection mechanism at one side close to the circular plate, a plurality of magnetic blocks are fixedly connected to the top surface of the circular plate, a vertical shaft is fixedly connected to the bottom surface of the circular plate, the bottom end of the vertical shaft penetrates through the box body and is fixedly connected with a ratchet wheel disc, the vertical shaft is movably connected with the box body, a first sheave is fixedly connected to the side wall of the vertical shaft, the invention can intermittently feed the diodes through the mutual matching among the box body, the circular plate and a feeding mechanism, avoid taking place the condition such as jam when the feeding, can effectual improvement its convenient degree of using.

Description

Semiconductor discrete device testing arrangement
Technical Field
The invention relates to the technical field of semiconductor discrete device testing, in particular to a semiconductor discrete device testing device.
Background
The semiconductor discrete device generally refers to a semiconductor crystal diode, a semiconductor triode, a diode for short, a triode and a semiconductor special device, after the semiconductor discrete device is processed and produced, the semiconductor discrete device needs to be tested, the use performance of each product is detected, the production quality is ensured, and the electrification detection is used as an important one-step test and directly influences the quality and the later use condition of the product.
In the prior art, most of the power-on detection devices for diodes of discrete semiconductor devices cannot be adjusted according to pin positions of the diodes in the use process, the situations of incomplete detection, easy pin bending and the like exist in the detection process, the diodes after the test cannot be well distinguished and discharged, and good and bad diodes are easily doped together, so that the test effect is poor and the use efficiency is low, so that the test device for the discrete semiconductor devices is provided.
Disclosure of Invention
The invention provides a semiconductor discrete device testing device, which aims to overcome the defects of poor testing effect, low use efficiency and the like in the prior art.
In order to achieve the purpose, the invention provides the following technical scheme: a semiconductor discrete device testing device comprises a bottom plate, wherein a protective shell is fixedly connected to the top surface of the bottom plate, a box body is fixedly connected to the top surface of the protective shell, the box body is arranged in a circular shape, a circular plate is arranged in the inner cavity of the box body, a plurality of arc-shaped grooves are formed in the side wall of the circular plate, diodes are arranged in the arc-shaped grooves, a reciprocating mechanism is arranged on the side wall of the box body, a detection mechanism is arranged on one side, close to the circular plate, of the reciprocating mechanism, a plurality of magnetic blocks are fixedly connected to the top surface of the circular plate, a vertical shaft is fixedly connected to the bottom surface of the circular plate, the bottom end of the vertical shaft penetrates through the box body and is fixedly connected with a ratchet disc, the vertical shaft is movably connected with the box body, a first grooved pulley is fixedly connected to the side wall of the vertical shaft, a motor is arranged on the left side of the top surface of the bottom plate, a rotating shaft is fixedly connected with a rotating shaft, a cam is fixedly connected to the top end of the rotating shaft, the eccentric fixedly connected with round bar of cam top surface, round bar and ratchet dish swing joint, fixedly connected with second sheave on the pivot lateral wall, the bottom plate top surface is close to right side department fixedly connected with air pump, two tracheas of fixedly connected with on the air pump lateral wall, protecting crust inner wall fixedly connected with limiting plate, the ring channel has been seted up to the plectane bottom surface, two installation pieces of box inner chamber bottom surface fixedly connected with, fixedly connected with air cock on the installation piece lateral wall, the trachea other end all runs through the limiting plate and is linked together with two air cocks, the box body top is close to left side department and is provided with feed mechanism.
Preferably, the reciprocating mechanism comprises a cylinder, the cylinder is movably connected with the box body, a cylinder block is arranged in an inner cavity of the cylinder, a V-shaped groove is formed in the side wall of the cylinder block, the V-shaped groove is annularly arranged, a cross rod is fixedly connected to the inner wall of the cylinder and movably connected with the V-shaped groove, a transmission shaft is fixedly connected to the bottom surface of the cylinder block, a third sheave is fixedly connected to the bottom end of the transmission shaft and penetrates through the cylinder, the first sheave is connected with the third sheave through a first belt, a baffle is movably connected to the side wall of the transmission shaft, which is located in the inner cavity of the cylinder, a first spring is arranged below the baffle, and the first spring is movably connected with the transmission shaft.
Preferably, the detection mechanism includes the diaphragm, diaphragm and drum fixed connection, the diaphragm below is provided with two detection tubes, the equal fixedly connected with slider of detection tube top surface, the diaphragm bottom surface set up with slider assorted spout, slider and spout swing joint, the equal swing joint of detection tube inner wall has two pick-up plates, the equal fixedly connected with second spring of detection plate top surface, the second spring other end all with detection tube inner wall fixed connection, the diode pin is located the detection tube, all be provided with adjustment mechanism on the slider lateral wall.
Preferably, the adjusting mechanism comprises an inserting rod, the left side wall of the transverse plate is provided with a plurality of through holes, the two inserting rods are located in the two through holes, the left side wall of the sliding block is provided with a jack matched with the inserting rod, and the inserting rod is inserted into one of the jacks.
Preferably, feed mechanism includes the inlet pipe, the inlet pipe left side is provided with two stock guides, the inlet pipe lateral wall seted up with stock guide assorted logical groove, the stock guide runs through logical groove, fixedly connected with loose axle between the stock guide, the stock guide all is fan-shaped setting, the stock guide is close to loose axle one side lateral wall and is the arc arch setting, loose axle bottom runs through stock guide and fixedly connected with fourth sheave, be connected through the second belt between fourth sheave and the second sheave, inlet pipe lateral wall fixedly connected with backup pad, the loose axle run through the backup pad and rather than swing joint.
Preferably, two discharge chutes are formed in the position, close to the rear side, of the side wall of the box body, and the side wall of the box body is fixedly connected with the material receiving plate at the position of the discharge chutes.
Preferably, the top surface of the circular plate is provided with a detection lamp.
A method for using a semiconductor discrete device testing device comprises the following steps:
s1: the distance between the detection barrels is adjusted according to the distance between the diode pins, the inserted rod is loosened, and then the detection barrels are moved to a proper position, so that the inserted rod is inserted into the jack through a proper through hole.
S2: then, the motor is started through an external power supply, the motor output shaft drives the second grooved wheel and the cam to rotate through the rotating shaft, the second grooved wheel drives the fourth grooved wheel to rotate through the second belt, the fourth grooved wheel drives the material guide plate to rotate through the movable shaft, and the intermittent blanking of the diode is achieved by utilizing the staggered arrangement of the sector surfaces of the material guide plate.
S3: the diode falls into the arc-shaped groove, the direction of the pin of the diode can be kept consistent by utilizing the magnetic block, meanwhile, the cam dials the ratchet wheel disc through the round rod to rotate to a certain angle, the ratchet wheel disc drives the first grooved wheel and the circular plate to rotate simultaneously through the vertical shaft, and the circular plate conveys the diode.
S4: when the vertical shaft drives the diode to feed, the first grooved wheel drives the third grooved wheel to rotate through the first belt, the third grooved wheel drives the cylindrical block to rotate through the transmission shaft, the cylindrical block drives the V-shaped groove to rotate, the inclined plane through the V-shaped groove utilizes the transverse rod to drive the cylinder to move upwards, the first spring is stretched, when the diode is conveyed to the lower part of the detection cylinder, the vertical shaft stops rotating, and meanwhile, the transverse rod utilizes the vertical surface of the V-shaped groove to rebound through the first spring, so that the cylinder descends.
S5: the cylinder drives the detection cylinder to descend through the transverse plate, the pins of the diodes are located in the detection cylinder, meanwhile, the pins of the diodes abut against the detection plate, the second spring is compressed, and the diodes are subjected to power-on testing.
S6: if the diode is electrified normally, the detection lamp is on, and if the diode detects a fault, the detection lamp is not on.
S7: the diode after the test is accomplished is carried to the right side blown down tank along with the plectane, starts the air pump simultaneously, if the diode test is normal, the air pump passes through the trachea and supplies air to the air cock, blows off the diode to connect on the flitch.
S8: if the diode test trouble, along with the plectane is carried, carry the diode of trouble to rear side silo of going out, blow out it through the air cock, distinguish the ejection of compact to the diode, repeat above-mentioned step, can effectual improvement its test effect.
Compared with the prior art, the invention has the beneficial effects that:
1. according to the invention, through the mutual matching of the box body, the circular plate and the feeding mechanism, the diodes can be fed intermittently, the situations of blockage and the like during feeding are avoided, and the use convenience of the diode feeding device can be effectively improved;
2. according to the invention, through the mutual matching among the reciprocating mechanism, the detection mechanism and the adjusting mechanism, the detection can be carried out according to diodes with different pins, so that the problems of incomplete detection and the like are avoided, and the detection effect can be effectively improved;
3. according to the invention, through the mutual matching among the air pump, the air nozzle and the material receiving plate, the diodes can be discharged in a distinguishing manner according to the detection data of the diodes, the doping of good and bad diodes is prevented, and the use efficiency of the diodes is improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic top view of a circular plate;
FIG. 3 is a schematic top view of the ratchet plate;
fig. 4 is a perspective view of a material guide plate;
FIG. 5 is a side view of the horizontal plate;
FIG. 6 is an enlarged view taken at A in FIG. 1;
FIG. 7 is an enlarged view of FIG. 1 at B;
fig. 8 is an enlarged view of fig. 1 at C.
Reference numbers in the figures: 1. a base plate; 2. a protective shell; 3. a box body; 4. a circular plate; 5. an arc-shaped slot; 6. a diode; 7. a reciprocating mechanism; 71. a cylinder; 72. a cylindrical block; 73. a V-shaped groove; 74. a cross bar; 75. a drive shaft; 76. a baffle plate; 77. a first spring; 8. a detection mechanism; 81. a transverse plate; 82. a detection cylinder; 83. a slider; 84. a chute; 85. detecting a plate; 86. a second spring; 9. an adjustment mechanism; 91. inserting a rod; 92. a through hole; 93. a jack; 10. a magnetic block; 11. a vertical axis; 12. a ratchet wheel disc; 13. a motor; 14. a rotating shaft; 15. a cam; 16. a round bar; 17. a second sheave; 18. a first sheave; 19. an air pump; 20. an air tube; 21. a limiting plate; 22. a third sheave; 23. an annular groove; 24. mounting blocks; 25. an air tap; 26. a feeding mechanism; 261. a feed pipe; 262. a material guide plate; 263. a movable shaft; 264. a support plate; 27. detecting a light; 28. a fourth sheave; 29. a material receiving plate.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 to 8, the overall structure of the present invention mainly includes a bottom plate 1, a protective shell 2, a box 3, a circular plate 4, a reciprocating mechanism 7, a detecting mechanism 8, an adjusting mechanism 9, an air pump 19, a feeding mechanism 26, and the like. Wherein, the box body 3 is circular, and the side wall of the circular plate 4 is provided with a plurality of arc-shaped grooves 5. During connection, the protective shell 2 is directly fixed on the top surface of the bottom plate 1, and the box body 3 is directly fixed on the top surface of the protective shell 2.
The circular plate 4 is arranged in the inner cavity of the box body 3, and a diode 6 is arranged in each arc-shaped groove 5. The reciprocating mechanism 7 is installed on the side wall of the box body 3, and the detection mechanism 8 is installed on one side of the reciprocating mechanism 7 close to the circular plate 4. The top surface of the circular plate 4 is fixedly connected with a plurality of magnetic blocks 10, the bottom surface of the circular plate 4 is fixedly connected with a vertical shaft 11, the bottom end of the vertical shaft 11 penetrates through the bottom of the box body 3, the bottom of the vertical shaft 11 is fixedly connected with a ratchet wheel disc 12, and the side wall of the vertical shaft 11 is fixedly connected with a first grooved wheel 18. The vertical shaft 11 is movably connected with the box body 3, namely, the vertical shaft 11 can rotate relative to the box body 3.
The top surface of the bottom plate 1 is provided with a motor 13 near the left side, an output shaft of the motor 13 is fixedly connected with a rotating shaft 14, the top end of the rotating shaft 14 is fixedly connected with a cam 15, the top surface of the cam 15 is eccentrically and fixedly connected with a round rod 16, and the round rod 16 is movably connected with a ratchet disc 12.
The side wall of the rotating shaft 14 is fixedly connected with a second grooved pulley 17, and an air pump 19 is fixed at a position close to the right side of the top surface of the bottom plate 1. Two air pipes 20 are fixedly connected to the side wall of the air pump 19, and a limiting plate 21 is fixedly connected to the inner wall of the protective casing 2 for fixing the air pipes 20. Meanwhile, two slots are arranged on the limiting plate 21, and two air pipes 20 of the air pump 19 are respectively clamped in the two slots to prevent the air pipes 20 from deviating or vibrating.
The annular groove 23 is opened on the bottom surface of the circular plate 4, two installation blocks 24 are fixedly connected to the bottom surface of the inner cavity of the box body 3, and an air tap 25 is fixedly connected to the side wall of each installation block 24. The other end of the air tube 20 penetrates through the limiting plate 21 and is respectively communicated with two air nozzles 25, that is, one air tube 20 is communicated with one air nozzle 25.
Feed mechanism 26 sets up in box body 3 top and is close to left side position department, and box body 3 lateral wall is close to rear side department and has seted up two blown down tanks, and box body 3 lateral wall is located blown down tank department fixedly connected with and connects flitch 29, and detection light 27 is installed to plectane 4 top surface.
According to the invention, through the mutual matching among the air pump 19, the air nozzle 25 and the material receiving plate 29, the diodes 6 can be discharged in a distinguishing way according to the detection data of the diodes 6, so that the doping of the good or bad diodes 6 is prevented, and the use efficiency of the diodes is improved.
The cross-sectional structure of the reciprocating mechanism 7 is shown in fig. 1, and comprises a cylinder 71, the cylinder 71 is movably connected with the box body 3, a cylinder block 72 is arranged in the inner cavity of the cylinder 71, a V-shaped groove 73 is formed in the side wall of the cylinder block 72, a cross bar 74 is fixedly connected with the inner wall of the cylinder 71, and the cross bar 74 is movably connected with the V-shaped groove 73. The bottom surface of the cylindrical block 72 is fixedly connected with a transmission shaft 75, the bottom end of the transmission shaft 75 penetrates through the cylinder 71 and is fixedly connected with a third sheave 22, the first sheave 18 and the third sheave 22 are connected through a first belt, the side wall of the transmission shaft 75 is positioned in the inner cavity of the cylinder 71 and is movably connected with a baffle 76, a first spring 77 is arranged below the baffle 76, and the first spring 77 is movably connected with the transmission shaft 75. The V-shaped groove 73 is arranged in a ring shape, that is, the V-shaped groove is formed along the surface of the cylindrical block 72, and the cylindrical block 72 is cylindrical, so that the V-shaped groove 73 thereon is also in a ring shape.
The detection mechanism 8 comprises a transverse plate 81, the transverse plate 81 is fixedly connected with the cylinder 71, two detection cylinders 82 are arranged below the transverse plate 81, and sliding blocks 83 are fixedly connected to the top surfaces of the detection cylinders 82. The bottom surface of the transverse plate 81 is provided with a sliding slot 84 matched with the sliding block 83, and the sliding block 83 is movably connected with the sliding slot 84, namely the sliding block 83 can move left and right in the sliding slot 84.
The inner wall of the detection barrel 82 is movably connected with two detection plates 85, the top surfaces of the detection plates 85 are fixedly connected with second springs 86, and the other ends of the second springs 86 are fixedly connected with the inner wall of the detection barrel 82. During detection, the pin of the diode 6 is positioned in the detection cylinder 82. To facilitate adjustment of the position of the slider 83, an adjustment mechanism 9 is provided on the side wall of the slider 83.
The adjusting mechanism 9 includes an insertion rod 91, a plurality of through holes 92 formed in the left side wall of the transverse plate 81, and an insertion hole 93 formed in the left side wall of the slider 83 and matched with the insertion rod 91. The two insertion rods 91 are inserted into the insertion holes 93 through the two through holes 92, respectively. During the use, through mutually supporting between reciprocating mechanism 7, detection mechanism 8 and the adjustment mechanism 9, can detect according to the diode 6 of different pins, avoid appearing detecting not in place scheduling problem, can effectual improvement its detection effect.
The feeding mechanism 26 comprises a feeding pipe 261, two material guide plates 262 are arranged on the left side of the feeding pipe 261, a through groove matched with the material guide plates 262 is formed in the side wall of the feeding pipe 261, and the material guide plates 262 penetrate through the through groove. The movable shafts 263 are fixedly connected between the material guiding plates 262, the material guiding plates 262 are all arranged in a fan shape, and the side wall of one side of the material guiding plate 262 close to the movable shafts 263 is arranged in an arc-shaped bulge.
The bottom end of the movable shaft 263 penetrates through the material guiding plate 262 and is fixedly connected with a fourth grooved pulley 28, the fourth grooved pulley 28 is connected with the second grooved pulley 17 through a second belt, the side wall of the feeding pipe 261 is fixedly connected with a supporting plate 264, and the movable shaft 263 penetrates through the supporting plate 264 and is movably connected with the supporting plate 264. Through the mutual matching among the box body 3, the circular plate 4 and the feeding mechanism 26, the intermittent feeding can be carried out on the diode 6, the situations of blockage and the like during feeding are avoided, and the use convenience of the intermittent feeding device can be effectively improved.
Through the product structure, the using method and the related working principle of the invention are as follows:
s1: the distance between the detecting cylinders 82 is firstly adjusted according to the distance between the pins of the diode 6, and the inserting rod 91 is inserted into the inserting hole 93 through the proper through hole 92 after the inserting rod 91 is loosened and the detecting cylinder 82 is moved to the proper position.
S2: then, the motor 13 is started by an external power supply, an output shaft of the motor 13 drives the second sheave 17 and the cam 15 to rotate through the rotating shaft 14, the second sheave 17 drives the fourth sheave 28 to rotate through the second belt, the fourth sheave 28 drives the material guide plate 262 to rotate through the movable shaft 263, and the intermittent blanking of the diode 6 is realized by utilizing the staggered arrangement of the fan-shaped surfaces of the material guide plate 262.
S3: the diode 6 falls into the arc-shaped groove 5, the direction of pins of the diode 6 can be kept consistent by the aid of the magnetic blocks 10, meanwhile, the cam 15 dials the ratchet disc 12 through the round rod 16 to rotate to a certain angle, the ratchet disc 12 drives the first grooved wheel 18 and the circular plate 4 to rotate through the vertical shaft 11, and the circular plate 4 conveys the diode 6.
S4: when the vertical shaft 11 drives the diode 6 to feed, the first grooved wheel 18 drives the third grooved wheel 22 to rotate through the first belt, the third grooved wheel 22 drives the cylindrical block 72 to rotate through the transmission shaft 75, the cylindrical block 72 drives the V-shaped groove 73 to rotate, the inclined surface of the V-shaped groove 73 drives the cylinder 71 to move upwards through the cross rod 74, the first spring 77 is stretched, when the diode 6 is conveyed to the position below the detection cylinder 82, the vertical shaft 11 stops rotating, and meanwhile, the cross rod 74 rebounds through the first spring 77 through the vertical surface of the V-shaped groove 73, so that the cylinder 71 descends.
S5: the cylinder 71 drives the detection cylinder 82 to descend through the transverse plate 81, at the moment, the pin of the diode 6 is located in the detection cylinder 82, meanwhile, the pin of the diode 6 abuts against the detection plate 85, the second spring 86 is compressed, and the diode 6 is subjected to power-on test.
S6: when the diode 6 is normally energized, the detection lamp 27 is turned on, and when the diode 6 detects a failure, the detection lamp 27 is not turned on.
S7: the tested diode 6 is conveyed to the right discharge chute along with the circular plate 4, the air pump 19 is started at the same time, and if the test of the diode 6 is normal, the air pump 19 supplies air to the air nozzle 25 through the air pipe 20, so that the diode 6 is blown out to the material receiving plate 29.
S8: if the diode 6 fails in testing, the failed diode 6 is conveyed to the rear side discharging groove along with the conveying of the circular plate 4, the diode 6 is blown out through the air nozzle 25, the diode 6 is distinguished and discharged, the steps are repeated, and the testing effect can be effectively improved.
The working principle is as follows: when the invention is used, firstly, the distance between the detection cylinders 82 is adjusted according to the distance between the pins of the diodes 6, the insertion rod 91 is loosened, then the detection cylinder 82 is moved to a proper position, the insertion rod 91 is inserted into the insertion hole 93 through a proper through hole 92, then the motor 13 is started through an external power supply, the output shaft of the motor 13 simultaneously drives the second grooved pulley 17 and the cam 15 to rotate through the rotating shaft 14, the second grooved pulley 17 drives the fourth grooved pulley 28 to rotate through the second belt, the fourth grooved pulley 28 drives the material guide plate 262 to rotate through the movable shaft 263, the sector surfaces of the material guide plate 262 are arranged in a staggered manner to realize intermittent blanking of the diodes 6, the diodes 6 fall into the arc-shaped grooves 5, the directions of the pins of the diodes 6 can be kept consistent by the magnetic blocks 10, meanwhile, the cam 15 stirs the ratchet disc 12 to rotate to a certain angle through the round rod 16, and the ratchet disc 12 simultaneously drives the first grooved pulley 18 and the circular plate 4 to rotate through the vertical shaft 11, the diode 6 is conveyed by the circular plate 4, while the vertical shaft 11 drives the diode 6 to feed, the first grooved wheel 18 drives the third grooved wheel 22 to rotate by the first belt, the third grooved wheel 22 drives the cylinder block 72 to rotate by the transmission shaft 75, the cylinder block 72 drives the V-shaped groove 73 to rotate, the cylinder 71 is driven to move upwards by the inclined surface of the V-shaped groove 73 by the cross rod 74, the first spring 77 stretches, when the diode 6 is conveyed to the lower part of the detection cylinder 82, the vertical shaft 11 stops rotating, meanwhile, the cross rod 74 rebounds by the vertical surface of the V-shaped groove 73 through the first spring 77, so that the cylinder 71 descends, the cylinder 71 drives the detection cylinder 82 to descend through the transverse plate 81, at the moment, the pin of the diode 6 is located in the detection cylinder 82, the pin of the diode 6 abuts against 85, the second spring 86 compresses, the diode 6 is subjected to the energization test, if the diode 6 is normally energized, the detection lamp 27 lights up, if diode 6 detects the trouble, detection light 27 is not bright, diode 6 after the test is accomplished is carried to the right side blown down tank along with plectane 4, start air pump 19 simultaneously, if diode 6 tests normally, air pump 19 supplies air to air cock 25 through trachea 20, blow off diode 6 to connect on the flitch 29, if diode 6 tests the trouble, along with plectane 4 carries, carry the diode 6 of trouble to rear side blown out silo, blow off it through air cock 25, distinguish the ejection of compact to diode 6, repeat the above-mentioned step, can effectual improvement its test effect.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (8)

1. A semiconductor discrete device testing apparatus, comprising a base plate (1), characterized in that: the top surface of the bottom plate (1) is fixedly connected with a protective shell (2), and the top surface of the protective shell (2) is fixedly connected with a round box body (3); a circular plate (4) with a plurality of arc-shaped grooves (5) on the side wall is arranged in the inner cavity of the box body (3), and a diode (6) is arranged in each arc-shaped groove (5); a reciprocating mechanism (7) is arranged on the side wall of the box body (3), and a detection mechanism (8) is arranged on one side, close to the circular plate (4), of the reciprocating mechanism (7); the top surface of the circular plate (4) is fixedly connected with a plurality of magnetic blocks (10), the bottom surface of the circular plate (4) is fixedly connected with a vertical shaft (11), the bottom end of the vertical shaft (11) penetrates through the box body (3) and is fixedly connected with a ratchet wheel disc (12), and the side wall of the vertical shaft (11) is fixedly connected with a first grooved wheel (18); a motor (13) is mounted on the top surface of the bottom plate (1) close to the left side, a rotating shaft (14) is fixedly connected to an output shaft of the motor (13), a cam (15) is fixedly connected to the top end of the rotating shaft (14), a round rod (16) is eccentrically and fixedly connected to the top surface of the cam (15), and the round rod (16) is movably connected with the ratchet wheel disc (12); a second grooved pulley (17) is fixedly connected to the side wall of the rotating shaft (14), an air pump (19) is fixedly connected to the position, close to the right side, of the top surface of the bottom plate (1), two air pipes (20) are fixedly connected to the side wall of the air pump (19), two mounting blocks (24) are fixedly connected to the bottom surface of the inner cavity of the box body (3), and an air tap (25) is fixedly connected to the side wall of each mounting block (24); the other ends of the two air pipes (20) are respectively communicated with an air tap (25), and a feeding mechanism (26) is arranged above the box body (3) and close to the left side.
2. The semiconductor discrete device testing apparatus according to claim 1, characterized in that: the reciprocating mechanism (7) comprises a cylinder (71), the cylinder (71) is movably connected with the box body (3), a cylinder block (72) is arranged in the inner cavity of the cylinder (71), a V-shaped groove (73) is formed in the side wall of the cylinder block (72), the V-shaped groove (73) is annularly arranged, a cross rod (74) is fixedly connected to the inner wall of the cylinder (71), the cross rod (74) is movably connected with the V-shaped groove (73), a transmission shaft (75) is fixedly connected to the bottom surface of the cylinder block (72), the bottom end of the transmission shaft (75) penetrates through the cylinder (71) and is fixedly connected with a third grooved wheel (22), the first grooved wheel (18) is connected with the third grooved wheel (22) through a first belt, a baffle (76) is movably connected to the side wall of the transmission shaft (75) in the inner cavity of the cylinder (71), and a first spring (77) is arranged below the baffle (76), the first spring (77) is movably connected with the transmission shaft (75).
3. The semiconductor discrete device testing apparatus according to claim 2, characterized in that: detection mechanism (8) are including diaphragm (81), diaphragm (81) and drum (71) fixed connection, diaphragm (81) below is provided with two detection section of thick bamboo (82), detect the equal fixedly connected with slider (83) of a section of thick bamboo (82) top surface, diaphragm (81) bottom surface set up with slider (83) assorted spout (84), slider (83) and spout (84) swing joint, detect the equal swing joint of a section of thick bamboo (82) inner wall and have two pick-up plates (85), the equal fixedly connected with second spring (86) of pick-up plate (85) top surface, the second spring (86) other end all with detection section of thick bamboo (82) inner wall fixed connection, diode (6) pin is located detection section of thick bamboo (82), all be provided with adjustment mechanism (9) on slider (83) lateral wall.
4. A semiconductor discrete device testing apparatus according to claim 3, characterized in that: adjustment mechanism (9) are including inserted bar (91), a plurality of through-hole (92) have been seted up to diaphragm (81) left side wall, two inserted bar (91) are located wherein two through-holes (92), slider (83) left side wall all seted up with inserted bar (91) assorted jack (93), inserted bar (91) all insert in one of them jack (93).
5. The semiconductor discrete device testing apparatus according to claim 1, characterized in that: feed mechanism (26) includes inlet pipe (261), inlet pipe (261) left side is provided with two stock guides (262), inlet pipe (261) lateral wall seted up with stock guide (262) assorted logical groove, stock guide (262) run through logical groove, fixedly connected with loose axle (263) between stock guide (262), stock guide (262) all are fan-shaped setting, stock guide (262) are close to loose axle (263) one side lateral wall and are the arc arch setting, loose axle (263) bottom is run through stock guide (262) and fixedly connected with fourth sheave (28), be connected through the second belt between fourth sheave (28) and second sheave (17), inlet pipe (261) lateral wall fixedly connected with backup pad (264), loose axle (263) run through backup pad (264) and rather than swing joint.
6. The semiconductor discrete device testing apparatus according to claim 1, characterized in that: two discharge chutes are formed in the side wall of the box body (3) close to the rear side, and the side wall of the box body (3) is fixedly connected with a material receiving plate (29) at the discharge chutes.
7. The semiconductor discrete device testing apparatus according to claim 1, characterized in that: and a detection lamp (27) is arranged on the top surface of the circular plate (4).
8. Use of the semiconductor discrete device testing apparatus according to any one of claims 1 to 7, characterized by comprising the steps of:
s1: firstly, adjusting the distance between the detection cylinders (82) according to the distance between the pins of the diode (6), loosening the insertion rod (91), moving the detection cylinders (82) to a proper position, and then inserting the insertion rod (91) into the insertion hole (93) through a proper through hole (92);
s2: the motor (13) is started through an external power supply, an output shaft of the motor (13) drives the second grooved wheel (17) and the cam (15) to rotate simultaneously through the rotating shaft (14), the second grooved wheel (17) drives the fourth grooved wheel (28) to rotate through the second belt, the fourth grooved wheel (28) drives the material guide plate (262) to rotate through the movable shaft (263), and the diodes (6) are intermittently fed by utilizing the staggered arrangement of the fan-shaped surfaces of the material guide plate (262);
s3: the diode (6) falls into the arc-shaped groove (5), the magnetic block (10) can keep the pin directions of the diode (6) consistent, meanwhile, the cam (15) dials the ratchet wheel disc (12) to rotate to a certain angle through the round rod (16), the ratchet wheel disc (12) simultaneously drives the first grooved wheel (18) and the circular plate (4) to rotate through the vertical shaft (11), and the circular plate (4) conveys the diode (6);
s4: when the vertical shaft (11) drives the diode (6) to feed, the first grooved wheel (18) drives the third grooved wheel (22) to rotate through a first belt, the third grooved wheel (22) drives the cylindrical block (72) to rotate through the transmission shaft (75), the cylindrical block (72) drives the V-shaped groove (73) to rotate, the cylinder (71) is driven to move upwards through the inclined surface of the V-shaped groove (73) by using the cross rod (74), the first spring (77) is stretched, when the diode (6) is conveyed to the position below the detection cylinder (82), the vertical shaft (11) stops rotating, and meanwhile, the cross rod (74) rebounds through the first spring (77) by using the vertical surface of the V-shaped groove (73), so that the cylinder (71) descends;
s5: the cylinder (71) drives the detection cylinder (82) to descend through the transverse plate (81), at the moment, pins of the diode (6) are located in the detection cylinder (82), meanwhile, the pins of the diode (6) push against the detection plate (85), the second spring (86) is compressed, and the diode (6) is subjected to power-on test;
s6: if the diode (6) is electrified normally, the detection lamp (27) is turned on, and if the diode (6) detects a fault, the detection lamp (27) is not turned on;
s7: the tested diode (6) is conveyed to a right discharge chute along with the circular plate (4), the air pump (19) is started at the same time, if the diode (6) is tested normally, the air pump (19) supplies air to the air nozzle (25) through the air pipe (20), and the diode (6) is blown out to the material receiving plate (29);
s8: if the diode (6) fails in the test, the failed diode (6) is conveyed to a rear side discharging groove along with the conveying of the circular plate (4), the diode is blown out through an air nozzle (25), the diode (6) is distinguished and discharged, and the steps are repeated until the test is finished.
CN202110788344.3A 2021-07-13 2021-07-13 Semiconductor discrete device testing arrangement Active CN113702791B (en)

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