CN113588110A - Correction method and device of temperature measuring equipment - Google Patents
Correction method and device of temperature measuring equipment Download PDFInfo
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- CN113588110A CN113588110A CN202110882327.6A CN202110882327A CN113588110A CN 113588110 A CN113588110 A CN 113588110A CN 202110882327 A CN202110882327 A CN 202110882327A CN 113588110 A CN113588110 A CN 113588110A
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- 238000012937 correction Methods 0.000 title claims abstract description 168
- 238000000034 method Methods 0.000 title claims abstract description 45
- 230000035945 sensitivity Effects 0.000 claims abstract description 191
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 35
- 238000013507 mapping Methods 0.000 claims description 48
- 238000004590 computer program Methods 0.000 claims description 8
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
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Abstract
The invention provides a correction method and a correction device of temperature measurement equipment, wherein the method comprises the following steps: acquiring a first voltage value of the thermopile at a first correction temperature and a second voltage value at a second correction temperature and acquiring a first resistance value of the thermistor at the first correction temperature and a second resistance value at the second correction temperature; determining a first sensitivity and a second sensitivity of the thermistor according to the first resistance value and the second resistance value respectively; determining a third sensitivity of the thermopile and a third resistance value of the thermistor at the ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity; and correcting the temperature measuring equipment according to the third sensitivity and the third resistance value. According to the invention, the temperature measuring equipment does not need to be placed on the temperature control equipment for standing, the correction time of the temperature measuring equipment is shortened, the error caused by the difference between the environment temperature set by the temperature control equipment and the actual environment temperature is eliminated, and the correction accuracy of the temperature measuring equipment is improved.
Description
Technical Field
The invention relates to a correction technology of temperature measurement equipment, in particular to a correction method and a correction device of temperature measurement equipment.
Background
Most of temperature measuring equipment such as forehead temperature guns, ear temperature guns and industrial temperature measuring guns on the market measure infrared energy emitted by a target object by using a non-contact sensor (thermopile) to measure, and the sensor consists of two interface components of a thermistor and the thermopile. The heat energy generates a tiny voltage difference through different metal materials in the thermopile, and the voltage difference can be converted and sampled by an analog-to-digital converter (ADC) in the single chip microcomputer and then the temperature of a target object is pushed back out.
The temperature measuring equipment needs to be corrected before leaving the factory. At present, temperature measurement equipment needs to be kept still for a period of time (for example, 30min) at the ambient temperature set in the temperature control equipment to complete thermal equilibrium, and then temperature correction can be carried out.
When the temperature measuring equipment is taken out of the temperature control equipment, calibration operation is carried out, and if the temperature difference between the room temperature of a production workshop and the temperature of the temperature control equipment is large, the temperature measuring equipment can be inaccurate in correction. Therefore, the temperature measuring equipment has the problems of long correction time and low correction accuracy.
Disclosure of Invention
The invention provides a correction method and a correction device for temperature measurement equipment, which are used for solving the problems of long correction time and low correction accuracy of the temperature measurement equipment.
In one aspect, the present invention provides a calibration method for a temperature measurement device, including:
acquiring a first voltage value of a thermopile of temperature measuring equipment at a first correction temperature and a second voltage value of the thermopile at a second correction temperature, and acquiring a first resistance value of a thermistor of the temperature measuring equipment at the first correction temperature and a second resistance value of the thermistor at the second correction temperature;
determining a first sensitivity of the thermistor according to the first resistance value and determining a second sensitivity of the thermistor according to the second resistance value;
determining a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;
and correcting the temperature measuring equipment according to the third sensitivity and the third resistance value.
In one embodiment, the step of obtaining a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and the step of obtaining a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature comprises:
controlling the temperature measuring equipment to measure a blackbody furnace outputting a first correction temperature to obtain a first voltage value of the thermopile at the first correction temperature and a first resistance value of the thermistor at the first correction temperature;
and controlling the temperature measuring equipment to measure the blackbody furnace outputting a second correction temperature to obtain a second voltage value of the thermopile under the second correction temperature and a second resistance value of the thermistor under the second correction temperature.
In one embodiment, the step of determining a first sensitivity of the thermistor based on the first resistance value and determining a second sensitivity of the thermistor based on the second resistance value comprises:
acquiring a first mapping table corresponding to the first correction temperature and a second mapping table corresponding to the second correction temperature, wherein the first mapping table comprises the resistance value and the sensitivity of the thermistor at the first correction temperature, and the second mapping table comprises the resistance value and the sensitivity of the thermistor at the second correction temperature;
determining the first sensitivity corresponding to the first resistance value in the first mapping table, and determining the second sensitivity corresponding to the second resistance value in the second mapping table.
In one embodiment, the step of determining a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature based on the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity comprises:
determining a first corresponding relation between the third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature;
determining a second corresponding relation between the third sensitivity and a third environment temperature according to the second voltage, the second correction temperature and a first preset formula, wherein the third environment temperature is determined according to the second correction temperature;
determining a third corresponding relation between the third resistance value and the second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula;
determining a fourth corresponding relation between the third resistance value and the third environment temperature according to the second resistance value, the second sensitivity and a second preset formula;
and determining the third resistance value and the third sensitivity according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship.
In an embodiment, the step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value includes:
acquiring a difference value between the currently determined third resistance value and the last determined third resistance value;
and when the difference value is smaller than a preset difference value, updating the sensitivity of the electric thermopile in the temperature measuring equipment to the currently determined third sensitivity, and updating the resistance value of the thermistor in the temperature measuring equipment to the currently determined third resistance value.
In an embodiment, after the step of obtaining the difference between the currently determined third resistance value and the last determined third resistance value, the method further includes:
when the difference is larger than or equal to a preset difference, determining a fourth resistance value of the thermistor according to a currently determined third sensitivity and a fifth corresponding relation, wherein the fifth corresponding relation is determined according to the first corresponding relation and the third corresponding relation;
determining a fourth sensitivity of the thermopile according to the fourth resistance value and a sixth correspondence, wherein the sixth correspondence is determined according to the second correspondence and the fourth correspondence;
and updating the fourth resistance value to a currently determined third resistance value, updating the fourth sensitivity to a currently determined third sensitivity, and returning to the step of acquiring the difference between the currently determined third resistance value and the last determined third resistance value.
In an embodiment, after the step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value, the method further includes:
acquiring a fifth voltage value of the electric thermopile and a fifth resistance value of the thermistor when the temperature measuring equipment measures the temperature of the target object;
determining a seventh corresponding relation between the target temperature of the target object and the current environment temperature according to the third sensitivity, the fifth voltage value and a first preset formula;
determining an eighth corresponding relation between the target temperature and the current environment temperature according to the third resistance value, the fifth resistance value and a second preset formula;
and determining the target temperature according to the seventh corresponding relation and the eighth corresponding relation.
In one embodiment, the first calibration temperature and the second calibration temperature are temperatures within a measurement temperature range of the temperature measurement device.
On the other hand, the invention also provides a correcting device of the temperature measuring equipment, which comprises:
the temperature measuring device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring a first voltage value of a thermopile of the temperature measuring device at a first correction temperature and a second voltage value of the thermopile of the temperature measuring device at a second correction temperature, and acquiring a first resistance value of a thermistor of the temperature measuring device at the first correction temperature and a second resistance value of the thermistor at the second correction temperature;
the determining module is used for determining the first sensitivity of the thermistor according to the first resistance value and determining the second sensitivity of the thermistor according to the second resistance value;
the determining module is further configured to determine a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;
and the correction module is used for correcting the temperature measuring equipment according to the third sensitivity and the third resistance value.
On the other hand, the invention also provides a correcting device of the temperature measuring equipment, which comprises: a memory and a processor;
the temperature measuring equipment measures the temperature of a target object through the electrothermal stack and the thermistor;
the memory stores computer-executable instructions;
the processor executes computer-executable instructions stored by the memory to cause the processor to perform the calibration method of the thermometric device as described above.
In another aspect, the present invention further provides a computer-readable storage medium, in which computer-executable instructions are stored, and the computer-executable instructions are executed by a processor to implement the calibration method of the thermometric apparatus as described above.
In another aspect, the present invention also provides a computer program product comprising a computer program, which when executed by a processor, implements the calibration method of the thermometric apparatus as described above.
The invention provides a correction method and a correction device of temperature measurement equipment, which are used for acquiring a first voltage value of a thermopile of the temperature measurement equipment at a first correction temperature and a second voltage value of the thermopile at a second temperature, acquiring a first resistance value of a thermistor of the temperature measurement equipment at the first correction temperature and a second resistance value at the second correction temperature, determining a first sensitivity of the thermistor based on the first resistance value, determining a second sensitivity of the thermistor based on the second resistance value, determining a third sensitivity of the thermopile and a third resistance value of the thermistor at an environmental temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity, and finally correcting the temperature measurement equipment based on the third sensitivity and the third resistance value. According to the invention, the voltage value of the thermopile at the correction temperature and the resistance value of the thermistor at the correction temperature in the temperature measurement equipment are measured, so that the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be calculated, namely the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be obtained without placing the temperature measurement equipment in the temperature control equipment for standing, the correction time of the temperature measurement equipment is shortened, the error caused by the difference between the ambient temperature set by the temperature control equipment and the actual ambient temperature is eliminated, and the correction accuracy of the temperature measurement equipment is improved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.
FIG. 1 is a system architecture diagram of a calibration method for implementing a thermometric device according to the present invention;
FIG. 2 is a schematic flow chart of a calibration method of a temperature measuring device according to a first embodiment of the present invention;
FIG. 3 is a schematic flow chart illustrating a calibration method of a temperature measuring device according to a second embodiment of the present invention;
FIG. 4 is a detailed flowchart of step S10 of the calibration method for a temperature measuring device according to the third embodiment of the present invention;
FIG. 5 is a detailed flowchart of step S20 of the calibration method for a temperature measuring device according to the fourth embodiment of the present invention;
FIG. 6 is a detailed flowchart of step S30 of the calibration method for a temperature measuring device according to the fifth embodiment of the present invention;
FIG. 7 is a functional block diagram of a calibration device of the thermometric apparatus of the present invention;
FIG. 8 is a schematic diagram of a hardware structure of the calibrating apparatus of the temperature measuring device of the present invention.
With the foregoing drawings in mind, certain embodiments of the disclosure have been shown and described in more detail below. These drawings and written description are not intended to limit the scope of the disclosed concepts in any way, but rather to illustrate the concepts of the disclosure to those skilled in the art by reference to specific embodiments.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.
The invention provides a correction method of temperature measuring equipment, which can be realized by a system architecture diagram shown in figure 1. As shown in fig. 1, after the blackbody furnace 100 stably outputs the first correction temperature, the temperature measuring device 200 measures the temperature of the blackbody furnace (the dotted line indicates that the temperature measuring device 200 measures the temperature of the blackbody furnace 100), and a first voltage value of the electric heating stack of the temperature measuring device 200 at the first correction temperature and a first resistance value of the thermistor of the temperature measuring device 200 at the first correction temperature are obtained; the blackbody furnace 100 outputs the second calibration temperature again stably, and the temperature measuring device 200 measures the temperature of the blackbody furnace, so that a second voltage value of the electrothermal stack at the second calibration temperature and a second resistance value of the thermistor at the second calibration temperature are obtained. The temperature measuring device 200 transmits the first resistance value, the second resistance value, the first voltage value, and the second voltage value to the calibration apparatus 300 of the temperature measuring device, or a calibration worker reads the first resistance value, the second resistance value, the first voltage value, and the second voltage value from the temperature measuring device 200 and inputs the first resistance value, the second resistance value, the first voltage value, and the second voltage value to the calibration apparatus 300 of the temperature measuring device. The calibration device 300 of the temperature measuring apparatus can calibrate the temperature measuring apparatus based on the first voltage value, the second voltage value, the first resistance value and the second resistance value. The temperature measuring device 200 may be a forehead thermometer or an ear thermometer that measures the temperature of a human body, and the temperature measuring device 200 may also be an industrial temperature measuring gun.
In the prior art, the calibration of the temperature measuring equipment needs to carry out the calibration of a thermistor and the calibration of a thermopile. For the correction of the thermistor, the temperature measuring equipment needs to be placed in the temperature control equipment with the set environmental temperature and stands still for about 30min, so that the temperature measuring equipment is corrected after thermal balance is completed. According to the requirements of the use environment of the temperature measuring equipment, the environment temperature can be 25 ℃ or three correction temperatures, wherein the three correction temperatures are 10 ℃, 25 ℃ and 40 ℃, namely the temperature measuring equipment needs to be kept still in the temperature control equipment for 30min or 90 min. When the temperature measuring device is taken out of the temperature control device for calibration operation, if the difference between the room temperature of the calibration environment and the environment temperature set by the temperature control device is large, the calibration accuracy will be affected. In addition, the calibration of the temperature measuring equipment needs to be completed quickly, that is, the shorter the time for the temperature measuring equipment to perform the calibration operation, the better, if the calibration operation of the calibration personnel is not thorough, the calibration time is increased, and therefore the calibration accuracy of the temperature measuring equipment is low.
In addition, when the temperature measuring device performs the Thermopile calibration, it is necessary to set calibration points through a blackbody furnace or a constant temperature water tank (the constant temperature water tank is a kind of temperature control device) to perform parameter calibration, and a large amount of memory is also necessary to perform recording, for example, it is necessary to perform parameter calibration on a negative temperature coefficient thermistor impedance and a temperature curve mapping table, and on a Thermopile (Thermopile) voltage and temperature curve mapping table. Therefore, the calibration device of the temperature measurement equipment needs to store a lengthy mapping table for calibration, and the calibration cost is increased.
The invention provides a correction method of temperature measurement equipment, and aims to solve the problems in the prior art, wherein the problems in the prior art comprise the problem that the time for which a thermistor needs to be kept still is too long, the problem that the time for the temperature measurement equipment to be taken out of the temperature control equipment is too short, and the consumed storage capacity of thermistor parameters and thermopile parameters is large.
The following describes the technical solutions of the present invention and how to solve the above technical problems with specific embodiments. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments. Embodiments of the present invention will be described below with reference to the accompanying drawings.
Referring to fig. 2, fig. 2 is a first embodiment of the calibration method of the thermometric apparatus of the present invention, the calibration method of the thermometric apparatus comprises the following steps:
in step S10, a first voltage value of the thermopile of the temperature measuring device at the first calibration temperature and a second voltage value at the second calibration temperature are obtained, and a first resistance value of the thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature are obtained.
In the present embodiment, the main implementation body is a correction device of the temperature measurement apparatus, and for convenience of description, the correction device of the temperature measurement apparatus is referred to as a device in the following. The temperature measuring equipment has a measuring temperature range, and when the temperature measuring equipment is used for correcting, a first correcting temperature and a second correcting temperature need to be determined in the measuring temperature range, namely the first correcting temperature and the second correcting temperature are temperatures in the measuring temperature range of the temperature measuring equipment. For example, if the temperature measuring device is a forehead temperature gun, the temperature measuring device is a device for measuring the temperature of the human body, and the temperature of the human body is 35 ℃ to 41 ℃, that is, the temperature measuring range of the temperature measuring device is 35 ℃ to 41 ℃. The first correction temperature may be set to 35 c and the second correction temperature to 41 c, and of course, the first correction temperature and the second correction temperature may be any temperature of 35 c to 41 c.
The temperature measuring equipment is provided with a Thermopile thermolile and a Thermistor, and when the temperature measuring equipment measures an object with a first correction temperature, a first voltage value of the Thermopile and a first resistance value of the Thermistor are recorded, wherein the first correction temperature is 35 ℃, for example, the first voltage value is recorded as Vther35The first resistance value is denoted as Ramb35. When the temperature measuring device measures an object with a second correcting temperature, a second voltage value of the thermopile and a second resistance value of the thermistor are recorded, for example, when the second correcting temperature is 41 ℃, the second voltage value is recorded as Vther41And the second resistance value is denoted as Ramb41。
The first resistance value, the second resistance value, the first voltage value and the second voltage value can be stored in the device in advance, and when correction is needed, the device extracts the first voltage value, the second voltage value, the first resistance value and the second resistance value.
In step S20, a first sensitivity of the thermistor is mappable and determined from the first resistance value and a second sensitivity of the thermistor is mappable and determined from the second resistance value.
The thermistor has a corresponding sensitivity at different temperatures, and the sensitivity of the thermistor is related to the resistance value of the thermistor at that temperature. The device can measure the resistance value of the thermistor at different temperatures, calculate the sensitivity of the thermistor at different temperatures through the measured resistance value, further construct the mapping relation among the temperature, the resistance value of the thermistor and the sensitivity of the thermistor based on the temperature, the resistance value and the sensitivity, and store the mapping relation.
After the device obtains the first resistance value and the second resistance value, the first sensitivity of the thermistor can be determined based on the first resistance value, the first correction temperature and the mapping relation, and then the second sensitivity of the thermistor can be determined based on the second resistance value, the second correction temperature and the mapping relation.
In step S30, a third sensitivity of the thermopile and a third resistance value of the thermistor at the first ambient temperature are determined based on the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity.
The device stores the mapping relation among the resistance value of the thermistor, the sensitivity of the thermopile, the resistance value of the thermistor under the correction temperature and the voltage value of the thermopile under the correction temperature. The device can determine a first relational expression between the resistance value of the thermistor and the sensitivity of the electric thermopile based on the first voltage value, the first resistance value, the first sensitivity and the mapping relation; the device can determine a second relational expression between the resistance value of the thermistor and the sensitivity of the thermopile based on the second voltage value, the second resistance value, the second sensitivity and the mapping relation, so that a third sensitivity of the thermopile and a third resistance value of the thermistor at the first ambient temperature can be obtained based on the first relational expression and the second relational expression. The first ambient temperature can be understood as the temperature at which the temperature measuring device is placed in the temperature control device in the prior art. For example, the first ambient temperature is 25 ℃.
The single chip microcomputer in the device is increased from the conventional 8-bit MCU to the 32-bit MCU, and the operating frequency is increased from the conventional 2MHz to 48MHz or 72MHz, so that the single chip microcomputer of the device can rapidly calculate and solve simultaneous equations (the simultaneous equations of the first relational expression and the second relational expression) to obtain the third sensitivity of the thermopile and the third resistance value of the thermistor at the first ambient temperature.
And step S40, correcting the temperature measuring equipment according to the third sensitivity and the third resistance value.
After the third sensitivity and the third resistance value are obtained, the sensitivity of the thermopile and the resistance value of the thermistor stored in the temperature measuring equipment can be replaced by the device, so that the correction of the temperature measuring equipment is completed.
In the embodiment, the temperature measuring equipment is corrected without adopting a negative temperature coefficient thermistor impedance and temperature curve mapping table and a thermopile voltage to temperature curve mapping table, so that a long mapping table does not need to be stored, the memory space is saved, and the cost of a correction system is reduced. Meanwhile, the temperature measuring equipment does not need to be placed in the temperature control equipment with the set environment temperature, the standing time of the temperature measuring equipment is eliminated, the correction time of the temperature measuring equipment is shortened, and the problem of correction errors caused by the fact that the temperature measuring equipment is placed in the actual temperature with large temperature difference after being taken out of the temperature control equipment is solved. In addition, when the temperature measuring equipment is corrected, the temperature measuring equipment does not need to be placed in the temperature control equipment with the set environment temperature, so that the correction time of the temperature measuring equipment does not meet the requirement, and the correction of the temperature measuring equipment does not meet the requirement on the operation proficiency of a corrector.
In the technical solution provided in this embodiment, a first voltage value of a thermopile of a temperature measurement device at a first correction temperature and a second voltage value of the thermopile at a second temperature are obtained, a first resistance value of a thermistor of the temperature measurement device at the first correction temperature and a second resistance value of the thermistor at the second correction temperature are obtained, a first sensitivity of the thermistor is determined based on the first resistance value, a second sensitivity of the thermistor is determined based on the second resistance value, a third sensitivity of the thermopile and a third resistance value of the thermistor at a first environmental temperature are determined according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity, and finally the temperature measurement device is corrected based on the third sensitivity of the thermopile and the third resistance value of the thermistor at the first environmental temperature. According to the invention, the voltage value of the thermopile at the correction temperature and the resistance value of the thermistor at the correction temperature in the temperature measurement equipment are measured, so that the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be calculated, namely the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be obtained without placing the temperature measurement equipment in the temperature control equipment for standing, the correction time of the temperature measurement equipment is shortened, the error caused by the difference between the ambient temperature set by the temperature control equipment and the actual ambient temperature is eliminated, and the correction accuracy of the temperature measurement equipment is improved.
Referring to fig. 3, fig. 3 is a second embodiment of the calibration method of the thermometric apparatus, and based on the first embodiment, the step S10 includes:
step S11, controlling the temperature measuring device to measure the blackbody furnace outputting the first calibration temperature, and obtaining a first voltage value of the thermopile at the first calibration temperature and a first resistance value of the thermistor at the first calibration temperature.
And step S12, controlling the temperature measuring equipment to measure the blackbody furnace outputting the second correction temperature to obtain a second voltage value of the thermopile at the second correction temperature and a second resistance value of the thermistor at the second correction temperature.
In the present embodiment, the blackbody furnace output correction temperature is employed. The temperature measuring device comprises a temperature measuring device, a temperature measuring device and a temperature control device, wherein the temperature measuring device comprises a temperature measuring device, a temperature control device and a temperature control device. The stable output of the first correction temperature by the black body furnace means that the difference between each temperature output by the black body furnace in the current time period and the first correction temperature is small, that is, each difference is smaller than a preset difference, and the preset difference is a small value, for example, 0.2 ℃.
And controlling the blackbody furnace to output a second correction temperature, namely adjusting the power of the blackbody furnace, so that the temperature output to the outside by the blackbody furnace is the second correction temperature. And when the second correction temperature is stably output by the black body furnace, the temperature measuring equipment can be controlled to measure the black body furnace, so that a second voltage value of the thermopile at the second correction temperature and a second resistance value of the thermistor at the second correction temperature can be detected. The stable output of the second correction temperature by the black body furnace means that the difference value between each temperature output by the black body furnace in the current time period and the second correction temperature is small, that is, each difference value is smaller than a preset difference value, and the preset difference value is a small value, for example, 0.2 ℃. Of course, whether the blackbody furnace stably outputs the correction temperature may be determined based on time, for example, the blackbody furnace may stably output the correction temperature by operating for 10min after the correction temperature is set and the power is set.
In addition, two black body furnaces can be adopted, one black body furnace outputs a first correction temperature, and the other black body furnace outputs a second correction temperature, so that the waiting time for stable correction temperature output can be saved.
In the technical scheme provided by this embodiment, the device measures the blackbody furnace outputting the first correction temperature and the second correction temperature by controlling the temperature measuring equipment, and accurately obtains the first voltage value, the second voltage value, the first resistor and the second resistor value.
Referring to fig. 4, fig. 4 is a third embodiment of the calibration method of the thermometric apparatus, and step S20 includes, based on the first or second embodiment:
step S21, a first mapping table corresponding to the first calibration temperature and a second mapping table corresponding to the second calibration temperature are obtained, where the first mapping table includes the resistance and the sensitivity of the thermistor at the first calibration temperature, and the second mapping table includes the resistance and the sensitivity of the thermistor at the second calibration temperature.
Step S22, a first sensitivity corresponding to the first resistance value is determined in the first mapping table, and a second sensitivity corresponding to the second resistance value is determined in the second mapping table.
In this embodiment, the apparatus stores a plurality of mapping tables, each mapping table corresponding to a resistance value and a sensitivity of the thermistor measured at the calibration temperature.
The device obtains a first mapping table based on the first correction temperature, wherein the first mapping table comprises the resistance value and the sensitivity of the thermistor at the first correction temperature; the device determines a second mapping table corresponding to the second correction temperature, wherein the second mapping table comprises the resistance value and the sensitivity of the thermistor at the second correction temperature.
The device can find a first resistance value corresponding to a first resistance value of the thermistor at a first correction temperature in the first mapping table, and can find a second sensitivity corresponding to a second resistance value of the thermistor at a second correction temperature in the second mapping table.
In the technical solution provided in this embodiment, the device stores a mapping table of resistance values and sensitivities of the thermistor at different temperatures, so that the first sensitivity of the thermistor is accurately determined in the mapping table based on the first correction temperature and the first resistance value, and the second sensitivity of the thermistor is accurately determined in the mapping table by the second correction temperature and the second resistance value.
Referring to fig. 5, fig. 5 is a fourth embodiment of the calibration method of the temperature measuring device according to the present invention, and based on any one of the first to third embodiments, step S30 includes:
step S31, determining a first corresponding relationship between the third sensitivity and a second ambient temperature according to the first voltage, the first calibration temperature and a first preset formula, wherein the second ambient temperature is determined according to the first calibration temperature.
In this embodiment, the sensitivity K of the thermopile may be provided by the manufacturer of the thermopile, but the K of each thermopile is different from the actual K, and the K provided by the manufacturer is different from the actual K, so the calibration of the temperature measurement device requires calibration of the sensitivity of the thermopile.
Based on Seebeck effect and Stefan-Boltzmann law, a good mathematical model of a Thermopile in temperature measurement equipment is characterized by a first preset formula, wherein the first preset formula is as follows:
Vther＝K×{(Tobj+273.15)4-(Tamb+273.15)4}-----(1)
wherein, VtherIs the output voltage of thermolile, TobjIs a target temperature, TambTo ambient temperature, K is the sensitivity of the thermopile.
The mathematical model of the Thermistor in the good temperature measuring equipment is represented by a second preset formula, and the second preset formula is as follows:
wherein R isambIs the resistance value, R, of the thermistor at ambient temperaturerefIs referred to the resistance value, T, of the thermistor at ambient temperatureambIs ambient temperature, TrefFor reference to ambient temperature, Beta is the sensitivity of the thermistor.
After the device obtains the first voltage, the second voltage, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity, the first voltage and the first correction temperature are substituted into a first preset formula, and the first correction temperature can be regarded as a target temperature in the first preset formula. Taking the first calibration temperature as 35 ℃ as an example, the first voltage and the first calibration temperature are substituted into a first preset formula to obtain a first corresponding relationship between the third sensitivity of the thermopile and the second ambient temperature, where the first corresponding relationship is:
Vther35＝K×{(35+273.15)4-(Tamb35+273.15)4}-----(3)
wherein, Vther35Is a first voltage, K is a third sensitivity of the thermopile, Tamb35For the second ambient temperature, the second ambient temperature is determined based on the first corrected temperature, e.g., Tamb35Subscript 35 in (1) is the first corrected temperature.
And step S32, determining a second corresponding relation between a third sensitivity of the thermopile and a third environment temperature according to the second voltage, the second correction temperature and the first preset formula, wherein the third environment temperature is determined according to the second correction temperature.
The device substitutes the second voltage and the second correction temperature into the first preset formula, and the second correction temperature can be regarded as the target temperature in the first preset formula. Taking the second calibration temperature as 41 ℃ as an example, substituting the second voltage and the second calibration temperature into the first preset formula to obtain a second corresponding relationship between the third sensitivity of the thermopile and the third environment temperature, wherein the second corresponding relationship is as follows:
Vther41＝K×{(41+273.15)4-(Tamb41+273.15)4}-----(4)
wherein, Vther41Is a first voltage, K is a third sensitivity of the thermopile, Tamb41For a third ambient temperature, the third ambient temperature being determined in dependence on a third corrected temperature, e.g. Tamb41The subscript 41 in (1) is the second correction temperature.
Step S33, determining a third corresponding relationship between a third resistance value and a second ambient temperature according to the first resistance value, the first sensitivity and a second predetermined formula.
The device substitutes the first resistance value and the first sensitivity into a second preset formula, and the first correction temperature can be regarded as a target temperature in the second preset formula. Taking the first calibration temperature as 35 ℃ as an example, the first resistance value and the first sensitivity are substituted into the second preset formula, so as to obtain a third corresponding relationship between a third resistance value of the thermistor and the second ambient temperature, wherein the third corresponding relationship is as follows:
wherein R isamb35Is a first resistance value, Rref25Is the third resistance value, T, of the thermistor at the first ambient temperatureamb35Is the second ambient temperature.
To facilitate the determination of the second ambient temperature Tamb35Equation 5 can be transposed into termsAnd obtaining a third corresponding relation:
step S34, determining a fourth corresponding relationship between the third resistance value and the third ambient temperature according to the second resistance value, the second sensitivity and a second preset formula.
The device substitutes the second resistance value and the second sensitivity into a second preset formula, and the second corrected temperature can be regarded as the target temperature in the second preset formula. Taking the second calibration temperature as 41 ℃ as an example, the second resistance and the second sensitivity are substituted into the second preset formula to obtain a fourth corresponding relationship between the third resistance and the second ambient temperature, wherein the fourth corresponding relationship is as follows:
wherein R isamb41Is a first resistance value, Rref25Is the third resistance value, T, of the thermistor at the first ambient temperatureamb41Is a third ambient temperature.
To facilitate the determination of the third ambient temperature Tamb41The equation 6 may be transformed by shifting terms to obtain a fourth corresponding relationship:
in step S35, the third resistance value and the third sensitivity are determined based on the first correspondence relationship, the second correspondence relationship, the third correspondence relationship, and the fourth correspondence relationship.
The first corresponding relationship is a corresponding relationship between the third sensitivity and the second ambient temperature, and the first corresponding relationship specifically refers to formula 3; the second corresponding relationship is a corresponding relationship between the third sensitivity and the third ambient temperature, and the second corresponding relationship specifically refers to formula 4; the third corresponding relationship is a corresponding relationship between the third resistance value and the second ambient temperature, and the third corresponding relationship specifically refers to formula 5 or formula 7; the fourth corresponding relationship is a corresponding relationship between the third resistance value and the third ambient temperature, and the fourth corresponding relationship specifically refers to formula 6 or formula 8; therefore, the four corresponding relations form a quaternary linear equation of the third resistance value, the third sensitivity, the second environment temperature and the third environment temperature, and the device can perform equation simultaneous based on the four corresponding relations, so as to calculate the third resistance value and the third sensitivity. For example, substituting equation 7 (third correspondence) into equation 3 (first correspondence) and substituting equation 8 (fourth correspondence) into equation 4 (second correspondence) may result in the equation set:
the third resistance R of the thermistor can be obtained by the equations 9 and 10ref25And a third sensitivity K of the thermopile.
In the technical scheme provided by this embodiment, the device obtains an equation set composed of four corresponding relations based on the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, the second sensitivity, the first correction temperature and the second correction temperature, and then accurately determines the third resistance value of the thermistor and the third sensitivity of the thermopile based on the equation set.
Referring to fig. 6 and 6, a fifth embodiment of the calibration method of the temperature measuring device of the present invention, based on the fourth embodiment, step S40 includes:
in step S41, a difference between the currently determined third resistance value and the last determined third resistance value is obtained.
And step S42, when the difference is smaller than the preset difference, updating the sensitivity of the thermopile in the temperature measuring equipment to the currently determined third sensitivity, and updating the resistance value of the thermistor in the temperature measuring equipment to the currently determined third resistance value.
In this embodiment, after obtaining the third resistance value and the third sensitivity, the device needs to compare the currently determined third resistance value with the last determined third resistance value to determine whether an error occurs in the calculation process, that is, the device performs multiple calculations of the third resistance and the third sensitivity in the temperature measurement device, and determines that the currently determined third resistance value and the currently determined third sensitivity are accurate only when a difference between two adjacent third resistance values is small.
In this regard, the device obtains a difference between the currently determined third resistance value and the last determined third resistance value, and determines whether the difference is less than a preset difference. The predetermined difference is a small difference, for example, the predetermined difference is 0.0005. And if the difference is smaller than the preset difference, updating the sensitivity of the electric heating pile of the temperature measuring equipment to the currently determined third sensitivity, and updating the resistance value of the thermistor to the currently determined third resistance value, thereby completing the correction of the temperature measuring equipment.
If the difference is larger than or equal to the preset difference, it can be determined that the calculation error occurs in the third resistance value and the third sensitivity measured last time or currently. The apparatus then substitutes the currently determined third sensitivity into the fifth correspondence to determine a fourth resistance value of the thermistor. The fifth corresponding relationship is determined according to the first corresponding relationship and the third corresponding relationship, and the fifth corresponding relationship is the above formula 9. The device then substitutes the currently determined fourth resistance value into the sixth correspondence to determine a fourth sensitivity of the thermopile. The sixth corresponding relationship is determined according to the second corresponding relationship and the fourth corresponding relationship, and the sixth corresponding relationship is the above formula 10.
The apparatus updates the fourth resistance value to the currently determined third resistance value and updates the fourth sensitivity to the third sensitivity, thereby returning to perform step S41, i.e., again determining whether the difference between the currently determined third resistance value and the last determined third resistance value is less than the preset difference. Therefore, a third resistance value with a smaller error and a third sensitivity can be obtained to finish the correction of the temperature measuring equipment.
In the technical scheme provided by this embodiment, the device obtains a difference between the currently determined third resistance value and the last determined third resistance value, and updates the sensitivity of the thermopile in the temperature measurement device to the currently determined third sensitivity and updates the resistance value of the thermistor to the third resistance value when the difference is smaller than a preset difference, thereby accurately completing the correction of the temperature measurement device.
In an embodiment, after step S40, the method further includes:
and acquiring a fifth voltage value of the electric heating pile and a fifth resistance value of the thermistor when the temperature measuring equipment measures the temperature of the target object.
And determining a seventh corresponding relation between the target temperature of the target object and the current environment temperature according to the third sensitivity, the fifth voltage value and the first preset formula.
And determining an eighth corresponding relation between the target temperature and the current environment temperature according to the third resistance value, the fifth resistance value and a second preset formula.
And determining the target temperature according to the seventh corresponding relation and the eighth corresponding relation.
In this embodiment, after the temperature measuring device completes the calibration, the temperature measuring device can perform normal temperature measurement. Specifically, the device obtains a fifth voltage value of the thermopile and a fifth resistance value of the thermistor when the temperature measuring device measures the target entrusted temperature, so that the third sensitivity and the fifth voltage value are substituted into the first preset formula to obtain a seventh corresponding relation between the target temperature of the target object and the current environment temperature. The device substitutes the third resistance value and the fifth resistance value into a second preset formula to obtain an eighth corresponding relation. The device can accurately obtain the target temperature T based on the seventh corresponding relation and the eighth corresponding relationobj。
The present invention also provides a calibration apparatus for a temperature measuring device, and referring to fig. 7, the calibration apparatus 700 for a temperature measuring device includes:
the acquiring module 701 is configured to acquire a first voltage value of a thermopile of the temperature measuring device at a first correction temperature and a second voltage value of the thermopile at a second correction temperature, and acquire a first resistance value of a thermistor of the temperature measuring device at the first correction temperature and a second resistance value of the thermistor at the second correction temperature;
a determining module 702, configured to determine a first sensitivity of the thermistor according to the first resistance value, and determine a second sensitivity of the thermistor according to the second resistance value;
a determining module 702, configured to determine a third sensitivity of the thermopile and a third resistance value of the thermistor at the first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;
and the correcting module 703 is configured to correct the temperature measuring device according to the third sensitivity and the third resistance value.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
the control module is used for controlling the temperature measuring equipment to measure the blackbody furnace outputting the first correction temperature to obtain a first voltage value of the thermopile at the first correction temperature and a first resistance value of the thermistor at the first correction temperature;
and the control module is used for controlling the temperature measuring equipment to measure the blackbody furnace outputting the second correction temperature to obtain a second voltage value of the thermopile at the second correction temperature and a second resistance value of the thermistor at the second correction temperature.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
the acquiring module 701 is configured to acquire a first mapping table corresponding to a first correction temperature and a second mapping table corresponding to a second correction temperature, where the first mapping table includes a resistance value and a sensitivity of the thermistor at the first correction temperature, and the second mapping table includes a resistance value and a sensitivity of the thermistor at the second correction temperature;
a determining module 702 is configured to determine a first sensitivity corresponding to the first resistance value in a first mapping table, and determine a second sensitivity corresponding to the second resistance value in a second mapping table.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
a determining module 702, configured to determine a first corresponding relationship between the third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature, and a first preset formula, where the second ambient temperature is determined according to the first correction temperature;
a determining module 702, configured to determine a second corresponding relationship between a third sensitivity and a third environmental temperature according to the second voltage, the second calibration temperature, and the first preset formula, where the third environmental temperature is determined according to the second calibration temperature;
a determining module 702, configured to determine a third corresponding relationship between a third resistance value and a second ambient temperature according to the first resistance value, the first sensitivity, and a second preset formula;
a determining module 702, configured to determine a fourth corresponding relationship between a third resistance value and a third ambient temperature according to the second resistance value, the second sensitivity, and a second preset formula;
a determining module 702, configured to determine a third resistance value and a third sensitivity according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship, and the fourth corresponding relationship.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
an obtaining module 701, configured to obtain a difference between a currently determined third resistance value and a last determined third resistance value;
and the updating module is used for updating the sensitivity of the thermopile in the temperature measuring equipment to the currently determined third sensitivity and updating the resistance value of the thermistor in the temperature measuring equipment to the currently determined third resistance value when the difference value is smaller than the preset difference value.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
a determining module 702, configured to determine a fourth resistance value of the thermistor according to a currently determined third sensitivity and a fifth corresponding relationship when the difference is greater than or equal to a preset difference, where the fifth corresponding relationship is determined according to the first corresponding relationship and the third corresponding relationship;
a determining module 702, configured to determine a fourth sensitivity of the thermopile according to a fourth resistance value and a sixth correspondence, where the sixth correspondence is determined according to a second correspondence and a fourth correspondence;
and the updating module is used for updating the fourth resistance value to the currently determined third resistance value, updating the fourth sensitivity to the currently determined third sensitivity, and returning to the step of acquiring the difference value between the currently determined third resistance value and the last determined third resistance value.
In one embodiment, the calibration device 700 of the thermometric apparatus comprises:
the obtaining module 701 is configured to obtain a fifth voltage value of the thermopile and a fifth resistance value of the thermistor when the temperature measuring device measures the temperature of the target object;
a determining module 702, configured to determine a seventh corresponding relationship between the target temperature of the target object and the current ambient temperature according to the third sensitivity, the fifth voltage value, and the first preset formula;
a determining module 702, configured to determine an eighth corresponding relationship between the target temperature and the current ambient temperature according to the third resistance value, the fifth resistance value, and a second preset formula;
a determining module 702, configured to determine the target temperature according to the seventh corresponding relationship and the eighth corresponding relationship.
FIG. 8 is a block diagram illustrating a calibration arrangement of a thermometric device according to an exemplary embodiment.
The correcting device of the temperature measuring equipment can comprise: a processor 81, such as a CPU, a memory 82, and a transceiver 83. Those skilled in the art will appreciate that the configuration shown in FIG. 8 does not constitute a limitation of the calibration means of the thermometric apparatus and may include more or fewer components than shown, or some components in combination, or a different arrangement of components. The memory 82 may be implemented by any type or combination of volatile or non-volatile memory devices such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks.
The processor 81 may invoke a computer program stored in the memory 82 to perform all or a portion of the steps of the calibration method of the thermometric device described above.
The transceiver 83 is used for receiving information transmitted from and transmitting information to an external device.
A non-transitory computer readable storage medium having instructions therein that, when executed by a processor of a calibration device of a thermometric apparatus, enable the calibration device of the thermometric apparatus to perform the above calibration method of the thermometric apparatus.
A computer program product comprising a computer program which, when executed by a processor of a calibration device of a thermometric apparatus, enables the calibration device of the thermometric apparatus to perform the calibration method of the thermometric apparatus described above.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (12)
1. A calibration method of a temperature measurement device is characterized by comprising the following steps:
acquiring a first voltage value of a thermopile of temperature measuring equipment at a first correction temperature and a second voltage value of the thermopile at a second correction temperature, and acquiring a first resistance value of a thermistor of the temperature measuring equipment at the first correction temperature and a second resistance value of the thermistor at the second correction temperature;
determining a first sensitivity of the thermistor according to the first resistance value and determining a second sensitivity of the thermistor according to the second resistance value;
determining a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;
and correcting the temperature measuring equipment according to the third sensitivity and the third resistance value.
2. The method for calibrating temperature measuring equipment according to claim 1, wherein the step of obtaining a first voltage value at a first calibration temperature and a second voltage value at a second calibration temperature of a thermopile of the temperature measuring equipment, and the step of obtaining a first resistance value at the first calibration temperature and a second resistance value at the second calibration temperature of a thermistor of the temperature measuring equipment comprises:
controlling the temperature measuring equipment to measure a blackbody furnace outputting a first correction temperature to obtain a first voltage value of the thermopile at the first correction temperature and a first resistance value of the thermistor at the first correction temperature;
and controlling the temperature measuring equipment to measure the blackbody furnace outputting a second correction temperature to obtain a second voltage value of the thermopile under the second correction temperature and a second resistance value of the thermistor under the second correction temperature.
3. The calibration method of a thermometric apparatus according to claim 1, wherein said step of determining a first sensitivity of said thermistor based on said first resistance value and a second sensitivity of said thermistor based on said second resistance value comprises:
acquiring a first mapping table corresponding to the first correction temperature and a second mapping table corresponding to the second correction temperature, wherein the first mapping table comprises the resistance value and the sensitivity of the thermistor at the first correction temperature, and the second mapping table comprises the resistance value and the sensitivity of the thermistor at the second correction temperature;
determining the first sensitivity corresponding to the first resistance value in the first mapping table, and determining the second sensitivity corresponding to the second resistance value in the second mapping table.
4. The method of calibrating a thermometric apparatus of claim 1, wherein said step of determining a third sensitivity of the thermopile and a third resistance of the thermistor at a first ambient temperature based on the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity comprises:
determining a first corresponding relation between the third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature;
determining a second corresponding relation between the third sensitivity and a third environment temperature according to the second voltage, the second correction temperature and a first preset formula, wherein the third environment temperature is determined according to the second correction temperature;
determining a third corresponding relation between the third resistance value and the second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula;
determining a fourth corresponding relation between the third resistance value and the third environment temperature according to the second resistance value, the second sensitivity and a second preset formula;
and determining the third resistance value and the third sensitivity according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship.
5. The calibration method of the thermometric apparatus of claim 4, wherein said step of calibrating the thermometric apparatus based on the third sensitivity and the third resistance value comprises:
acquiring a difference value between the currently determined third resistance value and the last determined third resistance value;
and when the difference value is smaller than a preset difference value, updating the sensitivity of the electric thermopile in the temperature measuring equipment to the currently determined third sensitivity, and updating the resistance value of the thermistor in the temperature measuring equipment to the currently determined third resistance value.
6. The calibration method of temperature measuring equipment according to claim 5, wherein said step of obtaining the difference between the currently determined third resistance value and the last determined third resistance value further comprises:
when the difference is larger than or equal to a preset difference, determining a fourth resistance value of the thermistor according to a currently determined third sensitivity and a fifth corresponding relation, wherein the fifth corresponding relation is determined according to the first corresponding relation and the third corresponding relation;
determining a fourth sensitivity of the thermopile according to the fourth resistance value and a sixth correspondence, wherein the sixth correspondence is determined according to the second correspondence and the fourth correspondence;
and updating the fourth resistance value to a currently determined third resistance value, updating the fourth sensitivity to a currently determined third sensitivity, and returning to the step of acquiring the difference between the currently determined third resistance value and the last determined third resistance value.
7. The method for calibrating temperature measuring equipment according to any one of claims 1 to 6, wherein said step of calibrating said temperature measuring equipment based on said third sensitivity and said third resistance value further comprises:
acquiring a fifth voltage value of the electric thermopile and a fifth resistance value of the thermistor when the temperature measuring equipment measures the temperature of the target object;
determining a seventh corresponding relation between the target temperature of the target object and the current environment temperature according to the third sensitivity, the fifth voltage value and a first preset formula;
determining an eighth corresponding relation between the target temperature and the current environment temperature according to the third resistance value, the fifth resistance value and a second preset formula;
and determining the target temperature according to the seventh corresponding relation and the eighth corresponding relation.
8. The method of calibrating temperature measuring equipment according to any one of claims 1 to 6, wherein the first calibration temperature and the second calibration temperature are temperatures within a measurement temperature range of the temperature measuring equipment.
9. A correcting device of temperature measuring equipment is characterized by comprising:
the temperature measuring device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring a first voltage value of a thermopile of the temperature measuring device at a first correction temperature and a second voltage value of the thermopile of the temperature measuring device at a second correction temperature, and acquiring a first resistance value of a thermistor of the temperature measuring device at the first correction temperature and a second resistance value of the thermistor at the second correction temperature;
the determining module is used for determining the first sensitivity of the thermistor according to the first resistance value and determining the second sensitivity of the thermistor according to the second resistance value;
the determining module is further configured to determine a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;
and the correction module is used for correcting the temperature measuring equipment according to the third sensitivity and the third resistance value.
10. A correcting device of temperature measuring equipment is characterized by comprising: a memory and a processor;
the temperature measuring equipment measures the temperature of a target object through the electrothermal stack and the thermistor;
the memory stores computer-executable instructions;
the processor executes computer-executable instructions stored in the memory to cause the processor to perform the method of calibrating a thermometric apparatus according to any of claims 1 to 8.
11. A computer-readable storage medium having computer-executable instructions stored thereon, which when executed by a processor, implement a calibration method for thermometry equipment according to any one of claims 1 to 8.
12. A computer program product comprising a computer program, characterized in that the computer program, when being executed by a processor, carries out the method of calibrating a thermometric apparatus according to one of claims 1 to 8.
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