CN113432554B - Offset detection method and device for lens photosensitive chip - Google Patents
Offset detection method and device for lens photosensitive chip Download PDFInfo
- Publication number
- CN113432554B CN113432554B CN202110637896.4A CN202110637896A CN113432554B CN 113432554 B CN113432554 B CN 113432554B CN 202110637896 A CN202110637896 A CN 202110637896A CN 113432554 B CN113432554 B CN 113432554B
- Authority
- CN
- China
- Prior art keywords
- pixel
- pixel point
- preset
- lens
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Studio Devices (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
The embodiment of the invention provides a method and a device for detecting the offset of a lens photosensitive chip, wherein the method comprises the following steps: acquiring an image to be detected through a lens photosensitive chip, wherein the image to be detected comprises a central pixel point and at least two azimuth pixel points, and the central pixel point and the azimuth pixel points are acquired by imaging preset pixel points in an offset test chart in the lens photosensitive chip; acquiring a first pixel coordinate of a central pixel point and a second pixel coordinate of an azimuth pixel point, and respectively determining the relative angles of each azimuth pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate; determining an average angle of each relative angle; and acquiring the angle difference between the average angle and a preset average angle, and if the angle difference is greater than the preset angle difference, determining that the detection result of the lens photosensitive chip is unqualified. Compared with the prior art, the offset angle of the photosensitive chip is measured by a quadratic element measuring instrument; the invention can automatically measure the offset angle of the photosensitive chip, eliminate the manual measurement error and improve the measurement accuracy.
Description
Technical Field
The application relates to the technical field of computers, in particular to a method and a device for detecting offset of a lens photosensitive chip.
Background
With the rapid development of global information-oriented construction and the explosion of information consumption, the demand of people on mobile phones is more and more vigorous; for example, smart phones are currently available for calling, messaging, shopping, working, taking pictures, and the like. The camera is arranged in the mobile phone to realize the photographing function, and people have higher and higher photographing quality requirements on the smart phone, so that the mobile phone manufacturer pays more and more attention to the imaging quality of the mobile phone camera and the precision of the mobile phone camera module is more and more strictly controlled.
The photosensitive chip is an important component of the camera module, is made of a high-sensitivity semiconductor material, can convert light rays into electric charges, converts the electric charges into digital signals through an analog-digital converter chip, stores the digital signals after being compressed by a flash memory or a built-in hard disk card in a mobile phone, can easily transmit the data to a computer, and modifies images according to needs and imagination by means of processing means of the computer. The chip laminating machine uses special glue to attach the photosensitive chip on the circuit board, so that the photosensitive chip can output charges converted from light. However, due to the precision of the chip laminating machine, or the chip laminating machine is collided to cause the instability of the machine table and the like, the laminating of the photosensitive chip deviates from the corresponding position, and further the image acquired by the photosensitive chip deviates. In order to manage and control the offset, the offset of the photosensitive chip is measured by a quadratic element measuring instrument in the prior art, but the quadratic element measuring instrument needs to manually measure the offset angle, so that the workload is large, and the time consumption is long; generally, a mode of inspecting the first piece of each shift is adopted for testing, and the mode cannot ensure the management and control consistency of mass production delivery.
Therefore, there is a need for a method and an apparatus for detecting the offset of a lens sensor chip, which can automatically test the offset angle of the lens sensor chip.
Disclosure of Invention
The embodiment of the invention provides a method and a device for detecting the offset of a lens photosensitive chip, which can realize the automatic test of the offset angle of the photosensitive chip.
In a first aspect, an embodiment of the present invention provides a method for detecting a shift of a lens photosensitive chip, where the method includes:
acquiring an image to be detected through a lens photosensitive chip, wherein the image to be detected comprises a central pixel point and at least two orientation pixel points, and the central pixel point and the orientation pixel points are acquired by imaging preset pixel points in an offset test chart in the lens photosensitive chip;
acquiring a first pixel coordinate of the central pixel point and a second pixel coordinate of the azimuth pixel point, and respectively determining the relative angle between each azimuth pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate;
determining an average angle of each relative angle; and obtaining the angle difference between the average angle and a preset average angle, wherein if the angle difference is greater than the preset angle difference, the detection result of the lens photosensitive chip is unqualified.
In the method, preset pixel points are set in an offset test chart, so that a lens photosensitive chip obtains an image to be detected of the offset test chart, and the image to be detected comprises a central pixel point and at least two azimuth pixel points which correspond to the preset pixel points in the offset test chart; further calculating the relative angle of the first pixel coordinate of the central pixel point and the second pixel coordinate of the azimuth pixel point; then determining the average angle of each relative angle; and finally, acquiring the angle difference between the average angle and the preset average angle, and judging the deviation of the lens photosensitive chip according to the angle difference and the preset angle difference. Compared with the prior art, the offset angle of the photosensitive chip is measured by the quadratic element measuring instrument; the invention can automatically measure the offset angle of the photosensitive chip, eliminate the manual measurement error and improve the measurement accuracy of the offset angle.
Optionally, the offset test chart comprises a preset center pixel point and four preset orientation pixel points, and the four preset orientation pixel points are respectively located in the northwest direction, the southwest direction, the northeast direction and the southeast direction on a diagonal line of the offset test chart; the distances between the four preset azimuth pixel points and the preset center pixel point are equal; the central pixel point and the orientation pixel point are obtained by imaging the preset pixel point in the lens photosensitive chip in the offset test chart, and the method comprises the following steps:
the image to be detected comprises a central pixel point and four azimuth pixel points;
the central pixel points and the four azimuth pixel points are obtained by imaging the preset central pixel points and the four preset azimuth pixel points of the offset test chart in the lens photosensitive chip.
In the method, the offset test chart comprises a preset center pixel point and four preset orientation pixel points, and the four preset orientation pixel points are respectively positioned in the northwest direction, the southwest direction, the northeast direction and the southeast direction of a diagonal line of the offset test chart. Due to the irregularity of the lens in distortion in all directions, the preset direction pixel points in four directions are arranged at equal intervals aiming at the preset central direction pixel point, and the direction pixel points in four directions of the image to be detected can be correspondingly obtained. And then can acquire the degree of lens distortion that all directions caused by the skew of sensitization chip, can further improve the measurement accuracy of skew angle.
Optionally, the preset average angle is an average value of relative angles between the four preset orientation pixels in the offset test chart and the preset central pixel.
In the method, the preset average angle is determined according to the average value of the relative angles of the four preset azimuth pixel points of the offset test chart and the preset central pixel point. Therefore, the preset average angle is the average angle when distortion does not occur, the difference is made between the preset average angle and the average angle of the distorted graphic card to be detected, the angle difference representing the distortion degree can be obtained, whether the image distortion of the lens photosensitive chip is within the allowable range or not is determined, and the detection result is correspondingly given.
Optionally, determining the relative angle between each position pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate respectively includes:
wherein (X) i ，Y i ) The second pixel coordinate of the orientation pixel point; (X) 0 ，Y 0 ) The first pixel coordinate of the center pixel point; theta.theta. i The relative angle between the azimuth pixel point and the center pixel point is obtained;
determining an average angle for each relative angle, comprising:
wherein, theta' 0 Is the average angle; n is the number of the orientation pixel points;
obtaining an angle difference between the average angle and a preset average angle, including:
Δθ＝|θ’ 0 -θ 0 |
wherein Δ θ is the angular difference; theta 0 And the preset average angle is obtained.
In the method, the relative angle between each azimuth pixel point and the central pixel point of the image to be detected is obtained through a theta i formula. Therefore, each azimuth pixel point of the image to be detected acquired through the photosensitive chip correspondingly offsets the relative angle of the distorted preset azimuth pixel point of the test chart. And then according to the difference value between the average angle of the relative angles of the pixel points in each direction and the undistorted preset average angle of the offset test chart, acquiring the angle difference which can represent whether the angle difference accords with the control standard, and further judging whether the offset angle of the photosensitive chip accords with the control standard. Therefore, the accuracy of the judgment result is improved.
Optionally, before obtaining the first pixel coordinate of the center pixel point and the second pixel coordinate of the orientation pixel point, the method further includes:
and acquiring the center pixel point and the azimuth pixel point in the image to be detected by a frequency domain filtering method, wherein the pixel value of the center pixel point and the pixel value of the azimuth pixel point are respectively the maximum pixel value or the minimum pixel value in the pixel values of all pixel points in the region where the center pixel point and the azimuth pixel point are located.
In the method, the center pixel point and the azimuth pixel point in the image to be detected are obtained through a frequency domain filtering method. Therefore, the accuracy of obtaining the relative angle can be improved, and the accuracy of the detection result is further improved.
Optionally, the test equipment includes four card stations, and the four card stations are respectively used for setting the offset test card, the dirty test card, the brightness test card and the chromaticity test card; the offset test graphic card is used for detecting the offset degree of the lens photosensitive chip, the dirt test graphic card is used for detecting the goodness of pixels in the lens photosensitive chip or dirt of the lens, the brightness test graphic card is used for detecting the brightness of pixels in the lens photosensitive chip, and the chromaticity test graphic card is used for detecting the chromaticity of pixels in the lens photosensitive chip.
In the method, four graphic card stations are arranged in the test equipment and are respectively used for arranging an offset test graphic card, a dirty test graphic card, a brightness test graphic card and a chroma test graphic card. Therefore, multiple items of automatic detection can be performed on the lens, and the lens detection efficiency is improved.
Optionally, the test equipment further comprises four lens clamps, the tail ends of the four lens clamps are connected, and the clamp arms of the four lens clamps are equal in length; the four graphic card stations in the test equipment respectively correspond to the four lens clamps.
In the method, the picture card station corresponds to the lens clamp, so that the lens can accurately shoot the test picture card.
In a second aspect, an embodiment of the present invention provides a device for detecting a shift of a photosensitive chip of a lens, including:
the receiving module is used for acquiring an image to be detected through the lens photosensitive chip, the image to be detected comprises a center pixel point and at least two orientation pixel points, and the center pixel point and the orientation pixel points are acquired by imaging preset pixel points in the offset test chart in the lens photosensitive chip;
the processing module is used for acquiring a first pixel coordinate of the central pixel point and a second pixel coordinate of the azimuth pixel point, and respectively determining the relative angle between each azimuth pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate;
the processing module is further configured to determine an average angle of each relative angle; and obtaining the angle difference between the average angle and a preset average angle, wherein if the angle difference is greater than the preset angle difference, the detection result of the lens photosensitive chip is unqualified.
In a third aspect, an embodiment of the present application further provides a computing device, including: a memory for storing a program; a processor for calling the program stored in said memory and executing the method as described in the various possible designs of the first aspect according to the obtained program.
In a fourth aspect, embodiments of the present application further provide a computer-readable non-transitory storage medium including a computer-readable program that, when read and executed by a computer, causes the computer to perform the method as set forth in the various possible designs of the first aspect.
These and other implementations of the present application will be more readily understood from the following description of the embodiments.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required to be used in the description of the embodiments will be briefly introduced below, and it is apparent that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings may be obtained according to the drawings without inventive labor.
Fig. 1 is a schematic diagram of a structure for detecting an offset of a lens sensor chip according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a structure for detecting the offset of a lens sensor chip according to an embodiment of the present invention;
fig. 3 is a schematic diagram of an image to be detected according to an embodiment of the present invention;
fig. 4 is a schematic diagram of an image to be detected according to an embodiment of the present invention;
fig. 5 is a schematic flow chart of a method for detecting an offset of a lens sensor chip according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of an offset test card according to an embodiment of the present invention;
fig. 7 is a schematic diagram of an image to be detected according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of an offset test card according to an embodiment of the present invention;
fig. 9 is a schematic diagram of an image to be detected according to an embodiment of the present invention;
fig. 10 is a schematic flowchart of a method for detecting a shift of a lens sensor chip according to an embodiment of the present invention;
fig. 11 is a schematic view of a device for detecting a shift of a lens sensor chip according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a system architecture for detecting the offset of a lens sensor chip according to an embodiment of the present invention; taking the example that the offset test chart 103 includes one preset center pixel point and two preset orientation pixel points; the lens 102 comprises a lens circuit board which comprises a lens photosensitive chip; the lens photosensitive chip in the lens 102 can shoot the offset test graphic card 103 to obtain an image to be detected of the offset test graphic card 103, and correspondingly, preset pixel points in the offset test graphic card 103 are correspondingly imaged in the image to be detected; that is, the offset test chart 103 includes a preset center pixel point and two preset orientation pixel points, and the image to be detected also includes the preset center pixel point and one center pixel point and two orientation pixel points obtained by imaging the preset center pixel point and the two preset orientation pixel points. The lens circuit board in the lens 102 transmits the acquired image to be detected to the computing device 101 through the corresponding circuit. The computing device 101 includes a preset algorithm and preset parameters, such as, preset parameters: presetting an average angle, a preset angle difference and the like, and detecting the image to be detected by the computing equipment 101 according to a preset algorithm, preset parameters and the image to be detected so as to obtain a detection result. Therefore, the offset of the lens photosensitive chip of each lens can be detected without manual participation in the process, so that the labor cost and the detection time cost are greatly reduced; and the accuracy of the detection result can be improved through a fixed preset algorithm and preset parameters.
Based on the system architecture for lens sensor chip offset detection in fig. 1, fig. 2 is a system architecture for lens sensor chip offset detection according to an embodiment of the present application, which includes: the computer device 201, the lens 202 and the offset test chart 203 comprising a preset center pixel point and four preset orientation pixel points. The four preset orientation pixel points are respectively positioned in the northwest direction, the southwest direction, the northeast direction and the southeast direction on the diagonal line of the offset test chart; and the distances between the four preset azimuth pixel points and the preset center pixel point are equal. Thus, under normal conditions, the distortion of the lens offset when the variables in the four directions (the direction angle and the distance between the preset direction pixel point and the preset center pixel point) are equal can be obtained, and compared with the offset test chart 103 including one preset center pixel point and two preset direction pixel points in fig. 1, the detection result obtained by using the offset test chart in fig. 2 as the basis is more accurate.
Based on the system architecture for detecting the offset of the lens photosensitive chip in fig. 1, fig. 3 is an image to be detected provided in the embodiment of the present application, where the image to be detected is obtained by imaging the offset test chart in fig. 1 on the lens photosensitive chip, and includes a central pixel point and two orientation pixel points. The dotted hollow points represent the positions of preset central pixel points and preset azimuth pixel points in the image to be detected in the offset test chart; black solid points represent central pixel points and azimuth pixel points in the image to be detected; the preset central pixel point and the central pixel point are coincided.
Based on the system architecture for detecting the offset of the lens photosensitive chip in fig. 2, fig. 4 is an image to be detected provided in the embodiment of the present application, where the image to be detected is obtained by imaging the offset test chart in fig. 2 on the lens photosensitive chip, and includes a central pixel point and four azimuth pixel points. The dotted hollow points represent the positions of preset central pixel points and preset azimuth pixel points in the image to be detected in the offset test chart; black solid points represent central pixel points and azimuth pixel points in the image to be detected; the preset central pixel point and the central pixel point are coincided.
Based on this, an embodiment of the present application provides a flow of a method for detecting a shift of a lens photosensitive chip, as shown in fig. 5, including:
501, acquiring an image to be detected through a lens photosensitive chip, wherein the image to be detected comprises a center pixel point and at least two azimuth pixel points, and the center pixel point and the azimuth pixel points are acquired by imaging preset pixel points in an offset test chart in the lens photosensitive chip;
In the method, preset pixel points are set in an offset test chart, so that a lens photosensitive chip obtains an image to be detected of the offset test chart, and the image to be detected comprises a center pixel point and at least two azimuth pixel points corresponding to the preset pixel points in the offset test chart; further calculating the relative angle of the first pixel coordinate of the central pixel point and the second pixel coordinate of the azimuth pixel point; then determining the average angle of each relative angle; and finally, acquiring the angle difference between the average angle and the preset average angle, and judging the deviation of the lens photosensitive chip according to the angle difference and the preset angle difference. Compared with the prior art, the offset angle of the photosensitive chip is measured by a quadratic element measuring instrument; the invention can automatically measure the offset angle of the photosensitive chip, eliminate the manual measurement error and improve the measurement accuracy of the offset angle.
The embodiment of the application provides an offset test chart and an image to be detected, wherein the offset test chart comprises a preset central pixel point and four preset azimuth pixel points, and the four preset azimuth pixel points are respectively located in the northwest azimuth, the southwest azimuth, the northeast azimuth and the southeast azimuth on a diagonal line of the offset test chart; the distances between the four preset azimuth pixel points and the preset center pixel point are equal; the central pixel point and the orientation pixel point are obtained by imaging the preset pixel point in the lens photosensitive chip in the offset test chart, and the method comprises the following steps: the image to be detected comprises a central pixel point and four azimuth pixel points; the central pixel points and the four azimuth pixel points are obtained by imaging the preset central pixel points and the four preset azimuth pixel points of the offset test chart in the lens photosensitive chip. Here, an offset test chart including four preset orientation pixel points and an image to be detected including four orientation pixel points are shown in fig. 2 and 4. The distance between the pixel points in the preset directions in the offset test chart and the pixel points in the preset center is equal to the distance between the pixel points in the preset directions in the northwest direction, the southwest direction, the northeast direction and the southeast direction. So, control position and distance variable equal, obtain to wait to detect can be according to the skew angle of the more accurate acquisition camera lens sensitization chip of the skew of four position pixel points after the image. It should be noted that the number of the preset orientation pixels included in the offset test chart provided in the embodiment of the present application may be not only two or four, but also any offset test chart with more than or equal to two preset orientation pixels, and the number of the preset orientation pixels in the offset test chart may be set as needed, which is not specifically limited herein.
The embodiment of the application provides a preset average angle, and the preset average angle is an average value of relative angles of four preset azimuth pixel points and a preset center pixel point respectively in an offset test chart. That is to say, the angle difference is the difference between the average value of the relative angles between the four preset orientation pixels in the offset test chart and the preset central pixel, and the average value of the relative angles between the four orientation pixels in the image to be detected and the central pixel. The average value of the relative angles of the images to be detected can eliminate the relative angle obtained according to one azimuth pixel point with overlarge distortion or overlarge distortion; the offset condition of the lens photosensitive chip is judged according to the relative angle, so that the problem that the offset result of the lens photosensitive chip is larger or smaller than the actual offset is caused.
The embodiment of the application provides an angle difference calculation method, which respectively determines the relative angles of each position pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate, and comprises the following steps:
wherein (X) i ，Y i ) The second pixel coordinate of the orientation pixel point; (X) 0 ，Y 0 ) The first pixel coordinate of the center pixel point; theta i The relative angle between the azimuth pixel point and the center pixel point is obtained;
determining an average angle for each relative angle, comprising:
wherein, theta' 0 Is the average angle; n is the number of the orientation pixel points;
obtaining an angle difference between the average angle and a preset average angle, including:
Δθ＝|θ’ 0 -θ 0 |
wherein Δ θ is the angular difference; theta 0 Is the preset average angle.
That is to say, when the lens photosensitive chip in the lens acquires the image to be detected imaged by the offset test chart, the circuit board in the lens sends the image to be detected to the computing equipment, and the computing equipment sends the image to be detected to the computing equipment according to the preset parameter theta corresponding to the preset central pixel point and the preset azimuth pixel point in the offset test chart 0 And presetting an angle difference, and determining whether the offset angle of the lens photosensitive chip is qualified or not by the image to be detected. When two preset azimuth pixel points exist, a preset parameter theta in the computing equipment is obtained 0 Then, as shown in FIG. 6, the offset test chart, T 1 The second pixel coordinate of the preset orientation pixel point is (X) 1 ，Y 1 )、T 2 The second pixel coordinate of the preset orientation pixel point is (X) 2 ，Y 2 )；T 0 The first pixel coordinate of the preset central pixel point is (X) 0 ，Y 0 )；T 1 And T 0 Relative angle of theta 1 、T 2 And T 0 Relative angle of theta 2 . Then
The predetermined angular difference may be determined empirically and by professionally related techniques, such as counting a large number of measured offset angles and θ 0 To determine a preset angle difference. The corresponding image to be tested, T, as shown in FIG. 7, corresponds to the offset test card of FIG. 6 1 ' the second pixel coordinate of the orientation pixel is (X) 1 ’，Y 1 ’)、T 2 ' the second pixel coordinate of the orientation pixel point is (X) 2 ’，Y 2 ’)；T 0 ' the first pixel coordinate of the center pixel point is (X) 0 ’，Y 0 ’)；T 1 ' and T 0 The relative angle of' being theta 1 ’、T 2 ' and T 0 The relative angle of' being theta 2 '. Then
Then delta theta = | theta' 0 -θ 0 L. And determining whether the bonding of the lens photosensitive chip is qualified or not or whether the lens is qualified or not according to the relation between the delta theta and the preset angle difference.
When the number of the preset azimuth pixel points is four, a preset parameter theta in the computing equipment is obtained 0 Then, as shown in FIG. 8, the offset test chart, T 1 The second pixel coordinate of the preset orientation pixel point is (X) 1 ，Y 1 )、T 2 The second pixel coordinate of the preset orientation pixel point is (X) 2 ，Y 2 )、T 3 The second pixel coordinate of the preset orientation pixel point is (X) 3 ，Y 3 )、T 4 The second pixel coordinate of the preset orientation pixel point is (X) 4 ，Y 4 )；T 0 Presetting central pixel pointHas a first pixel coordinate of (X) 0 ，Y 0 )；T 1 And T 0 Relative angle of theta 1 、T 2 And T 0 Relative angle of theta 2 、T 3 And T 0 Relative angle of theta 3 、T 4 And T 0 Is relative angle theta 4 . Then
The corresponding image to be tested, T, shown in FIG. 9, corresponding to the offset test card of FIG. 8 1 ' the second pixel coordinate of the orientation pixel point is (X) 1 ’，Y 1 ’)、T 2 ' the second pixel coordinate of the orientation pixel point is (X) 2 ’，Y 2 ’)、T 3 ' the second pixel coordinate of the orientation pixel point is (X) 3 ’，Y 3 ’)、T 4 ' the second pixel coordinate of the orientation pixel is (X) 4 ’，Y 4 ’)；T 0 ' the first pixel coordinate of the center pixel point is (X) 0 ’，Y 0 ’)；T 1 ' and T 0 The relative angle of' being theta 1 ’、T 2 ' and T 0 The relative angle of' being theta 2 ’、T 3 ' and T 0 The relative angle of' being theta 3 ’、T 4 ' and T 0 The relative angle of' being theta 4 '. Then the
Then delta theta = | theta' 0 -θ 0 L. And determining whether the bonding of the lens photosensitive chip is qualified or not or whether the lens is qualified or not according to the relation between the delta theta and the preset angle difference.
Here, based on the above-mentioned offset test chart in fig. 8 and the image to be detected in fig. 9, the present application provides an offset calculation scenario of the lens sensor chip, and a calculation example:
for example, if the specification of the lens Sensor in the camera module is GC02M1, two million pixels. The size of the image was 1600 × 1200pixel; the rotation angle of the lens photosensitive chip is required to be not more than 2 °, that is, the preset angle difference is 2 °.
The coordinates and relative angles of each pixel point in the offset test chart are as follows:
| coordinates of the object | Angle of rotation | ||
| T0 | (0,0) | / | |
| T1 | (-400,300) | θ1 | 143.13 |
| T2 | (400,300) | θ2 | 143.13 |
| T3 | (-400,-300) | θ3 | 143.13 |
| T4 | (400，-300) | θ4 | 143.13 |
TABLE 1
The coordinates and relative angles of corresponding pixel points in the image to be detected of the offset test graphic card are as follows:
| coordinates of the object | Angle of rotation | ||
| T0’ | (0,0) | / | |
| T1’ | (-378,321) | θ1’ | 139.67 |
| T2’ | (420,276) | θ2’ | 146.69 |
| T3’ | (-411,-277) | θ3’ | 146.03 |
| T4’ | (386，-322) | θ4’ | 140.17 |
TABLE 2
Then
Then Δ θ = |143.13-143.14|. If the preset angle difference is 2 degrees, the calculation result is 0.01 degrees<And 2 degrees, the offset angle of the lens photosensitive chip does not exceed the control, and the lens photosensitive chip is qualified in detection.
The embodiment of the application provides a method for determining a center pixel point and an orientation pixel point of an image to be detected, and before acquiring a first pixel coordinate of the center pixel point and a second pixel coordinate of the orientation pixel point, the method further includes: and acquiring the central pixel point and the azimuth pixel point in the image to be detected by a frequency domain filtering method, wherein the pixel value of the central pixel point and the pixel value of the azimuth pixel point are respectively the maximum pixel value or the minimum pixel value in the pixel values of the pixels in the area where the central pixel point and the azimuth pixel point are located. That is to say, the pixel values of the center pixel point and the azimuth pixel point of the image to be detected are obviously different from the pixel values of other pixel points in the area where the point is located. As for the image to be detected in fig. 9, the central pixel point and the azimuth pixel point of the image to be detected are all black points, and the areas outside the central pixel point and the azimuth pixel point are all white, so that the pixel values of the central pixel point and the azimuth pixel point are the largest in the areas where the central pixel point and the azimuth pixel point are located; if the center pixel point and the azimuth pixel point of the image to be detected are white points, and the areas outside the center pixel point and the azimuth pixel point are black, the pixel values of the center pixel point and the azimuth pixel point are the minimum in the areas where the center pixel point and the azimuth pixel point are located; the colors of the center pixel point and the azimuth pixel point and the colors of the areas of the center pixel point and the azimuth pixel point are not limited, and the center pixel point, the azimuth pixel point and other pixel points in the areas of the center pixel point and the azimuth pixel point can be distinguished.
The embodiment of the application provides a test device, which comprises four graphic card stations, wherein the four graphic card stations are respectively used for setting the offset test graphic card, the dirty test graphic card, the brightness test graphic card and the chroma test graphic card; the offset test graphic card is used for detecting the offset degree of the lens photosensitive chip, the dirty test graphic card is used for detecting the goodness of pixels in the lens photosensitive chip or the dirt of the lens, the brightness test graphic card is used for detecting the brightness of pixels in the lens photosensitive chip, and the chromaticity test graphic card is used for detecting the chromaticity of pixels in the lens photosensitive chip. That is to say, the test equipment may be provided with not only the offset test card, but also a stain test card, a brightness test card, and a chromaticity test card to detect stains on the lens photo-sensing chip or the lens, and to detect brightness and chromaticity of the lens photo-sensing chip, respectively. Therefore, automatic multiple detection can be realized for one lens photosensitive chip or lens. The test equipment can contain more than four graphic card stations, for example, a definition test graphic card can be contained to test definition of a lens photosensitive chip or a lens, and the like. Any number of graphic card stations can be arranged in the test equipment to place the corresponding type of graphic card, that is, the graphic card stations and the types of the graphic cards in the test equipment can be specifically arranged according to the needs, which is not limited herein.
The embodiment of the application provides a test device, which further comprises four lens clamps, wherein the tail ends of the four lens clamps are connected, and the clamp arms of the four lens clamps are equal in length; the four graphic card stations in the test equipment respectively correspond to the four lens clamps. That is to say, if the clamp arm is filled with the lenses, in the process of rotating the clamp arm for one circle, the lenses can be paused and shot for four times, so that each lens can shoot four corresponding test graphics cards, the lens photosensitive chip in each lens can shoot each type of test graphics cards, and multiple automatic tests can be completed. The test is carried out by rotating the clamp arm, and compared with the horizontal direction movement of the furniture arm, the volume of the test equipment can be reduced. In addition, if the number of the test graphic cards is more than or equal to four, the number of the graphic card stations in the test equipment is also more than or equal to four, and the clamp arms can also be correspondingly more than or equal to four.
Based on the above flow, an embodiment of the present application provides a flow of a method for detecting a shift of a lens photosensitive chip, as shown in fig. 10, including:
and step 1010, if the angle difference is larger than the preset angle difference, the lens photosensitive chip is unqualified.
In step 1011, if the angle difference is less than or equal to the preset angle difference, the lens photosensitive chip is qualified.
Based on the same concept, an embodiment of the present invention provides a device for detecting a shift of a photosensitive lens, and fig. 11 is a schematic view of the device for detecting a shift of a photosensitive lens according to the embodiment of the present invention, as shown in fig. 11, including:
the receiving module 1101 is used for acquiring an image to be detected through a lens photosensitive chip, wherein the image to be detected comprises a central pixel point and at least two azimuth pixel points, and the central pixel point and the azimuth pixel points are acquired by imaging preset pixel points in an offset test chart in the lens photosensitive chip;
the processing module 1102 is configured to obtain a first pixel coordinate of the center pixel and a second pixel coordinate of the orientation pixel, and determine, according to the first pixel coordinate and the second pixel coordinate, a relative angle between each orientation pixel and the center pixel;
the processing module 1102 is further configured to determine an average angle of each relative angle; and obtaining the angle difference between the average angle and a preset average angle, wherein if the angle difference is greater than the preset angle difference, the detection result of the lens photosensitive chip is unqualified.
Optionally, the offset test chart comprises a preset center pixel point and four preset orientation pixel points, and the four preset orientation pixel points are respectively located in the northwest direction, the southwest direction, the northeast direction and the southeast direction on a diagonal line of the offset test chart; the distances between the four preset azimuth pixel points and the preset center pixel point are equal; the center pixel point and the orientation pixel point are obtained by imaging the preset pixel point in the lens photosensitive chip in the offset test graphic card, and the method comprises the following steps: the image to be detected comprises a central pixel point and four azimuth pixel points; the central pixel points and the four azimuth pixel points are obtained by imaging the preset central pixel points and the four preset azimuth pixel points of the offset test chart in the lens photosensitive chip.
Optionally, the preset average angle is an average value of relative angles between the four preset orientation pixels in the offset test chart and the preset central pixel.
Optionally, determining the relative angle between each position pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate respectively includes:
wherein (X) i ，Y i ) The second pixel coordinate of the orientation pixel point; (X) 0 ，Y 0 ) The first pixel coordinate of the center pixel point; theta.theta. i The relative angle between the azimuth pixel point and the center pixel point is obtained;
determining an average angle for each relative angle, comprising:
wherein, theta' 0 Is the average angle; n is the number of the orientation pixel points;
obtaining an angle difference between the average angle and a preset average angle, including:
Δθ＝|θ’ 0 -θ 0 |
wherein Δ θ is the angular difference; theta 0 Is the preset average angle.
Optionally, the processing module 1102 is further configured to: and acquiring the central pixel point and the azimuth pixel point in the image to be detected by a frequency domain filtering method, wherein the pixel value of the central pixel point and the pixel value of the azimuth pixel point are respectively the maximum pixel value or the minimum pixel value in the pixel values of the pixels in the area where the central pixel point and the azimuth pixel point are located.
Optionally, the test equipment includes four card stations, and the four card stations are respectively used for setting the offset test card, the dirty test card, the brightness test card and the chromaticity test card; the offset test graphic card is used for detecting the offset degree of the lens photosensitive chip, the dirty test graphic card is used for detecting the goodness of pixels in the lens photosensitive chip or the dirt of the lens, the brightness test graphic card is used for detecting the brightness of pixels in the lens photosensitive chip, and the chromaticity test graphic card is used for detecting the chromaticity of pixels in the lens photosensitive chip.
Optionally, the test equipment further comprises four lens clamps, the tail ends of the four lens clamps are connected, and the clamp arms of the four lens clamps are equal in length; the four graphic card stations in the test equipment respectively correspond to the four lens clamps.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A method for detecting the offset of a lens photosensitive chip is characterized by comprising the following steps:
acquiring an image to be detected through a lens photosensitive chip, wherein the image to be detected comprises a central pixel point and at least two orientation pixel points, and the central pixel point and the orientation pixel points are acquired by imaging preset pixel points in an offset test chart in the lens photosensitive chip;
acquiring a first pixel coordinate of the central pixel point and a second pixel coordinate of the azimuth pixel point, and respectively determining the relative angle between each azimuth pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate;
determining an average angle of each relative angle; and obtaining the angle difference between the average angle and a preset average angle, wherein if the angle difference is greater than the preset angle difference, the detection result of the lens photosensitive chip is unqualified.
2. The method of claim 1, wherein the migration test chart includes a predetermined center pixel, four predetermined orientation pixels, and the four predetermined orientation pixels are respectively located at the northwest direction, the southwest direction, the northeast direction, and the southeast direction on the diagonal of the migration test chart; the distances between the four preset azimuth pixel points and the preset center pixel point are equal;
the central pixel point and the orientation pixel point are obtained by imaging the preset pixel point in the lens photosensitive chip in the offset test chart, and the method comprises the following steps:
the image to be detected comprises a central pixel point and four azimuth pixel points;
the central pixel points and the four azimuth pixel points are obtained by imaging the preset central pixel points and the four preset azimuth pixel points of the offset test chart in the lens photosensitive chip.
3. The method of claim 2, wherein the predetermined average angle is an average of relative angles of the four predetermined orientation pixels and the predetermined center pixel in the offset test chart.
4. The method of claim 1, wherein determining the relative angle of each location pixel point to the center pixel point from the first pixel coordinate and the second pixel coordinate, respectively, comprises:
wherein (X) i ，Y i ) The second pixel coordinate of the orientation pixel point; (X) 0 ，Y 0 ) The first pixel coordinate of the center pixel point; theta.theta. i The relative angle between the azimuth pixel point and the center pixel point is obtained;
determining an average angle for each relative angle, comprising:
wherein, theta' 0 Is the average angle; n is the number of the orientation pixel points;
obtaining an angle difference between the average angle and a preset average angle, including:
Δθ＝|θ’ 0 -θ 0 |
wherein Δ θ is the angular difference; theta.theta. 0 Is the preset average angle.
5. The method of claim 1, wherein prior to obtaining the first pixel coordinate of the center pixel and the second pixel coordinate of the orientation pixel, further comprising:
and acquiring the central pixel point and the azimuth pixel point in the image to be detected by a frequency domain filtering method, wherein the pixel value of the central pixel point and the pixel value of the azimuth pixel point are respectively the maximum pixel value or the minimum pixel value in the pixel values of the pixels in the area where the central pixel point and the azimuth pixel point are located.
6. The method of claim 1, wherein the test equipment comprises four card stations, wherein the four card stations are used for setting the offset test card, the dirty test card, the luminance test card and the chrominance test card respectively; the offset test graphic card is used for detecting the offset degree of the lens photosensitive chip, the dirty test graphic card is used for detecting the goodness of pixels in the lens photosensitive chip or the dirt of the lens, the brightness test graphic card is used for detecting the brightness of pixels in the lens photosensitive chip, and the chromaticity test graphic card is used for detecting the chromaticity of pixels in the lens photosensitive chip.
7. The method of claim 6, wherein the test apparatus further comprises four lens holders, the end portions of the four lens holders being connected, and the holder arms of the four lens holders being of equal length; the four graphic card stations in the test equipment respectively correspond to the four lens clamps.
8. An apparatus for detecting a shift of a photosensitive chip of a lens, the apparatus comprising:
the receiving module is used for acquiring an image to be detected through the lens photosensitive chip, the image to be detected comprises a center pixel point and at least two orientation pixel points, and the center pixel point and the orientation pixel points are acquired by imaging preset pixel points in the offset test chart in the lens photosensitive chip;
the processing module is used for acquiring a first pixel coordinate of the central pixel point and a second pixel coordinate of the azimuth pixel point, and respectively determining the relative angle between each azimuth pixel point and the central pixel point according to the first pixel coordinate and the second pixel coordinate;
the processing module is further configured to determine an average angle of each relative angle; and obtaining an angle difference between the average angle and a preset average angle, wherein if the angle difference is greater than the preset angle difference, the detection result of the lens photosensitive chip is unqualified.
9. A computer-readable storage medium, characterized in that it stores a program which, when run on a computer, causes the computer to carry out the method of any one of claims 1 to 7.
10. A computer device, comprising:
a memory for storing a computer program;
a processor for invoking a computer program stored in said memory for executing the method of any of claims 1 to 7 in accordance with the obtained program.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110637896.4A CN113432554B (en) | 2021-06-08 | 2021-06-08 | Offset detection method and device for lens photosensitive chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110637896.4A CN113432554B (en) | 2021-06-08 | 2021-06-08 | Offset detection method and device for lens photosensitive chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113432554A CN113432554A (en) | 2021-09-24 |
| CN113432554B true CN113432554B (en) | 2022-12-09 |
Family
ID=77755391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110637896.4A Active CN113432554B (en) | 2021-06-08 | 2021-06-08 | Offset detection method and device for lens photosensitive chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113432554B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116051556B (en) * | 2023-03-31 | 2023-07-25 | 至美时代生物智能科技(北京)有限公司 | Micro-fluidic chip reaction hole image recognition method and system based on relative coordinates |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112672278A (en) * | 2020-12-17 | 2021-04-16 | 南昌逸勤科技有限公司 | Positioning method and device of wearable equipment |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0599623A (en) * | 1991-10-03 | 1993-04-23 | Omron Corp | Displacement measuring apparatus |
| JP4264620B2 (en) * | 2002-02-01 | 2009-05-20 | ソニー株式会社 | Solid-state imaging device and mounting method for mounting solid-state imaging device on substrate |
| JP4214462B2 (en) * | 2003-02-28 | 2009-01-28 | ソニー株式会社 | Image processing apparatus and method, recording medium, and program |
| TWI407080B (en) * | 2010-04-30 | 2013-09-01 | Quanta Comp Inc | System and method for inspecting three-dimensional sensor |
| CN103018015B (en) * | 2012-12-26 | 2016-01-20 | 青岛歌尔声学科技有限公司 | The apparatus and method of the light shaft offset of camera lens in checkout equipment |
| CN103528803B (en) * | 2013-10-31 | 2016-05-11 | 广州视睿电子科技有限公司 | The whether qualified device and method of test camera module |
| CN104406541B (en) * | 2014-11-12 | 2017-02-15 | 浙江大学 | Precise assembling and adjusting device and method for detector chip of imaging system |
| CN205102802U (en) * | 2015-10-14 | 2016-03-23 | 重庆鹰谷光电有限公司 | TO photoelectric detector axiality detection device |
| JP6838417B2 (en) * | 2016-03-16 | 2021-03-03 | リコーイメージング株式会社 | Shooting device |
| CN106289062B (en) * | 2016-09-30 | 2019-07-16 | 哈尔滨工业大学 | A kind of bearing calibration of benchmark camera offset |
| CN107504896B (en) * | 2017-08-11 | 2019-07-16 | 哈尔滨工业大学 | A kind of location algorithm based on the matched spherical pin element of point |
| CN107505120B (en) * | 2017-09-18 | 2019-09-17 | 歌尔股份有限公司 | Camera module optical center location measurement method and measuring device |
| CN108426701B (en) * | 2017-12-27 | 2020-02-14 | 北京空间机电研究所 | Method and system for testing orientation elements in discontinuous star camera of CCD (Charge coupled device) |
| CN212871679U (en) * | 2020-08-31 | 2021-04-02 | 浙江水晶光电科技股份有限公司 | Chip debugging device |
-
2021
- 2021-06-08 CN CN202110637896.4A patent/CN113432554B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112672278A (en) * | 2020-12-17 | 2021-04-16 | 南昌逸勤科技有限公司 | Positioning method and device of wearable equipment |
Non-Patent Citations (1)
| Title |
|---|
| 集成电路粘片机视觉检测技术研究;郭强生等;《电子工业专用设备》;20050715(第07期);37-43 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113432554A (en) | 2021-09-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2020010945A1 (en) | Image processing method and apparatus, electronic device and computer-readable storage medium | |
| Wang et al. | A simple method of radial distortion correction with centre of distortion estimation | |
| US20110228052A1 (en) | Three-dimensional measurement apparatus and method | |
| CN109427046B (en) | Distortion correction method and device for three-dimensional measurement and computer readable storage medium | |
| CN107749981B (en) | Camera field angle measurement method and system | |
| CN103398696A (en) | Method for measuring distance of terminal camera and terminal | |
| WO2014106303A1 (en) | Panoramic lens calibration for panoramic image and/or video capture apparatus | |
| CN104683793A (en) | Detecting method for camera | |
| CN113432554B (en) | Offset detection method and device for lens photosensitive chip | |
| CN114993614A (en) | AR head-mounted equipment testing equipment and testing method thereof | |
| CN108055532A (en) | Automate the method and apparatus of matching test card | |
| CN111586401B (en) | Optical center testing method, device and equipment | |
| CN114140521A (en) | Method, device and system for identifying projection position and storage medium | |
| JP5599849B2 (en) | Lens inspection apparatus and method | |
| CN110044266B (en) | Photogrammetry system based on speckle projection | |
| US20130155257A1 (en) | Test device for testing camera module and method thereof | |
| CN113781392A (en) | Method for detecting adhesive path, electronic device and storage medium | |
| CN107527323B (en) | Calibration method and device for lens distortion | |
| CN116908185A (en) | Method and device for detecting appearance defects of article, electronic equipment and storage medium | |
| CN107734324B (en) | Method and system for measuring illumination uniformity of flash lamp and terminal equipment | |
| CN116380918A (en) | Defect detection method, device and equipment | |
| CN112770111B (en) | Device and method for identifying coincidence of optical axis of lens and center of image sensor | |
| CN113345024B (en) | Method for judging assembly quality of camera module | |
| CN109916341B (en) | Method and system for measuring horizontal inclination angle of product surface | |
| KR101301358B1 (en) | Concentricity measuring system for camera module and method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |