CN113419589B - Circuit parameter trimming method, trimming circuit, chip and electronic equipment - Google Patents
Circuit parameter trimming method, trimming circuit, chip and electronic equipment Download PDFInfo
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- CN113419589B CN113419589B CN202110788724.7A CN202110788724A CN113419589B CN 113419589 B CN113419589 B CN 113419589B CN 202110788724 A CN202110788724 A CN 202110788724A CN 113419589 B CN113419589 B CN 113419589B
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Abstract
The application discloses a circuit parameter trimming method, a trimming circuit, a chip and electronic equipment, which can reduce trimming errors, and the method comprises the steps of obtaining test parameters and corresponding target parameters when an element to be trimmed in the circuit to be trimmed is in each working state; determining a test range formed by each test parameter of the element to be modified and a target range formed by corresponding target parameters, and acquiring the test length of the test range and the target length of the target range; and acquiring test parameters with deviation from the target parameters and modifying, wherein the test length is modified to be equal to the target length, and the test parameters with deviation are modified to be equal to the target parameters based on the target length.
Description
Technical Field
The application relates to the technical field of integrated circuits, in particular to a circuit parameter trimming method, a trimming circuit and a chip.
Background
Due to the reasons of process manufacturing or structural asymmetry, actual parameters obtained by circuit testing may deviate from target parameters calculated theoretically, so the actual parameters of the circuit are usually modified.
When a parameter of a certain element of a circuit is modified by a conventional modification method, when a tested parameter deviates from a target parameter, as shown in fig. 1, the parameter of the element is quantitatively translated during modification until the modified parameter is close to or equal to the target parameter.
In general, there may be more than two parameters in some elements of the circuit, such as an operational amplifier, and there may be a plurality of different output parameters, and there may be deviations between these output parameters and the corresponding target parameters when the comparator is operated. However, the inventor has found that when the conventional trimming method is used for trimming, if all parameters are subjected to quantitative translation, only one trimmed parameter of the element may be close to or equal to the target parameter, but large errors may exist between other trimmed parameters of the element and the target parameter. As shown in fig. 2, both the test parameter 1 and the test parameter 2 of the element deviate from the target value, and after the quantitative translational trimming is performed by the conventional method, the trimmed parameter 1 approaches the target parameter, and the trimmed parameter 2 deviates from the target parameter by a relatively large amount.
Disclosure of Invention
Based on this, in order to solve or improve the problems in the prior art, the present application provides a trimming method for circuit parameters, a trimming circuit, a chip and an electronic device, which can reduce trimming errors.
In a first aspect, a method for trimming a circuit parameter is provided, which includes the following steps:
obtaining test parameters and corresponding target parameters when an element to be repaired in a circuit to be repaired is in each working state;
determining a test range formed by each test parameter of the element to be modified and a target range formed by corresponding target parameters, and acquiring the test length of the test range and the target length of the target range;
and acquiring test parameters with deviation from the target parameters and modifying, wherein the test length is modified to be equal to the target length, and the test parameters with deviation are modified to be equal to the target parameters based on the target length.
In one embodiment, when the test length is greater than the target length, the test length is shortened to be equal to the target length during trimming;
and when the test length is smaller than the target length, increasing the test length until the test length is equal to the target length during adjustment.
In one embodiment, when the length formed by the range where the test parameters of the element group with the deviation are located is smaller than the target length, the length is increased during trimming until the deviation from the target length is within a preset range.
In one embodiment, the step of respectively modifying the test parameters in each operating state to be equal to the target parameters based on the target length, and the length formed by the range where the test parameters in each operating state are located after modification is equal to the target length includes:
and classifying the target range into classification parameters of different gears according to the target length, and selecting the classification parameters of corresponding gears according to the target parameters corresponding to the test parameters to serve as the repaired test parameters.
In a second aspect, a trimming circuit is provided, which includes:
the test unit is used for testing test parameters of the circuit to be repaired in each working state;
the control unit is connected with the test unit and used for outputting a control signal to control the circuit to be modified to enter a working state, determining a test range formed by each test parameter of the element to be modified, a target range formed by the corresponding target parameter, a test length of the test range and a target length of the target range, and outputting a modification signal to the modification unit when detecting that the deviation of the test parameter and the corresponding target parameter is greater than a preset deviation;
and the trimming unit is connected with the control unit, is used for being connected with the circuit to be trimmed, and is used for trimming a test parameter with deviation from a target parameter in response to the trimming signal, trimming the test length to be equal to the target length, trimming the parameter with deviation to be equal to the target parameter based on the target length, and trimming the length formed by the range of the test parameter in each working state after trimming to be equal to the target length.
In one embodiment, the trimming unit is configured to shorten the test length to be equal to the target length during trimming when the test length is greater than the target length, and increase the test length to be equal to the target length during trimming when the test length is less than the target length.
In one embodiment, the trimming unit is further configured to grade the target range into grading parameters of different gears according to the target length, and select the grading parameter of the corresponding gear according to the target parameter corresponding to the test parameter, as the trimmed test parameter.
In one embodiment, the trimming units include a plurality of trimming units, one trimming unit includes a plurality of switch circuits and a plurality of trimming position execution circuits, and the switch circuits are respectively connected with the control unit and the trimming position execution circuits; the trimming signals are level signals, one switching circuit is connected with one trimming signal, each switching circuit is started in response to the trimming signal output by the control unit, and each trimming position execution circuit is used for trimming the test parameters which have deviation with the target parameters when the corresponding switching circuit is started.
In one embodiment, the test parameter is an output voltage of an element to be modified, the target length is a target voltage length, and the modifying and adjusting execution circuit comprises a first-step modifying circuit, a second-step modifying circuit and a gear selection circuit; the input end of the first-step trimming circuit is connected with a reference voltage, the output end of the first-step trimming circuit is connected with the input end of the second-step trimming circuit, and the control end of the first-step trimming circuit is connected with the control unit through a switch circuit; the output end of the second-step trimming circuit is connected with the input end of the gear selection circuit, and the control end of the second-step trimming circuit is connected with the control unit through the switch circuit; the control end of the gear selection circuit is connected with the control unit through the switch circuit, and the output end of the gear selection circuit is used for outputting grading voltage;
the first-step trimming circuit is used for responding to the control of the control unit when the switch circuit is started, and outputting divided voltage as target voltage length according to the target voltage length of the element to be trimmed and based on the reference voltage;
the second-step trimming circuit is used for responding to the control of the control unit to determine a target voltage range when the switch circuit is started, and the voltage length formed by the target voltage range is equal to the target voltage length;
the gear selection circuit is used for dividing a target voltage range into graded voltages of different gears according to a target length and outputting the corresponding graded voltage as the modified output voltage in response to the control of the control unit when the switch circuit is started.
The first-step trimming circuit comprises a first operational amplifier and a first voltage division selection circuit, a positive input end of the first operational amplifier is used for being connected with the reference voltage, the first voltage division selection circuit comprises a first end and a second end, the first end is connected with a negative input end of the first operational amplifier, the second end is connected with an output end of the first operational amplifier, the first voltage division selection circuit is used for responding to control of the control unit and selecting corresponding divided voltage output based on output voltage of the first operational amplifier when the switch circuit is started, and the divided voltage is used as a target voltage length.
In one embodiment, the second-step trimming circuit comprises a high-order voltage selection circuit, a low-order voltage selection circuit and an intermediate resistance circuit, the intermediate resistance circuit comprises a plurality of resistors which are sequentially connected in series, and the high-order voltage selection circuit and the low-order voltage selection circuit respectively comprise a first end, a second end and a control end; the first resistor of the middle resistor circuit along the signal transmission direction is connected with the second end of the high-order voltage selection circuit, the last resistor is connected with the first end of the low-order voltage selection circuit, the first end of the high-order voltage selection circuit is connected with the first end of the first voltage division selection circuit, and the second end of the low-order voltage selection circuit is grounded;
the high-order voltage selection circuit is used for responding to the maximum value of the control target output voltage range of the control unit when the switch circuit is started, and the low-order voltage selection circuit is used for responding to the minimum value of the control voltage range of the control unit when the switch circuit is started;
the gear selection circuit comprises a plurality of switches connected in parallel, a first end of each switch is connected with a corresponding resistor of the middle resistor circuit, a second end of each switch outputs corresponding grading voltage, a control end of each switch is connected with the control unit through the switch circuit, and the control unit is used for gating the corresponding switch to output the corresponding grading voltage as the output voltage after trimming according to the target voltage corresponding to the output voltage with deviation.
In a third aspect, a chip is further provided, where the chip includes a circuit to be modified and the modification circuit described in any of the above embodiments, and the modification circuit is configured to modify an element to be modified of the circuit to be modified.
In a fourth aspect, an electronic device is further provided, where the electronic device includes the chip described in any of the above embodiments.
In the above embodiment, the test length of the element to be modified is modified to be equal to the target length, and then the test parameters with deviations are modified to be equal to the target parameters based on the target length, so that the deviation between the length formed by the ranges of the test parameters in each working state after modification and the target length can be reduced, and the deviation between the test parameters and the target parameters can be reduced, so that the modification error can be reduced in the embodiment of the present application.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings used in the description of the embodiments will be briefly introduced below. It is to be understood that the drawings in the following description are illustrative only and are not restrictive of the invention.
Fig. 1 is a schematic diagram of trimming effect of a conventional trimming method;
fig. 2 is a schematic diagram illustrating another trimming effect of the conventional trimming method;
fig. 3 is a schematic flow chart of a circuit parameter trimming method according to an embodiment of the present application;
fig. 4 is a schematic diagram illustrating a trimming effect of the trimming method of the present application;
fig. 5 is a schematic view illustrating another trimming effect of the trimming method of the present application;
fig. 6 is a schematic structural diagram of a trimming circuit according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a trimming circuit according to another embodiment of the present application;
fig. 8 is a schematic structural diagram of a trimming execution circuit according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application are clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless explicitly specified otherwise. In the description of the present application, "a number" means at least one, such as one, two, etc., unless specifically limited otherwise.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items. The terms "coupled," "connected," "electrically connected," and "electrically connected," as used herein, include any direct and indirect electrical or structural connection. Thus, if a first device couples, connects, or electrically connects to a second device, that connection may be through a direct electrical connection, or through an indirect electrical connection via other devices and connections.
As described in the background art, the inventor has found that when some elements in a circuit have more than two parameters, when a conventional trimming method is used for trimming, only one of the trimmed parameters of the elements may be close to or equal to a target parameter, but a large error may exist between the other trimmed parameters of the elements and the target parameter.
The embodiment of the application provides a circuit parameter trimming method, a trimming circuit, a chip and an electronic device, which can reduce trimming errors.
Referring to fig. 3, which is a schematic flow chart of a circuit parameter trimming method according to an embodiment of the present application, as shown in fig. 3, the circuit parameter trimming method includes the following steps:
step 302: obtaining test parameters and corresponding target parameters when an element to be repaired in a circuit to be repaired is in each working state;
step 304: determining a test range formed by each test parameter of the element to be modified and a target range formed by corresponding target parameters, and acquiring the test length of the test range and the target length of the target range;
step 306: and acquiring test parameters with deviation from the target parameters and modifying, wherein the test length is modified to be equal to the target length, the test parameters with deviation are modified to be equal to the target parameters respectively based on the target length, and the length formed by the range of the test parameters in each working state after modification is equal to the target length.
It should be noted that, the reference to being equal to the target length in the embodiments of the present application includes the case where there is a predetermined deviation from the target length; equal to the target parameter, including a predetermined deviation from the target parameter; the term "equal" mentioned in the subsequent embodiments also includes the case where a predetermined deviation exists.
It can be understood that each test parameter is mapped to a coordinate system, and the distance between the minimum test reference and the maximum test parameter is the length formed by the range of the test parameter; correspondingly, each target parameter is mapped to a coordinate system, and the distance between the minimum target parameter and the maximum target parameter is the target length.
According to the embodiment of the application, the test length of the element to be trimmed is trimmed to be equal to the target length, and then the test parameters with deviations are trimmed to be equal to the target parameters based on the target length, so that the deviation between the length and the target length formed by the range of the test parameters in each working state after trimming can be reduced, and the deviation between the test parameters and the target parameters can be reduced, and therefore, trimming errors can be reduced.
Taking an example that an element to be repaired includes two working states and two output parameters exist as an example, as shown in fig. 2, both a test value 1 and a test value 2 deviate from a target value, firstly, as shown in fig. 4, a first step of repairing is performed, namely, the length formed by the test value 1 and the test value 2 after the first step of repairing is consistent with the length formed by the target value 1 and the target value 2, at this time, although the lengths are consistent, the test value still deviates from the corresponding target value greatly, then, as shown in fig. 5, a second step of repairing is performed, and the test value 1 and the test value 2 are translated during the repairing, so that the test value after the second step of repairing is consistent with the corresponding target value. As can be seen from fig. 5, after the two trimming steps, the length formed by the test value 1 and the test value 2 is equal to the target length, and the values of the test value 1 and the test value 2 are also equal to the target value.
In some examples, the circuit to be trimmed may be a chip that has completed a package test. The component to be modified may be, but is not limited to, a D/a converter, a/D converter, clock or operational amplifier, etc. The test parameter may be an output signal of the D/a converter, an output signal of the a/D converter, a clock frequency of a clock, an output voltage of the operational amplifier, or the like, but is not limited thereto. In some examples, after the circuit to be modified enters the working state, the above various components in the circuit can all enter the working state.
It is understood that in the embodiment of the present application, the test parameter refers to an actual parameter of the circuit to be modified under test, for example, an output voltage of the circuit to be modified.
In some embodiments, when the test length is greater than the target length, the test length is shortened to equal the target length when trimming. In some embodiments, when the test length is less than the target length, the test length is increased up to equal the target length when trimmed.
In some embodiments, the step of adjusting the biased test parameter to be equal to the target parameter in step 306 includes: and acquiring the deviation between the test parameter with the deviation and the target parameter of the test parameter, and translating according to the deviation to realize position adjustment. For example, if the test parameter is 5V, the target parameter is 4V, and the deviation is 1V, the test parameter is translated downward by 1V, and the position adjustment can be realized.
Step 302 and step may be to obtain test parameters and target parameters in each operating state by testing when the circuit to be repaired leaves the factory, and step 304 is to obtain a test length and a target length. And then step 306, testing actual parameters of the circuit to be modified in actual application, and modifying if the actual parameters obtained by testing have deviation with the target parameters.
It should be understood that, although the steps in the flowchart of fig. 3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in fig. 3 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
The embodiment of the application further provides a trimming circuit.
Please refer to fig. 6, which is a schematic structural diagram of a trimming circuit according to an embodiment, the trimming circuit includes:
the test unit 610 is used for testing test parameters of the circuit to be repaired in each working state;
the control unit 620 is connected with the test unit 610, and is configured to output a control signal to control the circuit to be modified to enter a working state, determine a test range formed by each test parameter of the element to be modified, a target range formed by a corresponding target parameter, a test length of the test range, and a target length of the target range, and output a modification signal to the modification unit when it is detected that a deviation between the test parameter and the corresponding target parameter is greater than a preset deviation;
the trimming unit 630 is connected to the control unit 620, is used for being connected to a circuit to be trimmed, and is used for trimming a test parameter having a deviation from a target parameter in response to the trimming signal, trimming the test length to be equal to the target length, trimming the parameter having the deviation to be equal to the target parameter based on the target length, and trimming the length of a range where the test parameter is located in each operating state after trimming to be equal to the target length.
In the embodiment of the present application, for a component group having a deviation from a target parameter, the trimming unit 630 first performs length trimming on the component group parameter, so that a parameter range and a target range formed by each component of the component group are smaller than a preset deviation, and then the test parameters of each component in the component group are trimmed, so that a test parameter range and a size of each component of the component group are smaller than the preset deviation, and therefore, the embodiment of the present application can reduce a trimming error.
In some embodiments, the control unit 620 may be a master circuit with an arithmetic function. The test unit 620 is related to the type of the test parameter, for example, the test parameter is voltage, the test unit may be a voltage test circuit, the test parameter is current, the test unit may be a current test circuit, the test parameter is clock frequency, and the test parameter may be a clock frequency test circuit.
In one embodiment, as shown in fig. 7, the trimming unit 630 includes a plurality of trimming units, one trimming unit 630 includes a plurality of switch circuits 631 and a plurality of trimming bit execution circuits 632, and the switch circuits 631 are respectively connected to the control unit 620 and the trimming bit execution circuits 632; the trimming signal is a level signal, one switch circuit 631 accesses to one trimming signal, each switch circuit 631 is turned on in response to the trimming signal output by the control unit, and each trimming position execution circuit 632 is used for trimming a test parameter having a deviation from a target parameter when the corresponding switch circuit 631 is turned on.
The following describes a specific embodiment of the trimming bit execution circuit by taking a test parameter as an output voltage of the to-be-trimmed element and a length formed by taking a target length as a target voltage range as an example.
In some embodiments, referring to fig. 8, the trimming bit execution circuit 632 includes a first step trimming circuit 6321, a second step trimming circuit 6322, and a range selection circuit 6323; the input end of the first-step trimming circuit 6321 is connected to a reference voltage, the output end of the first-step trimming circuit 6321 is connected to the input end of the second-step trimming circuit 6322, and the control end of the first-step trimming circuit is connected to the control unit through the switch circuit 631; the output end of the second-step trimming circuit 6322 is connected to the input end of the gear selection circuit 6323, and the control end is connected to the control unit through the switch circuit 631; the control terminal of the gear selection circuit 6323 is connected to the control unit 620 through the switch circuit 631, and the output terminal is used for outputting the classification voltage.
The first-step trimming circuit 6321 is configured to output a divided voltage as a target voltage length based on the reference voltage according to the target voltage length of the element to be trimmed in response to the control of the control unit 620 when the switch circuit 631 is turned on. The second-step trimming circuit 6322 is configured to determine a target voltage range, which constitutes a voltage length equal to the target voltage length, in response to the control of the control unit 620 when the switch circuit 631 is turned on. The range selection circuit 6323 is configured to divide the target voltage range into stepped voltages of different ranges by a target length, and to output the corresponding stepped voltage as the modified output voltage in response to the control of the control unit 620 when the switch circuit 631 is turned on.
For the first step trimming circuit 6321:
specifically, referring to fig. 8, the first-step trimming circuit 6321 includes a first operational amplifier U1 and a first voltage-dividing selection circuit (not shown in fig. 8), a positive input terminal of the first operational amplifier U1 is used for accessing the reference voltage Vbias, the first voltage-dividing selection circuit includes a first terminal and a second terminal, the first terminal is connected to a negative input terminal of the first operational amplifier U1, the second terminal is connected to an output terminal of the first operational amplifier U1, and the first voltage-dividing selection circuit is configured to respond to the control of the control unit 620 and select a corresponding divided voltage output based on the output voltage of the first operational amplifier U1 when the switch circuit 631 is turned on, where the divided voltage is used as the target voltage length.
More specifically, as shown in fig. 8, the first voltage division selection circuit includes a first switch circuit and a first resistor circuit, the first switch circuit includes a plurality of switches connected in parallel, the first resistor circuit includes a plurality of resistors connected in series in sequence, a first resistor along the signal transmission direction is connected to the output terminal of the first operational amplifier, a last resistor is grounded, a second end of each switch of the first switch circuit is connected to an adjacent resistor connected into the first resistor circuit, and a first end of each switch is used as a first end of the voltage division selection circuit and connected to the negative input terminal of the first operational amplifier U1.
For example, as shown in fig. 8, the first switch circuit includes a plurality of switches K1 to K4 connected in parallel, the first resistor circuit includes resistors R1 to R5 along the signal transmission direction, first ends of the switches K1 to K4 are all connected to the negative input end of the operational amplifier U1, a second end of the switch K1 is connected between the resistors R1 and R2, a second end of the switch K2 is connected between the resistors R2 and R3, a second end of the switch K3 is connected between the resistors R3 and R4, and a second end of the switch K4 is connected between the resistors R4 and R5. In specific implementation, by selecting which switches are turned on, the length formed by trimming the test voltage is equal to the target voltage length, and examples will be explained later.
For the second trimming circuit 6323:
specifically, the second-step trimming circuit 6323 includes a high-order voltage selection circuit, a low-order voltage selection circuit, and an intermediate resistance circuit (the three circuits are not labeled in fig. 8), where the intermediate resistance circuit includes a plurality of resistors connected in series in sequence, and each of the high-order voltage selection circuit and the low-order voltage selection circuit includes a first end, a second end, and a control end; the first resistor of the middle resistor circuit along the signal transmission direction is connected with the second end of the high-order voltage selection circuit, the last resistor is connected with the first end of the low-order voltage selection circuit, the first end of the high-order voltage selection circuit is connected with the first end of the first voltage division selection circuit, and the second end of the low-order voltage selection circuit is grounded. The high-order voltage selection circuit is used for responding to the maximum value of the control target output voltage range of the control unit when the switch circuit is started, and the low-order voltage selection circuit is used for responding to the minimum value of the control voltage range of the control unit when the switch circuit is started. For the gear selection circuit 6323, the gear selection circuit 6323 includes a plurality of switches connected in parallel, a first end of each switch is connected to a corresponding resistor of the intermediate resistor circuit, a second end of each switch outputs a corresponding stepped voltage, a control end of each switch is connected to the control unit 620 through the switch circuit 631, and the control unit 620 is configured to gate the corresponding switch to output the corresponding stepped voltage as the modified output voltage according to the target voltage corresponding to the output voltage having the deviation.
Exemplarily, as shown in fig. 8, the high-order voltage selection circuit includes two switches K5 and K6 connected in series in sequence and two resistors R6 and R7 connected in series in sequence, where a junction of the switches K5 and K6 is connected to a junction of the resistors R6 and R7; the low-order voltage selection circuit comprises two switches K11 and K12 which are sequentially connected in series and two resistors R12 and R13 which are sequentially connected in series, wherein the joint of the switches K11 and K12 is connected with the joint of the resistors R12 and R13. The range selection circuit 6323 includes switches K7, K8, K9, K10 connected in parallel.
In some examples, the trimming execution circuit further includes a second operational amplifier U2, a positive input terminal of the second operational amplifier U2 is connected to the first terminal of the high-voltage selection circuit and to the output terminal of the range selection circuit 6323 for amplifying the stepped voltage output by the range selection circuit 6323, and the voltage output by the output terminal of the second operational amplifier U2 is used as the trimmed output voltage. In other examples, the positive input terminal of the second operational amplifier U2 is further connected to the output terminal thereof, and two resistors R13 and R14 are further connected in series therebetween.
The operation of the trimming circuit shown in fig. 8 is briefly described by an example.
Assuming that the target voltage length of the element to be modified is known to be 6V, the target voltage range is 1-7V, when the circuit to be modified works, the output voltage of the element to be modified in a certain working state is 3V, the corresponding target voltage is 2V, and deviation exists, and modification is needed. In the first step of trimming, the reference voltage Vbias may be made to be 10V, the resistances of the resistors R1 to R5 are equal, the switches K3 and K4 are turned on, and K1 and K2 are turned off, so that the output voltage of the first operational amplifier U1 is 6V. Since the voltage required to be modified is equal to 2V, that is, 2V is output by the gear selection circuit 6323, and the low-order voltage of the second-step modification circuit is 1V and the high-order voltage is 7V, so that the target voltage range is maintained to be 1-7V, for example, the switch K10 may be turned on, the switches K7-K9 may be turned off, and one of the switches K5 and K6 may be turned on, and one of the switches K11 and K12 may be turned on.
Illustratively, the switch circuit 631 may be a transistor, such as a P-type transistor, with a gate terminal connected to the control unit 620 and a drain terminal connected to the trimming bit execution circuit 632. When the grid end is connected with a high level signal, the P-type transistor is conducted, and when the grid end is connected with a low level signal, the P-type transistor is cut off.
In some embodiments, the control unit 620 is configured to output a plurality of control signals, one control signal controlling an operation of one element of the circuit to be modified.
In some embodiments, the trimming unit 630 is configured to shorten the test length to be equal to the target length during trimming when the test length is greater than the target length, and to increase the test length to be equal to the target length during trimming when the test length is less than the target length. For example, as shown in fig. 8, the length of the test voltage of the device to be modified is 8V, and the length of the target voltage is 6V, so that the first operational amplifier U1 can output 6V. If the test voltage length of the device to be modified is 4V and the target voltage length is 6V, the first operational amplifier U1 can output 6V.
In some embodiments, the trimming unit 630 is further configured to classify the target range into classification parameters of different gears according to the target length, and select a classification parameter of a corresponding gear according to a target parameter corresponding to the test parameter, as the trimmed test parameter. For example, as shown in fig. 8, the target length is divided into 4 step parameters of different steps, and if other conditions are the same, different switches are turned on to output different voltages. In fig. 8, only four different gears are illustrated as examples, and in other embodiments, fewer or more gears may be provided, all falling within the scope of the present application.
For other specific limitations of the trimming circuit in the embodiment of the present application, refer to the foregoing circuit parameter trimming method, which is not described herein again in detail.
The embodiment of the present application further provides a chip, which includes a circuit to be repaired and the trimming circuit of any of the above embodiments, where the trimming circuit is used to trim an element to be repaired in the circuit to be repaired.
The embodiment of the application also provides an electronic device, which comprises the chip in the embodiment.
The electronic device may be implemented in various forms. For example, the electronic devices described in the present application may include mobile terminals such as a mobile phone, a tablet computer, a notebook computer, a palmtop computer, a Personal Digital Assistant (PDA), a Portable Media Player (PMP), a navigation device, a wearable device, a smart band, a pedometer, and the like, and fixed terminals such as a Digital TV, a desktop computer, and the like.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for trimming circuit parameters is characterized by comprising the following steps:
obtaining test parameters and corresponding target parameters when an element to be repaired in a circuit to be repaired is in each working state;
determining a test range formed by each test parameter of the element to be modified and a target range formed by corresponding target parameters, and acquiring the test length of the test range and the target length of the target range;
acquiring test parameters with deviation from target parameters and modifying, wherein the test length is modified to be equal to the target length, the test parameters with deviation are modified to be equal to the target parameters respectively based on the target length, and the length formed by the range of the test parameters in each working state after modification is equal to the target length; the target length is a target voltage length.
2. The method of trimming a circuit parameter of claim 1,
when the test length is larger than the target length, the test length is shortened until the test length is equal to the target length during trimming;
and when the test length is smaller than the target length, increasing the test length until the test length is equal to the target length during adjustment.
3. The method of claim 1, wherein said step of modifying the test parameters in each operating state to be equal to the target parameters based on the target length, and wherein the modified test parameters in each operating state have a range that is equal to the target length comprises:
and classifying the target range into classification parameters of different gears according to the target length, and selecting the classification parameters of the corresponding gears according to the target parameters corresponding to the test parameters to serve as the modified test parameters.
4. A trimming circuit, comprising:
the test unit is used for testing the test parameters of the circuit to be repaired in each working state;
the control unit is connected with the test unit, and is used for outputting a control signal to control the circuit to be trimmed to enter a working state, determining a test range formed by each test parameter of the element to be trimmed, a target range formed by corresponding target parameters, a test length of the test range and a target length of the target range, and outputting a trimming signal to the trimming unit when detecting that the deviation of the test parameter and the corresponding target parameter is greater than a preset deviation;
the trimming unit is connected with the control unit, is used for being connected with the circuit to be trimmed, and is used for trimming a test parameter with deviation from a target parameter in response to the trimming signal, trimming the test length to be equal to the target length, trimming the parameter with deviation to be equal to the target parameter based on the target length, and trimming the length formed by the range of the test parameter in each working state after trimming to be equal to the target length;
the trimming unit comprises a plurality of trimming units, one trimming unit comprises a plurality of switch circuits and a plurality of trimming position execution circuits, and the switch circuits are respectively connected with the control unit and the trimming position execution circuits; the trimming signals are level signals, one switching circuit is connected with one trimming signal, each switching circuit is started in response to the trimming signal output by the control unit, and each trimming position execution circuit is used for trimming the test parameters which have deviation with the target parameters when the corresponding switching circuit is started; the test parameter is the output voltage of the element to be modified.
5. The trimming circuit of claim 4, wherein the trimming unit is configured to shorten the test length to be equal to a target length during trimming when the test length is greater than the target length, and to increase the test length to be equal to the target length during trimming when the test length is less than the target length.
6. The trimming circuit according to claim 4, wherein the trimming unit is further configured to classify the target range into classification parameters of different gears according to the target length, and select the classification parameter of the corresponding gear according to the target parameter corresponding to the test parameter as the trimmed test parameter.
7. The trimming circuit according to claim 4, wherein the target length is a target voltage length, and the trimming position execution circuit comprises a first-step trimming circuit, a second-step trimming circuit and a gear selection circuit; the input end of the first-step trimming circuit is connected with a reference voltage, the output end of the first-step trimming circuit is connected with the input end of the second-step trimming circuit, and the control end of the first-step trimming circuit is connected with the control unit through a switch circuit; the output end of the second-step trimming circuit is connected with the input end of the gear selection circuit, and the control end of the second-step trimming circuit is connected with the control unit through the switch circuit; the control end of the gear selection circuit is connected with the control unit through the switch circuit, and the output end of the gear selection circuit is used for outputting grading voltage;
the first-step trimming circuit is used for responding to the control of the control unit when the switch circuit is started, and outputting divided voltage as target voltage length according to the target voltage length of the element to be trimmed and based on the reference voltage;
the second-step trimming circuit is used for responding to the control of the control unit to determine a target voltage range when the switch circuit is started, and the voltage length formed by the target voltage range is equal to the target voltage length;
the gear selection circuit is used for dividing a target voltage range into graded voltages of different gears according to a target length and outputting the corresponding graded voltage as the modified output voltage in response to the control of the control unit when the switching circuit is started;
the first-step trimming circuit comprises a first operational amplifier and a first voltage division selection circuit, wherein the positive input end of the first operational amplifier is used for accessing the reference voltage, the first voltage division selection circuit comprises a first end and a second end, the first end is connected with the negative input end of the first operational amplifier, the second end is connected with the output end of the first operational amplifier, the first voltage division selection circuit is used for responding to the control of the control unit and selecting corresponding voltage division output based on the output voltage of the first operational amplifier when the switch circuit is started, and the voltage division is used as the target voltage length;
the second-step trimming circuit comprises a high-order voltage selection circuit, a low-order voltage selection circuit and an intermediate resistance circuit, the intermediate resistance circuit comprises a plurality of resistors which are sequentially connected in series, and the high-order voltage selection circuit and the low-order voltage selection circuit respectively comprise a first end, a second end and a control end; the first resistor of the middle resistor circuit along the signal transmission direction is connected with the second end of the high-order voltage selection circuit, the last resistor is connected with the first end of the low-order voltage selection circuit, the first end of the high-order voltage selection circuit is connected with the first end of the first voltage division selection circuit, and the second end of the low-order voltage selection circuit is grounded.
8. The trimming circuit according to claim 7, wherein the high-order voltage selection circuit is configured to respond to a maximum value of a control target output voltage range of the control unit when the switching circuit is turned on, and the low-order voltage selection circuit is configured to respond to a minimum value of a control voltage range of the control unit when the switching circuit is turned on;
the gear selection circuit comprises a plurality of switches connected in parallel, a first end of each switch is connected with a corresponding resistor of the middle resistor circuit, a second end of each switch outputs corresponding grading voltage, a control end of each switch is connected with the control unit through the switch circuit, and the control unit is used for gating the corresponding switch to output the corresponding grading voltage as the output voltage after trimming according to the target voltage corresponding to the output voltage with deviation.
9. A chip comprising a circuit to be modified and the modification circuit according to any one of claims 4 to 8, the modification circuit being configured to modify a component to be modified of the circuit to be modified.
10. An electronic device comprising the chip of claim 9.
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| CN114676599B (en) * | 2022-05-26 | 2022-08-30 | 绍兴圆方半导体有限公司 | Chip parameter trimming method and device, electronic equipment and storage medium |
| CN116578155B (en) * | 2023-07-14 | 2023-09-15 | 上海英联电子科技有限公司 | Adjustment method and system for trimming circuit |
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| CN111142006B (en) * | 2019-12-26 | 2022-10-28 | 上海岭芯微电子有限公司 | Trim test method and automatic test equipment for chip |
| CN113075531A (en) * | 2021-03-24 | 2021-07-06 | 上海华虹宏力半导体制造有限公司 | Chip testing method |
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