CN113281587B - Detection method and system based on manufacturability design simulator - Google Patents
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Abstract
The invention discloses a detection method and a system based on a manufacturability design simulator, wherein the detection method comprises the following steps: acquiring collected data; converting the collected data into detection data, and storing the detection data into a temporary storage area; analyzing the detection data in the temporary storage area within a first preset period duration, and storing the detection data to a final storage position within a second preset period duration; wherein the first preset period duration is greater than the second preset period duration. The detection method and the system of the manufacturability design simulator provided by the invention can automatically detect the manufacturability of the logic board, improve the detection efficiency and solve the problems of high detection cost and low detection efficiency of the logic board.
Description
Technical Field
The invention relates to the field of electronic design, in particular to a detection method and a detection system based on a manufacturability design simulator.
Background
Various electronic products are used in daily life of users, so the reliability of the electronic products is directly related to the safety of the users. At present, primary Design engineers in most enterprises have no abundant Design experience, and in order to ensure Manufacturability and reliability of electronic Design, design For Manufacturability (DFM) detection can only be performed on electronic products through a Manufacturability Design simulator, but this method needs manual proofreading, which reduces the work efficiency of operators. The existing DFM detection needs a large amount of manpower and material resources, and the flow is complex.
Therefore, a testing method based on the manufacturability design simulator is needed to solve the above problems.
Disclosure of Invention
The invention aims to provide a detection method and a detection system based on a manufacturability design simulator, so as to solve the problems of high detection cost and long detection time of DFM.
In order to achieve the above object, an embodiment of the present invention provides a detection method based on a manufacturability design simulator, where the detection method includes: acquiring collected data; converting the collected data into detection data, and storing the detection data into a temporary storage area; analyzing the detection data in the temporary storage area within a first preset period duration, and storing the detection data to a final storage position within a second preset period duration; wherein the first preset period duration is greater than the second preset period duration.
Further, the step of acquiring the collected data includes: executing the following steps within a third preset period duration; judging whether the acquisition times are less than preset times or not; when the collection times are judged to be less than the preset times, acquiring the collected data, accumulating the collection times, and then re-executing the step of judging whether the collection times are less than the preset times; the collected data comprise voltage data and/or duration data, and the duration of the third preset period is longer than that of the second preset period.
Further, in the step of judging whether the number of times of acquisition is less than a preset number of times, when it is judged that the number of times of acquisition is equal to the preset number of times, the number of times of acquisition is reset, and the step of converting the acquired data into the detection data is performed, and.
Further, when it is determined that the number of times of collection is less than the preset number of times, acquiring the collected data, accumulating the number of times of collection, and re-executing the step of determining whether the number of times of collection is less than the preset number of times, includes: acquiring acquired data through different acquisition channels of the manufacturability design simulator according to preset duration.
Further, the duration data is the power-on time difference or the power-off time difference between different acquisition channels of the manufacturability design simulator.
Further, the step of analyzing the detection data in the temporary storage area during a first preset period, and storing the detection data to a final storage location during a second preset period includes: judging whether the detection data is in a preset voltage range and/or a preset duration range; and correspondingly outputting an abnormal identifier when the detection data is judged not to be in the preset voltage range and/or the preset duration range.
Further, the step of analyzing the detection data in the temporary storage area during a first preset period, and storing the detection data to a final storage location during a second preset period further includes: and storing the detection data and/or the working state identification to a final storage position according to a second preset period duration, wherein the working state identification comprises an abnormal identification.
Further, the step of converting the collected data into detection data and storing the detection data into a temporary storage area includes: and displaying the converted detection data in real time.
Further, before the step of acquiring acquisition data, the method comprises: setting a sampling frequency, wherein the sampling frequency is used for adjusting the shape of the visualized waveform displayed by the manufacturability design simulator.
The embodiment of the invention also provides a detection system based on the manufacturability design simulator, which comprises: the acquisition unit is used for acquiring acquisition data; the conversion unit is used for converting the acquired data into detection data; the first storage unit is used for storing the detection data to a temporary storage area; the analysis unit is used for analyzing the detection data in the temporary storage area within a first preset period duration; and the second storage unit is used for storing the detection data to a final storage position in a second preset period duration, wherein the first preset period duration is longer than the second preset period duration.
The detection method and the detection system for the manufacturability design simulator provided by the embodiment of the invention ensure the traceability of data by storing the collected data to the final storage position. Since the actual time consumption of the process of storing the detection data to the final storage position is shorter than the actual time consumption of the process of acquiring the acquisition data, when the duration of the first preset period is equal to the duration of the second preset period, the process of storing the detection data to the final storage position is completed, but the next process is still not executed, and further the waste of the detection time is caused. The detection method provided by the embodiment of the invention effectively reduces the time consumption ratio of the flow of storing the detection data to the final storage position in the detection method, so that the manufacturability design simulator can have more time to acquire and analyze the flow, and the detection time is further shortened. Meanwhile, the detection method and the detection system provided by the embodiment of the invention can realize automatic detection of the logic board, so that the labor cost is greatly reduced. The logic board detected by the detection method provided by the embodiment of the invention can ensure the self yield.
Drawings
The technical solution and other advantages of the present invention will become apparent from the following detailed description of specific embodiments of the present invention, which is to be read in connection with the accompanying drawings.
FIG. 1 is a flowchart of a detection method based on a manufacturability design simulator according to an embodiment of the invention.
Fig. 2 is a sub-flowchart of step S100 shown in fig. 1.
Fig. 3 is a schematic structural diagram of a detection system based on a manufacturability design simulator according to an embodiment of the invention.
Description of reference numerals:
reference part name
100. Detection system 110 acquisition unit
120. Conversion unit 130 first storage unit
140. Second storage unit of analysis unit 150
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment provides a detection method based on a manufacturability design simulator, which comprises the following steps.
And S100, acquiring collected data.
Wherein the collected data comprises voltage data and/or duration data. Specifically, the collected data is obtained by collecting the logic board to be detected through the manufacturability design simulator. Optionally, step S100 is preceded by a step of setting a sampling frequency. The sampling frequency is used to adjust the shape of the visualized waveform displayed by the manufacturability design simulator. Illustratively, the sampling frequency is set by a user according to actual requirements, and the higher the sampling frequency is, the denser the visualized waveform is, and the lower the sampling frequency is, the sparser the visualized waveform is. Further, this step also includes substeps S110 to S120.
And S110, judging whether the acquisition times are less than the preset times or not within the third preset period duration. The third preset period duration is greater than the second preset period duration. The second predetermined period duration and the third predetermined period duration are further described below.
In this embodiment, the preset number of times may be set by a user, and the specific number of times of the preset number of times is not limited in this embodiment. Illustratively, the higher the preset number of times, the more representative the converted detection data, but the time consumption of the detection process is increased accordingly. The lower the preset times, the less representative the converted detection data is, but the time consumption of the detection process is correspondingly reduced. Manufacturers can choose between the yield of the logic board and the time consumption of the detection according to actual requirements.
And step S120, when the acquisition times are judged to be less than the preset times, acquiring the acquisition data, accumulating the acquisition times, and re-executing the step of judging whether the acquisition times are less than the preset times.
And resetting the acquisition times when the acquisition times are judged to be equal to the preset times, and executing the step of converting the acquired data into the detection data. The number of acquisition is illustratively the number of acquired data, but of course, the ratio of the two may be other ratios. For example: two acquisition data are acquired each time the acquisition times are increased. Specifically, in the step of acquiring the collected data, the collected data are acquired through different collecting channels of the manufacturability design simulator according to preset time length.
For example: dividing the frequency of 72MHz of the manufacturability design simulator by 6 (or 4) and 12MHz after the frequency division, wherein the number of sampling cycles is set to 7.5 cycles +12.5 cycles =20 cycles (where 12.5 cycles are to ensure that the acquired data does not fluctuate when the acquired data is acquired), and the preset time duration is 1.67 microseconds (20 × 1/12). The preset times are set to be 5 times, in order to improve the utilization and testing efficiency of the chip, 5 channels are selected for the sampling channel in the embodiment, and the channel is automatically converted by setting the scanning mode of the embedded single chip microcomputer. The voltage of 5 types of CDs 4051 (single 8-channel digital control analog electronic switch) of the same pin is selected, 5 voltages, namely a first type voltage, a second type voltage, a third type voltage, a fourth type voltage and a fifth type voltage, are acquired through 5 channels, 7.5 cycles are acquired on a first channel, then the time is delayed for 12.5 cycles, the voltage is converted to a second channel for acquisition, similarly, after 20 cycles (1.67 microseconds), the voltage is converted to a third channel, and by analogy, the conversion from the first channel to the fifth channel is 1 cycle, 5 voltage data (namely the acquired data in the embodiment) are acquired after one cycle, 5 groups of voltage data are acquired after 5 cycles, and the voltage data are averaged to be the detection voltages of the first type voltage, the second type voltage, the third type voltage, the fourth type voltage and the fifth type voltage. For each acquisition channel, the acquisition time can be prolonged as much as possible to ensure the accuracy of the detection data.
Preferably, the voltage data is collected, and the power-on time difference or the power-off time difference between different collecting channels can be recorded at the same time. Because a power supply sequence exists between each type of voltage of the logic board, whether the logic board to be detected is abnormal or not can be judged through the power-on time difference and the power-off time difference between different acquisition channels. According to the embodiment, whether a certain type of voltage of the logic board is in an abnormal state or not can be comprehensively judged according to the duration data and the voltage data, so that the detection accuracy is greatly improved. Optionally, the 72MHz dominant frequency of the timer of the manufacturability design simulator is divided by 72 to 1MHz, (i.e., one acquisition for 1 microsecond), with a maximum count per channel timer of 65535. In this embodiment, when the power-on or power-off duration is still 0 (i.e. the voltage is not powered on or powered off) when a channel timer counts up to 65535 times, the timing is continued by a time compensation value to ensure that the detection data recorded in the final storage location is in accordance with the actual situation.
And S200, converting the acquired data into detection data, and storing the detection data into a temporary storage area.
In the embodiment, the accuracy and the representativeness of the detection data are ensured by converting a plurality of acquired data into the detection data. Alternatively, the manufacturer may directly convert single or small amounts of collected data into test data without considering the accuracy and representativeness of the test data. Specifically, the temporary storage area is a cache area of the manufacturability design simulator. In the embodiment, the collected data needs to be correspondingly processed subsequently, so that the collected data is not stored in the final storage position. Optionally, on the premise that the manufacturer does not consider saving the storage space, the collected data can be stored to the final storage position so as to facilitate the subsequent proofreading of the accuracy of the detection data. Specifically, the detection data is a ratio of a sum of all the collected data to a total number of all the collected data (i.e. the detection data is an average value of all the collected data), and in other embodiments, the collected data may be processed in other manners, for example, the average value is obtained by a weight corresponding to the collected data. In this embodiment, the final storage location is a data storage table, and the user can intuitively search the detection data through the data storage table. Step S200 may further include the step of displaying the converted sensing data in real time. Specifically, after the acquired data is converted into the detection data, the visual waveform of the converted detection data can be displayed in real time, so that a user can check whether the detection data is abnormal in real time.
Step S300, analyzing the detection data in the temporary storage area within a first preset period duration, and storing the detection data to a final storage position within a second preset period duration. The first preset period duration is longer than the second preset period duration.
In this embodiment, the processor of the manufacturability design simulator is a single-core processor, so the order and duration of each execution step need to be planned. Therefore, in the present embodiment, the step of analyzing the detection data in the temporary storage area executes the first preset cycle duration every interval of the first duration (the value of the first duration is the sum of the second preset cycle duration and the third preset cycle duration). And storing the detection data to a final storage position, and executing a second preset period duration at intervals of a second duration (the value of the second duration is the sum of the first preset period duration and a third preset period duration). And the step of acquiring the acquired data executes a third preset period every other third period (the value of the third period is the sum of the first preset period and the second preset period). For example, the first preset period duration is 4 seconds, the second preset period duration is 2 seconds, and the third preset period duration is 3 seconds. If so configured, the step of analyzing the detection data in the temporary storage area is performed for 4 seconds at intervals of 5 seconds, the step of storing the detection data to the final storage location is performed for 2 seconds at intervals of 7 seconds, and the step of acquiring the acquisition data is performed for 3 seconds at intervals of 6 seconds. Since the objective of this embodiment is to reduce the time ratio of the process of storing the detection data to the final storage location in the detection process, the relationship between the duration of the second preset period and the duration of the first preset period and the relationship between the duration of the second preset period and the duration of the third preset period are defined herein. The manufacturer can limit the size relationship between the first preset period duration and the third preset period duration according to the actual situation during detection. Step S300 further includes the following steps. And judging whether the detection data is in a preset voltage range and/or a preset duration range. And correspondingly outputting an abnormal identifier when the detection data is judged not to be in the preset voltage range and/or the preset duration range. The abnormal mark is used for marking abnormal detection data so as to facilitate a user to screen the abnormal detection data. The user can obtain a preset voltage range and/or a preset duration range of VCC (power supply voltage) according to the specification. Further, step S300 further includes: and storing the detection data and/or the working state identification to a final storage position according to the second preset period duration. Wherein the working state identification comprises an abnormal identification. For example: and finally, storing the detection data in the storage position corresponding to the working state identifier, so that the user can intuitively inquire the abnormal detection data. The operating state identification may be used to identify abnormal detection data in this embodiment.
According to the detection method of the manufacturability design simulator provided by the embodiment, the traceability of data is ensured by storing the collected data to the final storage position, so that the time consumption ratio of the process of storing the detection data to the final storage position in the detection method is effectively reduced, the manufacturability design simulator can have more time for collecting and analyzing the process, and the detection efficiency is improved. Meanwhile, the detection method provided by the embodiment can realize automatic detection of the logic board, so that the labor cost is greatly reduced. The logic board detected by the detection method provided by the embodiment can ensure the self yield.
Referring to fig. 3, based on the same inventive concept, the present embodiment further provides a detection system 100 based on a manufacturability design simulator, which includes a collecting unit 110, a converting unit 120, a first storage unit 130, an analyzing unit 140, and a second storage unit 150.
The acquisition unit 110 is used to acquire acquisition data. The conversion unit 120 is configured to convert the collected data into detection data. The first storage unit 130 is used for storing the detection data to a temporary storage area. The analyzing unit 140 is configured to analyze the detection data in the temporary storage area for a first preset period duration. The second storage unit 150 is configured to store the detection data to a final storage location within a second preset period duration, where the first preset period duration is longer than the second preset period duration.
The detection system of the manufacturability design simulator provided by the embodiment ensures the traceability of data by storing the collected data to the final storage position, thereby effectively reducing the time consumption ratio of the process of storing the detection data to the final storage position in the detection method, so that the manufacturability design simulator can have more time for collecting and analyzing the process, and the detection efficiency is improved. Meanwhile, the detection system provided by the embodiment can realize automatic detection of the logic board, so that the labor cost is greatly reduced. The detection system provided by the embodiment can be used for detecting the logic board, so that the self yield can be ensured.
The method and the system for detecting the manufacturability design simulator provided by the embodiment of the invention are introduced in detail, and a specific example is applied to explain the principle and the embodiment of the invention, and the description of the embodiment is only used for helping to understand the method and the core idea of the invention; meanwhile, for those skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (9)
1. A detection method based on a manufacturability design simulator is characterized by comprising the following steps:
acquiring acquired data, wherein the acquired data is acquired by acquiring the logic board to be detected through the manufacturability design simulator, the acquired data comprises voltage data and duration data, the manufacturability design simulator acquires the voltage data and the duration data of the logic board to be detected through different acquisition channels, and the duration data is the power-on time difference or the power-off time difference between the different acquisition channels of the manufacturability design simulator;
converting collected data collected by different collecting channels into detection data, and storing the detection data into a temporary storage area, wherein the detection data is the ratio of the sum of all the collected data of different collecting channels to the total amount of all the collected data; and
analyzing the detection data in the temporary storage area within a first preset period duration, and storing the detection data to a final storage position within a second preset period duration; wherein the first preset period duration is greater than the second preset period duration.
2. The method of claim 1, wherein the step of acquiring the collected data comprises:
executing the following steps within a third preset period duration;
judging whether the acquisition times are less than preset times or not;
when the collection times are judged to be less than the preset times, acquiring the collected data, accumulating the collection times, and re-executing the step of judging whether the collection times are less than the preset times; the third preset period duration is greater than the second preset period duration.
3. The detecting method according to claim 2, wherein in the step of judging whether the number of times of acquisition is less than a preset number of times, when it is judged that the number of times of acquisition is equal to the preset number of times, the number of times of acquisition is reset, and the step of converting the acquired data into the detected data is performed.
4. The detecting method according to claim 2, wherein said steps of acquiring the collected data and accumulating the collection times when it is determined that the collection times are less than the preset times, and re-executing said step of determining whether the collection times are less than the preset times, comprise: acquiring acquired data through different acquisition channels of the manufacturability design simulator according to preset duration.
5. The method for testing as defined in claim 1, wherein said step of analyzing said test data in said temporary storage area for a first preset period of time and storing said test data to a final storage location for a second preset period of time comprises:
judging whether the detection data are in a preset voltage range and a preset duration range or not;
and when the detection data is judged not to be in the preset voltage range and/or the preset duration range, correspondingly outputting an abnormal mark.
6. The method for checking as claimed in claim 1, wherein the step of analyzing the check data in the temporary storage area for a first preset period duration and storing the check data to a final storage location for a second preset period duration further comprises:
and storing the detection data and/or the working state identification to a final storage position according to a second preset period duration, wherein the working state identification comprises an abnormal identification.
7. The inspection method of claim 1, wherein the step of converting the collected data into inspection data and storing said inspection data in a temporary storage area comprises:
and displaying the converted detection data in real time.
8. The detection method of claim 1, wherein prior to the step of acquiring acquisition data, comprising: setting a sampling frequency, wherein the sampling frequency is used for adjusting the shape of the visualized waveform displayed by the manufacturability design simulator.
9. A manufacturability design simulator based inspection system, comprising:
the system comprises a collecting unit, a judging unit and a judging unit, wherein the collecting unit is used for obtaining collected data, the collected data is obtained by collecting a logic board to be detected through the manufacturability design simulator, the collected data comprises voltage data and duration data, the manufacturability design simulator collects the voltage data and the duration data of the logic board to be detected through different collecting channels, and the duration data is the power-on time difference or the power-off time difference among the different collecting channels of the manufacturability design simulator;
the conversion unit is used for converting the acquired data acquired by different acquisition channels into detection data, wherein the detection data is the ratio of the sum of all the acquired data of the different acquisition channels to the total amount of all the acquired data;
the first storage unit is used for storing the detection data to a temporary storage area;
the analysis unit is used for analyzing the detection data in the temporary storage area within the duration of a first preset period; and
and the second storage unit is used for storing the detection data to a final storage position in a second preset period duration, wherein the first preset period duration is longer than the second preset period duration.
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