CN113176223A - Infrared spectrophotometry detector - Google Patents
Infrared spectrophotometry detector Download PDFInfo
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- CN113176223A CN113176223A CN202110306571.8A CN202110306571A CN113176223A CN 113176223 A CN113176223 A CN 113176223A CN 202110306571 A CN202110306571 A CN 202110306571A CN 113176223 A CN113176223 A CN 113176223A
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- 238000004566 IR spectroscopy Methods 0.000 title claims abstract description 11
- 239000011343 solid material Substances 0.000 claims abstract description 56
- 238000002834 transmittance Methods 0.000 claims abstract description 19
- 230000007547 defect Effects 0.000 claims abstract description 6
- 238000012360 testing method Methods 0.000 claims description 23
- 239000012535 impurity Substances 0.000 claims description 4
- 238000012935 Averaging Methods 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 10
- 238000000034 method Methods 0.000 abstract description 6
- 239000000126 substance Substances 0.000 description 5
- 230000001427 coherent effect Effects 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000001157 Fourier transform infrared spectrum Methods 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000010986 on-line near-infrared spectroscopy Methods 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses an infrared spectrophotometry detector which is used for detecting internal flaws of solid materials and comprises an infrared light source, a lamp chamber, a light homogenizing device and a camera, wherein: the infrared light source is arranged on the inner wall of the lamp chamber, a window is formed in the top of the lamp chamber, and infrared light emitted by the infrared light source is reflected by the interior of the lamp chamber and then is emitted from the top of the lamp chamber; the light homogenizing device is arranged at the top of the lamp chamber, receives infrared light emitted from the top of the lamp chamber and disperses the infrared light; the solid material is placed above the light uniformizing device, infrared light scattered by the light uniformizing device is irradiated into the solid material and transmitted, the infrared light transmitted from the solid material is collected by the camera, and an infrared image of the solid material is shot to obtain the infrared light transmittance of the solid material. Compared with the prior art, the method can be used for nondestructive detection of internal defects of various solid materials by utilizing infrared spectroscopy.
Description
Technical Field
The invention relates to the field of infrared detection, in particular to an infrared spectrophotometry detector.
Background
The infrared spectrophotometry is an analysis method established by using molecules to absorb infrared light with certain wavelengths to cause the transition of vibration energy levels and rotation energy levels when the substances are irradiated within the wavelength range of 760-1000 nm and obtaining an infrared absorption spectrum according to the selective absorption of the substances to the infrared light. When light passes through a substance to be measured, the degree of absorption of light by the substance varies depending on the wavelength of the light. When the infrared spectroscopy is used for measurement, the structure of a substance is not damaged, the measurement is quick, the using amount of a sample is small, and the operation is simple and convenient.
The infrared spectrometers in the prior art are generally divided into two types, one is raster scanning, which is rarely used; the other is michelson interferometer scanning, known as fourier transform infrared spectroscopy, which is the most widely used. The raster scanning is to divide the detecting light (infrared light) into two beams by a spectroscope, one beam is used as reference light, the other beam is used as detecting light to irradiate a sample, the wavelengths of the infrared light are divided by a raster and a monochromator, the intensities of the wavelengths are scanned and detected one by one, and finally the two beams are integrated into a spectrogram. The fourier transform infrared spectroscopy uses a michelson interferometer to divide detection light (infrared light) into two beams, which are reflected back to a beam splitter on a movable mirror and a fixed mirror, and the two beams are broadband coherent light and interfere with each other. Coherent infrared light irradiates on a sample, the coherent infrared light is collected by a detector to obtain infrared interferogram data containing sample information, and an infrared spectrogram of the sample is obtained after Fourier transformation is carried out on the data by a computer. The Fourier transform infrared spectrum has the characteristics of high scanning rate, high resolution, stable repeatability and the like, and is widely used. The Chinese patent with publication number CN105699311A of 2016, 06 and 22 in 2016 discloses an on-line product detection system and method based on a micro near-infrared spectrometer, wherein the on-line near-infrared spectrometer comprises a main body, a spectrometer, a laser driver, a camera, a gold-plated reference plate, a stepping motor and a stepping motor driver; the stepping motor is fixed on the end surface of the main body, the output shaft of the stepping motor is connected with the connecting plate, and the middle part of the gold-plated reference plate is fixed on the connecting plate; a central groove is arranged in the middle of the main body, and a camera and a spectrometer are arranged on two sides of the central groove; the two sides of the main body are provided with slide rails, and the connecting blocks are arranged on the slide rails; two ends of the gold-plated sheet reference plate are fixed on the connecting blocks on the slide rails; the laser is arranged on the lower part of the main body on one side where the spectrograph is arranged. The device cannot detect fine flaws inside the solid material.
The existing infrared spectrophotometer mainly aims at compound identification, inspection or content measurement, is less applied to detection of fine marks (flaws) of solid materials, and many materials cannot detect internal flaws after injection molding or welding.
Disclosure of Invention
The invention provides an infrared spectrophotometry detector for nondestructive detection of internal flaws of various solid materials.
In order to solve the technical problems, the technical scheme of the invention is as follows:
an infrared spectrophotometric detector for detecting internal flaws of solid materials comprises an infrared light source, a lamp chamber, a light homogenizing device and a camera, wherein:
the infrared light source is arranged on the inner wall of the lamp chamber, a window is formed in the top of the lamp chamber, and infrared light emitted by the infrared light source is reflected by the interior of the lamp chamber and then is emitted from the top of the lamp chamber;
the light homogenizing device is arranged at the top of the lamp chamber, receives infrared light emitted from the top of the lamp chamber and disperses the infrared light;
the solid material is placed above the light uniformizing device, infrared light scattered by the light uniformizing device is irradiated into the solid material and transmitted, the infrared light transmitted from the solid material is collected by the camera, and an infrared image of the solid material is shot to obtain the infrared light transmittance of the solid material.
Preferably, the infrared light source emits infrared light at a wavelength of 980 nm.
Preferably, the infrared light source is an infrared LED lamp.
Preferably, the light homogenizing device is a light homogenizing plate.
Preferably, an infrared light narrow-band filter is installed in the camera.
Preferably, the external light narrowband filter is a 980nm narrowband filter.
Preferably, the 980nm narrowband filter is of grade OD2 to OD 4.
Preferably, in the infrared spectrophotometry detector, when the camera shoots the infrared image of the solid material, the image contour of the solid material is calculated by using an automatic image algorithm, the test area is customized as required, and automatic coordinate conversion is performed according to the set contour and the test area in repeated tests, so that the test area is automatically applied to each test.
Preferably, the obtaining of the infrared light transmittance of the solid material specifically includes:
and averaging the brightness threshold values of all the pixel points in the test area, and comparing the average brightness value of the background light received by the camera when no solid material exists to obtain the infrared light transmittance of the test area.
Preferably, the qualified solid material is photographed and compared with the same solid material, and defects including bubbles and impurities in the solid material are found according to the difference of light transmittance.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that:
the invention can utilize infrared spectrum to detect the internal defects of various solid materials, including PMMA, PC, ABS and other materials added with elements such as germanium, sulfide and the like, and the detection process is lossless. The light transmittance of the material can be scanned in a full picture, a detection area and a light transmittance range are freely set, the light transmittance and impurities of the detection area are automatically extracted, and identification is made.
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a schematic view of the installation of the infrared light source of the present invention.
In the figure, 1 is a camera, 2 is a light homogenizing plate, 3 is an infrared light source, and 4 is a lamp chamber.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent;
for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product;
it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.
Example 1
The present embodiment provides an infrared spectrophotometric detector for detecting internal defects of solid materials, as shown in fig. 1 and fig. 2, comprising an infrared light source 3, a lamp chamber 4, a light homogenizing device, and a camera 1, wherein:
the infrared light source 3 is installed on the inner wall of the lamp chamber 4, the top of the lamp chamber 4 is provided with a window, and infrared light emitted by the infrared light source 3 is reflected by the inside of the lamp chamber 4 and then is emitted from the top of the lamp chamber 4;
the light homogenizing device is arranged at the top of the lamp chamber 4, receives the infrared light emitted from the top of the lamp chamber 4 and disperses the infrared light;
the solid material is placed above the light uniformizing device, infrared light scattered by the light uniformizing device irradiates and transmits the solid material, the camera 1 collects infrared light transmitted by the solid material, and an infrared image of the solid material is shot to obtain the infrared light transmittance of the solid material.
The wavelength of the infrared light emitted by the infrared light source 3 is 980 nm.
The infrared light source 3 is an infrared LED lamp.
The light homogenizing device is a light homogenizing plate 2.
In this embodiment, a 980nm infrared LED side illumination method and the light homogenizing plate 2 are adopted, and the side illumination method can enable light rays not to directly illuminate the light homogenizing plate 2, but to illuminate other areas of the lamp chamber 4, and the light rays are reflected by the lamp chamber 4 and then transmitted to the light homogenizing plate 2. The light homogenizing plate 2 can further disperse the light to achieve the effect of homogenizing the light.
An infrared light narrow-band filter is installed in the camera 1.
The external light narrowband filter is a 980nm narrowband filter.
The 980nm narrowband filter is in the order of OD 2-OD 4.
The 980nm narrow-band filter is built in the embodiment to eliminate the influence of stray light.
In the infrared spectrophotometry detector, when the camera 1 shoots the infrared image of the solid material, the image outline of the solid material is calculated by using an automatic image algorithm, the test area is customized according to the requirement, and automatic coordinate conversion is carried out according to the set outline and the test area in repeated tests, so that the test area is automatically applied to each test.
Obtaining the infrared light transmittance of the solid material, which specifically comprises the following steps:
and averaging the brightness threshold values of all the pixel points in the test area, and comparing the average brightness value of the background light received by the camera 1 with the average brightness value of the background light when no solid material exists to obtain the infrared light transmittance of the test area.
Through shooting qualified solid materials, comparing the qualified solid materials with the solid materials of the same type, and discovering the defects including bubbles and impurities in the solid blanking according to the difference of light transmittance.
Example 2
The embodiment discloses an infrared spectrophotometric detection method, which is based on the infrared spectrophotometric detector described in embodiment 1, and specifically comprises the following steps:
the infrared light source emits infrared light by adopting a side illumination method, and the infrared light is emitted from the top of the lamp chamber after being emitted by the lamp chamber;
the light homogenizing device receives infrared light emitted from the top of the lamp chamber and further disperses the infrared light;
infrared light is emitted into the solid material after being dispersed by the light homogenizing device;
the camera acquires infrared light transmitted from the solid material to obtain an infrared image of the solid material;
comparing the average of the brightness threshold values of all pixel points of the infrared image with the average brightness value of background light to obtain the infrared light transmittance of the test area, wherein the average brightness of the background light is the average brightness when infrared light is not emitted into a solid material after being scattered by a light uniformizing device and is directly acquired by a camera;
and comparing the infrared light transmittance of the test area with the transmittance of the qualified solid material to find the internal flaws of the detected solid material.
The same or similar reference numerals correspond to the same or similar parts;
the terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (10)
1. The utility model provides an infrared spectrophotometry detector for detect the inside flaw of solid material, its characterized in that includes infrared source, lamp house, dodging device and camera, wherein:
the infrared light source is arranged on the inner wall of the lamp chamber, a window is formed in the top of the lamp chamber, and infrared light emitted by the infrared light source is reflected by the interior of the lamp chamber and then is emitted from the top of the lamp chamber;
the light homogenizing device is arranged at the top of the lamp chamber, receives infrared light emitted from the top of the lamp chamber and disperses the infrared light;
the solid material is placed above the light uniformizing device, infrared light scattered by the light uniformizing device is emitted into the solid material, the infrared light transmitted by the solid material is collected by the camera, and an infrared image of the solid material is shot to obtain the infrared light transmittance of the solid material.
2. The infrared spectrophotometric detector of claim 1 wherein the infrared light source emits infrared light at a wavelength of 980 nm.
3. The infrared spectrophotometric detector of claim 2 wherein the infrared light source is an infrared LED lamp.
4. The infrared spectrophotometric detector of claim 1 wherein the light homogenizing device is a light homogenizing plate.
5. The infrared spectrophotometric detector of claim 1 wherein an infrared light narrowband filter is mounted in the camera.
6. The infrared spectrophotometric detector of claim 5 wherein the external light narrowband filter is a 980nm narrowband filter.
7. The infrared spectrophotometric detector of claim 6 wherein the 980nm narrowband filter is rated at OD2 to OD 4.
8. The infrared spectrophotometer according to claim 1, wherein when the camera takes an infrared image of the solid material, the image profile of the solid material is calculated by an automatic image algorithm, a test area is customized as required, and automatic coordinate conversion is performed in repeated tests according to the set profile and the test area, so that the test area is automatically applied to each test.
9. The infrared spectrophotometric detector according to claim 8, wherein the obtaining of the infrared transmittance of the solid material is specifically:
and averaging the brightness threshold values of all the pixel points in the test area, and comparing the average brightness value of the background light received by the camera when no solid material exists to obtain the infrared light transmittance of the test area.
10. The infrared spectrophotometer according to claim 9, wherein the defects including bubbles and impurities inside the solid material are found based on the difference in transmittance by photographing the acceptable solid material and comparing it with the same kind of solid material.
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| CN202110306571.8A CN113176223A (en) | 2021-03-23 | 2021-03-23 | Infrared spectrophotometry detector |
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| CN202110306571.8A CN113176223A (en) | 2021-03-23 | 2021-03-23 | Infrared spectrophotometry detector |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113927928A (en) * | 2021-10-29 | 2022-01-14 | 嘉兴九辰科技服务有限公司 | Preparation method of resin button |
| CN114739300A (en) * | 2022-03-29 | 2022-07-12 | 上海优睿谱半导体设备有限公司 | Method for measuring epitaxial layer thickness of epitaxial wafer |
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