CN113010004A - Abnormal power consumption processing method and device and electronic equipment - Google Patents

Abnormal power consumption processing method and device and electronic equipment Download PDF

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Publication number
CN113010004A
CN113010004A CN202110291382.8A CN202110291382A CN113010004A CN 113010004 A CN113010004 A CN 113010004A CN 202110291382 A CN202110291382 A CN 202110291382A CN 113010004 A CN113010004 A CN 113010004A
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voltage
change rate
sampling
determining
power consumption
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CN113010004B (en
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边越峰
梁长国
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Vivo Mobile Communication Co Ltd
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Vivo Mobile Communication Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G06F1/3234—Power saving characterised by the action undertaken
    • G06F1/3296—Power saving characterised by the action undertaken by lowering the supply or operating voltage

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Abstract

The application discloses an abnormal power consumption processing method and device and electronic equipment, and belongs to the field of electronic control. The method comprises the following steps: when a preset condition is met, at least three sampling voltages are obtained; determining a change rate parameter of the system voltage according to the sampling voltage; when the change rate parameter indicates that the system current exceeds a preset threshold current value, performing power consumption reduction processing on a module with abnormal power consumption; in the application, the change rate parameter of the system voltage reflects the change of the system voltage within a period of time, and further reflects the change of the system current within a period of time, and when the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the power consumption of a module can be reduced. Because the preset threshold current value is smaller than the overcurrent and junction temperature protection threshold current value, the power consumption can be reduced when the system current is higher but not exceeds the overcurrent and junction temperature protection threshold current value, so that the power consumption is reduced in advance before the overcurrent or junction temperature protection is triggered by the system, and the condition of direct shutdown is avoided.

Description

Abnormal power consumption processing method and device and electronic equipment
Technical Field
The application belongs to the field of electronic control, and particularly relates to an abnormal power consumption processing method and device and electronic equipment.
Background
In the process of using the electronic equipment, the situation that the system current is very high can occur, for example, some devices are abnormal to cause high power consumption, a large-scale game is started, and the like, and the situation easily causes the system current to be too high or causes the junction temperature of power consumption devices to exceed the standard. In practical applications, electronic devices usually have an Over Current Protection (OCP) function, and when an instantaneous Current of a system is too large and exceeds an overcurrent Protection threshold Current value, after a certain response time, if the Current continuously exceeds a standard, the system is shut down to protect devices of the electronic devices. In addition, when the current is too large, the junction temperature of the device is easy to exceed the standard, and the device is damaged, so that some electronic equipment has a junction temperature protection function, and when the junction temperature of the device exceeds the standard due to the fact that the current of a system exceeds the junction temperature protection threshold current value, the device is protected by shutting down the electronic equipment.
When the battery capacity is low, if a load with large current exists, the battery voltage which is originally very low falls below a battery voltage shutdown point, so that the system does not remind a user of abnormal shutdown in time, and inconvenience is caused to the user. At present, the instantaneous current of large software is higher and higher, so that the occurrence probability of sudden shutdown is higher and higher, and the internal resistance of a battery is increased under a low-temperature environment, so that the situation is easier to trigger.
Disclosure of Invention
The embodiment of the application aims to provide an abnormal power consumption processing method, an abnormal power consumption processing device and electronic equipment, and the problem that sudden automatic shutdown is easy to happen when the system current is too large or the junction temperature exceeds the standard can be solved.
In order to solve the technical problem, the present application is implemented as follows:
in a first aspect, an embodiment of the present application provides an abnormal power consumption processing method, where the method includes:
under the condition that a preset condition is met, at least three sampling voltages corresponding to the system voltage are obtained;
determining a change rate parameter of the system voltage according to the at least three sampling voltages;
determining a target module causing power consumption abnormity under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value;
executing corresponding power consumption reduction processing operation on the target module;
the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
In a second aspect, an embodiment of the present application provides an apparatus for processing abnormal power consumption, where the apparatus includes:
the acquisition module is used for acquiring at least three sampling voltages corresponding to the system voltage under the condition that a preset condition is met;
the first determination module is used for determining a change rate parameter of the system voltage according to the at least three sampling voltages;
the second determining module is used for determining a target module causing abnormal power consumption under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value;
the processing module is used for executing corresponding power consumption reduction processing operation on the target module;
the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
In a third aspect, an embodiment of the present application provides an electronic device, which includes a processor, a memory, and a program or instructions stored on the memory and executable on the processor, and when executed by the processor, the program or instructions implement the steps of the method according to the first aspect.
In a fourth aspect, embodiments of the present application provide a readable storage medium, on which a program or instructions are stored, which when executed by a processor implement the steps of the method according to the first aspect.
In a fifth aspect, an embodiment of the present application provides a chip, where the chip includes a processor and a communication interface, where the communication interface is coupled to the processor, and the processor is configured to execute a program or instructions to implement the method according to the first aspect.
In the embodiment of the application, under the condition that the preset condition is met, the electronic device may obtain at least three sampling voltages corresponding to the system voltage, determine a change rate parameter of the system voltage according to the at least three sampling voltages, determine a target module causing power consumption abnormality under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value, and further perform corresponding power consumption reduction processing operation on the target module. In this embodiment, the change rate parameter of the system voltage may reflect a change of the system voltage within a period of time, and the change of the system voltage within a period of time may reflect a change of the system current within a period of time, and in a case where the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the electronic device may perform a power consumption reduction process on a target module causing power consumption abnormality, so as to recover the system current to below the preset threshold current value. In addition, because the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic equipment and smaller than the junction temperature protection threshold current value of the electronic equipment, when the system current is higher but not greater than the overcurrent protection threshold current value and the junction temperature protection threshold current value of the electronic equipment, the electronic equipment can perform power consumption reduction treatment, so that the power consumption can be reduced in advance before the system triggers the overcurrent or junction temperature protection function, and the condition that the direct shutdown is caused by the triggering of the overcurrent or junction temperature protection function is avoided.
Drawings
Fig. 1 is a flowchart of an abnormal power consumption processing method according to an embodiment of the present application;
fig. 2 is a flowchart of another abnormal power consumption processing method according to an embodiment of the present application;
FIG. 3 is a schematic diagram of sampling a system voltage according to an embodiment of the present disclosure;
FIG. 4 is a diagram illustrating a power saving processing operation performed on a flash according to an embodiment of the present disclosure;
FIG. 5 is a diagram illustrating a CPU performing power-saving processing operations according to an embodiment of the present disclosure;
FIG. 6 is a schematic circuit diagram illustrating an implementation of abnormal power consumption handling according to an embodiment of the present disclosure;
fig. 7 is a block diagram illustrating a structure of an abnormal power consumption processing apparatus according to an embodiment of the present application;
fig. 8 is a block diagram of an electronic device according to an embodiment of the present disclosure;
fig. 9 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terms first, second and the like in the description and in the claims of the present application are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It will be appreciated that the data so used may be interchanged under appropriate circumstances such that embodiments of the application may be practiced in sequences other than those illustrated or described herein, and that the terms "first," "second," and the like are generally used herein in a generic sense and do not limit the number of terms, e.g., the first term can be one or more than one. In addition, "and/or" in the specification and claims means at least one of connected objects, a character "/" generally means that a preceding and succeeding related objects are in an "or" relationship.
The abnormal power consumption processing method provided by the embodiment of the present application is described in detail below with reference to the accompanying drawings through specific embodiments and application scenarios thereof.
Referring to fig. 1, an embodiment of the present application provides an abnormal power consumption processing method, including:
step 101, acquiring at least three sampling voltages corresponding to a system voltage under the condition that a preset condition is met.
In this embodiment of the application, the preset condition may be a trigger condition for the electronic device to execute an operation of acquiring at least three sampling voltages corresponding to the system voltage, and the electronic device may perform at least three times of sampling on the system voltage when the preset condition is satisfied, so as to acquire the at least three sampling voltages corresponding to the system voltage. The sampling mode may be periodic sampling. For example, T is a sampling period, and a sampling voltage may be acquired at intervals of T, and 2T is acquired to obtain 3 sampling voltages, where 2T is a detection period. For another example, one sampling voltage may be acquired at intervals of T, 4 sampling voltages may be acquired at intervals of 4T, and 3T is one detection period.
Whether the system current exceeds a preset threshold current value or not is judged according to the at least three sampling voltages, and false triggering of power consumption reduction processing operation caused by short-time fluctuation of the system current can be prevented.
And step 102, determining a change rate parameter of the system voltage according to the at least three sampling voltages.
In the embodiment of the application, the sampling voltage, that is, the instantaneous system voltage, may reflect the instantaneous system current, the change rate of the sampling voltage with time, that is, the slope of the sampling voltage with time, may reflect the change amount of the system current in a period of time, synthesize the instantaneous system voltage, and the change amount of the system voltage, and may determine the condition of the system current. Thus, the rate of change parameter of the system voltage may reflect the condition of the system current.
103, under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value, determining a target module causing power consumption abnormity; the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
In the embodiment of the present application, since the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic device and smaller than the junction temperature protection threshold current value of the electronic device, if the system current only exceeds the preset threshold current value, it indicates that the increase of the system current does not meet the condition of triggering the overcurrent protection or the junction temperature protection, and at this time, a target module causing abnormal power consumption may be determined.
In practical application, the required current of each module capable of working normally can be prestored in the system, and when the system current of a certain module is detected to exceed the required current corresponding to the module, the abnormal power consumption of the module can be determined. The module may be a functional module or an entity module in the electronic device, which is not specifically limited in this embodiment of the present application.
And 104, executing corresponding power consumption reduction processing operation on the target module.
In the embodiment of the application, different power consumption reduction processing operations can be preset for different modules, so that the corresponding power consumption reduction processing operations can be executed on the target module. For example, the power consumption may be reduced by reducing the flash lamp current for a flash with abnormal power consumption, by reducing the CPU clock frequency for a Central Processing Unit (CPU) with abnormal power consumption, or by reducing the speaker volume for a speaker with abnormal power consumption, which is not particularly limited in the embodiments of the present application.
In this embodiment, the change rate parameter of the system voltage may reflect a change of the system voltage within a period of time, and the change of the system voltage within a period of time may reflect a change of the system current within a period of time, and in a case where the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the electronic device may perform a power consumption reduction process on a target module causing power consumption abnormality, so as to recover the system current to below the preset threshold current value. In addition, because the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic equipment and smaller than the junction temperature protection threshold current value of the electronic equipment, when the system current is higher but not greater than the overcurrent protection threshold current value and the junction temperature protection threshold current value of the electronic equipment, the electronic equipment can perform power consumption reduction treatment, so that the power consumption can be reduced in advance before the system triggers the overcurrent or junction temperature protection function, and the condition that the direct shutdown is caused by the triggering of the overcurrent or junction temperature protection function is avoided.
Optionally, referring to fig. 2, step 102 may specifically include the following steps:
step 1021: determining a target voltage change rate from the voltage corresponding to the preset threshold current value to a first sampling voltage;
step 1022: determining a first voltage rate of change of a second sampled voltage to the first sampled voltage;
step 1023: under the condition that the first voltage change rate is smaller than the target voltage change rate, determining a second voltage change rate of the sampling voltage from the third sampling voltage to the previous sampling time for any third sampling voltage after the second sampling voltage;
the first sampling voltage is a sampling voltage with the earliest sampling time in the at least three sampling voltages, and the second sampling voltage is a sampling voltage with the earliest sampling time in the at least three sampling voltages except the first sampling voltage.
It is understood that, in the embodiments of the present application, the rate of change refers to a rate of change of a certain physical quantity with respect to time, and for example, the rate of change of voltage refers to a rate of change of voltage with respect to time.
In step 1021, since P is UI, it can be determined that the system current is equal to the preset threshold current value I according to the output power P of the system0Voltage U corresponding to time0Then, the voltage can be sampled at the first sampling voltage U1Greater than a predetermined threshold current value I0Corresponding voltage U0In the case of (2), a preset threshold current value I is determined0Corresponding voltage U0To a first sampling voltage U1Target voltage change rate i0Wherein i is0＝(U0-U1) And T is one sampling period. In the examples of the present application, i0< 0 because if i0Greater than or equal to 0, then U0≥U1Then, I0≤I1，I1Is a first sampling voltage U1Corresponding current, I0≤I1I.e. the first sampling voltage U1The corresponding current is greater than or equal to the preset threshold current value, that is, the system current exceeds the preset threshold current value, and this condition will be detected in the previous detection period, so that the current is controlled at the preset threshold current value by the power consumption reduction processing operation, therefore, in each detection period, i0Is less than 0.
In the time T, the different first sampling voltages change to voltages corresponding to the preset threshold current value, and the currents allowed to increase by the system are different, that is, when the first sampling voltage is lower, the current increase is not more than the preset threshold current value, and when the first sampling voltage is higher, the current increase is only a little and may exceed the preset threshold current value. Therefore, for different first sampling voltages, different target voltage change rates can be determined, the target voltage change rate can be used as a standard value, when the first sampling voltage is changed into a second sampling voltage after the time T elapses, the voltage change rate from the second sampling voltage to the first sampling voltage can be compared with the standard value to determine whether the real change amount of the system voltage exceeds the change amount allowed by the system voltage, and further, whether the real change amount of the system current exceeds the change amount allowed by the system current can be determined.
In step 1022, a second sampled voltage U may be determined2To a first sampling voltage U1First rate of voltage change i1Wherein i is1＝(U2-U1)/T。
In step 1023, when the first voltage change rate i1Less than target voltage rate of change i0For the second sampling voltage U2Each subsequent third sampled voltage may determine a second voltage rate of change of each respective third sampled voltage to the sampled voltage at the respective previous sampling time.
Referring to FIG. 3, for curve U1-U2-U3-U4Second sampling voltage U2The third sampled voltage thereafter includes U3And U4At i0On the basis of < 0, when the first voltage change rate i1Less than target voltage rate of change i0When it is explained in U1Change to U2The system voltage is reduced more and the system current is increased more and exceeds the preset threshold current value I0Therefore, it is possible to continue to determine U3To U2Voltage change rate i of2And U is4To U3Voltage ofRate of change i3To determine whether the system current can fall back to the preset threshold current value I in a detection period0If the system can fall back, the situation that the instantaneous current of the system is accidentally excessive can be eliminated, wherein i2＝(U3-U2)/T，i3＝(U4-U3)/T。
Correspondingly, referring to fig. 2, step 103 may specifically include the following steps:
step 1031: and under the condition that each second voltage change rate is smaller than or equal to zero, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
At i1＜i0In the case that the system current exceeds the preset threshold current value I0With reference to the curve U shown in fig. 31-U2-U3", if i2< 0, it means that the system current is in U in the next 1 sampling period2Continuously reducing on the basis that the system current exceeds a preset threshold current value I for 2 continuous sampling periods0. With reference to the curve U shown in FIG. 31-U2-U3', if i2When the value is 0, it means that the system current is in U in the next 1 sampling period2Keeping unchanged on the basis that the system current exceeds a preset threshold current value I for 2 continuous sampling periods0。
At i1＜i0And i is2Under the condition that the current value is less than or equal to 0, namely the system current exceeds the preset threshold current value I for 2 continuous sampling periods0With reference to the curve U shown in fig. 31-U2-U3”-U4", if i3< 0, it means that the system current is in U for the next 1 sampling period3Based on the current value of the system, the current value of the system continuously decreases for 3 sampling periods exceeding a preset threshold current value I0. With reference to the curve U shown in FIG. 31-U2-U3’-U4', if i3When the value is 0, it means that the system current is in U in the next 1 sampling period3Keeping unchanged on the basis that the system current exceeds a preset threshold current value I for 3 continuous sampling periods0。
When the system current exceeds the preset threshold current value I for at least two continuous sampling periods0Under the condition of (3), the condition that the instantaneous current of the system is accidentally overlarge can be eliminated, the situation that the power consumption abnormality occurs to the electronic equipment is shown, and then the electronic equipment can determine the target module causing the power consumption abnormality.
Optionally, referring to fig. 2, after step 1022, the following steps are further included:
step 1024: determining that the preset condition is satisfied in a case where the first voltage change rate is greater than or equal to the target voltage change rate.
The preset condition for triggering the electronic device to execute the operation of acquiring the at least three sampling voltages corresponding to the system voltage may specifically include that the first voltage change rate is greater than or equal to the target voltage change rate. If the second sampling voltage U2To a first sampling voltage U1First rate of voltage change i1Greater than or equal to a target voltage change rate i0Is explained in U1Change to U2The system voltage rises and the system current decreases during time T, and the second sampling voltage U2Corresponding current I2Lower than a preset threshold current value I0At this time, the electronic device may determine that the preset condition is satisfied, start a new detection period, and start to perform an operation of acquiring at least three sampling voltages corresponding to the system voltage. Therefore, when the system current is determined not to exceed the preset threshold current value, a new detection period is restarted for detection, so that the system is prevented from increasing more overcurrent judgment conditions, and the operation amount of the system is reduced.
In practical application, after a new detection period starts, the electronic device may acquire at least three new sampling voltages for the system voltage again, and of course, the third sampling voltage acquired last may also be used as the first sampling voltage in the new detection period, and then acquire at least two new sampling voltages for the system voltage, so as to form a new detection period.
Optionally, referring to fig. 2, after step 1023, the following steps may be further included:
step 1025: for any one of the third sampled voltages, determining a third voltage change rate from the third sampled voltage to the first sampled voltage if the second voltage change rate corresponding to the third sampled voltage is greater than zero.
At i1＜i0In the case that the system current exceeds the preset threshold current value I0With reference to the curve U shown in fig. 31-U2-U3If U is present3To U2I of (a)2If > 0, the system current is in U in the next 1 sampling period2On the basis, the system current is reduced to a certain extent, and the system current is lower than a preset threshold current value I0The trend of (c). At this point, the electronic device may continue to determine U3To U1Voltage change rate i of31To be determined at U3To U1Within 2T, whether the system current exceeds a preset threshold current value I0。
With reference to the curve U shown in FIG. 31-U2-U3-U4If U is present4To U3I of (a)3If > 0, it means that the system current is in U in the next 1 sampling period3On the basis, the system current is reduced, and the system current is lower than the preset threshold current value I after 2 continuous adoption periods0The trend of (c). At this point, the electronic device may continue to determine U4To U1Voltage change rate i of41To be determined at U4To U1Within 3T, whether the system current exceeds a preset threshold current value I0。
Accordingly, referring to fig. 2, step 103 may further include the steps of:
step 1032: and under the condition that each third voltage change rate is smaller than the target voltage change rate, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
At i1＜i0And under the condition that the second voltage change rate corresponding to each third sampling voltage is greater than zero, if each third voltage change rate is smaller than the target voltage change rate i0The system voltage rises, which indicates that the system current always exceeds the preset threshold current value I although falling back to some extent0That is, in a detection period, the system current does not fall back to the preset threshold current value I0Thereafter, at this time, the electronic device may determine that the system current exceeds the preset threshold current value I0And determining a target module causing the power consumption abnormality.
With reference to the curve U shown in FIG. 31-U2-U3-U4，U2To U1I of (a)1＜i0The third sampling voltage includes U3And U4，U3Corresponding second voltage change rate of U3To U2I of (a)2，i2＞0，U4Corresponding second voltage change rate of U4To U3I of (a)3，i3＞0，U3To U1Has a third voltage change rate of i31，i31＜0，U4To U1Has a third voltage change rate of i41，i41< 0, therefore, U4To U3To U again2In the process, the system voltage rises, which shows that the system current falls back to U4Or exceeds the preset threshold current value I0I.e. in U1-U2-U3-U4In the detection period, the system current cannot fall back to the preset threshold current value I0Thereafter, at this time, the electronic device may determine that the system current exceeds the preset threshold current value I0And determining a target module causing the power consumption abnormality.
Optionally, referring to fig. 2, after step 1025, the following steps may be further included:
step 1026: determining that the preset condition is satisfied in a case where the third voltage change rate is greater than or equal to the target voltage change rate.
The preset condition for triggering the electronic device to execute the operation of acquiring the at least three sampling voltages corresponding to the system voltage may specifically include that the third voltage change rate is greater than or equal to the target voltage change rate. Referring to fig. 3, the third sampling voltage U3To a first sampling voltage U1Third rate of voltage change i31Greater than or equal to a target voltage change rate i0Is explained in U1Change to U3Within the time period of 2T, the system voltage rises, the system current decreases, and falls back to the preset threshold current value I0Hereinafter, at this time, the electronic device may determine that the preset condition is satisfied, and start a new detection period to start performing an operation of acquiring at least three sampling voltages corresponding to the system voltage. Therefore, when the system current is determined not to exceed the preset threshold current value, a new detection period is restarted for detection, so that the system is prevented from increasing more overcurrent judgment conditions, and the operation amount of the system is reduced.
Of course, in practical applications, the system current is ensured to fall back to the preset threshold current value I0In the following, the influence caused by the short-time fluctuation of the system current is avoided, and the preset condition can be determined to be satisfied under the condition that the change rates of the at least two third voltages are both greater than or equal to the target voltage change rate. For example, referring to FIG. 3, at U3To U1Third rate of voltage change i31Greater than or equal to a target voltage change rate i0In case of (2), it is also possible to continue to determine U4To U1Third rate of voltage change i41Whether or not it is greater than or equal to the target voltage change rate i0If yes, the system current can be determined to meet the preset condition, and if not, the system current can be determined not to fall back to the preset threshold current value I in a detection period0In the following, a target module causing a power consumption abnormality can be further specified.
In a specific application, in the case that the target module is a flash lamp, step 104 may specifically include: and reducing the current of the flash lamp to a preset current, wherein the preset current is greater than or equal to the lowest working current of the flash lamp and is less than the current working current of the flash lamp. For example, when a photo flash flashes, the current of a single Light Emitting Diode (LED) may reach 1.2-1.5A, and when it is determined that the target module causing abnormal power consumption is a flash, the current of the flash may be reduced from 1.5A to 0.5A, as shown in fig. 4.
In the case that the target module is a CPU, step 104 may specifically include: and reducing the clock frequency of the CPU to a preset frequency, wherein the preset frequency is greater than or equal to the lowest clock frequency of the CPU and is less than the current clock frequency of the CPU. For example, in the normal configuration, the clock frequency of the system CPU is operated at the maximum value, and when the target module causing the power consumption abnormality is determined to be the CPU, the CPU may be controlled to be down-clocked, as shown in fig. 5.
Further optionally, in the case that the system current is restored to be lower than the preset threshold current value by the power consumption reduction processing operation, it may be determined that the preset condition is satisfied, so that a new detection cycle is restarted to continue the detection and processing of abnormal power consumption. For example, referring to fig. 5, when the system current is restored below the preset threshold current value by the operation of reducing the clock frequency, the clock frequency of the CPU may be restored to the normal frequency, that is, the maximum clock frequency, so that the clock frequency of the system CPU continues to operate at the maximum value.
FIG. 6 is a schematic diagram illustrating an exemplary Circuit for handling abnormal power consumption, and referring to FIG. 6, a charging Integrated Circuit (IC) may convert a system voltage VsysOutput to various modules in the system. In this embodiment of the application, a voltage comparator may be added between the charging IC and the operation module, an output signal of the voltage comparator may be directly fed back to a Micro Controller Unit (MCU) or a CPU, a sampling voltage obtained by sampling a system voltage may be input to a positive electrode of the voltage comparator, and a voltage compared with the sampling voltage may be input to a negative electrode of the voltage comparator. For example for U in FIG. 31To U2The positive pole of the voltage comparator can be input into U2The negative pole of the voltage comparator can be input with U1And further can be (U)2-U1) To the control module so that the MCU is based on (U)2-U1) And executing subsequent steps of calculating the change rate, judging the overcurrent and the like, and executing subsequent power consumption reduction processing operation. Of course, in practical applications, the CPU may perform the steps of calculating the change rate, determining the overcurrent, and the like, and execute the subsequent power consumption reduction processing operation through the MCU, which is not specifically limited in this embodiment of the present application. In addition, referring to fig. 6, a System On Chip (SOC) may be used for sampling control, which triggers sampling of the System voltage once every time T.
The circuit diagram shown in fig. 6 is only an example of a circuit for implementing the embodiment of the present application, and is not limited to the present application.
In the embodiment of the application, under the condition that the preset condition is met, the electronic device may obtain at least three sampling voltages corresponding to the system voltage, determine a change rate parameter of the system voltage according to the at least three sampling voltages, determine a target module causing power consumption abnormality under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value, and further perform corresponding power consumption reduction processing operation on the target module. In this embodiment, the change rate parameter of the system voltage may reflect a change of the system voltage within a period of time, and the change of the system voltage within a period of time may reflect a change of the system current within a period of time, and in a case where the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the electronic device may perform a power consumption reduction process on a target module causing power consumption abnormality, so as to recover the system current to below the preset threshold current value. In addition, because the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic equipment and smaller than the junction temperature protection threshold current value of the electronic equipment, when the system current is higher but not greater than the overcurrent protection threshold current value and the junction temperature protection threshold current value of the electronic equipment, the electronic equipment can perform power consumption reduction treatment, so that the power consumption can be reduced in advance before the system triggers the overcurrent or junction temperature protection function, and the condition that the direct shutdown is caused by the triggering of the overcurrent or junction temperature protection function is avoided.
In the abnormal power consumption processing method provided in the embodiment of the present application, the execution main body may be an abnormal power consumption processing apparatus, or a control module of the abnormal power consumption processing apparatus for executing the method of the abnormal power consumption processing. In the embodiment of the present application, a method for executing an abnormal power consumption processing by an abnormal power consumption processing apparatus is taken as an example, and the apparatus for processing abnormal power consumption provided in the embodiment of the present application is described.
Referring to fig. 7, there is provided an apparatus 700 for abnormal power consumption handling, the apparatus 700 including:
an obtaining module 701, configured to obtain at least three sampling voltages corresponding to a system voltage when a preset condition is met;
a first determining module 702, configured to determine a change rate parameter of the system voltage according to the at least three sampled voltages;
a second determining module 703, configured to determine, when the change rate parameter indicates that the system current exceeds a preset threshold current value, a target module causing power consumption abnormality;
a processing module 704, configured to perform a corresponding power consumption reduction processing operation on the target module;
the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
Optionally, the first determining module 702 includes:
the first determining submodule is used for determining the target voltage change rate from the voltage corresponding to the preset threshold current value to the first sampling voltage;
a second determination submodule for determining a first voltage change rate of the second sampled voltage to the first sampled voltage;
a third determining submodule configured to determine, for any third sampled voltage subsequent to the second sampled voltage, a second voltage change rate of the sampled voltage from the third sampled voltage to a previous sampling time, when the first voltage change rate is smaller than the target voltage change rate;
the first sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages, and the second sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages except the first sampling voltage;
the second determining module 703 includes:
and the fourth determining submodule is used for determining that the system current exceeds the preset threshold current value and determining a target module causing abnormal power consumption under the condition that each second voltage change rate is smaller than or equal to zero.
Optionally, the first determining module 702 further includes:
a fifth determining submodule, configured to determine that the preset condition is satisfied when the first voltage change rate is greater than or equal to the target voltage change rate.
Optionally, the first determining module further includes:
a sixth determining submodule, configured to determine, for any one of the third sampling voltages, a third voltage change rate from the third sampling voltage to the first sampling voltage when the second voltage change rate corresponding to the third sampling voltage is greater than zero;
the second determining module 703 further includes:
and the seventh determining submodule is used for determining that the system current exceeds the preset threshold current value and determining a target module causing abnormal power consumption under the condition that each third voltage change rate is smaller than the target voltage change rate.
Optionally, the first determining module 702 further includes:
an eighth determining submodule, configured to determine that the preset condition is satisfied when the third voltage change rate is greater than or equal to the target voltage change rate.
In the embodiment of the application, under the condition that the preset condition is met, at least three sampling voltages corresponding to the system voltage can be obtained through the obtaining module, then the change rate parameter of the system voltage is determined through the first determining module according to the at least three sampling voltages, the target module causing power consumption abnormity is determined through the second determining module under the condition that the change rate parameter indicates that the system current exceeds the preset threshold current value, and then the corresponding power consumption reduction processing operation is executed on the target module through the processing module. In this embodiment, the change rate parameter of the system voltage may reflect a change of the system voltage within a period of time, and the change of the system voltage within a period of time may reflect a change of the system current within a period of time, and in a case where the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the electronic device may perform a power consumption reduction process on a target module causing power consumption abnormality, so as to recover the system current to below the preset threshold current value. In addition, because the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic equipment and smaller than the junction temperature protection threshold current value of the electronic equipment, when the system current is higher but not greater than the overcurrent protection threshold current value and the junction temperature protection threshold current value of the electronic equipment, the electronic equipment can perform power consumption reduction treatment, so that the power consumption can be reduced in advance before the system triggers the overcurrent or junction temperature protection function, and the condition that the direct shutdown is caused by the triggering of the overcurrent or junction temperature protection function is avoided.
The abnormal power consumption processing device in the embodiment of the present application may be a device, or may be a component, an integrated circuit, or a chip in a terminal. The device can be mobile electronic equipment or non-mobile electronic equipment. By way of example, the mobile electronic device may be a mobile phone, a tablet computer, a notebook computer, a palm top computer, a vehicle-mounted electronic device, a wearable device, an ultra-mobile personal computer (UMPC), a netbook or a Personal Digital Assistant (PDA), and the like, and the non-mobile electronic device may be a server, a Network Attached Storage (NAS), a Personal Computer (PC), a Television (TV), a teller machine or a self-service machine, and the like, and the embodiments of the present application are not particularly limited.
The abnormal power consumption processing device in the embodiment of the present application may be a device having an operating system. The operating system may be an Android (Android) operating system, an ios operating system, or other possible operating systems, and embodiments of the present application are not limited specifically.
The abnormal power consumption processing device provided by the embodiment of the application can realizeFIGS. 1 to 2In order to avoid repetition, the processes implemented by the method embodiment are not described herein again.
Optionally, as shown in fig. 8, an electronic device 800 is further provided in this embodiment of the present application, and includes a processor 801, a memory 802, and a program or an instruction stored in the memory 802 and capable of running on the processor 801, where the program or the instruction is executed by the processor 801 to implement each process of the foregoing abnormal power consumption processing method embodiment, and can achieve the same technical effect, and in order to avoid repetition, details are not repeated here.
It should be noted that the electronic device in the embodiment of the present application includes the mobile electronic device and the non-mobile electronic device described above.
Fig. 9 is a schematic diagram of a hardware structure of an electronic device implementing an embodiment of the present application.
The electronic device 900 includes, but is not limited to: a radio frequency unit 901, a network module 902, an audio output unit 903, an input unit 904, a sensor 905, a display unit 906, a user input unit 907, an interface unit 908, a memory 909, and a processor 910.
Those skilled in the art will appreciate that the electronic device 900 may further include a power source (e.g., a battery) for supplying power to various components, and the power source may be logically connected to the processor 910 through a power management system, so as to manage charging, discharging, and power consumption management functions through the power management system. The electronic device structure shown in fig. 9 does not constitute a limitation of the electronic device, and the electronic device may include more or less components than those shown, or combine some components, or arrange different components, and thus, the description is not repeated here.
The processor 910 is configured to, when a preset condition is met, obtain at least three sampling voltages corresponding to a system voltage;
determining a change rate parameter of the system voltage according to the at least three sampling voltages;
determining a target module causing power consumption abnormity under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value;
and executing corresponding power consumption reduction processing operation on the target module.
Optionally, the processor 910 is further configured to determine a target voltage change rate from the voltage corresponding to the preset threshold current value to the first sampling voltage;
determining a first voltage rate of change of a second sampled voltage to the first sampled voltage;
under the condition that the first voltage change rate is smaller than the target voltage change rate, determining a second voltage change rate of the sampling voltage from the third sampling voltage to the previous sampling time for any third sampling voltage after the second sampling voltage;
the first sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages, and the second sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages except the first sampling voltage;
and under the condition that each second voltage change rate is smaller than or equal to zero, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
Optionally, the processor 910 is further configured to determine that the preset condition is met when the first voltage change rate is greater than or equal to the target voltage change rate.
Optionally, the processor 910 is further configured to, for any one of the third sampling voltages, determine a third voltage change rate from the third sampling voltage to the first sampling voltage when the second voltage change rate corresponding to the third sampling voltage is greater than zero;
and under the condition that each third voltage change rate is smaller than the target voltage change rate, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
Optionally, the processor 910 is further configured to determine that the preset condition is met when the third voltage change rate is greater than or equal to the target voltage change rate.
In the embodiment of the application, under the condition that the preset condition is met, the electronic device may obtain at least three sampling voltages corresponding to the system voltage, determine a change rate parameter of the system voltage according to the at least three sampling voltages, determine a target module causing power consumption abnormality under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value, and further perform corresponding power consumption reduction processing operation on the target module. In this embodiment, the change rate parameter of the system voltage may reflect a change of the system voltage within a period of time, and the change of the system voltage within a period of time may reflect a change of the system current within a period of time, and in a case where the change rate parameter of the system voltage indicates that the system current exceeds a preset threshold current value, the electronic device may perform a power consumption reduction process on a target module causing power consumption abnormality, so as to recover the system current to below the preset threshold current value. In addition, because the preset threshold current value is smaller than the overcurrent protection threshold current value of the electronic equipment and smaller than the junction temperature protection threshold current value of the electronic equipment, when the system current is higher but not greater than the overcurrent protection threshold current value and the junction temperature protection threshold current value of the electronic equipment, the electronic equipment can perform power consumption reduction treatment, so that the power consumption can be reduced in advance before the system triggers the overcurrent or junction temperature protection function, and the condition that the direct shutdown is caused by the triggering of the overcurrent or junction temperature protection function is avoided.
It should be understood that, in the embodiment of the present application, the input Unit 904 may include a Graphics Processing Unit (GPU) 9041 and a microphone 9042, and the Graphics Processing Unit 9041 processes image data of a still picture or a video obtained by an image capturing device (such as a camera) in a video capturing mode or an image capturing mode. The display unit 906 may include a display panel 9061, and the display panel 9061 may be configured in the form of a liquid crystal display, an organic light emitting diode, or the like. The user input unit 907 includes a touch panel 9071 and other input devices 9072. A touch panel 9071 also referred to as a touch screen. The touch panel 9071 may include two parts, a touch detection device and a touch controller. Other input devices 9072 may include, but are not limited to, a physical keyboard, function keys (e.g., volume control keys, switch keys, etc.), a trackball, a mouse, and a joystick, which are not described in detail herein. Memory 909 can be used to store software programs as well as various data including, but not limited to, application programs and operating systems. The processor 910 may integrate an application processor, which primarily handles operating systems, user interfaces, applications, etc., and a modem processor, which primarily handles wireless communications. It is to be appreciated that the modem processor described above may not be integrated into processor 910.
The embodiment of the present application further provides a readable storage medium, where a program or an instruction is stored on the readable storage medium, and when the program or the instruction is executed by a processor, the program or the instruction implements each process of the foregoing abnormal power consumption processing method embodiment, and can achieve the same technical effect, and in order to avoid repetition, details are not repeated here.
The processor is the processor in the electronic device described in the above embodiment. The readable storage medium includes a computer readable storage medium, such as a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and so on.
The embodiment of the present application further provides a chip, where the chip includes a processor and a communication interface, the communication interface is coupled to the processor, and the processor is configured to run a program or an instruction, so as to implement each process of the above-mentioned abnormal power consumption processing method embodiment, and achieve the same technical effect, and in order to avoid repetition, the description is omitted here.
It should be understood that the chips mentioned in the embodiments of the present application may also be referred to as system-on-chip, system-on-chip or system-on-chip, etc.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Further, it should be noted that the scope of the methods and apparatus of the embodiments of the present application is not limited to performing the functions in the order illustrated or discussed, but may include performing the functions in a substantially simultaneous manner or in a reverse order based on the functions involved, e.g., the methods described may be performed in an order different than that described, and various steps may be added, omitted, or combined. In addition, features described with reference to certain examples may be combined in other examples.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present application.
While the present embodiments have been described with reference to the accompanying drawings, it is to be understood that the invention is not limited to the precise embodiments described above, which are meant to be illustrative and not restrictive, and that various changes may be made therein by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (12)

1. An abnormal power consumption processing method, characterized by comprising:
under the condition that a preset condition is met, at least three sampling voltages corresponding to the system voltage are obtained;
determining a change rate parameter of the system voltage according to the at least three sampling voltages;
determining a target module causing power consumption abnormity under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value;
executing corresponding power consumption reduction processing operation on the target module;
the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
2. The method of claim 1, wherein determining a rate of change parameter of the system voltage from the at least three sampled voltages comprises:
determining a target voltage change rate from the voltage corresponding to the preset threshold current value to a first sampling voltage;
determining a first voltage rate of change of a second sampled voltage to the first sampled voltage;
under the condition that the first voltage change rate is smaller than the target voltage change rate, determining a second voltage change rate of the sampling voltage from the third sampling voltage to the previous sampling time for any third sampling voltage after the second sampling voltage;
the first sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages, and the second sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages except the first sampling voltage;
the determining a target module causing power consumption abnormity under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value comprises the following steps:
and under the condition that each second voltage change rate is smaller than or equal to zero, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
3. The method of claim 2, wherein after determining the first rate of change of voltage from the second sampled voltage to the first sampled voltage, further comprising:
determining that the preset condition is satisfied in a case where the first voltage change rate is greater than or equal to the target voltage change rate.
4. The method of claim 2, wherein the determining a second voltage change rate of the third sampled voltage to a sampled voltage at a previous sampling time for any third sampled voltage after the second sampled voltage if the first voltage change rate is less than the target voltage change rate further comprises:
for any one of the third sampling voltages, determining a third voltage change rate from the third sampling voltage to the first sampling voltage when the second voltage change rate corresponding to the third sampling voltage is greater than zero;
the determining a target module causing power consumption abnormity under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value further comprises:
and under the condition that each third voltage change rate is smaller than the target voltage change rate, determining that the system current exceeds the preset threshold current value, and determining a target module causing abnormal power consumption.
5. The method of claim 4, wherein for any of the third sampled voltages, after determining a third rate of change of voltage from the third sampled voltage to the first sampled voltage if the second rate of change of voltage for the third sampled voltage is greater than zero, further comprising:
determining that the preset condition is satisfied in a case where the third voltage change rate is greater than or equal to the target voltage change rate.
6. An apparatus for exceptional power consumption handling, the apparatus comprising:
the acquisition module is used for acquiring at least three sampling voltages corresponding to the system voltage under the condition that a preset condition is met;
the first determination module is used for determining a change rate parameter of the system voltage according to the at least three sampling voltages;
the second determining module is used for determining a target module causing abnormal power consumption under the condition that the change rate parameter indicates that the system current exceeds a preset threshold current value;
the processing module is used for executing corresponding power consumption reduction processing operation on the target module;
the preset threshold current value is smaller than an overcurrent protection threshold current value of the electronic equipment and is smaller than a junction temperature protection threshold current value of the electronic equipment.
7. The apparatus of claim 6, wherein the first determining module comprises:
the first determining submodule is used for determining the target voltage change rate from the voltage corresponding to the preset threshold current value to the first sampling voltage;
a second determination submodule for determining a first voltage change rate of the second sampled voltage to the first sampled voltage;
a third determining submodule configured to determine, for any third sampled voltage subsequent to the second sampled voltage, a second voltage change rate of the sampled voltage from the third sampled voltage to a previous sampling time, when the first voltage change rate is smaller than the target voltage change rate;
the first sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages, and the second sampling voltage is the sampling voltage with the earliest sampling time in the at least three sampling voltages except the first sampling voltage;
the second determining module includes:
and the fourth determining submodule is used for determining that the system current exceeds the preset threshold current value and determining a target module causing abnormal power consumption under the condition that each second voltage change rate is smaller than or equal to zero.
8. The apparatus of claim 7, wherein the first determining module further comprises:
a fifth determining submodule, configured to determine that the preset condition is satisfied when the first voltage change rate is greater than or equal to the target voltage change rate.
9. The apparatus of claim 7, wherein the first determining module further comprises:
a sixth determining submodule, configured to determine, for any one of the third sampling voltages, a third voltage change rate from the third sampling voltage to the first sampling voltage when the second voltage change rate corresponding to the third sampling voltage is greater than zero;
the second determining module further comprises:
and the seventh determining submodule is used for determining that the system current exceeds the preset threshold current value and determining a target module causing abnormal power consumption under the condition that each third voltage change rate is smaller than the target voltage change rate.
10. The apparatus of claim 9, wherein the first determining module further comprises:
an eighth determining submodule, configured to determine that the preset condition is satisfied when the third voltage change rate is greater than or equal to the target voltage change rate.
11. An electronic device comprising a processor, a memory and a program or instructions stored on the memory and executable on the processor, the program or instructions, when executed by the processor, implementing the steps of the power consumption exception handling method according to any one of claims 1-10.
12. A readable storage medium, on which a program or instructions are stored, which when executed by a processor implement the steps of exceptional power consumption handling according to any of claims 1-10.
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